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JPS6041416B2 - Processing method of data for deflection yoke magnetic field distribution inspection - Google Patents
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JPS6041416B2 - Processing method of data for deflection yoke magnetic field distribution inspection - Google Patents

Processing method of data for deflection yoke magnetic field distribution inspection

Info

Publication number
JPS6041416B2
JPS6041416B2 JP55028135A JP2813580A JPS6041416B2 JP S6041416 B2 JPS6041416 B2 JP S6041416B2 JP 55028135 A JP55028135 A JP 55028135A JP 2813580 A JP2813580 A JP 2813580A JP S6041416 B2 JPS6041416 B2 JP S6041416B2
Authority
JP
Japan
Prior art keywords
magnetic field
field distribution
deflection yoke
data
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55028135A
Other languages
Japanese (ja)
Other versions
JPS56126230A (en
Inventor
輝 藤井
隆之 西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55028135A priority Critical patent/JPS6041416B2/en
Publication of JPS56126230A publication Critical patent/JPS56126230A/en
Publication of JPS6041416B2 publication Critical patent/JPS6041416B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J9/00Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
    • H01J9/236Manufacture of magnetic deflecting devices for cathode-ray tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2209/00Apparatus and processes for manufacture of discharge tubes
    • H01J2209/236Manufacture of magnetic deflecting devices
    • H01J2209/2363Coils
    • H01J2209/2366Machines therefor, e.g. winding, forming, welding, or the like

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Measuring Magnetic Variables (AREA)
  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
  • Formation Of Various Coating Films On Cathode Ray Tubes And Lamps (AREA)

Description

【発明の詳細な説明】 本発明は、TV用偏向ヨークの主要部品である水平コイ
ル及び垂直コイルの検査に好適なデータ処理方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a data processing method suitable for inspecting horizontal coils and vertical coils, which are the main components of a TV deflection yoke.

カラーVT用偏向ヨークの検査は、主要部品である水平
コイルを組み合わせて完成品で、画像検査方式をとって
いたため、コイル単体の評価法がなくコイルの製造技術
が遅れていた。
Inspection of deflection yokes for color VTs was performed using an image inspection method on the completed product by combining the main components, horizontal coils, and as a result, there was no evaluation method for the coils alone, and coil manufacturing technology was lagging behind.

そこでコイル単体の品質を評価する方法として、磁界分
布の測定を応用した「コイル単体検査法」を開発したが
、いまだ日が浅く実験装置を使って、データ処理に大き
な時間を要している。アナログ・データの処理は、まず
センサの校正あるいは入力回路でハード的に補正する方
法を取るが、センサの数が多い場合、特に磁界測定セン
サのように取付位置および取付角度が出力に大きく影響
するものは、センサ単体での校正法がない。
Therefore, as a method to evaluate the quality of a single coil, we developed a ``single coil inspection method'' that applies the measurement of magnetic field distribution, but it is still in its infancy and requires a large amount of time to process data using experimental equipment. Analog data processing is first done by calibrating the sensor or by making hardware corrections in the input circuit, but when there are a large number of sensors, the mounting position and angle greatly affect the output, especially when it comes to magnetic field measurement sensors. There is no calibration method for the sensor alone.

つまり、磁界測定センサを多数装備した装置で、センサ
の単体校正あるいは入力回路での補正は困難である。回
路上の補正は部品のバラツキ、測定条件(環境を含む)
等が累積される上、何を補正基準にするか、が問題にな
る。従来1個のセンサを平行移動させながら、磁界分布
を測定する方法はあるが、測定点が多くなると時間がか
かり能率が悪い。
In other words, in a device equipped with a large number of magnetic field measurement sensors, it is difficult to calibrate each sensor individually or to correct it using the input circuit. Corrections on the circuit are due to component variations and measurement conditions (including environment)
etc. are accumulated, and it becomes a problem as to what should be used as the correction standard. Conventionally, there is a method of measuring the magnetic field distribution while moving one sensor in parallel, but it takes time and is inefficient when the number of measurement points increases.

また、センサの走行機構に高い精度が要求される。本発
明の目的は、偏向ョ−クコィルの磁界分布を正しく測定
して検査精度の向上をはかってなる偏向ヨーク磁界分布
検査用データの処理方法を提供するものである。
Additionally, high accuracy is required for the sensor's travel mechanism. SUMMARY OF THE INVENTION An object of the present invention is to provide a method for processing data for testing deflection yoke magnetic field distribution, which improves testing accuracy by accurately measuring the magnetic field distribution of a deflection yoke coil.

