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JPS6141570B2 - - Google Patents
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JPS6141570B2 - - Google Patents

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Publication number
JPS6141570B2
JPS6141570B2 JP53011610A JP1161078A JPS6141570B2 JP S6141570 B2 JPS6141570 B2 JP S6141570B2 JP 53011610 A JP53011610 A JP 53011610A JP 1161078 A JP1161078 A JP 1161078A JP S6141570 B2 JPS6141570 B2 JP S6141570B2
Authority
JP
Japan
Prior art keywords
optical system
eye
aiming
optical axis
index
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53011610A
Other languages
Japanese (ja)
Other versions
JPS54104692A (en
Inventor
Shinji Wada
Ikuo Kitao
Yasuo Kato
Taketoshi Ishihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP1161078A priority Critical patent/JPS54104692A/en
Priority to US05/935,608 priority patent/US4277150A/en
Publication of JPS54104692A publication Critical patent/JPS54104692A/en
Publication of JPS6141570B2 publication Critical patent/JPS6141570B2/ja
Granted legal-status Critical Current

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Description

【発明の詳細な説明】 本発明は、アイレフラクトメーターに関する。
特に、本発明はアイレフラクトメーターにおける
照準装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an eye refractometer.
In particular, the invention relates to an aiming device in an eye refractometer.

被検眼の矯正屈折度を他覚的に測定するための
アイレフラクトメーターは、被検眼の瞳孔を通し
てターゲツトを眼底に投影し、被検眼の網膜に結
像したターゲツト像の合焦状態を測定して、ター
ゲツト像が網膜上に鮮明に結像するときのターゲ
ツトの位置により、被検眼の屈折度を必要な矯正
屈折度数として測定するものである。この測定に
際し、被検眼の角膜頂点と対物レンズとの距離す
なわちワーキングデイスタンスを適正に保つと同
時に、被検眼光軸と測定光軸とを合致させるた
め、照準光学系が設けられる。
Eye refractometers are used to objectively measure the corrected refractive power of the eye to be examined, by projecting a target onto the fundus of the eye through the pupil of the eye to be examined, and measuring the focusing state of the target image formed on the retina of the eye to be examined. The refractive power of the eye to be examined is measured as the necessary corrective refractive power based on the position of the target when the target image is clearly formed on the retina. During this measurement, a aiming optical system is provided in order to properly maintain the distance between the corneal vertex of the eye to be examined and the objective lens, that is, the working distance, and to align the optical axis of the eye to be examined with the measurement optical axis.

この照準光学系は、測定光学系と同一水平面内
で、一定角度すなわち普通は9゜の角度をなす方
向から被検眼前眼部を観察し、たとえばスプリツ
トプリズム等の手段により、被検眼に対する対物
レンズの適正なワーキングデイスタンスを確認で
きるようにしたものである。また、光軸のアライ
ンメントの確認のためには、適正なワーキングデ
イスタンスが保たれていることの前提のもとで、
照準系の指標線を被検眼瞳の中心に合わせる方法
がとられている。
This aiming optical system observes the anterior segment of the eye to be examined from a direction forming a fixed angle, usually an angle of 9°, within the same horizontal plane as the measurement optical system, and uses a means such as a split prism to set an objective to the eye to be examined. This allows you to check the proper working distance of the lens. In addition, in order to confirm the alignment of the optical axis, on the premise that an appropriate working distance is maintained,
A method is used in which the index line of the aiming system is aligned with the center of the pupil of the eye to be examined.

