JPS6030759B2 - Method for controlling metal ion concentration in electrolytic bath - Google Patents
Method for controlling metal ion concentration in electrolytic bathInfo
- Publication number
- JPS6030759B2 JPS6030759B2 JP14609881A JP14609881A JPS6030759B2 JP S6030759 B2 JPS6030759 B2 JP S6030759B2 JP 14609881 A JP14609881 A JP 14609881A JP 14609881 A JP14609881 A JP 14609881A JP S6030759 B2 JPS6030759 B2 JP S6030759B2
- Authority
- JP
- Japan
- Prior art keywords
- metal
- concentration
- amount
- wavelength
- ions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- Spectrometry And Color Measurement (AREA)
Description
【発明の詳細な説明】
本発明は、金属の連続電解析出をほどこす装置の電解液
の濃度をあらかじめ定められた値に自動的に制御する浴
濃度制御方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a bath concentration control method for automatically controlling the concentration of an electrolyte in an apparatus for continuous electrolytic deposition of metals to a predetermined value.
電解析出とは電気エネルギーを用いて金属塩水溶液中の
金属イオンを、他の素地表面に析出させる方法をいい、
電解液とは該電解析出反応を行なわしめる液をいう。Electrolytic deposition is a method that uses electrical energy to deposit metal ions in an aqueous metal salt solution onto the surface of another substrate.
The electrolytic solution refers to a solution that carries out the electrolytic deposition reaction.
かかる電解液において、電解析出金属組成、析出効率等
の電解性能は電解液の組成に依存するもので、適正なる
電解液組成管理から必要となる。In such an electrolytic solution, electrolytic performance such as electrolytic deposit metal composition and deposition efficiency depends on the composition of the electrolytic solution, and is required from proper electrolytic solution composition management.
電解液組成は該露析量と電解液が露折物表面に付着して
次工程へ持ち出される量(以下ドラッグアウト量と託す
)と、さらには被電析表面に付着して前工程より持ちこ
まれる爽雑イオン量および被露析金属体から電解液中に
溶出する量(以下溶出量と記す)等によって変動する。
しかるに不溶出陽極を用いて電解析出も行なう場合は、
軍析によって消費される金属量の補給は該金属を別の方
法で該電解液に溶解するか、炭酸塩等金属と結合してい
る化学種が容易に系外に出ていく物質によって補給しな
ければならない。The electrolyte composition is determined by the amount of electrolyte deposited, the amount of electrolyte that adheres to the surface of the exposed object and is carried out to the next process (hereinafter referred to as drag-out amount), and the amount of electrolyte that adheres to the surface of the electrodeposited material and is carried over from the previous process. It varies depending on the amount of extraneous ions contained in the electrolyte, the amount eluted from the metal body to be deposited into the electrolytic solution (hereinafter referred to as eluted amount), etc.
However, if electrolytic deposition is also performed using an insoluble anode,
The amount of metal consumed by military analysis can be replenished by dissolving the metal in the electrolyte by another method, or by using a substance such as carbonate that allows the chemical species bound to the metal to easily leave the system. There must be.
一方ドラッグアウトによって消費される金属については
、硫酸塩等電解液を構成する物質で補給する必要がある
。さらに、一般に金属を電解析出させる場合に、爽雑イ
オン(例えば被電析体として一般的なFe)の影響を受
け、目標金属を高い電流効率でもつて電解させる場合は
、爽雑イオンを何らかの方法で低下させるか、目標電折
金属イオン濃度を増大させて目標金属イオン濃度と交雑
イオン濃度の比をある一定の値以上に保つ必要がある。On the other hand, metals consumed by drag-out need to be replenished with substances that make up the electrolyte, such as sulfate. Furthermore, when metals are generally electrolytically deposited, they are affected by extraneous ions (for example, Fe, which is commonly used as an electrodeposited object), and when electrolyzing the target metal with high current efficiency, it is necessary to It is necessary to maintain the ratio between the target metal ion concentration and the hybrid ion concentration above a certain value by decreasing the concentration by a method or by increasing the target electrolyzed metal ion concentration.
本発明者らは3波長比色計によって、目標金属イオン濃
度と爽雑イオン濃度が目的元素による着色を直接測定し
うろことに着目し、更にはpH測定値と併せて演算回路
により計算し、目標金属イオン濃度を求め、霧祈金属消
費量とドラッグアウト消費量を求めて夫々に該当する該
金属化合物を電解裕中に補給するシステムを開発した。
さらに3波長比色計による目的金属イオン濃度と爽雑イ
オン濃度の求め方を説明する。吸光々度法にて補数の金
属イオンの測定を行う場合、それぞれの金属イオンの波
長が重なり合って相互に干渉し合い適切な吸光度が得ら
れない。The present inventors focused on the fact that the target metal ion concentration and the detrital ion concentration could be used to directly measure the coloring caused by the target element using a three-wavelength colorimeter, and further calculated them using an arithmetic circuit in conjunction with the pH measurement value. We have developed a system that calculates the target metal ion concentration, determines the amount of mist prayer metal consumed and the amount consumed by drag-out, and replenishes the corresponding metal compound into the electrolytic bath.
