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JPS6046029B2 - thermal head - Google Patents
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JPS6046029B2 - thermal head - Google Patents

thermal head

Info

Publication number
JPS6046029B2
JPS6046029B2 JP53014283A JP1428378A JPS6046029B2 JP S6046029 B2 JPS6046029 B2 JP S6046029B2 JP 53014283 A JP53014283 A JP 53014283A JP 1428378 A JP1428378 A JP 1428378A JP S6046029 B2 JPS6046029 B2 JP S6046029B2
Authority
JP
Japan
Prior art keywords
titanium
boride
thermal head
heating resistor
alloy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53014283A
Other languages
Japanese (ja)
Other versions
JPS54107350A (en
Inventor
晄 新見
利民 原
昌久 福井
義章 白戸
芳興 櫨本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP53014283A priority Critical patent/JPS6046029B2/en
Publication of JPS54107350A publication Critical patent/JPS54107350A/en
Publication of JPS6046029B2 publication Critical patent/JPS6046029B2/en
Expired legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/315Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
    • B41J2/32Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
    • B41J2/335Structure of thermal heads

Landscapes

  • Electronic Switches (AREA)
  • Resistance Heating (AREA)
  • Non-Adjustable Resistors (AREA)

Description

【発明の詳細な説明】 本発明は、サーマルヘッドの発熱抵抗体と、該発熱抵
抗体に電力を供給する電気導体との密着性の良いサーマ
ルヘッドに関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thermal head that has good adhesion between a heating resistor of the thermal head and an electric conductor that supplies power to the heating resistor.

熱印字記録に用いられるサーマルヘッドは例えば、ガ
ラスのような電気的な絶縁性と平滑面とを有する基板上
に複数個の発熱抵抗体と、この発熱抵抗体に電力を供給
するための電気導体とを設け、記録すべき情報に従つて
必要な熱パターンが得られるように、対応する発熱抵抗
体に電気導体を介して電流を流して発熱させ、記録媒体
に接触することにより記録を行なうものである。
A thermal head used for thermal print recording, for example, has a plurality of heating resistors on a substrate with electrical insulation and a smooth surface, such as glass, and an electric conductor for supplying power to the heating resistors. Recording is performed by applying a current to the corresponding heat-generating resistor through an electric conductor to generate heat and contacting the recording medium so as to obtain the necessary thermal pattern according to the information to be recorded. It is.

そこに用いられる発熱抵抗体としては、従来窒化タンタ
ル、ニクロム等の薄膜発熱抵抗体、銀−パラジウム等を
用いた厚膜発熱抵抗体、シリコン半導体を用いた半導体
発熱抵抗体がある。このうち薄膜発熱抵抗体を用いたサ
ーマルヘッドは厚膜発熱抵抗体、半導体発熱抵抗体等と
比較して熱応答性がよく耐熱性、耐熱衝撃性に優れ、寿
命が長く、信頼性が高い等の特徴を有している。この薄
膜発熱抵抗体としては、従来、窒化タンタルが比較的耐
熱性に優れ、信頼性も高く、又、固有抵抗値も250〜
300μΩαと比較的高い値て製造の制御性もよいため
、特に多く用いられている。しかるに、窒化タンタルは
約000゜C以上の高温に対しては急激に酸化されその
抵抗値が急激に増加し、記録紙に印字する場合、印字濃
度を劣化させる欠点がある。一般にはこの欠点を補うた
めに酸化シリコン(SiO2)の耐酸化保護層を設け更
にその上に酸化タンタル(Ta2O5)の耐摩耗層を設
けてサーマルヘッドとして使用しているが、サーマルヘ
ッドを長時間駆動された時の抵抗変化は少くなく、なお
十分満足できるものではなかつた。特に近年高速サーマ
ルヘッドの要求が増加しつつあるためヘッドの通電パル
ス巾を短かくして感熱紙を発色させる必要があり、従つ
て電力は従来より増加することになり、発熱抵抗体はさ
らに高温になるから寿命はより短かくなる。そのため、
さらに耐熱性のある発熱抵抗体が要求されている。本発
明者等は上記欠点を改善するために種々検討した結果、
金属硼化物を主成分とする発熱抵抗体が非常に満足すべ
きものであることを見い出した。
Heat generating resistors used therein include conventional thin film heat generating resistors made of tantalum nitride, nichrome, etc., thick film heat generating resistors using silver-palladium, etc., and semiconductor heat generating resistors using silicon semiconductor. Among these, thermal heads using thin film heating resistors have better thermal response, superior heat resistance and thermal shock resistance, longer lifespan, and higher reliability than thick film heating resistors, semiconductor heating resistors, etc. It has the following characteristics. Conventionally, tantalum nitride has been used as a thin film heating resistor because it has relatively excellent heat resistance, high reliability, and has a specific resistance value of 250~250.
It is particularly widely used because it has a relatively high value of 300 μΩα and has good manufacturing controllability. However, tantalum nitride is rapidly oxidized at high temperatures of about 000° C. or higher, resulting in a rapid increase in its resistance value, which has the disadvantage of deteriorating print density when printing on recording paper. Generally, in order to compensate for this drawback, an oxidation-resistant protective layer of silicon oxide (SiO2) is provided, and then a wear-resistant layer of tantalum oxide (Ta2O5) is provided on top of this to be used as a thermal head. The resistance change when driven was not small and was still not completely satisfactory. In particular, as the demand for high-speed thermal heads has increased in recent years, it is necessary to shorten the energizing pulse width of the head to color the thermal paper, which means that the electric power is higher than before, and the heating resistor becomes even hotter. lifespan becomes shorter. Therefore,
Furthermore, heat-resistant heating resistors are required. As a result of various studies to improve the above drawbacks, the inventors of the present invention found that
It has been found that a heating resistor based on a metal boride is very satisfactory.

