JPS602386B2 - How to manage plating solution and chemical solution - Google Patents
How to manage plating solution and chemical solutionInfo
- Publication number
- JPS602386B2 JPS602386B2 JP57042468A JP4246882A JPS602386B2 JP S602386 B2 JPS602386 B2 JP S602386B2 JP 57042468 A JP57042468 A JP 57042468A JP 4246882 A JP4246882 A JP 4246882A JP S602386 B2 JPS602386 B2 JP S602386B2
- Authority
- JP
- Japan
- Prior art keywords
- replenishment
- amount
- proportional
- chemical
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C22/00—Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C22/73—Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals characterised by the process
- C23C22/77—Controlling or regulating of the coating process
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J19/00—Chemical, physical or physico-chemical processes in general; Their relevant apparatus
- B01J19/0006—Controlling or regulating processes
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemically Coating (AREA)
- Chemical Treatment Of Metals (AREA)
Description
【発明の詳細な説明】
この発明はめつき液及びめつきの前処理、あるいは後処
理に用いる化成液(以下上記2種類の液を化学処理液と
いう)の管理方法、特にその液の性質を決定する物理量
、化学量の管理方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method for managing a plating solution and a chemical solution used for pre-treatment or post-treatment of plating (hereinafter, the above two types of solutions are referred to as chemical treatment solutions), and in particular determines the properties of the solution. It concerns methods of managing physical and chemical quantities.
イb学処理液による処理がより均一かつ経済的になされ
るためには、該処理液の温度、濃度、粘度等の物理量や
化学量を厳密に管理することが要請される。In order to achieve more uniform and economical treatment with a chemical treatment liquid, it is required to strictly control physical and chemical quantities such as temperature, concentration, and viscosity of the treatment liquid.
例えば、絶縁板上にめつきによって金属薄膜を形成した
プリント基板は、エレクトロニクスの進歩に共なって機
械的強度あるいは膜厚の均一性等が強く要請される様に
なっており、この要請に答えるには、めつき液中の各種
成分濃度を適正かつ均一に調整する必要がある。For example, printed circuit boards, which are made by plating a thin metal film on an insulating board, are required to meet the demands of mechanical strength and uniformity of film thickness as electronics progresses. To achieve this, it is necessary to adjust the concentrations of various components in the plating solution appropriately and uniformly.
ところで、従釆のイb学処理液の管理調正方法を上記め
つき液について説明すると、例えば一定時間(例えば3
時間)おきに手分析で各種濃度を測定し、その結果に基
づいて、そのつど適当量、例えば設定値より10%高い
濃度になるまで補給することが行なわれていたのである
が、この方法では第1図に示す様に濃度のバラつきが激
しく、かつ濃度が均一になるまでに時間的遅れがあり、
上記要請に耐え縛るものではなかった。By the way, to explain the control and adjustment method of the secondary chemical processing solution for the above-mentioned plating solution, for example, for a certain period of time (for example, 3
The various concentrations were manually measured at intervals (time), and based on the results, the appropriate amount was replenished each time, for example, until the concentration was 10% higher than the set value, but this method As shown in Figure 1, the concentration varies greatly, and there is a time delay before the concentration becomes uniform.
It did not comply with the above request.
またこの従来の方法を用いて上記時間遅れの問題を解決
し、液の安定性を確保するためには、大規模な縄はんシ
ステムが必要となり、結果として製品のコストを押し上
げていたのである。更に上記とは別の方法として、第2
図に示す様にめつき液の各成分の濃度を連続的に分析し
、その結果の濃度が範囲を持たせた設定値の下限よりも
低くなった時に、供V給菱贋を自動的に作動させて濃度
を上昇させ、該濃度が設定の上限を越えた時に供艶溝装
置の作動を自動的に停止する様にした方法も使用されて
いたのである。Furthermore, in order to solve the above-mentioned time delay problem and ensure the stability of the liquid using this conventional method, a large-scale rope system was required, which resulted in an increase in the cost of the product. . Furthermore, as a method different from the above, the second
As shown in the figure, the concentration of each component of the plating solution is continuously analyzed, and when the resulting concentration is lower than the lower limit of the set value with a range, the supply voltage is automatically switched off. A method was also used in which the polishing groove device was activated to increase the concentration, and when the concentration exceeded a set upper limit, the operation of the polishing groove device was automatically stopped.
