JPS6021956B2 - Liquid phase growth method for semiconductor layer - Google Patents
Liquid phase growth method for semiconductor layerInfo
- Publication number
- JPS6021956B2 JPS6021956B2 JP11541982A JP11541982A JPS6021956B2 JP S6021956 B2 JPS6021956 B2 JP S6021956B2 JP 11541982 A JP11541982 A JP 11541982A JP 11541982 A JP11541982 A JP 11541982A JP S6021956 B2 JPS6021956 B2 JP S6021956B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- liquid phase
- crystal
- growth method
- phase growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B19/00—Liquid-phase epitaxial-layer growth
- C30B19/02—Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
- C30B19/04—Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux the solvent being a component of the crystal composition
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
本発明はリン(P)を含有する半導体基板上に各種半導
体層を液相ェピタキシャルさせるための装置および方法
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus and method for liquid phase epitaxial formation of various semiconductor layers on a semiconductor substrate containing phosphorus (P).
リンを含有する半導体基板のひとつであるたとえばln
P基板は極めて熱分解しやすく、6500 Cで30分
間の加熱によっても1冊基板の表面からPが蒸発してし
まう。One of the semiconductor substrates containing phosphorus, for example ln
P substrates are extremely susceptible to thermal decomposition, and P evaporates from the surface of a single substrate even when heated at 6500 C for 30 minutes.
このため1中茎板表面に小さな玉状のlnが多数残され
、基板結晶表面は著しく平坦性を損なう。従釆、この様
な結晶表面の荒れを平坦化するため、ェピタキシャル成
長の直前にlnP基板表面をわずかに溶解させる工程を
導入したり、或いはlnP基板上に更に別な半導体層を
形成し基板とするなどの手段を用いざるを得なかった。
本発明は、液相ェピタキシャル成長開始直前まで、基板
をP蒸気中にさらす状態に保持しておくことを趣旨とす
るものである。For this reason, many small ball-shaped ln are left on the surface of the 1st stem plate, and the flatness of the substrate crystal surface is significantly impaired. Therefore, in order to smooth out such roughness on the crystal surface, it is necessary to introduce a process to slightly dissolve the surface of the lnP substrate immediately before epitaxial growth, or to form another semiconductor layer on the lnP substrate. They had no choice but to resort to methods such as
The purpose of the present invention is to keep the substrate exposed to P vapor until just before the start of liquid phase epitaxial growth.
最も簡便にはたとえば1冊基板の場合にはこれに対向し
てこれと同種の1冊結晶片をカバーとして対向して設置
することにより結晶を加熱中に起こるPの蒸発を防止し
、基板結晶の表面状態に変化を起こさせること無く液相
ェピタキシャル成長を行なわせるものである。カバーと
しては加熱によってリン蒸気を放出する材料であれば良
いが、不純物の基板への混入等を避けるため、1岬基板
に対し1冊結晶の力バ一を用いるのが好適である。基板
をP蒸気にさらしておくという観点からは装置の凹部7
に別途P蒸気を送りこんでlnP基板からのPの解※を
防止しても勿論良い。しかし実用上装置が大がかりとな
る。以下、実施例に従って本発明を詳細に説明する。The simplest method, for example, in the case of a single substrate, is to place a single crystal piece of the same type as a cover on the opposite side to prevent the evaporation of P that occurs during heating of the crystal, and to prevent the substrate crystal from evaporating. This allows liquid phase epitaxial growth to occur without causing any change in the surface state of the substrate. The cover may be made of any material that releases phosphorus vapor when heated, but in order to avoid contamination of the substrate with impurities, it is preferable to use one crystal power balance for one cape substrate. From the point of view of exposing the substrate to P vapor, the recess 7 of the device
Of course, it is also possible to separately feed P vapor into the lnP substrate to prevent P from being released from the lnP substrate. However, in practice, the equipment is large-scale. Hereinafter, the present invention will be explained in detail according to Examples.
第1図は本発明の実施例を説明する装置断面図である。
6はスライド板でグラフアィト製であり、成長基板を設
ける凹所7が形成されている。FIG. 1 is a sectional view of a device explaining an embodiment of the present invention.
A slide plate 6 is made of graphite and has a recess 7 in which a growth substrate is to be placed.
