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JPS6052404B2 - automatic focus adjustment device - Google Patents
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JPS6052404B2 - automatic focus adjustment device - Google Patents

automatic focus adjustment device

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Publication number
JPS6052404B2
JPS6052404B2 JP7081775A JP7081775A JPS6052404B2 JP S6052404 B2 JPS6052404 B2 JP S6052404B2 JP 7081775 A JP7081775 A JP 7081775A JP 7081775 A JP7081775 A JP 7081775A JP S6052404 B2 JPS6052404 B2 JP S6052404B2
Authority
JP
Japan
Prior art keywords
focal position
image
optical
objective lens
differential value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP7081775A
Other languages
Japanese (ja)
Other versions
JPS51147336A (en
Inventor
隆一 鈴木
真司 山本
秀樹 河野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP7081775A priority Critical patent/JPS6052404B2/en
Publication of JPS51147336A publication Critical patent/JPS51147336A/en
Publication of JPS6052404B2 publication Critical patent/JPS6052404B2/en
Expired legal-status Critical Current

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  • Focusing (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は顕微鏡の自動焦点調節装置に関する。[Detailed description of the invention] [Field of application of the invention] The present invention relates to an automatic focus adjustment device for a microscope.

〔発明の背景〕顕微鏡の焦点調節は、試料(被写体)と
対物レンズ間の光路長を一定に保つことによりおこなわ
れている。
[Background of the Invention] Focus adjustment of a microscope is performed by keeping the optical path length between the sample (subject) and the objective lens constant.

この光路長の変動が顕微鏡像の焦点ずれの生じる理由で
あり、この値が対物レンズの焦点深度(対物レンズの倍
率と開口数により定まり、2皓ては通常±1.7μm程
度)以上になると焦点ずれの状態となる。焦点ずれの像
と焦点の合つている像の差は、像の濃度、一次微分に顕
著に表われることが一般に知られている。第1図は、横
軸に光路長の変位、縦軸に一次微分値(絶対値)を取つ
てこの関係の例を示したものであり、焦点の合つた位置
で微分値が最大となり、焦点がずれるにしたがつて徐々
に減少する。したがつて、この微分値を像の焦点の度合
を示す信号として有効に用いることができる。なお焦点
の度合を示す信号としては、上述した像の濃度を用いる
こともできるが、ここでは微分値を用いた場合を例に説
明する。顕微鏡の自動焦点調節は、今述べた微分値の最
大値を山登ほり法と呼ばれる方法を用いて検出しておこ
なわれている。
This variation in optical path length is the reason why the microscope image is out of focus, and if this value exceeds the depth of focus of the objective lens (determined by the magnification and numerical aperture of the objective lens, which is usually about ±1.7 μm) The image becomes out of focus. It is generally known that the difference between an out-of-focus image and an in-focus image is noticeable in the density and first derivative of the image. Figure 1 shows an example of this relationship, with the horizontal axis representing the displacement of the optical path length and the vertical axis representing the first-order differential value (absolute value). gradually decreases as the value shifts. Therefore, this differential value can be effectively used as a signal indicating the degree of focus of the image. Although the above-mentioned image density can be used as the signal indicating the degree of focus, an example in which a differential value is used will be explained here. Automatic focus adjustment of a microscope is performed by detecting the maximum value of the differential value just mentioned using a method called the mountain climbing method.

