JPS6026180B2 - Electromagnetic non-destructive testing method and device - Google Patents
Electromagnetic non-destructive testing method and deviceInfo
- Publication number
- JPS6026180B2 JPS6026180B2 JP5014477A JP5014477A JPS6026180B2 JP S6026180 B2 JPS6026180 B2 JP S6026180B2 JP 5014477 A JP5014477 A JP 5014477A JP 5014477 A JP5014477 A JP 5014477A JP S6026180 B2 JPS6026180 B2 JP S6026180B2
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- detection
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Description
【発明の詳細な説明】
この発明は金属材料の傷を電磁気現象を応用して非破壊
的に検出する非破壊深傷装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a nondestructive deep scratch device that nondestructively detects scratches in metal materials by applying electromagnetic phenomena.
一般に金属材料に発生する傷を電磁気現象を応用して深
傷する方法としては、電流を被検査材である金属材料中
に流し傷の存在によって生じる電流の乱れを検出コイル
のインピーダンスの変化として検出する渦流探傷法、ま
たは被検査材である金属材料(ただし磁性体に限られる
)に磁界を印加し、傷の存在によって生じる傷部からの
磁束のろうえし、を検出する磁気的探傷法、とくに自動
的に探傷する方法として、感磁性素子により、傷部から
のろうえし、磁束を直接電気信号に変換する方法等があ
り、それぞれ被検査材の形状や製造工程に相応して応用
され、広く利用されているところである。Generally, a method of applying electromagnetic phenomena to deep scratches that occur in metal materials involves passing a current into the metal material being inspected and detecting the disturbance of the current caused by the presence of scratches as a change in the impedance of the detection coil. eddy current flaw detection, or magnetic flaw detection, which applies a magnetic field to the metal material being inspected (limited to magnetic materials) and detects the flux of magnetic flux from the flaw caused by the presence of flaws; In particular, automatic flaw detection methods include using a magnetically sensitive element to detect wax from the flaw, and directly converting magnetic flux into an electrical signal, each of which is applied depending on the shape of the material being inspected and the manufacturing process. , is widely used.
しかるに最近の傷検出能力ならびに深傷能率(速度)の
向上に対する要望は各種金属材料において、品質ならび
に信頼性向上のため全数精密検査の立場から益々高度な
ものへ移行しつつある。However, recent demands for improvements in flaw detection ability and deep flaw efficiency (speed) are shifting from the standpoint of precision inspection of 100% to more advanced methods in order to improve quality and reliability in various metal materials.
さらに傷の種類によってほとんど問題とならないものも
あれば、重大事故につながる場合もある。すなわち傷の
種類別の欠陥検出を行なうことが重要となる。これらの
諸問題に対処するには、傷検出能力の向上に対しては検
出端の小形化や探傷信号処理回路の高速化や安定化の努
力がそれぞれ目的に応じて個別に成されている。Furthermore, depending on the type of injury, some injuries may be of little concern, while others may lead to serious accidents. That is, it is important to perform defect detection for each type of flaw. To deal with these problems, individual efforts have been made to improve the flaw detection ability by making the detection end smaller and increasing the speed and stabilization of the flaw detection signal processing circuit, depending on the purpose.
しかしながら検出端の小形化と探傷能率とは相反する条
件となり、これを解決するには検出端の被検査材へのよ
り正確でかつ高速の追随走査、および深傷信号処理回路
のより高速化によって対処する以外に方法がなかった。
また傷信号の分類に対しては決定的な良い方法はなく、
複数種類の優に相応して複数種類の検出端で同一の被検
査材を何度も深傷するのが最も信頼性が高いとされてい
る。この場合は深傷能率が悪く、かつコストが高くつく
などデメリットがありこれらの目的に対処する能率的な
方法が強く望まれていた。この発明は以上にかんかみ発
明されたもので、傷検出能力と探傷能率との向上を同時
に解決するとともに、傷の種類を分類して探傷すること
も可能にしたまったく新しい電磁気的深傷方法ならびに
装置を提供しようとするものである。However, the miniaturization of the detection end and flaw detection efficiency are contradictory conditions, and this can be solved by making the detection end follow the inspection target more accurately and at high speed, and by increasing the speed of the deep flaw signal processing circuit. There was no other way but to deal with it.
