JPS599866B2 - How to detect minute magnetic field changes - Google Patents
How to detect minute magnetic field changesInfo
- Publication number
- JPS599866B2 JPS599866B2 JP50042516A JP4251675A JPS599866B2 JP S599866 B2 JPS599866 B2 JP S599866B2 JP 50042516 A JP50042516 A JP 50042516A JP 4251675 A JP4251675 A JP 4251675A JP S599866 B2 JPS599866 B2 JP S599866B2
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- Prior art keywords
- hall element
- temperature
- magnetic field
- function
- hall
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
【発明の詳細な説明】
本発明は、ホール素子を用いて、微小な磁界変化を検出
する方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of detecting minute changes in magnetic field using a Hall element.
ある物理的な状態を一定の範囲内に保つように制御を行
なうのに、その状態の磁気的な性質に着目し、磁気的な
変化によつて状態の変化を検知し、その変化量に応じた
操作によつて制御を行なう場合がある。In order to control a certain physical state to keep it within a certain range, we focus on the magnetic properties of that state, detect changes in the state based on magnetic changes, and respond according to the amount of change. In some cases, control may be performed by specific operations.
たとえば、電子写真における磁気現像方式でトナーとキ
ャリヤーとの混合比の変化に応じて現像剤の透磁率が変
化することを利用し、現像剤に一定の磁場を作用させ、
その漏洩磁束の変化を検出して、上記混合比を一定の範
囲内に制御する場合などである。このような場合に磁界
の基準状態からの微小なずれを検出する手段が必要にな
る。磁界検出素子としてはホール素子が良く知られてい
る。For example, in the magnetic development method used in electrophotography, a constant magnetic field is applied to the developer by utilizing the fact that the magnetic permeability of the developer changes as the mixing ratio of toner and carrier changes.
This is the case when the mixing ratio is controlled within a certain range by detecting the change in the leakage magnetic flux. In such a case, a means for detecting minute deviations of the magnetic field from the reference state is required. A Hall element is well known as a magnetic field detection element.
ホール素子は優れて感度が良好であり、極めて微弱な磁
界をも検出できる。就中インヂウム・アンチモナイド蒸
着のホール素子は、その感度が極めて良いことで知られ
ている。しかしながら、一般にホール素子は、その温度
特性、即ち、一定入力に対する出力の温度に対する依存
の特性が顕著であり、そのため、特殊な温度補正を行な
つたり、測定空間領域を恒温化するなどの処置を必要と
していた。本発明の目的は、ホール素子の、出力に対す
る機能を入力量たる磁束密度と、温度を変数とする2変
数函数とみなし、さらに、制御電流端子電圧と温度との
特性関係を用い、最終的に上記2変数函数を、磁束密度
と制御電流端子電圧を変数とする2変数一次函数により
近似し、近似函数に基づいて、磁束密度の基準値からの
微小変化を算出するという全く新しい微小磁界変化の検
出方法を提供することである。Hall elements have excellent sensitivity and can detect even extremely weak magnetic fields. In particular, Hall elements made of indium antimonide are known for their extremely high sensitivity. However, in general, Hall elements have a remarkable temperature characteristic, that is, the dependence of the output on temperature for a constant input, and therefore measures such as special temperature correction or constant temperature measurement are required. I needed it. The purpose of the present invention is to consider the function of the output of the Hall element as a two-variable function with magnetic flux density as the input quantity and temperature as variables, and further, to finally obtain the output by using the characteristic relationship between the control current terminal voltage and temperature. The above two-variable function is approximated by a two-variable linear function with magnetic flux density and control current terminal voltage as variables, and based on the approximation function, the minute change in magnetic flux density from the reference value is calculated. An object of the present invention is to provide a detection method.
