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JPS6215817B2 - - Google Patents
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JPS6215817B2 - - Google Patents

Info

Publication number
JPS6215817B2
JPS6215817B2 JP56017707A JP1770781A JPS6215817B2 JP S6215817 B2 JPS6215817 B2 JP S6215817B2 JP 56017707 A JP56017707 A JP 56017707A JP 1770781 A JP1770781 A JP 1770781A JP S6215817 B2 JPS6215817 B2 JP S6215817B2
Authority
JP
Japan
Prior art keywords
output
det
memory
outputs
infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56017707A
Other languages
Japanese (ja)
Other versions
JPS57132031A (en
Inventor
Takeshi Inoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56017707A priority Critical patent/JPS57132031A/en
Publication of JPS57132031A publication Critical patent/JPS57132031A/en
Publication of JPS6215817B2 publication Critical patent/JPS6215817B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80Calibration
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/20Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077Imaging

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)

Description

【発明の詳細な説明】 本発明は複数の赤外線検知素子の出力のバラツ
キを補正する様にした赤外線検知素子の出力補正
方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for correcting the output of an infrared sensing element, which corrects variations in the output of a plurality of infrared sensing elements.

従来から物体の表面の温度測定等に赤外線映像
装置が用いられている。この赤外線映像装置は、
物体から輻射される赤外線の強度を測定すること
によつて物体の表面における温度分布を知ること
を目的としたものである。
2. Description of the Related Art Infrared imaging devices have been used to measure the temperature of the surface of an object. This infrared imaging device is
The purpose is to determine the temperature distribution on the surface of an object by measuring the intensity of infrared rays radiated from the object.

この様な赤外線映像装置は、第1図の如く複数
の検知素子DET1〜DET4を対角線上に配置し、
走査ラインを4素子分づつ移動させる様にして、
一画面を走査する様にしている。この場合、各検
知素子の特性のバラツキにより、出力電圧が変動
すると、正確に熱パターンを表示することができ
ない。
Such an infrared imaging device has a plurality of detection elements DET 1 to DET 4 arranged diagonally as shown in FIG.
By moving the scanning line by 4 elements,
I am trying to scan one screen. In this case, if the output voltage fluctuates due to variations in the characteristics of each sensing element, the thermal pattern cannot be accurately displayed.

本発明は、この様な点に鑑みてなされたもの
で、各素子の出力電圧を自動的に補正して、バラ
ツキのない熱パターンを表示させることを目的と
し、この様な目的は、校正時複数の赤外線検知素
子の出力をそれぞれホールドし、該複数の赤外線
検知素子出力の一つの基準として残りの出力との
差を求め、この差を複数回求めて平均化してメモ
リに記憶し、運用時、該複数の赤外線検知素子の
出力の内基準に用いた素子の出力を除く残りの出
力に該メモリ内の差を加算して出力する様にした
多素子赤外線検知器の出力補正方法によつて達成
される。
The present invention has been made in view of these points, and aims to automatically correct the output voltage of each element to display a uniform thermal pattern. Each of the outputs of a plurality of infrared detection elements is held, and the difference between the outputs of the plurality of infrared detection elements and the remaining outputs is determined as a reference, and this difference is determined multiple times, averaged, and stored in memory, and during operation. , by an output correction method of a multi-element infrared detector, in which the difference in the memory is added to the remaining outputs of the plurality of infrared detection elements excluding the output of the element used as a reference, and the output is output. achieved.

