JPS5945087B2 - Photoelectric element sensitivity correction circuit - Google Patents
Photoelectric element sensitivity correction circuitInfo
- Publication number
- JPS5945087B2 JPS5945087B2 JP9951578A JP9951578A JPS5945087B2 JP S5945087 B2 JPS5945087 B2 JP S5945087B2 JP 9951578 A JP9951578 A JP 9951578A JP 9951578 A JP9951578 A JP 9951578A JP S5945087 B2 JPS5945087 B2 JP S5945087B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- current
- sensitivity
- circuit
- photoelectric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Nuclear Medicine (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
【発明の詳細な説明】
本発明は、光量差を検出して装置、部品等の設定位置を
制御する回路に係り、さらに詳しく述べると、光量検出
素子として複数個の光電素子を用い、それらに同じ光量
を入射した場合における光電素子の感度差を補正する回
路に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a circuit that detects a difference in light intensity and controls the setting position of a device, a component, etc. The present invention relates to a circuit that corrects sensitivity differences between photoelectric elements when the same amount of light is incident.
例えば、半導体パターン製造工程などにおいて、ウェハ
面上にパターンマスクを位置合せをする場合、ミクロン
オーダーで極めて高精度に位置設定が成される。For example, when aligning a pattern mask on a wafer surface in a semiconductor pattern manufacturing process, positioning is performed with extremely high accuracy on the order of microns.
一般にこの種の位置決めには光検出技術が適用され、光
電素子を装置の位置決め部に近接しておき、それにガラ
スファイバーなどを介して導びかれた光源を透過あるい
は反射方式により当て、位置決め体を介して得られた光
量を検出することにより行われる。ところが、この種の
光電素子には製造上などから感度ばらつきがあり、高精
度の位置決めをするためには各々の光電素子間の感度が
一定になるように感度補正を要する。Generally, photodetection technology is applied to this type of positioning, in which a photoelectric element is placed close to the positioning part of the device, and a light source guided through a glass fiber or the like is applied to the positioning body using a transmission or reflection method. This is done by detecting the amount of light obtained through the However, this type of photoelectric element has sensitivity variations due to manufacturing reasons, and in order to perform highly accurate positioning, sensitivity correction is required so that the sensitivity between each photoelectric element is constant.
まず、従来は光電素子間の感度ばらつきを極力少なくす
る方法として、同じ条件で多数の光電素子の感度を測定
し、感度が最も一致している光電素子を選択する方法で
ある。First, a conventional method for minimizing variations in sensitivity between photoelectric elements is to measure the sensitivities of a large number of photoelectric elements under the same conditions and select the photoelectric element with the most matching sensitivity.
しかし、この方法は周囲温度の変化、経時変化等による
感度のドリフトなどを考えた場合、各々の特性は大きく
変化し、やはり高精度の位置決めができない。また、こ
れを解決する手段として、例えば、2個の光電素子に接
続される負荷抵抗のうち一方の抵抗をポテンショメータ
に置換して、これを調整して他方の受光素子に見かけ上
感度の合致させる方法が考えられる。However, with this method, when considering sensitivity drift due to changes in ambient temperature, changes over time, etc., each characteristic changes significantly, and highly accurate positioning is still not possible. In addition, as a means to solve this problem, for example, one of the load resistors connected to the two photoelectric elements is replaced with a potentiometer, and this is adjusted so that the apparent sensitivity matches that of the other photodetector. There are possible ways.
しかし、この場合、機械要素が介入させるため駆動系の
制御が煩雑となるばかりでなく信頼性、精度に乏しく、
スピードが遅くかつ自動化できない欠点がある。本発明
は上記した従来技術の欠点に鑑み、光電素子による位置
決め精度と信頼性を向上させ、制御の自動化を図ると共
に、光電素子の感度補正回路の簡素化を図ることを目的
とする。However, in this case, the control of the drive system is not only complicated due to the intervention of mechanical elements, but also lacks reliability and precision.
The drawback is that it is slow and cannot be automated. In view of the above-mentioned drawbacks of the prior art, it is an object of the present invention to improve the positioning accuracy and reliability of a photoelectric element, automate control, and simplify the sensitivity correction circuit of the photoelectric element.
