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JPS6022826B2 - bonding wire - Google Patents
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JPS6022826B2 - bonding wire - Google Patents

bonding wire

Info

Publication number
JPS6022826B2
JPS6022826B2 JP52099594A JP9959477A JPS6022826B2 JP S6022826 B2 JPS6022826 B2 JP S6022826B2 JP 52099594 A JP52099594 A JP 52099594A JP 9959477 A JP9959477 A JP 9959477A JP S6022826 B2 JPS6022826 B2 JP S6022826B2
Authority
JP
Japan
Prior art keywords
wire
bonding
metal
metals
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52099594A
Other languages
Japanese (ja)
Other versions
JPS5433659A (en
Inventor
武久 浜野
元 村上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP52099594A priority Critical patent/JPS6022826B2/en
Publication of JPS5433659A publication Critical patent/JPS5433659A/en
Publication of JPS6022826B2 publication Critical patent/JPS6022826B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07551Connecting or disconnecting of bond wires characterised by changes in properties of the bond wires during the connecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/521Structures or relative sizes of bond wires
    • H10W72/522Multilayered bond wires, e.g. having a coating concentric around a core
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/5363Shapes of wire connectors the connected ends being wedge-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Wire Bonding (AREA)

Abstract

PURPOSE:To prevent feasible junction caused by the production of intermetallic compound due to bonding between different types of metals, by forming junction with the same types of metals or metals not causing intermetallic compounds.

Description

【発明の詳細な説明】 本発明は、ボンディングワイヤの構造及びそれを用いた
ワイヤボンディング方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a bonding wire structure and a wire bonding method using the same.

従来提案されているワイヤボンディング法は、Au,A
そ線などを用い、超音波溶接、熱圧着(ネイルヘッド)
、抵抗溶接などのボンディング法により半導体べレツト
のパッドとりードの先端部とを電気的に接続させる方法
で半導体装置の製造分野では広く実用化されている技術
である。しかし、ワイヤボンディングは、操作が比較的
簡単である反面接続部(コンタクト部)の機械的強度は
それ程強くない。特に、パッドとワイヤ、ワイヤとりー
ドとの材料がそれぞれ異なる場合(異なるのが一般的で
ある)には、コンタクト部に金属間化合物が生成され接
合部が脆弱化する。この金属間化合物の生成を防止して
接合部の接着力(ポンダピリティ)確保するために従釆
から、例えばワイヤ先端部あるいは、リード先端部にA
u又はAgメッキを施す等の表面処理を行うのが普通で
あった。このAuあるいはAgメッキ等の表面処理は高
価な作業となり、半導体装置の構成部品の価格低減の阻
害要因となっている。そこで、本発明の目的は、接着強
度の強いボンディングワイヤを提供するにある。
Conventionally proposed wire bonding methods include Au, A
Ultrasonic welding, thermocompression bonding (nail head) using straight wire, etc.
This is a method of electrically connecting the pad of a semiconductor pellet to the tip of a lead using a bonding method such as resistance welding, and is a technique widely used in the field of manufacturing semiconductor devices. However, although wire bonding is relatively easy to operate, the mechanical strength of the connecting portion (contact portion) is not so strong. In particular, when the pad and the wire, and the wire and the lead, are made of different materials (generally, they are different), intermetallic compounds are generated in the contact portion, weakening the joint. In order to prevent the formation of this intermetallic compound and ensure bonding strength (pondability) at the joint, for example, A
It was common practice to perform surface treatments such as U or Ag plating. This surface treatment, such as Au or Ag plating, is an expensive operation, and is an impediment to reducing the cost of components of semiconductor devices. Therefore, an object of the present invention is to provide a bonding wire with strong adhesive strength.

本発明は、接合部の脆弱化の原因が異種金属接合による
金属間化合物の生成にある点を考慮し、極力同種金属の
接合、又は金属間化合物生成をしない金属同士の接合を
形成する、あるいは金属間化合物生成をする金属同士の
接合部を少なくする等の手段により、接合強度を強くし
たボンディングワイヤを提供しようとするもので、その
要旨とするところは、第1の金属からなる第1の線材と
、この線材の軸線に沿って設けられた第2の金属からな
る第2の線材とによりボンディングワイヤを構成した点
にある。
The present invention takes into consideration the fact that the cause of weakening of joints is the formation of intermetallic compounds due to the joining of dissimilar metals, and forms joints of similar metals or metals that do not generate intermetallic compounds as much as possible, or The aim is to provide a bonding wire with increased bonding strength by reducing the number of bonding parts between metals that generate intermetallic compounds. The bonding wire is constituted by a wire rod and a second wire rod made of a second metal provided along the axis of the wire rod.

