JPS6154112B2 - - Google Patents
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- Publication number
- JPS6154112B2 JPS6154112B2 JP57053396A JP5339682A JPS6154112B2 JP S6154112 B2 JPS6154112 B2 JP S6154112B2 JP 57053396 A JP57053396 A JP 57053396A JP 5339682 A JP5339682 A JP 5339682A JP S6154112 B2 JPS6154112 B2 JP S6154112B2
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- magnetic field
- electric field
- target
- control device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、基板に薄膜を付着させるマグネトロ
ンスパツタ装置を用いた、基板表面への二種若し
くはそれ以上の物質を層状に形成させたり、二種
以上の物質を任意の組成からなる合金として付着
させる方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to forming a layer of two or more substances on the surface of a substrate using a magnetron sputtering device for depositing a thin film onto a substrate. The present invention relates to a method of depositing the above substances as an alloy having an arbitrary composition.
従来技術
従来のマグネトロンスパツタ装置としては、第
1図に示されるように1対の陽極1及び陰極2と
陰極2の下方に配置され、電界に対してほぼ垂直
に磁界を発生させる磁石3とを基本構成要件とし
て、陽極1に基板4を設置し、陰極2にスパツタ
する物質5を配置して磁界の作用によつて放出さ
れる高速二次電子を閉じ込めるようにした装置が
知られている。そして、該装置を用いて基板に物
質を層として付着する方法がとられている。Prior Art As shown in FIG. 1, a conventional magnetron sputter device includes a pair of anodes 1 and 2, and a magnet 3 that is placed below the cathode 2 and generates a magnetic field approximately perpendicular to the electric field. There is a known device in which a substrate 4 is installed on the anode 1 and a sputtering substance 5 is placed on the cathode 2 to confine high-speed secondary electrons emitted by the action of a magnetic field. . A method has been adopted in which a substance is deposited as a layer on a substrate using this apparatus.
発明が解決しようとする問題点
しかしながら、かかる従来のスパツタリング方
法では、スパツタにより付着した膜が均一で、基
板の温度が上がらず、成膜速度が速いといつた
数々の長所を有しているが、基板に複数の物質の
膜を層状に付着させたり、二種以上の物質を合金
として、任意の組成比で付着させるには不適当で
あつた。Problems to be Solved by the Invention However, such conventional sputtering methods have a number of advantages, such as a uniform film deposited by sputtering, no rise in temperature of the substrate, and a fast film formation rate. However, it is not suitable for depositing layers of a plurality of substances on a substrate, or for depositing two or more substances as an alloy in an arbitrary composition ratio.
またマグネトロンスパツタ装置において陰極状
に特定のリング状の浸蝕領域が形成されるが、そ
れが如何なる要因によりなるのか、必ずしも正確
に把握されていなつかた為に、異なる二種以上の
物質を同時にスパツタすることはあまり行なわれ
ていなかつた。 In addition, in magnetron sputtering equipment, a specific ring-shaped eroded area is formed on the cathode, but the cause of this is not necessarily understood accurately, so it is difficult to sputter two or more different materials at the same time. There wasn't much to do.
そこで、本発明者達は、まず浸蝕領域の形状の
要因を知るために下記のような実験を行なつた。
従来のマグネトロンスパツタ装置に銅の円板を陰
極としてアルゴン90%、酸素10%の混合ガス中に
おいて浸蝕領域の形状を定める要因と思われる放
電電力、ガス圧力及び磁界分布を様々に変化させ
てスパツタさせた。すると浸蝕領域は光沢をもつ
た銅色を呈し、浸蝕領域外は黒化し明瞭なるコン
トラストをもつて肉眼により容易に識別できるよ
うになる。これは、スパツタされた物質がガス状
分子との衝突により後方散乱され、陰極上に酸化
銅(CuO)を堆積させ黒化するのであるが、浸
蝕領域においてはその堆積速度よりも浸蝕速度の
方がはるかに早いため銅色のままで残るためであ
る。この実験の結果浸蝕領域の形状を定める因子
は、放電電力、ガス圧力及び磁界分布によること
が判明した。さらに磁界に関して磁界強度の絶対
値、電界に平行な成分及び垂直な成分について検
討したところ電界に平行な磁界成分Hhが浸蝕領
域に大きな影響を与えていることが判明した。 Therefore, the present inventors first conducted the following experiment in order to find out the factors that affect the shape of the eroded area.