本発明は、前述の光電素子に補正回路を設ける方法によ
るものであつて、同じ条件にある複数個の光電素子間の
感度差を電圧信号として検出し、これをデイジタル信号
に変換し、感度差情報として記憶し、その記憶内容をさ
らにアナログ電圧信号に変換し、誤差信号として前記複
数個の光電素子のいずれかIつにフイードバツク補正し
て他の光電素子と感度を台致させ、上記目的を達成した
ものである。The present invention is based on a method of providing a correction circuit in the photoelectric element described above, and detects the difference in sensitivity between a plurality of photoelectric elements under the same conditions as a voltage signal, converts it into a digital signal, and converts the difference in sensitivity into a digital signal. The above purpose is achieved by storing the information as information, further converting the stored content into an analog voltage signal, and applying feedback correction to any one of the plurality of photoelectric elements as an error signal to match the sensitivity with the other photoelectric elements. This has been achieved.
以下、添付図に従つて本発明を詳述する。The present invention will be described in detail below with reference to the accompanying drawings.
図は本発明の実施の一例で、2つの光電素子を用いた場
合における光電素子の感度補正回路図である。図中、1
,2は図示していない位置決め体に近接に配設される光
電素子なるフオトダイオードで、やはり図示していない
ガラスフアイバ一等により導かれた検出光3を受光し、
光電変換するものである。4,5はオペアンプ0P1,
0P2および同抵抗値Rの抵抗Rl,R2により構成さ
れた電流一電圧変換回路、6はオペアンプ0P3と各々
が同じ値の抵抗R3,R4,R5,R6により構成され
た電圧差動回路、7は電圧差動回路6のアナログ出力電
圧をデイジタル信号に変換するアナログーデイジタル変
換器(以下A/D変換器と略ず)、8は補正開始信号1
1により起動され、前記A/D変換器出力を感度誤差情
報として記憶する記憶回路、9は記憶回路8のデイジタ
ル出力信号を再びアナログ出力電圧に変換するデイジタ
ルーアナログ変換器(以下、D/A変換器と略す)、1
0はオペアンプ0P4と、各々が同じ値の抵抗R7,R
8,R9,RlOと、抵抗値Rの抵抗Rllとにより構
成された電圧一電流変換回路であつて、この電圧一電流
変換回路10の出力なる補正信号は、前述のフオトダイ
オード1のカソード側に入力されている。The figure is an example of the implementation of the present invention, and is a sensitivity correction circuit diagram of a photoelectric element when two photoelectric elements are used. In the figure, 1
, 2 is a photodiode, which is a photoelectric element, arranged close to a positioning body (not shown), which receives detection light 3 guided by a glass fiber (not shown), etc.
It performs photoelectric conversion. 4 and 5 are operational amplifiers 0P1,
0P2 is a current-to-voltage conversion circuit composed of resistors Rl and R2 having the same resistance value R; 6 is a voltage differential circuit composed of an operational amplifier 0P3 and resistors R3, R4, R5, and R6 each having the same value; 7 is a voltage differential circuit composed of resistors R3, R4, R5, and R6 each having the same resistance value; An analog-digital converter (hereinafter abbreviated as A/D converter) converts the analog output voltage of the voltage differential circuit 6 into a digital signal, 8 is a correction start signal 1
1 is activated and stores the output of the A/D converter as sensitivity error information; 9 is a digital-to-analog converter (hereinafter referred to as D/A converter) that converts the digital output signal of the storage circuit 8 again into an analog output voltage; converter), 1
0 is the operational amplifier 0P4 and resistors R7 and R, each having the same value.
8, R9, and RlO, and a resistor Rll with a resistance value R. A correction signal output from this voltage-to-current converter circuit 10 is connected to the cathode side of the photodiode 1 described above. It has been entered.
図示の如く接続構成された回路に?いて、その動作説明
をずれば、フオトダイオードの感度補正にあたり、まず
、同じ光量の検出光3をフオトダイオード1,2に投光
する。In the circuit connected and configured as shown? To explain the operation differently, when correcting the sensitivity of the photodiodes, first, the same amount of detection light 3 is projected onto the photodiodes 1 and 2.
