JPS6132634B2 - - Google Patents
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- Publication number
- JPS6132634B2 JPS6132634B2 JP3543774A JP3543774A JPS6132634B2 JP S6132634 B2 JPS6132634 B2 JP S6132634B2 JP 3543774 A JP3543774 A JP 3543774A JP 3543774 A JP3543774 A JP 3543774A JP S6132634 B2 JPS6132634 B2 JP S6132634B2
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- JP
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- Prior art keywords
- signal
- level
- hysteresis
- under test
- measured
- Prior art date
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- 238000012360 testing method Methods 0.000 claims description 19
- 230000003247 decreasing effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 23
- 230000008859 change Effects 0.000 description 6
- 239000000696 magnetic material Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 230000005415 magnetization Effects 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- OUBORTRIKPEZMG-UHFFFAOYSA-N INT-2 Chemical compound Nc1c(ncn1-c1ccc(F)cc1)C(=N)C#N OUBORTRIKPEZMG-UHFFFAOYSA-N 0.000 description 1
- 101100348848 Mus musculus Notch4 gene Proteins 0.000 description 1
- 101000767160 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) Intracellular protein transport protein USO1 Proteins 0.000 description 1
- 101001060278 Xenopus laevis Fibroblast growth factor 3 Proteins 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011017 operating method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Landscapes
- Measuring Magnetic Variables (AREA)
Description
【発明の詳細な説明】
本発明は電子計算機により被測定物のヒステリ
シスを測定するヒステリシス測定装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a hysteresis measuring device that measures the hysteresis of a measured object using an electronic computer.
磁性材料の磁化特性は、一般にその磁性材料中
の磁界の強さとその磁束密度との関係を示す曲線
をいい、材料の磁気的特性を知るうえで極めて大
切なものである。そして磁性材料の磁化曲線は一
般にヒステリシスを示すので、被測定物のヒステ
リシスを測定することにより、その磁気的特性を
知ることができる。 The magnetization properties of a magnetic material generally refer to a curve that shows the relationship between the strength of the magnetic field in the magnetic material and its magnetic flux density, and are extremely important in understanding the magnetic properties of the material. Since the magnetization curve of a magnetic material generally exhibits hysteresis, by measuring the hysteresis of the object to be measured, the magnetic properties of the object can be known.
而して従来は被測定物のヒステリシスの測定は
半ば実験的に人間の手操作により行なわれてお
り、このヒステリシスの測定に電子計算機を導入
する方法はいまだ実施されていない。 Conventionally, the measurement of the hysteresis of an object to be measured has been carried out semi-experimentally and manually, and a method of introducing an electronic computer to the measurement of this hysteresis has not yet been implemented.
まず従来から行なわれている人間の手操作によ
るヒステリシスの測定方法について説明すると、
信号源から被測定物に印加する信号を除々に変化
してゆき、その変化分に対する被測定物の出力レ
ベルを例えばデジタルボルトメータ等により測定
して記録するか、あるいはレベル検知器により表
示ランプを点灯させることにより、被測定物のヒ
ステリシスを測定していた。しかしながら、上述
の測定法においては操作者の操作方法により信号
源から被測定物へ印加される信号の変化量が違つ
てきたり、ヒステリシスの変化点の確認が不正確
であつたり操作者の個人誤差による測定誤差が大
きく、高精度のヒステリシス測定が不可能であつ
た。 First, I will explain the conventional method of measuring hysteresis using manual operations.
Gradually change the signal applied from the signal source to the measured object, and measure and record the output level of the measured object in response to the change, for example, with a digital voltmeter, or use a level detector to display an indicator lamp. By turning on the light, the hysteresis of the object to be measured was measured. However, in the above measurement method, the amount of change in the signal applied from the signal source to the measured object may differ depending on the operating method of the operator, or the confirmation of the changing point of hysteresis may be inaccurate, or the operator's The measurement error caused by the error was large, and highly accurate hysteresis measurement was impossible.