しかしながら、この方法は、分析を連続的に行なうが、
補給が間歌的であるため前述の手分析の場合と同様に濃
度のバラつき、及び均一になるまでの時間遅れの問題は
解消されないで濃度を連続して一定に保つことができな
い上、連続分析であるが故に濃度センサーとして電極を
用いると測定中の電極への付着物の影響を受けて分析精
度が経時的に低下し従って、それだけ濃度のバラつきが
大きくなるといった欠点が生じていた。この発明は、上
記従釆の事情に鑑みて提案されたものであって、めつき
液やその他の化学処理液の物理的、化学的測定値を該液
の使用量とのバランスを保って補給することによって、
管理調整することを目的とするものである。However, although this method performs analysis continuously,
Because the replenishment is intermittent, the problem of concentration variations and the time delay until it becomes uniform is not solved, as in the case of manual analysis mentioned above, and it is not possible to keep the concentration constant continuously. However, when an electrode is used as a concentration sensor, the accuracy of analysis decreases over time due to the influence of deposits on the electrode during measurement, resulting in a disadvantage that the variation in concentration increases accordingly. This invention has been proposed in view of the above-mentioned circumstances, and it supplies the physical and chemical measurement values of plating solution and other chemical treatment solutions while maintaining a balance with the amount of the solution used. By,
The purpose is to manage and coordinate.
この発明は、一定時間おきに被管理液の状態を示す物理
量、又は化学量を測定検出するステップと、基準設定値
と、今回測定値との差から比例補給量を算出するステッ
プと、今回測定値と前回測定値と更に前回の比例補給量
を用いて定量補給量を算出するステップと、上記の様に
して求められた定量補給量と比例補給量を被管理液に補
給するステップとよりなることを主たる特徴とするもの
であって、以下更に詳しく説明する。This invention includes the steps of: measuring and detecting a physical quantity or chemical quantity indicating the state of the liquid to be managed at regular intervals; calculating a proportional replenishment amount from the difference between a reference setting value and the currently measured value; It consists of a step of calculating a fixed replenishment amount using the value, the previous measured value, and the previous proportional replenishment amount, and a step of replenishing the controlled liquid with the fixed replenishment amount and proportional replenishment amount determined as above. This is the main feature, and will be explained in more detail below.
* 第3図は、この発明の概用を示すフローチャートで
ある。*FIG. 3 is a flowchart showing the general application of this invention.
この第3図に於て、まず処理槽1には入っている被管理
液は、一定時間(例えば1時間)おきにサンプリングさ
れ温度、粘度、濃度、比重、解(水素イオン濃度)等の
物理量又は化学量が測定される。測定結果は、電気量と
して取出されCPU2に入力され、該CPU2は以下の
様にして比例補給量と定量補給量を算出する。比例補給
量とは基準設定値とのずれを惨正する・ために、一時的
にあるいは、常時に処理液槽1に補給される液量や熱量
等であって、この童は種々のファクターから算出される
が、基本的には比例補給量(Do)=(基準設定値−今
回測定値)×糟容量 ・・・……・・
・・・・m■で求められる。In Fig. 3, the liquid to be managed contained in the treatment tank 1 is sampled at regular intervals (for example, 1 hour) and physical quantities such as temperature, viscosity, concentration, specific gravity, solution (hydrogen ion concentration), etc. Or the stoichiometry is measured. The measurement results are taken out as electrical quantities and input to the CPU 2, and the CPU 2 calculates the proportional replenishment amount and fixed replenishment amount in the following manner. The proportional replenishment amount is the amount of liquid, heat, etc. that is temporarily or constantly replenished into the processing liquid tank 1 in order to correct the deviation from the standard set value. It is calculated, but basically the proportional supply amount (Do) = (standard setting value - current measured value) x pot capacity ......
