JPS5952378B2 - Defect determination method for sheet materials - Google Patents
Defect determination method for sheet materialsInfo
- Publication number
- JPS5952378B2 JPS5952378B2 JP859876A JP859876A JPS5952378B2 JP S5952378 B2 JPS5952378 B2 JP S5952378B2 JP 859876 A JP859876 A JP 859876A JP 859876 A JP859876 A JP 859876A JP S5952378 B2 JPS5952378 B2 JP S5952378B2
- Authority
- JP
- Japan
- Prior art keywords
- photoelectric conversion
- diffraction image
- light
- binary code
- sheet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000007547 defect Effects 0.000 title claims description 31
- 238000000034 method Methods 0.000 title claims description 13
- 239000000463 material Substances 0.000 title claims description 7
- 238000006243 chemical reaction Methods 0.000 claims description 19
- 230000001427 coherent effect Effects 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 5
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 230000002950 deficient Effects 0.000 description 9
- 239000004744 fabric Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000012850 discrimination method Methods 0.000 description 2
- 239000002759 woven fabric Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
【発明の詳細な説明】
本発明はシート状物に存在する欠点を検出、種類判別す
る方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting and determining the type of defects present in a sheet-like material.
従来、シート状物すなわち鉄板、紙、フィルム、布など
に存在する欠点を判別する方法として(1)被検査面上
を光スポットで走査しその反射光あるいは透過光を光電
変換して得られた電気信号波形を解析して欠点判別する
方法。Conventionally, the methods used to identify defects in sheet-like objects, such as iron plates, paper, films, cloth, etc., were as follows: (1) Scanning a light spot over the surface to be inspected and photoelectrically converting the reflected or transmitted light. A method to identify defects by analyzing electrical signal waveforms.
(2)被検査面上からの透過光、あるいは反射光をフー
リエ変換用レンズを透過させマッチドフィルタ、コリメ
ーテイングレンズを介して欠点パターンの相関像を得、
その相関像により欠点判別をする方法(特開昭49−6
0782)などがある。(2) Transmit the transmitted light or reflected light from the surface to be inspected through a Fourier transform lens to obtain a correlation image of the defect pattern via a matched filter and collimating lens;
A method of determining defects based on the correlation image (Japanese Patent Laid-Open No. 49-6
0782).
しかし(1)の方法においては得られる電気信号波形が
複雑であり特に被検査物が布などの場合布自体が完全な
格子状を成していないので(1)の方法で使われるよう
な光スポットではその布独自の不規則性が正常部分の電
気信号波形として取り出され欠点部分における信号のS
/N比が悪く、信号波形も複雑となるため信号波形を解
析して欠点判別を行うことは、判別寺間も長くかかり実
用上不可能である場合が多い。また(2)の方法では種
々の欠陥パターンのフーリエ変換像を表示したマッチド
フィルタを使用するため、平面上に各種欠点に対応した
多くの光電変換素子が必要であると同時にマッチドフィ
ルタの作製が非常に難しい。以上、上記の方法において
は実用化が極めて困難であるが、本発明では、このよう
な欠点を改良するとともに装置の複雑さをなくしかつ高
速でシート材の欠点を判別することを可能ならしめたも
のである。However, in method (1), the electrical signal waveform obtained is complex, and especially when the object to be inspected is cloth, the cloth itself does not form a perfect grid, so the light used in method (1) is In the spot, the unique irregularities of the cloth are extracted as the electrical signal waveform of the normal part, and the S of the signal in the defective part is extracted.
Since the /N ratio is poor and the signal waveform is complicated, it is often practically impossible to analyze the signal waveform and determine the defect because it takes a long time to perform the determination. In addition, method (2) uses matched filters that display Fourier transformed images of various defect patterns, so many photoelectric conversion elements corresponding to various defects are required on a plane, and at the same time, the fabrication of matched filters is extremely difficult. It's difficult. As mentioned above, it is extremely difficult to put the above method into practical use, but the present invention improves these drawbacks, eliminates the complexity of the device, and makes it possible to identify defects in sheet materials at high speed. It is something.
