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JPS5939877B2 - X-ray tube filament temperature control method - Google Patents
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JPS5939877B2 - X-ray tube filament temperature control method - Google Patents

X-ray tube filament temperature control method

Info

Publication number
JPS5939877B2
JPS5939877B2 JP2360279A JP2360279A JPS5939877B2 JP S5939877 B2 JPS5939877 B2 JP S5939877B2 JP 2360279 A JP2360279 A JP 2360279A JP 2360279 A JP2360279 A JP 2360279A JP S5939877 B2 JPS5939877 B2 JP S5939877B2
Authority
JP
Japan
Prior art keywords
filament
tube current
circuit
ray tube
temperature control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2360279A
Other languages
Japanese (ja)
Other versions
JPS55117899A (en
Inventor
正和 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
J Morita Manufaturing Corp
Original Assignee
J Morita Manufaturing Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by J Morita Manufaturing Corp filed Critical J Morita Manufaturing Corp
Priority to JP2360279A priority Critical patent/JPS5939877B2/en
Publication of JPS55117899A publication Critical patent/JPS55117899A/en
Publication of JPS5939877B2 publication Critical patent/JPS5939877B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G1/00X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08Electrical details
    • H05G1/26Measuring, controlling or protecting
    • H05G1/30Controlling
    • H05G1/34Anode current, heater current or heater voltage of X-ray tube

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)

Description

【発明の詳細な説明】 本発明はX線撮影装置において管電流を設定管電流値に
維持するフィードバック回路、を有したX線管フィラメ
ント温度制御方法に関し、その要旨とするとこらは、管
電流制御用フィードバック回路の伝達特性をフィラメン
ト加熱時と冷却時とで相互に変化させる点にある。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an X-ray tube filament temperature control method having a feedback circuit for maintaining a tube current at a set tube current value in an X-ray imaging apparatus. The purpose of this invention is to mutually change the transfer characteristics of the feedback circuit for heating and cooling the filament.

X線撮影装置において常に安定したX線線量を得るため
にはX線管の管電流を一定に保つことが必須の要件であ
り、一方管電流はフィラメント湿度に大きく依存する。
In order to always obtain a stable X-ray dose in an X-ray imaging apparatus, it is essential to keep the tube current of the X-ray tube constant, and on the other hand, the tube current largely depends on the filament humidity.

従って一般に管電流制御用フィードバック系では管電流
が設定管電流値より低下する時にフィラメントを加熱し
て湿度上昇を促がし、逆に増大する時はフィラメントを
冷却して降温させるが、フィラメント加熱時の湿度変化
がフィラメントに対する供給エネルギー(供給電力)に
依存し、供給エネルギーを増大させるに従い温度上昇カ
ーブが急激に立上るのに対し、フィラメント冷却時の湿
度変化はフィラメントの熱損失(輻射、熱伝導等)に依
存してほぼ一定化され、しかして両者の湿度変化率が異
なっている。
Therefore, in general, in a tube current control feedback system, when the tube current decreases below the set tube current value, the filament is heated to promote an increase in humidity, and when the tube current increases, the filament is cooled to lower the temperature, but when the filament is heated, Changes in humidity depend on the energy supplied to the filament (supplied power), and as the supplied energy increases, the temperature rise curve rises rapidly.However, changes in humidity when cooling the filament depend on the heat loss (radiation, heat conduction) of the filament. etc.), and the rate of change in humidity is different between the two.

本発明はかかる点に鑑み、フィードバック回路の伝達特
性をフィラメント加熱時と冷却時で最適値に変化させ、
最も適切なフィラメント温度制御および管電流制御が行
なえるようにするものである。
In view of this point, the present invention changes the transfer characteristics of the feedback circuit to an optimal value when heating the filament and when cooling the filament,
This allows for the most appropriate filament temperature control and tube current control.