本発明は上記の事情に鑑みてなされたもので、
前述の欠点を除去するために電子計算機を導入し
て、被測定物に印加する信号源からの信号を段階
的に印加できるようにして測定精度を高めるとと
もに、個人誤差による測定誤差をなくして短時間
に正確なヒステリシス測定を行なうことのできる
電子計算機によるヒステリシス測定装置を提供す
ることを目的とする。 The present invention was made in view of the above circumstances, and
In order to eliminate the above-mentioned drawbacks, an electronic computer was introduced to make it possible to apply the signal from the signal source to the object to be measured in stages, increasing measurement accuracy, and eliminating measurement errors due to individual errors, resulting in faster measurement. An object of the present invention is to provide a hysteresis measurement device using an electronic computer that can perform time-accurate hysteresis measurement.
以下図面を参照して本発明による一実施例につ
いて説明する。 An embodiment of the present invention will be described below with reference to the drawings.
まず、第１図に本発明による一実施例であるヒ
ステリシス測定装置のブロツク図を示し説明す
る。 First, FIG. 1 shows a block diagram of a hysteresis measuring device which is an embodiment of the present invention.
図中１はヒステリシス測定における制御指令な
らびに測定結果を処理する電子計算機、２は電子
計算機１の制御指令信号により被測定物に変化信
号を印加する信号源、３は被測定物、４は被測定
物３からの出力信号レベルを検知するためのレベ
ル検知器である。また、S1は電子計算機１から信
号源２に与えられる駆動制御信号、Ｓcは駆動制
御信号S1により信号源２から被測定物３に印加さ
れるステツプ信号、Ｄは被測定物３からレベル検
知器４へ送出される出力信号、C1は電子計算機
１よりレベル検知器４に与えられる基準レベル信
号、INTは被測定物３の出力信号Ｄが基準レベル
信号C1を越えた時点で発生され電子計算機１に
入力される割込み信号、C2は割込み信号INTによ
り電子計算機１から信号源２に送出される制御指
令信号、Ｓsは制御指令信号C2に対応して信号源
２から被測定物３に印加されるステツプ信号をそ
れぞれ示している。 In the figure, 1 is an electronic computer that processes control commands and measurement results in hysteresis measurement, 2 is a signal source that applies a change signal to the object to be measured based on the control command signal of the electronic computer 1, 3 is the object to be measured, and 4 is the object to be measured. This is a level detector for detecting the output signal level from the object 3. Further, S 1 is a drive control signal applied from the electronic computer 1 to the signal source 2, S c is a step signal applied from the signal source 2 to the device under test 3 in response to the drive control signal S 1 , and D is a step signal applied from the device under test 3 to the device under test 3. The output signal sent to the level detector 4, C1 is the reference level signal given to the level detector 4 from the electronic computer 1, and INT is the reference level signal given to the level detector 4 from the computer 1 . An interrupt signal is generated and input to the computer 1, C2 is a control command signal sent from the computer 1 to the signal source 2 by the interrupt signal INT, and Ss is a control command signal sent from the signal source 2 in response to the control command signal C2. Each step signal applied to the object under test 3 is shown.
次に本発明によるヒステリシス測定法の概念を
第２図を参照して説明する。 Next, the concept of the hysteresis measurement method according to the present invention will be explained with reference to FIG.
信号源２から被測定物３に印加するステツプ信
号Ｓcを段階的にａ→ｂ、ｂ→ｃ、……、ｅ→ｆ
の如く等間隔で上昇させてゆき、次にｆ→ｅ、ｅ
→ｄ、……、ｂ→ａの如く下降させる。そして被
測定物３からの出力信号Ｄが、レベル検知器４に
予め電子計算機１により与えられた基準レベル信
号C1を越えた時点で即ちｃとｄのレベル間にお
いて割込み信号INTが電子計算機１に入力され
る。そして制御指令信号C2が信号源２に送出さ
れ、ｃ→ｄ間を更に段階的に細分割した信号が信
号源２からステツプ信号Ｓsとして被測定物３に
印加され、基準信号レベルC1における被測定物
のヒステリシスを測定するものである。例えばａ
→ｂ、ｂ→ｃ、ｃ→ｄ……間をIVステツプで変
化させ、C1レベルより被測定物の出力が大きく
なるｃ→ｄ間すなわち２→3V間を更に例えば
0.1V間隔に細分割して被測定物がC1レベルにな
る信号発生器に与える信号を測定したヒステリシ
スを求めるものである。一般に信号源２から被測
定物３に印加する信号電圧を、ａ→ｆ方向に上昇
させていつた場合と、ｆ→ａ方向に下降させてい
つた場合とでは被測定物の入出力特性が完全に一
致せず多少の誤差を生ずるものである。 The step signal S c applied from the signal source 2 to the object under test 3 is changed stepwise from a to b, b to c, ..., e to f.
