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JPS6217725B2 - - Google Patents
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JPS6217725B2 - - Google Patents

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Publication number
JPS6217725B2
JPS6217725B2 JP54114935A JP11493579A JPS6217725B2 JP S6217725 B2 JPS6217725 B2 JP S6217725B2 JP 54114935 A JP54114935 A JP 54114935A JP 11493579 A JP11493579 A JP 11493579A JP S6217725 B2 JPS6217725 B2 JP S6217725B2
Authority
JP
Japan
Prior art keywords
rotating mirror
interference fringes
inspected
reflected
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54114935A
Other languages
Japanese (ja)
Other versions
JPS5639517A (en
Inventor
Katsumi Kokubu
Masaharu Okafuji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Sheet Glass Co Ltd
Original Assignee
Nippon Sheet Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Sheet Glass Co Ltd filed Critical Nippon Sheet Glass Co Ltd
Priority to JP11493579A priority Critical patent/JPS5639517A/en
Publication of JPS5639517A publication Critical patent/JPS5639517A/en
Publication of JPS6217725B2 publication Critical patent/JPS6217725B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Mechanical Optical Scanning Systems (AREA)
  • Facsimile Scanning Arrangements (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【発明の詳細な説明】 本発明は、回転鏡を用いてフライングスポツト
方式あるいはフライングイメージ方式で検査体の
光走査を行なう方法における検査位置の検出技術
に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a technique for detecting an inspection position in a method of optically scanning an object to be inspected using a flying spot method or a flying image method using a rotating mirror.

ガラス板、金属板、織布等一般に製品が連続帯
状に製造される工程においては、製品の厚み、製
品表面あるいは内部の欠陥有無等を製品全幅にわ
たり連続検査する方法として光走査による検査方
法が広く行なわれている。この光走査による検査
法には大別して、光源からの光束を回転鏡で反射
させた後直接又は凹面鏡を介して検査体に投じて
検査体上で光スポツトを往復動させるフライング
スポツト方式と、検査体からの反射光を回転鏡で
反射させ、反射した検査体の影像を光学検査装置
に対し往復動させるフライングイメージ方式の2
方式がある。
In processes where products are generally manufactured in continuous strips, such as glass plates, metal plates, and woven fabrics, optical scanning inspection methods are widely used as a method for continuously inspecting the entire width of the product, such as the thickness of the product and the presence or absence of defects on the product surface or inside. It is being done. Inspection methods using optical scanning can be roughly divided into flying spot methods, in which a light beam from a light source is reflected by a rotating mirror and then projected onto the object to be inspected, either directly or via a concave mirror, and the light spot is moved back and forth on the object to be inspected; 2. Flying image method in which the light reflected from the body is reflected by a rotating mirror, and the reflected image of the object to be inspected is moved back and forth to the optical inspection device.
There is a method.

いずれの方式も検査体を小部分毎に順次光で検
査する点で共通しており、かかる検査方法では全
走査の間を通じて常に検査体上の検査位置を正確
に把握することが非常に重要である。
All of these methods have in common that the object to be inspected is sequentially inspected with light, small parts at a time, and in these inspection methods, it is extremely important to accurately grasp the inspection position on the object throughout the entire scan. be.

このような光走査における検査位置の検出方法
としては一定間隔の電気的な基準パルスを発生さ
せ、走査開始と同時にこの基準パルスを計数し、
予め把握してあるパルス数と検査体上での走査方
向距離との関係(パルスに基づく区画割り及び番
地付け)から検査位置を求める方法が最も一般的
である。
The method of detecting the inspection position in such optical scanning is to generate electrical reference pulses at regular intervals, count these reference pulses at the same time as the start of scanning,
The most common method is to determine the inspection position from the relationship between the number of pulses known in advance and the distance in the scanning direction on the inspection object (section division and address assignment based on pulses).

そして上記基準パルスとしては、等時間間隔の
クロツクパルスを用いるか又はロータリーエンコ
ーダーとよばれる円周方向に小間隔で多数のスリ
ツトを設けた円板を回転鏡と同期して回転させ、
このロータリーエンコーダーのスリツトを通る光
の断続を電気信号に変換したパルスを用いるのが
従来最も一般的である。
As the reference pulse, a clock pulse at equal time intervals is used, or a disk called a rotary encoder, which has a large number of slits arranged at small intervals in the circumferential direction, is rotated in synchronization with a rotating mirror.
Conventionally, it has been most common to use pulses obtained by converting the intermittent light passing through the slit of the rotary encoder into an electrical signal.