本発明の要旨は、標準偏向ヨークに対する単一のセンサ
の移動により求められた磁界分布、上記標準偏向ヨーク
に対する上記複数の磁界測定用センサにより求められた
磁界分布との相対関係にもとずし・て、複数個の磁界分
布測定用センサすべてに対して補正係数を設定させてお
き、この補正係数に従って測定値をディジタル的に処理
されている点にある。
The gist of the present invention is based on the relative relationship between the magnetic field distribution determined by moving a single sensor relative to the standard deflection yoke and the magnetic field distribution determined by the plurality of magnetic field measurement sensors relative to the standard deflection yoke. - Correction coefficients are set for all of the plurality of magnetic field distribution measuring sensors, and the measured values are digitally processed in accordance with the correction coefficients.

以下、本発明を図面により詳述する。偏向ヨーク用水平
コイルの検査で相違点は、磁界の方向とコイルに流す電
流値であり、その他異なるところはなく、ここでは実施
例として垂直コイルを取り上げた。
Hereinafter, the present invention will be explained in detail with reference to the drawings. The differences in the inspection of horizontal coils for deflection yokes are the direction of the magnetic field and the value of the current flowing through the coils, and there are no other differences.Here, a vertical coil was taken up as an example.

偏向ヨークの垂直コイルは第1図に示すごとく、フェラ
イトコア2、2Aに巻線された2個のコィレ1,IAで
構成されている。
As shown in FIG. 1, the vertical coil of the deflection yoke is composed of two coils 1 and IA wound around ferrite cores 2 and 2A.

磁界分布の測定点3は第2図および第3図に示すごとく
、コイルの中心軸に直角な断面A,B,C,Dにそれぞ
れ12点A,〜A,2、B〜B2、C,〜C,2、D,
〜D2とし、コイルの内面に沿った円周上に時計の文字
盤のように30度間隔とした。またセンサの検出方向は
全て一方向とした。この測定点に磁界センサを配備した
測定治具を第4図に示す。第5図は本発明の実施例で使
用したコイル単体検査装置である。第4図で、磁界測定
俗臭4は断面A,B,C,Dのそれぞれに12個のセン
サ5,6,7,8を取り付けている。
As shown in Figures 2 and 3, the measurement points 3 for magnetic field distribution are 12 points A, ~A, 2, B~B2, C, and 12 points on cross sections A, B, C, and D perpendicular to the central axis of the coil, respectively. ~C,2,D,
~D2, and the intervals were set at 30 degrees on the circumference along the inner surface of the coil like a clock face. In addition, the detection direction of the sensor was all set to one direction. FIG. 4 shows a measurement jig in which magnetic field sensors are installed at the measurement points. FIG. 5 shows a coil unit inspection device used in an embodiment of the present invention. In FIG. 4, the magnetic field measurement vulgar 4 has 12 sensors 5, 6, 7, and 8 attached to each of the cross sections A, B, C, and D.

各センサ埋込み穴10内に正しい検出精度を得るべく位
置決めされて固定されている。各センサのリード線9は
リード線穴を介して外部に導出している。第5図に示す
コイル単体検査装置は、ベース12、本体13、上下軸
14、位置決め穴15、位置決めピン、プレート17、
押えピン18,18A、位置決めッメ19、ストッパー
20、クランプカム21、ハンドル22、ボルト23、
リード線24、端子箱25、ケーブル26、、測定デー
タを自動処理する制御部27、コイル1,IAに電気を
供給する電源28及び第4図に示した測定治具4とより
成る。
It is positioned and fixed in each sensor embedding hole 10 to obtain correct detection accuracy. Lead wires 9 of each sensor are led out through lead wire holes. The coil unit inspection device shown in FIG. 5 includes a base 12, a main body 13, a vertical shaft 14, a positioning hole 15, a positioning pin, a plate 17,
Holding pins 18, 18A, positioning pin 19, stopper 20, clamp cam 21, handle 22, bolt 23,
It consists of a lead wire 24, a terminal box 25, a cable 26, a control section 27 that automatically processes measurement data, a power source 28 that supplies electricity to the coil 1 and IA, and the measurement jig 4 shown in FIG.

測定用コイルはハンドル22及び位置決めッメ19によ
って位置決めされてクランプカム21上に敦層される。
The measuring coil is positioned by the handle 22 and the positioning knife 19 and placed on the clamp cam 21.

