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JPS603897B2 - How to detect voltage between welding electrodes - Google Patents
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JPS603897B2 - How to detect voltage between welding electrodes - Google Patents

How to detect voltage between welding electrodes

Info

Publication number
JPS603897B2
JPS603897B2 JP10114083A JP10114083A JPS603897B2 JP S603897 B2 JPS603897 B2 JP S603897B2 JP 10114083 A JP10114083 A JP 10114083A JP 10114083 A JP10114083 A JP 10114083A JP S603897 B2 JPS603897 B2 JP S603897B2
Authority
JP
Japan
Prior art keywords
voltage
chip
welding
welding electrodes
inter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10114083A
Other languages
Japanese (ja)
Other versions
JPS5910481A (en
Inventor
誠一郎 玉井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP10114083A priority Critical patent/JPS603897B2/en
Publication of JPS5910481A publication Critical patent/JPS5910481A/en
Publication of JPS603897B2 publication Critical patent/JPS603897B2/en
Expired legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K11/00Resistance welding; Severing by resistance heating
    • B23K11/24Electric supply or control circuits therefor
    • B23K11/25Monitoring devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Resistance Welding (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、抵抗溶接、特にスポット溶接の溶接品質をモ
ニタリングする場合や品質を一定に制御する場合に有効
な制御因子としての溶接電極間電圧(以後これをチップ
間電圧とよぶ)の検出方法の改善に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention is directed to the welding electrode voltage (hereinafter referred to as welding voltage) as an effective control factor when monitoring the welding quality of resistance welding, especially spot welding, and when controlling the quality to a constant level. This invention relates to an improvement in the detection method of chip-to-chip voltage.

従来例の構成とその問題点 チップ間電圧を監視することが、スポット溶接品質の管
理にきわめて有効な手段であることは周知の事実である
(例えば、文献として、抵抗溶接研究委員会資料、「ス
ポット溶接の品質保証方法」大阪大学、仲田周次他著、
昭和52年12月9日、溶接学会発行)。
Conventional configuration and its problems It is a well-known fact that monitoring the inter-chip voltage is an extremely effective means of controlling spot welding quality (for example, see Resistance Welding Research Committee materials, “ Quality Assurance Method for Spot Welding” Osaka University, Shuji Nakata et al.
Published by the Welding Society of Japan on December 9, 1978).

ところで、チップ間電圧の検出は、被溶接物の形状等の
制約から、第1図のように、検出位置は溶接電極(チッ
プ)の先端からかなりはなれた位置A,B点にとられ、
またその検出プルーブは、溶接機の腕にそわせて引き出
される。ここで、1は溶接電極(チップ)、2は被溶接
物、3は検出ブルーブ、4は溶接機本体、&Pは電圧計
である。さて、実際に検出されるチップ間電圧Vtは、
第2図のA,B間の抵抗ドロップ分(V,十V2十V3
十V4十V5)と、溶接電流による誘起電圧分(K溝)
、(但しK:誘起電圧係数、i:溶接電流、t:時間)
との和として与えられる。
By the way, in detecting the inter-tip voltage, due to constraints such as the shape of the object to be welded, the detection positions are set at points A and B, which are quite far from the tip of the welding electrode (tip), as shown in Figure 1.
The detection probe is also pulled out along the arm of the welder. Here, 1 is a welding electrode (tip), 2 is a workpiece to be welded, 3 is a detection bulb, 4 is a welding machine body, &P is a voltmeter. Now, the inter-chip voltage Vt actually detected is
Resistance drop between A and B in Figure 2 (V, 10V20V3
10V40V5) and induced voltage due to welding current (K groove)
, (where K: induced voltage coefficient, i: welding current, t: time)
It is given as the sum of

0 このうち、溶接品質に関するのは、抵抗ドロップ分
のうちの被溶接物間の電圧V3である。
0 Of these, the voltage V3 between the objects to be welded, which is part of the resistance drop, is related to welding quality.

したがって、この電圧V3を求めるには、実際に検出さ
れるチップ間電圧Vtから、誘起電圧(K器)、チップ
内の抵抗ドロップ分(V,十V5)、チップと被溶接物
間の抵抗ドロップ分(V2十V4)を差し引くことによ
り可能である。ところが従来例においては、チップ間電
圧の検出に際し、せいぜい誘起電圧(K器)分のみを除
去する程度であり、検出精度としては、十分なものとは
言い難く、結果的にはチップ間電圧を利用した溶接品質
の監視も満足すべきものではなかった。発明の目的 本発明の検出方法は、以上の従釆例に鑑み、被溶接物間
の抵抗ドロップ分をより高精度に検出せんとするもので
ある。
Therefore, to find this voltage V3, from the actually detected inter-chip voltage Vt, the induced voltage (K), the resistance drop within the chip (V, +V5), the resistance drop between the chip and the object to be welded. This is possible by subtracting (V2 + V4). However, in the conventional example, when detecting the chip-to-chip voltage, at most only the induced voltage (K voltage) is removed, and the detection accuracy cannot be said to be sufficient, and as a result, the chip-to-chip voltage is The weld quality monitoring utilized was also unsatisfactory. Purpose of the Invention In view of the above-mentioned related examples, the detection method of the present invention is intended to detect the resistance drop between the objects to be welded with higher accuracy.

