JPS5941875B2 - Laser beam recording method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a laser beam recording method that utilizes thermal deformation caused by a laser beam.

Various methods have been used for recording in real time.

Examples include magnetic recording and recording using electron flux. Compared to these recording methods, the laser beam method is particularly superior in that it can record without aging, that it can record as a visible pattern, and that it can easily record additional information. As a recording member for such a laser beam method, a material that absorbs the radial energy of the laser beam and is thermally deformed is used, but any material may be used as long as it is such a material. However, it is required to have some characteristics. Its typical properties are mechanical strength, stability, reflectance, absorption number, thermal conductivity, softening temperature, and evaporation temperature (sublimation temperature).
In other words, since extremely high-density information is recorded on the recording member, the recorded member exhibits a fine pattern, and must be sufficiently protected from mechanical damage during subsequent handling. It must have good mechanical strength. Furthermore, the recorded member must be a stable material that does not change due to ambient temperature, humidity, changes over time, etc. Furthermore, it is desirable that the reflectance of the recording layer is low, since the beam energy of the laser beam can effectively reach the interior of the recording layer, thereby achieving recording using the weakest possible laser beam.

Similarly, in order to perform efficient recording, it is desirable that the absorption coefficient of the recording layer be large.

A large absorption coefficient means that the radial energy of the laser beam is efficiently converted into thermal energy in the recording layer, and as a result, the portion irradiated with the laser beam is easily deformed. Furthermore, from the viewpoint of resolution, it is desirable that the recording layer has a low thermal conductivity.

If the thermal conductivity is high, when the irradiated area of the laser beam is deformed, the heat of the irradiated area will be conducted to the surrounding area, causing the area around the irradiated area to melt or partially evaporate, resulting in a loss of resolution. be exposed. Further, it is desirable that the recording layer has a low melting point evaporation temperature (sublimation temperature). The intensity of the laser beam is approximately proportional to the evaporation temperature. It is desirable that the evaporation temperature of the recording layer be low in terms of simplifying the laser beam irradiation device and increasing the recording speed.
Selection of a constituent material of the recording layer that satisfies these various characteristics involves a very difficult technique. The main materials conventionally used are metals such as rhodium and resins.

These metals have excellent optical density, stability, and scratch and wear resistance, but they also have low reflectance (70-90%), high melting point (about 20,000 C), and boiling point (about 45,000 C).
C) high thermal conductivity (approximately 1.5 Watt/C
It has been pointed out that resins have a large rfL°C), and in the case of resins, their melting points and boiling points are low, and their thermal conductivity is also low, so they provide recording materials with higher sensitivity than metals.
In terms of optical density, stability, and scratch and abrasion resistance, it does not have sufficient properties for practical use. In addition, high resolution is required for high-density recording, and for this purpose,
First, the recording layer must be extremely thin and have a uniform thickness (usually several microns or less). However, in terms of the number of resin materials,
It is very difficult to form such a uniform recording layer with a thickness of several microns or less, and even if it could be formed, it would not have enough mechanical strength for practical use. Furthermore, when resin is used, it usually contains dye or pigment in order to absorb the radial energy of the laser beam, so if it is made into a very thin film, it will not be sufficient. A high optical density cannot be expected, and the contrast of the recorded pattern will not be sufficient. This is pointed out in the case of resin. As described above, improvements are still desired in conventional recording materials in order to lower the laser beam output, increase the recording speed, and ensure resolution when recording high-density information. In addition, in the conventional laser beam recording method, by irradiating the recording layer with a laser beam and removing the irradiated part of the recording layer, the contrast between the part where the recording layer is removed and the part where it is not removed (unirradiated part), Usually, patterns are formed based on optical density or color tone contrast, so it is necessary to remove all or most of the recording layer in the thickness direction in order to provide sufficient optical contrast. It was hot.

In this way, in the conventional method, the area removed by laser beam irradiation is large, so it is necessary to use a more powerful laser beam or to irradiate the laser beam for a long time, so it is difficult to apply it to high-speed recording. It does not have sufficient characteristics in this respect. Therefore, the main object of the present invention is to provide a high-speed recording method by using a more superior high-sensitivity recording material in place of conventional recording materials and by adopting a specific recording method. .

The feature is that by irradiating a recording layer formed mainly of a material selected from S, Se, Te, and their compounds (chalcogenide) with a laser beam containing recorded information, the material can be heated to a softening temperature. The above describes a laser beam recording method in which heat is generated below the evaporation temperature to thermally form a light-scattering deformation on the surface of the recording layer.

