JPS6146761B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a linear micrometer, and more particularly to a frame provided with an anvil, and a micrometer that is slidably supported on the frame and whose tip abuts an object to be measured during measurement. It has a straight-moving spindle,
This invention relates to an improvement in a linear micrometer that measures the length of an object to be measured from the linear displacement of the spindle when the object is held between an anvil and a spindle.

A micrometer is a type of length measuring device that measures the length of an object to be measured. This includes a frame on which an anvil is installed, and a spindle supported by the frame, the tip of which comes into contact with the object to be measured during measurement, and when the object to be measured is held between the anvil and the spindle. The length of the object to be measured is measured from the displacement of
A so-called mechanical rotary micrometer, which takes readings using magnification due to the slope of a screw, is mainly used.

On the other hand, in recent years, with the advancement of electronics, so-called electronic micrometers have been proposed in which the dimension reading portion of a mechanical micrometer is replaced with a photoelectric detection device. This is, for example,
a frame on which an anvil is disposed; a linear spindle that is slidably supported on the frame and whose tip comes into contact with the object to be measured during measurement; a fixed scale fixed to the frame; and the spindle. The device is equipped with a movable scale linked to the anvil and the spindle, and changes in the physical quantity between the movable scale and the fixed scale due to the linear displacement of the spindle, such as changes in the amount of transmitted light or reflected light, can be detected when the measured object is held between the anvil and the spindle. It is used to measure the length of objects. These electronic linear micrometers enable more accurate measurements than conventional mechanical micrometers, but in the past, in order to keep the measurement pressure constant, A person had to hold the spindle at a constant pressure to apply a predetermined measurement pressure, which caused some problems with the operating feel.

In order to eliminate the above-mentioned drawbacks of such electronic linear micrometers, in order to prevent the spindle from returning freely and to keep the measuring force constant, a reciprocating system is used to reciprocate the spindle over the entire stroke. a mechanism, a ratchet mechanism for locking the reciprocating mechanism at an arbitrary position, and a constant pressure mechanism for pressing the spindle against the object to be measured with a constant measuring force when the ratchet mechanism is in operation. However, in such a linear micrometer, a slide knob for operating the slider constituting the reciprocating mechanism is movable over the entire movement range of the spindle on the side of the micrometer body. This was inconvenient in terms of processing and operation of the main body. In particular, in addition to the slide knob,
A release mechanism is provided for overcoming the pressing force of the constant pressure mechanism and pulling back the spindle by a predetermined stroke to release the object to be measured while the reciprocating mechanism is locked by the ratchet mechanism, Furthermore, a snop knob for operating the release arm constituting the release mechanism is disposed on the side surface of the micrometer body on the side where the slide knob is not provided, so as to be movable over the entire movement range of the spindle. There is a need to
This was extremely inconvenient in terms of processing and operation.

In order to eliminate the above-mentioned drawbacks of the linear micrometer, the linear micrometer as described above includes a rack formed on the side surface of the spindle, a pinion that meshes with the rack on the circumferential surface, and a pinion that meshes with the rack. a first rotating member rotatably supported by the frame; and a second rotating member having an operation dial fixed thereto and rotatably supported by the frame on the same axis as the first rotating member. The first rotating member and the second rotating member have a predetermined allowable range of relative movement, and bias the first rotating member in the spindle forward direction with a predetermined biasing force within the allowable range. an interlocking mechanism that interlocks the rotating member;
It is also conceivable to provide a ratchet mechanism for preventing the rotating member from returning freely in the spindle retraction direction. According to such an electronic linear micrometer, the spindle moves straight by operating the operation dial, a measuring force is applied, and one-handed operation is also possible. In addition, there is no need to make the knob etc. movable over the entire side surface of the micrometer body, which is advantageous in processing the body, but it is necessary to open the ratchet mechanism when retracting the spindle. , it was necessary to operate a lever for this purpose. Another problem was that ratcheting noise was generated from the ratcheting mechanism when the spindle moved.