発明の構成 そのための構成として本発明は、抵抗溶接の溶接電極を
短絡して通電した時の通電サイクル毎の溶接電極間電圧
を検出し、その検出した溶接電極間電圧の平均値を求め
、その平均値を溶接打点数毎に予め定めた定数で補正し
て記憶し、溶接中の通電サイクル毎の溶接電極間電圧を
検出し、前記溶接中の溶懐電極間電圧と前記記憶してあ
る値との差分値をとり、その差分値を溶接電極間電圧の
検出値とする溶接電極間電圧の検出方法である。
Structure of the Invention As a structure for this purpose, the present invention detects the voltage between the welding electrodes for each energization cycle when the welding electrodes of resistance welding are short-circuited and energized, calculates the average value of the detected voltage between the welding electrodes, and calculates the average value of the detected voltage between the welding electrodes. The average value is corrected by a predetermined constant for each number of welding points and stored, the voltage between the welding electrodes is detected for each energization cycle during welding, and the voltage between the melting electrodes during welding and the stored value are detected. This is a method of detecting the voltage between welding electrodes, in which the difference value between the two electrodes is taken and the difference value is used as the detected value of the voltage between the welding electrodes.

実施例の説明以下本発明の実施例について説明する。DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments of the present invention will be described.

本発明では、第3図に示すように、通電時限の各電源サ
イクル毎のチップ短絡時のチップ間電圧Vtを順次検出
する。
In the present invention, as shown in FIG. 3, the chip-to-chip voltage Vt at the time of chip short-circuit is sequentially detected for each power supply cycle of the energization time limit.

この場合、誘起電圧(K器)を除去する方法として、チ
ップ間電圧Vtを、交流積分回路に入力し、第4図に示
すように熔接電流の電源半サイクル分の電流が流れ始め
る時点(C,E等)と流れ終える時点(D,F等)に対
応する交流積分回路出力(Vに,V側Vto,VtF等
)を検出し、その絶対値(例えばIVtc−Vtol、
IVtE−VtFI等)をもって、それぞれの半サイク
ル通電に対応するチップ間電圧とすることにより可能で
ある。このようにして、誘起電圧分を除去したチップ間
電圧を検出する。
In this case, as a method for removing the induced voltage (K voltage generator), the chip-to-chip voltage Vt is input to an AC integrating circuit, and as shown in FIG. .
This is possible by setting the inter-chip voltage corresponding to each half-cycle energization to be energization (IVtE-VtFI, etc.). In this way, the chip-to-chip voltage from which the induced voltage has been removed is detected.

ここで、チップ短絡時と実溶接時では、溶接電流に差異
があるため、第3図のチップ内抵抗ドロップ分(V,′
+V5′)とチップ・チップ間電圧V6は、それぞれ第
2図のチップ内抵抗ドロップ分(V,十V5)とチップ
・被溶接物間の電圧(V2十V4)とに厳密には等しく
ない。したがって、これを補正するため、チップ短絡時
の抵抗ドロップ分(V,′十V6十V;)に、一定の定
数を秦算した値をチップ短絡時のチップ間電圧とする。
また通電サイクル毎のチップ間電圧をもとにして通電時
限全体にわたるその平均値を求め、これをチップ短絡時
のチップ間電圧とする。ところで、よく知られているよ
うに溶接を繰返して行っていると、チップ先端がマッシ
ュルーム4状に変形してくる。
Here, since there is a difference in welding current between the chip short circuit and actual welding, the resistance drop within the chip (V, '
+V5') and the chip-to-chip voltage V6 are not strictly equal to the intra-chip resistance drop (V, +V5) and the chip-to-workpiece voltage (V2 + V4) shown in FIG. 2, respectively. Therefore, in order to correct this, a value obtained by subtracting a certain constant from the resistance drop (V, '10V60V;) at the time of a chip short-circuit is set as the inter-chip voltage at the time of a chip short-circuit.
Also, based on the inter-chip voltage for each energization cycle, the average value over the entire energization time period is determined, and this is taken as the inter-chip voltage at the time of chip short circuit. By the way, as is well known, when welding is repeated, the tip end deforms into a mushroom shape.

