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JPS5940250B2 - How to measure temperature and emissivity simultaneously - Google Patents
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JPS5940250B2 - How to measure temperature and emissivity simultaneously - Google Patents

How to measure temperature and emissivity simultaneously

Info

Publication number
JPS5940250B2
JPS5940250B2 JP15344877A JP15344877A JPS5940250B2 JP S5940250 B2 JPS5940250 B2 JP S5940250B2 JP 15344877 A JP15344877 A JP 15344877A JP 15344877 A JP15344877 A JP 15344877A JP S5940250 B2 JPS5940250 B2 JP S5940250B2
Authority
JP
Japan
Prior art keywords
emissivity
temperature
cavity
roughness
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15344877A
Other languages
Japanese (ja)
Other versions
JPS5485079A (en
Inventor
徹 井内
次雄 石田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP15344877A priority Critical patent/JPS5940250B2/en
Publication of JPS5485079A publication Critical patent/JPS5485079A/en
Publication of JPS5940250B2 publication Critical patent/JPS5940250B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/0003Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Description

【発明の詳細な説明】 本発明は、鋼板などの被測温物体の温度と放射率の同時
測定方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for simultaneously measuring the temperature and emissivity of an object to be measured, such as a steel plate.

冷延、熱延を問わず鋼板などの測温には非接触で測定で
きる放射温度計が適しているが、放射温度計の最大の弱
点は放射率と背光雑音である。
Radiation thermometers are suitable for measuring the temperature of cold-rolled or hot-rolled steel sheets because they can be measured without contact, but the biggest weaknesses of radiation thermometers are emissivity and backlight noise.

後者の背光雑音は特に炉内物体の測温の際などに大きな
問題となり、これの解決策は遮蔽である。これには覆い
などによる単なる遮蔽から、鏡面反射を利用するものな
ど幾つかの方法が考えられる。前者の放射率の問題に対
しては2色比温度計やその他の方法が考えられているが
、本発明者は放射率と温度を同時に測定し、これにより
正確な放射測温を可能にする方法を開発した。しかしな
がらこの方法では温度、放射率の算出に使用する演算式
のパラメータαを定数としており、例えば冷延鋼板また
は熱延鋼板など個々の被測温物体に適合するようにパラ
メータαを設定したのち、それぞれのラインに使用する
様にする。しかしこれでは使用対象を変れは再設定する
必要があり、甚だ厄介である。本発明はかゝる点を改善
し、パラメータαの自動修正を可能にして、前記の温度
、放射率同時測定放射温度計を何処へでも直ちに使用可
能にしようとするものである。
The latter backlight noise is a big problem, especially when measuring the temperature of objects inside the reactor, and the solution to this problem is shielding. There are several possible ways to do this, from simple shielding with a cover to the use of specular reflection. To solve the former problem of emissivity, dichroic thermometers and other methods have been considered, but the present inventor measures emissivity and temperature simultaneously, thereby making accurate radiation temperature measurement possible. developed a method. However, in this method, the parameter α of the calculation formula used to calculate the temperature and emissivity is a constant. For example, after setting the parameter α to suit each object to be measured, such as a cold-rolled steel plate or a hot-rolled steel plate, Use it for each line. However, in this case, if the target of use changes, it is necessary to reconfigure the settings, which is extremely troublesome. The present invention aims to improve these points, to enable automatic correction of the parameter α, and to enable the above-mentioned radiation thermometer for simultaneous measurement of temperature and emissivity to be used immediately anywhere.