A conventional magnetron sputtering device was used with a copper disc as the cathode in a mixed gas of 90% argon and 10% oxygen, and the discharge power, gas pressure, and magnetic field distribution, which are considered to be the factors that determine the shape of the eroded area, were varied. I sputtered. As a result, the eroded area takes on a shiny copper color, and the area outside the eroded area turns black with clear contrast and can be easily identified with the naked eye. This is because the spattered material is backscattered by collision with gaseous molecules, depositing copper oxide (CuO) on the cathode and blackening it, but in the eroded area, the erosion rate is faster than the deposition rate. This is because it remains copper-colored because it is much faster. As a result of this experiment, it was found that the factors that determine the shape of the eroded area are discharge power, gas pressure, and magnetic field distribution. Furthermore, regarding the magnetic field, we investigated the absolute value of the magnetic field strength, the components parallel to the electric field, and the components perpendicular to the electric field, and it was found that the magnetic field component Hh parallel to the electric field has a large influence on the eroded area.
例えば放電電力を50[W]、ガス圧力を1.0×
10-2[Torr]に設定したとき浸蝕領域は電界に
平行な磁界成分Hhが40[G]以下の領域に対応
していることが認められた。従つて放電電力及び
ガス圧力が一定の場合には電界に平行な磁界成分
Hhを変化させれば浸蝕領域を自由に変化させる
ことができることを確認した。 For example, discharge power is 50 [W], gas pressure is 1.0×
When set to 10 -2 [Torr], it was observed that the eroded region corresponds to the region where the magnetic field component Hh parallel to the electric field is 40 [G] or less. Therefore, when the discharge power and gas pressure are constant, the magnetic field component parallel to the electric field
It was confirmed that the eroded area can be changed freely by changing Hh.
そこで、本発明者達は上記新知見に基づき基板
上に複数の膜を層上に付着させたり、二種以上の
物質を合金として任意の組成比で付着するスパツ
タリング方法を発明したものである。 Based on the above-mentioned new knowledge, the present inventors have invented a sputtering method in which a plurality of films are deposited in layers on a substrate, or two or more materials are deposited as an alloy in an arbitrary composition ratio.
問題を解決するための手段
すなわち本発明は、一対の陽極及び陰極と、こ
の間の電界とほぼ直交する磁界を発生させる磁石
とを基本構成とし、前記陰極近傍に制御装置によ
つて電界と略平行な成分の磁界を変化させて浸蝕
領域を陰極上で内側と外側とに移動させるマグネ
トロンスパツタリング装置において、陰極のター
ゲツトに異なる複数の物質を内側及び外側に同心
形状に配置する工程と、ターゲツトを配置した後
に、制御装置を介して電界と平行な成分の磁界を
変化させ浸蝕領域を前記複数の物質上に移動させ
る工程とからなるスパツタリング方法により複数
の物質を多層上に形成させる。Means for Solving the Problem That is, the present invention has a basic configuration of a pair of anode and cathode, and a magnet that generates a magnetic field that is approximately perpendicular to the electric field between the anode and cathode, and that is placed near the cathode by a control device to generate a magnetic field that is approximately parallel to the electric field. In a magnetron sputtering device in which the eroded region is moved inward and outward on the cathode by changing the magnetic field of different components, there is a process of arranging a plurality of different materials concentrically inside and outside the target of the cathode, and After arranging the plurality of materials, a plurality of materials are formed on the multilayer by a sputtering method comprising a step of changing a magnetic field having a component parallel to the electric field via a control device to move an eroded region onto the plurality of materials.
