JPS6015149B2 - How to polish indium phosphide crystal - Google Patents
How to polish indium phosphide crystalInfo
- Publication number
- JPS6015149B2 JPS6015149B2 JP10787777A JP10787777A JPS6015149B2 JP S6015149 B2 JPS6015149 B2 JP S6015149B2 JP 10787777 A JP10787777 A JP 10787777A JP 10787777 A JP10787777 A JP 10787777A JP S6015149 B2 JPS6015149 B2 JP S6015149B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- indium phosphide
- polish
- alumina
- phosphide crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Mechanical Treatment Of Semiconductor (AREA)
Description
【発明の詳細な説明】
本発明は半導体結晶ウェハ、さらに特定すればインジウ
ムリン結晶ゥェハの鏡面研摩方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for mirror polishing semiconductor crystal wafers, and more particularly to a method for mirror polishing indium phosphide crystal wafers.
従来、半導体結晶がケイ素、ガリウムヒ素またはガリウ
ムリンであるとき、研摩粒としてアルミナ粒子をアルカ
リ水溶液に懸濁させた研摩液を使用して鏡面仕上げを行
なっていた。Conventionally, when the semiconductor crystal is silicon, gallium arsenide, or gallium phosphide, mirror finishing has been performed using a polishing solution in which alumina particles are suspended in an alkaline aqueous solution as polishing particles.
なお、ガリウムヒ素に対しては臭素をアルコ−ルに溶解
した溶液のみによって化学研摩することが行なわれたが
、この場合は、ウェハ端部が丸味を帯びる「たれ現象」
を生ずる欠点があった。本発明の対象とするインジウム
リン結晶については、アルミナをアルカリ水溶液に懸濁
させた研摩液が使用されていたが、これによる効果は、
研摩粒を水に懸濁させた研摩液と実質的に同様であって
、研摩傷が残り易いのみではなく、研摩速度が遅い欠点
があった。For gallium arsenide, chemical polishing was performed using only a solution of bromine dissolved in alcohol, but in this case, the ``sagging phenomenon'' in which the edges of the wafer became rounded
There was a drawback that caused For the indium phosphide crystal that is the object of the present invention, a polishing liquid in which alumina is suspended in an alkaline aqueous solution has been used, but the effects of this are as follows.
This is substantially the same as a polishing liquid in which abrasive grains are suspended in water, and it not only tends to leave polishing scratches but also has the disadvantage of slow polishing speed.
発明者らは、アルミナ研摩粒とし、臭化水素を溶解させ
た酢酸に研摩粒を懸濁させて得られた研摩液によって、
インジウムリン結晶の鏡面研摩を試みたが、結晶表面に
絹状の模様を生ずる欠点があった。The inventors used a polishing solution obtained by suspending alumina abrasive grains in acetic acid in which hydrogen bromide was dissolved.
An attempt was made to mirror polish an indium phosphide crystal, but it had the drawback of producing a silk-like pattern on the surface of the crystal.
本発明の目的は上記欠点を解消することである。The aim of the invention is to eliminate the above-mentioned drawbacks.
本発明の上記目的は、有機溶剤に臭素を溶解させた溶液
に研摩粒を懸濁させて得られた研摩液を使用することを
特徴とする。The above object of the present invention is characterized in that it uses a polishing liquid obtained by suspending abrasive grains in a solution in which bromine is dissolved in an organic solvent.
インジウムリン結晶の研摩方法によって達成することが
できる。本発明の方法で使用する研摩粒としては酸化鉄
あるいはアルミナが適当であり、その粒度は0.05〜
1〆の範囲が好ましい。また、使用する有機溶剤として
はメチルアルコール、エチルアルコール、プロピルアル
コール、ブチルアルコール、アセトンまたは酢酸を使用
することができる。また得られた研摩液に対する臭素お
よび研摩粒の割合は、それぞれ0.1〜5容量%および
0.1〜2の重量%とすることが適当である。本発明の
方法は、臭素による酸化作用と、アルミナによる機械的
研摩作用とを十分に併用するものであって、得られる半
導体結晶ウェハの鏡面には擦り傷による線状ないし絹状
の模様が認められず、ウェハの端部の角がだれることも
なく、かつ研摩時間を短時間とすることができる。This can be achieved by a method of polishing indium phosphide crystals. Iron oxide or alumina is suitable as the abrasive grains used in the method of the present invention, and the grain size thereof is 0.05~
A range of 1 is preferable. Furthermore, as the organic solvent to be used, methyl alcohol, ethyl alcohol, propyl alcohol, butyl alcohol, acetone or acetic acid can be used. The proportions of bromine and abrasive grains in the resulting polishing solution are suitably 0.1 to 5% by volume and 0.1 to 2% by weight, respectively. The method of the present invention sufficiently combines the oxidation effect of bromine and the mechanical polishing effect of alumina, and the resulting semiconductor crystal wafer has a linear or silk-like pattern on its mirror surface due to scratches. First, the edges of the wafer do not sag, and the polishing time can be shortened.
