JPS6148583B2 - - Google Patents
Info
- Publication number
- JPS6148583B2 JPS6148583B2 JP5801382A JP5801382A JPS6148583B2 JP S6148583 B2 JPS6148583 B2 JP S6148583B2 JP 5801382 A JP5801382 A JP 5801382A JP 5801382 A JP5801382 A JP 5801382A JP S6148583 B2 JPS6148583 B2 JP S6148583B2
- Authority
- JP
- Japan
- Prior art keywords
- reaction tube
- inert gas
- gas inlet
- inlet
- lid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000006243 chemical reaction Methods 0.000 claims description 61
- 239000000758 substrate Substances 0.000 claims description 41
- 239000011261 inert gas Substances 0.000 claims description 30
- 238000005229 chemical vapour deposition Methods 0.000 claims description 16
- 239000012495 reaction gas Substances 0.000 claims description 15
- 239000004065 semiconductor Substances 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 4
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 2
- 239000007789 gas Substances 0.000 claims 3
- 150000001875 compounds Chemical class 0.000 claims 2
- 239000010409 thin film Substances 0.000 description 6
- 239000010408 film Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 239000005360 phosphosilicate glass Substances 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000005368 silicate glass Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000001947 vapour-phase growth Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Description
【発明の詳細な説明】
本発明は半導体基板および太陽電池用材料とし
ての基板の製造に使用される外熱型プラズマ化学
気相成長装置や外熱型化学気相成長装置に関する
ものである。さらに詳しくは、半導体基板の層間
絶縁膜や最終保護膜としてのシリコン窒化膜
(SiN)、ケイ酸ガラス膜(SiO2)またはリンケイ
酸ガラス膜(PSG)や、太陽電池用材料としての
アモルフアスシリコンやアモルフアスシリコンカ
ーバイト(SixC1-x)などの薄膜をその基板上に
生成させる場合に、すでに反応温度に加熱してあ
る反応管に被処理基板を挿入して反応ガスにより
化学気相成長もしくはグロー放電を併用したプラ
ズマ化学気相成長は操作時間の短縮のために最近
よく使用されている。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an externally heated plasma chemical vapor deposition apparatus and an externally heated chemical vapor deposition apparatus used for manufacturing semiconductor substrates and substrates as materials for solar cells. More specifically, silicon nitride (SiN), silicate glass (SiO 2 ), or phosphosilicate glass (PSG) are used as interlayer insulating films and final protective films for semiconductor substrates, and amorphous silicon is used as a material for solar cells. When producing a thin film of amorphous silicon carbide (Si x C 1-x ) on a substrate, the substrate to be processed is inserted into a reaction tube that has already been heated to the reaction temperature, and a chemical vapor is generated using a reaction gas. Plasma chemical vapor deposition in conjunction with phase growth or glow discharge has recently become popular due to its shortened operating time.
第1図は従来一般に使用されている装置の構成
を示すもので、図ではプラズマ化学気相成長装置
を示している。プラズマを併用しない化学気相成
長装置の場合は高周波電力を導入する電気回路が
ないだけで、他は同様であるので、以後の説明は
プラズマ化学気相成長装置について行なう。 FIG. 1 shows the configuration of a conventionally commonly used apparatus, and the figure shows a plasma chemical vapor deposition apparatus. In the case of a chemical vapor deposition apparatus that does not use plasma, there is no electric circuit for introducing high-frequency power, and the other aspects are the same, so the following explanation will be given for the plasma chemical vapor deposition apparatus.
