JPS6041040B2 - How to grow gallium phosphide semiconductor crystals - Google Patents
How to grow gallium phosphide semiconductor crystalsInfo
- Publication number
- JPS6041040B2 JPS6041040B2 JP11501580A JP11501580A JPS6041040B2 JP S6041040 B2 JPS6041040 B2 JP S6041040B2 JP 11501580 A JP11501580 A JP 11501580A JP 11501580 A JP11501580 A JP 11501580A JP S6041040 B2 JPS6041040 B2 JP S6041040B2
- Authority
- JP
- Japan
- Prior art keywords
- gap
- crystal
- solution
- temperature
- temperature gradient
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 title claims description 130
- 239000004065 semiconductor Substances 0.000 title claims description 10
- 229910005540 GaP Inorganic materials 0.000 title description 30
- HZXMRANICFIONG-UHFFFAOYSA-N gallium phosphide Chemical compound [Ga]#P HZXMRANICFIONG-UHFFFAOYSA-N 0.000 title description 2
- 238000000034 method Methods 0.000 claims description 28
- 229910052698 phosphorus Inorganic materials 0.000 claims description 5
- 230000001747 exhibiting effect Effects 0.000 claims description 4
- 229910052733 gallium Inorganic materials 0.000 claims description 4
- 238000000354 decomposition reaction Methods 0.000 claims description 2
- 238000002844 melting Methods 0.000 claims description 2
- 230000008018 melting Effects 0.000 claims description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000010453 quartz Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 238000002109 crystal growth method Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 229910002804 graphite Inorganic materials 0.000 description 3
- 239000010439 graphite Substances 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000002500 effect on skin Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 230000000638 stimulation Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
本発明はSSD法によるGap(ガリウムリン)半導体
結晶の成長方法に関し、更に詳細には、大きなGap単
結晶を得ることが可能な結晶成長方法に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for growing a Gap (gallium phosphide) semiconductor crystal using the SSD method, and more particularly, to a crystal growth method capable of obtaining a large Gap single crystal.
GaP半導体結晶を作るSSD法は、侍公昭48一20
106号公報等によって公知である。The SSD method for making GaP semiconductor crystals was developed in Samurai Kosho 48-20.
It is publicly known from Publication No. 106 and the like.
次に、このSSD法による典型的な従来のGap結晶成
長方法を第1図及び第2図を参照して説明する。第1図
に示す石英製の円筒形るつぼ1の底に種結晶2を魔さ、
この上にGa溶液3を入れ、このるつぼ1を支持部材(
図示せず)で支持して石英製密封容器4の上部に配置す
る。また石英製密封容器4の底部に高さ4〜5肌の量の
赤燐5を置き10‐6Troo程度に真空密封する。次
にこの赤隣5を第1のヒーター6で例えば約43000
に加熱して、容器4内に約1気圧のP蒸気圧を発生させ
る。また第2図に示すようにGa溶液3の表面のP2位
置が例えば115000、種結晶2のP,位贋が例えば
1000ooとなるように第2のヒ−ター7でGa溶液
3に温度勾配を与える。このようにすると、Ga溶液3
の表面でGapが合成されてGaP膜8が生じ、このG
apが溶質としてGa溶液3の中を種結晶2に向って拡
散し、種結晶2の上にGap結晶9の成長が始まる。そ
して結晶9の成長が開始した後には結晶面位置P′,と
○a溶液表面位置P2との間の温度勾配によってGaP
の拡散が継続し、Gap結晶の成長が継続される。即ち
Ga溶液3の表面の高温部に於いて合成(Synthe
sis)された化合物GaPが溶質(Solute)と
して、Ga溶液3の中を種結晶2又は既に成長したGa
p結晶9の表面の低温部に向って拡散(Diffusi
on)してGaP結晶9が成長する。上述の如きSSD
法は、結晶成長の速度が遅いという欠点を有する反面、
次に示す多くの利点を有する。{a}従釆広く利用され
ているLEC法のように高温・高圧で結晶成長をさせる
必要がないので、製造装置が簡単かつ安価になる。他化
合物半導体を構成する元素を出発材料として結晶を直接
に作るので、製造が容易である。【c)結晶の形が容器
(るつぼ)の形状によって決まるので、径のそろった結
晶を得ることができる。‘dー結晶欠陥の少ない結晶が
得られるので、高発光効率発光素子が得られる。ところ
が、第1図に示す装置を利用して従釆のSSD法で結晶
を成長させれば、第3図及び第4図に示す如く多くの単
結晶部分9a則ち単結晶粒が不特定に並んだ結晶9則ち
多結晶となり、大きな単結晶を得ることが困難であった
。Next, a typical conventional gap crystal growth method using this SSD method will be explained with reference to FIGS. 1 and 2. A seed crystal 2 is placed at the bottom of a cylindrical crucible 1 made of quartz as shown in FIG.