Furthermore, there is no definitive good method for classifying flaw signals;
It is said that it is most reliable to make deep scratches on the same material to be inspected many times with multiple types of detection ends. In this case, there are disadvantages such as poor efficiency in deep damage and high cost, and there has been a strong desire for an efficient method to meet these objectives. This invention was invented based on the above, and it is a completely new electromagnetic deep flaw method that simultaneously solves the problem of improving flaw detection ability and flaw detection efficiency, and also makes it possible to classify and detect flaw types. The aim is to provide equipment.
すなわち、高周波電流を通じた検出コイルの近傍にて、
そのコイルの作る磁界内の複数点またはそれらの各点を
含む複数の等磁位線上に多重に磁芯を配備するとともに
、それらの各磁芯を固定または等磁位線上において運動
させつつ被検査材に近接走査させるようにしておき、そ
れぞれの磁芯の直下における被検査材中に生じる渦電流
の状態および被検査材の傷部からの磁束のろうえい状態
をそれぞれの磁芯によって検出コイルのインピーダンス
の変化として効率的に変換させるとともにこの検出コイ
ルのインピーダンス変化を検知することにより深傷動作
を行なわせるようにしたものである。In other words, near the detection coil through high-frequency current,
Multiple magnetic cores are arranged at multiple points within the magnetic field created by the coil or on multiple equipotential lines including each of those points, and each magnetic core is fixed or moved on the equipotential lines while being inspected. The impedance of the coil is detected by each magnetic core, and the state of eddy current generated in the material to be inspected directly under each magnetic core and the state of the flux flowing from the flawed part of the material to be inspected are detected by scanning in close proximity to the material. By efficiently converting the impedance as a change in the impedance and detecting the change in the impedance of the detection coil, a deep wound operation can be performed.
つぎに、この発明の深傷方法ならびに装置を図に示す実
施例によって説明する。Next, the deep wound method and device of the present invention will be explained with reference to embodiments shown in the drawings.
第1図はこの発明の要部である磁芯を多重に有する検出
コイルの中、円形状検出コイルの内部に2重に磁芯が配
置された検出コイルの平面図、第2図は同じく円形状コ
イルの内部と外部に2重に磁芯が配置された検出コイル
の実施例を示す。第1図および第2図において1は円形
状検出コイル,2,2′,2″・・・・・・,3,3′
,3″・・・・・・4,4′,4″……,および5,5
′,5″……は検出コイル1と同心円上の等磁位線C2
,C3,C4およびC5に配置された磁芯をそれぞれ表
わし、第1図および第2図はそれぞれ磁芯を多重に有す
る検出機構を構成している。Figure 1 is a plan view of a detection coil in which two magnetic cores are arranged inside a circular detection coil among the detection coils that have multiple magnetic cores, which is the essential part of this invention, and Figure 2 is a similar circular detection coil. An embodiment of a detection coil in which magnetic cores are arranged twice inside and outside the shape coil is shown. In Figures 1 and 2, 1 is a circular detection coil, 2, 2', 2''..., 3, 3'
, 3″...4, 4', 4″..., and 5, 5
', 5''... are equipotential lines C2 on the concentric circle with the detection coil 1
, C3, C4, and C5, and FIGS. 1 and 2 each constitute a detection mechanism having multiple magnetic cores.
