JPS6057249B2 - semiconductor bidirectional amplifier - Google Patents
semiconductor bidirectional amplifierInfo
- Publication number
- JPS6057249B2 JPS6057249B2 JP2421076A JP2421076A JPS6057249B2 JP S6057249 B2 JPS6057249 B2 JP S6057249B2 JP 2421076 A JP2421076 A JP 2421076A JP 2421076 A JP2421076 A JP 2421076A JP S6057249 B2 JPS6057249 B2 JP S6057249B2
- Authority
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- Prior art keywords
- semiconductor
- voltage
- input
- bidirectional amplifier
- electrode
- Prior art date
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- 239000004065 semiconductor Substances 0.000 title claims description 42
- 230000002457 bidirectional effect Effects 0.000 title claims description 15
- 230000015556 catabolic process Effects 0.000 claims description 6
- 239000003990 capacitor Substances 0.000 claims 1
- 230000007423 decrease Effects 0.000 description 17
- 230000003321 amplification Effects 0.000 description 8
- 238000003199 nucleic acid amplification method Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000035515 penetration Effects 0.000 description 3
- 239000000969 carrier Substances 0.000 description 2
- 241000406668 Loxodonta cyclotis Species 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
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Description
【発明の詳細な説明】
この発明は半導体ダイオードを用いた半導体双方向増幅
器に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor bidirectional amplifier using semiconductor diodes.
半導体ダイオードを用いる一方向性増幅器は本発明者が
すでに提案した。(特許第68318号)ツェナーダイ
オードの降服現象およびトランジスタの突き抜け現象は
その内部抵抗が激減する現J象であり、しかもそれらの
現象は復元性があつて電圧を下げると直ちに復帰する。
なお、この動作は極めて速く超高周波域に及んでいる。
トランジスタの突き抜け現象はp叩もnpnもコレクタ
とエミッタ間に加わる正負の電圧の向きは異なるが現;
象そのものはほぼ同様に発生する。第1図は負荷抵抗R
をベース開放のトランジス夕の突き抜け現象を発生する
半導体ダイオードDへ直列に接続して、その動特性を測
定する場合の測定回路およびその測定結果を示す。The inventor has already proposed a unidirectional amplifier using semiconductor diodes. (Patent No. 68318) The breakdown phenomenon of a Zener diode and the punch-through phenomenon of a transistor are phenomena in which the internal resistance is drastically reduced, and moreover, these phenomena are resilient and immediately recover when the voltage is lowered.
Note that this operation is extremely fast and extends into the ultra-high frequency range.
The punch-through phenomenon of transistors is that both P-type and NPN transistors have different directions of positive and negative voltages applied between the collector and emitter;
The elephant itself occurs in much the same way. Figure 1 shows the load resistance R
A measurement circuit and its measurement results are shown for measuring the dynamic characteristics of a semiconductor diode D which is connected in series to a semiconductor diode D which causes the penetration phenomenon of an open-base transistor.
同図aにおいては正電圧による突き抜け現象の臨界電圧
をEcとすれば、直流電圧が臨界電圧Ecまでは該半導
体の内部抵抗Rdは極めて大きいから電流はほとんど流
れない。電圧を臨界電圧Ecまで上げると電流は流れ始
め、EcからΔEだけ上げたとき電流がIだけ流れると
負荷抵抗Rに電圧降下RIが発生する。仮りに臨界電圧
Ecまての該半導体Dの内部抵抗Rdは無限大で電流1
が零だとすれば、Rの両端の出力電圧、すなわちRの電
圧降下RIは零てあり、また臨界電圧EcからΔEだけ
電圧を上けたときに該半導体が突き抜け現象を発生し、
そのためその内部抵抗Rdが零になつたとすれば、その
電圧降下RdIは零となりRの電圧降下、すなわち出力
電圧は(Ec+ΔE)となる。よつてその電圧増幅度を
Aとすれは、Aは次のように算出される。EcからΔE
だけ上げたことによつてRの電圧降下、すなわち出力電
圧は0から(Ec+ΔE)まで上つたのでとなり、ΔE
が小さい程、Ecが大きい程Aは大きくなる。In Figure a, if the critical voltage for the breakthrough phenomenon due to positive voltage is Ec, then until the DC voltage reaches the critical voltage Ec, the internal resistance Rd of the semiconductor is extremely large, so that almost no current flows. When the voltage is raised to the critical voltage Ec, current begins to flow, and when the voltage is raised from Ec by ΔE, a current of I flows, and a voltage drop RI occurs across the load resistance R. Suppose that the internal resistance Rd of the semiconductor D up to the critical voltage Ec is infinite and the current is 1.