凹所7にはリンを含有する基板たとえばn型1冊基板1
が収容される。更にn型1冊収納結晶1の上に、1冊カ
バー結晶2を設置する。基板結晶1とlnPカバー結晶
2との間隔は大略0.1肌以下とするのが良い。一方、
溶液受け5はグラフアィト製で次の如き溶液が収納され
る。第1溶液3はln5夕、GaAs25のo、1nA
s260のo、lnP51のoを7000Cに加熱し、
全ての熔質を溶かした後に冷却して準備したものである
。第2溶液4はln5タ上にZno.3の9、lnP5
5雌を接触させて用意したものである。先づこの様に設
置したボートを全体を垣温炉等で一定温度たとえば65
0o Cで30分間加熱し、ついで毎分0.30 Cの
速さで冷却を行った。冷却中にスライド板を移動して、
基板結晶1を第1溶液3および第2溶液4と順次接触さ
せ、GainAsP層とP形1冊層を連続的に成長させ
た。こう,して極めて良好なェピタキシャル成長層を得
ることが出来た。本発明では1中カバー結晶を設けた為
に、6500Cで3び分間加熱している間でも基板結晶
1の表面状態は変化せず、一様な厚さの成長層を得るこ
とが出来る。A substrate containing phosphorus, for example, an n-type substrate 1 is placed in the recess 7.
is accommodated. Further, a one-book cover crystal 2 is installed on the n-type one-book storage crystal 1. The distance between the substrate crystal 1 and the lnP cover crystal 2 is preferably approximately 0.1 skin or less. on the other hand,
The solution receiver 5 is made of graphite and stores the following solutions. The first solution 3 is ln5, GaAs25, 1nA
Heat o of s260 and o of lnP51 to 7000C,
It was prepared by melting all the melt and then cooling it. The second solution 4 was added to Zno. 3 of 9, lnP5
Five females were brought into contact with each other. The whole boat, which is set up in a similar manner, is kept at a constant temperature, for example, 65
Heating was carried out at 0°C for 30 minutes, followed by cooling at a rate of 0.30°C per minute. Move the slide plate during cooling,
The substrate crystal 1 was sequentially brought into contact with the first solution 3 and the second solution 4, and a GainAsP layer and a P-type single layer were successively grown. In this way, we were able to obtain an extremely good epitaxial growth layer. In the present invention, since a cover crystal is provided in substrate 1, the surface condition of substrate crystal 1 does not change even during heating at 6500C for 3 minutes, and a growth layer of uniform thickness can be obtained.
この結晶を用いてたとえばGal瓜P/lnPダブルヘ
テロ構造のレーザダイオードを試作した結果、再現性良
く室温で連続動作可能な素子を得ることができた。Using this crystal, for example, a laser diode with a Gal melon P/lnP double heterostructure was prototyped, and as a result, a device capable of continuous operation at room temperature with good reproducibility was obtained.
上記実施例では、平担な基板結晶上に液相成長層を形成
したが、本発明によれば、高温加熱により基板結晶の表
面状態が変わらないため、基板結晶表面に意図的な凹凸
を設けた場合でも、その凹凸の形状を保つたままの表面
に液相成長層を形成できることは言うまでもない。In the above embodiment, a liquid phase growth layer was formed on a flat substrate crystal, but according to the present invention, since the surface state of the substrate crystal does not change due to high temperature heating, intentional irregularities are provided on the substrate crystal surface. Needless to say, even in such a case, a liquid phase growth layer can be formed on the surface while maintaining the uneven shape.
一方、lnPカバ−結晶2の代りにグラフアィト・カバ
ーを用いて比較実験を行ない結晶の表面状態を観察した
。On the other hand, a comparative experiment was conducted using a graphite cover instead of the lnP cover crystal 2, and the surface state of the crystal was observed.
この結果、1冊基板結晶上にlnPカバーを設けた本発
明を用いるとほとんど凹凸は存在せず液相ェピタキシャ
ル用基板として好ましいものが得られた。一方、グラフ
アィト製カバーを用いた場合、結晶表面に深い不規則な
凹凸が多数形成されェピタキシャル用基板とし用いるこ
とが出来ないものであった。本発明を半導体レーザの製
造に用いた場合の効用について説明する。As a result, when the present invention in which an lnP cover was provided on a single substrate crystal was used, there were almost no irregularities, and a substrate suitable for liquid phase epitaxial use was obtained. On the other hand, when a cover made of graphite was used, many deep irregular irregularities were formed on the crystal surface, making it impossible to use it as an epitaxial substrate. The effects when the present invention is used in manufacturing a semiconductor laser will be explained.