この金属硼化物を主成分とする発熱抵抗体は約500℃
の耐熱性を有していて酸化されにくく、抵抗値が安定で
、比抵抗を高い値まで選択できるものである。さらにそ
の製造方法は、従来の窒化タンタル薄膜発熱抵抗体が反
応スパッタリングでしか製造できないのに対して電子ビ
ーム蒸着、スパッタリング、反応スパッタリングのいず
れでも製造することができる。しかしながら、本発明者
等がさらに種々検討した結果、前記硼化物薄膜発熱抵抗
体に電力を供給するための電気導体を蒸着したときに、
その密着性に問題があることが明らかになつた。
This heating resistor mainly composed of metal boride has a temperature of approximately 500°C.
It has high heat resistance, is resistant to oxidation, has a stable resistance value, and can have a specific resistance of up to a high value. Further, as for the manufacturing method thereof, unlike the conventional tantalum nitride thin film heating resistor which can be manufactured only by reactive sputtering, it can be manufactured by any of electron beam evaporation, sputtering, and reactive sputtering. However, as a result of various further studies by the present inventors, when an electric conductor for supplying power to the boride thin film heating resistor was deposited,
It became clear that there was a problem with the adhesion.

すなわち、サーマルヘッドの電気導体としては、一般に
、一定の膜厚に対してその固有抵抗値が低くて、化学的
、熱的に安定性のある金、銀、銅、アルミニウム等の電
気良導体及びそれらの合金が用いられていた。
In other words, the electrical conductor of the thermal head is generally a good electrical conductor such as gold, silver, copper, aluminum, etc., which has a low specific resistance value for a certain film thickness and is chemically and thermally stable. alloy was used.

これらの電気良導体のうち、銅、アルミニウム及びそれ
らの合金は一般に強固な密着力をもつているが、金、銀
については密着性が悪いため、下引層としてクロムまた
は二,クロム等の薄膜を設けることにより密着力を向上
させていた。しかしながら、金属硼化物を主成分とする
発熱抵抗体に対しては前記の下引層も効果が十分でない
ことが判つた。本発明は、抵抗値が安定で比抵抗を高い
値まで=選択でき、さらに安定性と信頼性に優れ、経時
的に安定した優れた画像を与えるサーマルヘッドを提供
することを目的とし、その特徴とするところは、金属硼
化物を主成分とする発熱抵抗体と電力供給用の電気導体
との間にチタン層またはチタンニを主成分とする合金層
を設けたことにある。
Among these electrically conductive materials, copper, aluminum, and their alloys generally have strong adhesion, but gold and silver have poor adhesion, so a thin film of chromium or dichromium is used as an undercoat layer. By providing this, the adhesion was improved. However, it has been found that the above-mentioned undercoat layer is not sufficiently effective for heating resistors whose main component is metal boride. An object of the present invention is to provide a thermal head that has a stable resistance value, can select a specific resistance up to a high value, has excellent stability and reliability, and provides excellent images that are stable over time. This is because a titanium layer or an alloy layer mainly composed of titanium is provided between the heating resistor mainly composed of metal boride and the electrical conductor for power supply.