・・・It is determined by m■.
この値は常時補給が続けられる場合の単位時間当りの補
給量であるので、サンプリング間隔より短い時間での補
給(第4図参照)をしようとする場合の単位時間当り補
給量はD=D。Since this value is the amount of replenishment per unit time when replenishment is continued at all times, the amount of replenishment per unit time when replenishment is attempted in a time shorter than the sampling interval (see Figure 4) is D=D.
Xサンプリング間隔時間,..,..,....,..
【2ー補給時間となる。X sampling interval time, . .. 、. .. 、. .. .. .. 、. ..
[2-It's time for replenishment.
定量補給量とは、その液の負荷とのバランスをとるため
に常時処理液槽1に補給される液量や熱量であって種々
のファクターから算出されるが、基本的には定量補給量
佃二(今回測定値−前回測定値)x槽容量÷十前回比例
補給量〔(D。The fixed amount of replenishment is the amount of liquid or heat that is constantly replenished into the processing liquid tank 1 in order to balance the load of the liquid, and is calculated from various factors, but basically the fixed amount of replenishment is 2 (current measured value - previous measured value) x tank capacity ÷ 10th previous proportional replenishment amount [(D.
)又は(D)〕.…・・・・・(3)サンプリング間隔
時間で単位時間当りの補給量が求められることになる。) or (D)]. (3) The amount of replenishment per unit time is determined by the sampling interval time.
正しい量の定量補給がなされると、その液の目的とする
物理量、あるいは化学量は当該化学処理液中で一定に保
たれる。尚、測定対象によっては、例えば濃度は測定時
に使用するセンサーの精度が充分でない場合があり、こ
の場合には上記糊式によって算出された複数回の定量補
給量を平均にすることによってより正しい定量補給量を
求めることができる。When the correct amount of quantitative replenishment is performed, the desired physical or chemical quantity of the liquid is kept constant in the chemical processing liquid. Depending on the object to be measured, for example, the accuracy of the sensor used when measuring concentration may not be sufficient. In this case, more accurate quantification can be achieved by averaging the amount of quantitative replenishment calculated multiple times using the above glue formula. Replenishment amount can be determined.
以上の様にして求められた比例補給量と定量補給量との
和が第■式に示す様に処理液槽1に補給されることとな
り、上記比例補給によって基準設定値とのずれが補正さ
れ、定量補給によって負荷とのバランスが保たれること
となる。The sum of the proportional replenishment amount and fixed replenishment amount determined as above is replenished into the processing liquid tank 1 as shown in equation (2), and the deviation from the standard setting value is corrected by the proportional replenishment. , the balance with the load will be maintained by constant replenishment.
総補給量(時間当り)=比例補給量〔(Do)又は(D
)〕十定量補給量(H) ・…・・・・・・・・・
・・‘4}尚、実験的には、比例補給を常時定量補給に
加えて補給するよりも、{2)式に従ってサンプリング
間隔の5分の1程度の時間で行う方が、良好な結果を得
ている(以下の実施例参照)。Total supply amount (per hour) = Proportional supply amount [(Do) or (D
)] Ten quantity supply amount (H) ・・・・・・・・・・・・・
...'4} Furthermore, experimentally, better results are obtained by performing proportional replenishment at about one-fifth of the sampling interval according to formula {2) than by constantly replenishing it in addition to quantitative replenishment. (See Examples below).
第4図は、以上の説明に基づいて、実際に化学処理液の
管理を行なう場合の状態を経時的に表わしたものであり
、第4図aは物理量、化学量の経時的変化を、また第4
図bは補給量の経時的変化を示したものである。Figure 4 shows the state of actual management of chemical treatment liquids over time based on the above explanation, and Figure 4a shows changes in physical quantities and chemical quantities over time. Fourth
Figure b shows the change in the amount of replenishment over time.
