JPS6127358B2 - - Google Patents
Info
- Publication number
- JPS6127358B2 JPS6127358B2 JP57005760A JP576082A JPS6127358B2 JP S6127358 B2 JPS6127358 B2 JP S6127358B2 JP 57005760 A JP57005760 A JP 57005760A JP 576082 A JP576082 A JP 576082A JP S6127358 B2 JPS6127358 B2 JP S6127358B2
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- melt
- gaas
- single crystal
- compound semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B27/00—Single-crystal growth under a protective fluid
- C30B27/02—Single-crystal growth under a protective fluid by pulling from a melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Description
【発明の詳細な説明】
本発明は、揮発性成分を構成元素の一つとする
化合物半導体の単結晶製造において、その化学量
論的組成比を一定に保ちながら結晶成長を行う装
置に関するもので、結晶全体がより均一な化学量
論的組成をもつ良質な化合物半導体結晶を再現性
よく製造するようにしたものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for growing a single crystal of a compound semiconductor having a volatile component as one of its constituent elements while keeping the stoichiometric composition constant. This method is designed to produce a high-quality compound semiconductor crystal with a more uniform stoichiometric composition throughout the crystal with good reproducibility.
近年、GaAs集積回路の基板単結晶として、高
純度アンドープ半絶縁性GaAsが注目されている
反面、化学量論的組成比の僅かなズレに起因する
と思われる各種の欠陥が存在していることも指摘
されている。このアンドープ半絶縁性GaAs単結
晶は、従来次の二つ方法で育成されているのが一
般的である。すなわち(1)ブリツジマン法などで化
学量論的組成比をもつGaAsの多結晶をSiO2製ボ
ート等を用いて先ず合成し、次いで上記多結晶を
SiO2あるいはBN製るつぼ内に液体封じ材である
B2O3とともに充填し、数気圧〜数10気圧下で溶
融し引上げ育成する、いわゆる液体封じ高圧溶融
引上げ法(Liquid Encapsucation
Czochealshi:LEC)でアンドープ半絶縁性
GaAs単結晶を育成する方法、(2)GaAsの原料であ
る高純度GaとAsとの直接SiO2あるいはBN(チツ
化ホウ素)製るつぼ内に化学量論的組成比に秤量
して充填し、液体封じ材B2O3を同じくるつぼ内
に入れて、約100気圧下で直接的にGaAsを合成溶
融し、その後数気圧に減圧してLEC法により単
結晶を引上げ育成する方法である。 In recent years, high-purity undoped semi-insulating GaAs has been attracting attention as a substrate single crystal for GaAs integrated circuits, but on the other hand, various defects that are thought to be caused by slight deviations in the stoichiometric ratio have also been observed. It has been pointed out. This undoped semi-insulating GaAs single crystal has conventionally been grown using the following two methods. In other words, (1) GaAs polycrystals having a stoichiometric composition are first synthesized using a boat made of SiO 2 by the Bridgeman method, etc., and then the above polycrystals are synthesized.
Liquid sealant in SiO2 or BN crucible
The so - called liquid encapsulation high-pressure melting and pulling method (Liquid Encapsucation
Czochealshi: LEC) and undoped semi-insulating
A method for growing GaAs single crystals: (2) high-purity Ga, which is the raw material for GaAs, and As are directly weighed and filled into a SiO 2 or BN (boron titanide) crucible at a stoichiometric composition; In this method, liquid sealing material B 2 O 3 is placed in the same crucible and GaAs is directly synthesized and melted under about 100 atmospheres, and then the pressure is reduced to several atmospheres and a single crystal is pulled and grown using the LEC method.