If is zero, the output voltage across R, that is, the voltage drop RI of R, is zero, and when the voltage is increased by ΔE from the critical voltage Ec, the semiconductor will cause a punch-through phenomenon,
Therefore, if the internal resistance Rd becomes zero, the voltage drop RdI becomes zero, and the voltage drop of R, that is, the output voltage becomes (Ec+ΔE). Therefore, assuming that the voltage amplification degree is A, A is calculated as follows. Ec to ΔE
As a result, the voltage drop of R, that is, the output voltage, increased from 0 to (Ec + ΔE), so ΔE
The smaller is and the larger is Ec, the larger is A.
臨界電圧Ecの値はツェナーダイオードでは(−20V
〜50V)、トランジスタの正方向の突き抜け現象では
80V〜120V)程度、ΔEはいずれも(1〜2)■
程度が一般となる。一般に半導体の電圧E対電流1の関
係は非直線で表わされ、電圧Eの小さいときはその内部
抵抗.が大きいため電流1は少なく、Eを上げるにつれ
て内部抵抗は小さくなつて電流1は増加する。The value of critical voltage Ec is (-20V) for Zener diode.
~50V), 80V~120V) in the positive direction punch-through phenomenon of transistors, and ΔE is (1~2)■
The degree is general. Generally, the relationship between voltage E and current 1 in a semiconductor is expressed as a non-linear relationship, and when voltage E is small, its internal resistance increases. Since E is large, current 1 is small, and as E is increased, internal resistance becomes smaller and current 1 increases.
それで内部抵抗をRdとし、Rd.l5lの関係を実測
してグラフに画くと、Iが小さい折はRdが大きく、I
が増加すればRdは急に小さくなつて双曲!線が表われ
、大略(Rd=K/In)と表わせる。ここにKは常数
nは半導体の品種およびばらつきによつて異なるが(n
〉1)となる。ツェナーダイオードの降服現象発生後、
およびベース開放のトランジスタダイオードの突き抜け
現象発生後は4特にそれらの内部抵抗Rdは激しく減少
するから、上記nの値は大きい。第1図aの回路におい
て直流電圧を突き抜け現象の臨界電圧Ec以上に順次上
げるとIも増加してゆき、したがつて内部抵抗Rdは大
略晶TvJLlI
なる双曲線状に激減し、該半導体の電圧降下■dは大路
次式に従つて減少する。Therefore, let the internal resistance be Rd, and Rd. When the relationship of l5l is actually measured and plotted on a graph, when I is small, Rd is large and I
As Rd increases, Rd suddenly decreases and becomes hyperbolic! A line appears and can be roughly expressed as (Rd=K/In). Here, K is a constant n, which varies depending on the type and variation of semiconductors (n
〉1). After the Zener diode breakdown phenomenon occurs,
After the penetration phenomenon occurs in transistor diodes with open bases, their internal resistance Rd decreases significantly, so the value of n is large. In the circuit shown in Fig. 1a, when the DC voltage is successively increased above the critical voltage Ec for the breakthrough phenomenon, I also increases, and as a result, the internal resistance Rd sharply decreases to a hyperbolic shape approximately TvJLLI, and the voltage drop across the semiconductor. ■d decreases according to Ohji's following formula.
結局電流1はRdの激減によつて多くなり、負荷抵抗R
の電圧降下は増加する。Eventually, the current 1 increases due to the drastic decrease in Rd, and the load resistance R
voltage drop increases.
それで該半導体の電圧降下はノとなり、Vd<51との
関係を測定してグラフに画くと第1図bのように電流制
御型の負性抵抗曲線となる。Therefore, the voltage drop across the semiconductor is 0, and when the relationship with Vd<51 is measured and plotted on a graph, it becomes a current-controlled negative resistance curve as shown in FIG. 1b.