そして、本発明による検出方法によれば上記の如き、温
度補正や測定空間領域の恒温化などの必要性は全くなく
なるのである。以下、図面を参照しながら、本発明を説
明する。周知の如く、ホール素子による磁界の検出は、
第1図に示すように、磁界を検出すべき位置に設置した
ホール素子1の入力端子である制御電流端子間に、制御
電流1。を通じ、検出すべき磁界の磁束密度Bによるホ
ール効果を、上記制御電流端子と直角方向に設けられた
出力端子間にホール電圧VNとして検出し、磁束密度B
とホール電圧VHとの対応関係にもとづいて、検出され
たホール電圧VHにより磁束密度Bの大きさを定めるこ
とによつて行なわれる。一般にホール素子においては前
述した如く、出力VHは、磁束密度Bのみならず温度T
にも依存する。従つて制御電流1。を一定に保つたとき
、ホール素子の、ホール電圧VHに対する機能は、磁束
密度Bと温度Tとを変数とする2変数函数とみなすこと
ができる。即ちVll=f(B,T)(1)である。函
数fは、ホール素子の個々に応じて、特性として定まる
。その具体的な形を既知の函数で表すことは困難であつ
ても、既知の函数を用い二て任意の精度で近似すること
は可能である。さて、今、ホール素子を用いて磁界を検
出しようとするにあたう、検出すべき磁界の変動範囲が
、基準値の近傍の比較的狭い範囲であう、即ち上記変動
が微小であシ、且つ、温度変化の範囲も比較・―的狭い
ことが分つている場合には、(1)式における函数fを
一次式で近似することが出きる。以下、具体的例に則し
て説明を行なう。即ち、室温下で、50乃至150ガウ
ス程度の磁束密度を有する磁界を、インヂウム・アンチ
モナイド蒸着のホール・5素子によυ検出する場合であ
る。第1図に示すホール素子1をインヂウム・アンチモ
ナイド蒸着のホール素子であるとする。磁束密度の基準
値B。を100ガウス、温度の基準値T。を20℃であ
るとし、微小温度変化にかかわりなく、磁束密度4Bの
基準値からのずれを検出しようとするのである。このと
き制御電流1。はホール素子1の特性に応じて、該例で
は5mAに保つ。そこで、先ず、(1)式を基準値の近
傍でテイラ一展開するとがえられる。According to the detection method of the present invention, there is no need for temperature correction or constant temperature measurement of the measurement space as described above. The present invention will be described below with reference to the drawings. As is well known, detection of a magnetic field by a Hall element is
As shown in FIG. 1, a control current 1 is applied between control current terminals that are input terminals of a Hall element 1 installed at a position where a magnetic field is to be detected. , the Hall effect due to the magnetic flux density B of the magnetic field to be detected is detected as a Hall voltage VN between the output terminal provided perpendicularly to the control current terminal, and the magnetic flux density B
This is done by determining the magnitude of the magnetic flux density B based on the detected Hall voltage VH based on the correspondence between the magnetic flux density B and the Hall voltage VH. Generally, in a Hall element, as mentioned above, the output VH is determined not only by the magnetic flux density B but also by the temperature T.
It also depends on. Therefore, the control current is 1. When VH is kept constant, the function of the Hall element with respect to Hall voltage VH can be regarded as a two-variable function with magnetic flux density B and temperature T as variables. That is, Vll=f(B,T)(1). The function f is determined as a characteristic depending on each Hall element. Even if it is difficult to express its specific form using a known function, it is possible to approximate it with arbitrary precision using a known function. Now, when trying to detect a magnetic field using a Hall element, the variation range of the magnetic field to be detected is a relatively narrow range near the reference value, that is, the variation is minute and temperature If it is known that the range of change is comparatively narrow, the function f in equation (1) can be approximated by a linear equation. Hereinafter, explanation will be given based on a specific example. That is, this is a case where a magnetic field having a magnetic flux density of about 50 to 150 Gauss is detected at room temperature by using a Hall 5 element made of indium antimonide vapor. It is assumed that the Hall element 1 shown in FIG. 1 is a Hall element formed by vapor deposition of indium antimonide. Reference value B of magnetic flux density. is 100 Gauss, and the temperature reference value T. is 20° C., and an attempt is made to detect the deviation of the magnetic flux density 4B from the reference value, regardless of minute temperature changes. At this time, the control current is 1. is kept at 5 mA in this example, depending on the characteristics of the Hall element 1. Therefore, first, it can be said that equation (1) is expanded by Taylor in the vicinity of the reference value.
