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JPS6146053B2 - - Google Patents
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JPS6146053B2 - - Google Patents

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Publication number
JPS6146053B2
JPS6146053B2 JP56211747A JP21174781A JPS6146053B2 JP S6146053 B2 JPS6146053 B2 JP S6146053B2 JP 56211747 A JP56211747 A JP 56211747A JP 21174781 A JP21174781 A JP 21174781A JP S6146053 B2 JPS6146053 B2 JP S6146053B2
Authority
JP
Japan
Prior art keywords
memory cell
semiconductor element
chip
recognized
cell section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56211747A
Other languages
Japanese (ja)
Other versions
JPS58110051A (en
Inventor
Toshio Murata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP21174781A priority Critical patent/JPS58110051A/en
Publication of JPS58110051A publication Critical patent/JPS58110051A/en
Publication of JPS6146053B2 publication Critical patent/JPS6146053B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Description

【発明の詳細な説明】 (a) 発明の技術分野 本発明は半導体素子に対する溶液滴下方法にお
ける半導体素子の位置認識方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a method for recognizing the position of a semiconductor element in a method for dropping a solution onto a semiconductor element.

(b) 従来技術と問題点 半導体記憶装置がα線の照射を受けると、周知
の如く書き込まれていた情報が消失する。そこで
上記問題を解消するため、種々の対策がなされて
いる。
(b) Prior Art and Problems As is well known, when a semiconductor memory device is irradiated with alpha rays, written information is lost. Therefore, various measures have been taken to solve the above problem.

この対策の一つに、半導体記憶装置の素子(以
下単にチツプと記す)を所定のパツケージに搭載
した後、上記チツプ上に樹脂を塗布する方法が用
いられている。
One of the countermeasures against this problem is to mount the elements of the semiconductor memory device (hereinafter simply referred to as chips) in a predetermined package, and then apply resin onto the chips.

上記樹脂を塗布するには、パツケージに搭載さ
れたチツプの位置を認識し、その位置に樹脂液の
滴下ツールを移動せしめて樹脂液をチツプ上に滴
下する。
To apply the resin, the position of the chip mounted on the package is recognized, and the resin liquid dropping tool is moved to that position to drip the resin liquid onto the chip.

ところがパツケージに搭載されたチツプの位置
認識は必ずしも容易ではない。即ち、チツプはパ
ツケージ上に通常金(Au)を主成分とする蝋材
により固着されるが、その際蝋材はチツプの周囲
に広がる。しかもこの蝋材表面の反射光の二値化
信号とチツプ表面の反射光の二値化信号との間に
は余り差がないので、両者を明確に識別すること
が出来ない。そのためチツプの位置を正確に検知
することが難しく、従つて上述の樹脂液を自動的
に塗布することが困難であるという問題がある。
However, it is not always easy to recognize the location of the chips mounted on the package. That is, the chip is fixed onto the package using a wax material, usually consisting mainly of gold (Au), and the wax material spreads around the chip. Moreover, since there is not much difference between the binary signal of the reflected light from the wax material surface and the binary signal of the reflected light from the chip surface, it is not possible to clearly distinguish between the two. Therefore, there is a problem in that it is difficult to accurately detect the position of the chip, and therefore it is difficult to automatically apply the above-mentioned resin liquid.

(c) 発明の目的 本発明の目的は上記問題点を解消して、チツプ
の位置認識を容易にするチツプ位置認識方法を提
供することにある。
(c) Object of the Invention An object of the present invention is to solve the above-mentioned problems and provide a chip position recognition method that facilitates chip position recognition.

(d) 発明の構成 本発明の特徴は、二値化データにおいてはメモ
リセル部が他の部分と識別し易いことを利用し、
半導体素子に照射した光の反射光量が低レベルで
あることを示すデータが低レベルであることを示
す二値化データが、一定数以上連続する領域を検
出し、その領域の外縁部で二値化データが変化す
る位置をメモリセル部の周縁として認識し、この
周縁の位置と予め記憶されているチツプに対する
メモリセル部の相互位置関係からチツプの中心位
置を求めることにある。
(d) Structure of the Invention The feature of the present invention is to take advantage of the fact that the memory cell part is easily distinguishable from other parts in binary data.
A region where a certain number or more of consecutive binary data indicating that the amount of reflected light of the light irradiated on the semiconductor element is low is detected, and a binary value is generated at the outer edge of the region. The purpose of this method is to recognize the position where the converted data changes as the periphery of the memory cell portion, and to determine the center position of the chip from the position of this periphery and the mutual positional relationship of the memory cell portion with respect to the chip which has been stored in advance.

