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JPS5953660B2 - scanning electron microscope - Google Patents
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JPS5953660B2 - scanning electron microscope - Google Patents

scanning electron microscope

Info

Publication number
JPS5953660B2
JPS5953660B2 JP55037512A JP3751280A JPS5953660B2 JP S5953660 B2 JPS5953660 B2 JP S5953660B2 JP 55037512 A JP55037512 A JP 55037512A JP 3751280 A JP3751280 A JP 3751280A JP S5953660 B2 JPS5953660 B2 JP S5953660B2
Authority
JP
Japan
Prior art keywords
scanning
ray tube
cathode ray
brightness
electron beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55037512A
Other languages
Japanese (ja)
Other versions
JPS56145644A (en
Inventor
弘暢 森脇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NICHIDENSHI TEKUNIKUSU KK
Original Assignee
NICHIDENSHI TEKUNIKUSU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NICHIDENSHI TEKUNIKUSU KK filed Critical NICHIDENSHI TEKUNIKUSU KK
Priority to JP55037512A priority Critical patent/JPS5953660B2/en
Publication of JPS56145644A publication Critical patent/JPS56145644A/en
Publication of JPS5953660B2 publication Critical patent/JPS5953660B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Description

【発明の詳細な説明】 本発明は一段偏向の走査系をもった走査電子顕微鏡の改
良に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in a scanning electron microscope having a single-stage deflection scanning system.

一段偏向の走査系は二段偏向の走査系に比べ構造が簡単
であることから、比較的簡易型の走査電子顕微鏡にはよ
く使用されている。
Since the single-stage deflection scanning system has a simpler structure than the two-stage deflection scanning system, it is often used in relatively simple scanning electron microscopes.

第1図はその概略を示すもので、電子銃(図示せず)か
らの電子線は第1集束レンズ1により集束され、点Pに
焦点を結んで発散状態で絞り板2上に投射される。
FIG. 1 shows the outline of the system. An electron beam from an electron gun (not shown) is focused by a first focusing lens 1, focused on a point P, and projected onto an aperture plate 2 in a diverging state. .

この絞り板の開口を通過した電子線は唯一段のX、 Y
偏向コイル3により、二次元的に偏向、走査され、最終
段集束レンズ(対物レンズ)4の紋り5を通過したもの
が集束されて試料6上に照射される。
The electron beam that passed through the aperture of this aperture plate is the only one in the X and Y stages.
The light is two-dimensionally deflected and scanned by the deflection coil 3, and the light that passes through the ridge 5 of the final stage focusing lens (objective lens) 4 is focused and irradiated onto the sample 6.

(特公昭48−14383号公報参照)この様な走査
系では、偏向コイル3による偏向力及び偏向方向を変え
た場合、点Pより発散する電子線の異った部分が絞り5
を通過して試料6に投射されるため、電子線の強度分布
が一様でなければならない。
(Refer to Japanese Patent Publication No. 48-14383.) In such a scanning system, when the deflection force and deflection direction by the deflection coil 3 are changed, different parts of the electron beam diverged from the point P are moved to the aperture 5.
Since the electron beam is projected onto the sample 6 through the electron beam, the intensity distribution of the electron beam must be uniform.

実際に、数百倍以上の中倍高倍での観察に当っては、電
子線の中心部のみ使用されるため、試料に照射される電
子の強度分布は一様なものとなる。
In fact, when observing at medium and high magnifications of several hundred times or more, only the central part of the electron beam is used, so the intensity distribution of the electrons irradiated onto the sample becomes uniform.

しかし乍ら、数十倍位の極低倍観察においては、第2図
1で示すような電子線の周辺部まで利用しなければなら
ないので、中心部に対し、ΔIで示す如き強度の低下を
生ずる。
However, in extremely low magnification observation of several tens of times, it is necessary to utilize the peripheral part of the electron beam as shown in Figure 2, so it is necessary to reduce the intensity as shown by ΔI with respect to the central part. arise.

この様な周辺での強度低下のある電子線走査により試料
画像を得た場合、陰極線管画面の周辺部で輝度及びコン
トラストが低下し、像質の劣化は避けられない。
When a sample image is obtained by electron beam scanning with such a decrease in intensity in the periphery, the brightness and contrast decrease in the periphery of the cathode ray tube screen, and deterioration in image quality is unavoidable.

実際の写真判定では、観察倍率35倍で輝度は15%程
度、コントラストは20〜25%中心部より低下してい
る。
In actual photographic judgment, at a viewing magnification of 35 times, the brightness is about 15% and the contrast is 20 to 25% lower than the center.

本発明は上記欠点を解決するもので、一段走査系を用い
た装置において、電子線のX、 Y方向の走査に同期し
て陰極線管画面の周辺部の明るさを高めるように該陰極
線管の輝度を制御することに特徴がある。
The present invention solves the above-mentioned drawbacks, and is intended to improve the brightness of the cathode ray tube screen so as to increase the brightness of the peripheral area of the cathode ray tube screen in synchronization with the scanning of the electron beam in the X and Y directions. The feature is that it controls brightness.