このような場合には、チップ短絡時のチップ間電圧が異
なってくるため前記平均値に補正を加えてやらなければ
ならない。この補正は、前記平均値に予め定めた熔接打
点数毎にある定数を乗算補正してチップ短絡時のチップ
間電圧平均値として記憶する。このようにしてやれば、
チップ短絡時のチップ間電圧の検出が、例えばチップ交
換時の場合のみでよいことになり、能率向上が図れる。
さて次に、実際の溶接中に検出されるチップ間電圧Vt
を交流積分回路に入力して、誘起電圧(K袋)分を除去
した値から、先のチップ短絡時のチップ間電圧の平均値
(記憶値)を通電の各電源サイクル毎に差し引いた値を
以つて各電源サイクル毎のチップ間電圧値とすれば、溶
接品質に関係する被溶接物間の電圧ドロップ分のみをよ
り正確に検出することができる。
In such a case, since the inter-chip voltage at the time of chip short-circuiting differs, the average value must be corrected. This correction is performed by multiplying the average value by a certain constant for each predetermined number of welding points, and storing the result as an average value of inter-chip voltage at the time of a chip short circuit. If you do it like this,
The inter-chip voltage at the time of a chip short circuit need only be detected, for example, when the chip is replaced, and efficiency can be improved.
Now, next, the inter-tip voltage Vt detected during actual welding.
is input into the AC integration circuit, and the average value (memory value) of the chip-to-chip voltage at the time of the previous chip short circuit is subtracted from the value obtained by removing the induced voltage (K bag) for each power supply cycle of energization. If the inter-chip voltage value is determined for each power cycle, only the voltage drop between the objects to be welded, which is related to welding quality, can be detected more accurately.

第5図は、本発明の検出方法を実施するための検出回路
の一実施例である。
FIG. 5 shows an embodiment of a detection circuit for carrying out the detection method of the present invention.

図において、チップ間電圧Vtは交流積分回路1に入力
され、さらにサンプルホールド回路0、A/D変換回路
mを介してマイクロコンピュータWに入力される。一方
、溶接電流は変流器Vを介してゼロ点検出回路のに入力
され、熔接電流が流れ始める時点や終了する時点(第4
図のC,D等)を検知し、マイクロコンピュータNに知
らせる。回路肌は検出されたチップ間電圧がチップ短絡
時のチップ間電圧か実熔接時のそれかを指示するスイッ
チ回路である。
In the figure, an inter-chip voltage Vt is input to an AC integration circuit 1, and further input to a microcomputer W via a sample hold circuit 0 and an A/D conversion circuit m. On the other hand, the welding current is input to the zero point detection circuit via the current transformer V, and the welding current starts and ends flowing (fourth point).
(C, D, etc. in the figure) is detected and notified to the microcomputer N. The circuit board is a switch circuit that indicates whether the detected chip-to-chip voltage is the chip-to-chip voltage at the time of chip short circuit or the voltage at actual welding.

また、溶接打点数は加圧弁(電磁弁)を制御する電気信
号を波形整形回路個に入力し、マイクロコンピュータW
に打点状態を知らせる。
In addition, the number of welding points can be determined by inputting an electric signal that controls a pressure valve (electromagnetic valve) into a waveform shaping circuit and using a microcomputer W.
Inform the player of the dot status.

マイクロコンピュータW内では、チップの変形に応じて
、チップ短絡時のチップ間電圧を修正する熔薮打点数を
固定的にもっていて、その打点数がくれば、順次前記チ
ップ間電圧を前述の方法で補正していく。以上のような
構成をとれば、きわめて容易かつ簡単に溶接品質に関係
する被溶接物間の抵抗ドロップ分をより精度よく検出す
ることができる。
The microcomputer W has a fixed number of dots for correcting the chip-to-chip voltage when the chip is shorted according to the deformation of the chip, and when that number of dots is reached, the chip-to-chip voltage is sequentially adjusted by the method described above. I will correct it. With the above configuration, it is possible to very easily and easily detect the resistance drop between the objects to be welded, which is related to welding quality, with higher accuracy.

発明の効果以上のように本発明の検出方法を利用すれば
、チップ間電圧のうち、溶接品質に関係する被溶接物間
の抵抗ドロップ分をより精度よく検出することが可能で
あり、かつ一度このチップ短絡時でのチップ間電圧デー
タを記憶させておけば、熔接打点が進行するに伴なうチ
ップ変形があっても、その変形に伴なうチップ間電圧を
補正する方法であるため、チップの変形に伴なつて何回
もチップ短絡時のチップ間電圧データを記憶させる必要
がなく、能率向上が図れる。
Effects of the Invention As described above, by using the detection method of the present invention, it is possible to more accurately detect the resistance drop between the objects to be welded, which is related to welding quality, in the inter-chip voltage, and it is possible to By storing the chip-to-chip voltage data at the time of chip short circuit, even if the chip deforms as the welding point progresses, the chip-to-chip voltage due to the deformation can be corrected. There is no need to store chip-to-chip voltage data when chips are shorted many times as the chips are deformed, and efficiency can be improved.

