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JPS6213618B2 - - Google Patents
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JPS6213618B2 - - Google Patents

Info

Publication number
JPS6213618B2
JPS6213618B2 JP54126634A JP12663479A JPS6213618B2 JP S6213618 B2 JPS6213618 B2 JP S6213618B2 JP 54126634 A JP54126634 A JP 54126634A JP 12663479 A JP12663479 A JP 12663479A JP S6213618 B2 JPS6213618 B2 JP S6213618B2
Authority
JP
Japan
Prior art keywords
inspected
chipping
photoelectric conversion
conversion element
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54126634A
Other languages
Japanese (ja)
Other versions
JPS5648547A (en
Inventor
Yoshinobu Kashiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP12663479A priority Critical patent/JPS5648547A/en
Publication of JPS5648547A publication Critical patent/JPS5648547A/en
Publication of JPS6213618B2 publication Critical patent/JPS6213618B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Cutting Tools, Boring Holders, And Turrets (AREA)

Description

【発明の詳細な説明】 この発明は特にスローアウエチツプの欠け検出
装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention particularly relates to a chipping detection device for a throw-away chip.

スローアウエチツプの切刃に欠けがあることは
刃具として問題であり、欠けのある不良品の検出
は従来目視によつて行われていた。
Chips on the cutting edge of a throw-out tip are a problem as a cutting tool, and defective products with chips have conventionally been detected by visual inspection.

この目視による欠け検出に代わつて、自動的に
検出する技術が提供されているが、種々の形状を
有するスローアウエチツプに適用するには幾つか
の問題点がある。
As an alternative to this visual chipping detection, automatic detection techniques have been proposed, but there are several problems in applying them to throw-away chips having various shapes.

この発明の目的は極めて簡素な構成で、適確に
スローアウエチツプに限らずこの種の形状物端部
の欠けの有無を検出出来る装置を提供することに
ある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a device which has an extremely simple configuration and can accurately detect the presence or absence of chipping not only in throw-away chips but also in the ends of this type of shaped articles.

以下に、実施例を示した添付図面に基づいてこ
の発明を詳述する。
The present invention will be described in detail below based on the accompanying drawings showing examples.

1はスローアウエチツプで、その側面中央に水
平方向から光2が投射されている。3はレンズ系
で、投光された光2の反射光がスローアウエチツ
プ1の辺上部に設けた細幅短冊状の光電変換素子
4に結像されるよう配備されている。5は光電変
換素子4の出力の増幅回路である。
1 is a throw-away chip, and light 2 is projected from the horizontal direction onto the center of the side surface of the chip. Reference numeral 3 denotes a lens system, which is arranged so that the reflected light of the projected light 2 is imaged on a narrow rectangular photoelectric conversion element 4 provided on the upper side of the throw-away chip 1. 5 is an amplification circuit for the output of the photoelectric conversion element 4.

スローアウエチツプ1を、投光された光2とチ
ツプ辺との角度を保持しつつ、矢符A方向に移動
させることにより、スローアウエチツプ1の端部
の全てが光電変換素子4に結像されることにな
る。ここでもし、端部に欠けが生じると反射光は
乱反射を起こし、光電変換素子4の出力に変化が
生じる。このようにしてスローアウエチツプ1の
端部の欠けを検出することが出来る。
By moving the throw-away chip 1 in the direction of arrow A while maintaining the angle between the projected light 2 and the side of the chip, the entire end of the throw-away chip 1 forms an image on the photoelectric conversion element 4. will be done. Here, if a chip occurs at the end, the reflected light causes diffuse reflection, causing a change in the output of the photoelectric conversion element 4. In this way, chipping at the end of the throw-away chip 1 can be detected.

ところが、欠けがたまたまスローアウエチツプ
1のノーズR部1aにある場合(実質的にこのよ
うな場合は多い)、光電変換素子4の出力波形は
第3図に示される如くになる。ここでXはノーズ
R部1aにおける乱反射による出力信号で欠け信
号はSの如くあらわれる。従つて実質的に欠けを
検出することが不可能となる。
However, if the chip happens to be located at the nose R portion 1a of the throw-away chip 1 (which is often the case), the output waveform of the photoelectric conversion element 4 becomes as shown in FIG. Here, X is an output signal due to diffuse reflection at the nose R portion 1a, and a missing signal appears as S. Therefore, it becomes virtually impossible to detect a chip.

そこで、この出力信号と、この出力信号を所定
時間遅らせた信号Yを形成し、その遅延信号との
差をとり、その差出力が予め設定したレベルより
も大きくなつたときの回数を計数し、即ち、ノー
ズR部の数以上に回数があらわれれば、あきらか
に欠けがあることが判別出来る。
Therefore, a signal Y is formed by delaying this output signal by a predetermined period of time, the difference between this output signal and the delayed signal is calculated, and the number of times the difference output becomes larger than a preset level is counted. That is, if the number of occurrences is greater than the number of nose R parts, it can be clearly determined that there is a chip.