(e) 発明の実施例 以下本発明を一実施例により説明する。(e) Examples of the invention The present invention will be explained below by way of an example.

第1図は上記一実施例の要部を示すシステム構
成図で、1は被処理試料、2はチツプ、3はパツ
ケージ、4はステージ、5はTVカメラ、6はレ
ンズ系、7は溶液滴下ツール、8は駆動部、9は
TVカメラドライバ、10はTVモニタ、11は位
置検出回路、12は制御系、13は記憶装置、1
4は演算回路である。
FIG. 1 is a system configuration diagram showing the main parts of the above embodiment, where 1 is a sample to be processed, 2 is a chip, 3 is a package, 4 is a stage, 5 is a TV camera, 6 is a lens system, and 7 is a solution droplet. Tool, 8 is drive unit, 9 is
TV camera driver, 10 is a TV monitor, 11 is a position detection circuit, 12 is a control system, 13 is a storage device, 1
4 is an arithmetic circuit.

本実施例においては、チツプに樹脂液を塗布す
る工程を開始するに先立ち、まずレンズ系6によ
りチツプ2上をTVカメラ5で撮像し、TVカメラ
ドライバ9を介してTVモニタ10にチツプ2の
二値化画像〔第2図参照〕を表示せしめる。この
ときTVモニタ10の画面に表示された二値化画
像においては、前述したように、チツプ2の像
と、周囲に広がつた蝋材15とを明確に識別する
ことは困難である。
In this embodiment, before starting the process of applying the resin liquid to the chip, the top of the chip 2 is first imaged by the TV camera 5 using the lens system 6, and the chip 2 is displayed on the TV monitor 10 via the TV camera driver 9. A binarized image (see Figure 2) is displayed. In the binarized image displayed on the screen of the TV monitor 10 at this time, as described above, it is difficult to clearly distinguish between the image of the chip 2 and the wax material 15 spread around it.

これに対し本願発明者らは、チツプ2のメモリ
セル部3が周囲の他の部分より実効的な反射率が
低く、従つてスライスレベルを適当に選択するこ
とにより、二値化データにおいてはメモリセル部
3を容易に識別し得ることを見出した。これはメ
モリセル部3内では、チツプ2の他の部分に較べ
て配線の幅が細く、しかも配線パターンが稠密に
形成されているため、他の部分より凹凸が激し
い。そのため照射された光が乱反射されてTVカ
メラ10に入射する光量が少なくなり、あたかも
反射率が低くなつたのと同様の結果となるものと
解される。
In contrast, the inventors of the present application have discovered that the effective reflectivity of the memory cell portion 3 of the chip 2 is lower than that of other surrounding portions, and that by appropriately selecting the slice level, the memory cell portion 3 of the chip 2 has a It has been found that the cell portion 3 can be easily identified. This is because the wiring width in the memory cell portion 3 is narrower than in other parts of the chip 2, and the wiring pattern is formed densely, so that the unevenness is more severe than in other parts. Therefore, the irradiated light is diffusely reflected and the amount of light incident on the TV camera 10 is reduced, resulting in the same result as if the reflectance had become low.

本発明はこの現象を利用してメモリセル部3の
位置認識を行おうとするものであつて、チツプ2
の撮像データにおいて、メモリセル部3に相当す
る部分は、信号レベルが周囲の他の部分より低く
なる。そこでこれを適当なスライスレベルで二値
化することにより、二値化データを、メモリセル
部3では“0”が連続し、メモリセル部3の周囲
では“1”となるようにすることができる。
The present invention attempts to recognize the position of the memory cell section 3 by utilizing this phenomenon.
In the captured image data, the signal level of the portion corresponding to the memory cell portion 3 is lower than that of other surrounding portions. Therefore, by binarizing this at an appropriate slice level, the binarized data can be made to have continuous "0" in the memory cell section 3 and "1" around the memory cell section 3. can.