次にこれを詳細に説明する。先ず前述の温度、放射率同
時測定法の原理を説明する。第1図aに示すように被測
温物体1の上に間隔を置いてキャビティ2を置き、更に
その上に放射温度計3を置く。キャビティ2は内面が高
反射率鏡面であり、そして両端開放の筒状体である。ま
た第1図bに示すように、他の条件は同じとして唯キャ
ビティ2の代りにキャビティ4を置く。このキャビティ
4は被測温物体1に面する側が開放、放射温度計3に面
する側が閉鎖となつた有底筒状体で、内面は高反射率鏡
面となつておりまた閉鎖端面には放射温度計3に整列し
てノ」仔L5があけられている。今物体1の表面温度を
T、放射率をεとすれば、第1図aの場合に放射温度計
3に入射するエネルギE4は物体1から放射温度計3へ
直接到達した放射エネルギのみであつてキャビティ2に
よる影響は受けない。従つて下式が成立する。E1=ε
・ Eb(T)・・・ ・・・・・・・・・・・(ハ
こゝでEbmは温度Tの黒体の放射エネルギである。
Next, this will be explained in detail. First, the principle of the aforementioned temperature and emissivity simultaneous measurement method will be explained. As shown in FIG. 1a, a cavity 2 is placed at a distance above the temperature-measuring object 1, and a radiation thermometer 3 is placed above it. The cavity 2 is a cylindrical body whose inner surface is a highly reflective mirror surface and whose both ends are open. Further, as shown in FIG. 1B, cavity 4 is placed in place of cavity 2, with other conditions being the same. This cavity 4 is a bottomed cylindrical body with an open side facing the temperature measurement object 1 and a closed side facing the radiation thermometer 3. The inner surface is a highly reflective mirror surface, and the closed end surface has a radiant In line with the thermometer 3, a hole L5 is opened. Now, if the surface temperature of the object 1 is T and the emissivity is ε, then the energy E4 incident on the radiation thermometer 3 in the case of Figure 1a is only the radiation energy that directly reaches the radiation thermometer 3 from the object 1. Therefore, it is not affected by cavity 2. Therefore, the following formula holds true. E1=ε
・Eb(T)・・・・・・・・・・・・・・・(Here, Ebm is the radiant energy of a black body at temperature T.

一方、第1図bでは物体1からの放射線は図示の如くキ
ャビティで多重反射し、この多重反射した放射率の一部
も小孔5を通つて放射温度計3に入射する。従つて入射
エネルギE2は大になり、見掛け上、物体1の放射率ε
が増大したことになる。この増大した放射率をg(ε)
とすると、下式が成立する。E2=g(ε)・Eb(T
) ・・・・・・・・・・・・・・(2)放射率
g(ε)の関数形が分れば(1),(2)式からε、T
を求めることが可能である。
On the other hand, in FIG. 1B, the radiation from the object 1 is reflected multiple times in the cavity as shown, and a portion of the multiple reflected emissivity also enters the radiation thermometer 3 through the small hole 5. Therefore, the incident energy E2 becomes large, and the apparent emissivity ε of the object 1 increases.
has increased. This increased emissivity is expressed as g(ε)
Then, the following formula holds true. E2=g(ε)・Eb(T
) ・・・・・・・・・・・・・・・(2) If the functional form of emissivity g(ε) is known, ε, T can be obtained from equations (1) and (2).
It is possible to obtain

こ\で放射率g(ε)であるが、この関数形を求めるた
め次の仮定を置く、(1)キヤビテイ表面の温度は物体
1の表面温度に比較して充分に低く、キヤビテイ自体か
らの放射エネルギは無視できる。(4)キヤビテイの下
端開口面での実効的な反射率γaは、キヤビテイの形状
、寸法、および内面の反射率によつて一義的に定まる。
0Ii)キヤビテイから物体面に再放射されたエネルギ
は、(1−ε)・pの割合で再びキヤビテイ内に反射さ
れる。
This is the emissivity g(ε), but in order to find this functional form, the following assumptions are made: (1) The temperature of the cavity surface is sufficiently low compared to the surface temperature of the object 1, and the Radiant energy is negligible. (4) The effective reflectance γa at the lower end opening surface of the cavity is uniquely determined by the shape and dimensions of the cavity, and the reflectance of the inner surface.
0Ii) The energy re-radiated from the cavity to the object surface is reflected back into the cavity at a ratio of (1-ε)·p.

pはεに依存しない定数である。以上の仮定のもとで、
放射エネルギE2を求めると次のようになる。従つて放
射率g(ε)は(α+1)・ε/(ε+α)で表わされ
ることが分る。
p is a constant that does not depend on ε. Under the above assumptions,
The radiant energy E2 is calculated as follows. Therefore, it can be seen that the emissivity g(ε) is expressed as (α+1)·ε/(ε+α).