第4図bに於いては、この化学処理液が、この発明に基
づいて管理される以前から理論的に算出される量Hoで
初期の見込補給がなされている。ただし、この初期の見
込補給量Hoは零であってもよい。次に時刻t,で、第
1回目のサンプリングがなされて管理の対象となってい
る物理量又は化学量が測定され、【11式と■式を基に
して算出された第1回目の比例補給量D,がサンプリン
グ間隔の数分の1程度の時間で補給される。In FIG. 4b, the chemical treatment liquid is initially replenished in an amount Ho calculated theoretically before it is managed according to the present invention. However, this initial expected supply amount Ho may be zero. Next, at time t, the first sampling is performed to measure the physical quantity or chemical quantity that is the subject of management, and [the first proportional supply amount calculated based on formula 11 and formula D, is replenished in a time approximately a fraction of the sampling interval.
従って比例補給が終った時点で被調整量はほぼ基準設定
値となる。時刻t,から一定時間後、例えば1時間後の
時刻らに第2回目のサンプリングが行なわれ、前回と同
様の比例補給量D2の算出及びその算出量D2に基づい
て比例補給が行なわれる。この時更に、第1回目のサン
プリング結果(前回測定値)と第2回目のサンプリング
結果(今回測定値)、更に第1回目の比例補給量D,を
用いて【31式に基づいて、Z定量補給量日,′の算出
が行なわれ、その結果は記憶装置に記憶させておく。更
に時刻t2から一定時間後の時刻t3に第3回目のサン
プリングが行なわれ、前回及び前々回と同様の比例補給
量D3の算出及び比例補給が行われることはもちろんで
あるZが、前回同様この時にも剛式で示される定量補給
量日,″の算出がなされる。ところで例えば、濃度測定
等に用いるセンサーは精度の面での信頼性に多少難点が
あり、定量補給量を算出する際には複数のデータ一の平
均をとる方が望ましい。Therefore, when the proportional replenishment is completed, the adjusted amount becomes approximately the reference setting value. A second sampling is performed after a certain period of time, for example, one hour after time t, and the proportional replenishment amount D2 is calculated in the same way as the previous time, and proportional replenishment is performed based on the calculated amount D2. At this time, furthermore, using the first sampling result (previous measurement value), the second sampling result (current measurement value), and the first proportional supply amount D, [based on formula 31, Z quantitative The replenishment amount date,' is calculated, and the result is stored in the storage device. Furthermore, the third sampling is performed at time t3, which is a certain period of time after time t2, and it goes without saying that the proportional replenishment amount D3 is calculated and the proportional replenishment is performed in the same way as the previous time and the time before the previous time. Also, the fixed amount of replenishment is calculated using the rigid formula.For example, sensors used for concentration measurement etc. have some drawbacks in terms of accuracy and reliability, so when calculating the fixed amount of replenishment, It is preferable to take the average of multiple pieces of data.
そこでこの第4図の例では前回算出した時刻ら時の定量
補給量日,′と今回算出した時刻t3時の定量補給量日
,″との平均をとってできるだけ正確な定量補給量日,
を算出している。もっとも、ここで更に多くの回数の算
出値の平均をとってもよいし、またセンサーに充分な精
度が期待できる場合は1回だけの算出値を用いてもよい
。この様にして算出された定量補給量日,は前記した見
込補給童Hoと異なる値であることが一般的であり、そ
の場合△H=日,一日。Therefore, in the example shown in Fig. 4, the fixed amount replenishment date calculated last time at time t, '' and the currently calculated fixed amount replenishment date at time t3,'' are averaged to determine the fixed amount replenishment date as accurate as possible.
is being calculated. However, it is also possible to take the average of the calculated values more times, or if the sensor is expected to have sufficient accuracy, the calculated value only once can be used. The quantitative replenishment amount day calculated in this way is generally a different value from the above-mentioned expected replenishment amount Ho, in which case ΔH=day, one day.