Put a Ga solution 3 on top of this, and hold this crucible 1 with a supporting member (
(not shown) and placed on the upper part of the sealed quartz container 4. Further, red phosphorus 5 in an amount of 4 to 5 skins in height is placed at the bottom of a sealed container 4 made of quartz, and the container is vacuum-sealed to about 10-6 Troops. Next, this red neighbor 5 is heated to about 43,000 by using the first heater 6.
to generate a P vapor pressure of about 1 atmosphere in the container 4. Further, as shown in FIG. 2, a temperature gradient is applied to the Ga solution 3 using the second heater 7 so that the P2 position on the surface of the Ga solution 3 is, for example, 115,000, and the P position of the seed crystal 2 is, for example, 1,000oo. give. In this way, Ga solution 3
Gap is synthesized on the surface of the GaP film 8, and this G
ap diffuses as a solute in the Ga solution 3 toward the seed crystal 2, and a Gap crystal 9 begins to grow on the seed crystal 2. After the growth of crystal 9 has started, the temperature gradient between the crystal plane position P' and the ○a solution surface position P2 causes GaP
continues to diffuse, and the growth of the Gap crystal continues. That is, the synthesis (Synthe
The compound GaP (SiS) is passed through the Ga solution 3 as a solute and the seed crystal 2 or the already grown Ga
Diffusion toward the low-temperature part of the surface of the p-crystal 9
on) and GaP crystal 9 grows. SSD as mentioned above
Although this method has the disadvantage of slow crystal growth,
It has many advantages as follows: {a} Unlike the widely used LEC method, there is no need to grow crystals at high temperatures and pressures, making the manufacturing equipment simple and inexpensive. Manufacturing is easy because crystals are directly formed using elements constituting other compound semiconductors as starting materials. [c) Since the shape of the crystal is determined by the shape of the container (crucible), crystals with uniform diameter can be obtained. 'd- Since a crystal with few crystal defects can be obtained, a light emitting device with high luminous efficiency can be obtained. However, if a crystal is grown by the secondary SSD method using the apparatus shown in FIG. The crystals were lined up9, that is, polycrystalline, and it was difficult to obtain a large single crystal.
従ってこの結晶9を利用して発光素子を作る際に多結晶
であるためによる欠点が常につきまとった。大きな単結
晶を作ることを目的として、特公昭51−48152号
公報でGa溶液の表面の温度とGap結晶成長面の温度
とを一定に保つ方法が提案されている。Therefore, when making a light emitting device using this crystal 9, there are always disadvantages due to the fact that it is polycrystalline. For the purpose of producing a large single crystal, Japanese Patent Publication No. 48152/1983 proposes a method of keeping the temperature of the surface of the Ga solution and the temperature of the Gap crystal growth surface constant.
この方法は、第1図に示すような従来のSSD法では、
GaP結晶9の成長とともにGap結晶成長面およびG
a溶液3の表面位置が変化してこれ等の各部分の温度と
温度分布が変化するので、単結晶生成が困難であるとの
考えに立脚し、第5図に説明的に示すように、例えばG
a溶液3を入れるるつぼ1の上部の断面積を下部の1/
2とし、種結晶2の上のGaP結晶9の成長に応じてる
つぼ1を下方に移動させ、GaとPが反応してGap膜
8が形成されるGa溶液表面の温度THとGap結晶9
の成長面の温度TL、およびこれら2つの面の間の距離
Lを結晶成長の間一定に保つ方法である。ところが、こ
のように温度条件を一定に保っても、実際に大きな単結
晶を確実に得ることは極めて困難である。そこで、本発
明の目的は、SSD法は単結晶又は単結晶に近い結晶を
得ることが可能なCap結晶の成長方法を提供すること
にある。This method is different from the conventional SSD method as shown in Figure 1.
As the GaP crystal 9 grows, the Gap crystal growth surface and the G
Based on the idea that it is difficult to produce a single crystal because the surface position of the a solution 3 changes and the temperature and temperature distribution of these parts change, as illustrated in FIG. 5, For example, G
a The cross-sectional area of the upper part of crucible 1 containing solution 3 is 1/1/of the lower part.
2, the crucible 1 is moved downward in accordance with the growth of the GaP crystal 9 on the seed crystal 2, and the temperature TH of the surface of the Ga solution and the Gap crystal 9, where Ga and P react to form the Gap film 8, are
This is a method of keeping the temperature TL of the growth surface and the distance L between these two surfaces constant during crystal growth. However, even if the temperature conditions are kept constant in this way, it is extremely difficult to reliably obtain a large single crystal. Therefore, an object of the present invention is to provide a method for growing a Cap crystal using the SSD method, which allows obtaining a single crystal or a crystal close to a single crystal.
上記目的を達成するための本発明は、比較的低い蒸気圧
を示すGa溶液を入れた容器を比較的高い蒸気圧を示す
Sの蒸気を含む雰囲気内で配し、・前記Ga溶液が前記
Pの蒸気と接触する部分をGaとPとから成るGaPの
融点よりは低いが比較的高温である高温部となし、前記
Ga溶液の前記高温部から離れた部分を前記高温部より
も温度が低い低温部となし、前記Pの蒸気圧を前記Ga
pの分解圧より高くし、前記高温部にて合成されたGa
pを前記Ga溶液中に拡散させて前記低温部にGap半
導体結晶を成長させる方法に於いて、前記Ga溶液を入
れた前記容器の下部にGap種結晶を配し、前記GaP
種結晶に放熱体(ヒートシンク)を熱的に結合し、前記
Ga溶液と前記Pの蒸気とが反応してGapが合成され
る前記Ga溶液の表面の面積(S,)と前記低温度の前
記GaP結晶の結晶成長面の面積(S2)との比(S,
/S2)を1/I.7〜1′5とし、前記Ga溶液の表
面と前記GaP結晶の結晶成長面との間の平均温度勾配
を15〜40q○/仇としてGaPの半導体結晶を成長
させることを特徴とするGap半導体結晶の成長方法に
係わるものである。To achieve the above object, the present invention provides a method for disposing a container containing a Ga solution exhibiting a relatively low vapor pressure in an atmosphere containing S vapor exhibiting a relatively high vapor pressure; The part of the Ga solution that comes into contact with the vapor is a high temperature part that is lower than the melting point of GaP made of Ga and P but has a relatively high temperature, and the part of the Ga solution that is away from the high temperature part is lower in temperature than the high temperature part. The vapor pressure of the P is set as the low temperature part, and the vapor pressure of the P is set as the low temperature part.
