Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS596482B2 - How to form porcelain electrodes - Google Patents
[go: Go Back, main page]

JPS596482B2 - How to form porcelain electrodes - Google Patents

How to form porcelain electrodes

Info

Publication number
JPS596482B2
JPS596482B2 JP1731079A JP1731079A JPS596482B2 JP S596482 B2 JPS596482 B2 JP S596482B2 JP 1731079 A JP1731079 A JP 1731079A JP 1731079 A JP1731079 A JP 1731079A JP S596482 B2 JPS596482 B2 JP S596482B2
Authority
JP
Japan
Prior art keywords
porcelain
electrodes
electrode
ceramic semiconductor
comparative example
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1731079A
Other languages
Japanese (ja)
Other versions
JPS55110003A (en
Inventor
宏 山岡
博之 高科
康二 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP1731079A priority Critical patent/JPS596482B2/en
Publication of JPS55110003A publication Critical patent/JPS55110003A/en
Publication of JPS596482B2 publication Critical patent/JPS596482B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Thermistors And Varistors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
  • Ceramic Capacitors (AREA)

Description

【発明の詳細な説明】 本発明は、磁器半導体等の表面に溶射法等によって電極
を設けるための磁器の電極形成方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for forming electrodes on ceramics for providing electrodes on the surface of ceramic semiconductors or the like by thermal spraying or the like.

従来、磁器半導体へのオーム性電極形成法として、アル
ミニウム、亜鉛、すす、銅、真ちゅう等を磁器半導体表
面に溶射する方法が広く知られている。
Conventionally, as a method of forming ohmic electrodes on a ceramic semiconductor, a method of thermally spraying aluminum, zinc, soot, copper, brass, etc. onto the surface of a ceramic semiconductor is widely known.

ところで、磁器半導体の用途が広がる(くつれ、磁器半
導体の形状寸法に対して高度な寸法精度が要求され、必
然的に磁器焼成後の研摩、研削等の加工が必要となって
きている。
By the way, as the applications of porcelain semiconductors expand (e.g., porcelain semiconductors are required to have a high level of dimensional accuracy in terms of their shape and dimensions, processing such as polishing and grinding after firing the porcelain becomes necessary.

しかしながら、その加工した部分に溶射しても電極の接
着強度が低下してしまう不都合を生じる。
However, even if the processed portion is thermally sprayed, the adhesive strength of the electrode will be reduced.

この原因は、加工によって成牛じた加工変質層が、溶射
時のサーマルショックによりマイクロクラック、歪が蓄
積してもろくなるためであることが判明した。
It was found that the cause of this was that the process-altered layer became brittle due to the accumulation of microcracks and distortions due to thermal shock during thermal spraying.

すなわち、第1図Aに示す如く、磁器半導体1の表面に
は加工に伴い結晶が破壊された加工変質層2が成牛され
、この加工変質層2に金属を溶射して同図Bのように電
極3を磁器半導体1の表面に形成すると、溶射の際のサ
ーマルショックによりマイクロクラックや歪等が大きく
なり加工変質層2は非常にもろい状態となる。
That is, as shown in FIG. 1A, a process-affected layer 2 in which crystals are destroyed due to processing is formed on the surface of the ceramic semiconductor 1, and metal is thermally sprayed onto this process-affected layer 2, as shown in FIG. 1B. When the electrode 3 is formed on the surface of the ceramic semiconductor 1, microcracks and distortions become large due to thermal shock during thermal spraying, and the process-affected layer 2 becomes extremely brittle.

従って、剥離試験を行うと、同図Cの如く容易に電極3
は磁器半導体1より剥れてしまう。
Therefore, when performing a peel test, the electrode 3 can be easily removed as shown in Figure C.
peels off from the ceramic semiconductor 1.

同様の不都合は、例えば磁器へのニッケル無電解めっき
の場合にも生じる。
Similar disadvantages occur, for example, in the case of electroless nickel plating on porcelain.