図において1は反応管2をとりまく環状のヒー
タ、反応管2は一端は内容物出入口として大きく
開口しており、他端はくびれて排気孔2−1が開
口している。3は石英などの耐熱絶縁物製のボー
トで、その底面は前記反応管の下部側面に合せた
形状をしており、上面には基板保持電極4が前記
反応管の管軸に垂直な面となるように、かつ実質
的に等間隔になるように複数枚保持されている。
5は反応管の内容物出入口に設けられた蓋で、こ
の内面には前記ボートに連結する連結棒5−1
と、この蓋を貫通して前記基板保持電極に高周波
電力を供給するための2個の端子14が設けられ
ている。この端子の内側からはそれぞれリード線
13で前記基板保持電極を1枚おきに交互に接続
してそれぞれ群をなし、かつ互に対向した基板保
持電極群を形成している。6は反応管の内容物出
入口と蓋との間に設けられた反応ガス導入リング
で、バルブを設けた反応ガス導入管6−1が設け
られている。7は反応管の排気孔2−1より排気
する排気ポンプである。 In the figure, reference numeral 1 denotes an annular heater surrounding a reaction tube 2, and the reaction tube 2 has one end that is wide open as an inlet/outlet for contents, and the other end is constricted and has an exhaust hole 2-1 opened therein. Reference numeral 3 denotes a boat made of heat-resistant insulator such as quartz, the bottom surface of which is shaped to match the lower side surface of the reaction tube, and the substrate holding electrode 4 on the top surface aligned with the surface perpendicular to the tube axis of the reaction tube. A plurality of sheets are held at substantially equal intervals.
Reference numeral 5 denotes a lid provided at the inlet/outlet for the contents of the reaction tube, and a connecting rod 5-1 connected to the boat is attached to the inner surface of the lid.
Two terminals 14 are provided through the lid to supply high frequency power to the substrate holding electrode. The substrate holding electrodes are connected alternately to every other substrate using lead wires 13 from inside these terminals to form groups of substrate holding electrodes facing each other. Reference numeral 6 denotes a reaction gas introduction ring provided between the contents inlet/outlet of the reaction tube and the lid, and a reaction gas introduction pipe 6-1 provided with a valve is provided. 7 is an exhaust pump that exhausts the reaction tube from the exhaust hole 2-1.
このような従来装置で化学気相成長を行なうた
めには、室温中で前記ボートに直立した基板保持
電極(もしくは基板保持板)に基板を装填し、こ
れをすでに気相成長に必要な反応温度にまで加熱
されている反応管に挿入して、基板が所定の反応
温度に到達するまで放置しておく。ところが、こ
の状態では反応管内には空気が充満しており、基
板温度が上昇するにつれ、基板表面が酸化されて
行く。このために酸化し易い基板や、酸化し易い
膜の生成には使えないという欠点がある。 In order to perform chemical vapor deposition using such conventional equipment, the substrate is loaded onto the substrate holding electrode (or substrate holding plate) that stands upright on the boat at room temperature, and the substrate is already heated to the reaction temperature required for vapor phase growth. The substrate is then inserted into a reaction tube that has been heated to a temperature of 100.degree. C. and left until the substrate reaches a predetermined reaction temperature. However, in this state, the reaction tube is filled with air, and as the substrate temperature rises, the substrate surface becomes oxidized. For this reason, it has the disadvantage that it cannot be used for producing substrates that are easily oxidized or films that are easily oxidized.
この欠点を多少でも緩和するために基板挿入直
後、基板の温度上昇を待たずに直ちに排気する方
法が試みられた。この場合には反応管内での対流
による熱伝導の手段がほとんど奪われてしまうた
めに、基板のみならず基板保持電極やボートまで
含めた熱容量が大きいので所定の温度まで上昇し
て安定するまでの時間が長く、従来は40分以上の
時間を必要としていた。 In order to alleviate this drawback to some extent, a method has been attempted in which the air is exhausted immediately after inserting the board, without waiting for the temperature of the board to rise. In this case, most of the means of heat conduction through convection within the reaction tube are taken away, and since the heat capacity of not only the substrate but also the substrate holding electrode and boat is large, it takes until the temperature rises to a predetermined temperature and becomes stable. It takes a long time, and previously required more than 40 minutes.