即ち、第4図に示す如く、光電変換素子4の出
力を遅延回路6によつて遅らせ、前記出力と共に
コンパレータ7に入力して両者の差信号をとり出
す。この差信号が設定レベル発生回路8からのス
レツシユホールドレベルとコンパレータ9で比較
され、スレツシユホールドレベルを越えた回数を
カウンタ10で計数し且つ計数値が設定回数より
越えたときのみ、カウンタ10から欠け信号aを
出力するよう構成すればよい。当然カウンタ10
は欠け信号aの出力と同時にプリセツトされ、設
定回数設定器は可変式にすることが望まれる。
That is, as shown in FIG. 4, the output of the photoelectric conversion element 4 is delayed by a delay circuit 6, and is input together with the output to a comparator 7 to extract a difference signal between the two. This difference signal is compared with the threshold level from the set level generation circuit 8 by the comparator 9, and the number of times the threshold level is exceeded is counted by the counter 10, and only when the counted value exceeds the set number of times, the counter 10 What is necessary is just to configure it so that the missing signal a is outputted from. Of course counter 10
is preset at the same time as the output of the missing signal a, and it is desirable that the set number of times setter be of a variable type.

この発明は以上の如くであるから、スローアウ
エチツプのノーズR部による乱反射の信号と欠け
信号とを結果的に混同することなく区別して、欠
けの有無を適確に判別することが出来る。
Since the present invention is as described above, it is possible to distinguish the signal of diffuse reflection from the nose R portion of the throw-away chip from the chipping signal without confusing the result, and to accurately determine the presence or absence of chipping.

更に光電変換素子の出力信号と、この出力信号
を所定時間遅延せしめた信号との差出力とコンパ
レータ9で比較する設定レベルをスローアウエチ
ツプの辺部とノーズR部1aとで各別に設定する
ことにより、更に精度高い判別が可能となる。
尚、通例辺部とノーズR部1aでは検査基準が異
なるものである。
Further, the setting level for comparing the difference output between the output signal of the photoelectric conversion element and a signal obtained by delaying this output signal by a predetermined time and the comparator 9 is set separately for the side part of the throw-out chip and the nose R part 1a. This allows for even more accurate discrimination.
Note that inspection standards are usually different for the side portion and the nose R portion 1a.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明実施例の構成図、第2図は同平
面図、第3図は光電変換素子の出力波形図、第4
図は光電変換素子の出力信号処理のブロツクダイ
ヤグラムである。 1……スローアウエチツプ、4……光電変換素
子。
Fig. 1 is a configuration diagram of an embodiment of the present invention, Fig. 2 is a plan view thereof, Fig. 3 is an output waveform diagram of the photoelectric conversion element, and Fig. 4 is a diagram of the output waveform of the photoelectric conversion element.
The figure is a block diagram of output signal processing of a photoelectric conversion element. 1... Throw-away chip, 4... Photoelectric conversion element.

Claims (1)

【特許請求の範囲】 1 スローアウエチツプ等の被検査物端部の欠け
の有無を判別する欠け検出装置であつて、被検査
物の側面から投光し、被検査物端部上面に配備し
た細幅の短冊状光電変換素子に被検査物端部が結
像するようになすと共に、該被検査物を投光方向
角度を保ちながら水平に移動させたときの前記光
電変換素子の出力により欠けの有無を検出する装
置において、前記光電変換素子の出力信号と、こ
の出力信号を遅延回路で所定時間遅延せしめた信
号との差出力を比較回路によつて比較し、この差
出力が予め設定されたレベルより大きくなつたと
きの回数をカウンタで計数し、計数された値が予
め設定された回数より多いとき欠けと判別するよ
うにしたことを特徴とする欠け検査装置。 2 前記光電変換素子の出力信号と、この出力信
号を所定時間遅延せしめた信号との差出力と比較
する設定レベルを被検査物の辺部と隅角部とで各
別に設定することを特徴とする特許請求の範囲第
1項記載の欠け検査装置。
[Scope of Claims] 1. A chip detection device for determining the presence or absence of a chip at the end of an object to be inspected, such as a throw-away chip, which emits light from the side of the object to be inspected and is disposed on the upper surface of the end of the object to be inspected. The end of the object to be inspected is imaged on a narrow strip-shaped photoelectric conversion element, and the output of the photoelectric conversion element when the object to be inspected is moved horizontally while maintaining the angle of the light projection direction prevents chipping. In the device for detecting the presence or absence of A chipping inspection device characterized in that a counter counts the number of times the chipping exceeds a preset level, and determines chipping when the counted value is greater than a preset number of times. 2. A setting level for comparing the difference output between the output signal of the photoelectric conversion element and a signal obtained by delaying this output signal by a predetermined time is set separately for the sides and corners of the object to be inspected. A chipping inspection device according to claim 1.
JP12663479A 1979-09-28 1979-09-28 Crack detector Granted JPS5648547A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12663479A JPS5648547A (en) 1979-09-28 1979-09-28 Crack detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12663479A JPS5648547A (en) 1979-09-28 1979-09-28 Crack detector

Publications (2)

Publication Number Publication Date
JPS5648547A JPS5648547A (en) 1981-05-01
JPS6213618B2 true JPS6213618B2 (en) 1987-03-27

Family

ID=14940042

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12663479A Granted JPS5648547A (en) 1979-09-28 1979-09-28 Crack detector

Country Status (1)

Country Link
JP (1) JPS5648547A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009168615A (en) * 2008-01-16 2009-07-30 Denso Corp Appearance inspection apparatus and appearance inspection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5135879B2 (en) * 1973-07-31 1976-10-05
JPS5841459B2 (en) * 1974-10-28 1983-09-12 キヤノン株式会社 BUTSUTAIRIYO BUKETSUKAN KENSAHOHO

Also Published As

Publication number Publication date
JPS5648547A (en) 1981-05-01

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