本発明に適用する金属硼化物には、硼化ジルコニウム、
硼化ハフニウム、硼化ランタン、硼化クロム、硼化チタ
ン、硼化タンタル、硼化ニオブ、硼化タングステン、硼
化モリブデン、硼化バナジ弓ウム等がある。薄膜発熱抵
抗体としてこれらの金属硼化物を単独あるいは2種以上
混合したりする。さらに酸素、炭素、窒素を発熱抵抗体
中の金属総量に対して原子比で0.005〜1.0程度
含有させても良い。あるいは、金属硼化物にSi..G
elTi..Zr..Hf..V..Nb..Ta,.
Cr..MO,.W..CulAg..Au..La.
.Ga,.Sm,.Mn,.Fe..CO..NilP
t..Rh..Pd,,Os,.Ir..Ruなどの金
属を0.5m01%〜50r1101%加えてもよい。
また、金属硼化物にMOSl2、WSl2、VSi2、
NbSj2、TaSj2、Crsi2、NrSi2、T
iSi2、Cr3Sj,.Fe3Sjなどの導電性硅化
物を1m01%〜40n101%加えてもよい。チタン
層またはチタンを主成分とする合金層の厚さは余り薄い
と密着性に効果が不十分でなく一方余り厚くしても密着
性の効果が飽和してしまい、好ましくは5A〜1000
Aがよく、より好ましくは10A〜500Aさらに好ま
しくは20A〜300Aがよい、ここでチタンとの合金
を作る金属としては7A1、Au..CuNAg..Z
r..Hf..Nb,.V..Ta..CrlMO、W
等が適用される。これらのチタン層またはチタンを主成
分とする合金層は抵抗加熱蒸着法、電子ビーム蒸着法、
スパッタリング法、等により、作製することができる。
上述のようにして構成したサーマルヘッドは比抵抗を高
い値まで選択でき、印字の高速化の為に短いパルス内で
大きな電流を流すことにも耐えられる。
Metal borides applicable to the present invention include zirconium boride,
Examples include hafnium boride, lanthanum boride, chromium boride, titanium boride, tantalum boride, niobium boride, tungsten boride, molybdenum boride, and vanadium boride. These metal borides may be used alone or as a mixture of two or more of these metal borides as a thin film heating resistor. Further, oxygen, carbon, and nitrogen may be contained in an atomic ratio of about 0.005 to 1.0 with respect to the total amount of metal in the heating resistor. Alternatively, Si. .. G
elTi. .. Zr. .. Hf. .. V. .. Nb. .. Ta...
Cr. .. MO,. W. .. CulAg. .. Au. .. La.
.. Ga,. Sm,. Mn,. Fe. .. C.O. .. NilP
t. .. Rh. .. Pd,,Os,. Ir. .. A metal such as Ru may be added in an amount of 0.5m01% to 50m1101%.
In addition, metal borides include MOSl2, WSl2, VSi2,
NbSj2, TaSj2, Crsi2, NrSi2, T
iSi2, Cr3Sj, . A conductive silicide such as Fe3Sj may be added in an amount of 1m01% to 40n101%. If the thickness of the titanium layer or the alloy layer containing titanium as a main component is too thin, the adhesion effect will not be sufficient, and if it is too thick, the adhesion effect will be saturated, so it is preferably 5A to 1000.
A is good, more preferably 10A to 500A, and even more preferably 20A to 300A.The metals forming an alloy with titanium include 7A1, Au. .. CuNAg. .. Z
r. .. Hf. .. Nb,. V. .. Ta. .. CrlMO,W
etc. apply. These titanium layers or titanium-based alloy layers can be formed by resistance heating evaporation, electron beam evaporation,
It can be manufactured by a sputtering method or the like.
The thermal head configured as described above can select a specific resistance up to a high value, and can withstand the flow of a large current within a short pulse in order to speed up printing.

また、ヘッド部、配線部の密着性が良いので耐熱性に優
れ、また、繰り返しパルスの印加に対しても長時間安定
てある。その製造方法も、特殊なものに限定する必要が
なく、抵抗加熱蒸着法、電子ビーム蒸着法、スパッタリ
ング法などいずれでも適用することができる。さらに、
このサーマルヘッドを用いて印字したときには経時的に
も安定した画像を提供することができる。次に実施例に
ついて説明する。
Furthermore, since the adhesion between the head portion and the wiring portion is good, it has excellent heat resistance and is stable for a long period of time even when repeated pulses are applied. There is no need to limit the manufacturing method to a special method, and any method such as resistance heating evaporation method, electron beam evaporation method, sputtering method, etc. can be applied. moreover,
When printing using this thermal head, it is possible to provide an image that is stable over time. Next, an example will be described.