この目的を達成するための構成は被検査面にコヒーレン
ト光を照射して欠点部分の透過光あるいは反射光のフラ
ウンホーファ回折像を得て複数個の光電変換素子により
電気信号を得る検出手段と、得られた電気信号を二値コ
ードに変換しその二値コードパターンにより欠点の判別
を行なう判別手段とから成ることを特徴とする。以下に
本発明の透過法を用いた実施例を図面に基いて詳細に説
明する。第1図において1はコヒーレント光を照射する
ためのレーザ光源、2、2’はレーザ光束を大きくする
ためのコリメーテイングレンズでシート状物を検査する
走査光点を所定の大きさに設定する。The configuration for achieving this purpose includes a detection means that irradiates the surface to be inspected with coherent light to obtain a Fraunhofer diffraction image of the transmitted light or reflected light of the defective area, and obtains an electrical signal using a plurality of photoelectric conversion elements; The present invention is characterized by comprising a discriminating means for converting the received electrical signal into a binary code and discriminating defects based on the binary code pattern. Embodiments using the transmission method of the present invention will be described in detail below with reference to the drawings. In Fig. 1, 1 is a laser light source for irradiating coherent light, 2 and 2' are collimating lenses for increasing the laser beam, and a scanning light spot for inspecting a sheet-like object is set to a predetermined size. .
3は被検査面を光走査するための回転ミラーで高速モー
タ(図示せず)によつて駆動せられる。Reference numeral 3 denotes a rotating mirror for optically scanning the surface to be inspected, which is driven by a high-speed motor (not shown).
4はシート状物で長手方向(矢印方向)に走行している
。4 is a sheet-like material running in the longitudinal direction (in the direction of the arrow).
5はレーザ光源1から被検査面上に照射された走査光点
、6はフーリエ変換用レンズでその前側焦点面が被検査
面上にあり、後側焦点面が受光面7の位置になるよう配
置されている。5 is a scanning light spot irradiated onto the surface to be inspected from the laser light source 1; 6 is a Fourier transform lens whose front focal plane is on the surface to be inspected, and its rear focal plane is at the position of the light receiving surface 7. It is located.
レーザ光源1から照射されたコヒーレント光は被検査面
を透過してフーリエ変換用レンズ6を透過しその後側焦
点面上の受光面7に被検査面のフラウンホーフア回折像
を形成する。第2図は被検査物を織物としたときのフラ
ウンホーフア回折像を示す模式図でありaは織物の正常
部分、bは欠点部分のフラウンホーフア回折像を示して
いる。フラウンホーフア回折の性質により被検査物の走
行移動に対して回折像の形状は変わらない。本発明は次
の特長を有する。即ち回折像は原点(0次回折点)に関
して点対称である。したがつて各種欠点による回折像変
化は回折像の1/2の像面だけ受光してやればよい。Coherent light emitted from the laser light source 1 passes through the surface to be inspected, passes through the Fourier transform lens 6, and forms a Fraunhofer diffraction image of the surface to be inspected on the light receiving surface 7 on the focal plane on the rear side. FIG. 2 is a schematic diagram showing a Fraunhofer diffraction image when the object to be inspected is a woven fabric, in which a shows the Fraunhofer diffraction image of a normal part of the woven fabric, and b shows a Fraunhofer diffraction image of a defective part. Due to the nature of Fraunhofer diffraction, the shape of the diffraction image does not change as the object to be inspected moves. The present invention has the following features. That is, the diffraction image is point symmetrical with respect to the origin (0th order diffraction point). Therefore, changes in the diffraction image due to various defects can be avoided by receiving only 1/2 of the image plane of the diffraction image.
これによつて受光のための光電変換素子は少なくて済み
非常に簡略化することができる。As a result, the number of photoelectric conversion elements for receiving light can be reduced and the device can be extremely simplified.
第1図に示す受光面7は第2図A,bに示す全フラウン
ホーフア回折像8の破線枠内9で示す1/2の像を受光
するものであり、その受光面には、たとえば、第3図の
ように複数個の光電変換素子Dl,D−2,・・・・・
・D−nが配置されている。第4図にフラウンホーフア
回折像の受光面7からの電気信号を処理して欠点を判別
する手段のプロツク線図を示す。二値コード変換部では
前段の回折像検出部における複数の光電変換素子Dl,
D−2,・・・・・・D−nの出力を複数段階のレベル
値に分割し、各々のレベル値信号を二値コード(パルス
信号)に変換する。欠点判別部ではあらかじめ各種の判
別すべき各々の欠点について対応づけられている二値コ
ードパターンとの比較を行ない欠点の種類を判別する。
同時に欠点位置検出部は回転ミラー3からの同期信号を
とり出し欠点の位置を決定し、欠点種類とともに記憶部
に入力させ記録する。光電変換素子に入力された電気信
号を処理して欠点を判別する過程を第5図、第6図を使
つてさらに詳しく説明する。The light-receiving surface 7 shown in FIG. 1 receives 1/2 of the entire Fraunhofer diffraction image 8 shown in FIGS. As shown in Figure 3, a plurality of photoelectric conversion elements Dl, D-2,...
