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JPS5953500B2 - X-ray fluoroscopy equipment - Google Patents
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JPS5953500B2 - X-ray fluoroscopy equipment - Google Patents

X-ray fluoroscopy equipment

Info

Publication number
JPS5953500B2
JPS5953500B2 JP53067277A JP6727778A JPS5953500B2 JP S5953500 B2 JPS5953500 B2 JP S5953500B2 JP 53067277 A JP53067277 A JP 53067277A JP 6727778 A JP6727778 A JP 6727778A JP S5953500 B2 JPS5953500 B2 JP S5953500B2
Authority
JP
Japan
Prior art keywords
ray
television camera
video monitor
inspected
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53067277A
Other languages
Japanese (ja)
Other versions
JPS54158984A (en
Inventor
正司 藤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP53067277A priority Critical patent/JPS5953500B2/en
Publication of JPS54158984A publication Critical patent/JPS54158984A/en
Publication of JPS5953500B2 publication Critical patent/JPS5953500B2/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/043Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using fluoroscopic examination, with visual observation or video transmission of fluoroscopic images

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Description

【発明の詳細な説明】 本発明はX線透視検査装置に係り、とくに被検査物の透
視像と外観とを1台のビデオモニタで観察できるように
したX線透視検査装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an X-ray fluoroscopic inspection apparatus, and more particularly to an X-ray fluoroscopic inspection apparatus in which a fluoroscopic image and an external appearance of an object to be inspected can be observed on a single video monitor.

ICなどの電子部品の微細部分を透視検査する場合、X
線の領域にまで感度のある撮像管を使用したテレビカメ
ラで直接、X線透視像を撮像管ターゲットに入力して電
気信号に変換する方式をとる。この場合、撮像管のビー
ム走査エリアとビデオモニタの画面エリアとの比で相対
的に拡大されフた映像が得られ、拡大率の大きい拡大透
視が可能となるので、ICのウェハーのボンディングの
状態や微小部品の構造の検査に有効である。しかし、微
小部品の部分的拡大像がビデオモニタに拡大されて表示
されるため、被検査物のどの部分を検査しているのかが
わかりにくいという欠点がある。これに対処するため従
来は、第1図に示すような方法がとられていた。
When performing a transparent inspection of minute parts of electronic components such as ICs,
Using a television camera that uses an image pickup tube that is sensitive even to the ray region, a method is used in which the X-ray fluoroscopic image is directly input to the image pickup tube target and converted into an electrical signal. In this case, a relatively enlarged image is obtained based on the ratio of the beam scanning area of the image pickup tube to the screen area of the video monitor, and magnified fluoroscopy with a large magnification ratio is possible, so the bonding state of the IC wafer can be observed. It is effective for inspecting the structure of micro parts. However, since a partially enlarged image of the microcomponent is displayed on a video monitor, it has the disadvantage that it is difficult to understand which part of the object to be inspected is being inspected. In order to deal with this problem, a method as shown in FIG. 1 has conventionally been used.

