JPS6148094B2 - - Google Patents
Info
- Publication number
- JPS6148094B2 JPS6148094B2 JP15509081A JP15509081A JPS6148094B2 JP S6148094 B2 JPS6148094 B2 JP S6148094B2 JP 15509081 A JP15509081 A JP 15509081A JP 15509081 A JP15509081 A JP 15509081A JP S6148094 B2 JPS6148094 B2 JP S6148094B2
- Authority
- JP
- Japan
- Prior art keywords
- focus correction
- infrared
- detection device
- mirror
- temperature detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/342—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells the sensed object being the obturating part
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Radiation Pyrometers (AREA)
- Mechanical Optical Scanning Systems (AREA)
Description
【発明の詳細な説明】
本発明は、物体から放射される赤外線を感知し
て物体の温度を検出する赤外線温度検出装置に関
し、特に例えば製鉄所におけるスラブの探傷など
のように物体を比較的短距離から広い幅に亘つて
走査する如く用いられる赤外線温度検出装置の焦
点補正機構の改良に係わる。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an infrared temperature detection device that detects the temperature of an object by sensing infrared rays emitted from the object. The present invention relates to an improvement in the focus correction mechanism of an infrared temperature detection device used to scan over a wide range of distances.
この種の赤外線温度検出装置（以下単に「温度
検出装置」と略記する）の従来の一例を第１図乃
至第５図に示してある。第１図は温度検出装置の
全体構成の概略図であり、基本的にはハウジング
１と、モータ２によりベルト３を介して回転駆動
される多角錐体の回転鏡４と、凹面の１次鏡５
と、凸面の２次鏡６と、赤外線検出部７とから構
成されている。ハウジング１には窓８が設けら
れ、例えば第２図に示すようにスラブ１０の傷１
１の検出する場合、矢印Ａ方向へ送られるスラブ
１０の表面が窓８から回転鏡４によつて矢印８で
示す如く走査される。これによりスラブ１０から
の赤外線９（矢印で示す）は図示の如く窓８から
ハウジング１内に入射し、回転鏡４，１次鏡５及
び２次鏡６において順次反射を繰り返して赤外線
検出部７に集光する。赤外線検出部７は入射した
赤外線の強さを感知して物体の温度を検出し、傷
の有無を検出する。スラブの場合、傷１１があれ
ば高温のスラブ内部が見えるので傷は高温部とし
て検出される。 A conventional example of this type of infrared temperature detection device (hereinafter simply referred to as "temperature detection device") is shown in FIGS. 1 to 5. FIG. 1 is a schematic diagram of the overall configuration of the temperature detection device, which basically includes a housing 1, a polygonal pyramidal rotating mirror 4 that is rotationally driven by a motor 2 via a belt 3, and a concave primary mirror. 5
, a convex secondary mirror 6 , and an infrared detection section 7 . The housing 1 is provided with a window 8, for example, as shown in FIG.
1, the surface of the slab 10 being sent in the direction of the arrow A is scanned by the rotating mirror 4 through the window 8 as shown by the arrow 8. As a result, the infrared rays 9 (indicated by arrows) from the slab 10 enter the housing 1 through the window 8 as shown in the figure, and are repeatedly reflected in the rotating mirror 4, the primary mirror 5, and the secondary mirror 6, and the infrared rays detecting unit 7. The light is focused on. The infrared detector 7 senses the intensity of the incident infrared rays, detects the temperature of the object, and detects the presence or absence of scratches. In the case of a slab, if there is a flaw 11, the inside of the high-temperature slab can be seen, so the flaw is detected as a high-temperature part.
以上のように赤外線温度検出装置をスラブ探傷
などに用いる場合、温度検出装置のスラブからの
高さ距離は一般に１ｍ程度の短距離であり、これ
に対してスラブ１０の幅（つまり走査幅）は２ｍ
前後となる。この場合、回転鏡４からスラブ表面
までの距離は１〜1.4ｍまで変化し、赤外線９の
集光点が赤外線検出部７に関して周期的にずれる
こになり、精密な検出が行えない。 As described above, when using an infrared temperature detection device for slab flaw detection, the height distance of the temperature detection device from the slab is generally a short distance of about 1 m, whereas the width of the slab 10 (that is, the scanning width) is 2m
Before and after. In this case, the distance from the rotating mirror 4 to the slab surface varies from 1 to 1.4 m, and the focal point of the infrared rays 9 is periodically shifted with respect to the infrared detection section 7, making it impossible to perform accurate detection.