従つてチツプ2の二値化データの中で“0”が
ある長さにわたつて連続すれば、その領域をメモ
リセル部3であると認識できるので、この判断基
準となる基準長をチツプの種別に対応して定めて
おき、チツプ2を撮像して得られた二値化データ
の中で、上述の基準長を越えて“0”が連続する
領域を検出し、これをメモリセル部3として認識
する。そしてこの領域の最外周部で二値化データ
が“0”から“1”に変化する位置を検出するこ
とによつて、メモリセル部3の周縁部の位置を認
識することができる。
Therefore, if "0" continues over a certain length in the binary data of the chip 2, that area can be recognized as the memory cell section 3. It is determined in accordance with the type, and in the binarized data obtained by imaging the chip 2, an area where "0" continues beyond the above-mentioned standard length is detected, and this is stored in the memory cell section 3. recognized as By detecting the position where the binary data changes from "0" to "1" at the outermost periphery of this area, the position of the periphery of the memory cell section 3 can be recognized.

そこで先ず、TVモニタ10上に、縦横各2本
ずつカーソル16,17を描かせ、これを図示せ
る如くメモリセル部3の4辺に一致せしめる。こ
のときのカーソル16,17の位置は位置検出回
路11により検出され、この位置データは制御系
12を介して記憶装置13に格納される。
Therefore, first, two cursors 16 and 17 are drawn on the TV monitor 10 in the vertical and horizontal directions, and these are made to coincide with the four sides of the memory cell section 3 as shown in the figure. The positions of the cursors 16 and 17 at this time are detected by the position detection circuit 11, and this position data is stored in the storage device 13 via the control system 12.

次いでチツプ2の二値化しない画像を再度TV
モニタ10上に表示する。今度はチツプ2の周縁
は明確に識別し得るので、カーソル16,17を
それぞれチツプ2の4辺に一致せしめる。このカ
ーソル16,17の位置も前と同様に記憶装置1
3に格納される。この二つの位置データから、チ
ツプ2に対するメモリセル部3の相互位置関係が
得られる。
Next, the non-binarized image of chip 2 is displayed on the TV again.
It is displayed on the monitor 10. This time, the periphery of chip 2 can be clearly identified, so the cursors 16 and 17 are aligned with the four sides of chip 2, respectively. The positions of these cursors 16 and 17 are also the same as before.
It is stored in 3. From these two positional data, the mutual positional relationship of the memory cell section 3 with respect to the chip 2 can be obtained.

以上によりチツプの位置検出の準備が完了し
た。
With the above steps, preparations for detecting the position of the chip are completed.

チツプ2に樹脂液の塗布を行うには、前記メモ
リセル部3をTVカメラ5により撮像し、位置検
出回路11によりその映像信号を二値化し、この
二値化データの中から光量が低レベルであること
を示す“0”が連続する長さが、予め設定された
基準長を越える領域を見出す。この領域が前述し
たようにメモリセル部3であるので、次にこの領
域の最外周部で二値化データが“0”から“1”
に変化する位置を検出する。以上によりメモリセ
ル部3の周縁の位置座標が検出された。
In order to apply the resin liquid to the chip 2, the memory cell section 3 is imaged by the TV camera 5, the video signal is binarized by the position detection circuit 11, and from this binarized data, a low level of light intensity is detected. Find an area in which the length of consecutive "0"s indicating that 0 exceeds a preset reference length. Since this area is the memory cell section 3 as mentioned above, the binary data changes from "0" to "1" at the outermost periphery of this area.
Detects the position that changes. As described above, the positional coordinates of the periphery of the memory cell section 3 have been detected.

この位置座標は前記演算回路14に送られ、制
御系12の指令に基づいて記憶装置13から読み
出された前記2組の位置データを用いて補正演算
を施し、チツプ2の中心位置を算出する。そして
現在のTVカメラ5の位置座標との差を算出し、
補正量として出力する。この補正量に基づいて駆
動部8は溶液滴下ツール7をチツプ2の中心の直
上部に移動せしめる。
These position coordinates are sent to the arithmetic circuit 14, which performs a correction calculation using the two sets of position data read out from the storage device 13 based on commands from the control system 12, and calculates the center position of the chip 2. . Then, calculate the difference with the current position coordinates of the TV camera 5,
Output as a correction amount. Based on this correction amount, the drive section 8 moves the solution dropping tool 7 to a position directly above the center of the chip 2.

この後は通常の如く樹脂液を滴下し、チツプ2
表面を樹脂により被覆する。
After this, drop the resin liquid as usual and chip 2.
The surface is coated with resin.