測定時には上下軸14が下方に移動し測定治具4を測定
用コイルに位置決めし、コイル1,IAに電源28から
電気を供給し磁界分布の測定を行う。以上の構成での問
題点は、48個の磁界センサの品質を袷具に取付けられ
た機械的位置精度で特に検出方向に対する角度の傾きが
大きく影響する。
During measurement, the vertical shaft 14 moves downward to position the measuring jig 4 on the measuring coil, and the coil 1 and IA are supplied with electricity from the power source 28 to measure the magnetic field distribution. The problem with the above configuration is that the quality of the 48 magnetic field sensors is greatly affected by the mechanical positional accuracy of the 48 magnetic field sensors attached to the harness, especially by the angle inclination with respect to the detection direction.

そこで、標準となるべき垂直コイルを用いて、上記測定
点を1個の磁界センサで機械的に平行移動させながら測
定したデータと、同一コイルを用いてコイル単体検査装
置で測定した4乳固のデータを比較し、48個の補正係
数を求めた。さらに断面上の対称性をみると同時に、4
つの断面A,B,C,Dのデータを立体的に処理できる
ように孝億して、それぞれの断面の1点を基準点と決め
、この補正係数を“1”とした。実施例は時計の文字盤
と同じ配列で、4つの断面中A,,B,,C,,D,を
基準点とした。次に補正係数の求め方について説明する
Therefore, using a standard vertical coil, the data measured while mechanically moving the measurement points in parallel with one magnetic field sensor, and the data of 4 milk solids measured using the same coil and a single coil inspection device. The data were compared and 48 correction coefficients were determined. Furthermore, while looking at the symmetry on the cross section, 4
In order to be able to three-dimensionally process the data of the three cross sections A, B, C, and D, one point on each cross section was determined as a reference point, and this correction coefficient was set to "1". In this embodiment, the arrangement is the same as that of a clock face, and A, B, C, and D among the four cross sections are used as reference points. Next, how to obtain the correction coefficient will be explained.

先ず、標準となるべき垂直コイルに対して、1個の磁界
センサを用いて48個の各点について磁界分布を求める
。この結果は、次の第1表の如くなる。第1表一方、上
記標準垂直コイルに対して、第5図の測定位置を用いて
4針固のセンサにより48点を測定する。
First, a magnetic field distribution is determined at each of 48 points using one magnetic field sensor for a standard vertical coil. The results are shown in Table 1 below. Table 1 On the other hand, measurements were taken at 48 points on the standard vertical coil using a 4-needle sensor using the measurement positions shown in FIG.

この結果を第2表に示す。第2表 次に、第1表を利用して第2表の を る。The results are shown in Table 2. Table 2 Next, using Table 1, calculate the in Table 2. Ru.

この鮫正万法は、鮫正値を各断面毎にZAi,盃i,Z
Ci,ZDj(但し、i=1,2…・・・12)とする
時、次の計算式により求める。かかる計算式によって求
められた鮫正値を第3表に示す。
This Sameshomanho uses the Samesho value for each cross section as ZAi, Sakazukii, Z
When Ci, ZDj (where i=1, 2...12), it is calculated using the following calculation formula. Table 3 shows the shark positive values determined by this calculation formula.

第3表 次に第3表に得た鮫正値をもとに、測定装置の補正係数
を求める。
Table 3 Next, based on the shark positive values obtained in Table 3, determine the correction coefficient of the measuring device.

この補正係数を各断面毎にRAJ,RBi,RCi,R
Diとすると、次の計算式によって補正係数を求めてい
る。かかる計算式によって得られた補正係数値を第4表
に示す。
This correction coefficient is calculated for each cross section by RAJ, RBi, RCi, R
Assuming Di, the correction coefficient is calculated using the following calculation formula. Table 4 shows the correction coefficient values obtained by this calculation formula.

第4表 以上の第1表〜第4表での各位の単位は、mVである。Table 4 The units in Tables 1 to 4 above are mV.

尚、基準点をA,,B,C,,D,としている故、RA
,=RB,=RC,=RD,=1である。かかる第4表
に示す補正係数を利用することによって、データA,,
B,C,,D.を基準値としたセンサ48個のバラッキ
を補正したデータを得ることができる。コイル単体検査
装置で測定した垂直コイルの磁界分布例を第6図に示す
In addition, since the reference points are A,, B, C,, D, RA
, =RB, =RC, =RD, =1. By using the correction coefficients shown in Table 4, data A,...
B,C,,D. It is possible to obtain data in which the variations of the 48 sensors are corrected using the reference value. Figure 6 shows an example of the magnetic field distribution of a vertical coil measured by a coil unit inspection device.

