Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6043017B2 - semiconductor equipment - Google Patents
[go: Go Back, main page]

JPS6043017B2 - semiconductor equipment - Google Patents

semiconductor equipment

Info

Publication number
JPS6043017B2
JPS6043017B2 JP54110353A JP11035379A JPS6043017B2 JP S6043017 B2 JPS6043017 B2 JP S6043017B2 JP 54110353 A JP54110353 A JP 54110353A JP 11035379 A JP11035379 A JP 11035379A JP S6043017 B2 JPS6043017 B2 JP S6043017B2
Authority
JP
Japan
Prior art keywords
annular
groove
electrode
sealed
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54110353A
Other languages
Japanese (ja)
Other versions
JPS5635442A (en
Inventor
一幸 中嶋
洋一 荒木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP54110353A priority Critical patent/JPS6043017B2/en
Publication of JPS5635442A publication Critical patent/JPS5635442A/en
Publication of JPS6043017B2 publication Critical patent/JPS6043017B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W76/00Containers; Fillings or auxiliary members therefor; Seals
    • H10W76/10Containers or parts thereof
    • H10W76/12Containers or parts thereof characterised by their shape
    • H10W76/13Containers comprising a conductive base serving as an interconnection
    • H10W76/138Containers comprising a conductive base serving as an interconnection having another interconnection being formed by a cover plate parallel to the conductive base, e.g. sandwich type
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings

Landscapes

  • Die Bonding (AREA)

Description

【発明の詳細な説明】 この発明は半導体装置にかゝり、特に大電力用の整流
素子、同トランジスタ等の耐力向上を目的とする。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to semiconductor devices, and particularly aims to improve the durability of high-power rectifying elements, transistors, and the like.

一般に大電力用整流素子や大電力用トランジスタ等の
半導体装置は種々の原因により過剰電流が流れることが
ある。
In general, excessive current may flow in semiconductor devices such as high-power rectifying elements and high-power transistors due to various causes.

上記は一例として逆方向耐圧が劣化した場合などであり
、過剰電流は整流素子の一個所に集中して流れる。か)
る過剰電流を防止するために回路の一部にフェーズ等が
設けられているが、フェーズは作動してもその特性上過
剰電流の瞬時通電を許すことがある。次に半導体整流素
子を示した第1図により説明する。図において1はセラ
ミックスでなる筒体、2、2は前記筒体の両端面に対向
して封着されコバール(商品名)でなる一対の環状蓋体
、3、3は前記筒体と同軸かつ環状蓋体の開孔に挿通し
封着された一対の電極体て、前記筒体、環状蓋体および
電極体とで気密の外囲器が形成され、この内部に電極体
の対向面間に下部電極とは鑞層5にて固着されて挟持さ
れた半導体素子構造体4と、過剰電流による半導体素子
構造体の溶解にともなつてプラズマ状に飛散する溶融金
属による蓋体の破を防護するための遮蔽体6、6’が設
けられている。この遮蔽体はシリコンゴム、テフロン、
ダイフロン(商品名)等の耐熱性にすぐれた合成樹脂板
にて形成され、封止前に密着させておくものである。
上記従来の構造によれば、過剰電流(例えば数1OKA
)が集中することにより半導体素子構造体が溶解しプラ
ズマ状に飛散する。
The above example is a case where the reverse breakdown voltage has deteriorated, and the excess current flows in a concentrated manner at one location of the rectifying element. mosquito)
A phase or the like is provided in a part of the circuit to prevent excessive current, but even if the phase operates, due to its characteristics, it may allow instantaneous excessive current to flow. Next, a description will be given with reference to FIG. 1 showing a semiconductor rectifying element. In the figure, 1 is a cylindrical body made of ceramics, 2, 2 are a pair of annular lids made of Kovar (trade name), which are sealed opposite to both end surfaces of the cylindrical body, and 3, 3 are coaxial with the cylindrical body and A pair of electrode bodies are inserted into the openings of the annular lid body and sealed. The cylinder body, the annular lid body, and the electrode bodies form an airtight envelope, and inside this envelope, there is a space between the opposing surfaces of the electrode bodies. The lower electrode protects the semiconductor element structure 4 that is fixed and sandwiched by the solder layer 5 and the lid from being broken by molten metal that scatters in the form of plasma as the semiconductor element structure melts due to excessive current. A shield 6, 6' is provided for this purpose. This shield is made of silicone rubber, Teflon,
It is made of a synthetic resin plate with excellent heat resistance, such as Daiflon (trade name), and is tightly attached before sealing.
According to the above conventional structure, an excessive current (for example, several 1 OKA
) concentrates, causing the semiconductor element structure to melt and scatter in the form of plasma.