Furthermore, how to determine the target metal ion concentration and the impurity ion concentration using a three-wavelength colorimeter will be explained. When measuring complementary metal ions using the absorbance method, the wavelengths of the respective metal ions overlap and interfere with each other, making it impossible to obtain appropriate absorbance.
たとえば第2図に示す様に、目的金属イオンの最適波長
がloで妨害金属イオンの吸収波長が1,,12にそれ
ぞれあったときlo値は1,,12の影響を受けて真の
吸光度を示さない。1,,12がloに対してどの様に
影響するかはその測定物質の組合せによってその都度異
なり、また、それぞれの測定物質の濃度によっても影響
の度合は異なる。For example, as shown in Figure 2, when the optimal wavelength of the target metal ion is lo and the absorption wavelength of the interfering metal ion is 1, 12, the lo value will be influenced by 1, 12 and will not reflect the true absorbance. Not shown. The influence of 1, 12 on lo differs depending on the combination of substances to be measured, and the degree of influence also differs depending on the concentration of each substance to be measured.
それ、測定元素とその濃度の組合せに応じて実験的に影
響の度合を考慮して測定方法を決める必要がある。そこ
で本測定においては目的金属イオンが1元素と妨害金属
イオンが2元素であり、それぞれの金属イオンに通した
フィルターを設置した3波長比色計を用いた。その測定
方式は目的波長loと妨害波長1,と12の関係より、
真の吸光度=〔L±(1,十12)〕±(1,十Z)の
式で真の吸光度を求め、あらかじめ濃度既知の金属イオ
ン量との吸光度の関係式から目的金属イオン量を求める
ことができる。この様に電解析出液の組成の自動制御を
行うことによって、通電量さえ調節すれば、容易に亀析
金属量を制御することができ、亀析表面品質を極めて高
く維持することができるものである。以下本発明を図面
に従いNiを爽雑イオンFe2十,Fe3十の存在下で
雷析する一実施例について説明する。However, it is necessary to determine the measurement method by experimentally considering the degree of influence depending on the combination of the element to be measured and its concentration. Therefore, in this measurement, the target metal ion was one element and the interfering metal ions were two elements, and a three-wavelength colorimeter was used, which was equipped with a filter that passed each metal ion. The measurement method is based on the relationship between the target wavelength lo and the interference wavelengths 1 and 12.
Determine the true absorbance using the formula: true absorbance = [L±(1,112)]±(1,10Z), and determine the target metal ion amount from the relational expression of the absorbance with the amount of metal ions whose concentration is known in advance. be able to. By automatically controlling the composition of the electrolytic deposit in this way, it is possible to easily control the amount of metal metallization by adjusting the amount of current applied, and the quality of the surface metallization can be maintained at an extremely high level. It is. Hereinafter, an embodiment of the present invention will be described in accordance with the drawings, in which Ni is subjected to lightning deposition in the presence of dusty ions Fe20 and Fe30.
第1図において、電解液1は電解槽2と循環タンク3の
間をポンプ4と4′を介して循環しており、温度コント
ローラー5により一定温度に制御されている。該循環タ
ンク3よりサンプリング用ポンプ6を介して電解液1を
サンプリングしてサンプル中に含まれるゴミ、懸濁物等
の妨害物を前処理装置7にて処理して清浄なサンプルと
する。該前処理済電解液を連続式3波長比色計8に供給
する。該連続式3波長色計8とは目的金属イオンである
ニッケル濃度と、ニッケル濃度を測定する上で妨害とな
るFe2十イオン濃度とFe3十イオン濃度の3金属イ
オンを測定する分析計である。ニッケルイオンを吸光々
度法で測定する場合、最も感度の良い最大吸収波長を選
定すると、必然的にFe2十イオン波長とFe3十イオ
ン波長がニッケルイオンの波長と重なり、ニッケルイオ
ン測定上の妨害元素となる。また、実験の結果第3図に
示すごとく、該Fe2十イオンはNi2十イオンに対し
ては正誤差となり、Fe3十イオンはNi2十イオンに
対して負誤差となって妨害する。In FIG. 1, an electrolytic solution 1 is circulated between an electrolytic cell 2 and a circulation tank 3 via pumps 4 and 4', and is controlled at a constant temperature by a temperature controller 5. The electrolytic solution 1 is sampled from the circulation tank 3 via the sampling pump 6, and the pretreatment device 7 processes the impediments such as dust and suspended matter contained in the sample to obtain a clean sample. The pretreated electrolyte is supplied to a continuous three-wavelength colorimeter 8. The continuous three-wavelength color meter 8 is an analyzer that measures the concentration of nickel, which is the target metal ion, and three metal ions, Fe20 ion concentration and Fe30 ion concentration, which interfere with the measurement of the nickel concentration. When measuring nickel ions using the spectrophotometric method, if the most sensitive maximum absorption wavelength is selected, the Fe20 ion wavelength and the Fe30 ion wavelength inevitably overlap with the nickel ion wavelength, resulting in interfering elements in the measurement of nickel ions. becomes. Moreover, as shown in FIG. 3 as a result of the experiment, the Fe20 ions have a positive error with respect to the Ni20 ions, and the Fe30 ions have a negative error and interfere with the Ni20 ions.
