JPS606919B2 - Method for producing Group 3-5 compound single crystal - Google Patents
Method for producing Group 3-5 compound single crystalInfo
- Publication number
- JPS606919B2 JPS606919B2 JP19775982A JP19775982A JPS606919B2 JP S606919 B2 JPS606919 B2 JP S606919B2 JP 19775982 A JP19775982 A JP 19775982A JP 19775982 A JP19775982 A JP 19775982A JP S606919 B2 JPS606919 B2 JP S606919B2
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- melt
- current value
- rubbo
- single crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000013078 crystal Substances 0.000 title claims description 46
- 150000001875 compounds Chemical class 0.000 title claims description 17
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 239000000203 mixture Substances 0.000 claims description 15
- 239000000155 melt Substances 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 6
- BTYUGHWCEFRRRF-UHFFFAOYSA-N [As].[K] Chemical compound [As].[K] BTYUGHWCEFRRRF-UHFFFAOYSA-N 0.000 claims 1
- 239000002994 raw material Substances 0.000 description 10
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 229910052582 BN Inorganic materials 0.000 description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 229910052810 boron oxide Inorganic materials 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 241000219112 Cucumis Species 0.000 description 1
- 235000015510 Cucumis melo subsp melo Nutrition 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 235000008331 Pinus X rigitaeda Nutrition 0.000 description 1
- 235000011613 Pinus brutia Nutrition 0.000 description 1
- 241000018646 Pinus brutia Species 0.000 description 1
- FJJCIZWZNKZHII-UHFFFAOYSA-N [4,6-bis(cyanoamino)-1,3,5-triazin-2-yl]cyanamide Chemical compound N#CNC1=NC(NC#N)=NC(NC#N)=N1 FJJCIZWZNKZHII-UHFFFAOYSA-N 0.000 description 1
- HELFUSSVIADALN-UHFFFAOYSA-N [K+].[K+].[O-]B[O-] Chemical compound [K+].[K+].[O-]B[O-] HELFUSSVIADALN-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- 239000008280 blood Substances 0.000 description 1
- 210000004369 blood Anatomy 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 229910021478 group 5 element Inorganic materials 0.000 description 1
- 239000003721 gunpowder Substances 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 239000000565 sealant Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000005068 transpiration Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
この発明は高品質m−V族化合物単結晶の製造方法に関
する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for producing high quality m-V group compound single crystals.
m−V族化合物のうち、高純度のカリウム硯素(GaA
s)単結晶は比抵抗が1ぴQ・肌以上の半絶縁性物質で
あって、最近、超高速集積回路オプトェレクトロニクス
集積回路の素子用結晶基板として注目を浴びている。Among the m-V group compounds, high purity potassium boronate (GaA
s) A single crystal is a semi-insulating material with a resistivity of 1 pQ or more, and has recently attracted attention as a crystal substrate for elements of ultra-high-speed integrated optoelectronic integrated circuits.
しかしながら、現在知られている高圧封止引き上げ法で
作成された無添加○aAs単結晶は結晶内の抵抗分布が
不均一であって、比抵抗が1ぴQ・肌以上で、且つ抵抗
分布が均一な単結晶を再現性よく製造することは困難で
あった。However, the additive-free ○aAs single crystal produced by the currently known high-pressure sealing and pulling method has an uneven resistance distribution within the crystal, with a resistivity of more than 1 PQ. It has been difficult to produce uniform single crystals with good reproducibility.
その理由としてはGaAs溶融液の組成の検知及び制御
技術が確立されていないこと、溶融中のGaAsの品質
を測定する方法が存在していなかったこと等が挙げられ
る。この発明は上記に鑑みなされたものであって、m−
V族化合物の組成比の違いにより電流値が変化すること
に着目し、化合物溶融液に電圧を印加し、電流値を測定
することにより溶融液の組成比を知ることができ、溶融
液の組成を調整しながら電流値を測定し、所定値に到達
したら種結晶の引き上げ操作を行うことにより所望の抵
抗値を有する高品質のm−V族化単結晶が得られること
になる。Reasons for this include that technology for detecting and controlling the composition of the GaAs melt has not been established, and that there is no method for measuring the quality of GaAs during melting. This invention was made in view of the above, and m-
Focusing on the fact that the current value changes depending on the composition ratio of Group V compounds, it is possible to know the composition ratio of the melt by applying a voltage to the compound melt and measuring the current value. The current value is measured while adjusting the current value, and when a predetermined value is reached, the seed crystal is pulled up, thereby obtaining a high quality m-V group single crystal having a desired resistance value.