これは、試料と対物レンズ間の光路長を微分値の大きく
なる方向にd(焦点深度以上)ずつ変化させ(ステージ
上下、鏡筒上下、対物レンズ上下などの方法があるが、
ここではステージ上下を例に以後述べる)、光路長Dl
D−D..D+dの微分値V。..VO−D..VO+
dが次の関係を満たす位置を求める方法である。IVO
l>1V0−dlかつIVDI>VO+DIこの方法を
用いると、焦点が合つていることを確かめるだけだも3
回のステージ移動をおこなう必要があり、撮像系の残像
およびステージの振動による画像の劣化を除くためには
長い時間が自動一焦点調節に、必要となる。〔発明の目
的〕 本発明は、上記自動焦点調節の持つ欠点を除き、高速な
顕微鏡用自動焦点調節装置を提供するものである。
This is done by changing the optical path length between the sample and the objective lens in steps of d (more than the depth of focus) in the direction of increasing the differential value (there are methods such as moving the stage up and down, the lens barrel up and down, and the objective lens up and down, etc.)
Here, we will discuss the upper and lower stages as an example), the optical path length Dl
D-D. .. Differential value V of D+d. .. .. VO-D. .. VO+
This is a method of finding a position where d satisfies the following relationship. IVO
l>1V0-dl and IVDI>VO+DI Using this method, all you have to do is make sure it's in focus.3
It is necessary to move the stage several times, and a long time is required for automatic single focus adjustment in order to eliminate image deterioration due to afterimages in the imaging system and vibrations of the stage. [Object of the Invention] The present invention provides a high-speed automatic focus adjustment device for a microscope, which eliminates the drawbacks of the above-mentioned automatic focus adjustment.

〔発明の概要〕 まず、本発明の基礎となる光学系の性質について述べる
[Summary of the Invention] First, the properties of the optical system that forms the basis of the present invention will be described.

顕微鏡は対物レンズと接眼レンズから構成されており、
撮像系の撮像面に試料の像が結ばれるときに焦点が合つ
た状態となる。いま、対物レンズと試料の光路長が+d
だけ長くなつたとすると、接眼レンズの像はΔKだけ接
眼レンズに近づく。一般に倍率Mのレンズで被写体が微
少値”Δaだけ移動したとすると、像の位置はΔAM2
だけ変化する。したがつて対物レンズ、接眼レンズの倍
率をそれぞれM,nとするとΔK=Dm2n2となり、
ΔKは極めて大きな値となり総合倍率が無視出来ないほ
ど変わる。ここで、接眼レンズをΔLだけ移動し、撮像
面を固定にする方法を取ると、ΔL≧Dm2となり総合
倍率の変化もあまりない。(d=5μ、m=2へn=1
0として総合倍率の変動は1%以下、ΔL〉2wR)つ
まり、この方法を用いれば焦点がdだけずれた像を取り
入れることができる。すなわち、本来焦点ずれの像を焦
点の合つた像として取らえられるわけである。
A microscope consists of an objective lens and an eyepiece.
When the image of the sample is formed on the imaging surface of the imaging system, it is in focus. Now, the optical path length between the objective lens and the sample is +d
, the image of the eyepiece approaches the eyepiece by ΔK. Generally, if the subject moves by a minute value "Δa" with a lens of magnification M, the position of the image will be ΔAM2
only changes. Therefore, if the magnifications of the objective lens and eyepiece are M and n, respectively, ΔK=Dm2n2,
ΔK becomes an extremely large value, and the total magnification changes so much that it cannot be ignored. Here, if a method is adopted in which the eyepiece is moved by ΔL and the imaging surface is fixed, ΔL≧Dm2 and the total magnification does not change much. (d=5μ, n=1 to m=2
0, the variation in total magnification is 1% or less, ΔL>2wR) In other words, if this method is used, it is possible to take in an image whose focus is shifted by d. In other words, an image that is originally out of focus can be captured as an in-focus image.

そこで、対物レンズから光を三等分し、接眼レンズまで
の光路長をL−ΔL.,L,L+ΔLとなるよう等倍率
の接眼レンズを配置し、各々に撮像系を置けば、各撮像
系は対物レンズと試料の光路長がD+d(後焦点位置)
、D(合焦点)、D−d(前焦点位置)の像を結んでい
ることになる。
Therefore, the light from the objective lens is divided into three equal parts, and the optical path length to the eyepiece is L-ΔL. , L, L + ΔL, and if an imaging system is placed in each, each imaging system will have an optical path length of D + d (back focal position) between the objective lens and the sample.
, D (focus point), and D-d (front focus position) are formed.