第1図の検出コイルをさらに詳しく説明すると等磁位線
C2上とC3上に配置した磁芯はその形状を異にしてお
り後述するキズの種類に相応するよう工夫されている。
(もちろん同一形状のものでもよい。)第2図は検出コ
イル1の外部と内部、すなわち等磁位線C4上とC5上
とで磁芯の形状は同一の場合を示しているが、第1図と
同様その形状を異にしても一向に差支えない。第2図の
最も特徴とするところは、1つの等磁位線上、例えばC
4上の磁芯4,4′,4″……は検出コィルーに対して
固定されており、もう1つの等磁位線C5上の磁芯5,
5′,5″・・・・・・はその円軌道C5上を回転運動
させることにある。さて、前述のような検出コイル1に
高周波電流を流すとき、検出コィルーの作る磁界によっ
てC2,C3,C4およびC5上の磁芯は強化され、磁
芯2,2′,2″・・・・・・,3,3′,3″・・・
・・・,4,4′,4″・・・・・・,および5,5′
,5″内の磁束密度はその透磁率に相応して増加すると
ともにそれらの滋芯に近接している被検査材(図示せず
)の表面においてそれぞれの磁芯の直下だけ局部的に磁
束密度が高い状態となる。To explain the detection coil shown in FIG. 1 in more detail, the magnetic cores arranged on equipotential lines C2 and C3 have different shapes, and are designed to correspond to the types of scratches described later.
(Of course, they may have the same shape.) Figure 2 shows a case where the shape of the magnetic core is the same on the outside and inside of the detection coil 1, that is, on the equipotential lines C4 and C5. As in the figure, there is no problem even if the shape is different. The most characteristic feature of Fig. 2 is that on one equipotential line, for example, C
The magnetic cores 4, 4', 4''... on the magnetic field line C5 are fixed to the detection coil, and the magnetic cores 5, 4', 4'' on the other equipotential line C5 are fixed to the detection coil.
5', 5''... is to rotate on the circular orbit C5. Now, when a high frequency current is passed through the detection coil 1 as described above, C2, C3 are caused by the magnetic field created by the detection coil. , C4 and C5 are strengthened and magnetic cores 2, 2', 2''..., 3, 3', 3''...
..., 4, 4', 4''..., and 5, 5'
, 5" increases in proportion to its magnetic permeability, and the magnetic flux density locally increases just below each magnetic core on the surface of the material to be inspected (not shown) that is close to those cores. becomes high.
この被検査材表面における局部的な磁束の方向は、被検
査材表面(図面と平行な面)に垂直な成分と水平な成分
を合わせ有している。これはどの磁芯2,3,4,5も
検出コイル1の中心に配置されていないためである。(
磁芯が検出コイル1の中心に配置された場合は垂直成分
だけとなる。)これらの磁束の中、垂直成分の磁束は被
検査材の磁心直下の部分に局部的な渦電流を議発し、キ
ズの到来によって渦電流の分布が乱される。一方水平成
分の磁束は被検査材の表面または表面下に存在するキズ
によってろうえい磁束を生じる結果となる。これらのキ
ズによる磁束の変化は、各磁心内部の磁束密度を変化さ
せる。The direction of the local magnetic flux on the surface of the material to be inspected has both a component perpendicular to the surface of the material to be inspected (a plane parallel to the drawing) and a horizontal component. This is because none of the magnetic cores 2, 3, 4, and 5 are arranged at the center of the detection coil 1. (
If the magnetic core is placed at the center of the detection coil 1, there will be only a vertical component. ) Among these magnetic fluxes, the perpendicular component of the magnetic flux generates local eddy currents in the part directly below the magnetic core of the material to be inspected, and the arrival of flaws disturbs the distribution of eddy currents. On the other hand, the magnetic flux of the horizontal component results in the generation of magnetic flux due to flaws existing on the surface or under the surface of the material to be inspected. Changes in magnetic flux due to these scratches change the magnetic flux density inside each magnetic core.
検出コイル1はこれらすべての磁芯をその磁界内に包含
しているから検出コィルーのインピーダンスの変化とな
って現れ、このインピーダンスの変化を検知すればキズ
の検出ができるようになる。この発明による探傷方法で
は複数の等磁位線上に磁芯を配置するので、各等磁位線
上毎に深傷感度が異ることになるが、多重に磁芯を配置
する最大の目的は多種類のキズを同時的にそれぞれ感度
よく検出することにある。Since the detection coil 1 includes all of these magnetic cores within its magnetic field, this appears as a change in the impedance of the detection coil, and by detecting this change in impedance, it is possible to detect flaws. In the flaw detection method according to the present invention, the magnetic cores are arranged on multiple equipotential lines, so the depth flaw sensitivity differs for each equipotential line, but the main purpose of arranging the magnetic cores in multiple places is to The purpose is to simultaneously detect different types of scratches with high sensitivity.
