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JPS6032308B2 - mass spectrometer - Google Patents
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JPS6032308B2 - mass spectrometer - Google Patents

mass spectrometer

Info

Publication number
JPS6032308B2
JPS6032308B2 JP9041278A JP9041278A JPS6032308B2 JP S6032308 B2 JPS6032308 B2 JP S6032308B2 JP 9041278 A JP9041278 A JP 9041278A JP 9041278 A JP9041278 A JP 9041278A JP S6032308 B2 JPS6032308 B2 JP S6032308B2
Authority
JP
Japan
Prior art keywords
magnetic field
analysis tube
mass spectrometer
ion
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP9041278A
Other languages
Japanese (ja)
Other versions
JPS5517926A (en
Inventor
正義 矢野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9041278A priority Critical patent/JPS6032308B2/en
Publication of JPS5517926A publication Critical patent/JPS5517926A/en
Publication of JPS6032308B2 publication Critical patent/JPS6032308B2/en
Expired legal-status Critical Current

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  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Description

【発明の詳細な説明】 本発明は、質量分析計装置に係り、特に高分解熊質量分
析計に使用するに好適な分析管に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a mass spectrometer apparatus, and particularly to an analysis tube suitable for use in a high-resolution bear mass spectrometer.

質量分析装置においては、従来イオンビームの縦方向(
磁場のNS方向)の収束性は持たないイオン光学系が多
用されてきた。
In conventional mass spectrometers, the longitudinal direction of the ion beam (
Ion optical systems that do not have convergence in the NS direction of the magnetic field have been frequently used.

しかるに近年高分解能を有し、しかも感度(イオン源か
らイオンコレクタへの透過率)の高い装置が求められ、
この対策として前記縦方向にも収束性を有するイオン光
学系(以下立体収束形と呼称)が提案されている。この
ような装置においてはイオン源、軍場電極、磁場、イオ
ンコレクタなどのそれぞれの縦方向中心が正しく同一平
面内に設置されることにより所期の性能を発揮できるも
のであるが、実際には各部品の加工時、組立時の誤差な
どにより、実現が困難である。したがって必要な各部分
(たとえばイオン源、磁場位置、コレクタスリツトなど
)を調整することにより最適点を見出し設定する手段が
とられている。第1図は、このような従来の質量分析装
置の要部平面図で、Sハウジングー、雷場2、分析管4
、Cハウジング5は一体的岡山体的に組立てられて装置
架台(図示せず)に固定される。
However, in recent years, there has been a demand for devices with high resolution and high sensitivity (transmittance from the ion source to the ion collector).
As a countermeasure to this problem, an ion optical system (hereinafter referred to as a three-dimensional convergence type) that also has convergence in the vertical direction has been proposed. In such a device, the desired performance can be achieved if the longitudinal centers of the ion source, field electrode, magnetic field, ion collector, etc. are placed correctly in the same plane, but in reality, This is difficult to achieve due to errors during processing and assembly of each part. Therefore, means are taken to find and set the optimal point by adjusting each necessary part (for example, the ion source, the magnetic field position, the collector slit, etc.). Figure 1 is a plan view of the main parts of such a conventional mass spectrometer, including the S housing, the lightning field 2, and the analysis tube 4.
, the C housing 5 is assembled into an integral Okayama body and fixed to an apparatus pedestal (not shown).

磁場3のェアギャツプ(図示せず)とその内に装着され
る分析管4との間隙(通常1側程度)の範囲内で磁場3
を移動させることにより前記調整が行なわれるものであ
る。このとき前記磁場3の位置調整は最も重要な事項で
あるが、磁石の空隙部に挟みこまれて存在する分析管4
が固定であるため次のような欠点、不都合がある。
The magnetic field 3 is generated within the air gap (not shown) of the magnetic field 3 and the gap between the analysis tube 4 installed therein (usually about 1 side).
The adjustment is performed by moving the . At this time, the position adjustment of the magnetic field 3 is the most important matter.
Since it is fixed, there are the following drawbacks and inconveniences.