即ち、X線管1から放射されたX線は、X−Yテーブル
3に載置された被j検査物2を透過しテレビカメラ4へ
入力される。撮像管5で電気信号に変換されたX線透視
像はビデオモニタ6で映像として表示される。このとき
被検査物の外観を撮像するため、工業用テレビカメラ2
Lビデオモニタ22などを別に設け、こ門の外観像とX
線透視像とを比較観察しながら検査していた。しかしな
がらこの方法は、工業用テレビカメラが斜め方向からし
か撮像できないため、ピットを合わせるのに別の工夫を
要すると共に、映像が見にくい欠点がある。さらに、検
査員は2フ台のビデオモニタを見る必要があるため検査
しにくいという難点があつた。本発明は従来の方法の欠
点を解消することを目的とするもので、本発明では、X
線源と被検査物との間にX線を透過し可視光線を反射す
るハーフ5ミラーを設け、X線透視像はX線テレビカメ
ラで、ハーフミラーで反射された外観は工業用テレビカ
メラでそれぞれ撮像し、X線テレビカメラの同期信号発
生部からの同期信号により同期したX線テレビカメラお
よび工業用テレビカメラそれぞれからのビデオ信号を信
号加工手段で適宜加工してビデオモニタに送り、1台の
ビデオモニタでX線透視像と外観とを同時にまたは切換
えて表示できるように構成して所期の目的を達成した。
That is, the X-rays emitted from the X-ray tube 1 pass through the inspection object 2 placed on the X-Y table 3 and are input to the television camera 4. The X-ray fluoroscopic image converted into an electrical signal by the image pickup tube 5 is displayed as an image on the video monitor 6. At this time, an industrial television camera 2 is used to image the appearance of the object to be inspected.
A separate L video monitor 22 is installed to display the external image of this gate and the
The inspection was conducted while comparing and observing the fluoroscopic image. However, this method has the disadvantage that an industrial television camera can only take images from an oblique direction, which requires additional efforts to align the pits and makes the images difficult to see. Another problem was that the inspector had to look at a two-foot video monitor, making it difficult to perform the inspection. The present invention aims to overcome the drawbacks of the conventional methods.
A half-5 mirror that transmits X-rays and reflects visible light is installed between the radiation source and the object to be inspected, and the X-ray fluoroscopic image is obtained using an X-ray television camera, and the appearance reflected by the half mirror is obtained using an industrial television camera. The video signals from the X-ray television camera and the industrial television camera, which are respectively imaged and synchronized by the synchronization signal from the synchronization signal generation section of the X-ray television camera, are appropriately processed by a signal processing means and sent to a video monitor. The desired purpose was achieved by configuring the video monitor to be able to display the X-ray fluoroscopic image and the external appearance at the same time or by switching between them.

以下図面を参照して本発明の一実施例を説明する。第2
図、第3図はそれぞれ本発明に係るX線透視検査装置の
一実施例の構成図およびプロツク図で、図において、X
線管などのX線源1とX一Yテーブル3に載置された被
検査物2との間に、X線を透過し被検査物からの可視光
を反射するハーフミラー7を反射面を被検査物に対向さ
せ所望角度傾斜させて設ける。このハーフミラー7は、
X線吸収が少なく且つ、可視光の反射率の高いもの、例
えばアルミ蒸着ミラーなどである。X−Yテーブル3の
下方にX線の領域にまで感度のある撮像管5を具えたX
線テレビカメラ4を設ける。また、前記ハーフミラー7
の反射光を受光する位置に工業用テレビカメラ8を設け
る。さらに信号加工手段としてミキサー9およびビデオ
モニタ6を適宜の場所に設け、前記X線テレビカメラ4
および工業用テレビカメラ8とミキサー9との間および
ミキサー9とビデオモニタ6との間をそれぞへ憚号線で
接続する。上述のハーフミラー7、X;線テレビカメラ
4、工業用テレビカメラ8、ミキサー9およびビデオモ
ニタ6は表示装置を構成する。つぎに第3図のプロツク
図をも参照しながら本実施例の作用および効果につき説
明する。
An embodiment of the present invention will be described below with reference to the drawings. Second
3 are a block diagram and a block diagram of an embodiment of the X-ray fluoroscopic inspection apparatus according to the present invention, respectively.
A half mirror 7 that transmits X-rays and reflects visible light from the object to be inspected is provided between the X-ray source 1 such as a ray tube and the object 2 placed on the X-Y table 3. It is provided facing the object to be inspected and tilted at a desired angle. This half mirror 7 is
The material has low X-ray absorption and high visible light reflectance, such as an aluminum vapor-deposited mirror. The
A line television camera 4 is provided. Further, the half mirror 7
An industrial television camera 8 is provided at a position to receive the reflected light. Furthermore, a mixer 9 and a video monitor 6 are provided at appropriate locations as signal processing means, and the X-ray television camera 4
The industrial television camera 8 and the mixer 9 are connected to each other, and the mixer 9 and the video monitor 6 are connected by cable lines. The above-mentioned half mirror 7, X-ray television camera 4, industrial television camera 8, mixer 9 and video monitor 6 constitute a display device. Next, the operation and effects of this embodiment will be explained with reference to the block diagram of FIG.