以上の代表的な製造方法では、大口径の半絶縁
性GaAs単結晶が得られるものの、(1)の方法にお
いては用いる多結晶GaAs中にSiを初めとする不
純物が多いと言う欠点があり(2)では高圧・高温
(100気圧、1250℃)下でGaAsと合成する際にAs
の揮発が多く、化学量論的組成比のGaAs融液、
従つて化学量論的組成比の単結晶が再現性よく得
られない、といつた大きな欠点がある。更に上記
(1)、(2)の方法において共通している問題点とし
て、単結晶育成中は数気圧〜数10気圧下で行うも
のの、溶融B2O3層を通してV族の揮発性成分で
あるAsの揮発が僅かであるが生じ、長時間の育
成では結晶の成長方向に沿つてCa/As比が漸次
変化したり、GaAs IC用基板としての歩留りが
低下することが指摘されている。 Although the typical manufacturing methods described above yield semi-insulating GaAs single crystals with large diameters, method (1) has the disadvantage that there are many impurities such as Si in the polycrystalline GaAs used ( In 2), As is synthesized with GaAs under high pressure and high temperature (100 atm, 1250°C).
GaAs melt with high volatilization and stoichiometric composition,
Therefore, a major drawback is that single crystals with stoichiometric composition cannot be obtained with good reproducibility. Further above
A common problem in methods (1) and (2) is that although single crystal growth is performed under several to several tens of atmospheres, As, a volatile component of group V, passes through the molten B 2 O 3 layer. It has been pointed out that when grown for a long time, the Ca/As ratio gradually changes along the crystal growth direction, and the yield as a GaAs IC substrate decreases.
この為に、例えば特公昭55−23798号の揮発性
成分を含む化合物結晶の製造方法では、揮発性成
分の蒸気で満たされる空間と高圧印加用の不活性
ガス空間との間に隔壁を設けて圧力差を自動的に
無くして揮発成分の損失を防ぐ方法も提案されて
いる。しかしながら、この方法では引上げ装置が
複雑となる欠点を有している。 For this reason, for example, in the method for producing compound crystals containing volatile components disclosed in Japanese Patent Publication No. 55-23798, a partition wall is provided between the space filled with the vapor of the volatile component and the inert gas space for applying high pressure. A method of automatically eliminating the pressure difference to prevent loss of volatile components has also been proposed. However, this method has the disadvantage that the lifting device is complicated.
他の揮発性成分を含む化合物半導体、たとえば
Inp、InAs等の−族化合物半導体、−
族、−族化合物においても、GaAsの場合と
同様、揮発成分の抑止制御が困難であつた。 Compound semiconductors containing other volatile components, e.g.
- group compound semiconductors such as Inp and InAs, -
Similarly to the case of GaAs, it has been difficult to control the suppression of volatile components in group and - group compounds.
本発明はこのような欠点を除去することを目的
とする。詳しくは、液体封じ溶融引上げ法
(LEC法)により単結晶を製造するに際し、るつ
ぼ外壁より揮発性元素の全部または一部を融液中
に供給することにより、融液中の揮発元素の存在
量を一定とし、化学量論的組成比を制御した化合
物半導体結晶を製造する方法及びその製造装置を
提供することを目的とする。 The present invention aims to eliminate these drawbacks. Specifically, when producing a single crystal using the liquid-encapsulated melt pulling method (LEC method), by supplying all or part of the volatile elements into the melt from the outer wall of the crucible, the amount of volatile elements present in the melt can be controlled. An object of the present invention is to provide a method of manufacturing a compound semiconductor crystal with a constant stoichiometric composition ratio and a manufacturing apparatus thereof.
したがつて、本発明による化合物半導体単結晶
の製造装置によれば、化合物半導体原料融液およ
び液体封じ剤を収納するためのるつぼと、この融
液に種結晶を接触させて単結晶を引き上げる装置
部を有する化合物半導体単結晶の製造装置におい
て、前記るつぼを上下動可能に支持するサセプタ
と、前記るつぼの上部および下部を独立して加熱
可能な加熱手段を有し、さらに前記るつぼは前記
融液および液体封じ剤を収納し、前記上部周縁に
リブを有する多孔性材製内るつぼと、この内るつ
ぼ外側に前記内るつぼ間に揮発製原料を収納する
ための空間部を形成し、前記リブの上部を液体封
じ剤が覆うように前記リブに係合して設けられる
外るつぼとより成り、前記リブは、内るつぼと外
るつぼにより形成された前記空間部に収納される
揮発性原料蒸気の過剰分を四散できるようになつ
ていることを特徴とするものである。 Therefore, the compound semiconductor single crystal production apparatus according to the present invention includes a crucible for storing a compound semiconductor raw material melt and a liquid sealant, and a device for bringing a seed crystal into contact with the melt and pulling the single crystal. A compound semiconductor single crystal manufacturing apparatus having a susceptor that supports the crucible in a vertically movable manner, and a heating means that can independently heat the upper and lower parts of the crucible, and an inner crucible made of a porous material for storing a liquid sealant and having ribs on the upper periphery; a space for storing a volatile raw material between the inner crucibles is formed on the outside of the inner crucible; an outer crucible that is provided in engagement with the rib so that the upper part is covered with a liquid sealant; It is characterized by the fact that it can be divided into four parts.