本発明は、上記の点に鑑み、磁器を加工後再焼成して加
工変質層を無くしてから磁器に電極を設けることにより
、充分な接着強度の電極を形成可能にした磁器の電極形
成方法を提供しようとするものである。
In view of the above points, the present invention provides a method for forming electrodes on porcelain that makes it possible to form electrodes with sufficient adhesive strength by re-firing the porcelain after processing to eliminate the process-affected layer and then providing the electrode on the porcelain. This is what we are trying to provide.

以下、本発明に係る磁器の電極形成方法を比較例及び実
施例に従って説明する。
Hereinafter, a method for forming a ceramic electrode according to the present invention will be explained according to comparative examples and examples.

比較例 1 3mm厚のチタン酸バリウム系磁器半導体基板を用意し
、加工を施すことなくアーク溶射法により表面にアルミ
ニウムを溶射した。
Comparative Example 1 A 3 mm thick barium titanate ceramic semiconductor substrate was prepared, and aluminum was sprayed onto the surface by arc spraying without any processing.

それから、溶射電極面の半分に粘着テープ(ソニーケミ
カル■製T−4000)を貼り、それを引き剥して剥離
試験を行った結果、電極に剥離は生じなかった。
Then, adhesive tape (T-4000 manufactured by Sony Chemical ■) was applied to half of the surface of the sprayed electrode, and as a result of peeling off the adhesive tape and conducting a peel test, no peeling occurred on the electrode.

比較例 2 3mvtqのチタン酸バリウム系磁器半導体基板を用意
し、これをラップ研摩により2.5mmの厚さに仕上げ
た。
Comparative Example 2 A 3 mvtq barium titanate ceramic semiconductor substrate was prepared and finished to a thickness of 2.5 mm by lap polishing.

それから再焼成を行うことなく直接アーク溶射法により
表面にアルミニウムを溶射した。
Aluminum was then sprayed onto the surface by direct arc spraying without re-firing.

次いで、比較例1と同じ条件で剥離試験を行った結果、
電極は完全に剥離した。
Next, as a result of performing a peel test under the same conditions as Comparative Example 1,
The electrode was completely peeled off.

比較例 3 3龍厚のチタン酸バリウム系磁器半導体基板を用意し、
これをラップ研摩により2.5mrnの厚さに仕上げた
Comparative Example 3 A barium titanate ceramic semiconductor substrate with a thickness of 3 mm was prepared,
This was finished to a thickness of 2.5 mrn by lap polishing.

この研摩加工を施した基板を700℃で5分間熱処理(
再焼成)した。
This polished substrate was heat-treated at 700°C for 5 minutes (
(refired).

それから、アーク溶射法により表面にアルミニウムを溶
射した。
Then, aluminum was sprayed onto the surface by arc spraying.

次いで、比較例1と同じ条件で剥離試験を行った結果、
電極は殆んど剥離した。
Next, as a result of performing a peel test under the same conditions as Comparative Example 1,
Most of the electrodes were peeled off.

比較例 4 前記比較例3と同じ加工を施したチタン酸バリウム系磁
器半導体基板を800℃で5分間熱処理した後、アーク
溶射法により表面にアルミニウムを溶射した。
Comparative Example 4 A barium titanate ceramic semiconductor substrate that had been processed in the same manner as in Comparative Example 3 was heat treated at 800° C. for 5 minutes, and then aluminum was sprayed onto the surface by arc spraying.

それから比較例1と同じ条件で剥離試験を行った結果、
電極は殆んど剥離した。
Then, as a result of performing a peel test under the same conditions as Comparative Example 1,
Most of the electrodes were peeled off.

実施例 1 前記比較例3と同じ加工を施したチタン酸バリウム系磁
器半導体基板を900°Cで5分間熱処理した後、アー
ク溶射法により表面にアルミニウムを溶射した。
Example 1 A barium titanate ceramic semiconductor substrate that had been processed in the same manner as in Comparative Example 3 was heat treated at 900°C for 5 minutes, and then aluminum was sprayed onto the surface by arc spraying.

それから比較例1と同じ条件で剥離試験を行った結果、
電極の一部が剥離した。
Then, as a result of performing a peel test under the same conditions as Comparative Example 1,
Part of the electrode peeled off.