照準及び測定が近赤外光又は赤外光により行な
われるようになつた赤外線アイレフラクトメータ
ーにおいては、暗視装置の解像力が十分でないた
め、スプリツト像合致方式ではワーキングデイス
タンスに或る程度の誤差が避けられない。照準光
学系は測定光学系に対し角度を有するので、この
ワーキングデイスタンスの誤差は、被検眼光軸と
測定光学系光軸とのアラインメント誤差を生じ
る。被検眼光軸と測定光軸とのこのアラインメン
ト誤差は、眼球光学系の収差のため、特に乱視測
定に誤差を生じ、好ましくない。特に、赤外線ア
イレフラクトメーターにおいては、被検眼の瞳が
開いているため、被検眼光軸と測定光軸との或る
程度のずれでは眼底におけるターゲツト像に特別
な異常を生じず、アラインメント誤差を測定時に
察知することができない。
In infrared eye refractometers, where aiming and measurement are performed using near-infrared light or infrared light, the resolution of the night vision device is not sufficient, so the split image matching method has a certain degree of error in working distance. is unavoidable. Since the aiming optical system has an angle with respect to the measuring optical system, an error in this working distance causes an alignment error between the optical axis of the eye to be examined and the optical axis of the measuring optical system. This alignment error between the optical axis of the eye to be examined and the optical axis for measurement is undesirable because it causes an error especially in astigmatism measurement due to the aberration of the eyeball optical system. In particular, in an infrared eye refractometer, since the pupil of the eye to be examined is open, a certain degree of deviation between the optical axis of the eye to be examined and the optical axis for measurement will not cause any special abnormality in the target image in the fundus, and alignment errors can be avoided. It cannot be detected during measurement.

此処で、ワーキングデイスタンス誤差と光軸の
アラインメント誤差の測定結果への影響について
検討すると、ワーキングデイスタンスのたとえば
5mm程度の誤差は、10デイオプターの場合に約
0.5デイオプター、5デイオプターの場合に約
0.12デイオプターの測定誤差となつて現れるにす
ぎないが、光軸アラインメント誤差による乱視測
定の誤差は重大である。したがつて、光軸のアラ
インメント誤差を除くことのできる照準装置を設
けることが特に望まれる。
If we consider the effects of working distance error and optical axis alignment error on the measurement results, we can see that an error of about 5 mm in working distance, for example, is approximately 5 mm for a 10 day opter.
Approximately for 0.5 day opter and 5 day opter
Although it only appears as a measurement error of 0.12 dayopter, the error in astigmatism measurement due to optical axis alignment error is significant. Therefore, it is particularly desirable to provide an aiming device that can eliminate optical axis alignment errors.

したがつて、本発明の主目的は、被検眼光軸と
測定光軸とを十分に正確に一致させることのでき
るアイレフラクトメーター用の照準装置を提供す
ることである。
Therefore, the main object of the present invention is to provide an aiming device for an eye refractometer that can align the optical axis of the eye to be examined and the measurement optical axis with sufficient accuracy.

被検眼光軸と測定光軸に沿つて行なうのが最も
よい。このためには、測定光軸上にハーフミラー
を置いて、このハーフミラーの反射光軸上に照準
光学系を配置すればよい。しかし、このように測
定光学系にハーフミラーを置くことは、光量の損
失を招き、特に赤外線アイレフラクトメーターの
場合、測定光学系及び照準光学系ともに、光量に
余裕がないため、実用上このような配置を採用す
ることはできない。
It is best to perform the measurement along the optical axis of the eye to be examined and the optical axis of the measurement. For this purpose, a half mirror may be placed on the measurement optical axis, and an aiming optical system may be placed on the reflection optical axis of this half mirror. However, placing a half mirror in the measurement optical system in this way leads to a loss of light intensity, and especially in the case of an infrared eye refractometer, there is not enough light capacity for both the measurement optical system and the aiming optical system, so this is not practical. It is not possible to adopt a suitable arrangement.

そこで、本発明においては、ハーフミラー等の
手段を用いることなく光軸のアラインメント誤差
を確実に除き得るようにするため、測定光学系の
光軸と照準光学系の光軸とを含む面に対しほぼ直
交する面内で被検眼前眼部に指標線を投影する指
標投影装置が設けられ、照準光学系には指標投影
装置の指標線にほぼ直交する方向の指標線が設け
られ、両指標線の被検眼との関係位置により、光
軸のアラインメントが確認されるようになつてい
る。すなわち、指標投影装置を、測定光学系の光
軸を含む垂直面内に設け、垂直方向の指標を投影
するようにすれば、この指標と被検眼のたとえば
虹彩との関係位置により光軸の水平方向のアライ
ンメントが得られ、照準光学系に設けた水平方向
の指標により、光軸の垂直方向のアラインメント
が得られる。
Therefore, in the present invention, in order to reliably eliminate the alignment error of the optical axis without using means such as a half mirror, the optical axis of the measuring optical system and the aiming optical system are An index projection device is provided that projects an index line onto the anterior segment of the subject's eye in a plane that is substantially orthogonal to the subject's eye, and the aiming optical system is provided with an index line that extends in a direction that is approximately orthogonal to the index line of the index projection device. The alignment of the optical axis is confirmed by the relative position of the eye to the subject's eye. In other words, if the index projection device is installed in a vertical plane that includes the optical axis of the measurement optical system and projects a vertical index, the optical axis will be horizontal depending on the relative position of this index and the iris of the eye to be examined. A directional alignment is obtained, and a horizontal index provided on the aiming optics provides a vertical alignment of the optical axis.