そこでフオトダイオード1,2は検出光3を電流11,
12に変換する。その電流11,12は選別されたフオ
トダイオード1,2を用いてある故、本来同じ値である
べきであるが、前述の如く素子の劣化、経時変化等によ
り感度差が生じているため図示の如く、後段の補正回路
が作動する。すなわち、フオトダイオード1,2から得
られる電流11,12を後段の抵抗Rl,R2の抵抗値
を共にRとする電流一電圧変換回路4,5により電圧V
,,2に変換する。Therefore, the photodiodes 1 and 2 convert the detection light 3 into a current 11,
Convert to 12. The currents 11 and 12 should have the same value because selected photodiodes 1 and 2 are used, but as mentioned above, there is a difference in sensitivity due to element deterioration, changes over time, etc. As such, the subsequent correction circuit operates. That is, the currents 11 and 12 obtained from the photodiodes 1 and 2 are converted to a voltage V by the current-to-voltage conversion circuits 4 and 5 in which the resistance values of the subsequent resistors Rl and R2 are both R.
,,Convert to 2.
そのときの電流11,12と電圧1,2の関係は次式の
如くである。1=11・R,V2−12・R
電流一電圧変換回路4,5より出力される上記電圧1,
2を、次段の電圧差動回路6に入力することによりその
出力に差動電圧V3を得る。The relationship between currents 11 and 12 and voltages 1 and 2 at that time is as shown in the following equation. 1=11・R, V2−12・R The above voltage 1 output from the current-voltage conversion circuits 4 and 5,
By inputting the voltage V2 into the voltage differential circuit 6 at the next stage, a differential voltage V3 is obtained at its output.
この場合電圧差動回路6に右ける抵抗R3〜R6は同じ
抵抗値であるので、差動電圧,にはV,=V2−V1−
R(12−11)
で示される入力の差分電圧が得られる。In this case, the resistors R3 to R6 in the voltage differential circuit 6 have the same resistance value, so the differential voltage is V, =V2-V1-
An input differential voltage represented by R(12-11) is obtained.
この差分電圧,を後段のA/D変換器7にて、デイジタ
ル信号に変換し、これは感度補正開始信号11により感
度誤差の情報として、記憶回路8に記憶される。記憶回
路8に記憶された感度誤差のデイジタル情報は、次段の
D/A変換器にてアナログ電圧V4に変換される。な旧
、ここでA/D変換器7とD/A変換器9は、負の電圧
をも処理する必要があるたY5.両極性−オフセツトバ
イナリ型のものを使用するものとする。また、D/A変
換器eにA/D変換器7と入出力特性が全く逆のものを
利用することにより、V4=,=R(12−11)
の関係を得る。This differential voltage is converted into a digital signal by the A/D converter 7 at the subsequent stage, and this is stored in the storage circuit 8 as sensitivity error information by the sensitivity correction start signal 11. The digital information of the sensitivity error stored in the storage circuit 8 is converted into an analog voltage V4 by a D/A converter at the next stage. In the old case, the A/D converter 7 and the D/A converter 9 needed to process negative voltage as well. A bipolar offset binary type shall be used. Further, by using a D/A converter e having completely opposite input/output characteristics to that of the A/D converter 7, the following relationship is obtained: V4=,=R(12-11).
次に、上記D/A変換器9の出力電圧4を電圧一電流変
換回路10に入力して、その出力に電流1,を得る。Next, the output voltage 4 of the D/A converter 9 is inputted to the voltage-to-current conversion circuit 10 to obtain the current 1 as its output.
ここで電圧一電流変換回路10にぉける抵抗R7,R8
,R9,RlOは同じ抵抗値で、また抵抗Rllの抵抗
値はRであるので、なる関係が得られる。このようにし
て、電圧一電流変換回路10から得られる電流1,6つ
まり、電流(1,−11)をフオトダイオード1の出力
電流にフイードバツクずれば、そのフオトダイオード1
より得られる電流は、11+(12−11)=12
となり、フオトダイオード2から出力される電流と合致
し6フオトダイオード1の感度がフオトダイオード2の
感度に対し補正されることになる。Here, resistors R7 and R8 in the voltage-current conversion circuit 10
, R9, and RlO have the same resistance value, and the resistance value of the resistor Rll is R, so the following relationship is obtained. In this way, if the currents 1 and 6 obtained from the voltage-current conversion circuit 10, that is, the current (1, -11), are feedback-shifted to the output current of the photodiode 1, the output current of the photodiode 1
The current obtained is 11+(12-11)=12, which matches the current output from photodiode 2, and the sensitivity of photodiode 1 is corrected with respect to the sensitivity of photodiode 2.
