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JPS606917B2 - Method for producing Group 3-5 compound semiconductor single crystal - Google Patents
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JPS606917B2 - Method for producing Group 3-5 compound semiconductor single crystal - Google Patents

Method for producing Group 3-5 compound semiconductor single crystal

Info

Publication number
JPS606917B2
JPS606917B2 JP16764882A JP16764882A JPS606917B2 JP S606917 B2 JPS606917 B2 JP S606917B2 JP 16764882 A JP16764882 A JP 16764882A JP 16764882 A JP16764882 A JP 16764882A JP S606917 B2 JPS606917 B2 JP S606917B2
Authority
JP
Japan
Prior art keywords
crystal
single crystal
sealant
pressure
pulling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP16764882A
Other languages
Japanese (ja)
Other versions
JPS5957993A (en
Inventor
文夫 折戸
一高 寺嶋
承生 福田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP16764882A priority Critical patent/JPS606917B2/en
Publication of JPS5957993A publication Critical patent/JPS5957993A/en
Publication of JPS606917B2 publication Critical patent/JPS606917B2/en
Expired legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/36Single-crystal growth by pulling from a melt, e.g. Czochralski method characterised by the seed, e.g. its crystallographic orientation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 この発明は高品質m−V族化合物半導体単結晶の製造方
法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing a high quality m-V group compound semiconductor single crystal.

m−V族化合物、例えばGaAs,Gap,lnPの単
結晶は半導体としての優れた性質を示し、発光ダイオー
ド、半導体レーザ素子等のオプトェレクトロニクスに用
いられる素子、マイクロ波ダイオード、電界効果型トラ
ンジスタ等の高周波素子の製造に広く用いられている。
Single crystals of m-V group compounds, such as GaAs, Gap, and lnP, exhibit excellent properties as semiconductors, and are used in elements used in optoelectronics such as light-emitting diodes and semiconductor laser devices, microwave diodes, field-effect transistors, etc. It is widely used in the manufacture of high-frequency devices.

更に超高速論理集積回路、オプトェレクトロニクス集積
回路の基板結晶として注目を浴びている。これらの化合
物単結晶の成長にはAs,P等の・V族元素が高解離圧
を示すため、液体封止剤を用いた高圧液体封止引き上げ
法(LES法)が通常用いられていた。
Furthermore, it is attracting attention as a substrate crystal for ultra-high-speed logic integrated circuits and optoelectronic integrated circuits. For the growth of single crystals of these compounds, a high-pressure liquid sealing method (LES method) using a liquid sealant has been commonly used since group V elements such as As and P exhibit high dissociation pressure.

この液体封止引き上げ法は大型綾晶が用いられ、m−V
族化合物のように結晶化の際に体積変化するものも容易
に単結晶化できる等の特徴を有しており、液体封止剤で
結晶材料溶融液を封止し、10〜7ぴ気圧の高圧下で解
離圧の高い偽,P等のV族元素の解離を抑制し、種結晶
を溶融液に接触させ、所定の速度で回転、引き上げるこ
とにより結晶の成長を行っていた。上述の如く、液体封
止引き上げ法は結晶の解離を防ぐため、高圧下で単結晶
の成長を行うので、結晶原料溶融液と封止剤との界面近
傍における温度勾配は8000/肌以上と高く、このた
め成長した結晶内に歪みが生じ、転位の原因となった。
This liquid-sealed pulling method uses a large ayase crystal, and m-V
It has the characteristic that even compounds whose volume changes during crystallization, such as group compounds, can be easily made into single crystals. Under high pressure, the dissociation of Group V elements such as P, which have a high dissociation pressure, is suppressed, and the crystal is grown by bringing the seed crystal into contact with the melt, rotating and pulling it at a predetermined speed. As mentioned above, in the liquid sealing pulling method, single crystals are grown under high pressure in order to prevent crystal dissociation, so the temperature gradient near the interface between the crystal raw material melt and the sealant is as high as 8000/skin or more. This caused distortion in the grown crystal, causing dislocations.