The Ga synthesized in the high temperature section is made higher than the decomposition pressure of p.
In the method of growing a Gap semiconductor crystal in the low temperature region by diffusing p into the Ga solution, a Gap seed crystal is placed at the bottom of the container containing the Ga solution, and the GaP
A heat radiator (heat sink) is thermally coupled to the seed crystal, and the Ga solution and the P vapor react to synthesize Gap.The area (S,) of the surface of the Ga solution and the low temperature The ratio (S,
/S2) to 1/I. 7 to 1'5, and a GaP semiconductor crystal is grown with an average temperature gradient of 15 to 40 q/m between the surface of the Ga solution and the crystal growth surface of the GaP crystal. It is related to the method of growth.
上記本発明によれば、ヒートシンクの効果、面積比S,
′S2の効果、平均温度勾配の効果が相乗的に作用して
大きな単結晶又は単結晶に近い結晶を作ることができる
。According to the present invention, the effect of the heat sink, the area ratio S,
The effect of 'S2 and the effect of the average temperature gradient act synergistically to produce a large single crystal or a crystal close to a single crystal.
以下、第6図〜第13図を参照して本発明の実施例につ
いて述べる。Embodiments of the present invention will be described below with reference to FIGS. 6 to 13.
但し、第6図〜第13図に於いて符号1〜9で示すもの
は、第1図で同一符号で示すものと実質的に同一であり
、また基本的な製造方法も同一であるので、これ等の説
明は省略する。本発明の実施例に係わるGaP結晶成長
装置を示す第6図に於いては、石英るつぼ1の下部la
に1 1 1結晶成長面を有するGaP種結晶2が配直
され、このGap種結晶2の下に薄いグラフアィト板1
0aを介して温度勾配調整用のシリコン製のヒートシン
ク10が配置され、このヒートシンク10‘ま容器10
に固着された複数の突起11によって支持されている。However, the items indicated by numerals 1 to 9 in Figs. 6 to 13 are substantially the same as those indicated by the same numerals in Fig. 1, and the basic manufacturing method is also the same. Explanation of these items will be omitted. In FIG. 6 showing the GaP crystal growth apparatus according to the embodiment of the present invention, the lower la of the quartz crucible 1 is
A GaP seed crystal 2 having a 1 1 1 crystal growth plane is arranged, and a thin graphite plate 1 is placed under this Gap seed crystal 2.
A heat sink 10 made of silicon for temperature gradient adjustment is arranged through the heat sink 10' and the container 10.
It is supported by a plurality of protrusions 11 fixed to.
従って、るつぼ1は底を有さず、種結晶2とグラフアイ
ト板10aとヒートシンク10が底の代りをしている。
尚るつぼ1に底を設けなくとも、Ga溶液3の表面張力
の関係でGa溶液3が流出することはない。またるつぼ
1は大蚤部lbと小径部lcとを有し、結晶成長の全期
間に渡ってGa溶液3の表面即ちGa膜8の部分が小軽
部lcに位置するように、N型不純物としてTeをドー
プしたGa溶液3が注入されている。尚4・軽部lcの
Ga溶液3の表面の面積S,と大径部lbのGap結晶
9の成長面の面積S2との比S,/S2が約1/3にな
るように、小軽部lcの内径が約24肋、大蚤部lbの
内径が約42側に決定されている。第6図の装置を使用
してGap結晶9を成長させる際には、第6図のP2位
置に対応する高温部の温度THを、石英中のSiによる
汚染を避けるために1200q○以下に設定し、またP
,位置に対応する低温部のGap結晶成長面の温度Tし
を950〜1100午0とし、Ga溶液3内の平均温度
勾配(以下単に温度勾配と呼ぶ)を15qo/肌以上と
する。Therefore, the crucible 1 does not have a bottom, and the seed crystal 2, the graphite plate 10a, and the heat sink 10 serve as the bottom.
Even if the crucible 1 does not have a bottom, the Ga solution 3 will not flow out due to the surface tension of the Ga solution 3. The crucible 1 has a large diameter part lb and a small diameter part lc, and the N-type impurity is added so that the surface of the Ga solution 3, that is, the portion of the Ga film 8 is located in the small diameter part lc during the entire period of crystal growth. A Ga solution 3 doped with Te is injected. 4. The small light part lc is adjusted so that the ratio S,/S2 of the surface area S of the Ga solution 3 in the light part lc to the area S2 of the growth surface of the Gap crystal 9 in the large diameter part lb is approximately 1/3. The inner diameter of the large flange lb is determined to be approximately 24 ribs, and the inner diameter of the large flange lb is determined to be approximately 42 ribs. When growing the Gap crystal 9 using the apparatus shown in Fig. 6, the temperature TH of the high temperature section corresponding to the P2 position in Fig. 6 is set to 1200q○ or less to avoid contamination by Si in the quartz. And also P
, the temperature T of the Gap crystal growth surface in the low temperature part corresponding to the position is set to 950 to 1100 o'clock, and the average temperature gradient (hereinafter simply referred to as temperature gradient) in the Ga solution 3 is set to 15 qo/skin or more.