・D-n is placed. FIG. 4 shows a block diagram of means for processing electrical signals from the light-receiving surface 7 of the Fraunhofer diffraction image to determine defects. In the binary code conversion section, a plurality of photoelectric conversion elements Dl in the previous stage diffraction image detection section,
The outputs of D-2, . . . D-n are divided into a plurality of levels of level values, and each level value signal is converted into a binary code (pulse signal). The defect discriminating section discriminates the type of defect by comparing it with a binary code pattern associated with each defect to be discriminated in advance.
At the same time, the defect position detection unit extracts the synchronization signal from the rotating mirror 3, determines the position of the defect, and inputs the defect type and the type into the storage unit for recording. The process of processing electrical signals input to the photoelectric conversion element to determine defects will be explained in more detail with reference to FIGS. 5 and 6.
すなわち第5図、第6図においてaは正常部bは欠点部
のそれぞれ一部分図でフラウンホーフア回折像をその受
光部の一例を示している。That is, in FIGS. 5 and 6, a shows a normal part, b shows a partial view of a defective part, and shows an example of a light receiving part of a Fraunhofer diffraction image.
第5図aにおける各光電変換素子の出力を二値コード変
換部で第6図のような二値コード(1あるいは0)に変
換し第5図bにおける各光電変換素子の出力を第6図b
のような二値コードに変換する。The output of each photoelectric conversion element in FIG. 5a is converted into a binary code (1 or 0) as shown in FIG. 6 by a binary code converter, and the output of each photoelectric conversion element in FIG. b
Convert to binary code like .
第6図A,bにおける上下段2つの二値コードLl,L
2は第7図に示すように各光電変換素子の出力をある適
当なレベル1 (L1)とそれよりも低いレベル2(L
2)とに分割した信号を表わす。Two binary codes Ll and L in the upper and lower rows in Fig. 6A and b
2, as shown in Figure 7, the output of each photoelectric conversion element is divided into a certain appropriate level 1 (L1) and a lower level 2 (L1).
2) represents the signal divided into and.
必要によつては3,4段の複数段階のレベル値に分割し
てもよい。If necessary, it may be divided into multiple level values of 3 or 4 levels.
に分割次に欠点判別部において第6図aあるいは第6図
bにおける各光電変換素子の出力を論理回路により組み
合わせあらかじめわかつている各種欠点の組み合わせと
比較し欠点種類を決定する。Next, in a defect discriminating section, the output of each photoelectric conversion element in FIG. 6a or 6b is combined by a logic circuit and compared with combinations of various defects known in advance to determine the defect type.
第5図、第6図においては光電変換素子を25個として
説明したが本発明ではこれに限定するものではない実施
例では欠点部のフラウンホーフア回折像検出に際しフラ
ウンホーフア回折像を直接光電変換素子で受光している
が、フラウンホーフア回折像から得られる空間周波数フ
イルタを受光面の直前に配置し正常部と重複するフラウ
ンホーフア回折光を取り除き欠点部によるフラウンホー
フア回折像の変化分のみを受光することも可能である。In FIGS. 5 and 6, 25 photoelectric conversion elements are used. However, the present invention is not limited to this. In the embodiment, when detecting a Fraunhofer diffraction image of a defective part, the Fraunhofer diffraction image is directly received by the photoelectric conversion element. However, it is also possible to place a spatial frequency filter obtained from the Fraunhofer diffraction image in front of the light-receiving surface to remove the Fraunhofer diffracted light that overlaps with the normal area and to receive only the changes in the Fraunhofer diffraction image due to the defective area. .
次に本発明の具体的実施例について述べる。(実施例)
シート状物として100cm幅のタフタ織物を使用し走
行速度を300m/Min、回転ミラー(六面鏡)の回
転数を2500min、5mwレーザーのスポツト径を
20mmとし、布面からの透過光のフラウンホーフア回
折像を取り出して織物の検反を行なつた。Next, specific examples of the present invention will be described. (Example)
A 100 cm wide taffeta fabric was used as the sheet material, the traveling speed was 300 m/min, the rotation speed of the rotating mirror (hexagonal mirror) was 2500 min, the spot diameter of the 5 mw laser was 20 mm, and Fraunhofer diffraction of the transmitted light from the cloth surface was performed. They took out the statue and inspected the fabric.