……………【51だけ理論補給量Ho
に追加して前記時刻t3時の比例補給量D3に加えて補
給してやればよいことになる。以後時刻t4,t5・・
・・・・・・・・・・・・・とサンプリングを続け、比
例補給量と定量補給量を算出し補給量を調整することが
繰返えされるわけである。……………【51 theoretical supply amount Ho
It is only necessary to replenish in addition to the proportional replenishment amount D3 at time t3. From then on, time t4, t5...
. . . Sampling continues, the proportional replenishment amount and fixed replenishment amount are calculated, and the replenishment amount is adjusted repeatedly.
前記時刻t3の時にもし‘5’式の△日があまりにも大
き過ぎて定量補給量日,と比例補給量D3の和が基準設
定値よりもあまりにも大きくなるときには、第4図破線
で示す様に2回〜3回に分割して徐々に増加させるよう
にしてもよい。At the time t3, if the △day in formula '5' is too large and the sum of the quantitative replenishment amount day and the proportional replenishment amount D3 becomes too large than the standard setting value, then the equation will be changed as shown by the broken line in Figure 4. It may be divided into 2 to 3 times and gradually increased.
以上に説明した方法を使用して管理調整できる物理量、
化学量は多岐に渡り、例えば濃度、母(水素イオン濃度
)、温度、粘度、比重等センサーを用いて電気量として
取出せる値すべてに及ぶ。Physical quantities that can be managed and adjusted using the methods described above,
Chemical quantities are diverse and include all values that can be extracted as electrical quantities using sensors, such as concentration, base (hydrogen ion concentration), temperature, viscosity, and specific gravity.
第1表はこの発明を適用して、管理し得る対象項目を列
挙したものである。第2表は、以上に説明したイb学処
理液の管理方法をプリント基板工場に於ける無電解鋼め
つき液中の各種成分の濃度管理に適用した場合の濃度変
動幅を前記第1図に示す手分析の場合の結果と比較した
ものであり、pH(水素イオン濃度)Cu2十濃度、H
CHO濃度とも著しく改善されていることが判る。Table 1 lists target items that can be managed by applying this invention. Table 2 shows the range of concentration fluctuations as shown in Figure 1 above when the above-described control method for chemical treatment liquid is applied to the concentration control of various components in electroless steel plating solution at a printed circuit board factory. This is a comparison with the results of manual analysis shown in
It can be seen that both the CHO concentration was significantly improved.
更に第3表は第2表と同じ条件下での各種補給液の使用
量を検討したものであって手分析の場合に比して、補給
童そのものも著しく減少していることが判る。Furthermore, Table 3 examines the amounts of various replenishment fluids used under the same conditions as in Table 2, and it can be seen that the number of replenishers themselves has decreased significantly compared to the case of manual analysis.
第4表はこの発明を金めつきに適用した場合の各種成分
の濃度変化の幅を従来の管理値と比較したものであって
、それぞれ著しく改善されていることが判る。Table 4 compares the range of concentration changes of various components when this invention is applied to gold plating with conventional control values, and it can be seen that each is significantly improved.
第5図はこの発明を実施するための装置の一例を示した
ものである。FIG. 5 shows an example of an apparatus for carrying out the invention.
1はめつき液糟等の化学処理液槽、21はサンプリング
ポンプであって後述のコンピューター3の指令によって
一定時間おきにサンプリング液を汲み上げる。1 is a tank for chemical processing liquid such as plating liquid, and 21 is a sampling pump which pumps up sampling liquid at regular intervals according to instructions from a computer 3, which will be described later.
22はセンサーであって例えば無電解鋼メッキに関して
いえば、ガラス電極、その他の電位差測定用電極〔斑(
水素イオン濃度)、鋼イオン濃度、ホルマリン(還元剤
)等の測定〕吸光度セル(銅イオン濃度測定)を用いる
。22 is a sensor; for example, in the case of electroless steel plating, a glass electrode or other potential difference measuring electrode [spotted] is used.
Measurement of hydrogen ion concentration), steel ion concentration, formalin (reducing agent), etc.] Use an absorbance cell (measurement of copper ion concentration).