実施例 2 前記比較例3と同じ加工を施したチタン酸バリウム系磁
器半導体基板を1000℃で5分間熱処理した後、アー
ク溶射法により表面にアルミニウムを溶射した。
Example 2 A barium titanate ceramic semiconductor substrate that had been processed in the same manner as in Comparative Example 3 was heat treated at 1000° C. for 5 minutes, and then aluminum was sprayed onto the surface by arc spraying.

それから比較例1と同じ条件で剥離試験を行った結果、
電極は剥離しなかった。
Then, as a result of performing a peel test under the same conditions as Comparative Example 1,
The electrode did not peel off.

実施例 3 前記熱処理を1100℃で行ったが、実施例2と同じ結
果が得られた。
Example 3 The heat treatment was performed at 1100° C., but the same results as in Example 2 were obtained.

実施例 4 前記熱処理を1200’Cで行ったが、実施例2と同じ
結果が得られた。
Example 4 The heat treatment was performed at 1200'C, but the same results as in Example 2 were obtained.

上記実施例によれば、チタン酸バリウム系磁器半導体基
板を5分間程度再焼成してから溶射を行うことにより、
電極の接着強度を向上させることができることが判る。
According to the above embodiment, by re-firing the barium titanate-based ceramic semiconductor substrate for about 5 minutes and then performing thermal spraying,
It can be seen that the adhesive strength of the electrode can be improved.

すなわち、実施例1によれば、電極の一部のみしか剥離
しない程度に接着強度を大幅改善でき、さらに実施例2
乃至4によれば、加工を施さない比較例1と同等の結果
が得られた。
That is, according to Example 1, the adhesive strength could be greatly improved to such an extent that only a part of the electrode was peeled off, and furthermore, according to Example 2,
According to samples 4 to 4, results equivalent to those of Comparative Example 1 in which no processing was performed were obtained.

すなわち、第2図Aに示す如く、磁器半導体1の表面に
は加工に伴い結晶が破壊された加工変質層2が生じるが
、再焼成を行うことにより同図Bに示すように再焼成の
際の熱エネルギによって加工変質層2が除去される。
That is, as shown in FIG. 2A, a process-affected layer 2 is formed on the surface of the ceramic semiconductor 1 in which the crystals are destroyed due to processing, but by re-firing, as shown in FIG. The process-affected layer 2 is removed by the thermal energy.

従って、同図Cの如く磁器半導体1の表面に金属を溶射
して電極3を形成してもマイクロクラックや歪が発生せ
ず、剥離試験を行っても同図りの如く電極3は剥れなG
)。
Therefore, even if the electrode 3 is formed by spraying metal onto the surface of the ceramic semiconductor 1 as shown in FIG. G
).

従って、本発明によれば、磁器を粗い粉で急速に削る等
の激しい研摩加工を施した面にも充分強固な接着力の溶
射ができる。
Therefore, according to the present invention, thermal spraying with a sufficiently strong adhesive force can be applied even to surfaces that have been subjected to severe abrasive processing, such as rapid grinding of porcelain with coarse powder.

また、従来、サーマルショックを柔げ、強度を上げるた
め溶射の際に溶射される面を予め加熱しつつ溶射する必
要があったが、これが不要になるため作業性が向上する
Furthermore, in the past, it was necessary to preheat the surface to be sprayed during thermal spraying in order to soften thermal shock and increase strength, but this is no longer necessary, which improves work efficiency.

さらに、加熱の際の溶射金属の酸化が問題であったが、
その心配がないため、広く金属種を選べる。
Furthermore, oxidation of the sprayed metal during heating was a problem;
Since you don't have to worry about that, you can choose from a wide range of metal types.

本発明に係る磁器の電極形成方法は、磁器への金属溶射
1.とくに磁器素体の温度が上らずサーマルショックの
大きなアーク溶射の場合に効果が太きいが、ニッケル無
電解めっきや蒸着、イオンブレーティング等の接着力の
向上にも効果を上げることができる。
The method for forming electrodes on porcelain according to the present invention includes 1. metal spraying on porcelain. It is particularly effective in arc spraying, where the temperature of the porcelain body does not rise and the thermal shock is large, but it can also be effective in improving adhesive strength in electroless nickel plating, vapor deposition, ion blating, etc.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の磁器の電極形成方法を示すHy明図、第
2図は本発明に係る磁器の電極形成方法を示す説明図で
ある。 1・・・・・・磁器半導体、2・・・・・・加工変質層
、3・・・・・・電極。
FIG. 1 is a diagram showing a conventional method for forming electrodes on porcelain, and FIG. 2 is an explanatory drawing showing a method for forming electrodes on porcelain according to the present invention. 1... Ceramic semiconductor, 2... Process-affected layer, 3... Electrode.

