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JPS608580B2 - Automatic focus adjustment device for scanning electron beam equipment, etc. - Google Patents
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JPS608580B2 - Automatic focus adjustment device for scanning electron beam equipment, etc. - Google Patents

Automatic focus adjustment device for scanning electron beam equipment, etc.

Info

Publication number
JPS608580B2
JPS608580B2 JP52043958A JP4395877A JPS608580B2 JP S608580 B2 JPS608580 B2 JP S608580B2 JP 52043958 A JP52043958 A JP 52043958A JP 4395877 A JP4395877 A JP 4395877A JP S608580 B2 JPS608580 B2 JP S608580B2
Authority
JP
Japan
Prior art keywords
electron beam
counter
output
count
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP52043958A
Other languages
Japanese (ja)
Other versions
JPS53128975A (en
Inventor
玄 伊達
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP52043958A priority Critical patent/JPS608580B2/en
Publication of JPS53128975A publication Critical patent/JPS53128975A/en
Publication of JPS608580B2 publication Critical patent/JPS608580B2/en
Expired legal-status Critical Current

Links

Description

【発明の詳細な説明】 本発明は走査型電子顕微鏡のような試料面を電子ビーム
等で掃引して映像信号を得る型の装置における自動焦点
調整装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an automatic focus adjustment device for an apparatus such as a scanning electron microscope that sweeps a sample surface with an electron beam or the like to obtain an image signal.

自動焦点調節に当っては合篤状態の検出が必要であり、
そのために種々な方法が提案されている。
When adjusting the automatic focus, it is necessary to detect the critical condition.
Various methods have been proposed for this purpose.

本発明はそのような合篤検出の方法を提案するものでは
なく、又特に何れかの方法に限定されるものではなく、
焦点調整の精度を上げることを目的としたものである。
本発明はしンズの焦点を変えながら合焦検出を行い、こ
の操作を繰返して平均を求めることにより焦点調整の精
度を上げるようにしたものである。
The present invention does not propose such a method of detecting disease, nor is it limited to any particular method.
The purpose is to improve the accuracy of focus adjustment.
The present invention improves the accuracy of focus adjustment by detecting focus while changing the focus of the lens, and by repeating this operation and calculating the average.

以下実施例により本発明を説明する。こ)に述べる実施
例は走査型電子顕微鏡を示し、図では電子顕微鏡の部分
は簡略化して書いてある。
The present invention will be explained below with reference to Examples. The embodiment described in (a) shows a scanning electron microscope, and the electron microscope part is simplified in the figure.

この実施例は映像信号を解析して焦点検出を行う場合の
合焦評価信号として映像信号中の交流成分の整流平滑信
号を用いたものである。1は対物レンズ、2は偏向コイ
ル、3は試料で、Bは電子線を示す。
In this embodiment, a rectified and smoothed signal of an alternating current component in a video signal is used as a focus evaluation signal when performing focus detection by analyzing a video signal. 1 is an objective lens, 2 is a deflection coil, 3 is a sample, and B is an electron beam.

4は試料から出る2次電子等を検出する検出器であり、
5は同検出器の出力を増幅する増幅器で電子ビームで試
料3を掃引すると増幅器5から映像信号が出力される。
4 is a detector that detects secondary electrons etc. emitted from the sample;
Reference numeral 5 denotes an amplifier for amplifying the output of the detector, and when the sample 3 is swept with an electron beam, a video signal is output from the amplifier 5.