したがつて、位置決め制御に先立ち、2つのダイオード
1,2の感度が同じとなるように補正を行なつてδけば
、位置決め制御時、これに同量の光が与えられたとき光
電素子間の感度不一致による位置決め誤差は避けられ、
正確な位置決め制御が自動的に達成できる。なお、光亀
素子なるフオトダイオード1,2の経年変化、劣化等に
よる感度変化と共に、そのフオトダイオードの補正回路
を構成するA/D変換器、D/A変換器の分解能と、抵
抗の温度による変化が考えられるが、位置決め誤差をカ
バーし得る分解能(ビツト数)を有するA/D変換器お
よびD/A変換器並び(こ、許容誤差への影響を無視で
きる温度係数を有する抵抗器を選択すれば、その問題は
解決でき、それでも従来の方式に比較して信頼性が高く
、かつ簡素化が達成でき得る等で2利余るところ大であ
る。Therefore, prior to positioning control, if correction is made so that the sensitivities of the two diodes 1 and 2 are the same (δ), when the same amount of light is applied to them during positioning control, the difference between the photoelectric elements Positioning errors due to sensitivity mismatch are avoided,
Accurate positioning control can be achieved automatically. In addition to the sensitivity change due to aging and deterioration of the photodiodes 1 and 2, which are optical elements, the sensitivity changes are due to the resolution of the A/D converter and D/A converter that make up the correction circuit of the photodiode, and the temperature of the resistor. Although variations are possible, select A/D converters and D/A converters with resolution (number of bits) that can cover positioning errors (and resistors with temperature coefficients that can ignore the effect on tolerance errors). If this is done, the problem can be solved, and the reliability is still higher than the conventional method, and simplification can be achieved, so there is a big advantage.
また、当然ながら本発明は上記の位置決め制御の実施例
に限るものでなく、光電素子を用いた光電検出による制
御装置に広く応用できるものである。尚、上述の実施例
では光電変換素子が2個設けられている場合}こついて
説明したが、本発明はこれに限定されるものではなく
例えば次の様に拡張することにより、光電変換素子が複
数個設けられている場合にも容易に適用することができ
る。Furthermore, it goes without saying that the present invention is not limited to the above embodiments of positioning control, but can be widely applied to control devices based on photoelectric detection using photoelectric elements. In the above embodiment, the case where two photoelectric conversion elements are provided was explained, but the present invention is not limited to this.
For example, by expanding as follows, it can be easily applied even when a plurality of photoelectric conversion elements are provided.
即ち、同じ条件にあるn個の光電素子のうち1つを基準
の光電素子とし(上記の実施例ではフオトダイオード2
に相当す6)、更にとなり台う光電素子間の感度差を(
n−1)個の電圧差動回路により(n−1)個の亀圧ぱ
号として検出する。この(n−1)個の電圧信号をそれ
ぞれデイジタル信号に変換して記Lし、更にこれを(n
−1)個のアナログ雪号に変換して、上記基準の光覗素
子を除く(n−1)個の光電素子にそれぞれ誤差信号と
してフイードバツク補正することにより、n個の光電素
子の感度を同一にすることができる。これによると、光
電素子の補正回路は簡単で、しかも高信頼で、高精度の
自動補正が達成できる利点並びに効果がある。That is, one of the n photoelectric elements under the same conditions is used as a reference photoelectric element (in the above embodiment, photodiode 2
6), and furthermore, the sensitivity difference between adjacent photoelectric elements is expressed as (
(n-1) voltage differential circuits detect (n-1) tortoise pressure signals. Each of these (n-1) voltage signals is converted into a digital signal and written as L, and further this is (n
-1) analog signals and performs feedback correction as an error signal to each of the (n-1) photoelectric elements excluding the reference optical peep element, thereby making the sensitivity of the n photoelectric elements the same. It can be done. According to this, the correction circuit for the photoelectric element is simple, highly reliable, and has the advantage and effect of achieving highly accurate automatic correction.