上記のように温度が安定してから前記6−1の
反応ガス導入管から反応ガスを注入し、所定の真
空度を維持しながらプラズマを各電極間に発生さ
せて基板上に膜を生成させるものである。この工
程で本来直接必要なものは薄膜の生成工程だけで
あり、その他の温度安定化までの時間や、生成終
了後の室温までの温度降下時間は短いほど良く、
この時間が生産性向上の大きな障害となつてい
た。 After the temperature stabilizes as described above, the reaction gas is injected from the reaction gas introduction tube in 6-1 above, and while maintaining a predetermined degree of vacuum, plasma is generated between each electrode to form a film on the substrate. It is something. The only thing that is directly required in this process is the thin film generation process, and the shorter the time for other temperature stabilization and the time for the temperature to drop to room temperature after the formation is completed, the better.
This time was a major obstacle to improving productivity.
本発明はこのような問題点を解決するためにな
されたもので、生産性を大幅に向上出来る外熱型
プラズマ化学気相成長装置および外熱型減圧化学
気相成長装置を提供するものである。以下図面に
よりプラズマ使用の場合について詳細に説明す
る。プラズマを使用しない場合は高周波電力関係
がないだけで、他は同様であるので、説明は省略
する。 The present invention was made to solve these problems, and provides an externally heated plasma chemical vapor deposition apparatus and an externally heated reduced pressure chemical vapor deposition apparatus that can significantly improve productivity. . The case of using plasma will be explained in detail below with reference to the drawings. If plasma is not used, there is no relationship with high frequency power, and the other things are the same, so the explanation will be omitted.
第2図は本発明の化学気相成長装置の反応管部
分の縦断面図である。図において15は外部反応
管、12は外部反応管の内容物出入口に設けた蓋
で、この蓋の内側には前記外部反応管の管軸と実
質的に一致する管軸を持つた内部反応管16が固
設されており、またこの蓋の内部反応管の内側部
分に相当する位置には反応ガス導入口12−1お
よび不活性ガス導入口12−2が前記蓋の内側か
ら外側もしくは周辺部へ貫通していると共に、高
周波電力用の端子14が2個蓋の両面に貫通して
設けられている。さらに前記内部反応管にはその
管軸方向のほぼ中央にまたがつて管壁の下側の面
に石英などの耐熱絶縁物製のボート16−1が固
設されており、このボートには前記管軸に垂直な
面を有する基板保持電極4が実質的に等間隔に設
けられている。また基板保持電極の上側の内部反
応管壁は大きく開口しており、天蓋18で基板1
1を出入れする時以外は閉鎖してある。さらに内
部反応管で蓋12と反対側の端部は直径をしぼつ
た細い排気孔16−2となつて外部反応管内に開
口している。内部反応管の外周下側には外部反応
管に内接して保持出来る脚16−3が設けられて
いる。この脚は固定脚ではなく、ローラー等の車
でも良い。17は不活性ガス加熱用ヒータで、こ
のヒータの不活性ガスの出口17−1と前記不活
性ガス導入口12−2との間はバルブを有する連
結管19で連結されてある。前記反応ガス導入口
12−1の外側はバルブを有する連結管20で反
応ガス供給源に接続されている。なお、外部反応
管の内容物出入口と反対の端部には排気ポンプ7
が接続されている。 FIG. 2 is a longitudinal sectional view of the reaction tube portion of the chemical vapor deposition apparatus of the present invention. In the figure, 15 is an external reaction tube, 12 is a lid provided at the entrance and exit for the contents of the external reaction tube, and inside this lid is an internal reaction tube with a tube axis that substantially matches the tube axis of the external reaction tube. A reaction gas inlet 12-1 and an inert gas inlet 12-2 are connected from the inside of the lid to the outside or the periphery at a position corresponding to the inner part of the internal reaction tube of the lid. In addition, two terminals 14 for high frequency power are provided to penetrate through both sides of the lid. Furthermore, a boat 16-1 made of a heat-resistant insulating material such as quartz is fixed to the lower surface of the tube wall so as to straddle approximately the center in the axial direction of the internal reaction tube. Substrate holding electrodes 4 having surfaces perpendicular to the tube axis are provided at substantially equal intervals. In addition, the internal reaction tube wall above the substrate holding electrode has a large opening, and a canopy 18 is used to hold the substrate.