すなわち第1図の検出コイルではC2上に配置した小さ
な磁芯は面積の小さな点状、または線状のキズを感度よ
く検出し、一方C3上の大きな磁芯はへゲキズや凹み等
面積の大きなキズの検出に有利であり、それらを同時的
に検出するのに最適である。すなわち磁芯の先端の形、
大きさ(すなわち形状)が複数種類で構成されているか
らである。1つの等磁位線におけるそれぞれの磁芯の先
端形状を異ならせることもできる。In other words, in the detection coil shown in Figure 1, the small magnetic core placed on C2 detects small point or linear scratches with high sensitivity, while the large magnetic core placed on C3 detects large area scratches, dents, etc. It is advantageous for detecting scratches and is ideal for detecting them simultaneously. In other words, the shape of the tip of the magnetic core,
This is because the size (that is, shape) is comprised of multiple types. The tip shapes of the respective magnetic cores in one equipotential line can also be made different.
また、第2図の検出コイルではC4およびC5を等磁位
線に選びC4上の磁芯を固定しC5上の磁芯をそのまわ
りに回転するようにすればC4上の磁芯は被検査材との
走査方向に対して直角すなわち横キズの検出に有利であ
るし、一方C5上の回転磁芯は主にたてキズの検出に有
効となり、この場合は多方向キズを同時的に検出するの
に最適となる。第2図に示す実施例のように各等磁位線
上の滋芯が固定または運動状態を共存する場合はそれら
が相互干渉しないように注意を要する。つぎにこの発明
の実施例装置を第3図によって説明する。In addition, in the detection coil shown in Figure 2, by selecting C4 and C5 as equimagnetic potential lines and fixing the magnetic core on C4 and rotating the magnetic core on C5 around it, the magnetic core on C4 will be the one to be inspected. It is advantageous for detecting horizontal scratches that are perpendicular to the scanning direction of the material, while the rotating magnetic core on C5 is mainly effective for detecting vertical scratches, and in this case, multidirectional scratches can be detected simultaneously. perfect for doing so. When the cores on each equipotential line coexist in a fixed or moving state as in the embodiment shown in FIG. 2, care must be taken to prevent them from interfering with each other. Next, an embodiment of the present invention will be explained with reference to FIG.
第3図はこの発明の実施例装置のブロック図でIAおよ
びIBは前記深傷法に係る同一の2個の多重に磁芯を有
する検出コイル、6は被検査材である平面状金属体、7
は差敷検出回路、8は増幅器、9および9′は位相弁別
または周波数弁別等の行なえる2系列の信号解析器をそ
れぞれ表わす。検出コイルIAおよびIBは前記深傷方
法において詳述したようにそれぞれ多種類のキズ信号を
含んだ深傷信号を刻々発しつつ、被検査材6を走査深傷
する。FIG. 3 is a block diagram of an apparatus according to an embodiment of the present invention, in which IA and IB are the same two detection coils having multiple magnetic cores according to the deep scratch method, 6 is a planar metal body which is a material to be inspected; 7
Reference numeral 8 indicates an offset detection circuit, 8 an amplifier, and 9 and 9' two signal analyzers capable of performing phase discrimination, frequency discrimination, etc., respectively. The detection coils IA and IB scan and cause deep scratches on the inspected material 6 while emitting deep scratch signals containing various types of scratch signals every moment, as described in detail in the deep scratch method.