即ち、第7図に示す如くP,とP2位置とで温度差TH
−TLが生じるようになし、この温度差による温度勾配
を15〜40こ0/弧から選択された適当な値とする。
尚第7図でTPは赤燐5の加熱温度であり、約420〜
450ooに設定される。ここで、Ga溶液3内の温度
勾配を15℃/仇以上としているが、結晶ィンゴット径
が3仇舷程度以上のものを得る場合に、金属であって熱
伝導率の大きいGa溶液3の中に1000/肌以上の温
度勾配を得ることはむずかしかった。That is, as shown in FIG. 7, there is a temperature difference TH between P and P2 positions.
-TL is caused, and the temperature gradient due to this temperature difference is set to an appropriate value selected from 15 to 40 degrees/arc.
In Figure 7, TP is the heating temperature of red phosphorus 5, which is about 420~
It is set to 450oo. Here, the temperature gradient in the Ga solution 3 is set to 15° C./2 or more, but when obtaining a crystal ingot with a diameter of about 3 m or more, the temperature gradient in the Ga solution 3, which is a metal and has high thermal conductivity, is It was difficult to obtain a temperature gradient of 1000/skin or more.
前記特公昭51一48152号公報の方法で確実に単結
晶を得ることができなかった理由も、加熱炉の温度設定
を正確に行なったにもかかわらずGa溶液3内に十分な
温度勾配ができていなかったことにその一因があると推
定される。このため、本実施例では高熱伝導率を有し且
つ耐熱性を有するシリコンからなるヒートシンクを用い
ることにより結晶成長面の温度を強制的に下げて15q
C/抑以上の温度勾配を得ている。この実施例における
結晶成長中のGa溶液3内の温度勾配は、第11図に示
すように時間の経過とともに増加する。しかし、15〜
40午0/仇の範囲に保たれる。上述の如く温度勾配を
設定し、且つ小径部lcと大淫部lbとを有するるつぼ
1を使用してS,/S2=1/3にすると、Gap膜8
から種結晶2又は成長結晶9に向って拡散するGapの
濃度が小径部lcから大径部lbに移った所で急激に小
さくなる。The reason why it was not possible to reliably obtain a single crystal using the method disclosed in Japanese Patent Publication No. 51-48152 is that a sufficient temperature gradient was not created in the Ga solution 3 even though the temperature of the heating furnace was set accurately. It is presumed that one reason for this is that they were not. Therefore, in this example, the temperature of the crystal growth surface is forcibly lowered by using a heat sink made of silicon, which has high thermal conductivity and heat resistance.
A temperature gradient greater than C/inhibition was obtained. In this example, the temperature gradient within the Ga solution 3 during crystal growth increases with time, as shown in FIG. 11. However, 15~
40:00/kept within range of the enemy. When the temperature gradient is set as described above and the crucible 1 having the small diameter part lc and the large diameter part lb is set to S,/S2=1/3, the Gap film 8
The concentration of Gap that diffuses toward the seed crystal 2 or the growing crystal 9 suddenly decreases at the point where it moves from the small diameter portion lc to the large diameter portion lb.
第10図AはGa溶液3の表面位置P2から結晶9の成
長面位置P,までのGa溶液3中のGaPの濃度を示す
ものであり、小窪部lcと大蓬部lbとの境界位置Pc
でGaP濃度が急激に低下し、そこから結晶成長面に向
って徐々に低下することを示す。ところで、GaPの飽
和濃度は温度によって決まり、Ca溶液中の温度勾配が
ほぼ一定の場合には、実験データから、第10図の曲線
Bに示すようにやや下側にアーチ状に突出した曲線で表
わされる。FIG. 10A shows the concentration of GaP in the Ga solution 3 from the surface position P2 of the Ga solution 3 to the growth surface position P of the crystal 9, and the boundary position Pc between the small depression lc and the large depression lb.
This shows that the GaP concentration decreases rapidly at , and then gradually decreases toward the crystal growth surface. By the way, the saturation concentration of GaP is determined by the temperature, and when the temperature gradient in the Ca solution is almost constant, experimental data shows that the saturation concentration of GaP is a curve that protrudes slightly downward in an arch shape, as shown in curve B in Figure 10. expressed.
このGaP飽和濃度曲線Bと本実施例のGaP濃度曲線
Aとの比較から明らかなように、本実施例のGaP濃度
はP,〜Pcの大蓬部lbに於いて飽和濃度以下に制限
されている。換言すれば過飽和状態が生じない濃度分布
となっている。このため、振動等の刺激が加えられても
、多結晶の原因となる結晶核が生じ1こく〈、第8図及
び第9図に示すような大きな単結晶部分9aを得ること
が出来る。尚、るつぼ1と接触する外周領域に僅かな多
結晶部分9bが生じるが、単結晶部分9aよりも大幅に
少ない。本実施例によれば、上述の如く全体を実質的に
単結晶とみなせる成長が可能であるのに対して、第1図
の従釆方法では第3図及び第4図に示すように多結晶に
なるのは、Ga溶液3中に於けるGaP濃度の分布が第
10図の曲線Cのようになることが大きな原因になって
いると思われる。As is clear from the comparison between this GaP saturation concentration curve B and the GaP concentration curve A of this example, the GaP concentration of this example is limited to below the saturation concentration in the large portion lb of P, ~Pc. There is. In other words, the concentration distribution is such that no supersaturation occurs. Therefore, even if a stimulus such as vibration is applied, a crystal nucleus that causes polycrystals is generated, and a large single crystal portion 9a as shown in FIGS. 8 and 9 can be obtained. Although a small amount of polycrystalline portion 9b is formed in the outer peripheral region that contacts the crucible 1, it is much smaller than the single-crystalline portion 9a. According to the present example, as described above, it is possible to grow the whole as a substantially single crystal, whereas in the secondary method shown in FIG. 1, a polycrystal is grown as shown in FIGS. The reason for this is thought to be that the GaP concentration distribution in the Ga solution 3 is as shown by curve C in FIG. 10.