また、通常広く用いられている<100>方向で引き上
げた結晶を(100)面で切断したウェハーでは転位密
度が直型方向にW型の不均一な分布を示す。上述の欠点
を避けるため、結晶成長操作を行う際に高圧容器内の雰
囲気圧力を低くするとか、高圧容器内のルッボの位置を
低くして結晶原料熔融液と封止剤との界面の温度勾配を
小さくする方法が提案されているが、結晶欠陥の少ない
高品質結晶成長に最適の温度分布、雰囲気圧力を再現性
よく設定することは難かしいことであり、殊に圧力を下
げ過ぎると、As,Pが飛散し、所定の組成比の単結晶
が得られなくなる。この発明の目的は上記の結晶原料溶
融液と封止剤との界面を低温度勾配にして、結晶成長を
行い、低欠陥で転位密度分布の均一性の優れた山一V族
化合物単結晶を再現性よく製造する方法を提供する。
Further, in a wafer obtained by cutting a crystal pulled in the <100> direction, which is commonly used, and cut along the (100) plane, the dislocation density exhibits a W-shaped non-uniform distribution in the straight direction. In order to avoid the above-mentioned drawbacks, during the crystal growth operation, the atmospheric pressure in the high-pressure container may be lowered, or the Rubbo position in the high-pressure container may be lowered to reduce the temperature gradient at the interface between the crystal raw material melt and the sealant. However, it is difficult to set the optimal temperature distribution and atmospheric pressure with good reproducibility for high-quality crystal growth with few crystal defects, and in particular, if the pressure is lowered too much, As , P are scattered, making it impossible to obtain a single crystal with a predetermined composition ratio. The purpose of this invention is to grow a Yamaichi Group V compound single crystal with low defects and excellent uniformity of dislocation density distribution by creating a low temperature gradient at the interface between the crystal raw material melt and the sealing agent. To provide a method for manufacturing with good reproducibility.

このため、この発明は液体封止引き上げ法による血−V
族化合物単結晶の製造方法において、結晶原料溶融液と
液体封止剤との界面が低温度勾配下で、種結晶及び成長
した結晶をその上方より流下する液体封止剤で被覆しな
がら結晶成長を行うことを特徴とする。
For this reason, the present invention provides blood-V
In the method for producing single crystals of group compounds, crystal growth is performed under a low temperature gradient at the interface between the crystal raw material melt and the liquid sealant, while covering the seed crystal and the grown crystal with the liquid sealant flowing down from above. It is characterized by doing the following.

この発明を添付の図面に基いて説明すると、第1図は液
体封止引き上げ用の単結晶製造装置の概略図であって、
不活性ガス導入管9と排気管10を備えた高圧容器1内
には石英、窒化ポロン等のルッボ3を炭素材料で作られ
た支持部材4内に設け、支持軸6により回転及び上下動
できるように支持し、ルッボ3の周囲にはヒータ2を設
け、ルッボを所定の温度に加熱保持すると共に、ヒータ
2の周囲には更に断熱壁7を設け、ヒータよりの外方へ
の放熱を防止する。
The present invention will be explained based on the accompanying drawings. FIG. 1 is a schematic diagram of a single crystal manufacturing apparatus for liquid-sealed pulling.
In a high-pressure container 1 equipped with an inert gas inlet pipe 9 and an exhaust pipe 10, a rubbo 3 made of quartz, poron nitride, etc. is provided in a support member 4 made of carbon material, and can be rotated and moved up and down by a support shaft 6. A heater 2 is provided around Rubbo 3 to heat and maintain Rubbo at a predetermined temperature, and an insulating wall 7 is further provided around the heater 2 to prevent heat radiation from the heater to the outside. do.