添付図は本発明による光電素子の感度補正回路の一実施
例を示ず図である。
1,2・・・・・・フオトダイオード、3・・・・・・
検出光、4,5・・・・・電流一電圧変換回路、6・・
・・・・市圧差動回路、7・・・・・・A/Dの変換器
、8・・・・記憶回路29・・・・・・D/A変換器、
10・・・・電圧一電流変換回路、R1〜Rll・・・
・・・抵抗、0P1〜0P4・・・・・.オペアンプ。The attached figure is a diagram that does not show an embodiment of a sensitivity correction circuit for a photoelectric element according to the present invention. 1, 2...Photodiode, 3...
Detection light, 4, 5...Current-voltage conversion circuit, 6...
... City pressure differential circuit, 7 ... A/D converter, 8 ... Memory circuit 29 ... D/A converter,
10... Voltage-current conversion circuit, R1 to Rll...
...Resistance, 0P1 to 0P4... operational amplifier.
Claims (1)
感度補正回路であつて、該複数個の光電素子から得られ
る検出電流を電圧に変換する光電素子と同数の電流−電
圧変換回路と、該各々の電流−電圧変換回路の出力電圧
を入力とし、該電流−電圧変換回路間の差電圧を出力す
る電圧差動回路と、該電圧差動回路の出力電圧をディジ
タル信号に変換した後、感度誤差情報として記憶する記
憶回路と、該記憶回路に記憶されたディジタル信号をア
ナログ信号に変換し、それを前記検出電流の差分電流に
変換する電圧−電流変換回路とから成り、該電圧−電流
変換回路の出力差分電流を、前記いずれか1つの光電素
子にフィードバックし、該光電素子の感度が他の光電素
子の感度と同じになる如く補正するように構成したこと
を特徴とする光電素子の感度補正回路。1. A sensitivity correction circuit between a plurality of installed photoelectric elements that receive the same amount of light, and a current-voltage conversion circuit of the same number as the number of photoelectric elements that converts the detection current obtained from the plurality of photoelectric elements into voltage; a voltage differential circuit which inputs the output voltage of each of the current-voltage conversion circuits and outputs a difference voltage between the current-voltage conversion circuits; and after converting the output voltage of the voltage differential circuit into a digital signal, It consists of a storage circuit that stores sensitivity error information, and a voltage-current conversion circuit that converts the digital signal stored in the storage circuit into an analog signal and converts it into a differential current of the detected current. A photoelectric device characterized in that the output difference current of the conversion circuit is fed back to any one of the photoelectric devices and corrected so that the sensitivity of the photoelectric device becomes the same as the sensitivity of the other photoelectric devices. Sensitivity correction circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9951578A JPS5945087B2 (en) | 1978-08-17 | 1978-08-17 | Photoelectric element sensitivity correction circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9951578A JPS5945087B2 (en) | 1978-08-17 | 1978-08-17 | Photoelectric element sensitivity correction circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5526459A JPS5526459A (en) | 1980-02-25 |
| JPS5945087B2 true JPS5945087B2 (en) | 1984-11-02 |
Family
ID=14249380
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9951578A Expired JPS5945087B2 (en) | 1978-08-17 | 1978-08-17 | Photoelectric element sensitivity correction circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5945087B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61170488A (en) * | 1985-01-25 | 1986-08-01 | 太刀川 紀男 | Bobbin thread feed mechanism of sewing machine |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5759184A (en) * | 1980-09-27 | 1982-04-09 | Hitachi Medical Corp | Scintilallation camera |
| JPS5847223A (en) * | 1981-09-17 | 1983-03-18 | Ricoh Co Ltd | Method and device for correcting sensitivity of solid state sensor |
| JPS61105477A (en) * | 1984-10-29 | 1986-05-23 | Nec Corp | Laser light warning device |
-
1978
- 1978-08-17 JP JP9951578A patent/JPS5945087B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61170488A (en) * | 1985-01-25 | 1986-08-01 | 太刀川 紀男 | Bobbin thread feed mechanism of sewing machine |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5526459A (en) | 1980-02-25 |
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