そして遮蔽体6、6’によつて外囲器構造中最も弱い環
状蓋体は相当防護されるが、絶縁性筒体1は飛散部に近
接、対向しているため破損する欠点がある。さらに外囲
器の破損は爆発を伴なうため、回路配線においてこの半
導体装置に隣接して設けられた他の部品まで破損するに
至る。 この発明は上記従来の欠点に対しこれを改良す
るための半導体装置の改良構造を提供するものである。
Although the annular lid, which is the weakest part of the envelope structure, is considerably protected by the shields 6 and 6', the insulating cylinder 1 has the drawback of being damaged because it is close to and facing the scattering part. Furthermore, since damage to the envelope accompanies an explosion, other components provided adjacent to the semiconductor device in the circuit wiring may also be damaged. The present invention provides an improved structure of a semiconductor device to overcome the above-mentioned conventional drawbacks.

この発明は圧接型の半導体装置において、対向する電
極体の間に可滑動に挟持された半導体素子構造体に外囲
しこれを電極体の間に封止する軟質筒状の弾性を有する
絶縁耐熱性封止体が、電極体に接する端面に形成された
少なくとも1の環状の突堤または溝を備えるとともに、
この突堤が接する電極体の表面に突堤または溝と嵌合す
る溝または突堤を備えた構造上の特徴がある。
The present invention relates to a press-contact type semiconductor device, in which a flexible cylindrical insulating heat-resistant material is provided that is surrounded by a semiconductor element structure slidably sandwiched between opposing electrode bodies and sealed between the electrode bodies. The sexual sealing body includes at least one annular protrusion or groove formed on the end surface in contact with the electrode body, and
There is a structural feature in which the surface of the electrode body in contact with this jetty is provided with a groove or a jetty that fits into the jetty or groove.

次にこの発明を一実施例により図面を参照して詳細に説
明する。
Next, the present invention will be explained in detail by way of an embodiment with reference to the drawings.

第2図に断面図によつて圧接型の半導体整流素子を示す
。図において、1はセラミックスの筒体、2,2″は筒
体の両端面に対向して封着されたコバール(商品名)で
一対に形成された環状蓋体、3,13″は筒体と同軸で
環状蓋体の開孔に挿通封着された一対の電極体で、筒体
、環状蓋体および電極体とで気密の外囲器が形成され、
この内部に電極体の対向面間に半導体素子構造体±(力
何滑動に挟持される。次に±uは軟質にて弾性を有する
絶縁耐熱材で形成された封止体で、筒状の軸方向の一部
断面がコ字形で、その内周面16aを半導体素子構造体
の周面に接してこれを定位せしめ、また筒端にフランジ
状に内方へ拡張した端面16b,16b″を夫々が対応
する電極体3,3″に接着して封止する。さらにこの封
止体は封着側電極体13″の外囲器内表面の一部と互い
に溝16cと突堤13aにて対接嵌合する。なお、第3
図には封止体又見に突堤26C1電極体23″に溝23
aを設けた構造を例示する。さらに第4図に第2図にて
示した封止体±1の一部切欠斜視図を示す。この発明に
よれは半導体素子構造体を電極間に圧接のみによつて定
位する圧接型半導体装置の組立工程中の取扱い、組立後
における振動、さらには温度変化(履歴)等にもとづく
半導体素子構造体が軟質弾性を有する封止体の作用によ
り変位せず、したがつてこの変位により生ずる過剰電流
発生、電極間の漏洩ないし短絡等が防止される。
FIG. 2 shows a pressure contact type semiconductor rectifier element in a cross-sectional view. In the figure, 1 is a ceramic cylinder, 2 and 2'' are a pair of annular lids made of Kovar (trade name) sealed opposite to each other on both end surfaces of the cylinder, and 3 and 13 are cylinders. A pair of electrode bodies are coaxially inserted and sealed into the aperture of the annular lid, and the cylinder, the annular lid, and the electrode body form an airtight envelope.
Inside this, a semiconductor element structure ±(force-slidingly) is sandwiched between the opposing surfaces of the electrode body. A part of the cross section in the axial direction is U-shaped, and its inner circumferential surface 16a contacts the circumferential surface of the semiconductor element structure to position it, and the cylindrical end has end surfaces 16b, 16b'' extending inward like a flange. Each of them is adhered and sealed to the corresponding electrode body 3, 3''.Furthermore, this sealing body is opposed to a part of the inner surface of the envelope of the sealed electrode body 13'' through the groove 16c and the jetty 13a. The third
The figure shows a groove 23 in the sealing body and a jetty 26C1 and an electrode body 23''.
A structure in which a is provided is illustrated. Further, FIG. 4 shows a partially cutaway perspective view of the sealing body ±1 shown in FIG. 2. According to the present invention, a semiconductor element structure based on handling during the assembly process of a pressure-contact type semiconductor device in which a semiconductor element structure is orientated only by pressure contact between electrodes, vibration after assembly, and temperature change (history), etc. is not displaced due to the action of the sealing body having soft elasticity, and therefore generation of excessive current, leakage or short circuit between the electrodes, etc. caused by this displacement are prevented.