この場合、先に述べたようにdとΔLの関係は対物レン
ズ、接眼レンズの倍率で決まり、たとえば、各々を20
f8、1@としたとき、d=5μmとすればΔL5−2
7!r!nである。したがつて、これらの像を比較すれ
ばステージの移動なしに焦点のずれ具合がわかる。つま
り接眼レンズまでの光路長がL一ΔL,.L..L+Δ
Lの像の微分値をそれぞれVし−△いVL〜VL+Δし
で示すと〜1,−Δ,くVLくぃΔ,のとき、接眼レン
ズまでの光路長がより長い光学系に焦点が合つている。
In this case, as mentioned earlier, the relationship between d and ΔL is determined by the magnification of the objective lens and the eyepiece lens.
When f8, 1@, if d=5μm, ΔL5-2
7! r! It is n. Therefore, by comparing these images, the degree of focus shift can be determined without moving the stage. In other words, the optical path length to the eyepiece is L - ΔL, . L. .. L+Δ
The differential value of the image of L is expressed as V - △ VL ~ VL + Δ, respectively. When 1, - Δ, and VL + Δ, the focus is on the optical system with a longer optical path to the eyepiece. It's on.

すなわち−d方向の焦点ずれ、2VL−Δ,くL,,〉
VL+Δ,のとき、接眼レンズまでの光路長がLの光学
系に焦点があつている。
That is, the focal shift in the -d direction, 2VL-Δ, kuL,,〉
When VL+Δ, the optical system whose optical path length to the eyepiece is L is in focus.

3VL−Δし〉Vし〉VL+△しのとき、接眼レンズま
での光路長がより短い光学系に焦点があつている、すな
わち+d方向の焦点ずれ、と判定できる。
When 3VL-Δ>V>VL+Δ, it can be determined that the optical system with the shorter optical path length to the eyepiece is in focus, that is, there is a defocus in the +d direction.

したがつて、上記1)の場合は試料と対物レンズから一
定距離だけ遠ざけ、3)の場合は試料を対物レンズに一
定距離だけ近づけ、上記2)の状態になるまでこれをく
り返すことにより光路長Lの接眼レンズを介する撮像系
に焦点のあつた像を得ることができる。
Therefore, in case 1) above, move the sample a certain distance away from the objective lens, and in case 3) bring the sample a certain distance closer to the objective lens, and repeat this until the state 2) above is achieved. A focused image can be obtained in the imaging system via the long L eyepiece.

この調節動作は顕微鏡の視野を移動するごとに行なわれ
るが、各視野における最初の判定で2)の状態であれば
試料ステージの上下方向の移動を行なう必要がなく、焦
点調節を最少のステージ移動で実現できる。また、いま
述べたことと同様な効果は、焦点距離の異なる三つの接
眼レンズを適当な位置におくことによつても実現できる
This adjustment operation is performed each time the field of view of the microscope is moved, but if the first judgment in each field is in condition 2), there is no need to move the sample stage up and down, and focus adjustment can be performed with the minimum stage movement. This can be achieved with The same effect as just described can also be achieved by placing three eyepiece lenses with different focal lengths at appropriate positions.

たとえば、対物レンズから接眼レンズまでの距離が一定
な位置に三つの接眼レンズを配置し、D−D..D..
D+dの像を撮像面に結ぶような焦点距離を持つ三種類
の接眼レンズを用いればよい。このようなレンズは、簡
単に作成することができる。〔発明の実施例〕 次に、本発明の実施例を光路長の異なる3種類の接眼レ
ンズを有する方式について述べる。
For example, three eyepieces are placed at positions where the distance from the objective lens to the eyepiece is constant, and D-D. .. D. ..
Three types of eyepieces having focal lengths that focus an image of D+d on the imaging surface may be used. Such lenses can be easily created. [Embodiments of the Invention] Next, an embodiment of the present invention will be described regarding a system having three types of eyepiece lenses having different optical path lengths.