以下、本発明を添付の図面に塞き説明すると、第1図は
単結晶製造装置の一例を示し、1は高圧容器であって、
この高圧容器1内にはその外周を炭素材料等の支持部材
4で覆れた石英、窒化ボロン等のルッボ3を設け、この
ルッボ3を回転支持軸6により回転且つ上下動できるよ
うに支持し、ルツポ3の周囲にはヒーター2を設けて、
ルツボを所定の温度に加熱、維持する。Hereinafter, the present invention will be explained with reference to the accompanying drawings. FIG. 1 shows an example of a single crystal manufacturing apparatus, and 1 is a high-pressure container,
A rubbo 3 made of quartz, boron nitride, etc., whose outer periphery is covered with a support member 4 made of carbon material, etc. is provided inside the high-pressure vessel 1, and the rubbo 3 is supported by a rotation support shaft 6 so that it can rotate and move up and down. , a heater 2 is provided around the Lutsupo 3,
Heat and maintain the crucible at a predetermined temperature.
ルッボ3の上部には下端に種結晶9を取付けた導電性の
引き上げ軸5を設け、この引き上げ軸は回転すると共に
上下動するように構成する。そして、ルッボの支持部村
4と種結晶引き上げ軸5にはリード線10,11をそれ
ぞれ接続する。上記の如き構成の装置において、ルツボ
3にはm−V族化合物を構成するm族及びV族元素をそ
れぞれ所定量入れ、更に高圧封止剤として酸化ボロン(
B203)を所定量添加し、ルッボを高圧容器1内に設
置し、アルゴン、窒素等の不活性ガスにより容器内を加
圧し、ヒーター2により原料元素の熔融温度以上の温度
で加熱してルッボ内の元素を熔融させる。m−V族化合
物としてはGaAs、lnP,Gap,Gasbが挙げ
られ、これらを構成する元素を原料として用いる。上述
の加熱処理によりルッボ3内に於ては上層に高圧封仕剤
として&03溶融液8が、下層にはm−V族化合物熔融
液7が形成する。A conductive pulling shaft 5 with a seed crystal 9 attached to the lower end is provided on the upper part of Rubbo 3, and this pulling shaft is configured to rotate and move up and down. Then, lead wires 10 and 11 are connected to the support section 4 of Rubbo and the seed crystal pulling shaft 5, respectively. In the apparatus configured as described above, the crucible 3 is filled with predetermined amounts of group m and group V elements constituting the m-V group compound, and boron oxide (
A predetermined amount of B203) is added, the Rubbo is placed in a high-pressure container 1, the inside of the container is pressurized with an inert gas such as argon or nitrogen, and the heater 2 is heated to a temperature higher than the melting temperature of the raw material elements. melt the elements. Examples of m-V group compounds include GaAs, InP, Gap, and Gasb, and elements constituting these are used as raw materials. By the above-described heat treatment, &03 melt 8 is formed as a high-pressure sealant in the upper layer in Rubbo 3, and m-V group compound melt 7 is formed in the lower layer.
ルッボ内の原料が溶融したら引き上げ軸5を下降させ種
結晶9をルッボ3内の溶融液7と接触させる。このよう
な状態で、リード線10,11を介してルツボ支持体4
と引き上げ軸5に電源官2より交流電圧を印加すると、
結晶原料溶融液7は抵抗体と見倣され「ルッボは絶縁体
のためコンデンサーと考えることができ、電流計13に
は溶融液7の抵抗値に対応する電流値が表示されること
になる。When the raw material in Rubbo is melted, the pulling shaft 5 is lowered to bring the seed crystal 9 into contact with the melt 7 in Rubbo 3. In this state, the crucible support 4 is connected via the lead wires 10 and 11.