以下第3図に示す実施例に基づき本発明を説明する。The present invention will be explained below based on the embodiment shown in FIG.

図中、第1図と同符号は同一物を示し、偏向コイルはX
方向用3XとY方向用3Yとに分けて表示しである。
In the figure, the same symbols as in Figure 1 indicate the same parts, and the deflection coil is
The display is divided into 3X for the direction and 3Y for the Y direction.

7XはX方向(水平)走査信号発生回路、7YはY方向
(垂直)走査信号発生回路で、夫々の出力信号は倍率調
整回路8を介して各偏向コイル3X、3Yに送られる。
7X is an X-direction (horizontal) scanning signal generation circuit, 7Y is a Y-direction (vertical) scanning signal generation circuit, and their output signals are sent to each deflection coil 3X, 3Y via a magnification adjustment circuit 8.

又、前記走査信号発生回路の出力信号は、増巾器9X、
9Yを介して陰極線管10の偏向コイル11X、11Y
に送られている。
Further, the output signal of the scanning signal generation circuit is transmitted through an amplifier 9X,
Deflection coils 11X and 11Y of the cathode ray tube 10 via 9Y
is being sent to.

12は二次電子や反射電子等、試料からの情報を検出す
る検出器で、その出力信号は映像増巾器13、乗算(又
は加算)器14を介して前記陰極線管10の輝度変調グ
リッドに印加される。
12 is a detector that detects information from the sample such as secondary electrons and reflected electrons, and its output signal is sent to the brightness modulation grid of the cathode ray tube 10 via an image amplifier 13 and a multiplier (or adder) 14. applied.

前記倍率調整回路8からのX、 Y夫々の出力信号は、
絶対値回路15X、15Yを通して負の信号を正に反転
した後、加算回路16に供給される。
The X and Y output signals from the magnification adjustment circuit 8 are as follows:
After the negative signal is inverted to positive through the absolute value circuits 15X and 15Y, it is supplied to the adder circuit 16.

17は可変直流電圧源であり、該電源の出力電圧も加算
回路16に供給されている。
17 is a variable DC voltage source, and the output voltage of this power source is also supplied to the adder circuit 16.

加算回路16の出力は検出器12からの映像信号と加算
、又は乗算されて陰極線管10のグリッドに供給される
The output of the adder circuit 16 is added or multiplied with the video signal from the detector 12 and then supplied to the grid of the cathode ray tube 10.

さて、倍率調整回路8から絶対値回路15X。Now, from the magnification adjustment circuit 8 to the absolute value circuit 15X.

15Yに送られた鋸歯状走査信号は負の電圧が反転され
、第4図aの如き信号となる。
The negative voltage of the sawtooth scanning signal sent to 15Y is inverted, resulting in a signal as shown in FIG. 4a.

このとき15Xの出力に対し、15Yの出力の周期は著
しるしく長く、通常数百倍〜千数百倍であることは云う
までもない。
At this time, it goes without saying that the period of the 15Y output is significantly longer than that of the 15X output, and is usually several hundred to several thousand times as long.

加算回路16において、絶対値回路15X、15Y及び
直流電圧源17の出力信号が加算され、第4図すの如き
輝度信号が出力される。
In the adder circuit 16, the output signals of the absolute value circuits 15X, 15Y and the DC voltage source 17 are added, and a luminance signal as shown in FIG. 4 is output.

同図においてτはX方向(水平)走査の周期、TはY方
向(垂直)走査の周期であり、又voは直流電圧源17
の出力電圧である。
In the figure, τ is the period of scanning in the X direction (horizontal), T is the period of scanning in the Y direction (vertical), and vo is the DC voltage source 17.
is the output voltage of

この様な信号を映像信号と乗算、又は加算して陰極線管
10に加えると、該陰極線管の画面周辺部での輝度及び
若しくはコントラス1へが高められ、全画面均質な画像
が得られる。
When such a signal is multiplied or added to a video signal and applied to the cathode ray tube 10, the brightness and/or contrast at the periphery of the screen of the cathode ray tube is increased to 1, and a uniform image on the entire screen is obtained.

前記絶対値回路15X、15Yには倍率に応じて振巾の
異なる走査信号が入るので倍率が低くなるにつれて第4
図の信号値は大きくなり、倍率変化に対し、自動的に周
辺部の輝度、コントラストの修正が行える。
Since the absolute value circuits 15X and 15Y receive scanning signals having different amplitudes depending on the magnification, as the magnification decreases, the fourth
The signal value in the figure increases, and the brightness and contrast of the peripheral area can be automatically corrected in response to changes in magnification.

実際の装置の場合、中漬や高倍観察では上記の輝度、コ
ントラスト修正は不要であるので、倍率調整回路8と絶
対値回路15X。
In the case of an actual device, the above-mentioned brightness and contrast corrections are not necessary for intermediate observation or high magnification observation, so the magnification adjustment circuit 8 and the absolute value circuit 15X are used.

15Yとの間にスイッチを設けると良い。It is recommended to provide a switch between the terminal and 15Y.