X−Yテーブル3を動かして被検査物2の検査部位をX
線源1からのX線ビームに合わせる。
Move the X-Y table 3 to move the inspection area of the object 2 to the
Align with the X-ray beam from source 1.

X線はハーフミラー7を透過し、被検査物2の検査部位
を透過して、そのX線透視像がX線テレビカメラ1へ入
力される。X線テレビカメラ1の同期5信号発生部4a
は同期信号をX線テレビの撮像部4bおよび工業用テレ
ビカメラ8に送り、各テレビカメラの偏向を制御して、
同期したビデオ信号を発生させる。ハーフミラー7で反
射された被検査物2の外観像は工業用テレビカメラ8に
入力される。X線テレビカメラ4および工業用テレビカ
メラ8からの互に同期したビデオ信号はミキサー9に送
られる。前記の各信号はミキサー9で混合されてビデオ
モニタ6に表示される。即ち、X線透視像と被検査物の
外観像の混合または外観がスーパーで表わされた映像が
ビデオモニタ6に表示される。ビデオモニタに例えば十
字線を設けておくことにより、検査部位が容易に確認で
き、1台のモニタで検査部位のX線透視像と被検査物の
外観像とが表示されるので、検査がやり易くなり、検査
能率が向上する。また、ハーフミラー7の設置により、
被検査物を直角に見た外観像が得られるので、映像が見
やすくなると共に、ピット合せに特別の工夫を必要とし
ない。なお、上述の実施例では、ミキサーでX線透視像
と外観像とを混合して表示するようにしたが、信号加工
手段として切換器を設け、上記の映像を任意に切換えて
単独に表示するようにすることもできる。
The X-rays pass through the half mirror 7 and through the inspection site of the object 2 to be inspected, and the X-ray fluoroscopic image thereof is input to the X-ray television camera 1. Synchronization 5 signal generator 4a of X-ray television camera 1
sends a synchronization signal to the imaging unit 4b of the X-ray television and the industrial television camera 8, controls the deflection of each television camera,
Generate a synchronized video signal. The external image of the inspected object 2 reflected by the half mirror 7 is input to an industrial television camera 8. Mutually synchronized video signals from the X-ray television camera 4 and the industrial television camera 8 are sent to a mixer 9. The aforementioned signals are mixed by a mixer 9 and displayed on a video monitor 6. That is, a mixture of an X-ray fluoroscopic image and an external appearance image of the object to be inspected, or an image in which the external appearance is superimposed, is displayed on the video monitor 6. For example, by providing a crosshair on the video monitor, the inspection area can be easily confirmed, and a single monitor can display an X-ray fluoroscopic image of the inspection area and an external image of the object to be inspected, making the inspection easier. This makes inspection easier and improves inspection efficiency. In addition, by installing the half mirror 7,
Since an external image of the inspected object viewed at right angles is obtained, the image is easy to see and no special effort is required for pit alignment. In the above embodiment, the X-ray fluoroscopic image and the external image are mixed and displayed using a mixer, but a switch is provided as a signal processing means to arbitrarily switch the above images and display them separately. You can also do it like this.