こ)で電子ビームの掃引をしながら対物レンズーの励磁
電流を0から最大値まで変えて行くと途中で合焦状態を
経過し、この場合の映像信号は第2図aに示すようにな
る。この映像信号から交流成分のみを取出し整流して平
滑化すると第2図bに示す信号が得られる。映像信号の
交流成分は合焦状態で最大になるから第2図bのピーク
の中央が合篤状態を表わす。第2図bの波形は左右対称
的であるから、波形整形回路によって一定レベルで切っ
て第2図cのような信号に変換する。第2図の機軸は掃
引距離であり、掃引に伴い単調にレンズ1の励磁電流を
変えているので、機軸は励磁電流にも対応しており、第
2図cの矩形波の立上り点の励磁電流をna、立下り点
の励磁電流を血とすると合篤状態を与えるレンズ1の励
磁電流は(服+nb)ノ2である。或はnaとnbとの
電流差をNとするとna十Nノ2と書くこともできる。
上式によって対物レンズ量の励磁電流が決定されるが〜
この決定の精度向上を計るため上述操作をm回線返し
「上式の平均によって励磁電流を決定する。本発明はこ
の平均を求める操作を自動的に行うものである。第1図
においてPQまパルス発振器でその出力パルスはゲート
G亀を通してディジタルアナログ変換器DAに入力され
tDAからは段階状に変化する信号が得られこの信号に
よって対物レンズ母の励磁電源Sを制御して励磁電流を
0から最大値まで階段状に変化させて行く。
In this case, when the excitation current of the objective lens is changed from 0 to the maximum value while sweeping the electron beam, the in-focus state is passed midway through, and the image signal in this case becomes as shown in FIG. 2a. If only the alternating current component is taken out from this video signal and rectified and smoothed, the signal shown in FIG. 2b is obtained. Since the alternating current component of the video signal is at its maximum in the in-focus state, the center of the peak in FIG. 2b represents the in-focus state. Since the waveform in FIG. 2b is symmetrical, it is cut at a constant level by a waveform shaping circuit and converted into a signal as shown in FIG. 2c. The axis in Figure 2 is the sweep distance, and since the excitation current of lens 1 is monotonically changed as the sweep is performed, the axis also corresponds to the excitation current, and the excitation point at the rising point of the rectangular wave in Figure 2c is Assuming that the current is na and the excitation current at the falling point is blood, the excitation current of the lens 1 that provides a concomitant state is (cloth+nb)/2. Alternatively, if the current difference between na and nb is N, it can also be written as na+N-2.
The excitation current for the objective lens amount is determined by the above formula.
In order to improve the accuracy of this determination, the excitation current is determined by repeating the above operation over m circuits and averaging the above formula.The present invention automatically performs the operation to obtain this average. The output pulse of the oscillator is input to the digital-to-analog converter DA through the gate G, and a stepwise changing signal is obtained from tDA.This signal controls the excitation power supply S of the objective lens mother, increasing the excitation current from 0 to the maximum. Change the value stepwise.

この間増幅器Sから出力される映像信号は波形成形回路
(レベル比較器)6に入力され〜 鯖からは第2図cの
波形が得られることになる。G2は通常開で6の出力の
立上り即ち第2図cにおけるMの位置で閉じられるゲー
トであり「パルス発振器PGの出力パルスはゲートG2
を通ってカウンタC川こ入力されて計数される。カウソ
タC…まm進カウン夕で計数がmになるとキャリー信号
を出して自身は川と戻る。このキャリー信号がカウン夕
C盤もこ計数される。従ってC2は電子ビームの掃引の
開始から励磁電流がnaになるまでの間のパルス数の1
ノm則ち励磁電流naの1/mを与える。G3は波形整
形回路6の出力がハィの間貝0ち第2図cでnaからn
bまでの間開いているゲートで〜同ゲートを通してパル
ス発振器PGのパルスがカウンタC3に送られて計数さ
れる。C3は2h進カウン夕で計数が2〜こなるとキャ
リー信号を出し0に戻る。このキヤIJ−信号もまたカ
ウンタC2に入力される。ゲートG2は励磁電流が0か
らnaまで、G3はnaからnbまで開いているので、
カウン夕G2には掃引の始めから励磁電流がnb‘こな
るまでの間連続して計数を行い、その計数値は−回の掃
引の間に服/m十Nノ2h となる。
During this time, the video signal output from the amplifier S is input to the waveform shaping circuit (level comparator) 6, and the waveform shown in FIG. 2c is obtained from the mackerel. G2 is a gate that is normally open and is closed at the rise of the output of 6, that is, at the position M in FIG. 2c.
It is inputted to the counter C through the counter C and counted. Kausota C...When the count reaches m in the m-adjustable count, it issues a carry signal and returns to the river. This carry signal is also counted by the counter C. Therefore, C2 is 1 of the number of pulses from the start of the electron beam sweep until the excitation current reaches na.
nom, that is, 1/m of the excitation current na is given. G3 is from na to n in Figure 2c when the output of the waveform shaping circuit 6 is high.
The pulses of the pulse oscillator PG are sent to the counter C3 and counted through the gate which is open until b. C3 is a 2h counter, and when the count exceeds 2, it issues a carry signal and returns to 0. This carrier IJ- signal is also input to counter C2. Gate G2 is open from excitation current 0 to na, and gate G3 is open from na to nb, so
The counter G2 continuously counts from the beginning of the sweep until the excitation current reaches nb', and the counted value becomes 2h/mN during - times of the sweep.