次に実施例と比較例とによって本発明の方法の操作およ
び効果を詳細に説明する。Next, the operation and effects of the method of the present invention will be explained in detail using Examples and Comparative Examples.
実施例
アルミナ粒子を水に懸濁させた市販の懸濁液(富士見研
摩工業社製 タイプ FM−4)を静贋させて上燈を除
き、得られたアルミナを乾燥させ、粒隆約0.3仏のア
ルミナを得た。Example A commercially available suspension of alumina particles suspended in water (Fujimi Kenma Kogyo Co., Ltd. Type FM-4) was allowed to stand still, the top light was removed, and the resulting alumina was dried to a grain height of about 0. Obtained 3 Buddhas of alumina.
臭素1容積%を含むメチルアルコール溶液200ccに
上記アルミナlogを懸濁させて研摩液とした。通常の
鏡面研摩装置を使用して、保持板に直径25側、厚み5
00仏のインジウムリンウェハを付着させ、研摩用クロ
スに鏡面とすべき結晶面を対向させ、さきの研摩液を4
0ccノminの割合で注力o循環させながら保持板を
5仇.p.m.で回転させて研摩した。The above alumina log was suspended in 200 cc of a methyl alcohol solution containing 1% by volume of bromine to prepare a polishing liquid. Using a regular mirror polisher, attach the retaining plate to a diameter 25 side and a thickness 5 mm.
Attach a 00 French indium phosphorus wafer, place the crystal plane that should be a mirror surface on the polishing cloth, and apply the previous polishing solution to the polishing cloth.
While circulating the focus at a rate of 0 cc min, hold the retaining plate for 5 minutes. p. m. I rotated it and polished it.
このときインジウムリンウェハに加える荷重は20雌/
地とした。約2分の研摩によって表面は光沢を呈し始め
、さらに約10分後には鏡面となり、得られた鏡面には
擦り傷が認められず、またウェハの端部の角がだれるこ
ともなかった。比較例47%臭化水素水20ccを60
%酢酸200ccに加えて、これに上記ァルミナ40g
を懸濁させて研摩液としたことの他は実施例と同機に操
作した。At this time, the load applied to the indium phosphorus wafer is 20 female/
It was grounded. After about 2 minutes of polishing, the surface began to become glossy, and after about 10 minutes, it became a mirror surface. No scratches were observed on the resulting mirror surface, and the edges of the wafer did not sag. Comparative Example: 20cc of 47% hydrogen bromide water
In addition to 200cc of % acetic acid, add 40g of the above alumina to this.
The machine was operated in the same manner as in the example except that the polishing liquid was prepared by suspending the polishing liquid.
Claims (1)
せて得られた研摩液を使用することを特徴とする、イン
ジウムリン結晶の研摩方法。1. A method for polishing indium phosphide crystals, characterized by using a polishing liquid obtained by suspending abrasive grains in a solution of bromine dissolved in an organic solvent.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10787777A JPS6015149B2 (en) | 1977-09-09 | 1977-09-09 | How to polish indium phosphide crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10787777A JPS6015149B2 (en) | 1977-09-09 | 1977-09-09 | How to polish indium phosphide crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5441664A JPS5441664A (en) | 1979-04-03 |
| JPS6015149B2 true JPS6015149B2 (en) | 1985-04-17 |
Family
ID=14470343
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10787777A Expired JPS6015149B2 (en) | 1977-09-09 | 1977-09-09 | How to polish indium phosphide crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6015149B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3222790A1 (en) * | 1982-06-18 | 1983-12-22 | Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen | METHOD FOR POLISHING INDIUMPHOSPHID SURFACES |
| US5040336A (en) * | 1986-01-15 | 1991-08-20 | The United States Of America As Represented By The Secretary Of The Air Force | Non-contact polishing |
| JPH01108435U (en) * | 1988-01-16 | 1989-07-21 |
-
1977
- 1977-09-09 JP JP10787777A patent/JPS6015149B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5441664A (en) | 1979-04-03 |
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