ェピタキシヤル用基板に発生した格子欠陥は極めて多数
の場合は同目的の基板としては使用出来ないし、又仮に
ェピタキシヤル層を成長させる場合も、ェピタキシャル
層中に欠陥が受け継がれ、‘1にの欠陥を介してリーク
電流の増大を招く、‘21寿命、信頼性低下に悪影響を
及ぼす。仕様として上述の実施例と同様の半導体レーザ
装置を作製した場合、カバーなしでは良品率0%である
が、1冊カバーを用いると80〜100%を確保出来る
。又石英カバーを用いた場合50%を越えない。更に信
頼性の指標として劣化率のメデアン(median)値
(動作電流の変動の割合)を比較してみるとlnPカバ
ーを用いると1%/kh程度、欠陥を含む基板を用いた
場合10%/kh程度と約1桁異なる。以上実施例では
最も簡単な構成の液相成長装置を例示したが種々の変形
例があることは論を待たない。If the number of lattice defects that occur in an epitaxial substrate is extremely large, it cannot be used as a substrate for the same purpose, and even if an epitaxial layer is grown, the defects will be inherited in the epitaxial layer, causing the same defects as in '1'. This causes an increase in leakage current, which has an adverse effect on the '21 lifespan and a decrease in reliability. When a semiconductor laser device with specifications similar to those of the above-mentioned embodiments is manufactured, the yield rate is 0% without a cover, but with a single cover, it is possible to secure a rate of 80 to 100%. Also, when using a quartz cover, it does not exceed 50%. Furthermore, when comparing the median value of the deterioration rate (rate of fluctuation in operating current) as an indicator of reliability, it is about 1%/kh when using an lnP cover, and 10%/kh when using a board with defects. It differs by about one order of magnitude from the kh level. In the above embodiments, a liquid phase growth apparatus having the simplest configuration has been illustrated, but it goes without saying that there are various modifications.
しかしいずれの装置に対しても、本発明の液相ェピタキ
シャル成長開始直前の均熱保持時に基板に対向して1中
茎板より成るカバーを設けて保持することによって効果
を奏することが出来る。However, for any of the apparatuses, effects can be obtained by providing and holding a cover made of a single stem plate facing the substrate during soaking and holding immediately before the start of liquid phase epitaxial growth according to the present invention.
第1図は液相成長装置の例を示す断面図である。
1……基板、2・・・…リン蒸気を放出するカバー、3
,4・・・・・・溶液、5・・・・・・溶液だめ、6・
・・・・・スライド板。
葵ー図FIG. 1 is a sectional view showing an example of a liquid phase growth apparatus. 1... Substrate, 2... Cover that releases phosphorus vapor, 3
, 4...Solution, 5...Solution reservoir, 6.
...Sliding board. Aoi diagram
Claims (1)
収容する保持板と、溶液を収納する溶液だめを有し、前
記基板と前記溶液を相対的に移動させ、相互に接触させ
前記基板上に半導体のエピタキシヤル成長層を形成する
液相成長方法であつて、液相エピタキシヤル成長開始前
の均熱保持時に前記基板に対向して、InP基板より成
るカバーを設けて均熱保持することを特徴とする半導体
層の液相成長方法。1. A holding plate for accommodating a semiconductor substrate for liquid phase epitaxial use containing phosphorus and a solution reservoir for accommodating a solution. A liquid phase growth method for forming an epitaxial growth layer, characterized in that a cover made of an InP substrate is provided facing the substrate during soaking and holding before the start of liquid phase epitaxial growth. A liquid phase growth method for a semiconductor layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11541982A JPS6021956B2 (en) | 1982-07-05 | 1982-07-05 | Liquid phase growth method for semiconductor layer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11541982A JPS6021956B2 (en) | 1982-07-05 | 1982-07-05 | Liquid phase growth method for semiconductor layer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS589899A JPS589899A (en) | 1983-01-20 |
| JPS6021956B2 true JPS6021956B2 (en) | 1985-05-30 |
Family
ID=14662100
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11541982A Expired JPS6021956B2 (en) | 1982-07-05 | 1982-07-05 | Liquid phase growth method for semiconductor layer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6021956B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62124430A (en) * | 1985-11-25 | 1987-06-05 | Sanyo Kokusaku Pulp Co Ltd | Device and method for measuring color density |
-
1982
- 1982-07-05 JP JP11541982A patent/JPS6021956B2/en not_active Expired
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62124430A (en) * | 1985-11-25 | 1987-06-05 | Sanyo Kokusaku Pulp Co Ltd | Device and method for measuring color density |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS589899A (en) | 1983-01-20 |
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