このため、製品の品質、信頼性の向上が達成されるとと
もに組立が容易となり、製造工程の能率と保留を大幅に
向上する利点がある。次には組立部が封止されるととも
にこの封止体が軟質にして弾性を有し環状突堤との嵌合
により極めて良好な密着度にて電極体との密着が達成さ
れ、環状蓋体が充分保護されるので、きわめて強力なプ
ラズマ状の飛散を生じても環状蓋体やセラミックスの筒
体等の外囲器の耐量が向上する。実際には半導体ペレッ
トの中央部で発生したアークの耐量の方が端縁での発生
より大きい傾向がある。さらには外部からの加圧により
電極体と半導体ペレットを電気的、熱的に接触させてい
るが、この力により封止体と電極間の空隙を閉塞するた
め一層の耐量向上が見込まれる。また、この発明は実施
にあたり半導体装置部品、組立装置、製造工程等の変更
が不要であるとともに封止体も廉価であるなど量産上の
利点もある。なお、この発明は上記実施例に限定される
ものでなく、サイリスタ、大電力用トランジスタ(キヤ
ン封止)など類似の構造体に広く適用できることはいう
までもない。
Therefore, the quality and reliability of the product are improved, and assembly is facilitated, which has the advantage of greatly improving the efficiency and maintenance of the manufacturing process. Next, the assembly part is sealed, and this sealing body is made soft and elastic, and by fitting with the annular jetty, an extremely good adhesion with the electrode body is achieved, and the annular lid body is closed. Since it is sufficiently protected, the withstand capacity of the envelope, such as the annular lid or the ceramic cylinder, is improved even if extremely strong plasma-like scattering occurs. In reality, the arc resistance that occurs at the center of a semiconductor pellet tends to be greater than that at the edges. Furthermore, the electrode body and the semiconductor pellet are brought into electrical and thermal contact by external pressure, and this force closes the gap between the sealing body and the electrode, so it is expected that the durability will be further improved. Furthermore, the present invention has advantages in terms of mass production, such as not requiring any changes in semiconductor device parts, assembly equipment, manufacturing processes, etc., and the sealing body being inexpensive. It goes without saying that the present invention is not limited to the above-mentioned embodiments, but can be widely applied to similar structures such as thyristors and high-power transistors (can-sealed).

図面の簡単な説明第1図は従来の半導体整流素子の断面
図、第2図はこの発明の一実施例の半導体整流素子の断
面図、第3図は別の一実施例を示す断面図、第4図は第
2図における封止体の一部を切欠して示す斜視図である
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a sectional view of a conventional semiconductor rectifying element, FIG. 2 is a sectional view of a semiconductor rectifying element according to an embodiment of the present invention, and FIG. 3 is a sectional view showing another embodiment. 4 is a partially cutaway perspective view of the sealing body in FIG. 2. FIG.

なお、図中同一符号は同一または相当部分を夫々示すも
のとする。
Note that the same reference numerals in the figures indicate the same or corresponding parts, respectively.