目視検反と比較して非常に高速でかつ正確に欠点検出及
びその種類判別をすることができた。なお走行速度は3
00m/Min〜350m/Minが適当であり、厚地
織物の場合にはレーザー光の出力を若干上げることによ
つて同様の結果が得られる。以上詳述したように本発明
ではシート状物にコヒーレント光を照射して欠点部分の
透過光あるいは反射光のフラウンホーフア回折像を複数
個の光電変換素子で受光し、得られた電気信号を複数段
階のレベル値に分割して、各々のレベル値信号を二値コ
ードに変換しその二値コードパターンにより各種欠点を
判別する欠点判別法であるので従来の方法に比べ装置が
単純化低コストとなり高速でシート材の欠点を判別する
ことが可能で実用に供することが容易で゛ある。Compared to visual inspection, we were able to detect defects and identify their types much faster and more accurately. The running speed is 3
00 m/Min to 350 m/Min is suitable, and in the case of thick fabrics, similar results can be obtained by slightly increasing the output of the laser beam. As described in detail above, in the present invention, a sheet-like object is irradiated with coherent light, a Fraunhofer diffraction image of transmitted light or reflected light from a defective part is received by a plurality of photoelectric conversion elements, and the obtained electrical signals are converted into multiple stages. This is a defect discrimination method that divides each level value signal into a binary code and identifies various defects based on the binary code pattern, so the device is simpler, lower cost, and faster than conventional methods. This makes it possible to identify defects in sheet materials and is easy to put into practical use.
第]図は本発明による欠点判別法の一実施例を示すシー
ト状物の欠点検出装置の配置図、第2図A,bはそれぞ
れ正常部欠点部のフラウンホーフア回折像の模式図、第
3図は受光面における光電素子の配置例、第4図は信号
処理過程を示すプロツク線図、第5図A,bはそれぞれ
正常部、欠点部のフラウンホーフア回折像と光電変換素
子との関係を示す配置例、第6図A,bはそれぞれの各
光電変換素子出力の二値コードの変換出力を示す図、第
7図は二値コードに変換するための2分割レベルを示す
図で゛ある。Figure] is a layout diagram of a defect detection device for a sheet-like object showing an embodiment of the defect discrimination method according to the present invention, Figures 2A and b are schematic diagrams of Fraunhofer diffraction images of defective areas in normal areas, and Figure 3. 4 is a block diagram showing the signal processing process, and FIGS. 5A and 5B are arrangement examples showing the relationship between Fraunhofer diffraction images and photoelectric conversion elements in normal and defective areas, respectively. For example, FIGS. 6A and 6B are diagrams showing the binary code conversion output of each photoelectric conversion element output, and FIG. 7 is a diagram showing the two-division level for converting into a binary code.
Claims (1)
いは反射光を光学変換してフラウンホーファ回折像を得
、その回折像面に設けた複数個の光電変換素子により電
気信号を得る検出手段と、各光電変換素子から得られた
電気信号を複数段階のレベル値に分割し各々のレベル値
信号を二値コードに変換し、その二値コードパターンに
より各種欠点を判別する判別手段とからなることを特徴
とするシート状物の欠点判別法。1. A detection means for obtaining a Fraunhofer diffraction image by irradiating a sheet-like object with coherent light and optically converting the transmitted light or reflected light, and obtaining an electrical signal using a plurality of photoelectric conversion elements provided on the diffraction image plane; It is characterized by comprising a discriminating means that divides the electrical signal obtained from the photoelectric conversion element into a plurality of levels of level values, converts each level value signal into a binary code, and discriminates various defects based on the binary code pattern. A method for determining defects in sheet-like materials.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP859876A JPS5952378B2 (en) | 1976-01-28 | 1976-01-28 | Defect determination method for sheet materials |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP859876A JPS5952378B2 (en) | 1976-01-28 | 1976-01-28 | Defect determination method for sheet materials |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5292579A JPS5292579A (en) | 1977-08-04 |
| JPS5952378B2 true JPS5952378B2 (en) | 1984-12-19 |
Family
ID=11697394
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP859876A Expired JPS5952378B2 (en) | 1976-01-28 | 1976-01-28 | Defect determination method for sheet materials |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5952378B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5474792A (en) * | 1977-11-28 | 1979-06-15 | Nippon Steel Corp | Surface defect inspection method of steel plates |
-
1976
- 1976-01-28 JP JP859876A patent/JPS5952378B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5292579A (en) | 1977-08-04 |
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