故にこの妨害を除き正確なニッケルイオン量を分析する
ためには、第4図に示すような光源21からの光をスリ
ット22にて方向性を与え回転式フィルター23に設置
した第5図に示すようなNi2十用フィルター(A)と
Fe2十用フィルター(B)とFe3十用フィルター(
C)により各イオンに適した波長に分離できるようにし
て、該回転式フィルター23を通過した波長の光を連続
フローセル24に導き、ここで吸光された光を検出器2
5に供給し、それぞれの金属イオン量濃度信号として第
1図の演算部9に送る。該演算部9にて計算して、表示
部1川こ表示して、目的金属イオン濃度が設定値より低
い場合は、制御部11からポンプ12を介してNi2十
イオン補給タンクBからNi2十イオンをNiS04・
母LOとして補給する。該前処理装置7で処理された電
解液1は連続pH計14に供給し、pH値を測定し、p
H濃度信号を演算部9にて計算し、表示部1川こ表示し
て所定pH値より低い場合は、制御部11からの信号に
よりポンプ12′を介してpH補給タンク13′からN
iC03を補給する。第1図中1 5は鋼板、16は電
極、17は通電ロールである。また爽雑イオンとして電
解液1中に蓄積する全Feイオンは、ニッケル電解析時
に同時にFeイオンも電解析出して、ニッケル電解析出
効率を低下させる。この関係を第6図に示す。それ故ニ
ッケルイオン濃度と全鉄イオン濃度比を一定範囲内(N
i/Feとして2以上)に制御することが必要である。Therefore, in order to remove this interference and accurately analyze the amount of nickel ions, the light from the light source 21 as shown in FIG. Ni20 filter (A), Fe20 filter (B), and Fe30 filter (
C) allows separation into wavelengths suitable for each ion, and guides the light having the wavelength that has passed through the rotary filter 23 to the continuous flow cell 24, where the absorbed light is sent to the detector 2.
5 and sent to the calculation unit 9 in FIG. 1 as respective metal ion amount concentration signals. If the target metal ion concentration is lower than the set value, the controller 11 sends Ni20 ions from the Ni20 ion replenishment tank B via the pump 12. NiS04・
Supply as mother LO. The electrolytic solution 1 treated with the pretreatment device 7 is supplied to a continuous pH meter 14, the pH value is measured, and the p
The H concentration signal is calculated by the calculation section 9 and displayed on the display section 1. If the pH value is lower than the predetermined pH value, the H concentration signal is calculated by the calculation section 9, and if the pH value is lower than the predetermined value, the H concentration signal is sent from the pH supply tank 13' via the pump 12' according to the signal from the control section 11.
Replenish iC03. In FIG. 1, 15 is a steel plate, 16 is an electrode, and 17 is an energizing roll. In addition, all the Fe ions accumulated in the electrolytic solution 1 as foreign ions also electrolytically deposit Fe ions at the same time during nickel electrolytic analysis, reducing the nickel electrolytic deposition efficiency. This relationship is shown in FIG. Therefore, the ratio of nickel ion concentration to total iron ion concentration must be kept within a certain range (N
It is necessary to control the ratio of i/Fe to 2 or more.
以上詳述した如く本発明によれば電解液の液濃度の変動
要因としての霞析量、ドラッグアウト量、爽雑イオン量
を迅速に測定し自動的に制御でき電解液の濃度管理がよ
り一層安定的に可能となる。As detailed above, according to the present invention, the amount of haze deposited, the amount of drag-out, and the amount of contaminant ions, which are factors that cause fluctuations in the concentration of the electrolyte, can be quickly measured and automatically controlled, thereby further improving the concentration management of the electrolyte. This is possible in a stable manner.