しかしながらクロツクパルスを位置検出用基準
パルスに用いた場合、回転鏡に回転速度ムラがあ
ると同一の検査位置に対する位置検出結果(基準
パルスに基づく番地)が走査毎にばらつき、位置
データの信頼性が低いものになると同時に、欠陥
検出の場合は欠陥の種類あるいは大きさに関し誤
認する原因となる。
However, when clock pulses are used as reference pulses for position detection, if the rotation speed of the rotating mirror is uneven, the position detection results (addresses based on the reference pulses) for the same inspection position will vary from scan to scan, and the reliability of the position data will be low. At the same time, in the case of defect detection, it can cause misunderstandings regarding the type or size of defects.

またロータリーエンコーダを用いる方法では、
製造の困難性及び強度上の問題から回転円板のス
リツト間隔をあまり密にすることができず、した
がつて検査体がガラス板等比較的大きいもので
は、走査線に沿うパルスに基づく区画割り(単位
番地幅)が粗いものとなつて充分な位置検出精度
が得られないという問題がある。
Also, in the method using a rotary encoder,
Due to manufacturing difficulties and strength issues, it is not possible to make the slit spacing of the rotating disk very close, so if the object to be inspected is relatively large, such as a glass plate, segmentation based on pulses along the scanning line is not possible. There is a problem that (unit address width) becomes coarse and sufficient position detection accuracy cannot be obtained.

本発明の主な目的は、回転鏡を用いた光走査に
おける検査位置検出を高精度で行なうことのでき
る方法を提供することにある。
A main object of the present invention is to provide a method that can detect an inspection position with high precision in optical scanning using a rotating mirror.

本発明の他の目的は、回転鏡の回転速度ムラに
影響されない光走査における位置検出方法を提供
することにある。
Another object of the present invention is to provide a position detection method in optical scanning that is not affected by uneven rotational speed of a rotating mirror.

本発明のさらに他の目的は、走査線に沿う位置
決めのための区画割りを極めて高密度で細分化し
得る光走査における位置検出方法を提供すること
にある。
Still another object of the present invention is to provide a position detection method in optical scanning that can subdivide divisions for positioning along a scanning line at an extremely high density.

本発明の方法では、回転鏡にレーザー干渉縞を
投射し、回転鏡で反射した干渉縞を受光器に受光
させ、前記回転鏡の回転に伴なつて前記受光器を
通過する干渉縞数を計数し、この計数値に基づい
て前記検査位置を決定する。
In the method of the present invention, laser interference fringes are projected onto a rotating mirror, the interference fringes reflected by the rotating mirror are received by a light receiver, and the number of interference fringes passing through the light receiver as the rotating mirror rotates is counted. Then, the inspection position is determined based on this count value.

なお、本発明において「回転鏡」とは、連続回
転する多面鏡および反射面が一定角度範囲内で揺
動回転するいわゆる振動鏡のいずれも含む。
In the present invention, the term "rotating mirror" includes both a continuously rotating polygon mirror and a so-called oscillating mirror whose reflecting surface swings and rotates within a certain angle range.

以下本発明を図面に示した実施例につき詳細に
説明する。
The present invention will be described in detail below with reference to embodiments shown in the drawings.

第1図は本発明方法をフライングスポツト方式
の欠陥検査装置に適用した例を示し、1は検査
体、例えば連続帯状に製造されるガラス板であり
矢印2の方向に移送される。
FIG. 1 shows an example in which the method of the present invention is applied to a flying spot type defect inspection apparatus. Reference numeral 1 denotes an object to be inspected, for example, a glass plate manufactured in a continuous band shape, which is transported in the direction of arrow 2.

このガラス板1の移送経路上方に傾いた軸線3
周りに連続回転する多面回転鏡4があり、主光源
5から出た光束6は回転鏡4の反射面4Aで反射
されてガラス板1に光スポツト7を形成する。
The axis 3 tilted upward on the transport path of this glass plate 1
There is a polygonal rotating mirror 4 that continuously rotates around it, and a light beam 6 emitted from a main light source 5 is reflected by a reflective surface 4A of the rotating mirror 4 to form a light spot 7 on the glass plate 1.