本発明によれば、原料融液を充填したるつぼの
多孔性壁を通して揮発性元素の一部または全部を
前記融液中に供給するため、揮発性元素の揮発分
はそのるつぼ外壁より供給されることとなり、一
定の組成比を有する融液より単結晶が育成される
こととなる。このため、良好な性質の単結晶を再
現性良く得ることができる。 According to the present invention, part or all of the volatile elements are supplied into the melt through the porous wall of the crucible filled with the raw material melt, so that the volatile components of the volatile elements are supplied from the outer wall of the crucible. Therefore, a single crystal is grown from a melt having a certain composition ratio. Therefore, a single crystal with good properties can be obtained with good reproducibility.
本発明を更に詳しく説明する。 The present invention will be explained in more detail.
第1図は本発明による製造装置の一実施例の断
面図であり、図中、1は化合物半導体融液及び液
体封じ材(B2O3等)を充填する多孔質性の内る
つぼ、2は多孔質内るつぼ1を納める、多孔質性
内るつぼ1に比べて長尺な外るつぼ、3は外るつ
ぼ2の内側に納める石英製スリーブるつぼ、4は
多孔質るつぼ1と石英製スリーブるつぼ3とで形
成される内空間、5は化合物半導体融液、6は化
合物半導体融液5の構成成分である揮発性元素の
塊、7は液体封じ材B2O3層、8は単結晶、9は
リブである。多孔質るつぼ1の上端周辺にはリブ
9がついており、リブ9と石英製スリーブるつぼ
3とで内空間4が形成されている。第2図は本発
明による二重構造のるつぼCを用いた単結晶引上
げ装置の概略図aとその垂直方向の温度分布bで
ある。第2図中、10は多孔質るつぼ1を加熱す
る上部ヒータ、11は外るつぼ2、底部に入れた
揮発性元素を加熱する下部ヒータ、12は結晶回
転引上軸、13は二重るつぼ(1,2,3で構成
される)Cを支え、かつ回転上下動可能なサセプ
タ、14は圧力チヤンバ、15は結晶観察用窓、
16は加圧用不活性ガス導入口、17はガス分配
板である。なお、上部ヒータ10及び下部ヒータ
11を独立に制御できる(温度制御系は図中省略
する)ので、第2図bに示す温度分布は任意に作
ることができる。多孔質るつぼ1の内空間4内で
の揮発成分の蒸気圧は下部ヒータ11の加熱温度
によつて制御されるものである。従つて、融液5
より液体封じ材7を通して揮発する揮発成分の補
償は下部ヒータ11の設定温度によつて最適に選
ぶことができる利点が生ずる。また、内空間4内
での揮発成分の蒸気が過剰であれば、多孔質るつ
ぼ1の上端円周についた同一材質の多孔質のリブ
9を通して離散することになる。 FIG. 1 is a cross-sectional view of one embodiment of the manufacturing apparatus according to the present invention, in which 1 is a porous inner crucible filled with a compound semiconductor melt and a liquid sealing material (B 2 O 3 etc.); 3 is a quartz sleeve crucible that is housed inside the outer crucible 2; 4 is a porous crucible 1 and a quartz sleeve crucible 3; 5 is a compound semiconductor melt, 6 is a mass of volatile elements that are constituents of the compound semiconductor melt 5, 7 is a liquid sealing material B 2 O 3 layer, 8 is a single crystal, 9 is a rib. A rib 9 is attached around the upper end of the porous crucible 1, and an inner space 4 is formed between the rib 9 and the quartz sleeve crucible 3. FIG. 2 is a schematic diagram (a) of a single crystal pulling apparatus using a double-structured crucible C according to the present invention and its vertical temperature distribution (b). In Figure 2, 10 is an upper heater that heats the porous crucible 1, 11 is an outer crucible 2, and a lower heater that heats the volatile elements placed in the bottom, 12 is a crystal rotation and pulling shaft, and 13 is a double crucible ( 1, 2, and 3) A susceptor that supports C and can be rotated and moved up and down, 14 is a pressure chamber, 15 is a crystal observation window,
16 is an inert gas inlet for pressurization, and 17 is a gas distribution plate. Note that since the upper heater 10 and the lower heater 11 can be controlled independently (the temperature control system is omitted from the figure), the temperature distribution shown in FIG. 2b can be created arbitrarily. The vapor pressure of the volatile components within the inner space 4 of the porous crucible 1 is controlled by the heating temperature of the lower heater 11. Therefore, melt 5
There is an advantage that the compensation for the volatile components that evaporate through the liquid sealing material 7 can be optimally selected depending on the set temperature of the lower heater 11. Further, if the vapor of the volatile components in the inner space 4 is excessive, it will be dispersed through the porous ribs 9 made of the same material attached to the upper circumference of the porous crucible 1.