上述した如く本実施例においては、チツプ内の
メモリセル部の実効的な反射率が、他の部分と異
なることを利用してメモリセル部3を検出するこ
とにより、パツケージ上に蝋材で固着されたチツ
プ2の位置を明確に検出し得る。
As described above, in this embodiment, the memory cell part 3 is detected by utilizing the fact that the effective reflectance of the memory cell part in the chip is different from other parts, and the memory cell part 3 is fixed on the package with wax material. The position of the chip 2 can be clearly detected.

(f) 発明の効果 以上説明した如く本発明によれば、チツプの位
置認識が容易となり、樹脂液を自動的に塗布する
ことが可能となる。
(f) Effects of the Invention As explained above, according to the present invention, the position of the chip can be easily recognized and the resin liquid can be applied automatically.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の要部を示すシステ
ム構成図、第2図は上記一実施例の位置検出方法
を説明するための図である。 図において、1は被処理試料、2は半導体素
子、3はパツケージ、5はTVカメラ、6はレン
ズ系、7は溶液滴下ツール、8は駆動部、10は
TVモニタ、11は位置検出回路、12は制御
系、13は記憶装置、14は演算回路である。
FIG. 1 is a system configuration diagram showing the main parts of an embodiment of the present invention, and FIG. 2 is a diagram for explaining the position detection method of the above embodiment. In the figure, 1 is a sample to be processed, 2 is a semiconductor element, 3 is a package, 5 is a TV camera, 6 is a lens system, 7 is a solution dropping tool, 8 is a drive unit, and 10 is a
11 is a position detection circuit, 12 is a control system, 13 is a storage device, and 14 is an arithmetic circuit.

Claims (1)

【特許請求の範囲】[Claims] 1 半導体素子表面に形成されたメモリセル部の
前記半導体素子に対する相互位置関係と、前記メ
モリセル部の認識基準となる基準長とを予め記憶
しておき、パツケージに蝋材により固着された半
導体素子の位置決めを行うに際し、位置決め対象
の半導体素子の撮像画像の二値化データにおい
て、該半導体素子に照射した光の反射光量が低レ
ベルであることを示すデータが、前記基準長を越
えて連続する領域を検出し、該検出された領域を
メモリセル部として認識し、該認識されたメモリ
セル部とその周囲の他の部分との間で二値化デー
タが変化する位置を前記メモリセル部の周縁とし
て認識し、該認識されたメモリセル部の周縁位置
と前記相互位置関係とから前記半導体素子の中心
の位置を求めることを特徴とする半導体素子の位
置認識方法。
1 The mutual positional relationship of the memory cell portion formed on the surface of the semiconductor element with respect to the semiconductor element and the reference length serving as the recognition standard of the memory cell portion are stored in advance, and the semiconductor element is fixed to the package with wax material. When performing positioning, in the binarized data of the captured image of the semiconductor element to be positioned, data indicating that the amount of reflected light of the light irradiated to the semiconductor element is at a low level continues beyond the reference length. A region is detected, the detected region is recognized as a memory cell section, and a position where the binary data changes between the recognized memory cell section and other parts around it is determined in the memory cell section. A method for recognizing the position of a semiconductor element, characterized in that the position of the center of the semiconductor element is determined from the recognized position of the peripheral edge of the memory cell portion and the mutual positional relationship.
JP21174781A 1981-12-23 1981-12-23 Recognition of position of semiconductor element Granted JPS58110051A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21174781A JPS58110051A (en) 1981-12-23 1981-12-23 Recognition of position of semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21174781A JPS58110051A (en) 1981-12-23 1981-12-23 Recognition of position of semiconductor element

Publications (2)

Publication Number Publication Date
JPS58110051A JPS58110051A (en) 1983-06-30
JPS6146053B2 true JPS6146053B2 (en) 1986-10-11

Family

ID=16610909

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21174781A Granted JPS58110051A (en) 1981-12-23 1981-12-23 Recognition of position of semiconductor element

Country Status (1)

Country Link
JP (1) JPS58110051A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0237939A (en) * 1988-07-28 1990-02-07 Mazda Motor Corp Mold forming machine

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2901067B2 (en) * 1988-09-12 1999-06-02 株式会社東芝 Resin sealing device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5197372A (en) * 1975-02-24 1976-08-26
JPS6059736B2 (en) * 1978-05-24 1985-12-26 三菱電機株式会社 Item position detection method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0237939A (en) * 1988-07-28 1990-02-07 Mazda Motor Corp Mold forming machine

Also Published As

Publication number Publication date
JPS58110051A (en) 1983-06-30

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