図中、X軸およびY軸は磁束密度を表し、スケールは中
心に向って高くなり、外側から中央に向って断面A,B
,C,Dの磁界分布を示す。これらのデータを自動処理
するブロック図を第7図に示す。図中、48個のデータ
はアナログマルチブレクサ29に入り、タイミングコン
トローラ3 0により、データA,,A2…・・・、D
,2と順次アンプ31、A/D変換器32に送り込まれ
、次にあらかじめROM33に収納されている補正係数
と対応付けて、補正演算器34に処理される。補正され
たデータはビデオRAM35を介して画像表示器36(
CRTディスプレィ)で図示する。同時に演算器37を
通して磁界分布のアンバランス量を算出し、プリントア
ウトすることもできる。なお、斜線をほどこしたブロッ
クは、マイクロコンピュータで処理する。データ処理回
路は回路部品のバラッキがデータに累積されるようにア
ンプ31、A/○変換器32をそれぞれ1個で構成して
、4針固のデータを同じ条件で処理し、データ処理精度
の向上と回路の簡易化をはかった。尚、上記実施例では
、補正係数をROM33に予じめ格納しておく形式とし
たが、オンライン処理によって格納させることも可能で
ある。
In the figure, the X-axis and Y-axis represent the magnetic flux density, and the scale increases toward the center, and cross sections A and B move from the outside to the center.
, C, and D are shown. A block diagram for automatically processing these data is shown in FIG. In the figure, 48 pieces of data enter the analog multiplexer 29 and are processed by the timing controller 30 as data A,, A2..., D.
, 2 are sequentially sent to the amplifier 31 and the A/D converter 32, and then processed by the correction calculator 34 in association with correction coefficients stored in the ROM 33 in advance. The corrected data is sent via the video RAM 35 to the image display 36 (
(CRT display). At the same time, the unbalance amount of the magnetic field distribution can be calculated through the calculator 37 and printed out. Note that the blocks with diagonal lines are processed by a microcomputer. The data processing circuit consists of one amplifier 31 and one A/○ converter 32 so that the variations in circuit parts are accumulated in the data, and processes the data of four needles under the same conditions, improving the data processing accuracy. Improvements were made and the circuit was simplified. In the above embodiment, the correction coefficients are stored in the ROM 33 in advance, but it is also possible to store them through online processing.

更に基準点をA,,B,,C,,D,としたがこれ以外
に基準点を設定することもできる。磁界センサのように
、磁界の中の検出位置および角度により、出力が大幅に
変化するものはセンサの取扱いと校正が困難である。
Further, although the reference points are A, B, C, D, other reference points may be set. It is difficult to handle and calibrate a sensor, such as a magnetic field sensor, whose output changes significantly depending on the detection position and angle in the magnetic field.

本発明のごとく複数個のセンサを用いて測定する場合、
センサ出力のバラッキ量を回路で個々に補正あるいは調
整しなければならず、基準のとり方および再現性に問題
があった。本発明はこれらの問題を解決し検査精度と信
頼性の向上をはかった。また自動化により検査のスピー
ドアップと量産現場への適用がはかれる。
When measuring using multiple sensors as in the present invention,
The amount of variation in the sensor output must be corrected or adjusted individually using a circuit, which poses problems in how to set standards and in reproducibility. The present invention aims to solve these problems and improve inspection accuracy and reliability. Automation also speeds up inspection and allows for application to mass production sites.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例で対象となった偏向ヨーク用垂
直コイルの斜視図、第2図は垂直コイルの磁界分布測定
点の一例を示す側面図、第3図は垂直コイルの磁界分布
測定点の一例を示す平面図、第4図は実施例の磁界セン
サを埋込んだ測定拾具の断面図、第5図は実施例のコイ
ル単体検査装置の斜視図、第6図は実施例による垂直コ
イル磁界分布図の一例図、第7図は実施例のデータ処理
回路のブロック図である。 1,IA……コイル、2,2A……コア、5,6,7,
8……センサ、33……補正係数ROM、34・・・・
・・補正演算器。 オー斑 オ2斑 ブギ 3 図 オ4図 オS図 オる楓 才7図
Fig. 1 is a perspective view of a vertical coil for a deflection yoke, which is the subject of an embodiment of the present invention, Fig. 2 is a side view showing an example of the magnetic field distribution measurement points of the vertical coil, and Fig. 3 is a magnetic field distribution of the vertical coil. A plan view showing an example of a measurement point, FIG. 4 is a cross-sectional view of a measuring device in which a magnetic field sensor of an embodiment is embedded, FIG. 5 is a perspective view of a single coil inspection device of an embodiment, and FIG. 6 is an embodiment. FIG. 7 is a block diagram of the data processing circuit of the embodiment. 1, IA... Coil, 2, 2A... Core, 5, 6, 7,
8...Sensor, 33...Correction coefficient ROM, 34...
...Correction calculator. Oh Madara O 2 Madara Boogie 3 Figure O 4 Figure O S Figure Oru Kaede Sai Figure 7