第2図は本発明による装置のプロツク図を示したもので
ある。光源1で照射されたステージ2上の試料3を顕微
鏡4で拡大し、接眼鏡筒6て光を3等分する。これは、
ハーフミラ等を用いて容易に実現でき、対物レンズ5か
らの光路長がL−ΔLlL..L+ΔLとなるように同
倍率の接眼レンズ7,8,9を置き、この像を撮像装置
、(たとえば、Tカメラ)10,11,12で撮像する
。この撮像動作は同期信号発生回路18からの同期信号
により行なわれる。すなわち、ステージ駆動回路17に
よりステージ2を横方向に移動し、視野の変更が完了し
た後に撮像装置10,11,12に同期信号が発せられ
、三種類の像の撮像が行なわれる。各々の画像信号は微
分回路13,14,15で微分される。比較器16では
微分回路13,14,15のそれぞれの出力のピーク値
し一ΔぃぃVし+ΔLを保持する。さらに各像の撮像が
完了した時点で同期信号発生回路18から発せられるタ
イミング信号により、上記ピーク値Vし一Δし、Vし、
VL+Δしの大小比較が行なわれるとともに、保持され
たピーク値はりセツトされる。大小比較の結果、Vし一
ΔしくVし〈VL+Δ,のときは接眼レンズまでの光路
長がより長い光学系に焦点があつている。すなわち−d
方向の焦点ずれであることを比較器16の出力は示して
おり、同期信号発生回路18からステージ駆動回路17
にタイミング信号が発せられるとステージ駆動回路17
は上記比較回路16の出力に応動してステージ2を対物
レンズ5から一定距離だけ遠ざける。VL−Δ,〉VL
〉ぃΔ,のときは接眼レンズまでの光路長がより短かい
顕微鏡について、焦点があつている。すなわち+d方向
の焦点ずれであることを比較器16の出力は示しており
、同期信号発生回路18からステージ駆動回路17にタ
イミング信号が発せられるとステージ駆動回路はステー
ジ2を対物レンズに一定距離だけ近づける。このような
制御により上下方向のステージ移動が完了した時点で同
期信号発生回路18から撮像装置10,11,12に再
び同期信号が発せられ、Vし一Δしくし〉VL+ΔLが
満たされるまで上述の操作が繰り返される。以上述べた
のは、三系統の撮像装置を用いた自動焦点調節について
である。
FIG. 2 shows a block diagram of a device according to the invention. A sample 3 on a stage 2 illuminated by a light source 1 is magnified by a microscope 4, and the light is divided into three equal parts by an eyepiece tube 6. this is,
This can be easily realized using a half mirror or the like, and the optical path length from the objective lens 5 is L-ΔLlL. .. Eyepiece lenses 7, 8, and 9 having the same magnification are placed so that L+ΔL, and the images are captured by imaging devices (eg, T cameras) 10, 11, and 12. This imaging operation is performed by a synchronizing signal from the synchronizing signal generating circuit 18. That is, after the stage 2 is moved laterally by the stage drive circuit 17 and the field of view has been changed, a synchronization signal is issued to the imaging devices 10, 11, and 12, and three types of images are captured. Each image signal is differentiated by differentiating circuits 13, 14, and 15. The comparator 16 holds the peak values of the outputs of the differentiating circuits 13, 14, and 15 as +ΔL. Furthermore, at the time when the imaging of each image is completed, the timing signal issued from the synchronization signal generation circuit 18 causes the peak value V to be increased by 1Δ, then V to be increased,
A comparison is made between VL+Δ and the peak value held is reset. As a result of the size comparison, when V is less than Δ and V is <VL+Δ, the focus is on the optical system with a longer optical path length to the eyepiece. i.e. -d
The output of the comparator 16 indicates that there is a focus shift in the direction, and the synchronization signal generation circuit 18 to the stage drive circuit 17
When a timing signal is issued to the stage drive circuit 17
moves the stage 2 away from the objective lens 5 by a certain distance in response to the output of the comparison circuit 16. VL−Δ,〉VL
〉ぃ∆, the microscope has a shorter optical path length to the eyepiece and is in focus. In other words, the output of the comparator 16 indicates that there is a focus shift in the +d direction, and when a timing signal is issued from the synchronization signal generation circuit 18 to the stage drive circuit 17, the stage drive circuit moves the stage 2 to the objective lens by a certain distance. Bring it closer. When the stage movement in the vertical direction is completed by such control, a synchronization signal is issued again from the synchronization signal generation circuit 18 to the imaging devices 10, 11, and 12, and the above-mentioned synchronization is performed until V + - Δ > VL + ΔL is satisfied. The operation is repeated. What has been described above is automatic focus adjustment using three systems of imaging devices.