以下、本発明の一実施例を図について説明す
る。図に示す赤外線アイレフラクトメーターは、
測定光学系A、投影光学系B、照準光学系C及び
指標投影系Dを有し、測定光学系Aは、対物レン
ズ1、3角形プリズム2と平面鏡3からなる公知
の構成のイメージローテーター4、孔あきプリズ
ム5及び結像レンズ6を有し、結像レンズ6を経
た光は撮像管7の光電面に結像する。投影光学系
Bは、近赤外光源8、コンデンサレンズ9、ター
ゲツト板10及び投影レンズ11を有し、レンズ
11を経た光は、孔あきプリズム5の傾斜面によ
り測定光学系Aの光軸12に沿つて反射され、イ
メージローテーター4及び対物レンズ1を経て被
検眼Eに投影され、眼底にターゲツト像を結像す
る。この眼底におけるターゲツト像からの光は、
被検眼Eの瞳孔を通して測定光学系Aに入り、撮
像管7の光電面に結像し、ターゲツト像がテレビ
13に可視像として写し出される。
Hereinafter, one embodiment of the present invention will be described with reference to the drawings. The infrared eye refractometer shown in the figure is
It has a measurement optical system A, a projection optical system B, an aiming optical system C, and an index projection system D, and the measurement optical system A includes an image rotator 4 having a known configuration consisting of an objective lens 1, a triangular prism 2, and a plane mirror 3; It has a perforated prism 5 and an imaging lens 6, and light passing through the imaging lens 6 forms an image on the photocathode of an imaging tube 7. The projection optical system B has a near-infrared light source 8, a condenser lens 9, a target plate 10, and a projection lens 11. It is reflected along the image rotator 4 and the objective lens 1, and is projected onto the eye E to be examined, forming a target image on the fundus of the eye. The light from the target image in the fundus of the eye is
The light enters the measuring optical system A through the pupil of the eye E to be examined, forms an image on the photocathode of the image pickup tube 7, and a target image is displayed on the television 13 as a visible image.

照準光学系Cは、測定光学系Aの光軸12と同
一水平面内にあり、かつ対物レンズ1の前方の点
14において該光軸12と交わる光軸15を有
し、この光軸15に沿つて対物レンズ1の後方に
レンズ16、スプリツトプリズム17、レンズ1
8,19、絞り板20及び結像レンズ21が配置
され、レンズ21を通つた光は撮像管22の光電
面に結像する。
The aiming optical system C has an optical axis 15 that is in the same horizontal plane as the optical axis 12 of the measurement optical system A and intersects with the optical axis 12 at a point 14 in front of the objective lens 1. At the rear of the objective lens 1, there is a lens 16, a split prism 17, and a lens 1.
8, 19, an aperture plate 20, and an imaging lens 21 are arranged, and the light passing through the lens 21 forms an image on the photocathode of the imaging tube 22.

指標投影系Dは、測定光学系Aの光軸12と同
一の垂直面内にありかつ該光軸12と点14にお
いて交差する光軸23を有し、近赤外光源24、
コンデンサレンズ25、指標板26、反射ミラー
27及び投影レンズ28,29を有する。指標板
26上には指標線すなわち本例においては光軸を
挾んで対称な2本の平行線が描かれこの指標線は
第4図aに示すように垂直方向の2本の暗線とし
て被検眼前眼部に投影される。
The index projection system D has an optical axis 23 that lies in the same vertical plane as the optical axis 12 of the measurement optical system A and intersects the optical axis 12 at a point 14, and includes a near-infrared light source 24,
It has a condenser lens 25, an index plate 26, a reflection mirror 27, and projection lenses 28 and 29. On the index plate 26, index lines, in this example, two parallel lines symmetrical with the optical axis in between, are drawn, and these index lines are examined as two vertical dark lines as shown in FIG. 4a. Projected to the anterior segment of the eye.

