JPS6114457B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a moisture resistance testing device for electronic components, etc., and particularly for testing the durability of electronic components under test by exposing them to stress caused by a combination of specific temperature and humidity. This relates to a test device for measurement.

As a conventional method for testing the humidity resistance of electronic components, a so-called constant temperature and humidity chamber test device has been used, in which steam is supplied from a boiler to a constant temperature chamber to control the humidity inside the chamber. This device is currently widely used because it can relatively easily adjust the humidity from room temperature to 100% within the temperature range from room temperature to around 100 degrees Celsius. However, with this device, it is very difficult to control humidity in the range below room temperature to 0℃ and at temperatures above 100℃, and there are also problems with the system that supplies steam from the boiler to the tank and controls the humidity inside the tank. There were disadvantages such as frequent occurrence and high equipment costs.

The present invention provides a test device that can easily control the humidity applied to a specimen under any temperature conditions, and includes a first sealed container that houses the specimen, and a test device that saturates the water vapor in the first sealed container. The second airtight container containing a sufficient amount of water is communicated with each other through a passage, and an opening/closing valve is provided in the passage.

Embodiments of the present invention will be described below with reference to the drawings. The apparatus of the present invention comprises a first sealed container 1 that accommodates a specimen, a second sealed container 2 that is filled with water in an amount sufficient to saturate water vapor, a passage 3 that communicates between both containers 1 and 2, and It consists of an opening/closing valve 4 provided in the middle of the passage 3.

Although the drawing shows an example in which the container main body B is partitioned by a partition wall and the first sealed container 1 and the second sealed container are formed therein, the structure is not necessarily limited to this, and the first sealed container 1 and the second sealed container 2 may be configured to communicate with each other through a pipe 3 having a valve 4.

Lid plate 5 that covers the top opening of the first airtight container 1
It has a piping 6, and a valve 7 is attached to the piping 6. The lid plate 5 is attached to the first sealed container 1 by bolts 8.
It is removably fixed. On the other hand, the second
A pipe 9 is connected to the upper surface of the closed container 2, and a valve 10 is provided on the pipe 9.

The specimen M is housed in the first airtight container 1 of the apparatus of the present invention, the lid is closed with the lid plate 5, the valve 7 is closed and the valves 4 and 10 are opened, and the specimen M is placed in the constant temperature bath 11 set at a temperature T ₁ . the second closed container 2 is filled with a sufficient amount of water, and the valve 10 is closed. current temperature
Let E ₁ be the saturated water vapor pressure corresponding to T ₁ . Next, with the apparatus of the present invention installed in the high temperature bath 11, the valve 4 is closed after a certain period of time, and the temperature of the thermostatic bath is raised to _T2 . Let E ₂ be the saturated water vapor pressure corresponding to this temperature T ₂ .

When the valve 4 is first opened, the water vapor pressure inside the first closed container 1 becomes E ₁ because saturated steam from the second closed container 2 fills the inside of the closed container 1 through the passage 3, and then Even if the valve 4 is closed and the temperature inside the constant temperature bath 11 is raised from T ₁ to T ₂ , the water vapor pressure inside the first closed container 1 is maintained at E ₁ . Therefore, the relative humidity inside the first closed container 1
When expressed as a percentage as a ratio between water vapor pressure and saturated water vapor pressure, RH is determined by the following equation (1).

RH=E ₁ /E ₂ ×100% ...(1) Generally, the humidity resistance test conditions include temperature stress
Since the temperature T ₂ and the humidity stress RH are given, when performing a humidity resistance test on the specimen M using the apparatus of the present invention, the temperature T ₁ is determined by the water vapor pressure E ₂ corresponding to the temperature T ₂ according to the above equation (1). Calculate the water vapor pressure E ₁ by substituting
It can be determined as the temperature corresponding to water vapor pressure _E1 .

Examples of the present invention are shown below.

Example This example uses specimen M as the moisture resistance test condition.
This shows the case where a durability test is conducted under stress at T ₂ = 85°C and RH = 80%. First, temperature T ₂ =
E ₂ corresponding to 85℃ is 433.6mmHg, relative temperature RH=
Since it is 85%, E ₁ = 368.56mmHg from the above equation (1).
is required.

Therefore, the temperature T ₁ corresponding to E ₁ is 81°C. Next, the specimen M is placed in the first sealed container 1,
The opening is covered with a cover plate 5, tightened and fixed with screws 8, and the valve 7 is closed. Next, the valves 4 and 9 are opened, and a sufficient amount of water is poured into the second sealed container 2 through the valve 10 into the second sealed container 2 so that the insides of both the sealed containers _{1 and} 2 reach saturated water vapor pressure at a temperature T1. supply to. Next, close the valve 10 and close both airtight containers 1 and 2.
is placed in a constant temperature bath 11 set at a temperature _T1 .

After both closed containers 1 and 2 reach a saturated water vapor pressure state, the valve 4 is closed while the containers are kept in the thermostatic chamber 11, the communication between the closed containers 1 and 2 is cut off, and the temperature inside the constant temperature chamber 11 is reduced to T. Increase the temperature to ₂ . In this state, the first
The relative temperature of the sealed container 1 is RH=85%, and a moisture resistance test of the specimen M is conducted under specified temperature and humidity conditions.

In the above embodiment, both closed containers 1 and 2 are placed in a constant temperature oven 11.
Although the case where the container is installed inside the container has been described, the present invention is not limited to this, and each sealed container can be directly heated with a heater.

As described above, according to the present invention, since the humidity in the first closed container 1 containing the specimen M can be freely adjusted in the thermostatic chamber 11, the humidity within the allowable temperature accuracy range of the thermostatic chamber 11 can be approximately There are no restrictions on humidity settings within the range of 0℃ to 100℃ and at high temperatures of 100℃ or higher, and the humidity can be set freely within any temperature range, and there is no humidity adjustment mechanism. Since it is extremely simple, it has the effect of being able to significantly improve the reliability and cost of the device compared to conventional devices.

[Brief explanation of the drawing]

The drawing is a longitudinal sectional view of a main part showing an embodiment of the device of the present invention. 1...First airtight container, 2...Second airtight container, 3
...Passage, 4...Valve, M...Specimen.

Claims (1)

[Claims] 1. A first sealed container that accommodates the specimen and a second sealed container that contains a sufficient amount of water to saturate the water vapor in the first sealed container are communicated with each other through a passage, and an opening/closing valve is provided in the passage. A moisture resistance test device characterized by being provided with.