しかし、焦点ずれの像(光路長L±ΔL)を取るために
二系統の撮像装置を用いるのは必ずしも得策ではない。
そこで、第3図に示したように光路長Lの画像と画像の
半分が光路長L+ΔL1他の半分が光路長L−ΔLの画
像とが得られたとすれば、画像の半分を用いて各光路長
の画像の比較をおこなうことができ、実質的に三系統を
用いた場合と同じことになる。
However, it is not necessarily a good idea to use two systems of imaging devices to take a defocus image (optical path length L±ΔL).
Therefore, as shown in Fig. 3, if an image with optical path length L and an image with optical path length L + ΔL in which half of the image is optical path length and an image with optical path length L - ΔL in the other half are obtained, each optical path is It is possible to compare long images, which is essentially the same as using three systems.

一画面内に光路長L±ΔLの像を作る方法としては二つ
の方法があり、一つはガラスなどを光路長の途中に画像
が二分されるように入れ実効的な光路長を短かくする方
法、他の一つは焦点距離の異なるレンズを複合して接眼
レンズを構成する方法である。
There are two methods to create an image with optical path length L±ΔL within one screen. One is to shorten the effective optical path length by inserting a piece of glass or the like in the middle of the optical path length so that the image is divided into two. Another method is to construct an eyepiece by combining lenses with different focal lengths.

上に述べた方法を用いれば、一画面内にL±ΔLの画像
を作成することができ、前に述べた二系統の撮像装置に
よる自動焦点調節が可能となる。
By using the method described above, an image of L±ΔL can be created within one screen, and automatic focus adjustment using the two systems of imaging devices described above becomes possible.