本発明による製造装置において、製造される単
結晶は、基本的に限定されるものではなく、揮発
性成分を含む化合物半導体単結晶であれば、いか
なるものでもよい。たとえば、−族、−
族、−族化合物半導体単結晶、具体的には
GaAs、InP、InAs、GaP、InGaP、InGaAsなど
を有効に育成可能である。 In the manufacturing apparatus according to the present invention, the single crystal manufactured is not fundamentally limited, and any compound semiconductor single crystal containing a volatile component may be used. For example, − family, −
group, - group compound semiconductor single crystal, specifically
It is possible to effectively grow GaAs, InP, InAs, GaP, InGaP, InGaAs, etc.
以下本発明による製造装置の作用効果をGaAs
単結晶製造に例をとり説明する。例 1
第3図は本発明による二重るつぼCと炉内構成
でもつて行う単結晶製造方法の過程を図示したも
ので、第1図と第2図で示した石英製スリーブる
つぼ3、及び上部ヒータ10、下部ヒータ11を
のぞいた部分は省略してある。 The effects of the manufacturing apparatus according to the present invention will be explained below.
This will be explained using an example of single crystal production. Example 1 Fig. 3 illustrates the process of a single crystal manufacturing method carried out using a double crucible C and a furnace configuration according to the present invention. Parts other than the heater 10 and lower heater 11 are omitted.
先ず第3図aの如く予じめ補償する揮発性元素
であるAs6′を外るつぼ2(実際には石英製スリ
ーブるつぼ3)に入れ、多孔質るつぼ1(以後内
るつぼと称す)を外るつぼ2に入れる。そして、
GaAsを合成するために、内るつぼ1中に原料の
Ga18とAs19を化学量論的比率に秤量して充
填する。次に外るつぼ2の内径に合致した厚さ約
1cmの円板状B2O3(固体)7′を入れる。このと
き固体B2O37′が上部ヒータ10の中心より下半
分に位置するよう、二重るつぼC全体と上部ヒー
タ10との相対位置をサセプター13(図中省
略)で調整する。そして、上部ヒータ10に通電
してB2O37′のみを溶融して、第3図bのように
原料のGa18とAs19を覆う。次にサセプター
13を回転(約5rpm)しながら上昇させ、Gaと
溶融させるとともに上部ヒータ10の通電を導加
させてGaAs融液5を合成する(図c)。このと
き、チヤンバー14(第2図)内の圧力は約100
気圧とした。内るつぼ温度をGaAsの融点〜1230
℃より僅かに高かく保持し、るつぼとヒータ10
内に完全に入るようにして、合成されたGaAs融
液5の温度を安定化させるとともに、チヤンバー
14内の圧力を約5気圧に徐々に下げる(図
d)。このとき、補償用Asの部分の温度を下部ヒ
ータ11により設定温度に上昇しておく。そし
て、一定時間保持後、回転引上軸12(第2図)
につけたGaAs種子結晶を溶融B2O37を通して
GaAs融液12につけ、単結晶Crを引上げ育成し
た(図e)。 First, as shown in Fig. 3a, As6', a volatile element to be compensated, is placed in the outer crucible 2 (actually, the quartz sleeve crucible 3), and the porous crucible 1 (hereinafter referred to as the inner crucible) is placed in the outer crucible. Put it in 2. and,
In order to synthesize GaAs, raw materials are placed in the inner crucible 1.