f(BO,TO)は、ホール素子1に制御電流1。とし
て5m1f)電流を通じ、20℃の温度下で、100ガ
ウスの磁束密度の磁場を作用させたときのホール電圧の
値である。これをVHOと書けば(2)式は次のように
なる。定数丁If(BO,TO)を求めるには、温度を
20℃に保ち、5mAの制御電流を流されたホール素子
1に作用する磁界の磁束密度Bの大きさを100ガウス
近傍において変化させ、その結果生ずるホール電圧の変
化を100ガウスの点で磁束密度Bで微分すればよい。
即ち、第2図は、20℃におけるホール素子1の、磁束
密度Bとホール電圧VHとの関係を示すものであり、こ
の図から、VH0=−37.0mV,丁f(BO,TO
)=一0.287が定まる。定数丁丁f(BO,TO)
を求めるには同様の操作を、温度Tとホール電圧VHに
対して行なえばよい。第3図は、ホール素子1に5m7
V7)制御電流を通じ、磁束密度100ガウスの磁界を
作用させたとき、温度変化に応じてホール電圧がどのよ
うに変化するかを示すものである。この図にもとづいて
定数丁丁f(BO,TO)は0.6と定められた。従つ
て(3)式はVll+37=−0.287(B−BO)
+0.6(T−TO)(4)となる。f(BO, TO) is a control current 1 to the Hall element 1. This is the value of the Hall voltage when a magnetic field with a magnetic flux density of 100 Gauss is applied at a temperature of 20° C. through a current (5m1f). If this is written as VHO, equation (2) becomes as follows. To obtain the constant If (BO, TO), the temperature is maintained at 20°C, and the magnitude of the magnetic flux density B of the magnetic field acting on the Hall element 1 through which a control current of 5 mA is passed is varied in the vicinity of 100 Gauss. The resulting change in Hall voltage may be differentiated with respect to the magnetic flux density B at a point of 100 Gauss.
That is, FIG. 2 shows the relationship between the magnetic flux density B and the Hall voltage VH of the Hall element 1 at 20°C, and from this figure, VH0 = -37.0 mV,
)=-0.287 is determined. Constant Ding Ding f (BO, TO)
In order to obtain , a similar operation can be performed for temperature T and Hall voltage VH. In Figure 3, the Hall element 1 is 5m7.
V7) This shows how the Hall voltage changes in response to temperature changes when a magnetic field with a magnetic flux density of 100 Gauss is applied through a control current. Based on this figure, the constant f(BO, TO) was determined to be 0.6. Therefore, equation (3) is Vll+37=-0.287(B-BO)
+0.6(T-TO)(4).
一方、ホール素子1のみならず一般にホール素子の制御
電流端子電圧V。On the other hand, the control current terminal voltage V not only of the Hall element 1 but also of the Hall element in general.
と温度Tの間には実用範囲における磁界の変化にかかわ
うなく一定の特性関係が成立つことが知られた。第4図
は、ホール素子1に対するこの特性関係を示している。
第4図の曲線は、磁束密度Bを0乃至200ガウスの範
囲で変化させても実質的に変化しない。従つて第4図の
関係を函数9を用いてT=9(VO)と表せば(4)式
はυυ′5
とあられされる。It is known that a constant characteristic relationship holds between the temperature T and the temperature T regardless of changes in the magnetic field in the practical range. FIG. 4 shows this characteristic relationship for the Hall element 1.
The curve of FIG. 4 does not substantially change even if the magnetic flux density B is changed in the range of 0 to 200 Gauss. Therefore, if the relationship shown in FIG. 4 is expressed as T=9(VO) using function 9, equation (4) can be expressed as υυ'5.
ここにV。OはT。に対する制ル素子1に対して1.7
5Vである。そこで関係T=l(VO)をT=20℃の
近傍で一次式υ−υ
で近似し、定数dを第4図にもとずいて、d=−?と定
めた。V here. O is T. 1.7 for control element 1 for
It is 5V. Therefore, the relationship T=l(VO) is approximated by the linear equation υ-υ near T=20°C, and the constant d is based on Figure 4, d=-? It was determined that
これによつて(5)式は0.0341め1となる。As a result, equation (5) becomes 0.0341th 1.