即ち、第1図のような場合には、GaP膜8からGap
の供給が充分であり、濃度の濃いGaP膜8の側から濃
度の薄い結晶成長面の側に向う溶質としてのGapの濃
度分布は、フィック(Fick)の第1法則によってや
や上にアーチ状に突出した曲線Cとなり、全ての領域で
過飽和状態又はこれに近い状態となる。このため、振動
等の刺激によって多結晶の原因となる結晶核が生じやす
く、第3図及び第4図に示すような結晶9になるものと
思われる。S,/S2の値と結晶成長とがどのように関
係しているかを調べるために、第6図の装置に於いて、
大蓬部lbの内径即ちS2の値を一定とし、小軽部lc
の内歪即ちS,のみを種々変えて、ィンゴツトに於ける
単結晶粒の数の変化を調べたところ、第12図のグラフ
になった。尚このグラフに於いて、曲線aはS,/S2
=1の場合、曲線bはS,/S2=1/1.5の場合、
曲線cはS,/S2=1/1.7の場合、曲線dはS,
/S2=1/2の場合、曲線eはS./S2=1/2.
5 S./S2=1/3及びS,/S2=1/4及びS
./S2=1/5の場合の、成長時間と単結晶粒数(個
/仇)との関係を示す。このグラフの機軸は結晶成長開
始から終了までの各時点での結晶状態を表わすためのパ
ラメータであり、成長順位と呼んでいる。結晶成長に従
って、単結晶粒は増加するが、曲線c,d,eでは、成
長終了時点近くまで、単結晶粒の数が実質的に1に保た
れている。これに対して、曲線a及びbでは多くの単給
晶粒を含む。従って、S,/S2≦1/1.7とすると
単結晶粒が極めて少なく、実質的に1つの大形単結晶と
みなせる結晶が得られる。しかし、S,/S2を小さく
するにしたがって結晶成長速度が遅くなり、実用的でな
くなるのでS,/S2=1/9塁度が限界である。尚結
晶成長速度はGa溶液3内の温度勾配にも関係するが、
実現可能な温度勾配で且つこれが15〜40oo/仇の
場合には、S,/S2の実用的な限界は約1/5である
。更に、第12図における単結晶粒数は目視によって調
べたものであるが、これに代って光弾性法等によってミ
クロな結晶状態を調べると、S./S2il/1.7及
び1/2で成長させた結晶にはマイクログレィンと呼ば
れる微小額角を持つ小領域の密集する部分が存在し、S
,/S2≦1/2.5で成長させた結晶にはマイクログ
レインがほとんど見られなかった。マイクログレィンを
含む結晶部分を用いた発光ダイオードは発光特性が良く
ないため、S./S2の値は1/2.5以下がより望ま
しい。第6図の装涜を使用した結晶成長方法に於いて、
Ga溶液3内の温度勾配を種々変えた場合のGap結晶
の単結晶状態を調べた。この結果、温度勾配が1ooo
/肌程度では、Ga溶液3中に結晶核が形成され易い不
安定な状態にあり、GaPの拡散途中に多結晶のもとと
なる結晶核が形成され、再現性良く大形な単結晶を得る
ことはできなかった。lyC/の以上の場合は、Ga溶
液は比較的安定した状態となり、Gapの大形単結晶貝
0ち結晶粒の少ないGaP結晶を再現性良く得ることが
できた。しかし、温度勾配を大きくしすぎると結晶成長
速度が速くなる反面結晶欠陥が多くなるので40℃/肌
程度を越えることは好ましくない。なお、温度勾配を結
晶成長とともに増加させるとより単結晶に近いものが得
られる。第6図の装置及びこれを利用した結晶成長方法
では、シリコン製ヒートシンク10を使用しているので
、Ga溶液3において15〜40oo/伽の温度勾配を
得ることが出釆た。That is, in the case as shown in FIG.
The concentration distribution of Gap as a solute from the side of the GaP film 8 with a high concentration to the side of the crystal growth surface with a low concentration is slightly arched upward according to Fick's first law. The curve becomes a prominent curve C, and all regions are in a supersaturated state or a state close to this. For this reason, it is thought that stimulation such as vibration tends to generate crystal nuclei that cause polycrystals, resulting in crystals 9 as shown in FIGS. 3 and 4. In order to investigate how the value of S, /S2 and crystal growth are related, in the apparatus shown in Fig. 6,
The inner diameter of the large part lb, that is, the value of S2, is constant, and the small light part lc
When only the internal strain, ie, S, was varied, the change in the number of single crystal grains in the ingot was investigated, and the graph shown in FIG. 12 was obtained. In this graph, curve a is S,/S2
= 1, curve b is S, /S2 = 1/1.5,
Curve c is S, when /S2=1/1.7, curve d is S,
/S2=1/2, the curve e is S. /S2=1/2.