このため、従来は第１図及び第３図に示すよう
な焦点補正機構１３が用いられている。この機構
は原理的には回転鏡４の走査周期に同期させて２
次鏡６を矢印Ｃ方向へ移動させることにより焦点
を補正するものである。すなわち第３図乃至第５
図に示すように、回転鏡４に円筒形のチヨツパ１
４を一体的に回転するように設けてあり、これに
焦点補正用指標である穴１５をサインカーブ状の
曲線に沿つて多数形成してある。一方、ハウジン
グ１６内にはボイスコイル型リニアモータ１７が
ブラケツト１８に固定してあり、このモータのシ
ヤフト１９の左端にはアーム２０を介して光方式
指標検出器２１を取り付けてあり、またシヤフト
１９の右端には２次鏡６を取り付けてある。指標
検出器２１は発光ダイオード２２からの光をフオ
ト・トランジスタ２３で受光して指標穴１５を検
出する。リニアモータ１７は、閉ループ制御回路
によつて、トランジスタ２３の受光量が最大とな
るように、つまり検出器２１が指標穴１５を追従
するようにシヤフト１９を駆動する。この結果２
次鏡６が矢印Ｃ方向へ移動し、焦点補正が行われ
ることになる。 For this reason, a focus correction mechanism 13 as shown in FIGS. 1 and 3 has conventionally been used. In principle, this mechanism operates in synchronization with the scanning period of the rotating mirror 4.
The focus is corrected by moving the secondary mirror 6 in the direction of arrow C. That is, Figures 3 to 5
As shown in the figure, a cylindrical tipper 1 is attached to the rotating mirror 4.
4 are provided so as to rotate integrally, and a large number of holes 15 serving as focus correction indicators are formed along a sine curve. On the other hand, inside the housing 16, a voice coil type linear motor 17 is fixed to a bracket 18, and an optical index detector 21 is attached to the left end of the shaft 19 of this motor via an arm 20. A secondary mirror 6 is attached to the right end of the mirror. The index detector 21 detects the index hole 15 by receiving light from the light emitting diode 22 with a photo transistor 23 . The linear motor 17 drives the shaft 19 using a closed loop control circuit so that the amount of light received by the transistor 23 is maximized, that is, so that the detector 21 follows the index hole 15. This result 2
Next, the mirror 6 moves in the direction of arrow C, and focus correction is performed.
しかしこの従来の焦点補正機構では、チヨツパ
１４の指標穴１５間のつなぎ部分で光が遮られる
ため、これを補償する制御回路（信号変換回路）
が必要であつた。 However, in this conventional focus correction mechanism, the light is blocked at the joint between the index holes 15 of the tipper 14, so a control circuit (signal conversion circuit) is required to compensate for this.
was necessary.
従つて本発明の目的は上記のような問題を解消
すること、すなわち前述したような赤外線温度検
出装置における焦点補正機構の改良構造を提供す
ることにある。 SUMMARY OF THE INVENTION Therefore, an object of the present invention is to solve the above problems, that is, to provide an improved structure for a focus correction mechanism in an infrared temperature detection device as described above.
以下、本発明について図示を参照し実施例に基
づいて詳細に説明する。 EMBODIMENT OF THE INVENTION Hereinafter, the present invention will be described in detail based on embodiments with reference to the drawings.
第６図乃至第８図は本発明による焦点補正機構
の一実施例の要部を示し、従来との相違点はチヨ
ツパ３０の構造だけであり、他は全く同様であ
る。すなわち、チヨツパ３０の焦点補正用指標は
その軸線方向の端面に形成された連続曲面３１で
ある。第８図に示すように、検出器２１は指標面
３１が発光ダイオード２２とフオト・トランジス
タ２３の中心線上にある位置を基準位置として読
み取る。すなわち、この位置ではフオト・トラン
ジスタ２３に入力する光量は半分だけであり、入
力光量がそれより多くなつたり少なくなれば検出
器２１、すなわちシヤフト１９及び２次鏡６が矢
印Ｃ方向へ追従移動し、焦点補正が行われること
になる。 FIGS. 6 to 8 show essential parts of an embodiment of a focus correction mechanism according to the present invention, and the only difference from the conventional one is the structure of the chopper 30, and the rest are completely the same. That is, the focus correction index of the chopper 30 is a continuous curved surface 31 formed on the end face in the axial direction. As shown in FIG. 8, the detector 21 reads the position where the index surface 31 is on the center line of the light emitting diode 22 and the photo transistor 23 as a reference position. That is, at this position, the amount of light input to the photo transistor 23 is only half, and if the amount of input light increases or decreases, the detector 21, that is, the shaft 19 and the secondary mirror 6 move in the direction of arrow C. , focus correction will be performed.