When an AC voltage is applied from the power source 2 to the pulling shaft 5,
The crystal raw material melt 7 can be regarded as a resistor, and since Rubbo is an insulator, it can be thought of as a capacitor, and the ammeter 13 will display a current value corresponding to the resistance value of the melt 7.
上述の電気回路を流れる電流値はルッボ内に溶融してい
るm−V族化合物の組成比によって変る。The value of the current flowing through the above-mentioned electric circuit changes depending on the composition ratio of the m-V group compound melted in Rubbo.
例えばルッボを約126000で加熱した時のGa船の
組成比の変化と電流値の変化は第2図のグラフに示すよ
うな関係があり、Gaが約51.3%,Asが約48.
7%の組成比の時に最大電流値を示し、0.27〜0.
3mAの範囲(図中の点線で示す範囲)の電流が流れて
いる場合は、ルッボ内の溶融GaAsの組成比は結晶成
長に最適な範囲内であることとなる。この電気信号は「
また、ルッボ内のm−V族化合物溶融液の温度によっ
て変化する。For example, when Lubbo is heated to about 126,000 ℃, the change in the composition ratio of the Ga vessel and the change in the current value have a relationship as shown in the graph of Figure 2, where Ga is about 51.3% and As is about 48%.
The maximum current value is shown when the composition ratio is 7%, and the current value is 0.27 to 0.
When a current in the range of 3 mA (range indicated by the dotted line in the figure) flows, the composition ratio of molten GaAs in Rubbo is within the optimum range for crystal growth. This electrical signal is
Moreover, it changes depending on the temperature of the m-V group compound melt in Rubbo.
即ち、第3図に示すように「 ルッボ内のGa船の組成
比を一定として(Ga50%、偽50%)、ルッボの加
熱温度を高めると「電流値は温度の上昇と共に増加する
。このことから、種付け時での電流値の変化は結晶を固
化し始める温度を反映しており、組成の変化により固化
開始温度と相関があるものと考えられる。この発明は上
述の如く。In other words, as shown in Figure 3, if the heating temperature of Rubbo is increased while the composition ratio of the Ga vessel in Rubbo is constant (Ga 50%, false 50%), the current value increases as the temperature rises. Therefore, it is considered that the change in the current value at the time of seeding reflects the temperature at which the crystal starts to solidify, and is correlated with the solidification start temperature due to the change in composition.This invention is as described above.
結晶引き上げ操作を行う前に熔融液の電流値を測定する
ことにより溶融液の組成比を正確に把握することができ
きるのであるから、例えば溶融液力むa船の場合、Ga
が過剰の場合かAsをルッボ内溶融液へ供給して電流が
所定値となったら結晶引き上げ操作を行うことにより所
望の組成比の単結晶を得ることができる。また、Asが
過剰の場合は高圧容器内の圧力を所定の値だけ減圧して
Asをルッボ内の結晶原料溶融液より蒸散させることに
より電流値が上昇することになる。Gaが過剰の溶融液
の調整に使用するAs供給装置の一例を第4図について
説明すると、高圧容器1の上部側壁に開設した閉口部1
4に旨筒15の開□端を気密に接続する。By measuring the current value of the melt before carrying out the crystal pulling operation, the composition ratio of the melt can be accurately determined.
If the amount of As is excessive, a single crystal having a desired composition ratio can be obtained by supplying As to the melt in the rubbo and performing a crystal pulling operation when the current reaches a predetermined value. If As is excessive, the current value will increase by reducing the pressure in the high-pressure container by a predetermined value to evaporate As from the crystal raw material melt in Rubbo. An example of an As supply device used for adjusting a molten liquid containing excess Ga is explained with reference to FIG. 4.
Connect the open □ end of the cylinder 15 to 4 in an airtight manner.