こ\でαは下式で表わされる定数設定パラメータである
。パラメータαを設定すれ(伯),(4)式からE2/
E1=Gとして放射率εはとなり、放射率εが分れば黒
体放射エネルギEb(1)が前召α1)式を変形した下
式から求まる。
Here, α is a constant setting parameter expressed by the following formula. By setting the parameter α, E2/
Assuming that E1=G, the emissivity ε becomes, and if the emissivity ε is known, the blackbody radiant energy Eb(1) can be found from the equation below, which is a modification of the equation α1).

Eb(?1r)が求まれば、あとはプランクの式を用い
て温度Tが簡単に求まる。このような測定を行なう装置
としては第2図bに示すようにキヤビテイ2と放射温度
計3との間に回転セタ一6を置き、この回転セクターを
第2図aに示すように回転軸7に対する中心角が90図
の対称配置された2つの扇形部分6a,6bからなり、
該扇形部分に軸7を中心とする弧状溝6c,6dを設け
たものとすればよい。このようにすればキヤビテイ2の
上方開放端はセクター6の扇形部分6a,6bとその間
の空白部分とで交互に覆われ、また解放され、第1図A
,bと同様な結果が交互に得られる。ところでこの放射
温度計ではパラメータαをオフライン実験結果などによ
り予め求めておく必要があるが、これでは融通性又は即
応性に乏しい。
Once Eb(?1r) is determined, the temperature T can be easily determined using Planck's equation. As a device for performing such measurements, a rotating sector 6 is placed between the cavity 2 and the radiation thermometer 3 as shown in FIG. 2b, and this rotating sector is connected to a rotating shaft 7 as shown in FIG. 2a. It consists of two fan-shaped parts 6a and 6b arranged symmetrically with a central angle of 90 degrees,
Arc-shaped grooves 6c and 6d centered on the shaft 7 may be provided in the fan-shaped portion. In this way, the upper open end of the cavity 2 is alternately covered with the fan-shaped portions 6a and 6b of the sector 6 and the blank area between them, and is then left open, as shown in FIG.
, b can be obtained alternately. However, in this radiation thermometer, it is necessary to obtain the parameter α in advance from off-line experimental results, but this method lacks flexibility or quick response.

本発明はこの点を改善しようとするものである。パラメ
ータαは前記(5)式で表わされる如く、未知数pなど
を含んでいて理論解は困難である。しかしながら(5)
式等から明らかなようにキヤビテイから物体1への放射
エネルギの該物体からのキヤビテイへの反射分を決定し
ており、このうちキヤビテイに関する成分子aはキヤビ
テイによつて定まる一定値であり、可変なのは物体に関
する成分pである。成分pは物体からキヤビテイへの反
射に関係しているから物体の表面性状によつて影響を受
けるはずであり、そこで物体の表面粗度とパラメータと
の関係を求めた所、第3図および第4図に示すように非
常によい相関を得た。こ\で第3図は粗度を平均傾斜角
θaで示しており、第4図は二乗平均粗さRMSで示し
ている。なお第3図においてP1はステンレス鏡面、P
2はアルミニウム鏡面、P3は珪素鋼板、P4は冷延鋼
板、P5はシヨツトプラスト粗面化アルミニウム板に対
する各測定値を示す。
The present invention attempts to improve this point. As expressed by the above equation (5), the parameter α includes an unknown number p, etc., and a theoretical solution is difficult. However (5)
As is clear from the equations, the amount of radiant energy from the cavity to the object 1 reflected from the object to the cavity is determined, and the component a related to the cavity is a constant value determined by the cavity, and is variable. is the component p related to the object. Since the component p is related to reflection from the object to the cavity, it should be affected by the surface properties of the object. Therefore, the relationship between the surface roughness of the object and the parameters was determined, and the results are shown in Figures 3 and 3. As shown in Figure 4, a very good correlation was obtained. Here, FIG. 3 shows the roughness by the average inclination angle θa, and FIG. 4 shows the roughness by the root mean square roughness RMS. In addition, in Fig. 3, P1 is a stainless steel mirror surface, and P1 is a stainless steel mirror surface.
2 shows the measured values for an aluminum mirror surface, P3 a silicon steel plate, P4 a cold-rolled steel plate, and P5 a shotplast roughened aluminum plate.