このとき、倍率調整つまみとスイッチとを連動せしめ、
一定倍率以下になったとき自動的に修正動作が開始され
るようにすると便利である。
At this time, link the magnification adjustment knob and switch,
It is convenient to automatically start the correction operation when the magnification falls below a certain level.

以上詳述したように、本発明に基づく装置においては、
倍率調整回路によって調整された走査信号の振幅に応じ
た勾配で該陰極線管画面の中央部から周辺部に向うに従
って実質的に輝度変調信号のレベルが高くされるように
陰極線管の輝度を制御するようにしているため、観察倍
率を切換えた場合にも観察倍率に応じた最適な周辺輝度
補正が成され、常に均質な画像を観察することができる
As detailed above, in the device based on the present invention,
The brightness of the cathode ray tube is controlled so that the level of the brightness modulation signal is substantially increased from the center to the periphery of the cathode ray tube screen with a gradient corresponding to the amplitude of the scanning signal adjusted by the magnification adjustment circuit. Therefore, even when the observation magnification is changed, optimal peripheral brightness correction is performed according to the observation magnification, and a homogeneous image can always be observed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の一段偏向の走査系を示す図、第2図はそ
の電子線強度分布を示す図、第3図は本発明の一実施例
を示すブロック図、第4図はその主要部動作説明図であ
る。 1:集束レンズ、2:絞り板、3X、3Y:偏向コイル
、4:最終集束レンズ、5:紋り、6:試料、7X、7
Y:走査信号発生回路、8:倍率調整回路、9X、9Y
:増巾器、10:陰極線管、IIX、IIY:偏向コイ
ル、12:検出器、13:映像増巾器、141乗算回路
、15X、15Y:絶対値回路、16:加算回路、17
:直流電圧源。
Fig. 1 is a diagram showing a conventional single-stage deflection scanning system, Fig. 2 is a diagram showing its electron beam intensity distribution, Fig. 3 is a block diagram showing an embodiment of the present invention, and Fig. 4 is its main part. It is an operation explanatory diagram. 1: Focusing lens, 2: Diaphragm plate, 3X, 3Y: Deflection coil, 4: Final focusing lens, 5: Fringe, 6: Sample, 7X, 7
Y: Scanning signal generation circuit, 8: Magnification adjustment circuit, 9X, 9Y
: Amplifier, 10: Cathode ray tube, IIX, IIY: Deflection coil, 12: Detector, 13: Video amplifier, 141 Multiplying circuit, 15X, 15Y: Absolute value circuit, 16: Adding circuit, 17
:DC voltage source.

Claims (1)

【特許請求の範囲】[Claims] 1 最終段集束レンズの上方に配置された一段の偏向器
より成る偏向装置と、発散状態にある電子線を前記最終
段集束レンズの中心に置かれた絞り面上で二次元的に走
査させるための走査信号を該偏向器に供給するための走
査信号発生回路と、該走査信号発生回路より該偏向器に
供給される走査信号の振幅を調整するための倍率調整回
路と、該電子線の試料上における走査に同期して走査さ
れ試料よりの情報信号を輝度変調信号を輝度変調信号と
して試料像を表示するための陰極線管とを具備する装置
において、該倍率調整回路によって調整された該振幅に
応じた勾配で該陰極線管画面の中央部から周辺部に向う
に従って実質的に該輝度変調信号のレベルが高くされる
ように該陰極線管の輝度を制御する手段を備えているこ
とを特徴とする走査電子顕微鏡。
1. A deflection device consisting of a single stage deflector placed above the final stage focusing lens, and for two-dimensionally scanning the electron beam in a diverging state on the aperture plane placed at the center of the final stage focusing lens. a scanning signal generation circuit for supplying a scanning signal of 1 to the deflector; a magnification adjustment circuit for adjusting the amplitude of the scanning signal supplied from the scanning signal generation circuit to the deflector; and a sample of the electron beam. In an apparatus equipped with a cathode ray tube for displaying a sample image by scanning in synchronization with the above scanning and using an information signal from a sample as a luminance modulation signal, the amplitude is adjusted by the magnification adjustment circuit. Scanning characterized by comprising means for controlling the brightness of the cathode ray tube so that the level of the brightness modulation signal is substantially increased from the center to the periphery of the cathode ray tube screen with a corresponding gradient. electronic microscope.
JP55037512A 1980-03-26 1980-03-26 scanning electron microscope Expired JPS5953660B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55037512A JPS5953660B2 (en) 1980-03-26 1980-03-26 scanning electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55037512A JPS5953660B2 (en) 1980-03-26 1980-03-26 scanning electron microscope

Publications (2)

Publication Number Publication Date
JPS56145644A JPS56145644A (en) 1981-11-12
JPS5953660B2 true JPS5953660B2 (en) 1984-12-26

Family

ID=12499584

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55037512A Expired JPS5953660B2 (en) 1980-03-26 1980-03-26 scanning electron microscope

Country Status (1)

Country Link
JP (1) JPS5953660B2 (en)

Also Published As

Publication number Publication date
JPS56145644A (en) 1981-11-12

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