ルッボの上部には下端に種結晶8を取付けた引き上げ軸
5を設け、この引き上げ車由は支持軸6と同様に回転す
ると共に上下動するように構成されている。上述の如き
単結晶製造装置において、下端に種結晶8を取付けた引
き上げ軸5の高さ方向中途には容器14を設け、容器の
底面の引き上げ軸5を貫通している部分15(第2図)
には僅かな間隙を設け、結晶成長工程中容器14に入っ
ている液体封止剤16はその間隙15により引き上げ軸
を伝わって流下する。なお、容器14は適当な方法(図
示せず)で引き上げ軸或は高圧容器内壁に固定されてい
る。ルッボ3の中には結晶材料原料及び封止剤原料を入
れ、また容器i4には封止剤原料を入れ、しかる後に高
圧容器1内に窒素、アルゴン等の不活性ガスを圧入し、
ルッボを原料溶融温度以上に加熱して結晶材料及び封止
剤を溶融させる。封止剤としては公知の酸化棚素(&0
3)が用いられる。ルッボに入れる結晶材料原料がGa
公,lnP等の化合物の多結晶及び半絶縁性とするため
の不純物の場合は3〜1正気圧程度の低圧で結晶材料原
料を熔融させる。またm−V族多結晶の代りに、これら
を構成する原素をルッボに入れ、30〜7ぴ気圧の高気
圧下で直接原料の合成を行っても良い。
A pulling shaft 5 with a seed crystal 8 attached to the lower end is provided in the upper part of Rubbo, and this pulling shaft is configured to rotate and move up and down in the same way as the support shaft 6. In the single crystal manufacturing apparatus as described above, a container 14 is provided midway in the height direction of the pulling shaft 5 with a seed crystal 8 attached to the lower end, and a portion 15 (see FIG. )
A slight gap is provided in the container 15, and the liquid sealant 16 contained in the container 14 flows down along the pulling axis through the gap 15 during the crystal growth process. The container 14 is fixed to the pulling shaft or the inner wall of the high-pressure container by an appropriate method (not shown). A crystal material raw material and a sealant raw material are put into Rubbo 3, a sealant raw material is put into a container i4, and an inert gas such as nitrogen or argon is then pressurized into the high pressure container 1.
Rubbo is heated above the raw material melting temperature to melt the crystal material and sealant. As a sealing agent, a well-known oxidized oxide (&0
3) is used. The raw material for the crystal material to be put into Rubbo is Ga.
In the case of polycrystalline compounds such as lnP and impurities for making them semi-insulating, the crystal material raw material is melted at a low pressure of about 3 to 1 positive atmosphere. Moreover, instead of the m-V group polycrystal, the constituent elements may be placed in a rubbo and the raw materials may be directly synthesized under high pressure of 30 to 7 pi atmospheres.

いずれの場合も、ルッポ内の原料が完全に溶融したら、
結晶原料溶融液13と液体封止剤12との界面を50℃
′肌程度以下の低温度勾配とする。この界面を低温度勾
配とする方法としては、高圧容器内の圧力を下げる方法
、ルッボの位置を下げて封止剤の加熱温度を上げる方法
、また第2図に示すように、ルッボ3の開□面上部には
反射板17を設けてルッポ開□面より放射される熱をル
ッボに向って反射させる方法等が挙げられる。上述の方
法は二つ或は三つ組合せて用いても良く、界面が所定の
値の低温度勾配となったら、引き上げ軸を下降し、種結
晶8を結晶原料溶融液13に接触させ、所定の速度で種
結晶を回転、引き上げて結晶の成長を行う。この時、温
度勾配が低いため、形成した結晶が封止剤12の上面よ
り突出すると、結晶表面より特定成分が輝散する。しか
し、引き上げ榛5に設けられた容器14には封止剤16
が入っており、高圧容器内の温度により溶融し、間隔1
5より引き上げ軸を伝って流下する。
In either case, once the raw material in Luppo is completely melted,
The interface between the crystal raw material melt 13 and the liquid sealant 12 is heated to 50°C.
'A low temperature gradient below skin level. Methods to create a low temperature gradient at this interface include lowering the pressure inside the high-pressure container, lowering the Rubbo position to increase the heating temperature of the sealant, and as shown in Figure 2, opening the Rubbo 3. Examples include a method in which a reflective plate 17 is provided above the □ surface to reflect the heat radiated from the open □ surface toward the Lubbo. The above-mentioned methods may be used in combination of two or three. When the interface has a low temperature gradient of a predetermined value, the pulling shaft is lowered, the seed crystal 8 is brought into contact with the crystal raw material melt 13, and the temperature gradient is lowered to a predetermined value. The seed crystal is rotated and pulled up at a speed of 100 to grow the crystal. At this time, since the temperature gradient is low, when the formed crystal protrudes from the upper surface of the sealant 12, the specific component radiates from the crystal surface. However, the sealant 16 is not included in the container 14 provided in the drawer 5.
is melted by the temperature inside the high-pressure container, and the interval 1
5, it flows down along the pulling shaft.