The recording layer employed in the present invention is mainly formed of a material selected from S, Se, Te, and their compounds (chalcogenides).

S (sulfur), Se (selenium) and Te (tellurium) are chalcogen elements. These elements constitute the recording layer either singly or as a mixture of two or more elements. Chalcogenide is a compound containing a chalcogen element. Chalcogen elements are chemically very active and react with almost any other element in any proportion to form compounds (chalcogenides). Representative examples of other elements include As, Bi,
Bb, Ge, Si, Sn, In, Zn, Fe, Cu, A
g, Ni, Al, V and Pb. A chalcogenide composed of these other elements and at least one chalcogen element provides an effective recording material in the present invention. In the present invention, the chalcogen element and chalcogenide used as the molding material for the recording layer have many features listed below.

The refractive index of chalcogen elements and chalcogenides is usually in the range of 2 to 4, and the reflectance determined from this is 3.
0-600! ), the absorption efficiency of the laser beam into the recording layer is high, and the intensity of the laser beam can be set low.

In addition, the absorption edges of chalcogen elements and chalcogenides are commonly located in the visible region (350 to 700 mμ), and the absorption edges can be freely changed by changing their composition and composition ratio. As a result, a recording layer having absorption corresponding to the wavelength of the laser beam used can be formed, and the radiant energy of the laser beam can be effectively converted into thermal energy, enabling high-speed recording.

Furthermore, the adjustment of the absorption edge in the spectral characteristics can make it insensitive to light rays other than specific wavelengths.

The thermal conductivity of chalcogen elements and chalcogenides is o.
5~o. o1 (Watt/CTIL℃), which is sufficiently small.
Thermal effects (melting,
evaporation, etc.), and furthermore, it is possible to avoid cracking due to thermal strain due to heat conduction and the resulting peeling, and as a whole, it is possible to create a sharp pattern with high resolution. In addition, as another characteristic of chalcogen elements and chalcogenides, the evaporation temperature (usually 400 to 1
500°C) is low. Such characteristics make it most suitable for use as a recording material. Another feature of using chalcogen elements and chalcogenides as recording layers is that it is much easier to form a uniform recording layer of any thickness than metals. This is because the chalcogen element, Kano, and Recogenide have physical properties such as non-sublimation, low melting point, and low boiling point, and do not react (low reaction) with metals such as W, Ta, and Mo even at high temperatures. When forming a recording layer using this method, a thick and uniform vapor deposited layer can be formed more easily than with metal. Another feature is that the hardness of chalcogen elements and chalcogenides is higher than that of metals.
Although inferior, it has very good adhesion to flexible supports such as films and papers.

This is due to chalcogen elements and chalcogenides. Therefore, by using chalcogen elements and chalcogenides, it is relatively easy to provide recording members in various shapes such as plate, film, and paper. Therefore, it will greatly improve recording speed, resolution, simplification of recording devices, manufacturing of recording layers according to the type of laser beam used, and manufacturing of recording members according to the market. be. The most typical structure of the recording member according to the present invention is shown in FIG. 1, and is composed of a support 1 and a recording layer 2. The recording layer is generally formed by vapor deposition or sputtering, but it may also be formed by melt coating by heating, or by solution coating using the alkali solubility of the chalcogen element and chalcogenide.

The thickness of the recording layer is usually 10μ to 10m.
Set to μ.

Furthermore, if the recording layer is thick, the support may be removed if necessary. Typical chalcogenides used to form the recording layer include the following compounds. Examples of S chalcogenide include As-S compound, Bi-S compound, S
i-S compound, Zn-S compound, Ge-S compound, Cu
-S compound, Ag-S compound, ■-S compound, Pb-S
compound, In-S compound, Al-S compound, Sn-S compound, N1-S compound, e-sp compound, Ge-S-
Cu compound, e-s-Na compound, As-S-1 compound, As-S-Te compound, As-S-Ge compound, In
-Ge-S compound, Ge-Sn-S compound, Ge-S-
As chalcogenide of Se such as Ag compounds, As
-Se compound, Sb-Se compound, Bi-Se compound,
Examples of Te chalcogides such as Ge-Se compounds and As-Se-1 compounds include As-Te compounds and Sb-T
e compounds, Bi-Te compounds, Si-As-Te compounds, etc. Chalcogenides containing two or more chalcogen elements include As-S-Te compounds, As-S-
Te compound, As-Se-Te compound, Ge-Se-S
compound, As-S-Se compound, etc.