旨筒15内には先端が高圧容器1内に突入する支持機1
8があり、支持棒先端には枇素収納容器16を固定し、
この支持榛の後端には永久磁石28を設ける。旨筒15
の外周面には環状の永久磁石19を鉄合させ、この環状
磁石19は支持極後端の磁石2Qと旨筒の壁部を挟んで
互に吸引し、環状磁石聾9を旨筒外周に沿って摺動させ
るとそれに伴って支持榛18を旨筒内を前後に移動する
ことになる。上記収納容器量6の支持榛竃8の固定端近
傍にはパイプ17の一端を接続し、屈曲してその先端は
容器の前方に延び、支持棒が旨筒内を下降したときにル
ッボ3内に突入するように構成する。容器16の周囲に
はヒーター21を設け、容器内を加熱するように構成す
る。上述の容器「支持棒、旨筒は石英またはパイロリテ
ック窒化ボロンで形成されている。上記の如き構成にて
、容器16内にはAsを予じめ装填し、環状磁石19に
より支持棒18を上端に引き上げて容器を開□部14内
に待機させておく。Inside the cylinder 15 is a support device 1 whose tip enters into the high pressure container 1.
8, and a phosphorus storage container 16 is fixed at the tip of the support rod.
A permanent magnet 28 is provided at the rear end of this support rod. Umatsutsu 15
An annular permanent magnet 19 is iron-coupled to the outer circumferential surface of the support pole, and the annular magnet 19 and the magnet 2Q at the rear end of the support pole are attracted to each other across the wall of the cylinder, and the annular magnet 9 is attached to the outer circumference of the cylinder. When the support rod 18 is slid along the cylinder, the support rod 18 is moved back and forth within the cylinder. One end of a pipe 17 is connected to the vicinity of the fixed end of the support rod 8 of the storage container 6, and the pipe 17 is bent so that its tip extends to the front of the container, so that when the support rod descends inside the cylinder, Configure it to enter. A heater 21 is provided around the container 16 to heat the inside of the container. The support rod and cylinder of the container described above are made of quartz or Pyrolithic boron nitride. The container is pulled up to the upper end and kept waiting inside the open square section 14.
ルッポ3内に原料を入れ、所定の圧力及び温度にし、ル
ッボ内の原料が溶融したら、種結晶9を下降させ、結晶
原料溶融液7に接触させて、電流値を測定する。測定し
た電流値よりAsが不足していることが判明したら、旨
筒15に隊合している環状磁石19を下降させ、その結
果、As収納容器16はルツボ3に近ずき、パイプ17
の先端は溶融液7に突入されることになる。A raw material is put into the Lubbo 3, the pressure and temperature are set to a predetermined value, and when the raw material in the Lubbo is melted, the seed crystal 9 is lowered and brought into contact with the crystal raw material melt 7, and the current value is measured. If it is determined that As is insufficient based on the measured current value, the annular magnet 19 aligned with the cylinder 15 is lowered, and as a result, the As storage container 16 approaches the crucible 3 and the pipe 17
The tip will be plunged into the melt 7.
高圧容器1内はAaの融点以上の温度であるため、As
蒸気はパイプ17端より噴出しており、結晶原料溶液中
にAsが吹き込まれることになる。吹き込み量が不足し
ている場合はヒーター21‘こより容器16を更に積極
的に加熱することにより瓜蒸気の噴出量は増加する。こ
のように気化されたAsを溶融液に吹込んで反応させ、
電流値が所定の値に下がったら、結晶の引き上げ操作を
行う。Asが過剰の場合は高圧容器内の圧力を減圧する
と圧力のバランスを保つため$が蒸発するので、調整が
Ga過剰の場合に較べて容易である。Since the temperature inside the high-pressure container 1 is higher than the melting point of Aa, As
Steam is ejected from the end of the pipe 17, and As is blown into the crystal raw material solution. If the blowing amount is insufficient, the container 16 is further actively heated by the heater 21', thereby increasing the blowout amount of melon steam. The thus vaporized As is blown into the melt and reacted.
When the current value falls to a predetermined value, a crystal pulling operation is performed. If As is in excess, the pressure in the high-pressure container is reduced and $ is evaporated to maintain the pressure balance, so adjustment is easier than in the case of excess Ga.