Claims (1)

【特許請求の範囲】 1 磁器を加工した後、900℃以上で1200°C以
下の熱処理温妾で再焼成してから前記磁器表面に電極を
設けることを特徴とする磁器の電極形成方法。 2 前記磁器がチタン酸バリウム系磁器半導体である特
許請求の範囲第1項記載の磁器の電極形成方法。 3 前記磁器表面にアルミニウムの溶射により電極を設
ける特許請求の範囲第1項記載の磁器の電極形成方法。
[Scope of Claims] 1. A method for forming electrodes on porcelain, which comprises processing the porcelain and then re-firing it in a heat treatment at a temperature of 900° C. or more and 1200° C. or less, and then providing an electrode on the surface of the porcelain. 2. The method for forming electrodes on porcelain according to claim 1, wherein the porcelain is a barium titanate-based ceramic semiconductor. 3. The method for forming electrodes on porcelain according to claim 1, wherein the electrodes are provided on the surface of the porcelain by thermal spraying of aluminum.
JP1731079A 1979-02-19 1979-02-19 How to form porcelain electrodes Expired JPS596482B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1731079A JPS596482B2 (en) 1979-02-19 1979-02-19 How to form porcelain electrodes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1731079A JPS596482B2 (en) 1979-02-19 1979-02-19 How to form porcelain electrodes

Publications (2)

Publication Number Publication Date
JPS55110003A JPS55110003A (en) 1980-08-25
JPS596482B2 true JPS596482B2 (en) 1984-02-13

Family

ID=11940430

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1731079A Expired JPS596482B2 (en) 1979-02-19 1979-02-19 How to form porcelain electrodes

Country Status (1)

Country Link
JP (1) JPS596482B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59169104A (en) * 1983-03-17 1984-09-25 株式会社東芝 Method of producing metal oxide nonlinear resistor

Also Published As

Publication number Publication date
JPS55110003A (en) 1980-08-25

Similar Documents

Publication Publication Date Title
US4488673A (en) Direct metal brazing to cermet feedthroughs
US10862447B2 (en) Method for processing a lithium tantalate crystal substrate
JPS644668B2 (en)
EP0006810A1 (en) Method of producing an integrated hybrid circuit
JPH0525397B2 (en)
JPS596482B2 (en) How to form porcelain electrodes
JPS59117115A (en) Method of producing semiconductor device
US3791861A (en) Method for producing thin film circuits on high purity alumina substrates
US5183553A (en) Method of forming a high temperature resistant copper coating on an inorganic dielectric
JPH10280137A (en) Manufacturing method of sputtering target
JPH03179793A (en) Surface structure of ceramic board and manufacture thereof
JPH0454633B2 (en)
JPS6222957B2 (en)
TWI918006B (en) Manufacturing method of ceramic electrostatic chuck and heater
JPS63190788A (en) Ceramics metallization method
JP3265289B2 (en) Manufacturing method of aluminum nitride substrate
JP3190908B2 (en) Aluminum nitride substrate
JPH0664988A (en) Production of metallized ceramic substrate
JPH0574614A (en) Manufacture of ceramic electronic component
JPH06350215A (en) Aluminium nitride board having copper circuit
IT8922405A1 (en) PROCEDURE FOR FORMING THIN FILM TERMINATIONS OF LOW INDUCTANCE CERAMIC CAPACITORS AND RESULTING ARTICLE.
TW202602823A (en) Manufacturing method of ceramic electrostatic chuck and heater
JPH01142089A (en) Metal-cored substrate and production thereof
JPH06448Y2 (en) Shield plate for thin film forming equipment
JPH03241764A (en) Aluminum nitride board and manufacture thereof