図面において、1は交流電源、2はエミッションスイッ
チ、3は高圧発生回路、4は高圧トランス、5は電流電
圧変換器、6はX線管、7はフィラメントトランス、8
はフィラメントドライブ回路、9は管電流誤差検出回路
、10はミラー積分回路、11はプレヒート回路で、9
〜11はフィードバック回路12を構成している。
In the drawing, 1 is an AC power supply, 2 is an emission switch, 3 is a high voltage generation circuit, 4 is a high voltage transformer, 5 is a current voltage converter, 6 is an X-ray tube, 7 is a filament transformer, 8
9 is a filament drive circuit, 9 is a tube current error detection circuit, 10 is a Miller integration circuit, 11 is a preheat circuit, 9
11 constitute a feedback circuit 12.

更に管電流誤差検出回路9は比較器A1と基準電圧源E
1とを有し、X線管6側から電流電圧変換器5にて電圧
化されたのちフィードバックされる管電流を基準電圧源
E、と比較し、比較器A1の入力電圧(管電流に相応す
る)が基準電圧よりも高いと負の出力を、又その逆の時
は正の出力をミラー積分回路10に供給するように構成
されている。
Further, the tube current error detection circuit 9 includes a comparator A1 and a reference voltage source E.
1, the tube current fed back from the X-ray tube 6 side after being converted into voltage by the current-voltage converter 5 is compared with the reference voltage source E, and the input voltage of the comparator A1 (corresponding to the tube current) is compared with the reference voltage source E. It is configured to supply a negative output to the Miller integration circuit 10 when the voltage (1) is higher than the reference voltage, and a positive output when vice versa.

ミラー積分回路10は順方向ダイオードD1と入力抵抗
R1との直列接続体と、−逆方向ダイオードD2と入力
抵抗R2との直列接続体とを有し、両直列接続体が並列
結線されると共tこ、此等に積分用コンデンサC1と増
幅器A2が結線されている。
The Miller integrating circuit 10 has a series connection body of a forward direction diode D1 and an input resistor R1, and a series connection body of a reverse direction diode D2 and an input resistance R2. An integrating capacitor C1 and an amplifier A2 are connected here.

プレヒート回路11は予熱基準電圧源E2と加算器A3
とを有し、この基準電圧にミラー積分回路出力を加算し
、この加算出力をフィラメントドライブ回路8に入力し
てフィラメントトランス7の一次側電圧を可変すべく構
成している。
The preheating circuit 11 includes a preheating reference voltage source E2 and an adder A3.
The output of the Miller integration circuit is added to this reference voltage, and the added output is input to the filament drive circuit 8 to vary the primary side voltage of the filament transformer 7.

尚、管電流誤差検出回路11中のスイッチSW1は上記
エミッションスイッチ2に連動するもので、エミッショ
ンスイッチ2のオン時にのみ基準電圧源E0を比較器A
1につなぐように設定されている。
The switch SW1 in the tube current error detection circuit 11 is linked to the emission switch 2, and only when the emission switch 2 is turned on, the reference voltage source E0 is connected to the comparator A.
It is set to connect to 1.

しかしてエミッションスイッチ2をオンするに伴い回路
3,4.5を経る周知回路動作によりX線管6に高圧が
印加され、管電流が流れる。
When the emission switch 2 is turned on, a high voltage is applied to the X-ray tube 6 by a well-known circuit operation via the circuits 3, 4.5, and a tube current flows.

この管電流は前記のように電流電圧変換器5で該管電流
値に応じた大きさの電圧に変換されたのち管電流誤差検
出回路9に導ひかれる。
This tube current is converted into a voltage corresponding to the tube current value by the current-voltage converter 5 as described above, and then led to the tube current error detection circuit 9.