The present invention has been made in order to eliminate the above-mentioned drawbacks of the conventional technology, and it is possible to move the spindle straight, apply a measuring force, and move it backward just by operating the operation dial. It is an object of the present invention to provide a linear micrometer that does not need to be movable over the entire side surface and is advantageous in processing the main body.

The present invention includes a frame provided with an anvil;
It has a linear spindle that is slidably supported on the frame and whose tip comes into contact with the object to be measured during measurement. In a linear micrometer that measures the length of an object to be measured,
a rotating shaft rotatably supported by the frame and having an operation dial fixed to one end; and a rack formed on the peripheral surface of the spindle and rotatably supported by the rotating shaft. a first rotating member formed with an engaging pinion; a second rotating member fixed to the rotating shaft; and a second rotating member screwed to the rotating shaft.
A third rotating member movable in the axial direction of the rotating shaft and a predetermined allowable relative movement range, and within the allowable range, the first rotating member is moved in the spindle forward direction by a predetermined biasing force. an interlocking mechanism that interlocks the first rotating member and the rotating shaft to bias the rotating shaft; and a linkage mechanism that moves the third rotating member in the axial direction of the rotating shaft during measurement to bring it into close contact with the frame; The above object is achieved by including a brake mechanism that prevents rotation of the rotation shaft.

The interlocking mechanism may include an arc-shaped elongated hole formed in the peripheral edge of the second rotating member, and a pin that is fixed to the first rotating member and inserted into the arc-shaped elongated hole. It is constructed using a pin and a spring stretched between the circumferential surface of the rotation shaft.

Furthermore, the brake mechanism is configured using a round hole formed in the peripheral edge of the third rotating member, and a pin that is fixed to the first rotating member and inserted into the round hole. It is something.

Further, the pin constituting the interlocking mechanism and the pin constituting the brake mechanism are made into a single member.

Embodiments of the present invention will be described in detail below with reference to the drawings. In this embodiment, as shown in FIGS. 1 to 4, the anvil 12 is disposed inside the tip.
A frame 10 in the shape of a letter, a linear spindle 14 slidably supported on the frame 10 and whose tip 14a comes into contact with the object to be measured during measurement, and a spindle 14 implanted in the rear end surface of the frame 10. Guide post 1
6 and a fixed scale, which is supported by a holder 18 fixed to the rear end of the guide column 16, and has light transmitting parts and non-light transmitting parts formed in a striped pattern at equal intervals on a flat plate made of glass. Index scale 2
0 is a movable scale whose front end is fixed to a scale holder 22 fixed to the spindle 14. A main scale 24 is formed of a glass flat plate with light transmitting parts and non-transmissive parts formed in a striped pattern at equal intervals, a light source (not shown) supported by the holder 18, and a light receiving board 26. It also includes a light receiving element (not shown), which is also supported by the holder 18 and receives the light emitted from the light source and transmitted through the main scale 24 and the index scale 20, and the main scale 24 as the spindle 14 is displaced. In an electronic linear micrometer that measures the length of an object to be measured held between the anvil 12 of the frame 10 and the tip 14a of the spindle 14 based on changes in the amount of light passing between the index scale 20 and the index scale 20, the fixed plate 30 , 32, is rotatably supported on the frame 10, and has an operation dial 34 fixed to one end with a screw 36.
8, a first rotating member 40 that is rotatably supported on the rotating shaft 38 and has a pinion 40a formed on its circumferential surface that meshes with a rack 14b formed on the lower surface of the spindle 14; A second rotating member 42 integrally formed with the rotating shaft 38; and a third rotating member 44 screwed onto the rotating shaft 38 and movable in the axial direction of the rotating shaft 38. and the second rotating member 42, which has a predetermined allowable range of relative movement A and urges the first rotating member 40 in the spindle forward direction with a predetermined urging force within the allowable range.
a circular arc-shaped elongated hole 42a formed in the peripheral edge of the circular arc-shaped elongated hole 42a, a pin 46 fixed to the first rotation member 40 and inserted through the arc-shaped elongated hole 42a, and the peripheral surfaces of the pin 46 and the rotation shaft 38; An interlocking mechanism configured using a spring 48 stretched between the third rotating member 44 and the third rotating member 44 is moved in the axial direction of the rotating shaft 38 to bring it into close contact with the fixed plate 30 during measurement. A round hole 44a formed at the peripheral edge of the third rotating member 44 to prevent rotation of the first rotating member 40.
The brake mechanism includes a pin 46 that is fixed to the circular hole 44a and that is integrated with the pin 46 that constitutes the interlocking mechanism. In the figure, 52 is a case cover.