本発明に於て、第1の金属と、第2の金属の選択は、ベ
レットのパッド材質及びリードの先端部の材質によって
決められる。
In the present invention, the selection of the first metal and the second metal is determined by the material of the pad of the pellet and the material of the tip of the lead.

即ち、第1の金属としてパッドと金属間化合物を生成し
ない材料を選択すれば、第2の金属としてはリードの先
端部と金属間化合物を生成しない材料が選択される。第
1の金属孫濠材と第2の金属線材との接合形態は、クラ
ッド線とするのが好ましく、具体的には第1の金属線材
の片面に第2の金属線材を被着したり、第1の金属線材
のまわりを第2の金属線材で被ったりするのがよい。通
常、半導体べレットのパッドはAそで、リードの先端は
コバールでそぜぞれ作られるので、本発明の好ましい実
施例に於けるワイヤで使用される材質は、第1の金属、
即ちパッド側接合用としては、Aぞ,Au,Ag,Cu
等であり、第2の金属則ちリード側接合用としては、F
eステンレススチール、42アロイ、コ/ゞール、Su
,Cu,A仏Aそ,Aタ等である。
That is, if a material that does not form an intermetallic compound with the pad is selected as the first metal, a material that does not form an intermetallic compound with the tip of the lead is selected as the second metal. It is preferable that the first metal sub-moat material and the second metal wire be joined by a clad wire. Specifically, the second metal wire may be attached to one side of the first metal wire, or the second metal wire may be bonded to the first metal wire. It is preferable to cover the metal wire with a second metal wire. Generally, the pads of the semiconductor pellet are made of A-sleeves and the tips of the leads are made of Kovar, so the materials used for the wire in the preferred embodiment of the present invention are the first metal,
That is, for pad side bonding, Azo, Au, Ag, Cu
etc., and for the second metal, ie, lead side bonding, F
eStainless Steel, 42 Alloy, Coal/Gal, Su
, Cu, A Buddha A so, A Ta, etc.

これ等の金属のうち異なるもの同士を任意に組み合せる
ことにより、本発明のボンディングワイヤが形成される
The bonding wire of the present invention is formed by arbitrarily combining different metals among these metals.

以下、本発明の一実施例を図に基づき説明する。Hereinafter, one embodiment of the present invention will be described based on the drawings.

第1図及び第2図は、3本で1組のりードを有するリー
ドフレームにおいて、中央リード1に半導体べレット2
を固着し、このべレツトに形成されたA〆パッド3と中
央リードの両側のりード(材質コバール)4とを本発明
に係わるボンディングワイヤ5にて熱圧着接続した状態
を示している。
1 and 2 show a lead frame having a set of three leads, with a semiconductor pellet 2 attached to the center lead 1.
The figure shows a state in which the A-stop pad 3 formed on the bellet and the leads (made of Kovar) 4 on both sides of the center lead are connected by thermocompression using the bonding wire 5 according to the present invention.

第1図が上面図で、第2図が第1図ロー0線断面図であ
る。第3図は、ボンディングワイヤ5の断面図で、第1
の線材6を構成する第1の金属はA夕、第2の線村7を
構成する第2の金属はコバールである。
FIG. 1 is a top view, and FIG. 2 is a sectional view taken along the line 0 in FIG. 1. FIG. 3 is a cross-sectional view of the bonding wire 5.
The first metal constituting the wire rod 6 is A-metal, and the second metal constituting the second wire rod 7 is Kovar.

この様な構造のワイヤをべレツトのパッド及びリード先
端部に接続した個所の拡大図を第4図に示している。パ
ッド側に熱圧着されるワイヤの金属はAそ線材6で、リ
ード先端部に熱圧着される金属はコバール線材7である
。この例では、当然ボンディングワイヤ5は中間部で1
80o回転させられる。本発明に係わるボンディングワ
イヤ5を使用し、実施例で示された様にパッド及びリー
ド‘こワイヤをボンディングすれば、同種金属同士の熱
圧着であるため、金属間化合物は生成されず、それに起
因する接合部の脆弱化は阻止される。
FIG. 4 shows an enlarged view of the portion where the wire having such a structure is connected to the pad of the bellet and the tip of the lead. The metal of the wire that is thermocompression bonded to the pad side is A-strip wire 6, and the metal that is thermocompression bonded to the lead tip is Kovar wire 7. In this example, naturally the bonding wire 5 is 1 in the middle part.
Rotated 80o. If the bonding wire 5 according to the present invention is used and the pad and lead wire are bonded as shown in the example, since the same type of metals are bonded by thermocompression, intermetallic compounds will not be generated, and no intermetallic compounds will be generated. weakening of the joint is prevented.