23は各種金属イオン(例えば鋼イオン、金イオン、ニ
ッケルイオン、スズィオン)、添加物(例えばシアン、
アンモニア)、還元剤(例えばホルマリン、次盛りン酸
)等の分析試薬槽、24はサンプリング液の鱗液槽であ
る。23 contains various metal ions (e.g. steel ions, gold ions, nickel ions, tin ions), additives (e.g. cyanide,
ammonia), reducing agents (for example, formalin, subphosphoric acid), etc., and 24 is a scale liquid tank for sampling liquid.
3はマイクロコンピューターであって基準濃度の設定値
等プログラム操作上必要な事項を記憶させておくメモリ
ー31と、センサー22の出力と設定値を比較するコン
パレーター手段32と比例補給裏、連続補給量等を算出
する演算手段33と演算手段33の出力を受けて補給ポ
ンプ4を駆動する出力手段35と入力事項や演算結果を
表示器34とテンキー等の入力手段36とよりなる。Reference numeral 3 denotes a microcomputer, which includes a memory 31 for storing items necessary for program operation such as reference concentration setting values, a comparator means 32 for comparing the output of the sensor 22 and the setting value, and proportional and continuous replenishment amounts. etc., an output means 35 that receives the output of the calculation means 33 and drives the replenishment pump 4, a display 34 for displaying input items and calculation results, and an input means 36 such as a numeric keypad.
更に4は補給ポンプであり5は補給槽である。この構成
に於いてセンサー22でサンプリング液の被管理値例え
ば濃度が電気信号としてコンピューター3に伝送され、
コンパレーター手段32で設定値と比較されて演算手段
33で比例補給量や連続補給量が算出され、出力手段3
5で補給ポンプ4を駆動すると同時に表示器34に必要
事項を表示するのである。以上説明した様に、この発明
はめつき液及びめつきの前処理、あるいは後処理に用い
る化成液等**の化学処理液の補給を比例補給と定量補
給の総和として行なう様になっているので、基準値との
ずれの調整(比例補給)、及び負荷とのバランスの調整
(定量補給)が簡単かつ迅速となり、管理が開始された
初期に数度の比例補給をしておくと、負荷の大きな変動
がない限りほとんど定量補給だけで管理対象値を一定に
保つことができ、しかも濃度等が均一になるまでの時間
遅れの問題も生じない効果を有しているのである。Furthermore, 4 is a replenishment pump and 5 is a replenishment tank. In this configuration, the sensor 22 transmits a controlled value, such as concentration, of the sampling liquid to the computer 3 as an electrical signal.
The comparator means 32 compares it with the set value, and the calculation means 33 calculates the proportional replenishment amount and continuous replenishment amount, and the output means 3
At the same time as the replenishment pump 4 is driven in step 5, necessary information is displayed on the display 34. As explained above, in this invention, the plating solution and the chemical processing solution such as chemical solution used for plating pre-treatment or post-treatment are replenished as a sum of proportional replenishment and quantitative replenishment. Adjusting the deviation from the reference value (proportional replenishment) and adjusting the balance with the load (quantitative replenishment) are easy and quick, and if you perform proportional replenishment several times at the beginning of management, it will be easier to adjust the balance with the load (proportional replenishment). As long as there are no fluctuations, the controlled value can be kept constant just by quantitative replenishment, and it has the effect that there is no problem of time delay until the concentration etc. become uniform.
第1表
この発明の適用範囲、被管理成分
第2表
無電解鋼めつき液の各種成分の濃度変化
めつき条件 、
PH 12.4oめつき裕組成
。Table 1 Scope of application of this invention, controlled components Table 2 Concentration changes of various components of electroless steel plating solution Plating conditions,
PH 12.4o Mitsuki Yutaka composition
.