Raise it at equal intervals as shown, then f → e, e
→d, ..., descend as in b→a. When the output signal D from the object to be measured 3 exceeds the reference level signal C 1 given in advance to the level detector 4 by the computer 1, that is, between levels c and d, the interrupt signal INT is sent to the computer 1. is input. Then, the control command signal C 2 is sent to the signal source 2, and the signal obtained by further subdividing the range from c to d in steps is applied from the signal source 2 to the device under test 3 as a step signal S s , and the reference signal level C 1 This is used to measure the hysteresis of an object under test. For example a
→ b, b → c, c → d... are changed in IV steps, and further between c → d, that is, 2 → 3 V, where the output of the measured object is greater than the C 1 level, for example.
The hysteresis is determined by measuring the signal given to the signal generator, which is subdivided into 0.1V intervals and the object under test reaches the C1 level. Generally, when the signal voltage applied from the signal source 2 to the DUT 3 is increased in the a → f direction, and when it is decreased in the f → a direction, the input/output characteristics of the DUT are completely changed. They do not match and cause some errors.
而して第１図において、電子計算機１からの基
準レベル信号C1がレベル検知器４に印加され、
信号源２に駆動制御信号S1が送出されると、信号
源２から被測定物３へ任意のステツプ信号Ｓcが
印加される。そして、このステツプ信号Ｓcによ
り被測定物３の出力信号Ｄが、レベル検知器４に
与えられた基準レベル信号C1のレベルに達しな
い場合は電子計算機１には割込み信号INTが入力
されず、更にこの場合は電子計算機１からの指令
により信号源２からの印加電圧を段階的に変化さ
せる。そして割込み信号INTが入力されると信号
源２に制御指令信号C2が送出され、信号源２か
らはこの制御指令信号C2に対応した段階上のス
テツプ信号Ｓsが被測定物３に印加される。この
操作が繰り返し行なわれ、この期間中被測定物３
の出力電圧Ｄがレベル検知器４の基準レベル信号
C1を越えた時点でパルスが発生し、これが電子
計算機１へ割込み信号INTとして入力され、電子
計算機１は次の段階の測定指令を信号源２へ送出
する。 In FIG. 1, the reference level signal C1 from the electronic computer 1 is applied to the level detector 4,
When the drive control signal S 1 is sent to the signal source 2, an arbitrary step signal S c is applied from the signal source 2 to the object under test 3. If the output signal D of the device under test 3 does not reach the level of the reference level signal C1 given to the level detector 4 by this step signal Sc , the interrupt signal INT is not input to the computer 1. Furthermore, in this case, the voltage applied from the signal source 2 is changed in steps according to instructions from the electronic computer 1. When the interrupt signal INT is input, a control command signal C2 is sent to the signal source 2, and the signal source 2 applies a higher step signal Ss corresponding to this control command signal C2 to the device under test 3. be done. This operation is repeated, and during this period the object to be measured 3
The output voltage D is the reference level signal of the level detector 4.
When C 1 is exceeded, a pulse is generated, which is input to the computer 1 as an interrupt signal INT, and the computer 1 sends a measurement command for the next stage to the signal source 2.
次にレベル検知器４から電子計算機１へ割込み
信号INTが入力された場合の動作を第３図を参照
して説明する。 Next, the operation when the interrupt signal INT is input from the level detector 4 to the computer 1 will be explained with reference to FIG.