第4図は二系統の撮像装置を用いた自動焦点調節の実施
例をプロツク図で示したものである。光源21で照射さ
れたステージ22上の試料23を顕微鏡24で拡大し、
接眼鏡筒26で光を2等分する。これはハーフ・ミラ等
を用いて容易に実現でき、対物レンズ25からの光路長
がL..L+ΔLとなるように同倍率の、接眼レンズ2
7,28を置き、この像を撮像装置29,30で撮像す
る。接眼レンズ28の前に実効的な光路長がLΔΔLと
なるような厚さのガラス31(たとえば、半円形のオプ
テイカル、フラツト)を挿入し、撮像装置30でL+Δ
L<!1.L−ΔLの像が半分ずつ写るようにする。こ
れらの画像を微分回路32,33に送り微分値を求める
。これを詳細に説明すると、ます同期信号発生回路36
から同期信号が撮像装置29及び30に与えられると、
30は光路長L+ΔLの部分の画像を撮像し、29はこ
れに対して光部長Lの画像のうちL1の部分(第3図を
参照)を撮像する。これらの部分の画像信号の微分値は
それぞれ微分回路33,32から出され、比較回路34
ではそれぞれの微分値のピーク値VL−Δ,及びL1を
保持する。上記の部分の撮像が完了した時点で同期信号
発生回路からタイミング信号が比較回路34に発せられ
、比較回路34では光路長L+ΔLの画像の微分値のピ
ーク値Vし一Δしと、この画像に対応する光路長Lの画
像の半分の部分レの微分値のピーク値VLlを比較して
結果を保持するとともにピークホールドされた値をりセ
ツトする。続いて撮像装置30では光路長L−ΔLの部
分の画像の撮像が、29では光路長Lの画像のうちの残
りのL2の部分の撮像が行なわれる。この間に保持され
た光路長L−ΔLの部分の微分値のピーク値,−△,と
、光路長Lの画像の残りの部分!の微分値のピーク値V
L2とは撮像が完了した時点で同期信号36から34へ
再びタイミング信号が与えられる事により比較され、ホ
ールドされていたこれらの値は再びりセツトされる。こ
のとぎ比較回器34の出力は、1Vし一ΔしくVLlか
つVし2くVし+Δしのとき、接眼レンズまでの光路長
がより長い光学系に焦点があつている、すなわち−d方
向の焦点ずれ、2Vし一ΔしくVし1かつVし2〉Vし
+Δしのとき、焦点一致、3Vし一ΔL>Vし,かつV
L2〉VL+Δしのとき、接眼レンズまでの光路長がよ
り短かい光学系に焦点があつている、すなわち+d方向
の焦点ずれ、との判定結果を示している。
FIG. 4 is a block diagram showing an embodiment of automatic focus adjustment using two systems of imaging devices. The sample 23 on the stage 22 irradiated by the light source 21 is magnified by the microscope 24,
The eyepiece tube 26 divides the light into two equal parts. This can be easily achieved using a half mirror or the like, and the optical path length from the objective lens 25 is L. .. Eyepiece 2 with the same magnification so that L+ΔL
7 and 28, and images thereof are captured by imaging devices 29 and 30. In front of the eyepiece lens 28, a glass 31 (for example, semicircular optical, flat) having a thickness such that the effective optical path length is LΔΔL is inserted, and the imaging device 30
L<! 1. Make sure that each half of the L-ΔL image is captured. These images are sent to differentiating circuits 32 and 33 to obtain differential values. To explain this in detail, the synchronous signal generation circuit 36
When a synchronization signal is given to the imaging devices 29 and 30 from
30 captures an image of a portion of optical path length L+ΔL, and 29 captures an image of a portion L1 (see FIG. 3) of the image of optical length L. Differential values of the image signals of these parts are output from differentiating circuits 33 and 32, respectively, and are sent to a comparing circuit 34.
Then, the peak values VL-Δ and L1 of the respective differential values are held. When the imaging of the above portion is completed, a timing signal is sent from the synchronization signal generation circuit to the comparison circuit 34, and the comparison circuit 34 determines the peak value V of the differential value of the image with the optical path length L + ΔL and the peak value of the differential value of the image with the optical path length L+ΔL. The peak value VLl of the differential value of the half partial image of the corresponding optical path length L is compared, the result is held, and the peak-held value is reset. Subsequently, the image capturing device 30 captures an image of a portion of the optical path length L−ΔL, and the image capturing device 29 captures an image of the remaining portion L2 of the image of the optical path length L. The peak value of the differential value of the portion of optical path length L−ΔL held during this time, −Δ, and the remaining portion of the image of optical path length L! The peak value V of the differential value of
When the imaging is completed, timing signals are again applied to the synchronization signals 36 to 34, and the values are compared with L2, and these held values are reset again. When the output of the sharpening comparator 34 is 1V and -Δ and VLl and V and 2 and V and +Δ, the focus is on the optical system with a longer optical path length to the eyepiece, that is, in the -d direction. When the focus shift is 2V and -Δ, and V and 1 and V and 2>V and +Δ, the focus is aligned, and 3V and -ΔL>V, and V
When L2>VL+Δ, the determination result is that the optical system with the shorter optical path length to the eyepiece is in focus, that is, there is a focus shift in the +d direction.

したがつて第2図の実施例と同様に“同期信号発生回路
36からタイミング信号をステージ駆動回路35に与え
ることにより1)、3)の場合は、ステージ駆動回路3
5を働かせてステージ22を移動し、2)が充たされる
まで上に述べた操作を繰り返す。この装置を用いること
により、二系統の撮像装置で高速自動焦点調節が可能と
なる。
Therefore, in the case of 1) and 3), the stage drive circuit 3
5 to move the stage 22, and repeat the above operation until 2) is satisfied. By using this device, high-speed automatic focus adjustment is possible with two systems of imaging devices.