Claims (1)

【特許請求の範囲】[Claims] 1 偏向ヨークコイルの磁界分布を測定すく配帯した複
数個の磁界測定用センサより偏向ヨークコイルの磁界分
布を測定し、該測定値をデイジタル的に処理してなる偏
向ヨークコイル磁界分布検査用データの処理方法に於い
て、標準偏向ヨークに対する単一のセンサの移動により
求められた磁界分布と、上記標準偏向ヨークに対する上
記複数個の磁界測定用センサにより求められた磁界分布
との相対関係にもとずいて上記複数個の磁界測定用セン
サのそれぞれについて個有の補正係数を設定しておき、
デイジタル的な処理の際に上記複数個の磁界測定用セン
サからの測定値に上記補正係数により補正を加えてなる
ことを特徴とする偏向ヨーク磁界分布検査用データの処
理方法。
1. Measuring the magnetic field distribution of the deflection yoke coil Deflection yoke coil magnetic field distribution inspection data obtained by measuring the magnetic field distribution of the deflection yoke coil using a plurality of magnetic field measurement sensors arranged around each other, and digitally processing the measured values. In the processing method, the relative relationship between the magnetic field distribution obtained by moving a single sensor relative to the standard deflection yoke and the magnetic field distribution obtained by the plurality of magnetic field measurement sensors relative to the standard deflection yoke is also determined. First, set a unique correction coefficient for each of the plurality of magnetic field measurement sensors mentioned above,
A method of processing data for a deflection yoke magnetic field distribution inspection, comprising: correcting measured values from the plurality of magnetic field measurement sensors using the correction coefficient during digital processing.
JP55028135A 1980-03-07 1980-03-07 Processing method of data for deflection yoke magnetic field distribution inspection Expired JPS6041416B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55028135A JPS6041416B2 (en) 1980-03-07 1980-03-07 Processing method of data for deflection yoke magnetic field distribution inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55028135A JPS6041416B2 (en) 1980-03-07 1980-03-07 Processing method of data for deflection yoke magnetic field distribution inspection

Publications (2)

Publication Number Publication Date
JPS56126230A JPS56126230A (en) 1981-10-03
JPS6041416B2 true JPS6041416B2 (en) 1985-09-17

Family

ID=12240319

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55028135A Expired JPS6041416B2 (en) 1980-03-07 1980-03-07 Processing method of data for deflection yoke magnetic field distribution inspection

Country Status (1)

Country Link
JP (1) JPS6041416B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
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US11131041B2 (en) 2018-01-31 2021-09-28 Japan Matex Co. Ltd. Apparatus for manufacturing open carbon fiber superfine yarn

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6176370U (en) * 1984-10-26 1986-05-22
BG41964A1 (en) * 1985-03-29 1987-09-15 Todorov Device for measuring of magnetic field stress
JPS62195574A (en) * 1986-02-22 1987-08-28 Murata Mfg Co Ltd Magnetic field distribution measuring instrument
JPH0812236B2 (en) * 1987-06-15 1996-02-07 グローリー工業株式会社 Magnetic thin film magnetization characteristic measuring device
JP3098505B2 (en) * 1998-12-22 2000-10-16 相光電子株式会社 Magnetic sensor unit and magnetic field measuring device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11131041B2 (en) 2018-01-31 2021-09-28 Japan Matex Co. Ltd. Apparatus for manufacturing open carbon fiber superfine yarn

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JPS56126230A (en) 1981-10-03

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