JPS5945082B2 - Clearance measuring device - Google Patents
Clearance measuring deviceInfo
- Publication number
- JPS5945082B2 JPS5945082B2 JP5291977A JP5291977A JPS5945082B2 JP S5945082 B2 JPS5945082 B2 JP S5945082B2 JP 5291977 A JP5291977 A JP 5291977A JP 5291977 A JP5291977 A JP 5291977A JP S5945082 B2 JPS5945082 B2 JP S5945082B2
- Authority
- JP
- Japan
- Prior art keywords
- gap
- capacitance
- electrodes
- measuring device
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004020 conductor Substances 0.000 claims description 21
- 239000000463 material Substances 0.000 description 6
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 4
- 239000007788 liquid Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- OEPOKWHJYJXUGD-UHFFFAOYSA-N 2-(3-phenylmethoxyphenyl)-1,3-thiazole-4-carbaldehyde Chemical compound O=CC1=CSC(C=2C=C(OCC=3C=CC=CC=3)C=CC=2)=N1 OEPOKWHJYJXUGD-UHFFFAOYSA-N 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Description
【発明の詳細な説明】
本発明は相対向して並設されている導体物質のすき間を
測定するすきま測定装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a gap measuring device for measuring the gap between conductive materials arranged side by side and facing each other.
板金材をボルト結合して構成した構造物や、数多くの柱
により組み合わされた構造物などにおいて、その結合部
の間隙や柱の間隔いわゆるすきまの寸法がその構造物の
機能に影響することがしばしばある。In structures constructed by joining sheet metal materials with bolts, or structures assembled by numerous columns, the dimensions of the gaps at the joints and the spacing between the columns, so-called gaps, often affect the function of the structure. be.
しかし、すきま箇所が水などの液体で浸されていたり、
すきまが構造物の内部の方にあるなどして、ノギスやス
キ間ゲージなどでは測定できない場合が多条あつた。However, if the gap is soaked with liquid such as water,
There were many cases where the gaps were located inside the structure and could not be measured using calipers or gap gauges.
本発明は上記欠点を排除するものであつて、誘電率の低
い遮蔽板と同板の両面に貼着され所定面積を有する一対
の電極とからなる電極板を間隔を存して相対向して並設
されている導体物質の間に挿入し、上記電極のうち一方
と上記導体物質問の静電容量および上記電極の他方と上
記導体物・質問の静電容量を測定し、上記導体物質の間
隔を測定するようzとしたことを特徴としその目的とす
るところは、相対向して並設されている導体物質問のす
きまの寸法を正確に測るすきま測定装置を提供するもの
である。The present invention eliminates the above-mentioned drawbacks, and consists of an electrode plate consisting of a shielding plate with a low dielectric constant and a pair of electrodes having a predetermined area attached to both sides of the plate, which face each other with a gap between them. The capacitance between one of the electrodes and the conductor object and the capacitance between the other electrode and the conductor object are measured by inserting it between the conductive materials arranged in parallel. It is characterized by the fact that z is used to measure the distance, and its purpose is to provide a gap measuring device that accurately measures the size of the gap between conductive objects arranged side by side facing each other.
本発明は上述したように、誘電率の低い遮蔽板の両面に
所定面積を有する一対の電極を貼り付けてなる電極板を
相対向して並設されている導体物質に挿入し、同導体物
質と上記一対の電極夫々との間の静電容量を測定するの
であるから、従来ノギスやスキ間ゲージなどでは測定出
来なかつた水中にすきまがある場合に偉力を発揮するす
きま測定装置である。As described above, the present invention involves inserting an electrode plate, which is made by pasting a pair of electrodes having a predetermined area on both sides of a shielding plate with a low dielectric constant, into conductive materials arranged in parallel facing each other. Since it measures the capacitance between the electrodes and the above-mentioned pair of electrodes, it is a gap measuring device that is useful when there are gaps in the water that could not be measured with conventional calipers or gap gauges.
以下、本発明を第1図および第2図に示す一実施例につ
いて説明する。Hereinafter, one embodiment of the present invention shown in FIGS. 1 and 2 will be described.