以上の実施例においては、ステージを移動させる例をあ
げたが、その他対物レンズ、鏡筒等を移動させてもよい
ことは言うまでもない。
In the above embodiments, an example was given in which the stage was moved, but it goes without saying that other objects such as the objective lens, lens barrel, etc. may also be moved.

〔発明の効果〕〔Effect of the invention〕

以上詳述したように、本発明によれば焦点が合つていれ
ばステージの移動なしに、焦点が合つていない場合でも
最少のステージ移動で焦点調節ができ、極めて高速の焦
点調節が可能となる。
As detailed above, according to the present invention, if the focus is in focus, the focus can be adjusted without moving the stage, and even if the focus is not in focus, the focus can be adjusted with a minimum amount of stage movement, making extremely high-speed focus adjustment possible. becomes.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、試料と対物レンズ間の充路長変位すなわち焦
点ずれの程度と一次微分値の変化を示した図、第2図は
、本発明の一実施例を示す図、第3図は本発明を説明す
るための図、第4図は本発明の他の実施例を示す図であ
る。
FIG. 1 is a diagram showing the path length displacement between the sample and the objective lens, that is, the degree of defocus, and the change in the first-order differential value. FIG. 2 is a diagram showing an embodiment of the present invention. FIG. FIG. 4, which is a diagram for explaining the present invention, is a diagram showing another embodiment of the present invention.

Claims (1)