5 S. /S2=1/3 and S, /S2=1/4 and S
.. The relationship between the growth time and the number of single crystal grains (pieces/grain) when /S2=1/5 is shown. The axis of this graph is a parameter representing the crystal state at each point from the start to the end of crystal growth, and is called the growth order. As the crystal grows, the number of single crystal grains increases, but in curves c, d, and e, the number of single crystal grains remains substantially 1 until near the end of growth. On the other hand, curves a and b include many monocrystalline grains. Therefore, when S,/S2≦1/1.7, the number of single crystal grains is extremely small, and a crystal that can be substantially regarded as one large single crystal can be obtained. However, as S,/S2 becomes smaller, the crystal growth rate slows down and becomes impractical, so S,/S2=1/9 degree is the limit. Although the crystal growth rate is also related to the temperature gradient within the Ga solution 3,
For a realizable temperature gradient of 15 to 40 oo/h, the practical limit of S,/S2 is about 1/5. Furthermore, although the number of single crystal grains in FIG. 12 was determined visually, if the microcrystalline state was examined using a photoelastic method instead, it was found that S. The crystals grown at /S2il/1.7 and 1/2 have areas where small regions with minute angles called micrograins are concentrated, and S
, /S2≦1/2.5, almost no micrograins were observed in the crystals grown. Light emitting diodes using crystal parts containing micrograins have poor light emitting characteristics, so S. The value of /S2 is more preferably 1/2.5 or less. In the crystal growth method using the decoction shown in Figure 6,
The single crystal state of the Gap crystal was investigated when the temperature gradient in the Ga solution 3 was varied. As a result, the temperature gradient is 1ooo
/ At skin level, the Ga solution 3 is in an unstable state where crystal nuclei are easily formed, and crystal nuclei that become the source of polycrystals are formed during GaP diffusion, resulting in large single crystals with good reproducibility. I couldn't get it. When lyC/ or more, the Ga solution was in a relatively stable state, and GaP crystals with few large single crystal grains could be obtained with good reproducibility. However, if the temperature gradient is made too large, the crystal growth rate will increase, but at the same time, crystal defects will increase, so it is not preferable to exceed about 40° C./skin. Note that by increasing the temperature gradient as the crystal grows, a crystal closer to a single crystal can be obtained. In the apparatus shown in FIG. 6 and the crystal growth method using the same, since the silicon heat sink 10 is used, it was possible to obtain a temperature gradient of 15 to 40 oo/g in the Ga solution 3.
このヒートシンク10を使用しないで、1500/肌以
上の大きな温度勾配をつけるために、ヒーター7から離
れるに従って温度が低下する(加熱炉に近いほど温度が
高い)ことを利用して、るつぼ1の位置を適当な距離だ
けヒーター7からずらしてみた。しかし、るつぼ1が空
の状態ではこの方法で予期したとおりの温度勾配が得ら
れたものの、るつぼ1にGa溶液3を入れると、Gaの
熱伝導率が高いために小さな温度勾配しか得られなかっ
た。たとえば、るつぼ1が空の時に30つ0/伽の温度
勾配が得られたが、るつぼ1にGa溶液3を入れてその
温度勾配を実測すると10qo/抑未満であった。従っ
て、ヒートシンク10を種結晶2に熱的に結合する方法
は、Ga溶液3内の温度勾配をl5qo/肌以上とする
ための簡単で実用的な方法である。また、ヒーター7と
して局部的加熱が可能な誘導加熱炉を用いて一般的な抵
抗加熱炉による温度勾配よりも大きな温度勾配として結
晶成長させた場合と、本実施例のヒートシンク10を使
用して結晶成長させた場合とを比較したところ、後者の
ヒートシンク10を利用した方が再現性良く結晶粒の少
ないGaP結晶即ち大形単結晶を得ることが出釆た。こ
の理由は明らかではないが、ヒートシンク10を用いる
ことによって、円形の結晶成長面の中心の温度がその周
辺の温度よりも僅かに低くなり、この温度差による温度
分布と、S,/S2≦1/1.7にした効果とが相乗的
に作用しているためと思われる。次に、本発明の別の実
施例に係わるGaP結晶成長装置を示す第13図につい
て述べる。但し、第6図と実質的に同一な部分には同一
な符号を付してその説明を省略する。この実施例では、
第6図に示するつぼ1の小径部lcを設ける代りに、ド
ーナツト状のグラフアィト製フロート12をGa溶液3
に浮かせている。そして、このフロート12は、0a溶
液3と赤燐5で作った隣P蒸気との接触面即ちGa溶液
3の上面の面積を、種結晶2又は成長結晶9とGa溶液
3との接触面積即ち結晶上表面の面積の約1/3に制限
するように形成されている。またGaとPとの接触面積
の制限を結晶成長の開始時から終了時まで確実に維持す
るためにフロート12をGa溶液3の液面の高さの変化
に追従して引き上げる引上げ装贋13が設けられている
。尚図示はされていないが、引上げ装直13を設けても
燐P蒸気が逃げ出さないようにシール装置が設けられて
いる。このように構成した場合には、Gap膜8から拡
散を開始したGaPは、フロート12を過ぎて急に断面
積の大きいGa溶液3の部分に入るので、Ga溶液3中
のGapの濃度がフロ−ト12の下で急に低下し、第1
0図と同様な濃度分布が得られ、温度勾配15〜40℃
/肌にした効果との相乗作用によって第6図の場合と同
様に再現性良く単結晶を得ることが出来る。In order to create a large temperature gradient of 1500/skin or more without using this heat sink 10, the position of crucible 1 is I tried shifting it from heater 7 by an appropriate distance. However, although the expected temperature gradient was obtained with this method when crucible 1 was empty, when Ga solution 3 was placed in crucible 1, only a small temperature gradient was obtained due to the high thermal conductivity of Ga. Ta. For example, when the crucible 1 was empty, a temperature gradient of 30 qo/kg was obtained, but when the Ga solution 3 was put into the crucible 1 and the temperature gradient was actually measured, it was less than 10 qo/kg. Therefore, the method of thermally coupling the heat sink 10 to the seed crystal 2 is a simple and practical method for