1は誘電率の低いたとえば塩化ビニリデンのようなフィ
ルム状の遮蔽板であつて、その両面に所定面積を有する
一対の電極2a、2bが貼着され電極板Tを構成してい
る。Reference numeral 1 denotes a film-like shielding plate made of, for example, vinylidene chloride having a low dielectric constant, and a pair of electrodes 2a and 2b having a predetermined area are adhered to both sides of the shielding plate 1 to constitute an electrode plate T.
3aないし3cはリード線であつて一端は夫々図示して
いない静電容量を測定する測定器に接続されており、一
方リード線3a、3bの他端は夫々電極2a、2b、ま
たリード線3cは相対向して並設されている導体物質A
(5Bに接続されるものである。3a to 3c are lead wires, one end of which is connected to a measuring device for measuring capacitance (not shown), while the other ends of lead wires 3a and 3b are connected to electrodes 2a and 2b, respectively, and lead wire 3c. are conductor materials A arranged in parallel facing each other.
(It is connected to 5B.
ここで
電極2aと導体物質Aの間隔D,の容量 Ca電極2b
と導体物質Bの間隔D2の容量 Cb電極2aと電極2
bの間隔D,の容量 Ccリード線3aと3cの間で
測定される容量C1リード線3bと3cの間で測定され
る容量C,とすると(ただし電極2aは導体物質Aに対
向しているとする)第1図との等価回路は第2図のよう
になる。Here, the capacitance of the distance D between the electrode 2a and the conductive material A is Ca electrode 2b
and the capacitance of the distance D2 between the conductive material B and the Cb electrode 2a and the electrode 2
Capacitance C, measured between lead wires 3a and 3c; capacitance C, measured between lead wires 3b and 3c; ) The equivalent circuit of FIG. 1 is as shown in FIG. 2.
今、上記導体物質A,B間に比誘電率ε,の液体が満さ
れていて上記電極板Tをそのすきまに挿入しリード線3
cを上記導体物質AおよびBに接続したとする。Now, the space between the conductor materials A and B is filled with a liquid having a dielectric constant of ε, and the electrode plate T is inserted into the gap, and the lead wire 3
Suppose that c is connected to the conductive materials A and B above.
電極2aおよび2bの面積A、遮蔽板1の比誘電率ε2
、真空中の誘電率ε。Area A of electrodes 2a and 2b, relative dielectric constant ε2 of shielding plate 1
, dielectric constant ε in vacuum.
とするとCa=εo・ε,・A/D,,・・・・・・(
1)Cb=εo・εピA/D2,・・・・・・(2)C
c=εo・ε2・A/D,,・・・・・・(3)と表わ
される。Then, Ca=εo・ε,・A/D,,・・・・・・(
1) Cb=εo・εpiA/D2,...(2)C
It is expressed as c=εo·ε2·A/D, (3).
またC1=Ca+1/(1/Cb+1/Cc)であるか
ら(1),(2),(3)式を代入しC1=εo・εピ
A/d1+εo・ε1・A/(D2+ε1・D3/ε2
)。Also, since C1=Ca+1/(1/Cb+1/Cc), substitute equations (1), (2), and (3) into C1=εo・εpiA/d1+εo・ε1・A/(D2+ε1・D3/ε2
).
・・・・・・(4)を得る。ここでε1/ε2は十分
大きいので(4)式右辺第2項はD2に左右されずほと
んど一定である。......(4) is obtained. Here, since ε1/ε2 is sufficiently large, the second term on the right side of equation (4) is almost constant regardless of D2.
従つて同2項をCOとおくことによりD,=εo・εビ
A/(C1−CO)となる。Therefore, by setting the same second term as CO, D,=εo·εbiaA/(C1−CO).
同様にC2=Cb+1/(1/Ca+1/Cc)=εo
・ε1・A/D2+G
.゜.d2=j・εピV(C2−C?.)すなわち電極
板Tと導体物質AおよびBの間隔Dl,d2は、リード
線3aと3cおよび3bと、3cから測定される静電容
量によつて求めることができるので、上記電極板T自身
の厚さを加算することにより、導体物質A−B間のすき
まの寸法が測定することができる。Similarly, C2=Cb+1/(1/Ca+1/Cc)=εo
・ε1・A/D2+G.゜. d2=j・εpiV(C2-C?.) That is, the distance Dl, d2 between the electrode plate T and the conductive materials A and B is determined by the capacitance measured from the lead wires 3a, 3c and 3b, and 3c. Therefore, by adding the thickness of the electrode plate T itself, the dimension of the gap between the conductor material A and B can be measured.