こ\で平均傾斜角θaとは、第5図に示すように物体表
面が凹凸しているとき、その物体の面方向に座標軸X、
厚み方向に座標軸Z、傾斜角をθ、LをX方向の所望考
察範囲とすると一UU で表わされる。
Here, the average inclination angle θa means that when the surface of an object is uneven as shown in Fig. 5, the coordinate axis X,
If the coordinate axis Z is the thickness direction, the inclination angle is θ, and L is the desired range of consideration in the X direction, it is expressed as 1UU.

また、二剰平均粗さRMSは波状物体表面の中心レベル
をZmとする次式で表わされる。粗度表示パラメータに
はこの他にもJISで規定されている如く平均粗やRa
や、最大高さR[Tlaxl十点平均粗さRzなど種々
あるが、使用に際しては勿論相関度の高いものを用いる
とよい。
Further, the double mean roughness RMS is expressed by the following equation, where Zm is the center level of the surface of the wavy object. In addition to this, roughness display parameters include average roughness and Ra as specified by JIS.
There are various values such as maximum height R[Tlaxl, ten-point average roughness Rz, etc., but it is of course best to use one with a high degree of correlation.

また、Z,θなどの測定には触針式が一般的であるが、
レーザビームを投射し正反射方向を中心とする散乱光強
度分布を測定し、該分布のピーク値および半値巾から平
均傾斜角θaを求めることが可能である。第6図は鋼板
表面において測定した粗度平均傾斜角θaと半値巾Hの
関係を得た例である。さらに、最近は光学的方法により
第5図に示したような表面プロフイルそのものを測定す
る方法も開発されており、それを使えば任意の粗度パラ
メータを非接触で求めることが可能である。
Additionally, a stylus type is commonly used to measure Z, θ, etc.
It is possible to project a laser beam, measure the scattered light intensity distribution centered on the specular reflection direction, and determine the average tilt angle θa from the peak value and half-width of the distribution. FIG. 6 is an example of the relationship between the roughness average inclination angle θa and the half width H measured on the surface of a steel plate. Furthermore, a method of measuring the surface profile itself using an optical method as shown in FIG. 5 has recently been developed, and by using this method, it is possible to determine any roughness parameter without contact.

粗度計、特に非接触で測定可能な光学的粗度計を前記の
放射温度計に付設し、該放射温度計の検出素子で前述の
放射エネルギEl,E2を測定し、また粗度計で粗度Q
SUND又はRMSを求め、これより第3図または第4
図のグラフを用いてパラメータαを決定し、該パラメー
タαと前記(6)式を用いて放射率εを、また(7)式
により温度Tを求めれば、任意の未知物体の表面温度を
極めて正確に測定することができる。勿論測温と粗度測
定は別個の場所で行なつてもよい。以上詳細に説明した
ように、本発明によれば放射率および表面性状が未知の
高温物体の表面温度を放射温度計により極めて正確に測
定することができ、鉄工業その他の分野の測温手段とし
て極めて有効である。
A roughness meter, especially an optical roughness meter capable of non-contact measurement, is attached to the radiation thermometer, and the radiation energies El and E2 are measured by the detection element of the radiation thermometer, and the roughness meter measures the radiation energies El and E2. Roughness Q
Find SUND or RMS, and from this figure 3 or 4
By determining the parameter α using the graph in the figure, emissivity ε using the parameter α and equation (6), and temperature T using equation (7), the surface temperature of any unknown object can be determined. Can be measured accurately. Of course, temperature measurement and roughness measurement may be performed at separate locations. As explained in detail above, according to the present invention, the surface temperature of a high-temperature object whose emissivity and surface texture are unknown can be measured extremely accurately using a radiation thermometer, and it can be used as a temperature measuring means in the iron industry and other fields. Extremely effective.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A,bは温度、放射率同時測定法の原理を説明す
る概略断面図、第2図A,bは第1図の具体例を示す概
略平面図および側面図、第3図および第4図は実測例を
示すグラフ、第5図は粗度の説明図、第6図は粗度平均
傾斜角θaと半値巾Hの関係を示す説明図である。 図面で1は被測温物体、2,4はキヤビテイ、3は放射
温度計、6は回転セクタである。
Figures 1A and b are schematic cross-sectional views explaining the principle of the simultaneous temperature and emissivity measurement method, Figures 2A and b are schematic plan views and side views showing specific examples of Figure 1, and Figures 3 and 3 are FIG. 4 is a graph showing an actual measurement example, FIG. 5 is an explanatory diagram of roughness, and FIG. 6 is an explanatory diagram showing the relationship between roughness average inclination angle θa and half width H. In the drawing, 1 is a temperature measured object, 2 and 4 are cavities, 3 is a radiation thermometer, and 6 is a rotating sector.