making the temperature gradient in the Ga solution 3 greater than 15 qo/skin. In addition, there are two cases in which a crystal is grown using an induction heating furnace capable of local heating as the heater 7 and a temperature gradient larger than that in a general resistance heating furnace, and a case in which a crystal is grown using the heat sink 10 of this embodiment. When compared with the case where the heat sink 10 is grown, it was found that the use of the latter heat sink 10 yields a GaP crystal with fewer crystal grains, that is, a large single crystal, with better reproducibility. The reason for this is not clear, but by using the heat sink 10, the temperature at the center of the circular crystal growth surface becomes slightly lower than the surrounding temperature, and the temperature distribution due to this temperature difference and S, /S2≦1 This seems to be because the effect of setting the value to /1.7 is acting synergistically. Next, FIG. 13, which shows a GaP crystal growth apparatus according to another embodiment of the present invention, will be described. However, parts that are substantially the same as those in FIG. 6 are given the same reference numerals, and their explanations will be omitted. In this example,
Instead of providing the small diameter portion lc of the crucible 1 shown in FIG.
It's floating in the air. Then, this float 12 changes the area of the contact surface between the Oa solution 3 and the neighboring P vapor made of red phosphorus 5, that is, the upper surface of the Ga solution 3, and the contact area between the seed crystal 2 or the growing crystal 9 and the Ga solution 3, that is, the area of the upper surface of the Ga solution 3. It is formed so as to be limited to about 1/3 of the area of the upper surface of the crystal. In addition, in order to reliably maintain the limit on the contact area between Ga and P from the start to the end of crystal growth, a pulling device 13 is installed to pull up the float 12 in accordance with changes in the height of the liquid level of the Ga solution 3. It is provided. Although not shown in the drawings, a sealing device is provided to prevent phosphorus P vapor from escaping even if the pulling refit 13 is provided. In this configuration, GaP that has started to diffuse from the Gap film 8 passes through the float 12 and suddenly enters the portion of the Ga solution 3 that has a large cross-sectional area, so that the concentration of Gap in the Ga solution 3 is equal to that of the flow. - It suddenly decreases below the first
A concentration distribution similar to that in Figure 0 was obtained, with a temperature gradient of 15 to 40°C.
/ Due to the synergistic effect with the skin effect, single crystals can be obtained with good reproducibility as in the case of Fig. 6.
以上、本発明の実施例について述べたが、本発明はこれ
に限定されるものではなく、本発明の要旨を逸脱しない
範囲で更に変形可能なものである。Although the embodiments of the present invention have been described above, the present invention is not limited thereto, and can be further modified without departing from the gist of the present invention.
例えば、ィンゴットの製造に限ることなく、基板上に薄
いGaP層をェピタキシャル成長させる場合にも適用可
能である。また、フロート12を、電気力又は磁気力で
保持又は移動するようにしてもよい。またヒートシンク
10をシリコン以外の材料で作ってもよい。またフロー
ト12の引き上げ装置13を設けずに、フロート12が
Ga溶液3の表面に浮くことが不可能になっても、その
まま成長を続けるようにしてもよい。またヒ−トシンク
10と種結晶2との間にグラフアィト板10a以外の接
着防止板を介在させてもよい。For example, the present invention is not limited to manufacturing ingots, but can also be applied to epitaxially growing a thin GaP layer on a substrate. Alternatively, the float 12 may be held or moved by electric or magnetic force. Moreover, the heat sink 10 may be made of materials other than silicon. Alternatively, the growth may continue without providing the lifting device 13 for the float 12 even if it becomes impossible for the float 12 to float on the surface of the Ga solution 3. Furthermore, an anti-adhesion plate other than the graphite plate 10a may be interposed between the heat sink 10 and the seed crystal 2.
第1図は従来のSSD法の装置を示す断面図、第2図は
第1図の装置の温度分布を示す温度分布図、第3図は第
1図の装贋で作った結晶の断面図、第4図は第3図のW
−W線に相当する部分の断面図である。
第5図は従来のSSD法の別の例を説明的に示す温度分
布図である。第6図は本発明の実施例に係わる製造装置
の断面図、第7図は第6図の装直の温度分布図、第8図
は第6図の装直で作った結晶の断面図、第9図は第8図
の瓜−K線に相当する断面図、第10図は第6図の装置
に於けるGa溶液中の位直とGap濃度との関係を示す
グラフである。第11図は第6図の装置に於ける成長時
間の経過と温度勾配の関係を示すグラフ、第12図は第
6図の装置で小径部の大きさを変化させた場合の成長順
位と単結晶粒数との関係を示すグラフである。第13図
は本発明の別の実施例に係わる成長装置の断面図である
。尚図面に用いられている符号に於いて、1はるつぼ、
2は種結晶、3はGa溶液、4は容器、5は赤燐、6は
第1のヒーター、7は第2のヒーター、8はGap膜、
9はGap結晶、10はヒートシンクである。
第1図
第2図
第3図
第4図
第5図
第6図
第7図
第8図
第9図
第12図
第13図
第10図
第11図Figure 1 is a cross-sectional view showing a conventional SSD method equipment, Figure 2 is a temperature distribution diagram showing the temperature distribution of the equipment shown in Figure 1, and Figure 3 is a cross-sectional view of a crystal made by the counterfeiting method shown in Figure 1. , Figure 4 shows W in Figure 3.
