Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6215138B2 - - Google Patents
[go: Go Back, main page]

JPS6215138B2 - - Google Patents

Info

Publication number
JPS6215138B2
JPS6215138B2 JP710379A JP710379A JPS6215138B2 JP S6215138 B2 JPS6215138 B2 JP S6215138B2 JP 710379 A JP710379 A JP 710379A JP 710379 A JP710379 A JP 710379A JP S6215138 B2 JPS6215138 B2 JP S6215138B2
Authority
JP
Japan
Prior art keywords
electrode
measurement
auxiliary electrode
measuring
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP710379A
Other languages
Japanese (ja)
Other versions
JPS55101055A (en
Inventor
Shigeru Takeuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP710379A priority Critical patent/JPS55101055A/en
Publication of JPS55101055A publication Critical patent/JPS55101055A/en
Publication of JPS6215138B2 publication Critical patent/JPS6215138B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Relating To Insulation (AREA)

Description

【発明の詳細な説明】 本発明は電子部品の電気特性検査に使用される
測定電極に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a measuring electrode used for testing electrical characteristics of electronic components.

トランジスタ等の電子部品の電気特性検査作業
にあつては、従来、第1図に示すような測定装置
を用いて行なつている。すなわち、絶縁材からな
る基板1に固定した棒体からなる測定電極2の上
端面に電子部品3の端子(リード)4を載せると
ともに、上方から絶縁材からなる押さえ5をリー
ド4に押し付け、リード4と測定電極2との密着
を図つて電子部品3の特性検査を行なう。なお、
測定電極2の基板1から下方に突出する下端は図
示しないが各種測定器等に接続される。
2. Description of the Related Art Inspection of electrical characteristics of electronic components such as transistors has conventionally been carried out using a measuring device as shown in FIG. That is, a terminal (lead) 4 of an electronic component 3 is placed on the upper end surface of a measuring electrode 2 made of a rod fixed to a substrate 1 made of an insulating material, and a presser 5 made of an insulating material is pressed against the lead 4 from above. 4 and the measuring electrode 2 are brought into close contact with each other, and the characteristics of the electronic component 3 are inspected. In addition,
Although not shown, the lower end of the measuring electrode 2 protruding downward from the substrate 1 is connected to various measuring instruments and the like.

ところで、このような測定機構によつて電子部
品の測定を長期間行なうと、リード4と接触する
測定電極2の測定端子面(上端面)6が摩耗して
しまい、リード4との間の接触不良を生じさせ、
特性検査ができなくなつてしまう。
By the way, if such a measuring mechanism is used to measure electronic components for a long period of time, the measurement terminal surface (upper end surface) 6 of the measurement electrode 2 that comes into contact with the lead 4 will wear out, causing the contact between the lead 4 and the lead 4 to deteriorate. cause defects,
Characteristic inspection becomes impossible.

そこで、従来は測定電極2が摩耗して使用に耐
えなくなると、測定電極2の交換を図つている。
Therefore, conventionally, when the measuring electrode 2 becomes worn out and becomes unusable, the measuring electrode 2 is replaced.

しかし、この測定電極交換作業は、高周波測定
回路等の周辺回路が付いている場合、交換後に煩
わしい調整作業が必要となり、測定装置の稼動率
の低下を来たしてしまう。
However, when replacing the measuring electrodes, if peripheral circuits such as high-frequency measuring circuits are attached, a troublesome adjustment work is required after replacement, resulting in a decrease in the operating rate of the measuring device.

したがつて、本発明の目的は測定電極交換作業
時間の短縮を図ることによつて、測定装置の嫁動
率の向上を図ることにある。
SUMMARY OF THE INVENTION Therefore, an object of the present invention is to improve the operational efficiency of a measuring device by shortening the time required for replacing measuring electrodes.

このような目的を達成するために本発明は、測
定電極の端部(頭部)に交換可能な導電材からな
る補助電極を取り付けておくものであり、前記補
助電極は弾性材からなるとともに、一部が不連続
なリングとなり、かつ基板に固定されている測定
電極の端部に挿入嵌合した際、リングの端面が測
定電極の端面よりも突出し測定端子面を形作るも
のである。以下実施例により本発明を説明する。
In order to achieve such an object, the present invention has an auxiliary electrode made of a replaceable conductive material attached to the end (head) of the measurement electrode, the auxiliary electrode made of an elastic material, When the ring is partially discontinuous and inserted into the end of the measurement electrode fixed to the substrate, the end surface of the ring protrudes beyond the end surface of the measurement electrode to form a measurement terminal surface. The present invention will be explained below with reference to Examples.