更に電源電圧を上げて行くと該半導体の負性抵抗の特性
は失なわれて通常のオーム抵抗となるものが多し\。し
かし品種によつてはこの負性.抵抗の電圧範囲は(50
V〜80V)以上にも及ぶものがある。負性抵抗は能動
回路を構成し得られ、発振や増幅を失なわせ得る。しか
もこの突き抜け現象発生後の電流負性抵抗の電圧範囲は
広いので出力も大きく、スピーカを高音に鳴らすことが
できる。(エザキダイオードの場合は両端に加える直流
電圧を2,3V上げると空乏層を浸透してキャリアの移
動が起りそのため結果的には内部抵抗が高くなつて電流
は減少するようになり、電圧制御型の負性抵抗となるが
、その電圧範囲は0.4■以下であつて出力は小さく、
スピーカはほとんど鳴らない。When the power supply voltage is further increased, the negative resistance characteristic of the semiconductor is lost and many become normal ohmic resistance. However, depending on the variety, this negative effect may occur. The voltage range of the resistor is (50
V to 80 V) or more. Negative resistance can constitute an active circuit and can cause loss of oscillation and amplification. Moreover, since the voltage range of the current negative resistance after this punch-through phenomenon occurs is wide, the output is large, and the speaker can produce high-pitched sound. (In the case of an Ezaki diode, when the DC voltage applied to both ends is increased by 2 to 3 V, carriers penetrate through the depletion layer and movement of carriers occurs. As a result, the internal resistance increases and the current decreases. It has a negative resistance of , but its voltage range is 0.4■ or less and the output is small.
The speakers hardly make any sound.
)第2図aはベース開放トランジスタダイオードの突き
抜け現象を発生後の負性抵抗を利用して本願に係る半導
体双方向増幅器の基本回路を示す。) FIG. 2a shows a basic circuit of a semiconductor bidirectional amplifier according to the present invention, which utilizes a negative resistance after the punch-through phenomenon of an open-base transistor diode occurs.
第2図bはその動作を明らかにするために設けた仮設図
であつて、第2図aの上半部を示す。第2図は突き抜け
現象発生後の高い電流電圧EBが加えられてあつて電流
が流れているものとする。したがつて該半導体D1およ
びD2の内部抵抗Rdは前述の式(Rd=K/I″)の
ように大略Pに反比例する。第2図bにおいて1,a端
子に正電圧を加えると、それによつてD1に流れる電流
11は増加し、そのためD1の内部抵抗は大いに減少す
る。電源電圧EBはRl,Dl,R3の各電圧降下の和
に等しいから、11の増加によつてD1の内部抵抗は大
いに減少し、そのためDェの電圧降下は減少すればその
減少分だけR,,R3の電圧降下の和は増加する。R3
の電圧降下はb図の2,a″間の出力電圧に等しいから
、結果的に1,a間に正電圧を加えると、2,a″間出
力電圧は増加する。この場合D1の内部抵抗の減少は著
大となるので、1,a間へ加える正電圧の値よりも大な
る出力電圧が2,a″間に発生する。次に1,a間に負
電圧を加えると11は減少しそのためD1の内部抵抗は
著大となり、したがつてD1の電圧降下は著大となる。
Rl,Dl,R3の各電圧降下の和がEBに等しいので
D1の電圧降下が著大となれば、R1とR3との電圧降
下の和はその分だけ減少し、R3の電圧降下、すなわち
出力電圧は減少する。突き抜け現象発生後の半導体の内
部抵抗の変化は極めて大きいから、1,a間に加える入
力電圧よりも2,a″間の出力電圧を大ならしめること
ができ、その出力電圧の位相は入力電圧の位相と等しい
。今度は2,a″間に正電圧を加えると11は減少する
からD1の内部抵抗Rdは激増する。FIG. 2b is a temporary diagram provided to clarify the operation, and shows the upper half of FIG. 2a. In FIG. 2, it is assumed that a high current voltage EB is applied after the punch-through phenomenon occurs, and a current is flowing. Therefore, the internal resistance Rd of the semiconductors D1 and D2 is roughly inversely proportional to P as shown in the above equation (Rd=K/I''). In FIG. 2b, when a positive voltage is applied to the terminals 1 and a, Therefore, the current 11 flowing through D1 increases, and therefore the internal resistance of D1 decreases greatly.Since the power supply voltage EB is equal to the sum of the voltage drops of Rl, Dl, and R3, an increase in 11 causes the internal resistance of D1 to decrease. is greatly reduced, and therefore, if the voltage drop of D is reduced, the sum of the voltage drops of R,, R3 will increase by that reduction.R3
Since the voltage drop is equal to the output voltage between 2 and a'' in figure b, as a result, when a positive voltage is applied between 1 and a, the output voltage between 2 and a'' increases. In this case, the internal resistance of D1 decreases significantly, so an output voltage greater than the value of the positive voltage applied between 1 and a is generated between 2 and a''.Next, a negative voltage is generated between 1 and a. When 11 is added, 11 decreases, so the internal resistance of D1 becomes significant, and therefore the voltage drop of D1 becomes significant.