さらに、例えば10秒ごとに1秒間外観を表示するなど
、定期的に切換を行ないながら表示するようにしてもよ
い。以上詳述したように、本発明によれば、X線を透過
し可視光線を反射するハーフミラーを設けたことにより
、被検査物のX線透視像と被検査物を直角に見た外観像
とが、1台のビデオモニタで所望の映像形態で観察でき
るので、電子部品などのX線透視検査の能率向上ならび
に検査員の疲労軽減に寄与することが大きい。
Further, the external appearance may be displayed while being changed periodically, for example, by displaying the external appearance for 1 second every 10 seconds. As described in detail above, according to the present invention, by providing a half mirror that transmits X-rays and reflects visible light, an X-ray fluoroscopic image of the object to be inspected and an external appearance image of the object to be inspected viewed at right angles are obtained. can be observed in a desired image format on a single video monitor, which greatly contributes to improving the efficiency of X-ray fluoroscopic inspection of electronic components and reducing fatigue of inspectors.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はX線透視検査装置の従来例を示す構成図、第2
図および第3図はそれぞれ本発明に係るX線透視検査装
置の一実施例の構成図およびブロツク図である。 1・・・・・・X線源、2・・・・・・被検査物、4・
・・・・・X線テレビカメラ、4a・・・・・・同期信
号発生部、6・・・・・・ビデオモニタ、7・・・・・
・ハーフミラー、8・・・・・・工業用テレビカメラ、
9・・・・・・信号加工手段。
Figure 1 is a configuration diagram showing a conventional example of an X-ray fluoroscopic inspection device;
3 and 3 are a configuration diagram and a block diagram, respectively, of an embodiment of an X-ray fluoroscopic inspection apparatus according to the present invention. 1...X-ray source, 2...Object to be inspected, 4.
...X-ray television camera, 4a ... Synchronization signal generator, 6 ... Video monitor, 7 ...
・Half mirror, 8...Industrial TV camera,
9... Signal processing means.

Claims (1)

【特許請求の範囲】 1 X線源からのX線による被検査物の透視像をX線テ
レビカメラで撮像しビデオモニタで観察するものにおい
て、X線源と被検査物との間にX線を透過し可視光を反
射する如く設けられたハーフミラーと、このハーフミラ
ーで反射された被検査物の外観を撮像する工業用テレビ
カメラと、前記X線テレビカメラの同期信号発生部から
の同期信号により同期した前記X線テレビカメラおよび
工業用テレビカメラそれぞれからのビデオ信号を加工し
てビデオモニタに送る信号加工手段と、この信号加工手
段からの信号により被検査物の透視像およびまたは外観
を表示するビデオモニタとより成る表示装置を具備した
ことを特徴とするX線透視検査装置。 2 信号加工手段をミキサーで構成し、被検査物の透視
像と外観とを同時にビデオモニタで表示することを特徴
とする特許請求の範囲第1項記載のX線透視検査装置。 3 信号加工手段を切換器で構成し、被検査物の透視像
と外観とを適宜切換えてビデオモニタで表示することを
特徴とする特許請求の範囲第1項記載のX線透視検査装
置。
[Scope of Claims] 1 In an apparatus in which a transparent image of an object to be inspected due to X-rays from an X-ray source is captured with an X-ray television camera and observed on a video monitor, A half mirror provided to transmit visible light and reflect visible light, an industrial television camera that images the appearance of the inspected object reflected by this half mirror, and synchronization from a synchronization signal generator of the X-ray television camera. a signal processing means that processes the video signals from the X-ray television camera and the industrial television camera synchronized with the signals and sends them to a video monitor; An X-ray fluoroscopic inspection apparatus comprising a display device comprising a video monitor for displaying images. 2. The X-ray fluoroscopic inspection apparatus according to claim 1, characterized in that the signal processing means comprises a mixer, and the fluoroscopic image and external appearance of the object to be inspected are displayed simultaneously on a video monitor. 3. The X-ray fluoroscopic inspection apparatus according to claim 1, wherein the signal processing means is constituted by a switch, and the fluoroscopic image and external appearance of the object to be inspected are appropriately switched and displayed on a video monitor.
JP53067277A 1978-06-06 1978-06-06 X-ray fluoroscopy equipment Expired JPS5953500B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53067277A JPS5953500B2 (en) 1978-06-06 1978-06-06 X-ray fluoroscopy equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53067277A JPS5953500B2 (en) 1978-06-06 1978-06-06 X-ray fluoroscopy equipment

Publications (2)

Publication Number Publication Date
JPS54158984A JPS54158984A (en) 1979-12-15
JPS5953500B2 true JPS5953500B2 (en) 1984-12-25

Family

ID=13340303

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53067277A Expired JPS5953500B2 (en) 1978-06-06 1978-06-06 X-ray fluoroscopy equipment

Country Status (1)