第2図は本発明の一実施例による測定電極の斜
視図である。同図に示すように、測定電極7は上
部に円柱大径部(頭部)8を有する丸棒体からな
り、導電性の良好な金属で作られている。また、
測定電極7の頭部8には補助電極9が挿脱自在に
取り付けられている。この補助電極9は導電性が
良好でかつ弾力性に富んだ金属、たとえばリン青
銅で作られていて、一部が不連続となるリング体
となつている。また、この補助電極9の高さは測
定電極7の頭部8の高さよりも数mm高くなつてい
て、第3図に示すように、絶縁性の基板10に取
り付けられた測定電極7の頭部8に補助電極9を
挿嵌した際、補助電極9の上端面は測定電極7の
上端面よりも上方に突出して測定端子面11を形
作るようになつている。なお、補助電極9の測定
電極7に対する取り付け、取り外しはリング体の
補助電極9の両端部を弾力に抗して拡げることに
より行ない、補助電極9はリング体の復元力によ
る締付けによつて測定電極7に張り付く。
FIG. 2 is a perspective view of a measurement electrode according to an embodiment of the present invention. As shown in the figure, the measurement electrode 7 is made of a round rod having a large diameter cylindrical portion (head) 8 at the top, and is made of a metal with good conductivity. Also,
An auxiliary electrode 9 is detachably attached to the head 8 of the measurement electrode 7. The auxiliary electrode 9 is made of a metal with good conductivity and high elasticity, such as phosphor bronze, and has a ring shape in which some parts are discontinuous. The height of this auxiliary electrode 9 is several mm higher than the height of the head 8 of the measurement electrode 7, and as shown in FIG. When the auxiliary electrode 9 is inserted into the portion 8, the upper end surface of the auxiliary electrode 9 protrudes above the upper end surface of the measurement electrode 7 to form a measurement terminal surface 11. The attachment and detachment of the auxiliary electrode 9 from the measurement electrode 7 is carried out by expanding both ends of the auxiliary electrode 9 of the ring body against elasticity, and the auxiliary electrode 9 is tightened by the restoring force of the ring body. Stick to 7.

このように、従来の測定電極7に補助電極9を
取り付けた測定電極にあつては、第3図で示すよ
うに、電子部品12のリード(端子)13を補助
電極9の上端測定端子面11に載せ、上方から押
さえ14で押し付けることによつて、リード13
と補助電極9との密着を図りながら電気特性検査
を行なう。そして、補助電極9の測定端子面11
が摩耗した場合には補助電極9を測定電極7から
抜き取つて新な補助電極9を測定電極7に取り付
ける。このように、補助電極9の挿脱は簡単に行
なえ、測定電極7の交換はないので回路との修正
作業も不要になり、作業時間は短縮されるため装
置の稼動率低下が防げる。なお、補助電極9の測
定端子面11の摩耗は方向性がある。また、補助
電極9はリング体となつている。したがつて、測
定電極7に対して補助電極9をたとえば45度ずつ
回動させることによつて、リード13が接触する
補助電極9の測定端子面11部分は未使用の摩耗
のない測定端子面11となる。このため、補助電
極9を採用することによつて、測定電極の使用回
数が従来に較べて大幅に増大する。
As shown in FIG. 3, in the case of the conventional measurement electrode 7 with the auxiliary electrode 9 attached, the lead (terminal) 13 of the electronic component 12 is connected to the upper end measurement terminal surface 11 of the auxiliary electrode 9. by placing it on the lead 13 and pressing it with the presser 14 from above.
The electrical characteristics are inspected while ensuring close contact between the electrode and the auxiliary electrode 9. Then, the measurement terminal surface 11 of the auxiliary electrode 9
When the auxiliary electrode 9 is worn out, the auxiliary electrode 9 is removed from the measuring electrode 7 and a new auxiliary electrode 9 is attached to the measuring electrode 7. In this way, the auxiliary electrode 9 can be easily inserted and removed, and since the measuring electrode 7 does not need to be replaced, there is no need to modify the circuit, and the working time is shortened, thereby preventing a decrease in the operating rate of the device. Note that the wear of the measurement terminal surface 11 of the auxiliary electrode 9 is directional. Further, the auxiliary electrode 9 has a ring shape. Therefore, by rotating the auxiliary electrode 9 by, for example, 45 degrees with respect to the measurement electrode 7, the portion of the measurement terminal surface 11 of the auxiliary electrode 9 that the lead 13 comes into contact with is an unused measurement terminal surface with no wear. It becomes 11. Therefore, by employing the auxiliary electrode 9, the number of times the measurement electrode is used is significantly increased compared to the conventional method.

また、この実施例によれば、リード13と補助
電極9との接触面積が小さく、かつ押さえ14で
リード13と補助電極9は強く密着するため、接
触抵抗が少なくなり、正確な測定が可能となる。
Furthermore, according to this embodiment, the contact area between the lead 13 and the auxiliary electrode 9 is small, and the lead 13 and the auxiliary electrode 9 are brought into close contact with each other by the presser 14, so that contact resistance is reduced and accurate measurement is possible. Become.

なお、本発明は前記実施例に限定されない。す
なわち、補助電極の形状は他の形状でもよい。
Note that the present invention is not limited to the above embodiments. That is, the shape of the auxiliary electrode may be other shapes.