照準光学系Cには適当な位置、たとえばスプリ
ツトプリズム17の焦点面に第4図bに示すよう
な水平方向の2本の指標線が光軸に関し対称に描
かれている。したがつて、このアイレフラクトメ
ーターを用いるときは、まずスプリツトプリズム
により得られる被検眼前眼部のスプリツト像が合
致するように、被検眼Eと対物レンズ1との間の
ワーキングデイスタンスを調節したのち、装置を
水平方向に移動調節して、被検眼前眼部に投影さ
れる2本の暗線が被検眼虹彩を挾むように位置決
めし、次いで装置を垂直方向に移動調節して、照
準光学系の2本の水平指標線が被検眼虹彩を挾み
込むように位置決めする。これによつて、測定光
学系Aの光軸12を被検眼Eの光軸に正確に合致
させることができる。
In the aiming optical system C, two horizontal index lines as shown in FIG. 4b are drawn symmetrically with respect to the optical axis at appropriate positions, for example, on the focal plane of the split prism 17. Therefore, when using this eye refractometer, first adjust the working distance between the eye E and the objective lens 1 so that the split images of the anterior segment of the eye obtained by the split prism match. Then, move the device horizontally to position it so that the two dark lines projected onto the anterior segment of the subject's eye sandwich the iris of the subject's eye, then move the device vertically to position the aiming optical system. The two horizontal index lines are positioned so that they sandwich the iris of the eye to be examined. Thereby, the optical axis 12 of the measurement optical system A can be accurately matched with the optical axis of the eye E to be examined.

以上述べたように、本発明においては、測定光
学系の光軸と照準光学系の光軸とを含む面に対し
ほぼ直交する面内で被検眼前眼部に指標線を投影
し、照準光学系にはこの投影指標線にほぼ直交す
る方向の指標線を設けたので、これら指標線と被
検眼前眼部の適当な部分たとえば虹彩との位置関
係を定めることにより、測定光学系の光軸と被検
眼の光軸とのアラインメントを正確に得ることが
できる。また、このアラインメントのための手段
は、測定及び照準光学系の光量損失を伴なうこと
がなく、余裕光量の少ない赤外線アイレフラクト
メーターに適用して多大の効果を得ることができ
る。
As described above, in the present invention, an index line is projected onto the anterior segment of the subject's eye in a plane that is substantially orthogonal to a plane including the optical axis of the measurement optical system and the optical axis of the aiming optical system, and Since the system is equipped with index lines that run in a direction approximately perpendicular to this projection index line, by determining the positional relationship between these index lines and a suitable part of the anterior segment of the subject's eye, such as the iris, the optical axis of the measurement optical system can be adjusted. It is possible to accurately obtain alignment between the eye and the optical axis of the eye to be examined. Further, this means for alignment does not involve loss of light quantity in the measurement and aiming optical system, and can be applied to an infrared eye refractometer with a small margin of light quantity to obtain a great effect.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す赤外線アイレ
フラクトメーターの光学系配置の概略斜視図、第
2図はその光学系の平面図、第3図は側面図、第
4図aは指標投影系により投影される指標の一例
を示す図、第4bは照準光学系に設けられる指標
の例を示す図である。 A……測定光学系、B……投影光学系、C……
照準光学系、D……指標投影系、1……対物レン
ズ、5……孔あきプリズム、7,22……撮像
管、10……ターゲツト板、17……スプリツト
プリズム、26……指標板。
Fig. 1 is a schematic perspective view of the optical system arrangement of an infrared eye refractometer showing an embodiment of the present invention, Fig. 2 is a plan view of the optical system, Fig. 3 is a side view, and Fig. 4 a is a projection of an index. FIG. 4b is a diagram showing an example of an index projected by the system, and FIG. 4b is a diagram showing an example of an index provided in the aiming optical system. A...Measurement optical system, B...Projection optical system, C...
Aiming optical system, D... Index projection system, 1... Objective lens, 5... Perforated prism, 7, 22... Image pickup tube, 10... Target plate, 17... Split prism, 26... Index plate .