It is closed except when entering and leaving 1. Further, the end of the inner reaction tube opposite to the lid 12 is formed into a narrow exhaust hole 16-2 with a reduced diameter and opens into the outer reaction tube. Legs 16-3 are provided on the lower side of the outer periphery of the inner reaction tube and can be held in contact with the outer reaction tube. These legs are not fixed legs, and may be rollers or other vehicles. Reference numeral 17 denotes a heater for heating an inert gas, and the inert gas outlet 17-1 of this heater and the inert gas inlet 12-2 are connected by a connecting pipe 19 having a valve. The outside of the reaction gas inlet 12-1 is connected to a reaction gas supply source through a connecting pipe 20 having a valve. In addition, an exhaust pump 7 is installed at the end of the external reaction tube opposite to the content inlet/outlet.
is connected.
次に本発明の装置の操作について説明する。 Next, the operation of the apparatus of the present invention will be explained.
まず、基板の装填作業の前にヒータ1に通電し
て外部反応管を所定の反応温度にまで上昇させて
おく。次に外部反応管から引出した内部反応管に
加熱してない不活性ガス(一般には窒素ガス)を
不活性ガス導入口から吹込み、内部の空気と置換
しておく。その後に天蓋18を取はずし、基板1
1を基板保持電極に装填し、天蓋で開口部を閉鎖
してから内部反応管をすでに加熱されている外部
反応管に挿入し蓋12を外部反応管に固定すると
ともに、不活性ガス加熱ヒータ17にも通電して
吹込み中の不活性ガスも高温状態とする。 First, before loading the substrates, the heater 1 is energized to raise the external reaction tube to a predetermined reaction temperature. Next, unheated inert gas (generally nitrogen gas) is blown into the internal reaction tube pulled out from the external reaction tube through the inert gas inlet to replace the air inside. After that, remove the canopy 18 and
1 is loaded onto the substrate holding electrode, the opening is closed with a canopy, the inner reaction tube is inserted into the already heated outer reaction tube, the lid 12 is fixed to the outer reaction tube, and the inert gas heating heater 17 The inert gas being blown is also heated to a high temperature by energizing it.
この状態で基板が所定の反応温度に到達したら
不活性ガスの吹込みを止め、排気ポンプ7を運転
しながら反応ガス導入口12−1から反応ガスを
導入する。このときに排気ポンプの排気量と反応
ガスの導入量を調節することにより、内部反応管
内(外部反応管内も同じ)の気圧を所定の圧力に
維持させておく。この状態に到達したら端子14
から高周波電力を基板保持電極に印加してプラズ
マ発生させ、薄膜成長を行わせる。 When the substrate reaches a predetermined reaction temperature in this state, the blowing of the inert gas is stopped, and the reaction gas is introduced from the reaction gas inlet 12-1 while the exhaust pump 7 is operated. At this time, the atmospheric pressure inside the internal reaction tube (same as inside the external reaction tube) is maintained at a predetermined pressure by adjusting the displacement amount of the exhaust pump and the amount of introduced reaction gas. When this state is reached, terminal 14
High frequency power is applied to the substrate holding electrode to generate plasma and grow a thin film.
所定の薄膜成長が終了したら高周波電力の印加
と反応ガスの導入を止め、加熱していない不活性
ガスを不活性ガス導入口より吹込み反応ガスと置
換した後に排気ポンプを止め、内部反応管を外部
反応管より引出して室温まで冷却させる。その後
に天蓋を取り去つて基板を取出せば良い。 When the specified thin film growth is completed, the application of high-frequency power and the introduction of the reaction gas are stopped, and after replacing the reaction gas with unheated inert gas blown into the inert gas inlet, the exhaust pump is stopped, and the internal reaction tube is closed. It is pulled out from the external reaction tube and allowed to cool to room temperature. After that, just remove the canopy and take out the board.
以上の操作で基板が高温になる前に空気を不活
性ガスと置換させ、また膜成長直後の高温状態の
ままで空気にさらさないので、基板ならびに成長
完了後の薄膜が酸化されることがない。 The above procedure replaces the air with inert gas before the substrate reaches a high temperature, and since it is not exposed to air in the high temperature state immediately after film growth, the substrate and the thin film after growth are not oxidized. .