Ga18 and As19 are weighed and filled in a stoichiometric ratio. Next, a disk-shaped B 2 O 3 (solid) 7' having a thickness of approximately 1 cm that matches the inner diameter of the outer crucible 2 is placed. At this time, the relative position of the entire double crucible C and the upper heater 10 is adjusted using the susceptor 13 (not shown) so that the solid B 2 O 3 7' is located in the lower half of the center of the upper heater 10. Then, the upper heater 10 is energized to melt only the B 2 O 3 7' and cover the raw materials Ga 18 and As 19 as shown in FIG. 3b. Next, the susceptor 13 is raised while rotating (approximately 5 rpm) to melt Ga and energize the upper heater 10 to synthesize the GaAs melt 5 (Figure c). At this time, the pressure inside the chamber 14 (Fig. 2) is approximately 100
It was taken as atmospheric pressure. Inner crucible temperature to GaAs melting point ~1230
Hold the crucible and heater slightly above 10°C.
By completely entering the chamber 14, the temperature of the synthesized GaAs melt 5 is stabilized, and the pressure inside the chamber 14 is gradually lowered to about 5 atmospheres (Figure d). At this time, the temperature of the compensation As portion is raised to a set temperature by the lower heater 11. After holding it for a certain period of time, the rotating pulling shaft 12 (Fig. 2)
A GaAs seed crystal dipped in molten B 2 O 3 is passed through 7
A single crystal of Cr was pulled and grown by immersing it in GaAs melt 12 (Figure e).
この過程において、c→dの過程では、例えチ
ヤンバー14内の圧力が原料As19の蒸気圧以
上であつても僅かに揮発し、またeの成長中にお
いてもGaAs融液5からB2O37を通して離散す
る。しかし、本発明によれば、補償用As6′が下
部ヒータ11の加熱により内空間4に満たされ、
内るつぼ1の多孔質壁(側壁及び底壁)を通し
て、As濃度の低いGaAs融液内に拡散し、融液内
対流によつて化学量論的比率が保たれる。 In this process, in the process from c to d, even if the pressure inside the chamber 14 is higher than the vapor pressure of the raw material As 19, there is a slight volatilization, and even during the growth of e, B 2 O 3 7 is removed from the GaAs melt 5. Discrete through. However, according to the present invention, the compensation As 6' is filled into the inner space 4 by the heating of the lower heater 11,
It diffuses into the GaAs melt with a low As concentration through the porous walls (side walls and bottom wall) of the inner crucible 1, and the stoichiometric ratio is maintained by convection within the melt.
以上の実施例で、化学量論的組成の保たれた高
純度アンドーブ半絶縁性GaAs単結晶(比抵抗107
Ωcm以上)が容易に得られた。 In the above example, a high-purity undoped semi-insulating GaAs single crystal (specific resistance 10 7
Ωcm or more) was easily obtained.