1・・・・・・絶縁性筒体、2,2・・・・環状蓋体、
3,13″,23″・・・・電極体、±1・・・・・・
半導体素子構造体、±U,IU゜゜゜゜゜゜封止体、1
6a,26a・・・・・・封止体の内周面、16b,1
6b″,26b,26b″・・・・・・封止体の端面、
16c・・・・・・封止体の環状溝、26c・・・・・
・封止体の環状突堤、13a・・・・・・電極体の環状
突堤、23a・・・電極体の環状溝。
1... Insulating cylindrical body, 2, 2... Annular lid body,
3, 13'', 23''...electrode body, ±1...
Semiconductor element structure, ±U, IU゜゜゜゜゜゜ sealed body, 1
6a, 26a... Inner peripheral surface of sealing body, 16b, 1
6b'', 26b, 26b''... end face of the sealing body,
16c... Annular groove of sealing body, 26c...
- Annular ridge of the sealing body, 13a... Annular ridge of the electrode body, 23a... Annular groove of the electrode body.

Claims (1)

【特許請求の範囲】[Claims] 1 絶縁性筒体と、前記筒体の両面の両端面に対向して
封着された一対の環状蓋体と、前記筒体と同軸に前記環
状蓋体の開孔に押入し封着され表面に環状の溝または突
堤をする一対の電極体よりなる気密の外囲器内にて電極
体の対向面の間に可滑動に挟持された半導体素子溝造体
と、軟質にして弾性を有する絶縁耐熱材にて筒状になり
内周面を前記半導体素子構造体の周面部に接してこれら
を定位するとともに端面部に電極体の前記環状の溝また
は突堤と嵌する突堤または溝を有する封止体とを具備し
たことを特徴とする半導体装置。
1. An insulating cylinder, a pair of annular lids that are sealed opposite to each other on both end surfaces of the cylinder, and a pair of annular lids that are inserted coaxially with the cylinder into an opening in the annular lid and sealed. A semiconductor element groove structure is slidably held between opposing surfaces of the electrode bodies in an airtight envelope consisting of a pair of electrode bodies forming an annular groove or a jetty, and a soft and elastic insulator. A seal made of a heat-resistant material and having a cylindrical shape and having an inner circumferential surface in contact with the circumferential surface of the semiconductor element structure to orient them, and having a protrusion or groove on the end surface that fits into the annular groove or protrusion of the electrode body. A semiconductor device characterized by comprising a body.
JP54110353A 1979-08-31 1979-08-31 semiconductor equipment Expired JPS6043017B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54110353A JPS6043017B2 (en) 1979-08-31 1979-08-31 semiconductor equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54110353A JPS6043017B2 (en) 1979-08-31 1979-08-31 semiconductor equipment

Publications (2)

Publication Number Publication Date
JPS5635442A JPS5635442A (en) 1981-04-08
JPS6043017B2 true JPS6043017B2 (en) 1985-09-26

Family

ID=14533607

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54110353A Expired JPS6043017B2 (en) 1979-08-31 1979-08-31 semiconductor equipment

Country Status (1)

Country Link
JP (1) JPS6043017B2 (en)

Also Published As

Publication number Publication date
JPS5635442A (en) 1981-04-08

Similar Documents

Publication Publication Date Title
CA1152654A (en) Explosion-proof semiconductor device
US2751528A (en) Rectifier cell mounting
US3280389A (en) Freely expanding pressure mounted semiconductor device
US4107727A (en) Resin sealed semiconductor device
JP6427693B2 (en) Semiconductor device
US3601667A (en) A semiconductor device with a heat sink having a foot portion
US3581160A (en) Semiconductor rectifier assembly having high explosion rating
US4150394A (en) Flat package semiconductor device having high explosion preventing capacity
JP7432072B2 (en) power semiconductor devices
EP0194946B1 (en) Pressurized contact type double gate static induction thyristor
US3992717A (en) Housing for a compression bonded encapsulation of a semiconductor device
US2881370A (en) Manufacture of semiconductor devices
US3335336A (en) Glass sealed ceramic housings for semiconductor devices
US3474302A (en) Semiconductor device providing hermetic seal and electrical contact by spring pressure
US4591896A (en) Pressure-contact sealing arrangement for a semiconductor pellet
US3328650A (en) Compression bonded semiconductor device
US3441813A (en) Hermetically encapsulated barrier layer rectifier
JPS6043017B2 (en) semiconductor equipment
US3581163A (en) High-current semiconductor rectifier assemblies
JPS6043016B2 (en) semiconductor equipment
US2661447A (en) Sealed rectifier
US4567504A (en) Semiconductor component with a disc-shaped case
US4692788A (en) Semiconductor device with solder overflow prevention geometry
JPS5943737Y2 (en) semiconductor equipment
US3214624A (en) Lightning arrester