また基板装填後外部反応炉に挿入後は高温の不
活性ガスを吹込んでいるために、この不活性ガス
の熱量と環状ヒータからの輻射熱と不活性ガスの
対流により環状ヒータからの伝熱も加わるので、
前記基板は急速に所定温度まで上昇する。 In addition, since high-temperature inert gas is blown into the external reactor after loading the substrate, heat transfer from the annular heater is also added due to the heat of this inert gas, radiant heat from the annular heater, and convection of the inert gas. So,
The substrate rapidly rises to a predetermined temperature.
実施例によれば従来方式の外熱型では基板挿入
後直ちに排気してしまうので、反応温度に安定す
るまでに40分ないし60分を必要としていた。本発
明の装置ではこの時間が5分で十分であつた。 According to the example, in the conventional external heating type, the exhaust air is exhausted immediately after inserting the substrate, so it takes 40 to 60 minutes to stabilize at the reaction temperature. In the apparatus of the present invention, this time of 5 minutes was sufficient.
さらに、反応ガスの種類によつてはリード線に
モリブデン線などの化学的に安定な材料を使用す
ることが好ましい場合がある。しかしモリブデン
などは酸化し易いために従来方式の装置では使用
が困難であつたが、本発明の装置では高温になる
時にはすでに空気が無い状態であるので、使用し
ても問題はない。 Furthermore, depending on the type of reaction gas, it may be preferable to use a chemically stable material such as a molybdenum wire for the lead wire. However, molybdenum and the like are easily oxidized, making it difficult to use them in conventional devices, but in the device of the present invention, there is no air present when the temperature reaches high temperatures, so there is no problem in using them.
以上のように本発明の装置によれば、薄膜成長
の前後の準備作業および後処理作業の時間が大幅
な短縮されるので、全体としての工程時間の短縮
に大きく寄与することが出来、実用効果が極めて
大きい。 As described above, according to the apparatus of the present invention, the time required for preparatory work and post-processing work before and after thin film growth can be significantly shortened, making it possible to greatly contribute to shortening the overall process time, resulting in practical effects. is extremely large.
第1図は従来のプラズマ化学気相成長装置の構
成図である。第2図は本発明のプラズマ化学気相
成長装置の反応管部分の縦断面図である。
図において1は環状ヒータ、2は反応管、4は
基板保持電極、5は蓋、15は外部反応管、12
は外部反応管の蓋、16は内部反応管、17は不
活性ガスヒータ、18は内部反応管の天蓋であ
る。
FIG. 1 is a block diagram of a conventional plasma chemical vapor deposition apparatus. FIG. 2 is a longitudinal sectional view of the reaction tube portion of the plasma chemical vapor deposition apparatus of the present invention. In the figure, 1 is an annular heater, 2 is a reaction tube, 4 is a substrate holding electrode, 5 is a lid, 15 is an external reaction tube, 12
16 is an inner reaction tube, 17 is an inert gas heater, and 18 is a canopy of the inner reaction tube.