実施例1 十分に洗浄した、グレーズド・セラミックス基板上に硼
化チタン(Ti式)、硼化ジルコニウム(ZrB2)、
硼化ハフニウム(HfB2)、硼化バナジウム(VB2
)、硼化ニオブ(NbB2)、硼化タンタル(TaB,
)、硼化クロム(CrB2)、硼化モリブデン(MOB
)、硼化タングステン(WBI:.WB2の混合物)、
硼化ランタン(LlB6)をターゲットとして2x10
−2T0rrのアルゴン分圧でスパッターにて、それぞ
れ1000Aの膜厚をつけた。
Example 1 Titanium boride (Ti type), zirconium boride (ZrB2),
Hafnium boride (HfB2), vanadium boride (VB2)
), niobium boride (NbB2), tantalum boride (TaB,
), chromium boride (CrB2), molybdenum boride (MOB
), tungsten boride (WBI: mixture of .WB2),
2x10 targeting lanthanum boride (LlB6)
A film thickness of 1000 A was formed on each film by sputtering at an argon partial pressure of -2T0rr.

これらの金属硼化物薄膜と電気導体(金、銀、銅、アル
ミニウムの4種類)との密着性を測定する為に、両者の
間に下引層を設けた場合と設けない場合との試料を作成
した。下引層としては100A〜200A厚のクロム層
、ニクロム層、チタン層の3種類をそれぞれ5×10−
6T0rrの真空度で電子ビーム蒸着法、で層形成した
。これらの各々について金、銀、銅、アルミニウムの電
気導体層を5000Aの厚さに電子ビーム蒸着法により
積層した。上記試料を密着性のテストとしてイソプロピ
ルアルコール中で1紛間超音波洗浄テストを行ないその
時の電気良導体のはがれを調べた。
In order to measure the adhesion between these metal boride thin films and electrical conductors (gold, silver, copper, and aluminum), samples were prepared with and without an undercoat layer between them. Created. The undercoat layer consists of three types of chromium layer, nichrome layer, and titanium layer each having a thickness of 100A to 200A at 5×10−
The layer was formed by electron beam evaporation at a vacuum level of 6T0rr. For each of these, electrical conductor layers of gold, silver, copper, and aluminum were laminated to a thickness of 5000 Å by electron beam evaporation. As a test for adhesion, the sample was subjected to a one-part ultrasonic cleaning test in isopropyl alcohol, and peeling of the electrically conductive material was examined.

その結果を表1に示す硼化物に金、銀、を直接蒸着した
試料は金、銀が完全にはがれてしまい。銅、アルミニウ
ムの場合には極部的にはがれがみられた。密着性を向上
させるためのクロム、ニクロム、チタンを蒸着させた試
料についてはクロム、ニクロムについては金、銀の電気
良導体が一部はがれていた。表1の結果から明らかなよ
うにクロム、ニクロム、チタンを設けることにより、密
着性は非常に向上するが、特にチタンについてはその密
着性は非常に改善されることが明らかである。
The results are shown in Table 1. In the samples in which gold and silver were directly deposited on boride, the gold and silver were completely peeled off. In the case of copper and aluminum, peeling was observed in some areas. Samples in which chromium, nichrome, and titanium were vapor-deposited to improve adhesion showed that the chromium, and the gold and silver electrical conductors of nichrome, were partially peeled off. As is clear from the results in Table 1, the adhesion is greatly improved by providing chromium, nichrome, and titanium, and it is clear that the adhesion of titanium in particular is greatly improved.

実施例2 実施例1て作製した試料と同じものを熱的安定性をテス
トするために450′CX5時間熱処理を行ない、その
熱処理前後の電気抵抗値を調べた。
Example 2 The same sample as prepared in Example 1 was heat treated at 450'CX for 5 hours to test its thermal stability, and the electrical resistance values before and after the heat treatment were examined.

表■、に熱処理前後の抵抗値の変化量を示す。表■、か
ら明らかなようにチタンは熱処理による抵抗変化は、非
常に少ない安定した、ものであることは明らかである。
金、銀については下引層がないと硼化物との密着性が悪
くなり、膜のはがれにより、接触不良となる。
Table 3 shows the amount of change in resistance before and after heat treatment. As is clear from Table 1, it is clear that titanium exhibits very little resistance change due to heat treatment and is stable.
For gold and silver, if there is no subbing layer, the adhesion with the boride will be poor, and the film will peel off, resulting in poor contact.