Country Link
JP (1) JPS5953500B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05322803A (en) * 1992-05-15 1993-12-07 Sony Corp Method for confirming alignment of x ray, method for confirming alignment and aligning x ray, and x-ray inspecting device
JPH06281598A (en) * 1991-07-26 1994-10-07 Motoronikusu:Kk Apparatus and method for simultaneously displaying x-ray image and optical image of multilayered work
WO2014061461A1 (en) * 2012-10-17 2014-04-24 株式会社システムスクエア Apparatus for inspecting packaging body
JP2018128401A (en) * 2017-02-10 2018-08-16 東芝Itコントロールシステム株式会社 X-ray fluoroscopy system

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JPS58118732A (en) * 1982-01-08 1983-07-14 株式会社東芝 X-ray diagnostic apparatus
JPS59130706U (en) * 1983-02-21 1984-09-01 有限会社友信開発 Medical X-ray fluoroscopy equipment
US4995068A (en) * 1989-10-02 1991-02-19 S&S Inficon, Inc. Radiation therapy imaging apparatus
JP2830214B2 (en) * 1989-11-18 1998-12-02 株式会社島津製作所 Sample image display
US5590170A (en) * 1993-04-12 1996-12-31 Glenbrook Technologies X-ray inspection system
WO1996029821A2 (en) * 1995-03-21 1996-09-26 Philips Electronics N.V. Image pick-up apparatus
JP3896641B2 (en) * 1997-07-17 2007-03-22 株式会社島津製作所 X-ray fluoroscopic equipment
US6151380A (en) * 1998-02-11 2000-11-21 Glenbrook Technologies Inc. Ball grid array re-work assembly with X-ray inspection system
US6009145A (en) * 1998-02-11 1999-12-28 Glenbrook Technologies Inc. Ball grid array re-work assembly with X-ray inspection system
US6229873B1 (en) * 1999-09-30 2001-05-08 Siemens Corporate Research, Inc Method for aligning an apparatus for superimposing X-ray and video images
US6473489B2 (en) * 1999-09-30 2002-10-29 Siemens Corporate Research, Inc Apparatus for superimposition of X-ray and video images
DE10049103B4 (en) * 1999-09-30 2005-01-27 Siemens Corp. Research, Inc. Device for overlaying X-ray and video images
JP4087727B2 (en) * 2003-03-19 2008-05-21 富士フイルム株式会社 Radiation imaging system
JP4123373B2 (en) * 2003-12-24 2008-07-23 株式会社島津製作所 X-ray fluoroscope
WO2007005636A2 (en) * 2005-06-30 2007-01-11 Controlled Semiconductor, Inc. Semiconductor failure analysis tool
JP4665774B2 (en) * 2006-01-23 2011-04-06 株式会社島津製作所 X-ray inspection equipment
JP5209935B2 (en) 2007-10-23 2013-06-12 キヤノン株式会社 X-ray imaging apparatus, control method for X-ray imaging apparatus, program, and storage medium
JP2009131323A (en) 2007-11-28 2009-06-18 Canon Inc Imaging device
CN102499703A (en) * 2011-11-01 2012-06-20 盖伯晴 C-beam X-ray image system and special photographing mechanism
JP5720028B1 (en) 2013-10-03 2015-05-20 株式会社 システムスクエア Packaging inspection equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06281598A (en) * 1991-07-26 1994-10-07 Motoronikusu:Kk Apparatus and method for simultaneously displaying x-ray image and optical image of multilayered work
JPH05322803A (en) * 1992-05-15 1993-12-07 Sony Corp Method for confirming alignment of x ray, method for confirming alignment and aligning x ray, and x-ray inspecting device
WO2014061461A1 (en) * 2012-10-17 2014-04-24 株式会社システムスクエア Apparatus for inspecting packaging body
JPWO2014061461A1 (en) * 2012-10-17 2016-09-05 株式会社 システムスクエア Packaging inspection equipment
JP2018128401A (en) * 2017-02-10 2018-08-16 東芝Itコントロールシステム株式会社 X-ray fluoroscopy system

Also Published As

Publication number Publication date
JPS54158984A (en) 1979-12-15

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