The reactivity of the chalcogen element is common, and among the above-mentioned exemplary compounds, compounds with different types of chalcogen elements can also be effectively used as chalcogenides in recording materials. In addition, there are many other compounds as chalcogenides, and these other chalcogenides may also be appropriately employed in the present invention. When forming a recording layer, it is also effective to add a small amount (1 mol % or less) of elements such as halogen, Ge, Si, etc. as an activator, if necessary.

Chalcogen also contains alkali metals such as Na and K, alkaline earth metals such as Ca and Sr, Si and Ge.
, Sn, Pb, etc., group Ib elements such as Tl, Al, In, etc., group IIb elements such as Zn, lanthanum-based rare earths such as Eu, Sm, actinide rare earths such as U, etc. Adding elements is also effective. Furthermore, adding a small amount of metal as an additive is effective in terms of optical density and photosensitivity. Typical metals to be added include Ag, Cu, Cd, Mn, Ga, In, Bi, and Sb.
, Fe, Ni or their alloys, especially Ag
, Sn, Zn, Bi and Cu are preferred. The amount of metal added is appropriately set in the range of 5 mol% to 80 mol%. Considering that a portion of the recording layer may evaporate when irradiated with a laser beam, it is also preferable to use a non-toxic material for the recording layer. In this respect, Ge--S compounds, Sn--S compounds, In--S compounds, Cu--S compounds, Ag--S compounds, Zn--S compounds, or compounds obtained by adding metals to these compounds are preferred. Chalcogen elements and chalcogenides can normally be in a glass state or a crystalline state. The crystalline state and the glass state exhibit different properties in terms of optical refractive index, specific heat, thermal conductivity, thermal expansion coefficient, etc. For example, regarding chalcogenide having the composition AS2S3, the optical refractive index in the crystalline state (wavelength 550 to 580 mμ) is 2.66, while the optical refractive index in the glass state is 2.77. Also, As2se
The thermal conductivity of the crystalline state of chalcogenide with composition 3 is 4×
103Cat/CT! L-SeC·°C, and that in the glass state is 7×10 4 cat/CTn-Sec·°C. In principle, the recording layer can be in both a crystalline state and a glassy state depending on the manufacturing conditions. This difference in manufacturing conditions can be determined individually for each actual manufacturing condition, and it is difficult to define general conditions that are commonly applied throughout. In the case of vapor deposition, the state control of the crystalline state and the glass state is such that the vapor deposition source is in the crystalline state, the substrate temperature is set near the glass transition point, or the conditions after vapor deposition are such that the crystalline state is easily obtained. A glass state can be easily obtained under conditions such as making the vapor deposition source in a glass state or keeping the substrate temperature at a relatively low temperature below the galant transition point, usually below room temperature. In addition, when forming a coating film on a support with a solution of chalcogen element and chalcogenide (chalcogen element and chalcogenide are soluble in alkali, so it is usually an alkaline solution), the temperature of the support should be set to 100°C or higher. A crystalline state is easily obtained under conditions such as applying at a relatively high temperature and slowly cooling it after application, or heat-treating it above the glass transition point after application, and under conditions where a heated alkaline solution is applied at high speed onto a support cooled to room temperature or below. Then, the glass state is easy to serve as a samurai. Further, in the case of melting, a crystalline state is easily obtained under conditions of slow cooling after melting, and a glass state is easily obtained under conditions of rapid cooling. Other factors related to whether the glass state or the crystalline state is likely to occur are the type and composition ratio of the chalcogenide composition. For example, Zn-S, As
xSel-x (x<0.4), Ge-S-P system, Ge-
S-Cu and As-Te systems tend to take a crystalline state, and Gel-XSx (0.4x<0.6, X>0.6
6), AsxSl-x (0.15 x <0.55), G
El-XSex (x>0.75), Ge-S-Na system, As-S-, etc. are likely to take a glass state.

In addition to the above, it is also considered that when the starting material of chalcogen used to form the recording layer is in a crystalline state, the formed recording layer also tends to be in a crystalline state. From the viewpoint of mechanical strength, stability, and flexibility, it is recommended that the recording layer be in a glass state.