さて、基準磁束密度からのずれは(B−BO)であるか
ら、これは(7)式からと与えられる。Now, since the deviation from the reference magnetic flux density is (B-BO), this can be given from equation (7).
そこで(8)式の右辺に対応するアナログ計算回路を設
定し、ホール素子1に生ずるホール電圧VHおよび、制
御電流端子電圧V。Therefore, an analog calculation circuit corresponding to the right side of equation (8) is set to calculate the Hall voltage VH generated in the Hall element 1 and the control current terminal voltage V.
とを電気信号として上記アナログ計算回路に入力すれば
、その出力として、検出すべき磁岑における磁束密度の
微小変化B−BO力哨動的に得られる訳である。第5図
は、本発明を実施するための装置の1例を、その要部の
み略図的に示すものである。即ち該装置の要部は、ホー
ル素子1、電流計2可変抵抗器3、演算増幅器4,5,
6,7、抵抗8,9、表示装置8、直流電源El,E2
により構成されている。If this is input as an electrical signal to the analog calculation circuit, the output will be a minute change in the magnetic flux density in the magnetic flux to be detected, B-BO force. FIG. 5 schematically shows only the essential parts of an example of an apparatus for carrying out the present invention. That is, the main parts of the device include a Hall element 1, an ammeter 2, a variable resistor 3, operational amplifiers 4, 5,
6, 7, resistors 8, 9, display device 8, DC power supplies El, E2
It is made up of.
ホール素子1の制御電流端子には、直流電源E1によシ
直流電圧が印加されるようになつており、スィツチSを
閉じると制御電流1。が流れるが、制御電流回路中には
、電流計2および、可変抵抗器3とが直列に配設されて
おり、可変抵抗器3は電流計2によつて制御され、一旦
制御電流1cを例えば該装置例では5m1V設定すると
、以後は、ホール素子1の内部抵抗の変化に呼応して可
変抵抗器3の抵抗置を変えて、常に5mAの制御電流が
ホール素子1に流されるようになつている。ホール電圧
端子は、演算増幅器5に、制御電流端子は、演算増幅器
4に接続されてお)、それぞれの演算増幅器に、これら
の端子に生ずる電圧が電気信号として入力するようにな
つている。演算増幅器4および5は差動増幅器であり、
入力信号としての端子間電位差を、それぞれ個有の倍率
で増幅する。演算増幅器の倍率は−61.32倍、・演
算増幅器5の倍率は−3.48倍である。演算増幅器4
および5の出力側はともに、演算増幅器6に入力する。
演算増幅器6は加算増幅器であつて、入力信号の信号値
の和を出力とする。演算増幅器6の出力は加算増幅器で
ある演算増幅器7に入力し、この演算増幅器7には、ま
た抵抗8および9によつて設定される一定の直流電圧が
直流電源E2から入力するようになつている。この直流
電圧信号は(8)式において定数項−21.6に対応し
ている。従つて、演算増幅器4,5,6,7、抵抗8お
よび9と、直流電源E2とは、(8)式の右辺に対応す
るアナログ計算回路を構成している。そこでホール素子
1を、検出すべき磁界中に設置して、スイツチSをオン
にし、必要な機器を作動させれば、演算増幅器4VCお
いて(8)式の第2項が、演算増幅器5によつて(8)
式の第1項が計算され、演算増幅器6によつて、これら
の項の減算がなされ、演算増幅器7によつてさらに(8
)式の定数項を加えられた結果であるB−BOが、表示
装置10に表示される。A DC voltage is applied to the control current terminal of the Hall element 1 by the DC power supply E1, and when the switch S is closed, the control current is 1. However, in the control current circuit, an ammeter 2 and a variable resistor 3 are arranged in series, and the variable resistor 3 is controlled by the ammeter 2, and once the control current 1c is In this device example, when the setting is 5m1V, from then on, the resistance position of the variable resistor 3 is changed in response to changes in the internal resistance of the Hall element 1, so that a control current of 5mA is always passed through the Hall element 1. There is. The Hall voltage terminal is connected to the operational amplifier 5, and the control current terminal is connected to the operational amplifier 4), so that the voltages generated at these terminals are input to the respective operational amplifiers as electrical signals. Operational amplifiers 4 and 5 are differential amplifiers,
The potential difference between the terminals as an input signal is amplified by a respective magnification factor. The magnification of the operational amplifier is -61.32 times, and the magnification of the operational amplifier 5 is -3.48 times. operational amplifier 4
and 5 are both input to an operational amplifier 6.