比較器A1では設定管電流に対応する基準電圧源E1を
使用して、実際の管電流に対応する入力電圧との比較が
成され、入力電圧が基準電圧よりも高い場合(即ち管電
流が設定管電流値よりも大きい場合)は負の出力がミラ
ー積分回路10に送られ、逆に入力電圧が基準電圧より
も低い場合(即ち管電流が設定管電流値よりも小さい場
合)は正の出力がミラー積分回路10に送られる。
In the comparator A1, a comparison is made with the input voltage corresponding to the actual tube current using the reference voltage source E1 corresponding to the set tube current, and if the input voltage is higher than the reference voltage (i.e. the tube current is higher than the set tube current) If the input voltage is lower than the reference voltage (i.e., the tube current is smaller than the set tube current value), a negative output is sent to the Miller integration circuit 10. is sent to the Miller integration circuit 10.

ミラー積分回路10ではその入力信号が正であると順方
向ダイオードD1側に電流が流れて、抵抗R1とコンデ
ンサC0で決まる積分定数で、又入力信号が負であると
逆方向ダイオードD2側に電流が流れて、抵抗R2とコ
ンデンサC1で決まる積分定数で所要の積分動作が実施
される。
In the Miller integration circuit 10, when the input signal is positive, current flows to the forward direction diode D1 side, and when the input signal is negative, current flows to the reverse diode D2 side with an integration constant determined by the resistor R1 and capacitor C0. flows, and a required integral operation is performed with an integral constant determined by resistor R2 and capacitor C1.

つまり、ミラー積分回路10の積分定数が入力信号の正
、負に応じて自動的に切換わるのである。
In other words, the integration constant of the Miller integration circuit 10 is automatically switched depending on whether the input signal is positive or negative.

このミラー積分回路出力は、プレヒート回路11へ送ら
れて基準電圧源E2と加算される。
This Miller integration circuit output is sent to the preheat circuit 11 and added to the reference voltage source E2.

そして、管電流誤差検出回路9で得られた出力が負であ
り、従って実際の管電流値が設定管電流値よりも低い場
合は、上記加算出力によってフィラメントドライブ回路
8がフィラメントトランス7の一次側電圧を高めてフィ
ラメントを加熱し、管電流を設定値に近ずける方向に増
大させる。
If the output obtained by the tube current error detection circuit 9 is negative and therefore the actual tube current value is lower than the set tube current value, the filament drive circuit 8 is activated to the primary side of the filament transformer 7 by the addition output. The voltage is increased to heat the filament and increase the tube current toward the set value.

又、管電流誤差検出回路9で得られた出力が正であり、
従って実際の管電流値が設定管電流値よりも高い場合は
プレヒート回路11ではミラー積分回路出力が減算的に
働き、フィラメントドライブ回路8によりフィラメント
トランス7の一次側電圧を抑えてフィラメントを冷却し
、管電流を設定値に近ずける方向に減小させる。
Further, the output obtained from the tube current error detection circuit 9 is positive,
Therefore, when the actual tube current value is higher than the set tube current value, the output of the Miller integral circuit works in a subtractive manner in the preheat circuit 11, and the filament drive circuit 8 suppresses the primary side voltage of the filament transformer 7 to cool the filament. Decrease the tube current toward the set value.

このような回路動作によりX線管6の管電流が常に設定
値に維持される。
Through such circuit operation, the tube current of the X-ray tube 6 is always maintained at the set value.

本発明は以上の如く使用されるのであるが、管電流誤差
検出回路9、ミラー積分回路10およびプレヒート回路
11を含むフィードバック回路において、前述のように
ミラー積分回路10の積分定数、つまりフィードバック
系の伝達特性を管電流誤差検出回路9の出力の正、負条
件に応じて可変し、管電流を増大すべくフィラメントを
加熱する時と管電流を減小すべくフィラメントを冷却す
る時では変化させている。
The present invention is used as described above, and in the feedback circuit including the tube current error detection circuit 9, the Miller integration circuit 10, and the preheat circuit 11, the integral constant of the Miller integration circuit 10, that is, the feedback system The transfer characteristics are varied according to the positive and negative conditions of the output of the tube current error detection circuit 9, and are changed when the filament is heated to increase the tube current and when the filament is cooled to decrease the tube current. There is.