FIG. 1 shows the most typical configuration of a recording member used in the present invention, which is composed of a recording layer 2 and a support 1. The most typical state of implementation of the invention is shown in FIGS. 2-4. The recording member is irradiated with a laser beam 3 as shown in FIG. 2, and the chalcogenide generates heat above its softening temperature and below its evaporation temperature, forming a light-scattering deformation 4 in the laser beam irradiated portion of the recording layer. be done. The light-scattering deformation formed by the laser beam consists of a collection of minute irregularities. In order to form such minute irregularities, laser beam irradiation is performed by modulating a single laser beam to target the same pixel, such as the so-called A/0 Kalva method, which combines an acousto-optic element and a galvanometer. This is accomplished by irradiating several times or more, by irradiating two or more laser beams, or by employing both at the same time. The size and number of the formed irregularities are set so as to effectively cause light scattering. For example, since light scattering images are normally observed using visible light, it is possible to effectively cause light scattering, and it is sufficient that the size of the unevenness (difference in height between peaks and valleys) is 100 mμ or less. be.
Also, from the same point, the formation density of unevenness is 15 pieces/10μ
It is preferable to set it to ~25 pieces/10 μ. In order to observe the recorded information directly as a scattering image or by enlarging and projecting it, it is necessary that these irregularities are gathered together to a certain extent, and the visible part of the recorded and non-recorded parts of the scattered image is The difference in light transmittance for light is preferably set such that the light transmittance of the recorded portion is set to 1 to 1/5 of the light transmittance of the non-recorded portion. For this reason, the degree of aggregation of the unevenness is preferably 5 or more, particularly preferably 10 or more in many cases. The light scattering image formed as shown in FIG.
The uneven portions are formed in the form of lattice points, checkered stripes, or randomly arranged, and are observed by reflection or transmission. Figure 3 shows the case of transmission,
The entire surface illumination light applied from the support side passes through the recording member, is selectively scattered 6 by the light-scattering deformed portion 4, and a scattered image is observed. In this case, the support is designed to be optically transparent and usually consists of a transparent material such as glass, polyester, acetate, polyethylene, etc. In the case of observation by reflection, as shown in FIG. 4, the entire surface light irradiation 5 is applied from the surface side of the recording layer, and the light-scattering deformed portion 4. Scattered at 6
and a scattering image is observed. In this case, the support is
It may be formed from an opaque material such as metal, ceramic, or paper. In the recording method according to the present invention, recording can be achieved by using a laser beam to form irregularities to the extent that light scattering occurs, so that recording can be performed at extremely high speed and a low-power laser beam can be used.

Further, the scattered image can be received by a photoelectric element and converted into an electrical signal for use. *Example 1 film thickness 8
A heat mode laser recording member was produced by using a 0μ polyester film as a substrate and forming chalcogen glass (GeS) to a thickness of about 1500λ by vacuum evaporation.

The degree of vacuum during vacuum evaporation was 2 x 10-6T0rr) and the port temperature was about 700°C. A writing experiment was conducted using the recording member manufactured as described above.

As shown in Fig. 5, the experimental method was to attach a recording member, T, to a turntable, 8, rotate the turntable with a motor, 9, and perform a uniform linear movement parallel to the table surface, 10. , a modulator for beams of lasers, 12,
11, through the mirror, 13, reflected by the lens, 14,
The light is focused on the surface of the recording member and recorded in a spiral pattern.
Writing experiments were conducted until the linear velocity at the outer periphery increased and recording became impossible.

In order to impart light scattering properties to the recording member, an acousto-optic modulator provided with 8 stages of spot positions was used as the 11 modulator. A writing experiment was conducted using the conventional heat mode laser recording method and compared.

A conventional experimental method for heat mode laser recording is shown in FIG. 5 with the modulator 11 removed. However, as a condensing lens, a 10x microscope objective lens was used so that the line width was 5 μm. The results of these experiments are summarized in the table below.

Similar results were obtained when S was used instead of GeS in this example.

Example 2 A recording member was prepared by forming a chalcogen glass of Ag25Ge25s5O to a thickness of about 1500 Å on a polyester film by vacuum evaporation in the same manner as in Example 1.

Using the experimental apparatus of Example 1, the maximum linear velocity at which a line width of approximately 5 μm could be obtained using the method of the present invention and the conventional method when the laser output was the same was determined. Example 3 A recording member was prepared by using an acetate film having a thickness of 75 μm as a substrate and forming Ges2 chalcogen glass to a thickness of 2000 μm on the substrate by vapor deposition.