Since the sum of the voltage drops of Rl, Dl, and R3 is equal to EB, if the voltage drop of D1 becomes significant, the sum of the voltage drops of R1 and R3 will decrease by that amount, and the voltage drop of R3, that is, the output The voltage decreases. Since the change in the internal resistance of the semiconductor after the punch-through phenomenon occurs is extremely large, the output voltage between 2 and a'' can be made larger than the input voltage applied between 1 and a, and the phase of the output voltage is equal to the input voltage. This time, when a positive voltage is applied between 2 and a'', 11 decreases, so the internal resistance Rd of D1 increases dramatically.
EBはRl,Dl,R3の各電圧降下の和に等しいから
D1の内部抵抗Rdが増加すれは、その内部抵抗は大き
くなり、R1およびR3の電圧降下は減少する。この場
一合はR1の電圧降下が出力となるから、右方の2,a
″間に正電圧を加えるとR1の電圧降下すなわち出力電
圧は減少し、2,a″間の正電圧と逆位相となる。2,
a″間に負電圧を加えるとR2,llが小さくなること
となり11は激増し、それによつてD1の内部抵抗は激
減してD1の電圧降下も激減し、Rl,R3の電圧降下
の和は激増するから1,a間の出力電圧は逆位相に激増
する。Since EB is equal to the sum of the voltage drops of Rl, Dl, and R3, as the internal resistance Rd of D1 increases, the internal resistance increases and the voltage drops of R1 and R3 decrease. In this case, the voltage drop across R1 becomes the output, so the right side 2,a
When a positive voltage is applied between ``2'' and ``a'', the voltage drop across R1, that is, the output voltage decreases, and the phase becomes opposite to the positive voltage between 2 and a''. 2,
When a negative voltage is applied between a'', R2 and ll become smaller, and 11 increases sharply.As a result, the internal resistance of D1 sharply decreases, and the voltage drop of D1 also sharply decreases, and the sum of the voltage drops of Rl and R3 becomes Since the output voltage increases dramatically, the output voltage between 1 and a increases dramatically in opposite phases.
第2図aは同図bへ下半部を加えた形での実用の基本回
路を表わし、その下半部は上半部の動作へ逆位相的に作
用し、結果的にはb図の2倍の増幅作用を呈する。Figure 2a shows a practical basic circuit with the lower half added to Figure 2b, and the lower half acts on the operation of the upper half in an antiphase manner, resulting in the result shown in Figure b. Exhibits double amplification effect.
その理由を考慮するといまDl,D2はそれぞれ特性が
全く等しくまたRl,R2,R3,R4の値もそれぞれ
全く相等しいとする。1,1″間に10Vの正電圧を加
えると、Rl,R2にそれぞれ5Vの電圧が加わる。Considering the reason, it is now assumed that Dl and D2 have exactly the same characteristics, and the values of R1, R2, R3, and R4 are also completely equal. When a positive voltage of 10V is applied between Rl and R2, a voltage of 5V is applied to each of Rl and R2.