■ 立体収束形イオン光学系においては、前記の如く各
部分の縦方向中心を同一平面内に置きたいが、特に磁石
空隙部中心と分析管中心を一致させることが難しくなり
、この結果イオンビームの分析管上下内壁への衝突、反
射、散乱などが起り、分解館や感度の低下をきたす。
■ In a three-dimensional focusing ion optical system, it is desirable to place the vertical centers of each part on the same plane as described above, but it is particularly difficult to align the center of the magnet cavity with the center of the analysis tube, and as a result, the ion beam Collision with the upper and lower inner walls of the analysis tube, reflection, and scattering occur, resulting in decomposition and a decrease in sensitivity.

■ 当然磁石空隙部の方が分析管外矩よりも大きいとい
う関係にあり、その差分を大きくすれば、磁石調整中を
拡げることができるが、磁石空隙部を大にすると磁場3
が弱まり、分析管外矩(当然内矩も)を小さくするとイ
オンビームの通過性が悪くなる。
■ Naturally, the magnet gap is larger than the outer rectangle of the analytical tube, and if you increase the difference, you can expand the magnet adjustment range, but if you increase the magnet gap, the magnetic field
If the outer rectangle (of course the inner rectangle) of the analysis tube is made smaller, the passage of the ion beam will deteriorate.

本発明の目的は、磁場を貫通する分析管部の両端に可榛
接続手段を設けて磁場と分析警部とを同時一体的に移動
可能とすることにより、イオンビーム通過性の良い質量
分析装置を提供するにある。
An object of the present invention is to provide a mass spectrometer with good ion beam passage by providing flexible connection means at both ends of an analysis tube that penetrates the magnetic field so that the magnetic field and the analysis tube can be moved simultaneously and integrally. It is on offer.

本発明は、立体収束形イオン光学系の質量分析装置のイ
オンビーム通過性を悪くする原因が経路中最も狭くて長
いトンネルである分析管にあることに着目し、この解決
手段として分析警部を他の固定部分と可捺接続し、かつ
磁石と同時一体的に移動可能にするようにしたものであ
る。
The present invention focuses on the fact that the cause of poor ion beam passage in a mass spectrometer with a stereoscopic focusing ion optical system is the analysis tube, which is the narrowest and longest tunnel in the path. It is designed to have a flexible connection with the fixed part of the magnet, and to be movable simultaneously and integrally with the magnet.

本発明の一実施例を第2図に示す。An embodiment of the present invention is shown in FIG.

Sハウジング1、雷場2、Cハウジング5は従釆例と同
様に装置架台(図示せず)に固定されるが、分析管4は
その両端に可榛部品6を介して前記電場2、Cハウジン
グ5に接続される。該分析管4は第3図に示す如く磁場
3のェアギャップに一致した太さ(外矩)を有しており
、分析管4をェアギャップ内に挿入した後は両者は一体
的になり、磁場3の移動に応じて分析管4も同量の移動
を行うことができるものである。すなわち、第4図にお
いて出射スリット7、露場電極8、磁場3、入射スリッ
ト9のそれぞれの中心点(または中心線)を同一平面内
に存在させるという理想状態に対して、製作、組立など
の工程で生ずる避けえない誤差の補正の手段として磁場
3の調整をすることが容易になる。前記調整においては
、イオンビーム10の通過路において縦方向に最も狭い
場所である分析管4内を、イオンビームが効率良く通過
できるように、磁場3の中心面と分析管4の中心線が一
致されていることが望ましいが、本発明においてはそれ
が容易に実現されるものである。この結果本発明によれ
ば次のような効果がある。■ 磁場の中心面と分析管の
中心線が一致して磁場調整後もずれることがないので、
イオンビームの分析管上下内壁への衝突、反射、散乱な
どが少く感度(イオン通過量)、分解能が向上する。
The S housing 1, the lightning field 2, and the C housing 5 are fixed to an apparatus stand (not shown) in the same manner as in the secondary example, but the analysis tube 4 is connected to the electric fields 2, C through flexible parts 6 at both ends thereof. It is connected to the housing 5. The analysis tube 4 has a thickness (outer rectangle) that matches the air gap of the magnetic field 3, as shown in FIG. According to the movement of the analysis tube 4, the analysis tube 4 can also be moved by the same amount. That is, in contrast to the ideal state in which the center points (or center lines) of the exit slit 7, the exposed field electrode 8, the magnetic field 3, and the entrance slit 9 are located in the same plane in FIG. 4, the manufacturing, assembly, etc. It becomes easier to adjust the magnetic field 3 as a means of correcting unavoidable errors occurring in the process. In the above adjustment, the center plane of the magnetic field 3 and the center line of the analysis tube 4 are aligned so that the ion beam can efficiently pass through the analysis tube 4, which is the narrowest place in the longitudinal direction of the passage of the ion beam 10. Although it is desirable that this be the case, this can be easily achieved in the present invention. As a result, the present invention has the following effects. ■ The center plane of the magnetic field and the center line of the analysis tube are aligned and do not shift even after adjusting the magnetic field.
Collision, reflection, and scattering of the ion beam against the upper and lower inner walls of the analysis tube are reduced, improving sensitivity (ion passing amount) and resolution.