さらに一対の陽極及び陰極と、この間の電界と
ほぼ直交する磁界を発生させる磁石とを基本構成
とし、前記陰極近傍に制御装置によつて電界と略
平行な成分の磁界を変化させて浸蝕領域を陰極上
で内側と外側とに移動させるマグネトロンスパツ
タリング装置において、陰極のターゲツトに異な
る複数の物質を同心形状で、且つターゲツトの内
側及び/又は外側が放射線状となるように配置す
る工程と、ターゲツトを配置した後に、制御装置
を介して電界と平行な成分の磁界を変化させ浸蝕
領域を所定の時間間隔で内側と外側と交互に移動
させる工程とからなるスパツタリング方法により
二種以上の物質を合金として任意の組成比で付着
する。 Furthermore, the basic configuration includes a pair of anode and cathode, and a magnet that generates a magnetic field that is substantially orthogonal to the electric field between the anode and cathode, and a control device changes the magnetic field with a component that is substantially parallel to the electric field near the cathode to form an eroded area. In a magnetron sputtering device that moves inward and outward on a cathode, a step of arranging a plurality of different substances on the target of the cathode in a concentric shape and such that the inside and/or outside of the target is radial; After arranging the target, two or more substances are sputtered using a sputtering method, which consists of the step of changing the magnetic field with a component parallel to the electric field via a control device and moving the eroded area alternately inside and outside at predetermined time intervals. It is deposited as an alloy in any composition ratio.
作 用
本発明にかかる方法では、陰極のターゲツトが
複数の異なる物質を内側と外側に同心形状に配置
されているので、制御装置を介して電界に平行成
分の磁界を変化させると例えば内側の中心にある
物質がまずスパツタされて基板にその物質が付着
する。その際外側周囲の物質は制御装置により浸
蝕領域が制御されているので、スパツタされな
い。中心部の物質のスパツタが終了すると制御装
置が作動し電界に平行な成分の磁界を変化させ、
浸蝕領域を外側の物質側に移動させる。すると外
側にある物質がスパツタされて基板にその物質が
付着する。したがつて基板上には、相異なる物質
が層状に薄膜を形成することができる。Effect In the method according to the present invention, since the cathode target has a plurality of different materials arranged concentrically on the inside and outside, when the magnetic field of the parallel component to the electric field is changed via the control device, for example, the inside center The material on the substrate is first sputtered to deposit the material on the substrate. In this case, the material on the outside is not spattered, since the erosion area is controlled by the control device. When the material in the center finishes sputtering, the control device operates and changes the magnetic field with a component parallel to the electric field.
Move the eroded area to the outer material side. The material on the outside is then sputtered and adheres to the substrate. Therefore, a thin layer of different materials can be formed on the substrate.
尚、制御装置の磁界の変化させ方を外側から内
側にかえる場合も前述と同じである。 Note that the case where the way the magnetic field of the control device is changed from outside to inside is also the same as described above.
次に、陰極のターゲツトを複数の物質で同心形
状に配置し、さらに内側を放射線状に特定の比率
で配置し、制御装置を介して電界と平行な成分の
磁界を変化させ浸蝕領域を所定の時間間隔で内側
と外側と交互に移動させる場合には、内側では2
種以上の物質が同時にスパツタされ、外側では物
質がスパツタされる。そしてこの内・外を交互に
スパツタさせるので、基板上には特定の比率から
なる合金が少しづつ堆積してゆく。 Next, the target of the cathode is arranged concentrically with multiple materials, and the inner part is arranged radially at a specific ratio, and the magnetic field whose component is parallel to the electric field is changed via the control device to control the eroded area to a predetermined area. When moving inside and outside alternately at time intervals, 2 on the inside
More than one species is sputtered at the same time, and the material is sputtered on the outside. Since this sputtering is performed alternately on the inside and outside, the alloy consisting of a specific ratio is gradually deposited on the substrate.
実施例
以下に本発明を図面に示された実施例に従つて
詳細に説明する。Embodiments The present invention will be described in detail below with reference to embodiments shown in the drawings.