糟容量 1.000 そ亀法。
2‐7肌そ 。裕負荷 2肌8.20 タ′ど3
5第3表
無電解鋼めつき液の各種成分の補給量(単位面積当り)
1液・・・・・・硫酸鋼+ホルマリン
N液・…・・カセィソーダロ液・・・・・・アル
カリ+ロッシェル塩 めつき条件は2
表に同じm液・・…・ホルマリン第4表
金めつきの各種成分の変化
めつき条件
めつき糟 1300そ
循環流量 5回転/時
温度分布 320±0.チ0
極板比率 5:1
極間距離 5仇Capacity 1.000 Sokame method.
2-7 skin. Yu load 2 skin 8.20 Ta'do 3
5 Table 3 Replenishment amount of various components of electroless steel plating solution (per unit area)
1 liquid... Sulfuric acid steel + formalin
N solution... Caustic soda solution... Alkali + Rochelle salt Plating conditions are 2
Same liquid as shown in the table... Formalin 4th table Changes in various components of gold plating Plating conditions Plating pot 1300 Circulating flow rate 5 revolutions/hour Temperature distribution 320 ± 0. Chi0 Plate ratio 5:1 Distance between poles 5
【図面の簡単な説明】
第1図は従釆の手分析による化学処理液の管理方法の濃
度変化と(同図a)と補給量(同図b)を示し、第2図
は、従来の連続分析によって自動的に補給装置をON/
OFFさせる管理方法の濃度変化(同図a)と補給量(
同図b)を示したものである。
第3図はこの発明の概客をフローチャートで示したもの
であり、第4図はこの発明による被管理値変化(同図a
)と補給量(同図b)を示したものであり、更に第5図
はこの発明を実施する装置を示したものである。第1図
第2図
第4図
第3図
第5図[Brief explanation of the drawings] Fig. 1 shows the concentration changes (a) and the amount of replenishment (b) of the chemical treatment liquid management method by manual analysis of the subordinate, and Fig. 2 shows the conventional method of managing the chemical treatment liquid. Continuous analysis automatically turns on/off the supply device.
Concentration change (a in the same figure) and supply amount (
Figure b) is shown. Figure 3 is a flowchart showing the general customer experience of this invention, and Figure 4 is a flowchart showing the changes in managed values according to this invention (a
) and the replenishment amount (b in the same figure).Furthermore, FIG. 5 shows an apparatus for carrying out the present invention. Figure 1 Figure 2 Figure 4 Figure 3 Figure 5
Claims (1)
及び化成液の管理方法。 (i)一定時間おきに被管理液をサンプリングして、該
被管理液の性質を決定する物理量、又は化学量を測定す
るステツプ(ii)基準設定値と今回測定値との差を基に
して、比例補給量を算出するステツプ(iii)今回測定
値と前回測定値と更に前回の比例補給量から定量補給量
を算出するステツプ(iv)上記(ii)(iii)のステツ
プで算出された比例補給量と定量補給量を被管理液に補
給するステツプ2 理論的に算出することができる減少
量だけ、見込補給されている被管理液を用いたことを特
徴とする特許請求の範囲第1項に記載のめつき液及び化
成液の管理方法。 3 各サンプリング毎に算出された複数の定量補給量の
平均を実際の定量補給量としたことを特徴とする特許請
求の範囲第1項に、記載のめつき液及び化成液の管理方
法。 4 比例補給時間が、サンプリング間隔時間より短いこ
とを特徴とする特許請求の範囲第1項に記載のめつき液
及び化成液の管理方法。[Scope of Claims] 1. A method for managing a plating solution and a chemical solution, characterized by comprising the following steps. (i) Step of sampling the liquid to be controlled at regular intervals and measuring the physical quantity or chemical quantity that determines the properties of the liquid to be controlled. (ii) Based on the difference between the standard setting value and the current measured value. , step of calculating the proportional replenishment amount (iii) step of calculating the fixed replenishment amount from the current measured value, the previous measured value, and the previous proportional replenishment amount (iv) the proportional replenishment amount calculated in steps (ii) and (iii) above. Step 2 of replenishing the replenishment amount and quantitative replenishment amount to the liquid to be managed. Claim 1, characterized in that the liquid to be managed is used that has been replenished as expected by the amount of decrease that can be calculated theoretically. Management method of plating solution and chemical solution described in . 3. The method for managing plating liquids and chemical liquids as set forth in claim 1, wherein the average of a plurality of quantitative replenishment amounts calculated for each sampling is taken as the actual quantitative replenishment amount. 4. The method for managing plating liquids and chemical conversion liquids according to claim 1, wherein the proportional replenishment time is shorter than the sampling interval time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57042468A JPS602386B2 (en) | 1982-03-16 | 1982-03-16 | How to manage plating solution and chemical solution |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57042468A JPS602386B2 (en) | 1982-03-16 | 1982-03-16 | How to manage plating solution and chemical solution |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58161758A JPS58161758A (en) | 1983-09-26 |