R1に加わる5Vの電圧は電源EBの電圧と同方向で両
者相加わるから電流11は増加し、その増加分をΔIと
する。R2に加わる5VはEBと逆方向に作用し、D2
に加わる電圧は(EB−5V)となり、その電流は(1
2一ΔI)となる2,2″間の出力電圧は1,1″間に
10■加える前は(11=12),(R3=R,)と仮
定すれば(R3ll−R,l2=0)となつている。1
1と12とは逆方向に流れているからである。Since the voltage of 5V applied to R1 is in the same direction as the voltage of the power source EB and both are added together, the current 11 increases, and the increase is defined as ΔI. The 5V applied to R2 acts in the opposite direction to EB, and D2
The voltage applied to is (EB-5V) and the current is (1
The output voltage between 2 and 2" becomes (2 - ΔI) before adding 10 seconds between 1 and 1", (11=12), and assuming (R3=R,), it becomes (R3ll-R, l2=0 ). 1
This is because 1 and 12 flow in opposite directions.
1,1″間に10V加えると、R3(11+ΔI)−R
4(12−ΔI)=R2Δ1+R,ΔI)となり、(R
3=R4)ならば上半のみの場合の2倍の出力となる。When 10V is applied between 1 and 1″, R3(11+ΔI)−R
4(12-ΔI)=R2Δ1+R,ΔI), and (R
3=R4), the output will be twice that in the case of only the upper half.
その位相は入力の位相に等しい。Dl,D2の電流に対
する内部抵抗の変化が著大であるから増幅が行なわれる
。1,1″に負電圧が加わる場合、2,2″から入力が
加えられる場合等も同様に考慮される。Its phase is equal to the phase of the input. Amplification is performed because the internal resistance changes significantly with respect to the currents of Dl and D2. A case in which a negative voltage is applied to 1, 1'', a case in which an input is applied from 2, 2'', etc. are similarly considered.
ただし2,2″に入力が加えられる場合の1,1″への
出力は逆位相となる。第2図aの回路は完全に対称的で
あつて相互に負性抵抗による自己発振を相殺して安定に
増幅作用を呈する。However, when input is applied to 2, 2'', the output to 1, 1'' will be in opposite phase. The circuit shown in FIG. 2a is completely symmetrical and exhibits a stable amplification effect by mutually canceling out self-oscillation due to negative resistance.
2つの抵抗Rl,R2の値を相等しくし、他の2つの抵
抗R3,R4の値も相等しく、Rl,R2とR3,R4
との抵抗値を異にすれば1,1゛側と2,2″側との出
力を異ならしめることができる。The values of the two resistors Rl and R2 are made equal, and the values of the other two resistors R3 and R4 are also made equal, Rl, R2 and R3, R4.
By making the resistance values different between the 1,1'' side and the 2,2'' side, the outputs can be made different.
第2図の基本型双方向増幅回路の実用回路の例は第3図
に示す。An example of a practical circuit of the basic bidirectional amplifier circuit shown in FIG. 2 is shown in FIG.
この回路では入力端子との結合に容量を用いているが、
トランスを用いること等も可能となる。周波数特性、直
線性、ひすみ率等の諸特性は良好で、真空管・トランジ
スタ増幅器と同程度であり、その増幅度は半導体ダイオ
ードの品種によつて相当異なるが、現在振幅増幅度は最
大1C@ないし2CPi程度である。第3図の直流電源
EBの電圧も半導体ダイオードの品種によつて異なるが
、最高約250V程度となる。これは交流100Vから
倍電圧整流回路によつて容易に得られ、したがつてトラ
ンスレスであり、また対称接・続の増幅器であるため、
平滑回路が簡単でもハム音は出力に現われず、音質も良
好となる。ベース開放のトランジスタ・ダイオードの場
合はPnp,npnいずれもPnまたはNp接続が2つ
のため、直流電源の正負の向きが何れてあつても突き抜
け現:象を発生して双方向増幅器の機能を有する。ただ
しツェナーダイオードの場合は逆方向の直流電源を用い
る。第4図はこの増幅器をタンテム接続する場合の系統
図であつて、1段だけでは増幅度の不足するフ折に使用
して所要の利得を得ることがその目的となる。This circuit uses capacitance for coupling with the input terminal, but
It is also possible to use a transformer. Frequency characteristics, linearity, distortion factor, and other characteristics are good and are on the same level as vacuum tube/transistor amplifiers.The amplification degree varies considerably depending on the type of semiconductor diode, but the current amplitude amplification degree is up to 1C@ It is about 2 to 2CPi. The voltage of the DC power supply EB in FIG. 3 also varies depending on the type of semiconductor diode, but the maximum voltage is about 250V. This can be easily obtained from AC 100V using a voltage doubler rectifier circuit, and is therefore transformerless, and since it is a symmetrically connected amplifier,
Even if the smoothing circuit is simple, no hum will appear in the output, and the sound quality will be good. In the case of open-base transistors and diodes, both Pnp and npn have two Pn or Np connections, so even if the positive or negative direction of the DC power supply is turned, a penetration phenomenon occurs and the function of a bidirectional amplifier is achieved. . However, in the case of a Zener diode, a DC power source in the opposite direction is used. FIG. 4 is a system diagram when these amplifiers are connected in tandem, and the purpose of this is to obtain a required gain by using it when the amplification level is insufficient with only one stage.