第5図のグラフはAsの蒸発処理時間と電流値の関係を
示すグラフであって、溶融液の電流値を測定した結果、
約0.2触れの値であったので、高圧容器内の圧力を3
の気圧より1気圧に下げ1時間後、及び2時間後の電流
値を測定した結果、電流値は次第に上昇し、Asが次第
に減少していることが判る。この発明は上述の如く、結
晶引き上げ操作を行う前に溶融液の電流値を測定し、所
定の範囲の組成比に相当する電流値が得られない場合は
、上述の如く、Asを供給したり、或は蒸散させて所望
の組成比に調整してから結晶の引き上げ操作を行うもの
であるから、高品質の山−V族化合物単線晶が再現性よ
く得られ、GaAs以外に1岬,lnAs等のm−V族
化合物単結晶の製造にも適用できる。The graph in FIG. 5 is a graph showing the relationship between the As evaporation treatment time and the current value, and as a result of measuring the current value of the melt,
Since the value was about 0.2 touch, the pressure inside the high pressure vessel was reduced to 3.
As a result of measuring the current value 1 hour and 2 hours after lowering the atmospheric pressure from 1 atm to 1 atm, it can be seen that the current value gradually increases and As gradually decreases. As described above, this invention measures the current value of the melt before performing the crystal pulling operation, and if a current value corresponding to the composition ratio within a predetermined range cannot be obtained, as described above, As is supplied or Alternatively, since the crystal is pulled after adjusting the desired composition ratio by evaporation, high-quality single-line crystals of Yama-V group compounds can be obtained with good reproducibility. It can also be applied to the production of m-V group compound single crystals such as.
・次に本発明の実施例を述べる。 - Next, examples of the present invention will be described.
第1図に示すような構造の単結晶製造装置において、内
径100肋、深さ100柳のパイロリテック窒化ボロン
製ルッボにガリウム500夕、枇素550夕、含水率1
0Q血の酸化ボロン180夕を入れ、高圧容器内に設置
してアルゴンガスを圧入し約5ぴ気圧にした後、ルッボ
を130000に加熱して上に珍03溶融液層が、下に
GaVs溶融液層が形成した時点でルツボの温度を12
60ooに下げ「容器内の圧力を2ぴ気圧に下降して種
結晶をGaAs溶融液に接触させ、15Vの交流電圧を
印加した。In a single crystal manufacturing apparatus having a structure as shown in Fig. 1, a rubbo made of Pyrolithic boron nitride with an inner diameter of 100 ribs and a depth of 100 yen is coated with 500 g of gallium, 550 g of phosphorus, and a water content of 1.
After putting 180 tons of 0Q blood boron oxide, placing it in a high-pressure container and pressurizing argon gas to make it about 5 pressures, heat the rubbo to 130,000 degrees to create a layer of 03 molten liquid on the top and a layer of molten GaVs on the bottom. When the liquid layer is formed, the temperature of the crucible is increased to 12
The pressure inside the container was lowered to 2 p atm, the seed crystal was brought into contact with the GaAs melt, and an AC voltage of 15 V was applied.
この時の電流値は0.3勿公であったので、第4図に示
したAs供給装置を用いて気化した舷を溶融液に30分
間吹込み、電流値が0.数hAに下ったので、種結晶を
Ga船溶融液に接触させ、10帆/時の速度で引き上げ
操作を行って、直径約5仇肋、長さ約10仇舷のGa松
単結晶を得た。この単結晶を縦割りのゥェハ−にして結
晶中の成長方向の抵抗分布を調べた結果を第6図のグラ
フに示す。グラフ中、曲線aが本発明の方法により得ら
れた結晶の抵抗値で結晶成長方向全体について1080
・肌以上の安定した高抵抗値を示していた。参考までに
、Asの吹込み操作を行わないで、製造した単結晶の縦
割りウヱハーの成長方向の抵抗値は曲線bに示す如く、
不均一で結晶端部ではGa過剰の傾向を示し、急激に低
下した。Since the current value at this time was 0.3, the vaporized gunpowder was blown into the melt for 30 minutes using the As supply device shown in FIG. Since the temperature had dropped to several hA, the seed crystal was brought into contact with the molten liquid of the Ga vessel, and a pulling operation was performed at a speed of 10 sails/hour to obtain a Ga pine single crystal with a diameter of about 5 ribs and a length of about 10 sails. Ta. The graph of FIG. 6 shows the results of examining the resistance distribution in the crystal growth direction using this single crystal as a vertically divided wafer. In the graph, curve a is the resistance value of the crystal obtained by the method of the present invention, which is 1080 in the entire crystal growth direction.