第2図は本発明の実施に使用するマグネトロン
スパツタ装置である。図において11及び12は
円形状のベースプレートあり、該プレート11及
び12によりガラス製の円筒13を密封すること
によりスパツタ室14を形成している。このスパ
ツタ室14の上板であるベースプレート11に
は、図示しない電源に接続された陽極15が絶縁
体16を介して固着されている。このベースプレ
ート11、絶縁体16及び陽極15の中心部は、
穴がくりぬかれており、その穴に元素成分又は組
成比を分析する監視装置17がはめこまれてい
る。監視装置としては、四重極質量分析器、イオ
ンゲージ又は原子吸光分光を用いて検出する装置
等がある。また底板であるベースプレート12の
周辺部は、排気孔19及びガス導入孔20が穿孔
され、それぞれ排気パイプ21及びガス導入パイ
プ22が接続されている。また中心部は穴が嵌り
抜かれ、その穴に断面T字状で図示しない電源に
接続された陰極23が絶縁体24を介して固着さ
れ、該陰極23の下方には電界と直交する磁界が
発生するように永久磁石25が配置されている。
ガラス円筒13の周辺には、陰極23付近に電界
と平行に磁界が発生するように制御装置18から
電流の供給を受ける円形コイル26が配置されて
いる。尚27は、膜を付着させようとする基板、
28は膜の材料となるターゲツト、29はシール
ドプレートであり、Eは電界、Hvは永久磁石の
磁力線、Hhはコイル26の磁力線である。尚本
実施例に用いるマグネトロンスパツタ装置とし
て、平板型のものを採用したが、第4図に示すよ
うに同軸状に配置した円筒型であつて異種の複数
の物質を永久磁石のN極又はS極を中心に上下方
向に同心形状に配置してターゲツトを形成した場
合や、更に永久磁石の周囲を円形コイルで四角く
囲つたものに対しても当然に適用される。 FIG. 2 shows a magnetron sputtering device used in the practice of the present invention. In the figure, reference numerals 11 and 12 denote circular base plates, and a sputtering chamber 14 is formed by sealing a glass cylinder 13 with the plates 11 and 12. An anode 15 connected to a power source (not shown) is fixed to a base plate 11, which is the upper plate of the sputtering chamber 14, via an insulator 16. The center of the base plate 11, insulator 16 and anode 15 is
A hole is hollowed out, and a monitoring device 17 for analyzing elemental components or composition ratios is fitted into the hole. Examples of the monitoring device include a quadrupole mass spectrometer, an ion gauge, or a detection device using atomic absorption spectroscopy. Further, an exhaust hole 19 and a gas introduction hole 20 are perforated in the peripheral portion of the base plate 12, which is a bottom plate, and an exhaust pipe 21 and a gas introduction pipe 22 are connected thereto, respectively. A hole is inserted in the center, and a cathode 23 having a T-shaped cross section and connected to a power supply (not shown) is fixed to the hole through an insulator 24, and a magnetic field orthogonal to the electric field is generated below the cathode 23. The permanent magnets 25 are arranged so as to.
A circular coil 26 is arranged around the glass cylinder 13 and receives current from the control device 18 so that a magnetic field is generated near the cathode 23 in parallel to the electric field. 27 is a substrate to which a film is to be attached;
Reference numeral 28 indicates a target which is the material of the film, 29 indicates a shield plate, E indicates an electric field, Hv indicates lines of magnetic force of the permanent magnet, and Hh indicates lines of magnetic force of the coil 26. Although a flat plate type magnetron sputtering device was adopted as the magnetron sputtering device used in this example, it is a cylindrical type coaxially arranged as shown in Fig. 4, and a plurality of different materials are connected to the N pole of a permanent magnet or Naturally, this method can also be applied to cases in which targets are arranged concentrically in the vertical direction with the S pole as the center, and also to cases in which a permanent magnet is surrounded by circular coils in a square manner.
上記の構成にかかる装置の作動について説明す
ると、陽極15の面上に基板27を置き、陰極2
3の面上にターゲツト28を載置した後に排気
し、スパツタ室14内が所定のガス圧となるよう
にガスを導入する。しかる後電極15,23間に
所定の電力を投入すると永久磁石25及びコイル
26が作る合成磁界の電子に対する作用により電
子は陰極23の中心から所定の距離を隔ててサイ
クロイド運動を行なう。この電子の運動がターゲ
ツト28のイオン化を促進するのでスパツタされ
た物質が基板27に付着する。この場合スパツタ
される陰極23上のターゲツト28における浸蝕
領域は、電界と平行の磁界Hが、Hc≧H≧−Hc
となる範囲においてリング状に形成される。そし
て、スパツタしている状態及び制御装置18が作
動して浸蝕領域が移動した際のスパツタしている
状態は、制御装置18へ伝えられ、該制御御装置
18が電流量を調節するので、所定のスパツタす
ることができる。 To explain the operation of the device having the above configuration, the substrate 27 is placed on the surface of the anode 15, and the cathode 2 is placed on the surface of the anode 15.