この2つの検出コイルIAおよびIBは交流ブリッジ等
差動的に検出する差動検出回路7により被検査材6にキ
ズが存在しないとき、その深傷出力信号が零になるよう
にしておく。さて、このような被検査材6と検出コイル
IAおよびIBとの走査探傷糊態において、検出コイル
の磁芯の直下にキズが到釆すると前述の探傷〆カニズム
によって差勤倹出回路7に出力すなわちキズ信号が現わ
れる。この深傷信号は前述のように検出コイルに流す高
周波電流に呼応して高周波電圧として検出することがで
き、この深傷信号は増幅器8で増幅した後、位相弁別に
よる信号解析を行なうことが可能となり、さらに深傷信
号の周波数成分を弁別してS/N良好なキズ検出を行な
わせることができる。9および9′は、上記信号解析を
行なわせる信号解析器を示しこれを2系列備えているの
は検出コイルIAまたはIBが2重(多重)の磁芯を有
し2種(多種)類のキズ信号を含んでいることに相応し
てそれぞれ最適な信号解析を行なわせるようにするため
である。These two detection coils IA and IB are set so that the deep flaw output signal thereof becomes zero when there is no flaw in the inspected material 6 by a differential detection circuit 7 such as an AC bridge that differentially detects the flaw. Now, in such a scanning flaw detection state between the inspected material 6 and the detection coils IA and IB, when a flaw arrives directly under the magnetic core of the detection coil, an output is output to the differential detection circuit 7 by the above-mentioned flaw detection mechanism. A scratch signal appears. As mentioned above, this deep damage signal can be detected as a high frequency voltage in response to the high frequency current flowing through the detection coil, and after this deep damage signal is amplified by the amplifier 8, it is possible to perform signal analysis using phase discrimination. Therefore, it is possible to further discriminate the frequency components of the deep flaw signal and perform flaw detection with a good S/N ratio. Reference numerals 9 and 9' denote signal analyzers for performing the above-mentioned signal analysis, and the reason why two series of these are provided is that the detection coil IA or IB has double (multiple) magnetic cores and two types (many types) of them. This is to allow each signal to be analyzed optimally depending on the fact that it includes a flaw signal.
以上の実施例では検出コイルの形状として円形状の例を
示したが円形に限定されるものではなく、被検査材の形
状や深傷の目的に応じて自由に設計すればよい。In the above embodiments, the shape of the detection coil is circular, but it is not limited to a circle, and may be freely designed depending on the shape of the material to be inspected and the purpose of deep scratches.
また、磁芯の先端形状はすべて円形の例を示したが、キ
ズの形状たとえば線状の横方向キズの場合は横長の長方
形にするなど探傷目的に応じて最適の設計をすることが
できる。In addition, although the shape of the tip of the magnetic core is circular in all examples, the shape of the flaw can be optimally designed depending on the purpose of flaw detection, such as a horizontally long rectangle in the case of a linear horizontal flaw.
また第1図の磁芯配置の検出コイルにおいて磁芯全体を
検出コイル1に対して、等磁粒線C2およびC3上にお
いて等速回転運動させる実施例が考えられる。Further, in the detection coil having the magnetic core arrangement shown in FIG. 1, an embodiment may be considered in which the entire magnetic core is rotated at a constant speed on the isomagnetic grain lines C2 and C3 with respect to the detection coil 1.
この場合は、この検出コイルと被検査材との相対的走査
探傷速度に影響されずに探傷信号の周波数弁別を容易に
する効果が生じる。以上詳述したように、この発明は検
出コイル近傍の複数の等磁位線上に多重に磁芯を配置す
るようにしたので、前記のように渦流探傷と磁気的探傷
の2つの探傷方法を具備するとともに、1つの検出コイ
ルだけで、従来的この種電磁気的深傷方法に較べて検出
感度をまったく低下させず、かつ同時的に広範囲の深傷
が可能となった。さらに磁芯の多重配置の最大の効果と
してキズの種類別に探傷および信号解析が可能となり、
多目的のキズ検出が同時的に行なえ探傷技術を画期的に
向上させることを保障する。In this case, the effect of facilitating frequency discrimination of the flaw detection signal is produced without being affected by the relative scanning flaw detection speed between the detection coil and the material to be inspected. As detailed above, this invention has multiple magnetic cores arranged on a plurality of equipotential lines near the detection coil, so it is equipped with two flaw detection methods: eddy current flaw detection and magnetic flaw detection. At the same time, with only one detection coil, the detection sensitivity is not lowered at all compared to the conventional electromagnetic deep wound method of this kind, and deep wounds can be detected over a wide range at the same time. Furthermore, the biggest effect of the multiplexed magnetic core arrangement is that it enables flaw detection and signal analysis for each type of flaw.