光スポツト7は回転鏡4の回転に伴ないガラス
板1上を幅方向に往復動してガラス板1を走査す
る。ガラス板1の下方には、光スポツト7の往復
動経路すなわち走査線8に沿つて光電変換素子を
多数配列して構成した主受光装置9があり、この
主受光装置9により、ガラス板1の表面あるいは
内部に存在するキズ、異物、泡等の欠陥に起因す
る透過光量変化が電気信号に変換されて図外の欠
陥判別装置に伝達される。一方以下に述べる方法
で走査線8に沿うガラス板1幅方向の検査位置が
検出されて上記欠陥判別装置に伝達される。
The light spot 7 scans the glass plate 1 by reciprocating in the width direction on the glass plate 1 as the rotating mirror 4 rotates. Below the glass plate 1, there is a main light receiving device 9 configured by arranging a large number of photoelectric conversion elements along the reciprocating path of the light spot 7, that is, along the scanning line 8. Changes in the amount of transmitted light due to defects such as scratches, foreign matter, bubbles, etc. existing on the surface or inside are converted into electrical signals and transmitted to a defect determination device (not shown). On the other hand, the inspection position in the width direction of the glass plate 1 along the scanning line 8 is detected by the method described below and transmitted to the defect determination device.

レーザー光源12及び受光器15を固定設置
し、このレーザー光源12から出るビームを光学
レンズ系13で収束させた後干渉縞生成装置14
に通して干渉縞を生成させ、この干渉縞を含むレ
ーザー光20を回転鏡4の反射面4Aで反射させ
た後受光装置15に受光させる。
A laser light source 12 and a light receiver 15 are fixedly installed, and the beam emitted from the laser light source 12 is converged by an optical lens system 13 and then an interference fringe generating device 14
The laser beam 20 containing the interference fringes is reflected by the reflecting surface 4A of the rotating mirror 4 and then received by the light receiving device 15.

さらに詳細には第2図に示すように干渉縞生成
装置14は高度の平行平面を有する透明板からな
り、この透明板14に斜め方向からレーザービー
ム21をレンズ13Aで拡大後レンズ13Bで収
束させて投射する。透明板14の一面には半透明
被膜16が設けてあるとともに、他面側には上記
投射ビームの光路を妨げない位置に反射被膜17
が設けてある。投射ビームの一部は半透明被膜1
6及び反射被膜17により透明板14の内部で反
射を繰返した後透過主ビーム22と同方向に副ビ
ーム23として出射する。そして両ビーム22及
び23は共に拡散しつつ相互干渉し、両ビームの
光路差に起因してクロス部分20には明暗コント
ラストの非常に強い干渉縞が出現する。なお、半
透明被膜16及び反射被膜17は設けることが望
ましいが設けずとも充分に明瞭な干渉縞が得られ
る。
More specifically, as shown in FIG. 2, the interference fringe generating device 14 is composed of a transparent plate having highly parallel planes, and a laser beam 21 is magnified by a lens 13A from an oblique direction onto the transparent plate 14, and then converged by a lens 13B. and project it. A semitransparent coating 16 is provided on one side of the transparent plate 14, and a reflective coating 17 is provided on the other side at a position that does not obstruct the optical path of the projection beam.
is provided. A part of the projected beam is covered with a semi-transparent coating 1
6 and the reflective coating 17 inside the transparent plate 14, and then emitted as a sub beam 23 in the same direction as the transmitted main beam 22. Both beams 22 and 23 interfere with each other while being diffused, and interference fringes with a very strong contrast between light and dark appear at the crossing portion 20 due to the optical path difference between the two beams. Although it is desirable to provide the semi-transparent coating 16 and the reflective coating 17, sufficiently clear interference fringes can be obtained even if they are not provided.

また収束させたレーザービームを透明板14の
表面で反射させ、この反射主ビームと透明板14
内部で反射した後主ビームと同方向に出射する副
ビームとによつて干渉縞を生成させてもよい。
In addition, the converged laser beam is reflected on the surface of the transparent plate 14, and this reflected main beam and the transparent plate 14
Interference fringes may be generated by a main beam reflected internally and a sub beam emitted in the same direction.