| JPS602386B2 true JPS602386B2 (en) | 1985-01-21 |
Family
ID=12636899
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57042468A Expired JPS602386B2 (en) | 1982-03-16 | 1982-03-16 | How to manage plating solution and chemical solution |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS602386B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012176626A1 (en) * | 2011-06-24 | 2012-12-27 | 東京エレクトロン株式会社 | Plating apparatus, plating method, and storage medium |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR940701464A (en) * | 1992-04-17 | 1994-05-28 | 이시마루 쓰네오 | Method for detecting concentration of chemical treatment liquid, apparatus and automatic management device thereof |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5654388A (en) * | 1979-10-11 | 1981-05-14 | Hitachi Ltd | Nuclear reactor container |
-
1982
- 1982-03-16 JP JP57042468A patent/JPS602386B2/en not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012176626A1 (en) * | 2011-06-24 | 2012-12-27 | 東京エレクトロン株式会社 | Plating apparatus, plating method, and storage medium |
| JP2013007099A (en) * | 2011-06-24 | 2013-01-10 | Tokyo Electron Ltd | Plating apparatus, plating method, and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58161758A (en) | 1983-09-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5368715A (en) | Method and system for controlling plating bath parameters | |
| US5352350A (en) | Method for controlling chemical species concentration | |
| JP3177338B2 (en) | Method and apparatus for holding an electroless plating solution | |
| US6471845B1 (en) | Method of controlling chemical bath composition in a manufacturing environment | |
| JP2004534909A (en) | Method and apparatus for controlling the amount of a chemical component in an electrochemical cell | |
| KR20040034464A (en) | Method and apparatus for maintaing an eching solution | |
| US5182131A (en) | Plating solution automatic control | |
| US20030095472A1 (en) | Chemical concentration control device for semiconductor processing apparatus | |
| JP2001264277A (en) | Method and device for detecting concentration and chemical diluting dispensing device | |
| JPS602386B2 (en) | How to manage plating solution and chemical solution | |
| US5450870A (en) | Method and an apparatus for detecting concentration of a chemical treating solution and an automatic control apparatus thereof | |
| JP3821742B2 (en) | Plating apparatus and plating solution management method using the same | |
| Pratt | Automated, high-precision coulometric titrimetry part II. Strong and weak acids and bases | |
| JP3046132B2 (en) | Control method of nitric acid hydrofluoric acid bath for descaling stainless steel strip and its continuous descaling device | |
| JP2001205158A (en) | Substrate immersion processing equipment | |
| JPH06178958A (en) | Automatic measurement for coated amount and device to be used in the method | |
| JPS6024182B2 (en) | Automatic control device for metal surface treatment liquid | |
| JP2002282755A (en) | Substrate processing apparatus | |
| TW200540294A (en) | Single-acid slightly compensating equipment and method | |
| JPS6317906B2 (en) | ||
| JPH08193299A (en) | Method for controlling plating solution concentration and device therefor | |
| JP2004315842A (en) | Method of etching copper-clad circuit board with hydrogen peroxide / sulfuric acid based etchant | |
| JPH02159029A (en) | Chemical treatment and device therefor | |
| JPS583999A (en) | Electric alloy plating method | |
| JPH04168286A (en) | Control method for etching bath |