例 2
第4図をもつて説明する。なお図中、石英製ス
リーブるつぼ3及び上、下ヒータ10,11以外
は省略してある。外るつぼに多量の原料As19
を入れ、内るつぼ1を挿入し、内るつぼ1内には
原料のCa18のみと固体B2O37′を入れる。そし
て上、下ヒータ10,11と二重るつぼCとの相
対位置は、図4aの如く、内るつぼ1及び原料
As19を各々のヒータ10,11が加熱出来る
ように予じめ設置する。次に、上部ヒータ10を
GaAsの融点近く迄上昇させ、Ga融液20及び溶
融B2O3層7を形成する。そして、下部ヒータ1
1に電通してある設定温度T1に保ち原料As19
を揮発させ、内空間4にAs蒸気を満たす。この
とき、チヤンバ14内の圧力は温度T1で決まる
As蒸気圧より高かく保つておく。こうして、内
空間4に充満したAs蒸気は、内るつぼ1の多孔
質壁を通して高温のGa溶液20内に拡散し、
GaAs飽和融液が合成される。このとき、Ga融液
20はAsを含んでその体積が約2倍のGaAs融液
5となる(図b→c)ので、初めに充填するGa
の量を予じめ少なくしておくことが必要である。
GaAs融液5が合成された後、例1と同様に種子
結晶を用いて単結晶育成を行つた。以上の過程で
GaAs飽和融液5が合成された後の過剰な内空間
4内As蒸気は、内るつぼ1円周のリブ9を通し
て離散し、結晶育成中にGaAs融液5表面より揮
発するAsは、例1と同様に内るつぼ1の側壁及
び底壁を通して補償され、GaAs融液20の化学
量論組成は常に保たれる。こうして不純物の少い
高純度半絶縁性GaAs単結晶が得られた。Example 2 This will be explained using Figure 4. In the figure, components other than the quartz sleeve crucible 3 and the upper and lower heaters 10 and 11 are omitted. A large amount of raw materials As19 in the outer crucible
, insert the inner crucible 1, and put only the raw material Ca18 and solid B 2 O 3 7' into the inner crucible 1. The relative positions of the upper and lower heaters 10, 11 and the double crucible C are as shown in FIG.
The As 19 is installed in advance so that each of the heaters 10 and 11 can heat it. Next, the upper heater 10 is
The temperature is raised to near the melting point of GaAs, and a Ga melt 20 and a molten B 2 O 3 layer 7 are formed. And lower heater 1
The raw material As19 is kept at the set temperature T1, which is electrically connected to 1.
is volatilized and the inner space 4 is filled with As vapor. At this time, the pressure inside the chamber 14 is determined by the temperature T 1
Keep it higher than the As vapor pressure. In this way, the As vapor filling the inner space 4 diffuses into the high temperature Ga solution 20 through the porous wall of the inner crucible 1.
GaAs saturated melt is synthesized. At this time, the Ga melt 20 contains As and becomes the GaAs melt 5 whose volume is about twice that of the GaAs melt 5 (Fig. b→c).
It is necessary to reduce the amount in advance.
After the GaAs melt 5 was synthesized, single crystal growth was performed in the same manner as in Example 1 using seed crystals. In the above process
Excess As vapor in the inner space 4 after the GaAs saturated melt 5 is synthesized is dispersed through the ribs 9 around the inner crucible 1, and the As vaporized from the surface of the GaAs melt 5 during crystal growth is Similarly, compensation is made through the side walls and bottom wall of the inner crucible 1, and the stoichiometric composition of the GaAs melt 20 is always maintained. In this way, a highly pure semi-insulating GaAs single crystal with few impurities was obtained.
以上の例でみられるように、内空間に満たされ
た揮発成分の蒸気は内るつぼ壁を通して融液内に
拡散するとともに、内るつぼ上端周囲につけたリ
ブ9を通して離散していく。これを抑制する為に
は、チヤンバ14内の圧力を下部ヒータ11で加
熱される揮発性成分補償用元素6のその温度にお
ける蒸気圧よりも高かくすることで実現される。
また、これ以外に、例えば第5図に示すように、
外るつぼ2に密着挿入する石英製スリーブるつぼ
3の上端に多孔質るつぼ1のリブ9と同一サイズ
をもつ石英製リブ21を設けたスリーブるつぼ2
2を用いてもよい。また、前記の例で結晶成長と
ともにGaAs融液の深さが減少し、従つてB2O3層
も内るつぼ1の中におりてくる為に、内るつぼの
リブ9の上にはB2O3が残らなくなり、リブ9か
らの揮発性成分の離散が激しくなることも考えら
れる。それには第5図の石英スリーブ22を用い
る以外に、例えば第6図に示すような多孔質るつ
ぼ23を用いることでも離散抑制ができる。すな
わち、外るつぼ2と内るつぼ23のリブ24で作
られる空間25にB2O3が残り、外圧が効率よく
加わるので、リブ24を通しての揮発成分の蒸気
の離散が折止できる。 As seen in the above example, the vapor of the volatile components filling the inner space diffuses into the melt through the inner crucible wall and is dispersed through the ribs 9 provided around the upper end of the inner crucible. This can be suppressed by making the pressure inside the chamber 14 higher than the vapor pressure of the volatile component compensating element 6 heated by the lower heater 11 at that temperature.