After placing the target 28 on the surface of the sputtering chamber 14, the sputtering chamber 14 is evacuated and gas is introduced so that the inside of the sputtering chamber 14 reaches a predetermined gas pressure. Thereafter, when a predetermined electric power is applied between the electrodes 15 and 23, the combined magnetic field generated by the permanent magnet 25 and the coil 26 acts on the electrons, causing the electrons to move a predetermined distance from the center of the cathode 23 and perform cycloidal motion. This movement of electrons promotes ionization of the target 28, so that the sputtered material adheres to the substrate 27. In this case, the eroded area in the target 28 on the cathode 23 to be sputtered is such that the magnetic field H parallel to the electric field
It is formed into a ring shape in the range where . Then, the sputtering state and the sputtering state when the control device 18 is activated and the eroded area moves are transmitted to the control device 18, and the control device 18 adjusts the amount of current. It can be sputtering.
もしコイル26の磁界を当初H=0、次にH=
Hhとなるように変化させたときは、第5図にみ
られるように合成磁界はH1からH2と変化し、第
6図に見られるように、浸蝕領域がAからBに移
動した状態でスパツタを行なうようになる。 If the magnetic field of the coil 26 is initially H=0, then H=
When the magnetic field is changed to Hh, the resultant magnetic field changes from H 1 to H 2 as shown in Figure 5, and the eroded area moves from A to B as shown in Figure 6. I started doing spatuta.
そこで、第7図に示すように円板にA,Bの物
質を別々に同心円状に内側と外側とに配置したタ
ーゲツトを陰極に設置する。そして後にスパツタ
室14内の空気を排気し、所定のガス圧となるよ
うにガスを注入する。そして両電極間に所定の電
力をかけると共に、コイル電流を調節して最初に
物質B側に浸蝕領域がきて、次に物質A側に浸蝕
領域がくるようにした場合には、それぞれ別個に
スパツタされるために、基板27には物質B、物
質Aの二層よりなる薄膜が形成される。 Therefore, as shown in FIG. 7, a target in which substances A and B are arranged concentrically on the inner and outer sides of a disc is installed at the cathode. Afterwards, the air in the sputtering chamber 14 is exhausted, and gas is injected to a predetermined gas pressure. Then, if a predetermined power is applied between both electrodes and the coil current is adjusted so that the eroded area first comes to the material B side and then the eroded region comes to the material A side, the sputtering is performed separately for each electrode. Therefore, a thin film consisting of two layers of substance B and substance A is formed on the substrate 27.
さらにもうひとつの方法は、第8図に示すよう
に物質A同心円の外側に、物質B,Cを同心円の
内側に放射状というようにターゲツトを配置す
る。 Yet another method is to arrange targets radially outside the concentric circle of material A and radially inside the concentric circle with materials B and C, as shown in FIG.
具体的にAを鉛(Pb)、Bをジルコニウム
(Zr)、Cを(Ti)を選択する。 Specifically, lead (Pb) is selected for A, zirconium (Zr) for B, and (Ti) for C.
次にそれぞれの付着量を確かめるためにPb、
Zr、Tiをアルゴン(Ar)90%、酸素(O2)10%
の雰囲気中にそれぞれ同一条件のもとでスパツタ
した場合に基板に堆積する割合は、実験によると
15.4:1.28:1.0であつた。 Next, to check the amount of each attached, Pb,
Zr, Ti with argon (Ar) 90%, oxygen (O 2 ) 10%
According to experiments, the rate of deposition on the substrate when sputtering is performed under the same conditions in an atmosphere of
It was 15.4:1.28:1.0.
そこでZrとTiの面積比を47.3:52.7に設定する
と共にPb側とZr、Ti側でスパツタする時間を
1:13.6に設定し第9図に示すような波形電流を
流し、浸蝕領域を移動させる。すると基板の表面
には、PbO−(Zr0.54・Ti0.46)O2を単位とする層
の重なりができる。 Therefore, we set the area ratio of Zr and Ti to 47.3:52.7, set the sputtering time on the Pb side, Zr, and Ti side to 1:13.6, and applied a waveform current as shown in Figure 9 to move the eroded area. . Then, layers of PbO-(Zr 0.54 · Ti 0.46 )O 2 are formed on the surface of the substrate.