以上のように、本発明の測定電極によれば、電
極交換時間が短縮され、かつ回路との調整作業も
不要となることから、一連の電極交換作業時間が
短縮される。したがつて、装置の稼動率が向上す
る。また、電極交換時、補助電極を回動させるだ
けでよい場合もあることから、電極の寿命が長く
なる特長もある。さらに、リードと補助電極とは
密着化するため、安定した電気特性検査も可能と
なる等多くの効果を奏する。
As described above, according to the measurement electrode of the present invention, the electrode replacement time is shortened, and adjustment work with the circuit is also unnecessary, so that the time required for a series of electrode replacement work is shortened. Therefore, the operating rate of the device is improved. Additionally, when replacing the electrode, it may be sufficient to simply rotate the auxiliary electrode, which has the advantage of extending the life of the electrode. Furthermore, since the lead and the auxiliary electrode are in close contact with each other, there are many effects such as stable electrical characteristic testing.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の測定電極による電子部品の測定
状態を示す断面図、第2図は本発明の一実施例に
よる測定電極の斜視図、第3図は本発明の測定電
極による電子部品の測定状態を示す断面図であ
る。 1……基板、2……測定電極、3……電子部
品、4……端子(リード)、5……押さえ、6…
…測定端子面、7……測定電極、8……頭部、9
……補助電極、10……基板、11……測定端子
面、12……電子部品、13……リード、14…
…押さえ。
FIG. 1 is a cross-sectional view showing how electronic components are measured using a conventional measurement electrode, FIG. 2 is a perspective view of a measurement electrode according to an embodiment of the present invention, and FIG. 3 is a measurement of electronic components using the measurement electrode of the present invention. It is a sectional view showing a state. 1... Board, 2... Measurement electrode, 3... Electronic component, 4... Terminal (lead), 5... Holder, 6...
...Measurement terminal surface, 7...Measurement electrode, 8...Head, 9
... Auxiliary electrode, 10 ... Board, 11 ... Measurement terminal surface, 12 ... Electronic component, 13 ... Lead, 14 ...
...Hold down.

Claims (1)

【特許請求の範囲】 1 棒体端面に被検査物の端子を当接する測定電
極において、棒体端部に棒体端面よりも端面が突
出するような導電材からなる交換可能な補助電極
を取り付けたことを特徴とする測定電極。 2 前記補助電極は棒体に回動可能に取り付け可
能となつていることを特徴とする特許請求の範囲
第1項記載の測定電極。 3 前記補助電極は一部が不連続となり、かつ弾
性材からなることを特徴とする特許請求の範囲第
1項または第2項記載の測定電極。
[Scope of Claims] 1. In a measurement electrode that brings a terminal of an object to be tested into contact with the end surface of a rod, a replaceable auxiliary electrode made of a conductive material is attached to the end of the rod so that the end surface protrudes beyond the end surface of the rod. A measurement electrode characterized by: 2. The measurement electrode according to claim 1, wherein the auxiliary electrode is rotatably attached to a rod. 3. The measurement electrode according to claim 1 or 2, wherein the auxiliary electrode is partially discontinuous and made of an elastic material.
JP710379A 1979-01-26 1979-01-26 Measurement electrode Granted JPS55101055A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP710379A JPS55101055A (en) 1979-01-26 1979-01-26 Measurement electrode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP710379A JPS55101055A (en) 1979-01-26 1979-01-26 Measurement electrode

Publications (2)

Publication Number Publication Date
JPS55101055A JPS55101055A (en) 1980-08-01
JPS6215138B2 true JPS6215138B2 (en) 1987-04-06

Family

ID=11656742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP710379A Granted JPS55101055A (en) 1979-01-26 1979-01-26 Measurement electrode

Country Status (1)

Country Link
JP (1) JPS55101055A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766786U (en) * 1980-10-09 1982-04-21

Also Published As

Publication number Publication date
JPS55101055A (en) 1980-08-01

Similar Documents

Publication Publication Date Title
US5134364A (en) Elastomeric test probe
JPS6215138B2 (en)
JPS58173841A (en) Card for probe
JPH0829475A (en) Contact probe of mounted substrate inspection device
JPH0145029B2 (en)
JPS6236137Y2 (en)
JP2000021528A (en) Contact pin for IC socket
JPH09304433A (en) Probe equipment
JP4736803B2 (en) probe
CN218036026U (en) Bending experiment base of circuit board
JPS58138058A (en) Semiconductor device
JPS6222069Y2 (en)
JPH05240877A (en) Prober for measuring semiconductor integrated circuit
JPH02234066A (en) Probe pin for in-circuit tester
JPS5932929Y2 (en) Measurement contact device
JPS6221008Y2 (en)
JPH04206752A (en) Inspecting device for surface-mounting type ic
JP2001153922A (en) Inspection socket
SU572862A2 (en) Device for connecting radio components leads to measuring unit
JPH079341Y2 (en) Terminal connection structure for electronic devices
JPS6225433A (en) Semiconductor element characteristic measuring device
JPH06295942A (en) Substrate inspecting instrument
JPS6298635A (en) wafer prober
JPH0611462Y2 (en) Contact probe for board inspection
JP3008612U (en) Measuring probe