図中1,2はそれぞれ本件の双方向増幅器を示す。この
発明は上記のように双方向増幅器てあつて半導体ダイオ
ードの降服現象、または突き抜け現象の発生電圧より高
い電圧における電流制御型負性抵抗性を利用する。In the figure, 1 and 2 respectively indicate the bidirectional amplifier of the present invention. As described above, the present invention utilizes the current-controlled negative resistance of a semiconductor diode at a voltage higher than the voltage at which the breakdown phenomenon or punch-through phenomenon occurs in a bidirectional amplifier.
双方向増幅器は従来存在しなかつた増幅器であり、制御
電極を要せず、回路は簡単て将来この回路方式に適する
優れた半導体ダイオードが開発される見込みがあり、さ
らにICの設計にも有効となる。A bidirectional amplifier is an amplifier that has never existed before, does not require a control electrode, has a simple circuit, and it is expected that excellent semiconductor diodes suitable for this circuit system will be developed in the future, and it will also be effective in IC design. Become.
図面はこの発明の原理および実施例を示す。
第1図は降服現象又は突き抜け現象を発生する半導体ダ
イオードに負荷抵抗Rを接続した場合の特性測定回路お
よびその測定結果の動特性を示し、第2図は本発明に係
る半導体双方向増幅器の基本回路を示し、第3図はその
応用例の回路であり、第4図は該増幅器をタンデム接続
した系統図を示す。なおEBは直流電源、Rdは半導体
ダイオードの内部抵抗、Ecは降服電圧または突き抜け
電圧の臨界値、D,Dl,D2は半導体ダイオードを示
すものである。The drawings illustrate the principles and embodiments of the invention. Fig. 1 shows a characteristic measurement circuit and the dynamic characteristics of the measurement results when a load resistor R is connected to a semiconductor diode that causes a breakdown phenomenon or a breakthrough phenomenon, and Fig. 2 shows the basics of a semiconductor bidirectional amplifier according to the present invention. FIG. 3 shows a circuit of an example of its application, and FIG. 4 shows a system diagram in which the amplifiers are connected in tandem. Note that EB is a DC power supply, Rd is an internal resistance of a semiconductor diode, Ec is a critical value of breakdown voltage or breakthrough voltage, and D, Dl, and D2 are semiconductor diodes.