従って、抵抗R2とコンデンサC1によって決定される
積分率をフィラメントを加熱するに最適の値に、又抵抗
R1とコンデンサC1によって決定される積分率をフィ
ラメントを冷却するに最適の値に設定しておけば、フィ
ラメント加熱時とフィラメント冷却時のフィードバック
系伝達特性が変わり、これによってフィラメント加熱時
および冷却時の特性が適正に保たれることになる。
Therefore, the integration factor determined by resistor R2 and capacitor C1 should be set to the optimal value for heating the filament, and the integration factor determined by resistor R1 and capacitor C1 should be set to the optimal value for cooling the filament. For example, the feedback system transmission characteristics change when the filament is heated and when the filament is cooled, so that the characteristics when the filament is heated and cooled are maintained appropriately.

故に本発明による時は、フィラメント温度を制御して管
電流を一定に保ち、安定したX線線量を得るものにおい
て、フィラメント加熱時および冷却時の最適温度変化率
に適合させて制御できるので有用である。
Therefore, the present invention is useful in a device that controls the filament temperature to keep the tube current constant and obtain a stable X-ray dose because it can be controlled to match the optimum temperature change rate during filament heating and cooling. be.

即ち、従来のフィードバック回路では冒頭で述べたフィ
ラメント加熱時と冷却時におけるフィラメント湿度変化
率の相違を考慮せずにフィードバック回路の伝達特性を
決定していたため、フィラメント加熱時又は冷却時のい
ずれかの温度特性を悪化させることになっていた。
In other words, in the conventional feedback circuit, the transfer characteristics of the feedback circuit were determined without considering the difference in the rate of change in filament humidity between heating and cooling the filament, which was mentioned at the beginning. It was supposed to worsen the temperature characteristics.

本発明によればかような不都合を払拭し得るのである。According to the present invention, such inconveniences can be eliminated.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の一実施例を示す電気回路である。 6・・・・・・X線管、12・・・・・・フィードバッ
ク回路。
The drawing is an electric circuit showing one embodiment of the present invention. 6...X-ray tube, 12...Feedback circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 X線管の管電流を設定管電流と比較し、この比較値
によりフィラメントの温度制御を行なうフィードバック
回路において、このフィードバック回路の伝達特性をフ
ィラメント加熱時とフィラメント冷却時とで異ならしめ
ることを特徴とするX線管フィラメント温度制御方法。
1. In a feedback circuit that compares the tube current of the X-ray tube with a set tube current and controls the temperature of the filament based on this comparison value, the transfer characteristics of this feedback circuit are made different between when the filament is heated and when the filament is cooled. An X-ray tube filament temperature control method.
JP2360279A 1979-02-28 1979-02-28 X-ray tube filament temperature control method Expired JPS5939877B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2360279A JPS5939877B2 (en) 1979-02-28 1979-02-28 X-ray tube filament temperature control method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2360279A JPS5939877B2 (en) 1979-02-28 1979-02-28 X-ray tube filament temperature control method

Publications (2)

Publication Number Publication Date
JPS55117899A JPS55117899A (en) 1980-09-10
JPS5939877B2 true JPS5939877B2 (en) 1984-09-26

Family

ID=12115144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2360279A Expired JPS5939877B2 (en) 1979-02-28 1979-02-28 X-ray tube filament temperature control method

Country Status (1)

Country Link
JP (1) JPS5939877B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62118370U (en) * 1986-01-20 1987-07-27
WO2017143974A1 (en) * 2016-02-22 2017-08-31 上海联影医疗科技有限公司 System and method for controlling filament of x-ray tube

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62118370U (en) * 1986-01-20 1987-07-27
WO2017143974A1 (en) * 2016-02-22 2017-08-31 上海联影医疗科技有限公司 System and method for controlling filament of x-ray tube

Also Published As

Publication number Publication date
JPS55117899A (en) 1980-09-10

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