以下本発明を実施例に基づいて説明する。第2
図は本発明の実施例を、第3図はリニアライザの
説明用特性図である。図において、AM1〜AM4
はプリメインアンプ、CL1〜CL4はクランプ回
路、ASはアナログスイツチ、BAはバツフアアン
プ、SHはサンプルホールド回路、A/Dはアナ
ログデジタル交換器、R1はレジスタ、OPは演算
回路、M1〜M3はメモリ、PRRはプログラマブル
リードオンリーメモリライタ、PR1〜PR3はプロ
グラマブルリードオンリーメモリ、DSはデータ
セレクタ、ADDは加算回路、PT1,PT2はプリ
ント板、TA,TBはタイミング発生部、SCNは水
平走査駆動部、TCは校正タイミング発生部、BD
は黒体炉である。
The present invention will be explained below based on examples. Second
The figure shows an embodiment of the present invention, and FIG. 3 is an explanatory characteristic diagram of a linearizer. In the figure, AM 1 to AM 4
is an integrated amplifier, CL 1 to CL 4 are clamp circuits, AS is an analog switch, BA is a buffer amplifier, SH is a sample hold circuit, A/D is an analog-to-digital exchanger, R 1 is a register, OP is an arithmetic circuit, M 1 to M 3 is memory, PRR is programmable read-only memory writer, PR 1 to PR 3 is programmable read-only memory, DS is data selector, ADD is adder circuit, PT1, PT2 are printed board, TA, TB are timing generator, SCN is the horizontal scanning drive section, TC is the calibration timing generation section, BD
is a blackbody furnace.

本発明においては、検知素子DET1〜DET4
校正を行なう時には、装置にプリント板PT1を
挿入し、プログラマブルリードオンリーメモリ
PR1〜PR3に補正値を書込み、運用時補正値を書
込んだリードオンリーメモリPR1〜PR3を実装し
たプリント板PT2をプリント板PT1に代えて装
置に挿入し、補正値により補正して出力する。
In the present invention, when calibrating the detection elements DET 1 to DET 4 , the printed board PT1 is inserted into the device and the programmable read-only memory
Write the correction values to PR 1 to PR 3 , insert the printed board PT2 on which the read-only memory PR 1 to PR 3 with the correction values written during operation into the device instead of the printed board PT1, and make corrections using the correction values. and output it.

以下補正値の書込み、及び補正値による補正の
動作を説明する。まず、校正時黒体炉BDからの
赤外線検知素子DET1〜DET4に導く。検知素子
DET1〜DET4の出力はプリメインアンプAM1
AM4によりそれぞれ増幅してクランプ回路CL1
CL4に入力する。クランプ回路CL1〜CL4は走査
鏡の水平駆動回路SCNからの駆動信号に基づい
て、タイミング発生部TAにより作成したクロツ
ク信号に同期して、黒体炉BDからの赤外線に基
づく出力電圧を基準にして、クランプする。クラ
ンプ回路CL1〜CL4の出力は、アナログスイツチ
ASにより、多重化されて、バツフアアンプBAを
介してサンプリングホールド回路SHに入力され
る。サンプリングホールド回路SHは入力したア
ナログ信号をサンプルホールドし、アナログ・デ
ジタル変換器A/Dに入力する。アナログ・デジ
タル変換器A/Dはサンプリング値をAD変換す
る。ここで検知素子DET1の出力を基準として用
いるとすれば、検知素子DET1の出力をサンプル
し、A/D変換した出力値をレジスタR1に入力
し、他の検知素子DET1のDET4の出力は演算回
路OPにおいて、レジスタR1内の値との差をと
り、この差をメモリM1〜M3の領域Aにそれぞれ
差を順次加算していく。(加算回数も同時に記憶
する)この時、メモリM1,M2,M3のアドレス信
号はA/D変換した信号を用いる。以上のことを
黒体炉BDの温度を制御部PCONにより、常温か
ら高温へ、又常温から低温へ変化させながら、繰
り返し行なう。これによりメモリM1〜M3の0番
地から最終番地まで素子のバラツキによる差の総
和がストアされる。
The writing of the correction value and the operation of correction using the correction value will be explained below. First, during calibration, the infrared detection elements DET 1 to DET 4 are guided from the blackbody furnace BD. Detection element
The output of DET 1 ~ DET 4 is the integrated amplifier AM 1 ~
Amplified by AM 4 and clamp circuit CL 1 ~
Enter CL 4 . Clamp circuits CL 1 to CL 4 are based on the drive signal from the horizontal drive circuit SCN of the scanning mirror, synchronized with the clock signal created by the timing generator TA, and set the output voltage based on the infrared rays from the blackbody furnace BD as a reference. and clamp it. The outputs of clamp circuits CL 1 to CL 4 are analog switches.
It is multiplexed by AS and input to the sampling hold circuit SH via the buffer amplifier BA. The sampling and holding circuit SH samples and holds the input analog signal and inputs it to the analog-to-digital converter A/D. The analog/digital converter A/D converts the sampled value into AD. If the output of the detection element DET 1 is used as a reference here, the output of the detection element DET 1 is sampled, the A/D converted output value is input to the register R 1 , and the output value of the other detection element DET 1 is input to the DET 4 of the other detection element DET 1 . The arithmetic circuit OP calculates the difference between the output and the value in the register R1 , and sequentially adds this difference to the areas A of the memories M1 to M3 . (The number of additions is also stored at the same time.) At this time, A/D converted signals are used as address signals for the memories M 1 , M 2 , and M 3 . The above steps are repeated while changing the temperature of the blackbody furnace BD from room temperature to high temperature and from room temperature to low temperature using the control unit PCON. As a result, the total sum of differences due to variations in elements is stored from address 0 to the final address of memories M 1 to M 3 .