更に、従来の様なりードフレーム先端部のメッキ等のわ
ずらわしい表面処理作業も不要となる。
Furthermore, there is no need for troublesome surface treatment operations such as plating the tip of the curved frame, which is required in the past.

本発明の実施例では、ボンディングワイヤは180o回
転してそれぞれ接合させたが、180o回転せずに、第
5図に示す如く、直接、例えば超音波溶接しても、接合
部の約半分がコバール同士の接合となるため、従来に比
較して接合強度は格段に高められることになる。
In the embodiment of the present invention, the bonding wires were rotated 180 degrees to join each other, but even if the bonding wires were directly welded, for example by ultrasonic wave, as shown in FIG. Since the two are bonded together, the bonding strength is significantly increased compared to the conventional method.

【図面の簡単な説明】[Brief explanation of drawings]

第1図乃至第6図は、本発明の実施態様を説明する図で
、第1図及び第2図は、ベレットのパッドとりードとを
ワイヤで接合した状態を示し第1図はその上面図、第2
図は第1図の0−ロ線断面図、第3図は本発明に係わる
ワイヤの断面図、第4図は接合部拡大断面図、第5図は
、本発明の他の実施態様の説明図で接合部拡大断面図で
ある。 1,4・・・・・・リードフレーム、2・・・・・・半
導体べレツト、3……パッド、5……ボンディングワイ
ヤ、6・・・・・・Aそ線材、7・・・・・・コバール
線材。 第1図第2図 第3図 第4図 第5図
1 to 6 are diagrams for explaining embodiments of the present invention, and FIGS. 1 and 2 show the state in which the pad and lead of the bullet are joined with a wire, and FIG. 1 shows the top surface thereof. Figure, 2nd
The figures are a cross-sectional view taken along the line 0-B of FIG. 1, FIG. 3 is a cross-sectional view of the wire according to the present invention, FIG. 4 is an enlarged cross-sectional view of the joint, and FIG. 5 is an explanation of another embodiment of the present invention. The figure is an enlarged sectional view of the joint. 1, 4...Lead frame, 2...Semiconductor bellet, 3...Pad, 5...Bonding wire, 6...A straight wire, 7... ... Kovar wire. Figure 1 Figure 2 Figure 3 Figure 4 Figure 5

Claims (1)

【特許請求の範囲】[Claims] 1 たがいに異種の金属からそれぞれ構成されている第
1及び第2のボンデイング予定部の間を電気的・機械的
に接続するためのボンデイングワイヤであつて、前記第
1のボンデイング予定部の金属との間で良好なボンダビ
リテイを示す第1の金属からなる半円形断面の第1の線
材と、前記第2のボンデイング予定部の金属との間で良
好なボンダビリテイを示す第2の金属からなり、前記第
1の線材その軸方向に沿つて固着された半円形断面の第
2の線材とをそなえたボンデイングワイヤ。
1 A bonding wire for electrically and mechanically connecting a first and a second bonding area each made of different metals, the bonding wire having a bonding wire that is connected to the metal of the first bonding area. a first wire rod having a semicircular cross section made of a first metal that exhibits good bondability between the wire rod and a second metal that exhibits good bondability between the metal of the second bonding scheduled portion; A bonding wire comprising a first wire and a second wire having a semicircular cross section fixed along the axial direction of the first wire.
JP52099594A 1977-08-22 1977-08-22 bonding wire Expired JPS6022826B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52099594A JPS6022826B2 (en) 1977-08-22 1977-08-22 bonding wire

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52099594A JPS6022826B2 (en) 1977-08-22 1977-08-22 bonding wire

Publications (2)

Publication Number Publication Date
JPS5433659A JPS5433659A (en) 1979-03-12
JPS6022826B2 true JPS6022826B2 (en) 1985-06-04

Family

ID=14251413

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52099594A Expired JPS6022826B2 (en) 1977-08-22 1977-08-22 bonding wire

Country Status (1)

Country Link
JP (1) JPS6022826B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60225450A (en) * 1984-04-24 1985-11-09 Furukawa Electric Co Ltd:The Manufacture of semiconductor device

Also Published As

Publication number Publication date
JPS5433659A (en) 1979-03-12

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