・It showed a stable high resistance value that was higher than that of the skin. For reference, the resistance value in the growth direction of a vertically split single crystal wafer manufactured without performing the As blowing operation is as shown in curve b.
It was non-uniform and showed a tendency of excessive Ga at the crystal edges, and decreased rapidly.
第1図は本発明の方法を実施するための単結晶製造装置
の一例を示す断面図、第2図はGa粕組成比と電流値の
関係の一例を示すグラフ。
第3図はGaAs溶融液の温度と電流値の関係を示すグ
ラフ、第4図はAs供給装置の一例を示す断面図、第5
図はAsの蒸散状態と電流値の関係を示すグラフ。第6
図は本発明の方法によって得られたGa船単結晶の抵抗
値分布図である。図中、1は高圧容器、2はヒーター、
3はルッボ、5は引き上げ軸、7は結晶原料溶融液、9
は種結・晶、12は電源を示す。
第1図
第2図
第3図
第4図
第5図
第6図FIG. 1 is a sectional view showing an example of a single crystal manufacturing apparatus for carrying out the method of the present invention, and FIG. 2 is a graph showing an example of the relationship between Ga lees composition ratio and current value. FIG. 3 is a graph showing the relationship between the temperature of the GaAs melt and the current value, FIG. 4 is a cross-sectional view showing an example of an As supply device, and FIG.
The figure is a graph showing the relationship between the transpiration state of As and the current value. 6th
The figure is a resistance value distribution diagram of a Ga carrier single crystal obtained by the method of the present invention. In the figure, 1 is a high pressure vessel, 2 is a heater,
3 is Rubbo, 5 is the pulling axis, 7 is the crystal raw material melt, 9
indicates a seed crystal/crystal, and 12 indicates a power source. Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6
Claims (1)
において、III−V族化合物溶融液に交流電圧を印加して
その電流値が0.27〜0.3mAの範囲にあるように
溶融液中のIII−V族化合物の組成比を調整して種結晶の
引き上げ操作を行うことを特徴とするIII−V族化合物結
晶の製造方法。 2 III−V族化合物はカリウム砒素化合物である特許請
求の範囲第1項記載の製造方法。[Claims] 1. A method for producing III-V group compound crystals by a pulling method, in which an alternating current voltage is applied to a III-V group compound melt and the current value is in the range of 0.27 to 0.3 mA. 1. A method for producing a III-V compound crystal, which comprises adjusting the composition ratio of the III-V compound in the melt and pulling the seed crystal. 2. The manufacturing method according to claim 1, wherein the III-V group compound is a potassium arsenic compound.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19775982A JPS606919B2 (en) | 1982-11-12 | 1982-11-12 | Method for producing Group 3-5 compound single crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19775982A JPS606919B2 (en) | 1982-11-12 | 1982-11-12 | Method for producing Group 3-5 compound single crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5988393A JPS5988393A (en) | 1984-05-22 |
| JPS606919B2 true JPS606919B2 (en) | 1985-02-21 |
Family
ID=16379871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19775982A Expired JPS606919B2 (en) | 1982-11-12 | 1982-11-12 | Method for producing Group 3-5 compound single crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS606919B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61151094A (en) * | 1984-12-26 | 1986-07-09 | Agency Of Ind Science & Technol | Production of single crystal of compound semiconductor |
| JPS61205697A (en) * | 1985-03-07 | 1986-09-11 | Nec Corp | Single crystal growth system for group iii-v compound semiconductor |
| JPS61222911A (en) * | 1985-03-28 | 1986-10-03 | Toshiba Corp | Synthesis of phosphorated compound |
-
1982
- 1982-11-12 JP JP19775982A patent/JPS606919B2/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5988393A (en) | 1984-05-22 |
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