In addition to this, for example, as shown in Figure 5,
A sleeve crucible 2 is provided with a quartz rib 21 having the same size as the rib 9 of the porous crucible 1 at the upper end of the quartz sleeve crucible 3 that is tightly inserted into the outer crucible 2.
2 may be used. In addition, in the above example, the depth of the GaAs melt decreases as the crystal grows, and therefore the B 2 O 3 layer also falls into the inner crucible 1, so there is no B 2 on the rib 9 of the inner crucible. It is also conceivable that no O 3 remains and that the volatile components from the ribs 9 become more dispersed. In addition to using the quartz sleeve 22 shown in FIG. 5, for example, a porous crucible 23 as shown in FIG. 6 may be used to suppress the scattering. That is, since B 2 O 3 remains in the space 25 formed by the ribs 24 of the outer crucible 2 and the inner crucible 23 and external pressure is applied efficiently, the dispersion of volatile component vapor through the ribs 24 can be prevented.
以上の例では−族化合物のGaAsについて
述べたが、揮発性元素と構成成分の一つとする他
の化合物半導体、例えばGaP、InP、InAsあるい
はInGaP、InGaAsのような結晶育成においても
本発明により高純度単結晶が製造できることはこ
れらの例より明らかである。また、−族以外
の−族及び−族化合物においても同様で
あることは容易に類推できる。 In the above example, GaAs, a - group compound, was described, but the present invention can also be applied to the crystal growth of other compound semiconductors that have volatile elements as one of their constituents, such as GaP, InP, InAs, InGaP, and InGaAs. It is clear from these examples that high purity single crystals can be produced. Furthermore, it can be easily inferred that the same holds true for - groups other than - groups and - group compounds.
前記の例では多孔質るつぼ1の材質としてBN
を用いたが、BNに限らず多孔質性のAlN、
Al2O3、カーボンなどでも効果は全く同じで、本
発明ではるつぼの材質を規定するものではない。
また、例1のべた固体B2O3を先ず溶融すること
については他の方法でも可能であり、また結晶育
成チヤンバ内の圧力、更には結晶回転、サセブタ
回転、サセブタ上昇など結晶育成条件に関しても
制約を受けるものではない。更には、不純物の添
加された高純度単結晶を製造するには、添加不純
物を内るつぼ1内に原料とともに挿入することで
可能である。 In the above example, BN is used as the material of the porous crucible 1.
However, not only BN but also porous AlN,
Al 2 O 3 , carbon, etc. have exactly the same effect, and the present invention does not specify the material of the crucible.
In addition, it is possible to first melt the solid solid B 2 O 3 in Example 1 using other methods, and the pressure in the crystal growth chamber, as well as the crystal growth conditions such as crystal rotation, susceptor rotation, and susceptor elevation, may also be changed. It is not subject to any restrictions. Furthermore, it is possible to produce a high-purity single crystal to which impurities have been added by inserting the added impurities into the inner crucible 1 together with the raw material.
本発明によれば、化合物半導体を構成する揮発
性元素蒸気をるつぼ外壁を通し融液中に拡散させ
るので、化学量論的組成を実現しえると言う利点
がある。 According to the present invention, since the volatile element vapor constituting the compound semiconductor is diffused into the melt through the outer wall of the crucible, there is an advantage that a stoichiometric composition can be realized.