【特許請求の範囲】 1 1個の対物レンズ、該対物レンズからの光路を3つ
の光路に分ける手段及び該3つの光路中に設けられ該対
物レンズまでの光路長が互いに異なる3個の接眼レンズ
を有し、これらレンズにより同一の被写体に対して焦点
位置、前焦点位置および後焦点位置の3種の光学像を同
時に得る顕微鏡と、上記3種の光学像を撮像して電気信
号にそれぞれ変換する3系統の撮像手段と、上記電気信
号より上記3種の光学像の焦点ずれの度合をそれぞれ示
す第1、第2、第3の微分値をそれぞれ求める手段と、
上記焦点位置の光学像の焦点ずれの度合を示す第1の微
分値を上記前焦点位置の光学像の焦点ずれの度合を示す
第2の微分値および上記後焦点位置の光学像の焦点ずれ
の度合を示す第3の微分値の各々と比較する手段と、こ
の比較手段の出力により上記第1の微分値が上記第2、
第3の微分値よりも大きくなるように上記対物レンズの
上記被写体までの距離を制御する手段とからなることを
特徴とする顕微鏡の自動焦点調節装置。 2 1個の対物レンズ、該対物レンズからの光路を2つ
の光路に分ける手段及び該2つの光路中に設けられ該対
物レンズまでの光路長が互いに異なる2個の接眼レンズ
を有し、上記対物レンズと一方の上記接眼レンズにより
被写体に対して焦点位置の光学像を得ると共に上記対物
レンズと他方の上記接眼レンズにより両レンズ間の実質
光路長を部分的に変えて上記被写体に対して同一の視野
内に前焦点位置および後焦点位置の光学像を得る顕微鏡
と、上記焦点位置の光学像を撮像して電気信号に変換す
る第1の手段と、上記前焦点位置および後焦点位置の光
学像を撮像して電気信号に変換する第2の手段と、上記
第1の手段からの電気信号より上記焦点位置の光学像の
うち上記前焦点位置の光学像に対応する部分の焦点ずれ
の度合を示す第1の微分値と、上記後焦点位置の光学像
に対応する部分の焦点ずれの度合を示す第2の微分値を
求める手段と、上記第2の手段からの電気信号より上記
前焦点位置および後焦点位置の光学像の焦点ずれの度合
をそれぞれ示す第3、第4の微分値を求める手段と、上
記、第1の微分値と上記第3の微分値、及び上記第2の
微分値と上記第4の微分値をそれぞれ比較する手段と、
この比較手段の出力により上記第1、第2の微分値がそ
れぞれ上記第3、第4の微分値よりも大きくなるように
上記対物レンズの上記被写体までの距離を制御する手段
とからなることを特徴とする顕微鏡の自動焦点調節装置
[Scope of Claims] 1. One objective lens, means for dividing the optical path from the objective lens into three optical paths, and three eyepieces provided in the three optical paths and having different optical path lengths to the objective lens. A microscope that simultaneously obtains three types of optical images of the same subject using these lenses: focal position, front focal position, and back focal position, and a microscope that captures the three types of optical images and converts them into electrical signals. three systems of imaging means, and means for obtaining first, second, and third differential values respectively indicating the degree of defocus of the three types of optical images from the electric signals;
A first differential value indicating the degree of defocus of the optical image at the focal position is combined with a second differential value indicating the degree of defocus of the optical image at the front focal position and a second differential value representing the degree of defocus of the optical image at the rear focal position. a means for comparing with each of the third differential values indicating the degree; and an output of the comparison means to determine whether the first differential value
An automatic focus adjustment device for a microscope, comprising means for controlling the distance of the objective lens to the subject so that it becomes larger than a third differential value. 2. One objective lens, means for dividing the optical path from the objective lens into two optical paths, and two eyepiece lenses provided in the two optical paths and having different optical path lengths to the objective lens, Obtain an optical image at the focal position of the subject using the lens and one of the eyepieces, and partially change the effective optical path length between both lenses using the objective lens and the other eyepiece to obtain an optical image of the subject at the same focal position. a microscope that obtains an optical image at the front focal position and a back focal position within a field of view; a first means for capturing the optical image at the focal position and converting it into an electrical signal; and an optical image at the front focal position and the rear focal position. a second means for imaging and converting the image into an electrical signal; and a second means for imaging and converting the image into an electrical signal; and a second means for imaging and converting the image into an electrical signal; means for determining a first differential value indicating the degree of defocus of a portion corresponding to the optical image at the back focal position; and means for determining the front focal position based on the electric signal from the second means. and means for determining third and fourth differential values respectively indicating the degree of defocus of the optical image at the back focal position; and the first differential value, the third differential value, and the second differential value. means for comparing the fourth differential value and the fourth differential value, respectively;
and means for controlling the distance of the objective lens to the subject so that the first and second differential values become larger than the third and fourth differential values, respectively, based on the output of the comparison means. Features an automatic focus adjustment device for microscopes.
JP7081775A 1975-06-13 1975-06-13 automatic focus adjustment device Expired JPS6052404B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7081775A JPS6052404B2 (en) 1975-06-13 1975-06-13 automatic focus adjustment device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7081775A JPS6052404B2 (en) 1975-06-13 1975-06-13 automatic focus adjustment device

Publications (2)

Publication Number Publication Date
JPS51147336A JPS51147336A (en) 1976-12-17
JPS6052404B2 true JPS6052404B2 (en) 1985-11-19

Family

ID=13442494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7081775A Expired JPS6052404B2 (en) 1975-06-13 1975-06-13 automatic focus adjustment device

Country Status (1)

Country Link
JP (1) JPS6052404B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5767904A (en) * 1980-10-16 1982-04-24 Canon Inc Deciding system for adjusting state of focus
JPS5772110A (en) * 1980-10-23 1982-05-06 Canon Inc Focus position detector
JPS5788417A (en) * 1980-11-21 1982-06-02 Hitachi Denshi Ltd Automatic focusing system
JPS58202671A (en) * 1982-05-21 1983-11-25 Hitachi Denshi Ltd Auto focus method
JPS5965813A (en) * 1982-10-06 1984-04-14 Olympus Optical Co Ltd Focusing detection system

Also Published As

Publication number Publication date
JPS51147336A (en) 1976-12-17

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