Claims (1)

【特許請求の範囲】[Claims] 1 内面を高反射率鏡面にしたキャビティを被測温物体
上に間隔を置いて設け、該キャビティを単に通過した及
び該キャビティで多重反射しながら通過した該物体から
の放射エネルギE_1、E_2を測定して該物体の温度
および放射率を測定する方法において、該物体の表面粗
度を測定し、該粗度により前記放射エネルギから温度T
および放射率εを算出する演算式ε=(α+1−αG)
/GおよびEb(T)=E_1/s(こゝでG=E_2
/E_1、Eb(T)は温度Tの黒体の放射エネルギ)
のパラメータαを修正して正しい該温度および放射率を
求めることを特徴とする温度の放射率の同時測定方法。
1 A cavity with a high reflectance mirror surface on the inner surface is provided at intervals above the object to be measured, and the radiant energy E_1, E_2 from the object that simply passes through the cavity and that passes through the cavity with multiple reflections is measured. In the method of measuring the temperature and emissivity of the object, the surface roughness of the object is measured, and the temperature T is determined from the radiant energy based on the roughness.
and the calculation formula for emissivity ε=(α+1−αG)
/G and Eb(T)=E_1/s (here G=E_2
/E_1, Eb(T) is the radiant energy of a blackbody at temperature T)
1. A method for simultaneously measuring temperature and emissivity, characterized in that correct temperature and emissivity are determined by correcting parameter α.
JP15344877A 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously Expired JPS5940250B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15344877A JPS5940250B2 (en) 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15344877A JPS5940250B2 (en) 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously

Publications (2)

Publication Number Publication Date
JPS5485079A JPS5485079A (en) 1979-07-06
JPS5940250B2 true JPS5940250B2 (en) 1984-09-28

Family

ID=15562764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15344877A Expired JPS5940250B2 (en) 1977-12-20 1977-12-20 How to measure temperature and emissivity simultaneously

Country Status (1)

Country Link
JP (1) JPS5940250B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01169561U (en) * 1988-05-18 1989-11-30
JPH0240750U (en) * 1988-09-07 1990-03-20
JP2021139628A (en) * 2020-03-02 2021-09-16 株式会社チノー Temperature measuring device and temperature measuring method

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* Cited by examiner, † Cited by third party
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US6179466B1 (en) * 1994-12-19 2001-01-30 Applied Materials, Inc. Method and apparatus for measuring substrate temperatures
JP4217255B2 (en) 2006-07-27 2009-01-28 株式会社神戸製鋼所 Steel plate temperature measuring method and temperature measuring device, and steel plate temperature control method
JP5293022B2 (en) * 2008-09-11 2013-09-18 新日鐵住金株式会社 Temperature control method in continuous annealing furnace and continuous annealing furnace
JP7062339B2 (en) * 2018-08-30 2022-05-06 株式会社チノー Temperature measuring method and temperature measuring device
CN115265825B (en) * 2022-07-06 2024-04-16 东北大学 Method and device for measuring temperature of inner surface, storage medium and terminal

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01169561U (en) * 1988-05-18 1989-11-30
JPH0240750U (en) * 1988-09-07 1990-03-20
JP2021139628A (en) * 2020-03-02 2021-09-16 株式会社チノー Temperature measuring device and temperature measuring method

Also Published As

Publication number Publication date
JPS5485079A (en) 1979-07-06

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