The rotating shaft 38 has a diameter that is changed between a portion that supports the first rotating member 40 and a portion that supports the third rotating member 44.
However, the first rotating member 40 or the third rotating member 4
It is made so that it does not detach from 4.

Further, the length of the arcuate elongated hole 42a is made slightly longer than the amount of movement of the third rotating member 44 until the brake is applied.

Furthermore, the spring 48 constituting the interlocking mechanism is S
It is made into a letter-shaped coil spring and is wound around the rotating shaft 38. Further, this spring 48 is biased in advance so that a predetermined pressing force is immediately applied when the spindle 14 is advanced by the pinion 40a of the first rotating member 40 and comes into contact with the anvil 12.

The guide column 16 has a hollow shape, and a battery 50 serving as a power source for a photoelectric detection device and the like is accommodated therein.

The action will be explained below. For measurement, first, the operation dial 34 is rotated to rotate the rotation shaft 38 clockwise in FIG. 1. Then, the first rotating member 40 is also rotated clockwise in FIG. 1
4b, the spindle 14 is fully retracted and ready for measurement.

Next, the object to be measured is interposed between the anvil 12 of the frame 10 and the tip 14a of the spindle 14,
Rotate the operation dial 34 in the opposite direction. Then, the rotating shaft 38 rotates counterclockwise in FIG. 1, and the first rotating member 40 also rotates counterclockwise in FIG. 1 via the spring 48 and pin 46. At this time, the relative positional relationship between the second rotating member 42 and the pin 46 is as shown in FIG. It has become a state of being. As a result, the spindle 14 is advanced, and the anvil 12 and the spindle 14 are moved forward.
When the object to be measured is held between the tips 14a of the spindle 14, the forward movement of the spindle 14 is stopped. At this time, the first rotating member 40 can no longer rotate in the forward direction. When the operation dial 34 is further rotated in the forward direction, as shown in FIG.
6) is rotated within the allowable range A. At this time, although the pin 46 is stopped, the rotation shaft 38 further rotates, so the third rotation member 44
is moved by a screw in the left direction as shown by arrow B in FIG. At this time, the round hole 44a of the third rotating member 44 and the pin 46 are sliding. Therefore,
Even if the measurer takes his hand off the operation dial 34 in this state, the spindle 14 does not return, and the measurement is performed with a predetermined measurement pressure being applied to the spindle 14 by the spring 48. Specifically, by detecting the amount of relative displacement between the index scale 20 and the main scale 24 due to the displacement of the spindle 14 with respect to the reference position from the change in the amount of passing light, the change in the main scale 24 from the reference position is detected. You can know the amount. Therefore, the amount of displacement of the spindle 14 to which the main scale 24 is fixed can be known, and the length of the object to be measured can be measured. At this time, since the spindle 14 is constantly pressed by the spring 48 in the direction in which it comes into contact with the object to be measured, a constant measuring force is always applied regardless of variations in the operator's operating force, etc., and accurate measurement is possible. It is possible. In addition, since the spring 48 is biased in advance, a predetermined pressing force is immediately applied when the tip of the spindle 14 is in contact with the object to be measured, allowing rapid measurement.