■ 磁場のェアギャップと分析管との間隙が不要となる
ため、その分だけェアギャツブを狭くして磁場強度を強
くすること、または分析管の太さ(したがって内箱寸法
)を大きくしてイオンの通過量を増すようにすること、
またその両方に使うことができる。
■ Since there is no need for a gap between the magnetic field air gap and the analysis tube, the air gap can be made narrower to increase the magnetic field strength, or the thickness of the analysis tube (and therefore the inner box size) can be increased to allow ions to pass through. to increase the amount;
It can also be used for both.

磁場3のェアギャップと分析管4の厚さ関係はそのおの
おのに適切な公差をつけてハメ合い方式とするほか無公
差とし磁場3に分析管4を固定する方式としても同じ効
果が得られる。
The relationship between the air gap of the magnetic field 3 and the thickness of the analysis tube 4 can be achieved by fitting each other with appropriate tolerances, or alternatively, the same effect can be obtained by fixing the analysis tube 4 to the magnetic field 3 with no tolerance.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の質量分析装置の要部平面図、第2図は本
発明の1実施例の平面図、第3図はその要部の断面図、
第4図は質量分析装置における鞄調整を説明するための
概略図である。 1……Sハウジング、2…・・・露場、3…・・・磁場
、4・・・・・・分析管、5…・・・Cハウジング、6
…・・・可榛手段。 第1図 第2図 第3図 第4図
FIG. 1 is a plan view of the main parts of a conventional mass spectrometer, FIG. 2 is a plan view of an embodiment of the present invention, and FIG. 3 is a sectional view of the main parts.
FIG. 4 is a schematic diagram for explaining bag adjustment in a mass spectrometer. 1...S housing, 2...Open field, 3...Magnetic field, 4...Analysis tube, 5...C housing, 6
......A beautiful means. Figure 1 Figure 2 Figure 3 Figure 4

Claims (1)

【特許請求の範囲】 1 磁場位置を調整可能とした質量分析装置において、
磁場を貫通する分析管部の両端に可撓接続手段を設ける
ことにより、前記分析管部と磁場が一体的に移動するよ
うに構成したことを特徴とする質量分析装置。 2 前記分析管部の外矩と磁場のエアギヤツプとが等し
いことを特徴とする第1項記載の質量分析装置。
[Claims] 1. A mass spectrometer in which the magnetic field position can be adjusted,
A mass spectrometer characterized in that the analysis tube section and the magnetic field are configured to move integrally by providing flexible connection means at both ends of the analysis tube section that penetrates the magnetic field. 2. The mass spectrometer according to item 1, wherein the outer rectangle of the analysis tube portion and the air gap of the magnetic field are equal.
JP9041278A 1978-07-26 1978-07-26 mass spectrometer Expired JPS6032308B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9041278A JPS6032308B2 (en) 1978-07-26 1978-07-26 mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9041278A JPS6032308B2 (en) 1978-07-26 1978-07-26 mass spectrometer

Publications (2)

Publication Number Publication Date
JPS5517926A JPS5517926A (en) 1980-02-07
JPS6032308B2 true JPS6032308B2 (en) 1985-07-27

Family

ID=13997865

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9041278A Expired JPS6032308B2 (en) 1978-07-26 1978-07-26 mass spectrometer

Country Status (1)

Country Link
JP (1) JPS6032308B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6052728A (en) * 1983-08-31 1985-03-26 Matsushita Electric Works Ltd Detection for soldering defect
JPH0342621Y2 (en) * 1984-09-06 1991-09-06

Also Published As

Publication number Publication date
JPS5517926A (en) 1980-02-07

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