Laser beam recording was performed on this recording member using the recording apparatus shown in FIG. The input of this device is a magnetic tape, and the magnetic tape reader 15 is 800 BPI, 1
This is a magnetic tape reader capable of switching the density of 600 BPI and the number of tracks between 7 tracks and 9 tracks, and its transfer rate is 36 KC. The controller 16 has a 16-bit/16-bit readout for controlling the entire device and for storing information from the magnetic tape reader in internal memory.
It is a general-purpose minicomputer with a core memory of 8K words. A control device 16 controls the movements of a character generator 17, an X-Y deflector 18, a laser beam generator 19, and a recording member 25. The character generator 17 is made up of an 8-bit/word, 1K-word ROM (read-only memory), and receives △X-△Y amplitude and unblank signals to generate a dot pattern corresponding to the contents of the ROM. It is occurring. △Y is 200KHz, △X is 4
It is deflected at a frequency of 0K11z. The X-Y deflection device 18 outputs a signal to move the laser beam to an arbitrary position on the screen according to a command from the control device 16, and has a maximum response of 40 KHz. The laser beam generator 19 has sufficient output to write optical information on a recording member. An electro-optic shutter 20 receives the unblank signal and directs a laser beam 19 onto the recording member 25.
This is a car cell (KevvCell) that turns on and off. Ultrasonic deflectors were used as the deflectors 21, 22, 23, and 24.

These deflectors receive the △X, △Y amplitude signals and the X, Y deflection signals, respectively, and deflect the laser beam by a predetermined amount.
and move it to a predetermined position. All of the above operations are controlled within the minicomputer, and various movements are possible.

FIG. 7 shows an example of a dot pattern recorded by this recording apparatus. That is, the laser beam is polarized in the Y direction and the X direction at the character generator. The dot positions for recording characters as a dot pattern are determined by turning on and off the electro-optic shutter 20. When the shaded print area is on (amp rack), the laser beam D is turned on.
It becomes the irradiated part, and when it is off (blank), it becomes the non-irradiated part of the laser beam. The irradiation position of the laser beam on the recording member is determined by the character generator and the electro-optic shutter, and the laser beam is controlled so that the irradiated portion has a light-scattering surface deformation. Two methods are mainly used for this control. One is when a laser beam reaches a certain recording dot area, for example, area A7, the laser beam is scanned back and forth several times at minute intervals, or the laser beam is swung. One method is to make A7 light scattering, and the other is to scan the laser beam with a character generator at minute intervals such that the laser beam scans the dot portion multiple times at intervals. In this method, the dot portion is made light scattering. In this example, recording was performed using the latter method.

After recording one character, the movement of the laser beam to record another character is performed by an XY polarizer. An argon laser with an output of 50 mw was used as the laser beam, and the diameter of the laser beam irradiated onto the recording member was set to 1.0 μm. The diameter of the dots is 10 μm, and the density of the dots is 10 6 cells/d. By scanning with a laser beam, 16 grooves were formed in one dot to form a light-scattering character pattern as a whole. The energy of the laser beam is 5x to create a light-scattering character pattern.
105erg/Cd was sufficient. Recording speed is 700
It was 0 character alpha alphabet/Sec. Example 4 Mylar film was used as the substrate, and Ge2s3 was placed on it.
A recording member was prepared by vacuum-depositing it to a thickness of 1500A.

Recording was performed on this recording member using a laser beam using a recording apparatus shown in FIG. The recipient 26 is the arrow 27
The recording member 28 moves in the direction of the arrow 29 in synchronization with the movement in the direction of the arrow 29. In this embodiment, the light emitted from the laser oscillator 30 (the reflection mirror of the oscillator has a reflectance of 100
(!), so there is always light coming out in two directions).

The light emitted from the higher reflectance mirror of the laser oscillator will be referred to as the backward light, and the high-intensity light that is normally used as laser light will be referred to as the forward light. The back light is used to measure the reflectance of the subject. The rearward light emitted from the laser is subjected to X-polarization using a galvanometer with a frequency of 3 KHz. When the laser beam hits an object, it is reflected by the reflectance of the object and is received by the photocell 36.

The deflector 32 used in this embodiment deflects only the X axis, and the deflection is performed in the Y direction by the movement of the subject. In this example, the subject is 6001L7! It is sent at a speed of L/Sec. The forward light of the laser 30 is deflected by a deflector 33 in synchronization with the deflector 32 .