At the end of the measurement, simply by rotating the operation dial 34 in the opposite direction, the third rotating member 44 is first released from its close contact with the fixed plate 30, and then,
The first rotating member 40 via the spring 48 and the pin 46
is rotated clockwise in Fig. 1, and spindle 1
4 is pushed back.

In this embodiment, the pin constituting the interlocking mechanism and the pin constituting the brake mechanism are made into a single member, so the configuration is simple.

Note that in the embodiment, the third rotating member 44
However, in the case of a configuration in which the rotating shaft 38 is directly supported by the frame 10, the third rotating member 44 is placed in close contact with the fixed plate 30.
Of course, it is also possible to bring it into direct contact with the.

In the above embodiment, the present invention was applied to an electronic linear micrometer that measures the linear displacement of a spindle from the change in the amount of light passing between the movable scale and the fixed scale, but the scope of the present invention is not limited to this. It is not limited to, but is not limited to, an electronic linear micrometer that measures the displacement of a measurement target from a change in the amount of reflected light between a fixed scale and a movable scale, or a linear movement of a spindle based on changes in other physical quantities between a movable scale and a fixed scale. It is clear that the invention can be similarly applied to general linear micrometers that measure displacement.

Further, in the above embodiment, the present invention was applied to a micrometer, but it is clear that the present invention can be similarly applied to length measuring instruments other than micrometers such as calipers and height gauges.

As explained above, according to the present invention, the spindle can move straight, apply a measuring force, and retreat by simply operating the operation dial, and can also be operated with one hand. Further, there is no need to dispose the operating knob etc. in a movable manner over the entire side surface of the micrometer body, which is advantageous in terms of body processing. Furthermore, it has excellent effects such as no ratcheting noise when the spindle moves.

[Brief explanation of the drawing]

FIG. 1 is a front view showing the configuration of an embodiment of a linear micrometer according to the present invention, FIG. 2 is a longitudinal cross-sectional view, and FIG. FIG. 4 is a cross-sectional view taken along the line - in FIG. 1, and FIG. 5 is a front view showing the measurement state of the main part of the interlocking mechanism of the embodiment. 10...Frame, 12...Anvil, 14...
...Spindle, 30, 32...Fixing plate, 34...
Operation dial, 38... Rotating shaft, 40... First rotating member, 40a... Pinion, 42... Second rotating member, 42a... Arc-shaped elongated hole, 44... Third
Rotating member, 44a...Round hole, 46...Pin, 4
8... Spring.

Claims (1)

[Claims] 1 It has a frame on which an anvil is arranged, and a linear type spindle that is slidably supported on the frame and whose tip comes into contact with the object to be measured during measurement,
In a linear micrometer that measures the length of an object to be measured from the linear displacement of the spindle when the object is held between an anvil and a spindle, an operation dial is rotatably supported on the frame and fixed to one end. a first rotating member rotatably supported on the rotating shaft and having a pinion formed on its circumferential surface that meshes with a rack formed on a side surface of the spindle; A second rotating member fixed to the rotating shaft, a third rotating member screwed to the rotating shaft and movable in the axial direction of the rotating shaft, and a predetermined relative movement tolerance range. the second rotating member for interlocking the first rotating member and the rotating shaft for urging the first rotating member in the spindle forward direction with a predetermined urging force within the allowable range; A pin fixed to the first rotating member is inserted into an arc-shaped elongated hole formed on the peripheral edge of the rotating member, and a spring is stretched between the pin and the circumferential surface of the rotating shaft. an interlocking mechanism; and a peripheral edge of the third rotating member for moving the third rotating member in the axial direction of the rotating shaft to bring it into close contact with the frame and preventing rotation of the rotating shaft during measurement. a brake mechanism configured by inserting a pin fixed to the first rotating member into a round hole formed in the linear micrometer.