この時の高圧容器内の温度は600〜1000℃程度で
あって、封止剤の粘度は低下しており、引き上げ軸を流
下した封止剤は種結晶8及び成長結晶11の表面を絶え
ず被覆してルッボ内へ流れ落ちるので、上述の成型結晶
よりの成分の鹿散は抑制され、引き上げ操作中の種結晶
の折損、落下を防止することができる。封止剤を収納す
る容器の大きさは、結晶成長工程中種結晶及び単結晶を
被覆する量の封止剤が入るものとするが、封止剤の流下
量は間隙によって制御することが可能であって、2〜1
0夕/時の流下により2〜3インチ径の結晶表面を被覆
することができる。この場合、水分を500〜200■
岬含んだウェットタイプの弦03を用いると粘性が低下
するため、流下が効果的に行われ、良い結果が得られる
。また、液体封止剤の収納容器の底面は頚射熱を反射す
るような構造とし、反射板の代りに用いることもできる
At this time, the temperature inside the high-pressure container is about 600 to 1000°C, the viscosity of the sealant has decreased, and the sealant flowing down the pulling shaft constantly covers the surfaces of the seed crystal 8 and growing crystal 11. Since the seed crystal flows down into the rubbo, the scattering of components from the above-mentioned molded crystal is suppressed, and breakage and falling of the seed crystal during the pulling operation can be prevented. The size of the container containing the sealant is such that it can contain enough sealant to cover the seed crystal and single crystal during the crystal growth process, but the amount of sealant flowing down can be controlled by the gap. and 2 to 1
A flow of 0 tm/hour can coat crystal surfaces of 2 to 3 inches in diameter. In this case, add 500~200cm of water.
When a wet type string 03 containing a cape is used, the viscosity is lowered, so that the flow is effectively performed and good results are obtained. Furthermore, the bottom surface of the liquid sealant storage container can be structured to reflect infrared heat and can be used in place of a reflecting plate.

結晶成長工程中において、種結晶及び形成した結晶の表
面を液体封止剤で被覆して結晶成分の飛散を抑制するた
め、転位分布の均一な高品質単結晶が再現性よく得られ
、特に低温度勾配下での結晶成長工程において効果があ
るが、通常の温度勾配下の結晶成長工程に用いても、効
果が見られることは明らかである。次に本発明の実施例
を述べる。
During the crystal growth process, the seed crystal and the surface of the formed crystal are coated with a liquid sealant to suppress the scattering of crystal components, making it possible to obtain high-quality single crystals with a uniform dislocation distribution with good reproducibility, and with a particularly low Although it is effective in a crystal growth process under a temperature gradient, it is clear that the effect can be seen even when used in a normal crystal growth process under a temperature gradient. Next, examples of the present invention will be described.

Ga500夕、As550夕、封止剤としてのB031
50夕をルッボに入れ、更に引き上げ軸に設けられた容
器にはB20330夕入れ、高圧容器内に窒素ガスを圧
入して2ぴ気圧とし、ヒータにてルツボを1260℃に
加熱して原料の合成を行った。
Ga500, As550, B031 as a sealant
B20330 was added to the container installed on the pulling shaft, nitrogen gas was injected into the high-pressure container to create a pressure of 2 pressure, and the crucible was heated to 1260°C with a heater to synthesize the raw materials. I did it.