第３図ａの第１ステツプにおいて、S2の時点で
レベル検知器４から電子計算機１へ割込み信号
INT−１が入力されると、電子計算機１は制御指
令信号C2を信号源２へ送出し、信号源２からの
信号電圧はａの第１ステツプからｂの第２ステツ
プへと移り、ａの第１ステツプの信号値S2より１
段階低いレベルのS1なる信号値により、ａの第１
ステツプより細分割した段階のステツプ信号Ｓs
が被測定物３に順々に印加される。そして更にｂ
の第２ステツプのS12の時点において、割込み信
号INT−２が電子計算機１に入力されると、制御
指令信号C2に基づくステツプ信号Ｓsが信号源２
から被測定物３へ印加され、前述と同様ｂの第２
ステツプからｃの第３ステツプへと移りより細分
割した信号が被測定物に加えられる。そしてこの
ような操作を測定に必要とする精度が得られるま
で繰り返し、行なつて基準信号C1に近ずけ信号
源２から被測定物３へ印加されるステツプ信号Ｓ
sの上昇時（絶対値での）における信号発生源に
与えた信号レベル値と、下降時における信号発生
源に与えた信号レベル値とを求め、その差を求め
てヒステリシスを算出するものである。第３図に
おいてステツプ信号を第３ステツプとした場合、
ｃの第３ステツプS112の時点で割込み信号INT−
３が電子計算機１へ入力されたとすると、電子計
算機１はS112を最終データとして出力する。 In the first step in FIG. 3a, an interrupt signal is sent from the level detector 4 to the computer 1 at the time of S2 .
When INT-1 is input, the computer 1 sends the control command signal C 2 to the signal source 2, and the signal voltage from the signal source 2 moves from the first step of a to the second step of b, and a 1 from the signal value S 2 of the first step of
With a signal value of S 1 at a step lower level, the first of a
Step signal S s at a stage subdivided from the step
are sequentially applied to the object to be measured 3. And further b
When the interrupt signal INT-2 is input to the computer 1 at S12 of the second step, the step signal Ss based on the control command signal C2 is sent to the signal source 2.
is applied to the object under test 3, and the second
The process moves from step c to the third step, in which a more finely divided signal is applied to the object under test. These operations are repeated until the accuracy required for measurement is obtained, and the step signal S applied from the signal source 2 to the object to be measured 3 approaches the reference signal C1.
Hysteresis is calculated by finding the signal level value given to the signal generation source when s is rising (in absolute value) and the signal level value given to the signal generation source when it is falling, and finding the difference between them. . In Fig. 3, when the step signal is set to the third step,
At the third step S112 of c, the interrupt signal INT-
3 is input to the computer 1, the computer 1 outputs S112 as the final data.
尚、上述の各ステツプにおける信号値の階段巾
の差の選択によつては、測定時間がかなりの影響
を受けるので、被測定物３の種類により各ステツ
プの信号値の段階巾は電子計算機１に与えられる
プログラムにより任意に選択できるようになつて
いる。 Note that the measurement time is considerably affected by the selection of the difference in step width of the signal value in each step described above, so the step width of the signal value in each step is determined by the electronic computer 1 depending on the type of the object to be measured 3. This can be selected arbitrarily according to the program provided.
また第４図〜第５図は本発明の他の実施例を示
すもので、第４図は磁性材料のヒステリシスが信
号源２から印加される信号電圧の変化巾により影
響を受けることから、上昇時の基準Ｕsおよび下
降時の基準Ｄsのそれぞれの基準値を毎回算出
し、その基準値から次の信号値を選択するように
したものである。 4 and 5 show other embodiments of the present invention, in which the hysteresis of the magnetic material is affected by the range of change in the signal voltage applied from the signal source 2, so The reference values of the time reference U s and the descending reference D s are calculated each time, and the next signal value is selected from the reference values.
第５図は信号源２から被測定物３に印加する信
号電圧の変化巾を一定として印加し、被測定物３
のヒステリシスを測定するものである。すなわ
ち、前述した各ステツプによらず一定の変化巾の
信号電圧を被測定物３に印加してヒステリシスを
測定するものである。 FIG. 5 shows a signal voltage applied from a signal source 2 to an object under test 3 with a constant change range.
It measures the hysteresis of That is, the hysteresis is measured by applying a signal voltage having a constant variation range to the object to be measured 3, regardless of the steps described above.
以上記載した如く本発明によれば、種々の磁性
材料のヒステリシスの自動測定が可能となるとと
もに、従来人間の操作により行なわれていたヒス
テリシス測定の個人誤差による測定誤差の影響が
なくなる。また、回路をブロツク化することによ
り測定に必要とする精度が得られると同時に測定
に不必要な精度は無視することができる。更に信
号源の信号電圧の発生を変化させることにより、
一定巾の信号変化によるヒステリシス測定のよう
な人間の操作では不可能に近いか実施しても多大
の時間を要するようなヒステリシスの測定が短時
間に高精度でできる電子計算機によるヒステリシ
ス測定装置を提供することができる。 As described above, according to the present invention, it is possible to automatically measure the hysteresis of various magnetic materials, and the influence of measurement errors due to individual errors in hysteresis measurements conventionally performed by human operations is eliminated. Further, by forming the circuit into blocks, the precision required for measurement can be obtained, and at the same time, precision unnecessary for measurement can be ignored. Furthermore, by changing the generation of the signal voltage of the signal source,
Provides a computer-based hysteresis measurement device that can perform hysteresis measurements in a short time and with high precision, which would be nearly impossible or take a lot of time to perform with human operations, such as hysteresis measurements based on signal changes over a certain width. can do.