メモリM1〜M3でのストアのタイミングは校正
タイミング発生部CTからのタイミング信号に同
期して行なわれる黒体炉の温度のスイープが終了
すると、0〜最終番地ごとに、演算回路OPにお
いて次の演算を行ない平均値を求める。
The storage timing in the memories M1 to M3 is as follows: When the sweep of the temperature of the blackbody furnace, which is performed in synchronization with the timing signal from the calibration timing generator CT, is completed, the next memory is stored in the arithmetic circuit OP for each address from 0 to the final address. Perform the calculation to find the average value.

差の値の総和/加算回数 この演算結果をメモリM1〜M3の領域Bにスト
アする。次に領域Bの値をプログラマブルリード
オンリーメモリライタPRRにより、プログラマ
ブルリードオンリーメモリPR1〜PR3にストアす
る。赤外線検知装置の運用時、プログラマブルリ
ードオンリーメモリPR1〜PR3をプリント板PT2
に実装し、プリント板PT1の代わりに装置に挿入
する。そしてアナログ・デジタル変換器ADから
出力された信号の内、検知素子DET1からの出力
に関しては、データセレクタDSを介してリニア
ライザLA1により温度と出力電圧の関係が直線と
なるように表示部へ入力する。
Total sum of difference values/number of additions This calculation result is stored in area B of memories M1 to M3 . Next, the value of area B is stored in the programmable read-only memories PR 1 to PR 3 by the programmable read-only memory writer PRR. When operating the infrared detection device, programmable read-only memories PR 1 to PR 3 are connected to printed board PT 2.
and insert it into the device instead of printed board PT 1 . Of the signals output from the analog-to-digital converter AD, the output from the detection element DET 1 is sent to the display unit via the data selector DS and linearizer LA 1 so that the relationship between temperature and output voltage becomes a straight line. input.

次に検知素子DET2,DET3,DET4の出力に関
しては、アナログ・デジタル変換器A/Dの出力
を加算回路ADDに入力するとともに、プログラ
マブルリードオンリーメモリPR1〜PR3へアドレ
ス信号として入力する。これによりプログラマブ
ルリードオンリーメモリPR1〜PR3から各温度に
おける補正値が出力され、加算回路ADDで加算
され、データセレクタDSを介してリニアライザ
LA2に入力する。これにより検知素子の出力が補
正されて表示部に入力される。
Next, regarding the outputs of the detection elements DET 2 , DET 3 , and DET 4 , the output of the analog-to-digital converter A/D is input to the adder circuit ADD, and is also input as an address signal to the programmable read-only memories PR 1 to PR 3 . do. As a result, the correction values at each temperature are output from the programmable read-only memories PR 1 to PR 3 , added by the adder circuit ADD, and sent to the linearizer via the data selector DS.
Enter LA 2 . As a result, the output of the sensing element is corrected and input to the display section.