クロム、ニクロムは熱処理前後の観察結果、硼化物との
反応が激しくあり、硼化物薄膜と電気良導体との接触を
悪くするようである。実施例3実施例1、2のチタン層
に代えて、チタン合金層として、(1)チタンとアルミ
ニウムの重量比で9:1の合金(2)チタンと金の重量
比で9:1の合金(3)チタンと銅の重量比で9:1の
合金゛(4)チタンと銀の重量比で9:1の合金(5)
チタンとジルニウムの重量比で8:2の合金(6)チタ
ンとハフニウムの重量比で8:2の合金(7)チタンと
ニオブの重量比で8:2の合金(8)チタンとバナジウ
ムの重量比で8:2の合金J(9)チタンとタンタルの
重量比で8:2の合金(10チタンとクロムの重量比で
8:2の合金(11)チタンとモリブデンの重量比で8
:2の合金(12)チタンとタングステンの重量比で8
:2のノ 合金(13)チタンとランタンの重量比で8
:2の合金をそれぞれ電子ビーム蒸着法で作成して同様
の測定をしたところ、ほぼ同様な結果が得られた。
Observations of chromium and nichrome before and after heat treatment indicate that they react violently with boride, which seems to impair the contact between the boride thin film and the electrically conductive material. Example 3 In place of the titanium layer in Examples 1 and 2, a titanium alloy layer was used: (1) an alloy with a weight ratio of titanium and aluminum of 9:1 (2) an alloy with a weight ratio of titanium and gold of 9:1 (3) An alloy with a weight ratio of titanium and copper of 9:1 (4) An alloy with a weight ratio of titanium and silver of 9:1 (5)
An alloy with a weight ratio of titanium and zirnium of 8:2 (6) an alloy with a weight ratio of titanium and hafnium of 8:2 (7) an alloy with a weight ratio of titanium and niobium of 8:2 (8) an alloy with a weight ratio of titanium and vanadium Alloy J with a weight ratio of titanium to tantalum of 8:2 (10) Alloy with a weight ratio of titanium to chromium of 8:2 (11) Titanium to molybdenum weight ratio of 8
:2 alloy (12) Weight ratio of titanium and tungsten is 8
:2 No Alloy (13) Weight ratio of titanium and lanthanum is 8
:2 alloys were prepared by electron beam evaporation and similar measurements were performed, and almost the same results were obtained.

Claims (1)

【特許請求の範囲】 1 基板と、該基板上に形成された発熱抵抗体と、該発
熱抵抗体に電力を供給する電気導体とを有するサーマル
ヘッドにおいて、前記発熱抵抗体が金属硼化物を主成分
とし、前記発熱抵抗体と電気導体との間に、チタン層ま
たはチタンを主成分とする合金層を設けたことを特徴と
するサーマルヘッド。 2 チタン層またはチタンを主成分とする合金層の厚さ
が5Å〜1000Åである特許請求の範囲第1項記載の
サーマルヘッド。
[Scope of Claims] 1. A thermal head having a substrate, a heating resistor formed on the substrate, and an electric conductor for supplying power to the heating resistor, wherein the heating resistor is mainly made of metal boride. 1. A thermal head characterized in that a titanium layer or an alloy layer containing titanium as a main component is provided between the heating resistor and the electric conductor. 2. The thermal head according to claim 1, wherein the titanium layer or the titanium-based alloy layer has a thickness of 5 Å to 1000 Å.
JP53014283A 1978-02-10 1978-02-10 thermal head Expired JPS6046029B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP53014283A JPS6046029B2 (en) 1978-02-10 1978-02-10 thermal head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP53014283A JPS6046029B2 (en) 1978-02-10 1978-02-10 thermal head

Publications (2)

Publication Number Publication Date
JPS54107350A JPS54107350A (en) 1979-08-23
JPS6046029B2 true JPS6046029B2 (en) 1985-10-14

Family

ID=11856754

Family Applications (1)

Application Number Title Priority Date Filing Date
JP53014283A Expired JPS6046029B2 (en) 1978-02-10 1978-02-10 thermal head

Country Status (1)

Country Link
JP (1) JPS6046029B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11953248B2 (en) 2019-04-19 2024-04-09 Daikin Industries, Ltd. Refrigerant management system and refrigerant management method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4638191B2 (en) * 2004-08-25 2011-02-23 京セラ株式会社 Thermal head inspection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11953248B2 (en) 2019-04-19 2024-04-09 Daikin Industries, Ltd. Refrigerant management system and refrigerant management method

Also Published As

Publication number Publication date
JPS54107350A (en) 1979-08-23

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