It is a sectional view of a portion corresponding to the -W line. FIG. 5 is a temperature distribution diagram illustrating another example of the conventional SSD method. FIG. 6 is a cross-sectional view of a manufacturing apparatus according to an embodiment of the present invention, FIG. 7 is a temperature distribution diagram of the reloading shown in FIG. 6, and FIG. 8 is a cross-sectional view of the crystal made by the reloading of FIG. 6. FIG. 9 is a cross-sectional view corresponding to the line K in FIG. 8, and FIG. 10 is a graph showing the relationship between the orientation and the Gap concentration in the Ga solution in the apparatus of FIG. 6. Fig. 11 is a graph showing the relationship between growth time and temperature gradient in the apparatus shown in Fig. 6, and Fig. 12 is a graph showing the growth order and growth rate when the size of the small diameter section is changed in the apparatus shown in Fig. 6. It is a graph showing the relationship with the number of crystal grains. FIG. 13 is a sectional view of a growth apparatus according to another embodiment of the present invention. In addition, in the symbols used in the drawings, 1 is the crucible,
2 is a seed crystal, 3 is a Ga solution, 4 is a container, 5 is red phosphorus, 6 is a first heater, 7 is a second heater, 8 is a Gap film,
9 is a Gap crystal, and 10 is a heat sink. Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Figure 12 Figure 13 Figure 10 Figure 11
Claims (1)
較的高い蒸気圧を示すPの蒸気を含む雰囲気内に配し、
前記Ga溶液が前記Pの蒸気と接触する部分をGaとP
とから成るGaPの融点よりは低いが比較的高温である
高温部となし、前記Ga溶液の前記高温部から離れた部
分を前記高温部よりも温度が低い低温部となし、前記P
の蒸気圧を前記GaPの分解圧より高くし、前記高温部
にて合成されたGaPを前記Ga溶液中に拡散させて前
記低温部にGaP半導体結晶を成長させる方法に於いて
、前記Ga溶液を入れた前記容器の下部にGaP種結種
を配し、前記GaP種結晶に放熱体を熱的に結合し、前
記Ga溶液と前記Pの蒸気とが反応してGaPが合成さ
れる前記Ga溶液の表面の面積(S_1)と前記低温度
の前記GaP結晶の結晶成長面の面積(S_2)との比
(S_1/S_2)を1/1.7〜1/5とし、前記G
a溶液の表面と前記GaP結晶の結晶成長面との間の平
均温度勾配を15〜40℃/cmとしてGaPの半導体
結晶を成長させることを特徴とするGaP半導体結晶の
成長方法。1. A container containing a Ga solution exhibiting a relatively low vapor pressure is placed in an atmosphere containing P vapor exhibiting a relatively high vapor pressure,
The part where the Ga solution contacts the P vapor is separated by Ga and P.
a high temperature part having a relatively high temperature but lower than the melting point of GaP consisting of; a part of the Ga solution remote from the high temperature part as a low temperature part having a temperature lower than the high temperature part;
In the method of growing a GaP semiconductor crystal in the low temperature region by increasing the vapor pressure of the GaP to a higher temperature than the decomposition pressure of the GaP and diffusing the GaP synthesized in the high temperature region into the Ga solution, the GaP semiconductor crystal is grown in the low temperature region. A GaP seed crystal is placed in the lower part of the container, a heat radiator is thermally coupled to the GaP seed crystal, and the Ga solution and the P vapor react to synthesize GaP. The ratio (S_1/S_2) of the surface area (S_1) to the crystal growth surface area (S_2) of the GaP crystal at the low temperature is set to 1/1.7 to 1/5, and the
A method for growing a GaP semiconductor crystal, the method comprising growing a GaP semiconductor crystal at an average temperature gradient of 15 to 40° C./cm between the surface of the solution and the crystal growth surface of the GaP crystal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11501580A JPS6041040B2 (en) | 1980-08-20 | 1980-08-20 | How to grow gallium phosphide semiconductor crystals |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11501580A JPS6041040B2 (en) | 1980-08-20 | 1980-08-20 | How to grow gallium phosphide semiconductor crystals |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5738400A JPS5738400A (en) | 1982-03-03 |
| JPS6041040B2 true JPS6041040B2 (en) | 1985-09-13 |
Family
ID=14652142
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11501580A Expired JPS6041040B2 (en) | 1980-08-20 | 1980-08-20 | How to grow gallium phosphide semiconductor crystals |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6041040B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0413050Y2 (en) * | 1985-06-03 | 1992-03-27 |
-
1980
- 1980-08-20 JP JP11501580A patent/JPS6041040B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5738400A (en) | 1982-03-03 |
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