さてゲートGIはカウン夕C4の計数出力が0からmま
での間開いているようになっており、G4は波形整形回
路6の出力の立下り(第2図cの血)によって計数を歩
進するようになっている。
Now, the gate GI is open while the count output of the counter C4 is from 0 to m, and the gate G4 increments the count by the fall of the output of the waveform shaping circuit 6 (the blood in Figure 2 c). It is supposed to be done.

またゲートGIを通ったパルスはカウンタC5で計数さ
れる。C5は計数noでキャリーするようになっており
、このキャリ−信号によって力ゥンタC亀,C3及びデ
ンジタルァナログ変換器口Aをリセットする。偏向コイ
ル2の偏向入力は上記キャリー信号を同期信号として制
御される。noは計数noに相当するディジタルアナロ
グ変換出力が最大励磁電流になるように定めてある。こ
のような構成であるから「電子ビームBの桶引はm回行
われ「 この間毎回カウン夕CI? C3によってその
回におけるMノ肌及びN/2hが求められ〜 これがカ
ウソ夕C2に入力されて加算積算されて行く。かくして
m回目の橋引で波形整形回路6の出力が立下つたときカ
ウンタC4から信号が出てゲートG軍が閉じ〜縞引信号
は通常の走査型電子顕微鏡における掃引信号に切換えら
れる。他方ゲートG亀が閉じた後はカウン夕C2の計数
は2(naノ靴十Nノ2h)但し2はm回の和を保持し
ている。この保持されている値はm回の掃引の各回にお
ける合焦時のレンズ励磁電流na十Nノ2の平均であり
ト最も正確な合篤状態を与える励磁電流の値を示す。以
後この保持されている計数値をカゥン夕C亀の計数mの
出力によって開かれるゲートG亀を通して変換器DAに
与えて対物レンズ貴の励磁電流を定める。ゲートG2は
一掃引の過程で掃引の始めから励磁電流がnaに達する
までの間開いている。
Further, the pulses passing through the gate GI are counted by a counter C5. C5 is designed to carry at count no, and this carry signal resets the power converter C, C3 and the digital analog converter port A. The deflection input of the deflection coil 2 is controlled using the carry signal as a synchronization signal. No is determined so that the digital-to-analog conversion output corresponding to count no becomes the maximum excitation current. With this kind of configuration, ``electron beam B is pumped m times,'' and each time during this period, M skin and N/2h for that time are determined by counter CI? C3. This is input to counter C2. Thus, when the output of the waveform shaping circuit 6 falls at the m-th bridge, a signal is output from the counter C4 and the gate G is closed.The striped signal is a sweep signal in a normal scanning electron microscope. On the other hand, after the gate G is closed, the count of the counter C2 is 2 (na no 10 N 2 h), but 2 holds the sum of m times. This held value is m It is the average of the lens excitation current (na 10N/2) at the time of focusing in each sweep, and indicates the value of the excitation current that gives the most accurate convergence condition. The excitation current of the objective lens is determined by applying it to the converter DA through the gate G which is opened by the output of the tortoise count m.The gate G2 is opened during the sweep process from the beginning of the sweep until the excitation current reaches na. ing.