ルッボ中の原料が完全に溶融したら、圧力を6気圧に下
げた。この時の原料溶融液と封止剤との界面の温度勾配
は約30qC/肌であった。種結晶を原料熔融液に接触
させ、5肌/時の速度で引き上げて直径約50肋、長さ
約10仇吻のGa偽単結晶を作成した。単結晶の引き上
げ操作中は引き上げ綾を伝って区03溶融液が流下し、
種結晶及び成長単結晶の表面を絶え間なく被覆していた
。このようにして得られた単結晶の中央部分を切り出し
、このウェハーの転位密度を測定したら、綾部分は3×
1び伽‐2であり、中央部分は7×1件抑‐2であり、
U型分布を示すた。比較のため、B203溶融液の被覆
を除いた外は全く同じ方法で単結晶の製造を試みたが、
得られた結晶体の外周部には欠陥が多く見られ、径の約
半分までの部分は使用不能で、製品としての価値は著し
く低下する。
Once the raw materials in Rubbo were completely melted, the pressure was lowered to 6 atmospheres. At this time, the temperature gradient at the interface between the raw material melt and the sealant was about 30 qC/skin. The seed crystal was brought into contact with the raw material melt and pulled up at a rate of 5 crystals/hour to create a Ga pseudo single crystal with a diameter of about 50 ribs and a length of about 10 ribs. During the single crystal pulling operation, the 03 melt flows down along the pulling twill,
The surface of the seed crystal and growing single crystal was continuously coated. After cutting out the central part of the single crystal obtained in this way and measuring the dislocation density of this wafer, the twill part was found to be 3×
1 Bika-2, the central part is 7 x 1 case-2,
It shows a U-shaped distribution. For comparison, we attempted to produce a single crystal using the same method except for coating with B203 melt, but
Many defects are seen on the outer periphery of the obtained crystal, and about half of the diameter is unusable, resulting in a significant decrease in value as a product.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は単結晶製造装置の概略断面図、第2図はこの発
明による単結晶製造装置の要部断面図、図中、1は高圧
容器、2はヒーター、3はルッボ、5は引き上げ軸、8
は種結晶、11は成長結晶、12は液体封止剤、13は
結晶原料溶融液、14は容器、16は液体封止剤を示す
。 第1図 第2図
FIG. 1 is a schematic cross-sectional view of a single crystal manufacturing apparatus, and FIG. 2 is a cross-sectional view of essential parts of a single crystal manufacturing apparatus according to the present invention. In the figure, 1 is a high pressure vessel, 2 is a heater, 3 is a rubbo, and 5 is a pulling shaft. , 8
11 is a seed crystal, 11 is a growing crystal, 12 is a liquid sealant, 13 is a crystal raw material melt, 14 is a container, and 16 is a liquid sealant. Figure 1 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 1 液体封止引き上げ法によるIII−V族化合物単結晶の
製造方法において、単結晶の引き上げ操作中引き上げ棒
を伝って液体封止剤を流下させ、種結晶及び形成した結
晶表面を該液体封止剤で被覆しながら結晶成長を行うこ
とを特徴とする単結晶の製造方法。
1. In a method for producing a III-V compound single crystal using a liquid sealing pulling method, a liquid sealant is caused to flow down along a pulling rod during the single crystal pulling operation, and the seed crystal and the surface of the formed crystal are sealed with the liquid. A method for producing a single crystal characterized by growing the crystal while being coated with an agent.
JP16764882A 1982-09-28 1982-09-28 Method for producing Group 3-5 compound semiconductor single crystal Expired JPS606917B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16764882A JPS606917B2 (en) 1982-09-28 1982-09-28 Method for producing Group 3-5 compound semiconductor single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16764882A JPS606917B2 (en) 1982-09-28 1982-09-28 Method for producing Group 3-5 compound semiconductor single crystal

Publications (2)

Publication Number Publication Date
JPS5957993A JPS5957993A (en) 1984-04-03
JPS606917B2 true JPS606917B2 (en) 1985-02-21

Family

ID=15853657

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16764882A Expired JPS606917B2 (en) 1982-09-28 1982-09-28 Method for producing Group 3-5 compound semiconductor single crystal

Country Status (1)

Country Link
JP (1) JPS606917B2 (en)

Also Published As

Publication number Publication date
JPS5957993A (en) 1984-04-03

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