Claims (1)

【特許請求の範囲】 1 被検眼の瞳孔を通してターゲツトを投影する
ための投影光学系と、被検眼の網膜に結像したタ
ーゲツト像の合焦状態を被検眼の瞳孔を通して測
定するための測定光学系と、前記測定光学系の光
軸に交差する光軸を有し角膜反射光により被検眼
光軸と前記測定光学系の光軸とのアラインメント
を判別する照準光学系とからなるアイレフラクト
メーターにおいて、前記測定光学系の光軸と前記
照準光学系の光軸とを含む面に対しほぼ直交する
面内で被検眼前眼部に指標線を投影する指標投影
装置が設けられ、前記照準光学系は前記指標投影
装置の指標線にほぼ直交する方向の指標線を有す
ることを特徴とする照準装置。 2 前記第1項において、前記ターゲツト及び指
標の投影は赤外光により行なわれ、前記測定光学
系及び照準光学系は、赤外光による像を観察する
ための暗視装置を有することを特徴とする照準装
置。 3 前記第1項又は第2項において、前記指標投
影装置の指標線及び前記照準光学系の指標線の
各々はそれぞれの光軸に関し対称に配置された2
本の線からなり、互に交差する各2本の線間に被
検眼虹彩をはさみ込んで照準を行なうようになつ
た照準装置。 4 前記第1項ないし第3項のいずれかにおい
て、前記照準光学系は前記測定光学系に対し水平
面内横方向に配置され、前記指標投影装置は垂直
方向下方に配置されたことを特徴とする照準装
置。
[Scope of Claims] 1. A projection optical system for projecting a target through the pupil of the eye to be examined, and a measurement optical system for measuring the in-focus state of the target image formed on the retina of the eye to be examined through the pupil of the eye to be examined. and an aiming optical system that has an optical axis that intersects with the optical axis of the measurement optical system and determines the alignment between the optical axis of the eye to be examined and the optical axis of the measurement optical system using corneal reflected light, An index projection device is provided that projects an index line onto the anterior segment of the subject's eye in a plane substantially orthogonal to a plane including the optical axis of the measurement optical system and the optical axis of the aiming optical system, and the aiming optical system An aiming device characterized by having an index line in a direction substantially perpendicular to the index line of the index projection device. 2. In the above item 1, the projection of the target and the index is performed using infrared light, and the measurement optical system and the aiming optical system have a night vision device for observing the image using the infrared light. aiming device. 3. In the first or second paragraph, each of the index line of the index projection device and the index line of the aiming optical system is arranged symmetrically with respect to the respective optical axis.
An aiming device that consists of two lines that intersect with each other, and aims by inserting the iris of the subject's eye between two lines that intersect with each other. 4. In any one of Items 1 to 3 above, the aiming optical system is arranged laterally in a horizontal plane with respect to the measuring optical system, and the index projection device is arranged vertically downward. Aiming device.
JP1161078A 1977-08-24 1978-02-04 Device for aiming in eyeerefractometer Granted JPS54104692A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1161078A JPS54104692A (en) 1978-02-04 1978-02-04 Device for aiming in eyeerefractometer
US05/935,608 US4277150A (en) 1977-08-24 1978-08-21 Eye refractmeter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1161078A JPS54104692A (en) 1978-02-04 1978-02-04 Device for aiming in eyeerefractometer

Publications (2)

Publication Number Publication Date
JPS54104692A JPS54104692A (en) 1979-08-17
JPS6141570B2 true JPS6141570B2 (en) 1986-09-16

Family

ID=11782668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1161078A Granted JPS54104692A (en) 1977-08-24 1978-02-04 Device for aiming in eyeerefractometer

Country Status (1)

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JP (1) JPS54104692A (en)

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Publication number Priority date Publication date Assignee Title
JPS58116336A (en) * 1981-12-28 1983-07-11 キヤノン株式会社 Ophthalmology equipment alignment device
JPS61185246A (en) * 1985-02-12 1986-08-18 キヤノン株式会社 fundus camera

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JPS54104692A (en) 1979-08-17

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