このためG沙まカウン夕C5の0計数出力で開かれ「波
形整形回路6の出力の立上りで閉じられる。第8図の実
施例は上述構成を粗調整、糟調整の2段に用いるように
したもので、ディジタルアナログ変換器がDA亀?DA
2の2個あり、スイッチSwによって選択切換えができ
るようになっている。DA量,DA2の出力は加算器A
dで加算されて励磁電流電源Sに送られる。その第1図
の実施例と対応する部分には同じ符号がつけてある。ま
ずスイッチSwを粗調側にして装置を動作させると第1
図の回路と全く同様の動作で焦点が調整される。次にス
イッチSwを精調側に切換える。DA2は一個のパルス
が入る度に出力はDAもの1/noだけ増加する。従っ
て一掃引の間にDA2はDAIの出力の一段分だけ変化
する。このDA2の出力が既に大体の合篤位置で固定さ
れているDA亀の出力に加算されて励磁電流電源Sに送
られる。かくしてもう一度回路を動作させると、DA2
を用いて第亀図の回路と同じ動作が再び行われ、m回の
掃引の後焦点の糟調整が完了する。しンズの励磁電流を
変化させる場合、レンズ磁界の確立にはおくれが伴うの
で掃引速度を余り速くできない。第3図の実施例では粗
調整、糟調整と2回線作するが、2回目の調整における
励磁電流の変化範囲はせまいので掃引速度を上げてもし
ンズの追従ができ、一回目は粗調整だから掃引速度が早
くてもよく、従って全体として調整所要時間は却って短
縮できる。本発明自動焦点調整装置は上述したような構
成で、合焦状態を与えるレンズ強度が何回かの合篤検出
動作の平均によって決められるので焦点決定の精度が高
く、第3図の実施例からも判るように一つの装置で粗調
整、精調整の多段調整が容易にできる利点がある。
For this reason, it is opened at the zero count output of the G-shape counter C5 and closed at the rising edge of the output of the waveform shaping circuit 6.The embodiment shown in FIG. So, the digital to analog converter is DA turtle?
There are two of them, 2, and they can be selected and switched using a switch Sw. DA amount, output of DA2 is added to adder A
d and sent to the exciting current power source S. Components corresponding to those in the embodiment of FIG. 1 are given the same reference numerals. First, when the switch Sw is set to the coarse adjustment side and the device is operated, the first
The focus is adjusted in exactly the same way as the circuit shown in the figure. Next, switch Sw is switched to the fine adjustment side. Every time one pulse is input to DA2, the output increases by 1/no of that of DA. Therefore, during the sweep, DA2 changes by one step of the output of DAI. The output of this DA2 is added to the output of the DA tortoise, which is already fixed at the approximate position, and is sent to the exciting current power source S. Thus, when the circuit is operated again, DA2
The same operation as in the circuit shown in Figure 1 is performed again using , and the focus adjustment is completed after m sweeps. When changing the lens excitation current, there is a delay in establishing the lens magnetic field, so the sweep speed cannot be increased very much. In the embodiment shown in Fig. 3, two circuits are used, one for coarse adjustment and one for coarse adjustment, but since the range of change in the excitation current in the second adjustment is narrow, it is possible to follow the current by increasing the sweep speed, and the first adjustment is for coarse adjustment. The sweep speed may be fast, and therefore the overall adjustment time can be shortened. The automatic focus adjustment device of the present invention has the above-described configuration, and the lens strength that provides the in-focus state is determined by the average of several focus detection operations, so the accuracy of focus determination is high. As can be seen, there is an advantage that multi-stage adjustments such as coarse adjustment and fine adjustment can be easily performed with one device.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の−実施例装置の回路構成を示すブロッ
ク図「第2図は上記回路の動作を説明する信号波形図、
第3図は本発明の他の実施例を示すブロック図である。 1・・…・対物レンズ、2…・・。偏向コイル、3…・
・・試料、B・…・・電子ビーム「PG…・・・パルス
発振器、GI〜G4・・・…ゲート、DA,DA1,D
A2…・・・ディジタルアナログ変換器、CI〜C5…
…カウンタ、4・・・…電子線検出器、5・…・・増幅
器、6・・・・・・波形整形回路(レベル比較回路)。
次′図が2図 が3図
FIG. 1 is a block diagram showing the circuit configuration of an embodiment of the present invention; FIG. 2 is a signal waveform diagram illustrating the operation of the above circuit;
FIG. 3 is a block diagram showing another embodiment of the present invention. 1...Objective lens, 2... Deflection coil, 3...
...Sample, B...Electron beam "PG...Pulse oscillator, GI~G4...Gate, DA, DA1, D
A2...Digital to analog converter, CI to C5...
...Counter, 4...Electron beam detector, 5...Amplifier, 6...Waveform shaping circuit (level comparison circuit).
Next' figure is 2 figure is 3 figure