Multi-purpose flaw detection can be performed simultaneously, ensuring a revolutionary improvement in flaw detection technology.
第1図はこの発明の要部である検出コイルの実施例を示
す図で、円形状検出コイルとその内部に多重に配置した
磁芯の形状と位置関係を示す平面図、第2図は検出コイ
ルの他の実施例を示す図で、円形検出コイルの内外に配
置した磁芯とその位置関係を示す平面図、さらに第3図
はこの発明による実施例装置のブロック図である。
1,IA,IB…検出コイル、2,2′,2″,3,3
′,3″,4,4′,4″,5,5′,5″・・・・・
・磁芯、6・・・・・・被検査材、7・・・・・・差動
検出回路、8・・・・・・増幅器、9・・・・・・位相
弁別回路(周波数弁別回路)。
髪’四
多2図
窮3函Fig. 1 is a diagram showing an embodiment of the detection coil which is the main part of this invention, and Fig. 2 is a plan view showing the shape and positional relationship of the circular detection coil and the magnetic cores arranged in multiple layers therein. FIG. 3 is a diagram showing another embodiment of the coil, and is a plan view showing the magnetic cores arranged inside and outside the circular detection coil and their positional relationship, and FIG. 3 is a block diagram of the embodiment device according to the present invention. 1, IA, IB...detection coil, 2, 2', 2'', 3, 3
', 3'', 4, 4', 4'', 5, 5', 5''...
・Magnetic core, 6... material to be inspected, 7... differential detection circuit, 8... amplifier, 9... phase discrimination circuit (frequency discrimination circuit) ). Hair' Shida 2 drawings 3 boxes
Claims (1)
、その幾可学的中心を除く任意の複数点、またはそれら
の各点を含む複数の等磁位線上の多点に磁芯を配備し、
この磁芯および検出コイルと被検査材とを相対的に移動
走査させるようにして、この検出コイルのインピーダン
スの変化を検知することにより被検査材の欠陥を検出す
るようにしたことを特徴とする電磁気的非破壊探傷方法
。 2 検出コイルの近傍でかつその幾可学的中心を除く任
意の複数点のいくつかの点を含む等磁位線上における磁
芯はこれを検出コイルに対して相対的に変位すべく運動
させるとともに、他の複数点の各点を含む等磁位線上に
おける磁芯は固定させるようにしたことを特徴とする特
許請求の範囲第1項記載の電磁気的非破壊探傷方法。 3 複数等磁位線の任意の1つに複数個配置した磁芯の
先端形状が複数種類で構成されているか、または1つの
等磁位線上には同一種類の先端形状の磁芯が配置され他
の等磁位線上には別の同一種類の先端形状の磁芯が配置
されるようにして複数種類の先端形状の磁芯で構成され
複数種類の欠陥を探傷するようにしたことを特徴とする
特許請求の範囲第1項または第2項記載の電磁気的非破
壊探傷方法。 4 被検査材に近接して設置した検出コイルの近傍にて
その幾可学的中心を除く任意の複数点またはそれらの各
点を含む複数の等磁位線上の多点に磁芯を配備するとと
もに前記磁芯をそれぞれの等磁位線上にて検出コイルに
対し相対的に変位すべく運動させるようにしこの運動す
る磁芯を有する検出コイルのインピーダンスの変化を検
知することにより被検査材の欠陥を検出するようにした
ことを特徴とする電磁気的非破壊探傷方法。 5 複数等磁位線の任意のつに複数個配置した磁芯の先
端形状が複数種類で構成されているか、または1つの等
磁位線上には同一種類の先端形状の磁芯が配置され他の
等磁位線上には別の同一種類の先端形状の磁芯が配置さ
れるようにして複数種類の先端形状の磁芯で構成され複
数種類の欠陥を探傷するようにしたことを特徴とする特
許請求の範囲第4項記載の電磁気的非破壊探傷方法。 6 被検査材に近接して設置された検出コイルと、この
検出コイルの近傍にてその幾可学的中心を除く任意の複
数点またはそれらの各点を含む複数の等磁位線上の多点
に多重に配備された磁芯とからなる検出機構を2個設け
るとともにそれらを差動的に検出する差動検出回路と、
この差動検出回路からの探傷信号をそれぞれ個別に解析
する複数個の信号解析回路とを備え有し、複数種類の傷
を前記検出コイルからの探傷信号で個別にかつ同時に検
出し探傷するようにしたことを特徴とする電磁気的非破
壊探傷装置。[Claims] 1. In the vicinity of the detection coil installed close to the material to be inspected, any plurality of points other than its geometric center, or on a plurality of equimagnetic potential lines including each of those points. Deploying magnetic cores at multiple points,
The magnetic core, the detection coil, and the material to be inspected are moved and scanned relative to each other, and defects in the material to be inspected are detected by detecting changes in impedance of the detection coil. Electromagnetic non-destructive testing method. 2. A magnetic core on an isomagnetic potential line that includes any number of points in the vicinity of the detection coil and excluding its geometric center is moved so as to be displaced relative to the detection coil, and 2. The electromagnetic non-destructive flaw detection method according to claim 1, wherein the magnetic core on the equimagnetic potential line including each of the other plurality of points is fixed. 