以上の如く本発明によれば各検知素子の出力を
自動的に補正して出力でき、バラツキのない熱パ
ターンを表示できる様になる。
As described above, according to the present invention, the output of each detection element can be automatically corrected and output, and a uniform thermal pattern can be displayed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は検知素子の配置を示す図、第2図は本
発明の実施例を示す図、である。 図中DET1〜DET4は検知素子、AM1〜AM4
プリメインアンプ、CL1〜CL4はクランプ回路、
ASはアナログスイツチ、BAはバツフアアンプ、
SHはサンプリングホールド回路、A/Dはアナ
ログ・デジタル変換器、R1はレジスタ、OPは演
算回路、M1〜M3はメモリ、PRRはプログラマブ
ルリードオンリーメモリタイタ、PR1〜PR3はプ
ログラマブルリードオンリーメモリ、ADDは加
算回路、DSはデータセレクタである。
FIG. 1 is a diagram showing the arrangement of sensing elements, and FIG. 2 is a diagram showing an embodiment of the present invention. In the figure, DET 1 to DET 4 are detection elements, AM 1 to AM 4 are integrated amplifiers, CL 1 to CL 4 are clamp circuits,
AS is an analog switch, BA is a buffer amplifier,
SH is a sampling hold circuit, A/D is an analog-to-digital converter, R1 is a register, OP is an arithmetic circuit, M1 to M3 are memories, PRR is a programmable read-only memory titer, and PR1 to PR3 are programmable reads. Only memory, ADD is an adder circuit, and DS is a data selector.

Claims (1)

【特許請求の範囲】[Claims] 1 校正時複数の赤外線検知素子の出力をそれぞ
れホールドし、該複数の赤外線検知素子出力の一
つを基準として残りの出力との差を求め、この差
を複数回求めて平均化してメモリに記憶し、運用
時該複数の赤外線検知素子の出力の内基準に用い
た素子の出力を除く残りの出力に該メモリ内の差
を加算して出力する様にした多素子赤外線検知素
子の出力補正方法。
1. During calibration, each output of a plurality of infrared detection elements is held, and one of the outputs of the plurality of infrared detection elements is used as a reference to determine the difference between the outputs of the remaining outputs, and this difference is determined multiple times, averaged, and stored in memory. A method for correcting the output of a multi-element infrared sensing element, in which the difference in the memory is added to the remaining outputs of the plurality of infrared sensing elements excluding the output of the element used as a reference during operation, and the output is output. .
JP56017707A 1981-02-09 1981-02-09 Correction system for output of infrared ray detecting elenent Granted JPS57132031A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56017707A JPS57132031A (en) 1981-02-09 1981-02-09 Correction system for output of infrared ray detecting elenent

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56017707A JPS57132031A (en) 1981-02-09 1981-02-09 Correction system for output of infrared ray detecting elenent

Publications (2)

Publication Number Publication Date
JPS57132031A JPS57132031A (en) 1982-08-16
JPS6215817B2 true JPS6215817B2 (en) 1987-04-09

Family

ID=11951236

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56017707A Granted JPS57132031A (en) 1981-02-09 1981-02-09 Correction system for output of infrared ray detecting elenent

Country Status (1)

Country Link
JP (1) JPS57132031A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5992319A (en) * 1982-11-19 1984-05-28 Fujitsu Ltd Interelement compensation system of multiple-element type infrared video device
JPS6175227A (en) * 1984-09-20 1986-04-17 Nippon Kokan Kk <Nkk> Temperature measurement device for moving objects
US4873442A (en) * 1985-12-09 1989-10-10 Hughes Aircraft Company Method and apparatus for scanning thermal images
FR2652471B1 (en) * 1989-09-22 1991-11-29 Thomson Csf DEVICE FOR CORRECTING DEFECTS IN A SUITE OF IMAGES ANALYZED BY AN INTEGRATED MATRIX INFRARED SENSOR.
JP2669140B2 (en) * 1990-10-24 1997-10-27 日本電気株式会社 Imaging device
CA2110368C (en) * 1992-12-07 1999-11-23 Gary M. Lindgren Wide dynamic range non-uniformity compensation for infrared focal plane arrays
JP3212874B2 (en) * 1996-04-19 2001-09-25 日本電気株式会社 Bolometer type infrared imaging device

Also Published As

Publication number Publication date
JPS57132031A (en) 1982-08-16

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