本発明の焦点補正機構によれば、チヨツパの焦
転補正指標が連続面であるため、従来のように信
号変換回路を用いずとも精密な焦点補正が可能で
あり、従つて信頼性の高い温度検出を実現し得
る。 According to the focus correction mechanism of the present invention, since the focus correction index of the tipper is a continuous surface, precise focus correction is possible without using a signal conversion circuit as in the conventional case, and therefore, highly reliable temperature control is possible. detection can be realized.
第１図乃至第５図は従来の赤外線温度検出装置
の一例を示す図であつて第１図が全体構成の概略
図、第２図がスラブの探傷法の概略図、第３図が
焦点補正機構の概略図、第４図がチヨツパの斜視
図、第５図が焦点補正用指標の検出方法を示す
図、第６図乃至第８図は本発明による焦点補正機
構の一実施例の要部を示す図であつて第６図がチ
ヨツパの断面図、第７図がチヨツパの斜視図、第
８図が焦点補正用指標の検出方法を示す図であ
る。
１……ハウジング、４……回転鏡、５……１次
鏡、６……２次鏡、７……赤外線検出部、８……
窓、９……赤外線、１０……スラブ、１１……
傷、１３……焦点補正機構、１７……ボイスコイ
ル型リニアモータ、１９……シヤフト、２１……
光方式検出器、２２……発光ダイオード、２３…
…フオト・トランジスタ、３０……チヨツパ、３
１……焦点補正用指標（端面の連続曲面）。
Figures 1 to 5 are diagrams showing an example of a conventional infrared temperature detection device, in which Figure 1 is a schematic diagram of the overall configuration, Figure 2 is a schematic diagram of a slab flaw detection method, and Figure 3 is a focus correction A schematic diagram of the mechanism, FIG. 4 is a perspective view of the tipper, FIG. 5 is a diagram showing a method of detecting a focus correction index, and FIGS. 6 to 8 are main parts of an embodiment of the focus correction mechanism according to the present invention. FIG. 6 is a sectional view of the tipper, FIG. 7 is a perspective view of the tipper, and FIG. 8 is a diagram showing a method of detecting a focus correction index. 1...Housing, 4...Rotating mirror, 5...Primary mirror, 6...Secondary mirror, 7...Infrared detection unit, 8...
Window, 9... Infrared rays, 10... Slab, 11...
Scratch, 13... Focus correction mechanism, 17... Voice coil type linear motor, 19... Shaft, 21...
Optical detector, 22... Light emitting diode, 23...
...Photo transistor, 30...Chiyotsupa, 3
1... Focus correction index (continuous curved surface of end surface).
Claims (1)
及び２次鏡で反射させ、赤外線検出部に集光入射
させて物体の温度を検出すると共に、前記回転鏡
と一体的に回転するチヨツパに形成した焦点補正
用指標を光方式により検出し、その検出信号に基
づき２次鏡の位置を調整して焦点を補正するよう
に構成された赤外線温度検出装置の焦点補正機構
において、前記チヨツパの焦点補正用指標がチヨ
ツパの回転軸線方向の端面に形成された連続曲面
から成ることを特徴とする赤外線温度検出装置の
焦点補正機構。1. Infrared rays emitted from an object are reflected by a rotating mirror, a primary mirror, and a secondary mirror, and the infrared rays are focused into an infrared detection section to detect the temperature of the object. In the focus correction mechanism of the infrared temperature detection device, the focus correction mechanism of the infrared temperature detection device is configured to detect the formed focus correction index by an optical method and correct the focus by adjusting the position of the secondary mirror based on the detection signal. A focus correction mechanism for an infrared temperature detection device, characterized in that a correction index consists of a continuous curved surface formed on an end face of a tipper in the rotation axis direction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15509081A JPS5855827A (en) | 1981-09-30 | 1981-09-30 | Focal point correcting mechanism of infrared ray temperature detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15509081A JPS5855827A (en) | 1981-09-30 | 1981-09-30 | Focal point correcting mechanism of infrared ray temperature detecting device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5855827A JPS5855827A (en) | 1983-04-02 |
| JPS6148094B2 true JPS6148094B2 (en) | 1986-10-22 |
Family
ID=15598423
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15509081A Granted JPS5855827A (en) | 1981-09-30 | 1981-09-30 | Focal point correcting mechanism of infrared ray temperature detecting device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5855827A (en) |
-
1981
- 1981-09-30 JP JP15509081A patent/JPS5855827A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5855827A (en) | 1983-04-02 |
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