この場合にそれぞれの層が単原子層となるよう
にスパツタを繰り返せば、Pb(Zr0.54・Ti0.46)
O3よりなるジルコン酸・チタン酸鉛(Lead
zirconate titanate)の結晶を(001)方向に成長
させることができる。 In this case, if sputtering is repeated so that each layer becomes a monoatomic layer, Pb(Zr 0.54・Ti 0.46 )
Zirconate /lead titanate (Lead
zirconate titanate) can be grown in the (001) direction.
尚本発明にかかるスパツタリング方法では、予
めマグネトロンスパツタ装置の浸蝕領域に関する
特性を把握し、コイル電流を流したとき、流さな
いときの浸蝕領域(陰極の内側及び外側)の境界
線を境にして同心形状に物質を配置することが好
ましい。 In addition, in the sputtering method according to the present invention, the characteristics of the eroded area of the magnetron sputtering device are grasped in advance, and the characteristics of the eroded area (inside and outside of the cathode) when the coil current is applied and when it is not applied are determined in advance. Preferably, the materials are arranged in a concentric configuration.
効 果
以上説明したように本発明にかかるスパツタ方
法は、従来のものに比較して浸蝕領域を制御装置
を介して移動させることができるので、基板に対
して複数の物質からなる層を付着することができ
る。Effects As explained above, the sputtering method according to the present invention allows the eroded area to be moved via the control device compared to the conventional method, so that it is possible to deposit layers of multiple substances on the substrate. be able to.
さらにターゲツトの物質の配置の仕方で、任意
の組成からなる合金の膜を付着させることができ
るので、従来の方法に比較してその利用価値は極
めて高い。 Furthermore, it is possible to deposit an alloy film of any composition depending on the arrangement of the target substance, so its utility value is extremely high compared to conventional methods.
第1図は、従来のマグネトロンスパツタ装置を
表わす概略図、第2図は本発明の実施に用いるマ
グネトロンスパツタ装置を表わす端面図、第3図
はマグネトロンスパツタ装置の陰極部の磁界の状
態を表わす状態図、第4図は本発明の実施に用い
る他のマグネトロンスパツタ装置の一部断面図、
第5図は磁界の変化と浸蝕領域との関係を示すグ
ラフ、第6図はターゲツトの浸蝕領域の状態を示
す一部平面図、第7図及び第8図はターゲツトの
実施例を示す平面図、第9図はコイルに流す波形
電流の一態様を示す波形図である。
1……陽極、2……陰極、3……磁石、4……
基板、11,12……ベースプレート、13……
円筒、14……スパツタ室、15……陽極、16
……絶縁体、17……監視装置、18……制御装
置、19……排気孔、20……ガス導入孔、21
……排気パイプ、22……ガス導入パイプ、23
……陰極、24……絶縁体、25……永久磁石、
26……円形コイル、27……基板。
Fig. 1 is a schematic diagram showing a conventional magnetron sputtering device, Fig. 2 is an end view showing a magnetron sputtering device used for carrying out the present invention, and Fig. 3 is a state of the magnetic field of the cathode part of the magnetron sputtering device. FIG. 4 is a partial cross-sectional view of another magnetron sputtering device used for carrying out the present invention.
Fig. 5 is a graph showing the relationship between changes in magnetic field and the eroded area, Fig. 6 is a partial plan view showing the state of the eroded area of the target, and Figs. 7 and 8 are plan views showing examples of the target. , FIG. 9 is a waveform diagram showing one aspect of the waveform current flowing through the coil. 1... Anode, 2... Cathode, 3... Magnet, 4...
Substrate, 11, 12... Base plate, 13...
Cylinder, 14... Spatuta chamber, 15... Anode, 16
... Insulator, 17 ... Monitoring device, 18 ... Control device, 19 ... Exhaust hole, 20 ... Gas introduction hole, 21
...Exhaust pipe, 22...Gas introduction pipe, 23
... cathode, 24 ... insulator, 25 ... permanent magnet,
26...Circular coil, 27...Substrate.