Claims (1)

【特許請求の範囲】[Claims] 1 電子線ビーム等によって試料面を掃引し、掃引の過
程で、パルス発振器の出力パルスを計数し、その計数信
号をDA変換してレンズ強度を変え、上記パルス発振器
の出力パルスをm進カウンタで計数し、更に同カウンタ
のキヤリー信号を計数するカウンタを設け、映像信号に
対する合焦評価信号が基準レベルを超えるまで及び超え
ている間の上記キヤリー信号を計数するカウンタの計数
出力を夫々電子線ビーム等によるm回の掃引の間積算し
、前者の積算出力に後者の積算出力の1/2を加算した
信号をレンズ強度を示すデイジタル信号とすることによ
り焦点調整を行うことを特徴とした走査型電子線装置等
の自動焦点調整装置。
1 Sweep the sample surface with an electron beam, etc., count the output pulses of the pulse oscillator during the sweeping process, convert the count signal from DA to change the lens strength, and measure the output pulses of the pulse oscillator with an m-ary counter. A counter is provided to count the carry signals of the same counter, and the count output of the counter that counts the carry signals until and while the focus evaluation signal for the video signal exceeds the reference level is counted by the electron beam. A scanning type that performs focus adjustment by integrating a signal obtained by adding 1/2 of the integrated output of the former and 1/2 of the integrated output of the latter during m sweeps, etc., as a digital signal indicating lens strength. Automatic focus adjustment device for electron beam equipment, etc.
JP52043958A 1977-04-15 1977-04-15 Automatic focus adjustment device for scanning electron beam equipment, etc. Expired JPS608580B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52043958A JPS608580B2 (en) 1977-04-15 1977-04-15 Automatic focus adjustment device for scanning electron beam equipment, etc.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52043958A JPS608580B2 (en) 1977-04-15 1977-04-15 Automatic focus adjustment device for scanning electron beam equipment, etc.

Publications (2)

Publication Number Publication Date
JPS53128975A JPS53128975A (en) 1978-11-10
JPS608580B2 true JPS608580B2 (en) 1985-03-04

Family

ID=12678204

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52043958A Expired JPS608580B2 (en) 1977-04-15 1977-04-15 Automatic focus adjustment device for scanning electron beam equipment, etc.

Country Status (1)

Country Link
JP (1) JPS608580B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6439986U (en) * 1987-09-07 1989-03-09

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0646554B2 (en) * 1983-09-02 1994-06-15 株式会社日立製作所 Automatic focusing method in electron beam equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6439986U (en) * 1987-09-07 1989-03-09

Also Published As

Publication number Publication date
JPS53128975A (en) 1978-11-10

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