The operational amplifier 6 is a summing amplifier and outputs the sum of the signal values of the input signals. The output of the operational amplifier 6 is input to an operational amplifier 7 which is a summing amplifier, and a constant DC voltage set by resistors 8 and 9 is also input to the operational amplifier 7 from the DC power supply E2. There is. This DC voltage signal corresponds to the constant term -21.6 in equation (8). Therefore, operational amplifiers 4, 5, 6, 7, resistors 8 and 9, and DC power supply E2 constitute an analog calculation circuit corresponding to the right side of equation (8). Therefore, if the Hall element 1 is installed in the magnetic field to be detected, the switch S is turned on, and the necessary equipment is activated, the second term of equation (8) at the operational amplifier 4VC is changed to the operational amplifier 5. Yotsute (8)
The first term of the equation is calculated, the operational amplifier 6 subtracts these terms, and the operational amplifier 7 further calculates (8
B-BO, which is the result of adding the constant term of the equation ), is displayed on the display device 10.
即ち、基準の磁束密度100ガウスからの磁束密度の変
化が検出される訳である。さて、該装置によつて検出さ
れる磁界変化を妥当とみなしうるのは、いうまでもなく
(8)式の近似がなりたつ場合に限る訳であるが、これ
は、温度の基準値20℃の近傍において、第3図および
第4図に示す曲線を直線とみなしうる温度領域であつて
、ほぼT=10℃乃至40℃くらいの温度領域である。
これは、実際の室温の変動域と略一致するから、検出の
状況によく合致する。そこで、該装置の検出精度を、そ
の磁束密度が100ガウスに保たれた磁界中にホール素
子1を設置し、温度Tを10℃乃至40℃の範囲で変動
させてその出力値によつて吟味したところ、上記温度範
囲内で常に、100±1ガウスを表示することが確認さ
れた。従つて、該装置によれば、10ガウスのオーダー
の微小磁束密度変化を検出する場合には非常に精度の良
い検出結果を、上記温度範囲内で、温度に係りなくえる
ことが出きる。以上、本発明によれば、正確で、且つ感
度が良く、しかも温度変化に追従でき、温度変化に対す
る特別な補正などの必要のない、微小磁界変化の検出方
法を提供できる。That is, a change in magnetic flux density from a reference magnetic flux density of 100 Gauss is detected. Now, it goes without saying that the change in the magnetic field detected by this device can be considered valid only if the approximation of equation (8) holds; In the vicinity, there is a temperature range in which the curves shown in FIGS. 3 and 4 can be regarded as straight lines, and this is a temperature range approximately from T=10° C. to 40° C.
This substantially matches the actual room temperature fluctuation range, so it matches well with the detection situation. Therefore, the detection accuracy of this device was examined by installing the Hall element 1 in a magnetic field whose magnetic flux density was maintained at 100 Gauss, and varying the temperature T in the range of 10°C to 40°C, and examining its output value. As a result, it was confirmed that 100±1 Gauss was always displayed within the above temperature range. Therefore, according to this device, when detecting minute changes in magnetic flux density on the order of 10 Gauss, very accurate detection results can be obtained within the above temperature range regardless of the temperature. As described above, according to the present invention, it is possible to provide a method for detecting minute magnetic field changes that is accurate and sensitive, can follow temperature changes, and does not require special correction for temperature changes.
第1図は、ホール素子による磁界検出を説明する図、第
2図は20℃における磁束密度の変化とホール電圧の変
化との関係の1例を示す図、第3図は、磁束密度100
ガウスに保つた場合のホール電圧と温度との関係を示す
図、第4図は、ホ一ル素子における温度と制御電流端子
電圧との特性関係の一例を示す図、第5図は、本発明を
実施するための装置の1例をその要部のみ略図的に示す
図である。
1・・・・・・ホール素子、2・・・・・・電流計、3
・・・・・・可変抵抗器、4,5,6,7・・・・・・
演算増幅器。Fig. 1 is a diagram explaining magnetic field detection by a Hall element, Fig. 2 is a diagram showing an example of the relationship between changes in magnetic flux density and changes in Hall voltage at 20°C, and Fig. 3 is a diagram illustrating magnetic field detection at 20°C.