第1図は本発明による化合物半導体単結晶製造
装置の一実施例の断面図、第2図は本発明による
化合物半導体単結晶製造装置の実施例のより具体
化したものの断面図、第3図、第4図は本発明に
よる製造装置の作用を説明するための説明図、第
5図は本発明に用いるるつぼの他の実施例を示す
断面図、第6図は本発明に用いるるつぼの第3の
実施例を示す断面図である。
1……多孔質るつぼ(内るつぼ)、2……外る
つぼ、3……石英製スリーブるつぼ、4……内空
間、5……化合物半導体融液、6……補償用揮発
性成分の塊、7……溶融B2O3、8……単結晶、
9……リブ、10……上部ヒータ、11……下部
ヒータ、12……結晶回転引上軸、13……サセ
プタ、14……圧力チヤンバ、15……観察用
窓、16……ガス導入口、17……ガス分配板、
18……原料Ga、19……原料As、7′……固体
B2O3、20……Ga融液、21……石英リブ、2
2……石英リブつきスリーブるつぼ、23……多
孔質るつぼ、24……リブ、25……リブ24と
外るつぼで作られる空間。
FIG. 1 is a cross-sectional view of an embodiment of the compound semiconductor single crystal manufacturing apparatus according to the present invention, FIG. 2 is a cross-sectional view of a more specific embodiment of the compound semiconductor single crystal manufacturing apparatus according to the present invention, and FIG. FIG. 4 is an explanatory diagram for explaining the operation of the manufacturing apparatus according to the present invention, FIG. 5 is a sectional view showing another embodiment of the crucible used in the present invention, and FIG. 6 is a third cross-sectional view of the crucible used in the present invention. FIG. 1... Porous crucible (inner crucible), 2... Outer crucible, 3... Quartz sleeve crucible, 4... Inner space, 5... Compound semiconductor melt, 6... Mass of compensating volatile component, 7... Molten B 2 O 3 , 8... Single crystal,
9...Rib, 10...Upper heater, 11...Lower heater, 12...Crystal rotation and pulling shaft, 13...Susceptor, 14...Pressure chamber, 15...Observation window, 16...Gas inlet , 17... gas distribution plate,
18... Raw material Ga, 19... Raw material As, 7'... Solid
B 2 O 3 , 20...Ga melt, 21...quartz rib, 2
2... Sleeve crucible with quartz ribs, 23... Porous crucible, 24... Ribs, 25... Space created by the ribs 24 and the outer crucible.
Claims (1)
納するためのるつぼと、この融液に種結晶を接触
させて単結晶を引き上げる装置部を有する化合物
半導体単結晶の製造装置において、前記るつぼを
上下動可能に支持するサセプタと、前記るつぼの
上部および下部を独立して加熱可能な加熱手段を
有し、さらに前記るつぼは前記融液および液体封
じ剤を収納し、前記上部周縁にリブを有する多孔
性材製内るつぼと、この内るつぼ外側に前記内る
つぼ間に揮発製原料を収納するための空間部を形
成し、前記リブの上部を液体封じ剤が覆うように
前記リブに係合して設けられる外るつぼとより成
り、前記リブは、内るつぼと外るつぼにより形成
された前記空間部に収納される揮発性原料蒸気の
過剰分を四散できるようになつていることを特徴
とする化合物半導体単結晶の製造装置。1. In a compound semiconductor single crystal manufacturing apparatus having a crucible for storing a compound semiconductor raw material melt and a liquid encapsulant, and a device section for bringing a seed crystal into contact with the melt to pull up the single crystal, the crucible is moved up and down. a susceptor capable of supporting the crucible; and a heating means capable of independently heating the upper and lower parts of the crucible; an inner crucible made of wood, a space formed outside the inner crucible for storing volatile raw materials between the inner crucibles, and provided in engagement with the ribs so that the liquid sealant covers the upper part of the ribs. and an outer crucible formed by the inner crucible and the outer crucible, and the rib is configured to disperse an excess amount of volatile raw material vapor stored in the space formed by the inner crucible and the outer crucible. Crystal manufacturing equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57005760A JPS58125688A (en) | 1982-01-18 | 1982-01-18 | Method and apparatus for manufacture of compound semiconductor single crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57005760A JPS58125688A (en) | 1982-01-18 | 1982-01-18 | Method and apparatus for manufacture of compound semiconductor single crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58125688A JPS58125688A (en) | 1983-07-26 |
| JPS6127358B2 true JPS6127358B2 (en) | 1986-06-25 |
Family
ID=11620073
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57005760A Granted JPS58125688A (en) | 1982-01-18 | 1982-01-18 | Method and apparatus for manufacture of compound semiconductor single crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58125688A (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS472946U (en) * | 1971-01-28 | 1972-09-01 |
-
1982
- 1982-01-18 JP JP57005760A patent/JPS58125688A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58125688A (en) | 1983-07-26 |
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