Claims (1)
き抜け現象を発生したのちはその内部抵抗Rdがほぼ電
流のn乗に反比例し、(Rd=K/I^n)と近似した
とき、(n>1)なる特性を有する半導体ダイオードD
_1、D_2の一方の電極に接続し、第二の入出力端子
対2、2′を、該半導体ダイオードD_1、D_2の他
方の電極に接続すると共に、該半導体ダイオードD_1
、D_2の一方の電極を第一の抵抗R_1、R_2を経
て直流電源E_Bの一方の極に接続し、該半導体ダイオ
ードD_1、D_2の他方の電極を第二の抵抗R_3、
R_4を経て直流電源E_Bの他方の極に接続して成る
半導体双方向増幅器。 2 直流電源E_Bの電源電圧値を該半導体ダイオード
D_1、D_2の降服現象または突き抜け現象を発生す
る電圧より高い値とした特許請求の範囲第1項記載の半
導体双方向増幅器。 3 第一の抵抗R_1、R_2と第二の抵抗R_3、R
_4の値を同じにした特許請求の範囲第1項記載の半導
体双方向増幅器。 4 第一の抵抗R_1、R_2と第二の抵抗R_3、R
_4の値を異ならしめた特許請求の範囲第1項記載の半
導体双方向増幅器。 5 第一および第二の入出力端子対1、1′;2、2′
を容量Cを介して第一および第二の入出力1、1′;2
、2′に接続して成る特許請求の範囲第1項記載の半導
体双方向増幅器。 6 第一の入出力端子対1、1′を該半導体ダイオード
D_1、D_2の一方の電極に接続し、第二の入出力端
子対2、2′を該半導体ダイオードD_1、D_2の他
の電極に接続すると共に、該半導体ダイオードD_1、
D_2の一方の電極を第一の抵抗R_1、R_2を経て
直流電源E_Bの一方の極に接続し、該半導体ダイオー
ドD_1、D_2の他方の電極を第二の抵抗R_3、R
_4を経て直流電源E_Bの他方の極に接続した半導体
双方向増幅器を2組以上設け、それらをタンデムに接続
して成る特許請求の範囲第1項記載の半導体双方向増幅
器。[Claims] 1. After the first input/output terminal pair 1, 1' undergoes a surrender phenomenon or a breakthrough phenomenon, its internal resistance Rd is approximately inversely proportional to the n-th power of the current, and (Rd=K/I A semiconductor diode D having the characteristic (n>1) when approximated to ^n)
The semiconductor diode D_1 is connected to one electrode of the semiconductor diode D_1, D_2, and the second input/output terminal pair 2, 2' is connected to the other electrode of the semiconductor diode D_1, D_2.
, D_2 are connected to one pole of a DC power source E_B via first resistors R_1, R_2, and the other electrodes of the semiconductor diodes D_1, D_2 are connected to a second resistor R_3, D_2.
A semiconductor bidirectional amplifier connected to the other pole of the DC power supply E_B via R_4. 2. The semiconductor bidirectional amplifier according to claim 1, wherein the power supply voltage value of the DC power source E_B is set to a value higher than the voltage that causes the breakdown phenomenon or breakthrough phenomenon of the semiconductor diodes D_1 and D_2. 3 First resistance R_1, R_2 and second resistance R_3, R
The semiconductor bidirectional amplifier according to claim 1, wherein the values of _4 are the same. 4 First resistor R_1, R_2 and second resistor R_3, R
The semiconductor bidirectional amplifier according to claim 1, wherein the values of _4 are different. 5 First and second input/output terminal pair 1, 1'; 2, 2'
through the capacitor C to the first and second input/output 1, 1'; 2
, 2'. 6 Connect the first input/output terminal pair 1, 1' to one electrode of the semiconductor diodes D_1, D_2, and connect the second input/output terminal pair 2, 2' to the other electrode of the semiconductor diodes D_1, D_2. and the semiconductor diode D_1,
One electrode of the semiconductor diode D_2 is connected to one pole of the DC power source E_B via the first resistor R_1, R_2, and the other electrode of the semiconductor diode D_1, D_2 is connected to the second resistor R_3, R_2.
2. The semiconductor bidirectional amplifier according to claim 1, comprising two or more sets of semiconductor bidirectional amplifiers connected to the other pole of the DC power supply E_B via the wire _4 and connected in tandem.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2421076A JPS6057249B2 (en) | 1976-03-08 | 1976-03-08 | semiconductor bidirectional amplifier |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2421076A JPS6057249B2 (en) | 1976-03-08 | 1976-03-08 | semiconductor bidirectional amplifier |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS52107711A JPS52107711A (en) | 1977-09-09 |
| JPS6057249B2 true JPS6057249B2 (en) | 1985-12-13 |
Family
ID=12131928
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2421076A Expired JPS6057249B2 (en) | 1976-03-08 | 1976-03-08 | semiconductor bidirectional amplifier |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6057249B2 (en) |
-
1976
- 1976-03-08 JP JP2421076A patent/JPS6057249B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS52107711A (en) | 1977-09-09 |
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