FIG. 4 is a diagram showing an example of the characteristic relationship between temperature and control current terminal voltage in a Hall element; FIG. 5 is a diagram showing the relationship between Hall voltage and temperature when maintained at Gaussian; 1 is a diagram schematically showing only the main parts of an example of a device for implementing the method. 1...Hall element, 2...Ammeter, 3
・・・・・・Variable resistor, 4, 5, 6, 7...
operational amplifier.
Claims (1)
流を一定値に保ち、ホール電圧V_Hに対するホール素
子の機能を、磁束密度Bと、温度Tとを変数とする2変
数函数V_H=f(B、T) とみなし、さらに、上記ホール素子における制御電流端
子電圧V_Cと温度Tとの特性関係を函数gによつてT
=g(V_C) と近似し、この関係を用いて、V_Hを V_H=f(B、g{V_C}) とし、函数fを、基準温度T_Oに対応する制御電流端
子電圧V_C_oおよび磁束密度の基準値B_O、およ
び上記V_C_O、B_Oに対応するホール電圧の基準
値V_H_Oの近傍で一次函数V_H_O+a(B−B
_O)+b(V_C−V_C_O)で近似し、方程式V
_H−V_H_O=a(B−B_O)+b(V_C−V
_C_O)を定め、これを(B−B_O)について解い
た方程式B−B_O=1/a(V_H−V_H_O)−
b/a(V_C−V_C_O)の右辺に対応するアナロ
グ計算回路を設定し、上記ホール素子に生ずるホール電
圧V_Hおよび制御端子電圧V_Cを電気信号として上
記アナログ計算回路に直接入力し、上記アナログ計算回
路により、その対応する函数値として(B−B_O)を
算出することを特徴とする微小磁界変化の検出方法。[Claims] 1. In a magnetic field detection method using a Hall element, the control current is kept at a constant value, and the function of the Hall element with respect to the Hall voltage V_H is determined by a two-variable function V_H with magnetic flux density B and temperature T as variables. = f(B, T), and furthermore, the characteristic relationship between the control current terminal voltage V_C and the temperature T in the Hall element is expressed as T by the function g.
=g(V_C), and using this relationship, set V_H to V_H=f(B, g{V_C}), and set the function f to the control current terminal voltage V_C_o corresponding to the reference temperature T_O and the standard of the magnetic flux density. A linear function V_H_O+a(B-B
_O) + b(V_C-V_C_O), and the equation V
_H-V_H_O=a(B-B_O)+b(V_C-V
_C_O) is determined and this is solved for (B-B_O) to create an equation B-B_O=1/a(V_H-V_H_O)-
An analog calculation circuit corresponding to the right side of b/a (V_C - V_C_O) is set, and the Hall voltage V_H generated in the Hall element and the control terminal voltage V_C are directly input to the analog calculation circuit as electric signals, and the analog calculation circuit A method for detecting minute magnetic field changes, characterized in that (BB_O) is calculated as the corresponding function value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50042516A JPS599866B2 (en) | 1975-04-07 | 1975-04-07 | How to detect minute magnetic field changes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP50042516A JPS599866B2 (en) | 1975-04-07 | 1975-04-07 | How to detect minute magnetic field changes |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS51117079A JPS51117079A (en) | 1976-10-14 |
| JPS599866B2 true JPS599866B2 (en) | 1984-03-05 |
Family
ID=12638225
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP50042516A Expired JPS599866B2 (en) | 1975-04-07 | 1975-04-07 | How to detect minute magnetic field changes |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS599866B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008008883A (en) * | 2006-06-02 | 2008-01-17 | Denso Corp | Magnetic sensor and sensor |
-
1975
- 1975-04-07 JP JP50042516A patent/JPS599866B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS51117079A (en) | 1976-10-14 |
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