尚本発明は上述した一実施例のみならず、その
他その要旨を変更しない範囲で種々変形して実施
できるものである。 The present invention is not limited to the above-described embodiment, and can be implemented with various modifications without changing the gist thereof.
第１図は本発明の一実施例を示すヒステリシス
測定装置のブロツク図、第２図は本発明における
ヒステリシス測定の概念を説明するための図、第
３図ａ〜ｃは本発明のヒステリシス測定の一実施
例を示す図、第４図〜第５図は本発明におけるヒ
ステリシス測定の信号電圧の他の実施例を示す図
である。
１……電子計算機、２……信号源、３……被測
定物、４……レベル検知器、Ｓs……ステツプ信
号、C1……基準レベル信号、INT……割込み信
号。
FIG. 1 is a block diagram of a hysteresis measuring device showing an embodiment of the present invention, FIG. 2 is a diagram for explaining the concept of hysteresis measurement in the present invention, and FIGS. Figures 4 and 5 showing one embodiment are diagrams showing other embodiments of signal voltages for hysteresis measurement in the present invention. 1...Electronic computer, 2...Signal source, 3...Device to be measured, 4...Level detector, Ss ...Step signal, C1 ...Reference level signal, INT...Interrupt signal.
Claims (1)
置において、前記被測定物に印加する信号を段階
的に制御し、かつ割込み信号を受けるごとに割込
み信号発生前のレベルから印加する信号のステツ
プレベルを前回の段階レベルより小さくするプロ
グラムが組み込まれた電子計算機と、この電子計
算機からの制御信号により前記被測定物に段階的
な信号を印加する信号源と、前記電子計算機から
基準レベル信号が与えられ前記被測定物からの出
力レベルがこの基準レベル信号を横切つた時点で
割込み信号を発生し前記電子計算機に割込みを行
なうレベル検知器とを具備し、割込み信号発生ご
とに、この割込み信号の生じた直前のレベルから
段階的に変る信号のステツプレベルを順々に小さ
くして基準レベルに被測定物の出力を一層近ず
け、被測定物に印加する信号の上昇時と下降時
に、基準レベル値を横切るときの被測定物に加え
られる入力信号を測定してこれら測定値の差をヒ
ステリシス値としたことを特徴とするヒステリシ
ス測定装置。1. In an apparatus for measuring the hysteresis of various objects under test, the signal applied to the object under test is controlled stepwise, and each time an interrupt signal is received, the step level of the applied signal is changed from the level before the interrupt signal is generated. an electronic computer incorporating a program to make the step level smaller than the previous step level; a signal source that applies a stepwise signal to the object under test according to a control signal from the computer; and a reference level signal applied from the computer. and a level detector that generates an interrupt signal and interrupts the electronic computer when the output level from the object to be measured crosses the reference level signal, and detects the generation of the interrupt signal every time the interrupt signal is generated. The step level of the signal that changes step by step from the previous level is gradually decreased to bring the output of the device under test closer to the reference level, and when the signal applied to the device under test rises and falls, the reference level A hysteresis measuring device characterized in that an input signal applied to an object to be measured is measured when it crosses a value, and a difference between these measured values is used as a hysteresis value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3543774A JPS6132634B2 (en) | 1974-03-29 | 1974-03-29 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3543774A JPS6132634B2 (en) | 1974-03-29 | 1974-03-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS50129082A JPS50129082A (en) | 1975-10-11 |
| JPS6132634B2 true JPS6132634B2 (en) | 1986-07-28 |
Family
ID=12441814
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3543774A Expired JPS6132634B2 (en) | 1974-03-29 | 1974-03-29 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6132634B2 (en) |
-
1974
- 1974-03-29 JP JP3543774A patent/JPS6132634B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS50129082A (en) | 1975-10-11 |
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