3. A plurality of magnetic cores arranged on any one of the plurality of isomagnetic potential lines have multiple types of tip shapes, or magnetic cores with the same type of tip shape are arranged on one equipotential line. The magnetic core is configured with a plurality of types of tip shapes such that other magnetic cores with the same type of tip shape are arranged on other equipotential lines, so that a plurality of types of defects can be detected. An electromagnetic nondestructive flaw detection method according to claim 1 or 2. 4. Arrange magnetic cores at any number of points other than the geometric center of the detection coil installed close to the material to be inspected, or at multiple points on multiple equipotential lines including each of those points. At the same time, the magnetic cores are moved to be displaced relative to the detection coil on their respective equipotential lines, and the change in impedance of the detection coil having the moving magnetic core is detected to detect defects in the material to be inspected. An electromagnetic non-destructive flaw detection method characterized by detecting. 5. Are multiple magnetic cores arranged on any one of multiple equipotential lines composed of multiple types of tip shapes, or are magnetic cores with the same type of tip shapes arranged on one equipotential line? Another magnetic core with the same type of tip shape is arranged on the equimagnetic potential line of the magnetic core, so that the magnetic core is configured with a plurality of types of tip shapes, and a plurality of types of defects can be detected. An electromagnetic nondestructive flaw detection method according to claim 4. 6 A detection coil installed close to the material to be inspected, and any plurality of points in the vicinity of this detection coil other than its geometric center, or multiple points on a plurality of equipotential lines including each of those points. a differential detection circuit that is provided with two detection mechanisms consisting of magnetic cores arranged in multiple directions and differentially detects them;
It is equipped with a plurality of signal analysis circuits that individually analyze the flaw detection signals from the differential detection circuit, so that multiple types of flaws can be individually and simultaneously detected using the flaw detection signals from the detection coil. An electromagnetic non-destructive flaw detection device characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5014477A JPS6026180B2 (en) | 1977-04-30 | 1977-04-30 | Electromagnetic non-destructive testing method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5014477A JPS6026180B2 (en) | 1977-04-30 | 1977-04-30 | Electromagnetic non-destructive testing method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS53135376A JPS53135376A (en) | 1978-11-25 |
| JPS6026180B2 true JPS6026180B2 (en) | 1985-06-22 |
Family
ID=12850963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5014477A Expired JPS6026180B2 (en) | 1977-04-30 | 1977-04-30 | Electromagnetic non-destructive testing method and device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6026180B2 (en) |
-
1977
- 1977-04-30 JP JP5014477A patent/JPS6026180B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS53135376A (en) | 1978-11-25 |
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