このように本実施例では誘電率の低い遮蔽板1の両面に
面積Aを有する一対の電極2a,2bを貼着して電極板
T8lm成し、相対向して併設されている導体物質A−
B間に上記電極板Tを挿入し、上記導体物質A−Bにリ
ード線3cを接続するとともに同線3cと上記電極2a
・2cに夫々接続されているリード線3a,3bとの間
の静電容量を測定することにより、上記導体物質A−B
間のすきまの寸法を測定できるので、測定すべきすきま
が構造物の内部にあつたり、同部分が液体で浸されたり
しており、従来のようなノギスやスキ間ゲージでは測定
できないような相対向して併設されている導体物質のす
きまを測定することができる。As described above, in this embodiment, a pair of electrodes 2a and 2b having an area A are attached to both sides of a shielding plate 1 having a low dielectric constant to form an electrode plate T8lm, and a conductor material A-
The electrode plate T is inserted between B, and the lead wire 3c is connected to the conductive material A-B, and the wire 3c and the electrode 2a are connected to each other.
・By measuring the capacitance between the lead wires 3a and 3b connected to 2c, the conductor material A-B
Since it is possible to measure the dimensions of the gap between gaps, it is possible to measure relative gaps that cannot be measured with conventional calipers or gap gauges, such as when the gap to be measured is inside a structure or the same area is immersed in liquid. It is possible to measure the gap between conductive materials placed side by side.
第1図は本発明の一実施例を示す説明図、第2図は第1
図の等価回路図である。
1:遮蔽板、2aおよび2b:電IfL3aないし3c
:リード線、AおよびB:導体物質、T:電極板。FIG. 1 is an explanatory diagram showing one embodiment of the present invention, and FIG.
FIG. 2 is an equivalent circuit diagram of FIG. 1: Shielding plate, 2a and 2b: Electric IfL3a to 3c
: lead wire, A and B: conductor material, T: electrode plate.
Claims (1)
積を有する一対の電極とからなる電極板を、間隔を存し
て相対向して並設されている導体物質の間に挿入し、上
記電極のうち一方と上記導体物質間の静電容量および上
記電極の他方と上記導体物質間の静電容量を測定し、上
記導体物質の間隔を測定するようにしたことを特徴とす
るすきま測定装置。1. An electrode plate consisting of a shielded wave with a low dielectric constant and a pair of electrodes having a predetermined area affixed to both sides of the plate is placed between conductive materials that are placed side by side facing each other with a gap between them. and measures the capacitance between one of the electrodes and the conductive material and the capacitance between the other electrode and the conductive material, thereby measuring the distance between the conductive materials. Clearance measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5291977A JPS5945082B2 (en) | 1977-05-09 | 1977-05-09 | Clearance measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5291977A JPS5945082B2 (en) | 1977-05-09 | 1977-05-09 | Clearance measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53138365A JPS53138365A (en) | 1978-12-02 |
| JPS5945082B2 true JPS5945082B2 (en) | 1984-11-02 |
Family
ID=12928229
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5291977A Expired JPS5945082B2 (en) | 1977-05-09 | 1977-05-09 | Clearance measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5945082B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020534531A (en) * | 2017-09-21 | 2020-11-26 | エフ・ホフマン−ラ・ロシュ・アクチェンゲゼルシャフト | Use of solid-state fraction sensor to evaluate solid-state fraction of target drug sample, and solid-state fraction sensor |
-
1977
- 1977-05-09 JP JP5291977A patent/JPS5945082B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020534531A (en) * | 2017-09-21 | 2020-11-26 | エフ・ホフマン−ラ・ロシュ・アクチェンゲゼルシャフト | Use of solid-state fraction sensor to evaluate solid-state fraction of target drug sample, and solid-state fraction sensor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS53138365A (en) | 1978-12-02 |
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