したがって結果的には、本発明の方法により、チップ間
電圧を利用したスポット溶接の品質管理がより高精度か
つ高能率に実施できる。
Therefore, as a result, by the method of the present invention, quality control of spot welding using inter-chip voltage can be carried out with higher precision and efficiency.

【図面の簡単な説明】 第1図はチップ間電圧の検出方法を実施している熔接機
の側面図、第2図は実溶接時のチップ間電圧を示すチッ
プ部分の拡大側面図、第3図はチップ短絡時のチップ間
電圧を示すチップ部分の拡大側面図、第4図はチップ間
電圧検出例を示す溶接電流とチップ間電圧の交流積分値
の波形図、第5図は本発明の検出方法を実施するための
検出回路のーブロツク図である。 1…・・・溶接電極(チップ)、2…・・・被熔接物、
3・・・・・・検出プルーブ、4・・・・・・溶接機本
体、1・・…・交流積分回路、0・・・…サンプルホー
ルド回路、m……A/D変換回路、W……マイクロコン
ビユー夕、V・…・・変流器、W・・・・・・ゼロ点検
出回路、肌・・・・・・スイッチ回路、肌…・・・波形
整形回路。 第1図第2図 第3図 第4図 第5図
[Brief explanation of the drawings] Fig. 1 is a side view of a welding machine implementing the method for detecting the inter-chip voltage, Fig. 2 is an enlarged side view of the tip portion showing the inter-tip voltage during actual welding, and Fig. 3 The figure is an enlarged side view of the tip part showing the inter-chip voltage when the tip is short-circuited, FIG. 4 is a waveform diagram of the AC integral value of the welding current and the inter-tip voltage, showing an example of detecting the inter-chip voltage, and FIG. 1 is a block diagram of a detection circuit for implementing the detection method; FIG. 1... Welding electrode (chip), 2... Object to be welded,
3...Detection probe, 4...Welding machine body, 1...AC integration circuit, 0...Sample hold circuit, m...A/D conversion circuit, W... ...Microcontroller, V...Current transformer, W...Zero point detection circuit, skin...Switch circuit, skin...waveform shaping circuit. Figure 1 Figure 2 Figure 3 Figure 4 Figure 5

Claims (1)

【特許請求の範囲】[Claims] 1 抵抗溶接の溶接電極を短絡して通電した時の通電サ
イクル時の溶接電極間電圧を検出し、その検出した溶接
電極間電圧の平均値を求め、その平均値を溶接打点数毎
に予め定めた定数で補正して記憶し、溶接中の通電サイ
クル毎の溶接電極間電圧を検出し、前記溶接中の溶接電
極間電圧と前記記憶してある値との差分値をとり、その
差分値を溶接電極間電圧の検出値とすることを特徴とす
る溶接電極間電圧の検出方法。
1 Detect the voltage between the welding electrodes during the energization cycle when the welding electrodes of resistance welding are short-circuited and energized, calculate the average value of the detected voltage between the welding electrodes, and preset the average value for each number of welding points. The voltage between the welding electrodes is corrected and stored using a constant, the voltage between the welding electrodes is detected for each energization cycle during welding, the difference value between the voltage between the welding electrodes during welding and the stored value is calculated, and the difference value is calculated. A method for detecting a voltage between welding electrodes, characterized in that the detected value is a voltage between welding electrodes.
JP10114083A 1983-06-06 1983-06-06 How to detect voltage between welding electrodes Expired JPS603897B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10114083A JPS603897B2 (en) 1983-06-06 1983-06-06 How to detect voltage between welding electrodes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10114083A JPS603897B2 (en) 1983-06-06 1983-06-06 How to detect voltage between welding electrodes

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP5206180A Division JPS5847946B2 (en) 1980-04-18 1980-04-18 How to detect voltage between welding electrodes

Publications (2)

Publication Number Publication Date
JPS5910481A JPS5910481A (en) 1984-01-19
JPS603897B2 true JPS603897B2 (en) 1985-01-31

Family

ID=14292771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10114083A Expired JPS603897B2 (en) 1983-06-06 1983-06-06 How to detect voltage between welding electrodes

Country Status (1)

Country Link
JP (1) JPS603897B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006043732A (en) * 2004-08-04 2006-02-16 Daihatsu Motor Co Ltd Spot welding device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006043732A (en) * 2004-08-04 2006-02-16 Daihatsu Motor Co Ltd Spot welding device

Also Published As

Publication number Publication date
JPS5910481A (en) 1984-01-19

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