The deflector 33 is also a 3KHz galvanometer. For synchronous deflection, deflection signals are output from an oscillator 31 and sent to 32 and 33 at the same time. The speed of the recording member is 30
The speed is mm/Sec. The laser used in this embodiment is a 10 mw He--Cd laser, and the beam diameter of the backward light is 10μ, while the beam diameter of the forward light is narrowed to 1μ.

The light reflected from the object is picked up by a photocell and amplified by an amplifier 35. By changing the characteristics of the amplifier 35 that controls the Kerr cell (KenCeII) 34, the contrast of the image can be changed. The reversal was also easy. A pseudo-halftone photograph can also be obtained by using a pulsed laser or by digitally performing deflection and inserting a gray scale between the laser and the deflection device 33.
Furthermore, by inserting a level detector into the amplifier, unnecessary background information can be removed by digitizing the signal of the subject. In this way, as shown in FIG. 9, a light-scattering recording pattern was formed by a set of grooves corresponding to the subject.

The width of one groove was approximately 0.5μ, and the groove interval was set to 0.6μ. The energy of the laser beam required to record the light scattering pattern is 3.7×10erg/? It was hot. Example 5 A recording member was prepared by vacuum-depositing Ges2 to a thickness of 200 μm on a Mylar sheet having a thickness of 25 μm.

Laser beam recording was performed on this recording member using a combination of the recording device shown in FIG. 8 and the recording device shown in FIG. 10. The operating conditions of the recording apparatus shown in FIG. 8 are the same as those in Example 4. In the recording device shown in Fig. 8, the reflectance of the laser beam varies depending on the type of various hard information recorded on the subject, and especially when the reflectance becomes higher than a certain level. In this case, the intensity of the recording laser beam increases accordingly, which in this case causes the recording device to be completely evaporated.
Rather than a light-scattering pattern, a complete uneven pattern is formed, making it difficult to record a homogeneous light-scattering pattern. In order to prevent this, the recording method shown in Figure 10 is adopted, in which when the recording laser beam becomes stronger than a certain level,
The intensity of the recording laser L beam is controlled by detecting the accompanying increase in light transmittance of the laser beam irradiated area due to complete evaporation of the recording layer, and prevents excessive melting and evaporation of the recording layer. It is a device that prevents Reference numeral 37 is for recording on the recording member 38 with a recording laser beam.

The recording member is brought into contact with the transparent glass cylinder 39 in the direction of the arrow 45. 40 is the reference light 1mw0)He
-Ne laser light is so weak that it does not record on the recording member.

The reference light is received by the photocell 42 through the recording member and the glass cylinder. A recording laser beam is received by a photocell 41 through a recording member and a glass cylinder. These two lights are constantly monitored by a comparator 43. When the energy of the recording laser beam is strong enough to create a light scattering pattern, the recording laser beam is scattered by the recording member and the photocell 41
The light observed in the photocell 41 gradually decreases, but when the intensity of the recording laser beam exceeds a certain value and becomes excessive, the recording layer of the recording member is evaporated and the scattering decreases rapidly. The amount of light received increases and the final image becomes positive.
The negative will be reversed. In order to prevent this, when the amount of light received by the photocell 41 becomes less than the light received by the photocell 42, the micro-vibration deflector 44 operates to give the recording laser beam 37 a vibration of about 3 MHz. This allows the energy to be dispersed and prevents excessive evaporation of the recording layer.

The high-density parts of the recorded pattern are slightly thicker, which visually gives the appearance of higher density. Similar vibrations occur when the recording beam is very weak, but due to the nature of the reference beam 40, when such vibrations occur, no recording is possible.

In this way, the laser beam intensity of 10
A light-scattering pattern was formed in the range of 5 to 106egrS). The groove width of the formed light scattering pattern is 0.2~
0.7μ, its density is 16 lines/10μ, and the transmittance of white light made into a parallel beam by a collimator from the substrate (Mylar) side is 15(f) in the recorded area and 90% in the unrecorded area. It was hot.

[Brief explanation of drawings]

FIG. 1 shows one embodiment of a recording member used in the present invention.

Claims (1)

[Claims] 1 By irradiating a recording layer formed mainly of a material selected from S, Se, Te, and a compound thereof (chalcogenite) with a laser beam having recorded information, the material is heated to a temperature higher than the softening temperature and lower than the evaporation temperature. A laser beam recording method characterized by generating heat to thermally form a light-scattering deformation on the surface of a recording layer.