第1図は本発明のブロック図であり、第2図は吸光々度
法で測定する際の目的波長と妨害波長の関係を示す。
第3図は妨害イオンの種類により妨害の影響の仕方が異
なることを示すことを示すもので、第4図は連続式3波
長比色計ブロック図であり、第5図は第4図の回転式フ
ィルター23の詳細図である。第6図はNiの電流効率
とNi/Feの関係を示したものである。1・・・電解
液、2・・・電解槽、3・・・循環ンク、4,4′,6
,12,12′・・・ポンプ、5・・・温度コントロー
フー、7・・・前処理装置、8・・・3波長比色計、9
…演算部、10‐表示部、11‐制御部、12・・・N
i補給タンク、13・・・pH補給タンク、14・・・
pH計、15・・・鋼板、16・・・電極、17・・・
通電ロール、21・・・光源、22ースリット、23・
・・回転式フィルター、24…フローセル、25…検出
器。
多/図
努2図
多3図
第4図
第5轡
葬る図FIG. 1 is a block diagram of the present invention, and FIG. 2 shows the relationship between the target wavelength and interference wavelength when measured by the absorbance method. Figure 3 shows that the interference effect differs depending on the type of interfering ion, Figure 4 is a block diagram of a continuous three-wavelength colorimeter, and Figure 5 shows the rotation of Figure 4. 3 is a detailed diagram of the expression filter 23. FIG. FIG. 6 shows the relationship between the current efficiency of Ni and Ni/Fe. 1... Electrolyte, 2... Electrolytic tank, 3... Circulation tank, 4, 4', 6
, 12, 12'...Pump, 5...Temperature controller, 7...Pretreatment device, 8...3 wavelength colorimeter, 9
...Arithmetic section, 10-display section, 11-control section, 12...N
i Replenishment tank, 13... pH replenishment tank, 14...
pH meter, 15... Steel plate, 16... Electrode, 17...
Energizing roll, 21... light source, 22-slit, 23-
...Rotary filter, 24...Flow cell, 25...Detector. Figure 4 Figure 5 Burial figure
Claims (1)
浴の一部を連続3波長比色計に、該比色計の前処理装置
を経て導き目的波長用フイルターAと妨害元素用フイル
ターB及びCからの信号と連続pH計からの信号を演算
回路に入れ、目的金属濃度と妨害元素濃度の比を計算し
て目的金属濃度設定値を求めるとともに、電解析出金属
量とドラツグアウト金属量を計算し、夫々の金属消費量
に見合う該金属化合物の補給量を制御することを特徴と
する電解浴中の金属イオン濃度の制御方法。1 In the metal electrolytic deposition equipment, a part of the treatment bath in the metal electrolytic deposition tank is guided to a continuous three-wavelength colorimeter through a pretreatment device of the colorimeter, and is passed through a filter A for the target wavelength and a filter B for interfering elements. The signals from C and C and the signal from the continuous pH meter are input into an arithmetic circuit, and the ratio of the target metal concentration to the interfering element concentration is calculated to obtain the target metal concentration setting value, and the amount of electrolytically deposited metal and dragout metal is calculated. A method for controlling the concentration of metal ions in an electrolytic bath, which comprises calculating and controlling the amount of the metal compound to be replenished in accordance with the consumption of each metal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14609881A JPS6030759B2 (en) | 1981-09-18 | 1981-09-18 | Method for controlling metal ion concentration in electrolytic bath |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14609881A JPS6030759B2 (en) | 1981-09-18 | 1981-09-18 | Method for controlling metal ion concentration in electrolytic bath |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5848700A JPS5848700A (en) | 1983-03-22 |
| JPS6030759B2 true JPS6030759B2 (en) | 1985-07-18 |
Family
ID=15400090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14609881A Expired JPS6030759B2 (en) | 1981-09-18 | 1981-09-18 | Method for controlling metal ion concentration in electrolytic bath |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6030759B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6036686A (en) * | 1983-08-08 | 1985-02-25 | Dowa Mining Co Ltd | Process control method of electrolytic system for copper |
| JPS60138096A (en) * | 1983-12-26 | 1985-07-22 | C Uyemura & Co Ltd | Plating method |
| JPS6293647A (en) * | 1985-10-21 | 1987-04-30 | Power Reactor & Nuclear Fuel Dev Corp | Method for detecting electrolytic reduction state of solution |
| JP2888035B2 (en) * | 1992-05-25 | 1999-05-10 | 日本鋼管株式会社 | Control method of metal ion concentration in zinc-based alloy electroplating solution |
-
1981
- 1981-09-18 JP JP14609881A patent/JPS6030759B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5848700A (en) | 1983-03-22 |
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