Claims (1)
直交する磁界を発生させる磁石とを基本構成と
し、前記陰極近傍に制御装置によつて電界と略平
行な成分の磁界を変化させて浸蝕領域を陰極上で
内側と外側とに移動させるマグネトロンスパツタ
リング装置において、陰極のターゲツトに異なる
複数の物質を内側及び外側に同心形状に配置する
工程と、ターゲツトを配置した後に、制御装置を
介して電界と平行な成分の磁界を変化させ侵蝕領
域を前記複数の物質上に移動させる工程とからな
るスパツタリング方法。 2 一対の陽極及び陰極と、この間の電界とほぼ
直交する磁界を発生させる磁石とを基本構成と
し、前記陰極近傍に制御装置によつて電界と略平
行な成分の磁界を変化させて浸蝕領域を陰極上で
内側と外側とに移動させるマグネトロンスパツタ
リング装置スにおいて、陰極のターゲツトに異な
る複数の物質を同心形状で、且つターゲツトの内
側及び/又は外側が放射線状となるように配置す
る工程と、ターゲツトを配置した後に、制御装置
を介して電界と平行な成分の磁界を変化させ侵蝕
領域を所定の時間間隔で内側と外側と交互に移動
させる工程とからなるスパツタリング方法。[Scope of Claims] 1. The basic structure includes a pair of anode and cathode, and a magnet that generates a magnetic field substantially perpendicular to the electric field between the anode and cathode, and a magnetic field with a component substantially parallel to the electric field is generated near the cathode by a control device. In a magnetron sputtering device in which the eroded area is moved inward and outward on the cathode, the steps include arranging a plurality of different materials concentrically inside and outside the target of the cathode, and after arranging the target. A sputtering method comprising the step of moving an eroded region onto the plurality of substances by changing a magnetic field having a component parallel to the electric field via a control device. 2 The basic structure consists of a pair of anode and cathode, and a magnet that generates a magnetic field that is substantially perpendicular to the electric field between them, and a control device changes the magnetic field with a component that is substantially parallel to the electric field near the cathode to form an eroded area. In a magnetron sputtering device that moves inward and outward on a cathode, a step of arranging a plurality of different substances on the target of the cathode in a concentric shape and with the inside and/or outside of the target radial. A sputtering method comprising the steps of, after placing a target, changing a magnetic field with a component parallel to the electric field via a control device to move the eroded area alternately inward and outward at predetermined time intervals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5339682A JPS58171569A (en) | 1982-03-31 | 1982-03-31 | Magnetron sputtering device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5339682A JPS58171569A (en) | 1982-03-31 | 1982-03-31 | Magnetron sputtering device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58171569A JPS58171569A (en) | 1983-10-08 |
| JPS6154112B2 true JPS6154112B2 (en) | 1986-11-20 |
Family
ID=12941659
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5339682A Granted JPS58171569A (en) | 1982-03-31 | 1982-03-31 | Magnetron sputtering device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58171569A (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58199860A (en) * | 1982-05-17 | 1983-11-21 | Hitachi Ltd | Film forming method |
| US5744011A (en) * | 1993-03-18 | 1998-04-28 | Kabushiki Kaisha Toshiba | Sputtering apparatus and sputtering method |
| JP4537899B2 (en) * | 2005-07-05 | 2010-09-08 | 富士通セミコンダクター株式会社 | Film-forming method and semiconductor device manufacturing method |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU475272B2 (en) * | 1971-09-07 | 1976-08-19 | Felio Corporation | Glow discharge method and apparatus |
| JPS5432638A (en) * | 1977-08-17 | 1979-03-10 | Asahi Denka Kogyo Kk | Cosmetic base composition |
| FR2423065A1 (en) * | 1978-04-12 | 1979-11-09 | Battelle Memorial Institute | PROCESS FOR MANUFACTURING ELECTRODES FOR FUEL CELLS, DEVICE FOR IMPLEMENTING THE PROCESS AND ELECTRODES RESULTING FROM THIS PROCESS |
| JPS5816068A (en) * | 1981-07-22 | 1983-01-29 | Hitachi Ltd | Planar magnetron sputtering method |
-
1982
- 1982-03-31 JP JP5339682A patent/JPS58171569A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58171569A (en) | 1983-10-08 |
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