Claims (1)
る外熱型化学気相成長装置において、一端が内容
物出入口として開口し、他端が排気口として排気
ポンプに接続された外部反応管と、この外部反応
管の内容物出入口の蓋に固設され前記外部反応管
と実質的に同軸をなして外部反応管内に挿入され
た内部反応管とよりなり、該内部反応管には内部
底面に固設されたボートと、このボート上に実質
的に等間隔で垂直面を有する複数の基板保持板
と、この複数の基板保持板の上方に穿設された蓋
付き開口部とが設けられ、前記外部反応管の内容
物出入口の蓋に内部反応管の内部に貫通するよう
に設けられた不活性ガス導入口および反応ガス導
入口を設け、この不活性ガス導入口の外側には不
活性ガス加熱ヒータを設け、この不活性ガス導入
口と不活性ガス加熱ヒータ間を接続する不活性ガ
ス導入管とよりなることを特徴とする外熱型化学
気相成長装置の反応管。 2 半導体基板の表面に半導体化合物を生成させ
る外熱型化学気相成長装置において、一端が内容
物出入口として開口し、他端が排気口として排気
ポンプに接続された外部反応管と、この外部反応
管の内容物出入口の蓋に固設され前記外部反応管
と実質的に同軸をなして外部反応管内に挿入され
た内部反応管とよりなり、該内部反応管には内部
底面に固設されたボートと、このボート上に実質
的に等間隔で垂直面を有し、前記蓋を貫通して設
けられた2個の端子からリード線によつて1枚お
きに別々に電気的に接続されて2組の群を構成さ
れた複数の基板保持電極とこの複数の基板保持電
極の上方に穿設された蓋付き開口部とを設け、前
記外部反応管の内容物出入口の蓋に内部反応管の
内部に貫通するように設けられた不活性ガス導入
口および反応ガス導入口とを設け、この不活性ガ
ス導入口の外側には不活性ガス加熱ヒータを設
け、この不活性ガス導入口と不活性ガス加熱ヒー
タ間を接続する不活性ガス導入管とよりなること
を特徴とする外熱型化学気相成長装置の反応管。[Claims] 1. In an externally heated chemical vapor deposition apparatus for producing a semiconductor compound on the surface of a semiconductor substrate, one end is opened as an inlet/outlet for contents, and the other end is connected to an exhaust pump as an exhaust port. and an inner reaction tube that is fixed to the lid of the content inlet/outlet of the outer reaction tube and inserted into the outer reaction tube substantially coaxially with the outer reaction tube, and the inner reaction tube has an inner tube. A boat is provided fixedly attached to the bottom surface, a plurality of substrate holding plates having vertical surfaces substantially equally spaced on the boat, and a covered opening bored above the plurality of substrate holding plates. An inert gas inlet and a reaction gas inlet are provided in the lid of the content inlet and outlet of the outer reaction tube so as to penetrate into the inner reaction tube, and an inert gas inlet is provided outside the inert gas inlet. 1. A reaction tube for an externally heated chemical vapor deposition apparatus, comprising an active gas heater and an inert gas inlet pipe connecting the inert gas inlet and the inert gas heater. 2. In an externally heated chemical vapor deposition apparatus that generates a semiconductor compound on the surface of a semiconductor substrate, an external reaction tube has one end opened as an inlet and an inlet for contents, and the other end is connected to an exhaust pump as an exhaust port, and this external reaction tube. an inner reaction tube fixed to the lid of the content inlet/outlet of the tube and inserted into the outer reaction tube substantially coaxially with the outer reaction tube; a boat, and two terminals having vertical surfaces substantially equally spaced on the boat and provided through the lid, each of which is electrically connected to every other terminal separately by a lead wire. A plurality of substrate holding electrodes configured into two groups and an opening with a lid formed above the plurality of substrate holding electrodes are provided, and the lid of the contents entrance and exit of the external reaction tube is provided with a lid of the inner reaction tube. An inert gas inlet and a reactive gas inlet are provided so as to penetrate inside the inert gas inlet, and an inert gas heater is provided outside the inert gas inlet, and an inert gas inlet and an inert gas inlet are provided outside the inert gas inlet. A reaction tube for an externally heated chemical vapor deposition apparatus, characterized by comprising an inert gas introduction tube connecting between gas heating heaters.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5801382A JPS58177134A (en) | 1982-04-09 | 1982-04-09 | Reaction tube of external thermal chemical vapor deposition equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5801382A JPS58177134A (en) | 1982-04-09 | 1982-04-09 | Reaction tube of external thermal chemical vapor deposition equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58177134A JPS58177134A (en) | 1983-10-17 |
| JPS6148583B2 true JPS6148583B2 (en) | 1986-10-24 |
Family
ID=13072079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5801382A Granted JPS58177134A (en) | 1982-04-09 | 1982-04-09 | Reaction tube of external thermal chemical vapor deposition equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58177134A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI395254B (en) * | 2006-01-25 | 2013-05-01 | Air Water Inc | Film forming device |
-
1982
- 1982-04-09 JP JP5801382A patent/JPS58177134A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58177134A (en) | 1983-10-17 |
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