上記干渉縞を回転鏡4の反射面4Aで反射さ
せ、反射された干渉縞24をスリツト25を介し
て受光器15に受光させる。
The interference fringes are reflected by the reflecting surface 4A of the rotating mirror 4, and the reflected interference fringes 24 are received by the light receiver 15 through the slit 25.

また主受光器9の両端には1回の走査毎に走査
開始及び走査終了を検出するスタートパルス用受
光器10、及びエンドパルス用受光器11を設け
てく。
Furthermore, a start pulse receiver 10 and an end pulse receiver 11 are provided at both ends of the main receiver 9 to detect the start and end of scanning for each scan.

第3図に示すように、干渉縞受光器15は計数
器26に接続されており、回転鏡4の回転に伴な
い受光器15を通過する干渉縞24の明暗変化が
受光器15で電気信号変化に変換され、適当な波
形整形がなされて干渉縞に対応するパルスPiの形
で計数器26で計数される。
As shown in FIG. 3, the interference fringe receiver 15 is connected to a counter 26, and the change in brightness of the interference fringe 24 passing through the receiver 15 as the rotating mirror 4 rotates causes the receiver 15 to receive an electrical signal. The signal is converted into a change, subjected to appropriate waveform shaping, and counted by a counter 26 in the form of pulses Pi corresponding to interference fringes.

この計数器26には受光器10からスタートパ
ルスPsが入り、このスタートパルスPsを受けて
干渉縞パルスPiの計数が開始されまた受光器11
からのエンドパルスPeを受けて計数を終える。
計数器26での計数データーは欠陥判別装置27
に常時送られ、一方主受光装置9から欠陥検出信
号Pdが欠陥判別装置27に送られる。
A start pulse Ps is input from the photoreceiver 10 to this counter 26, and upon receiving this start pulse Ps, counting of interference fringe pulses Pi is started, and the photoreceiver 11
The counting ends upon receiving the end pulse Pe from.
The count data from the counter 26 is sent to the defect discrimination device 27.
On the other hand, a defect detection signal Pd is sent from the main light receiving device 9 to the defect discriminating device 27.

上記の結果をもとにして干渉縞計数開始位置を
基準とする走査線8に沿う番地と各番地内の検査
結果(欠陥の有無)との対応データ、例えば第3
図に示すようなr番地からr+2番地にかけて欠
陥30が存在することを示すデータテーブル29
が欠陥判別装置内に作成され、また欠陥と同様に
してガラス板1の端縁位置番地が検出される。
Based on the above results, the correspondence data between the addresses along the scanning line 8 based on the interference fringe counting start position and the inspection results (presence or absence of defects) within each address, for example, the third
A data table 29 indicating that a defect 30 exists from address r to address r+2 as shown in the figure.
is created in the defect discriminating device, and the edge position address of the glass plate 1 is detected in the same manner as the defect.

そして予め欠陥判別装置に与えられている走査
線8に沿つた単位番地幅に関するデータと上記の
番地データに基づきガラス板1の端縁から欠陥ま
での相対距離が算出される。なお走査線8に沿つ
た位置と同時にガラス板1の移送方向における走
査位置も測定されるが本発明と直接関係しないの
で詳細な説明は省略する。この結果をもとに切断
工程あるいは成形工程において欠陥を含むガラス
板部分の除去、操業条件の変更等のしかるべき処
置が行なわれる。
Then, the relative distance from the edge of the glass plate 1 to the defect is calculated based on the data regarding the unit address width along the scanning line 8 that has been given to the defect discriminating device in advance and the above address data. Note that the scanning position in the transport direction of the glass plate 1 is also measured at the same time as the position along the scanning line 8, but since this is not directly related to the present invention, a detailed explanation will be omitted. Based on this result, appropriate measures are taken in the cutting or forming process, such as removing glass plate portions containing defects or changing operating conditions.

ここで干渉縞について述べると、干渉縞の空間
密度D(ビーム拡がり角単位角度当りの本数)は
近似的に、 D=tsin2θ/λo√22〓 t:透明板14の厚み θ:レーザービームの入射角 λo:レーザービームの波長 n:透明板14の屈折率 で表わされ、したがつて可及的に間隔の密な干渉
縞を得るには厚みの大な透明板14を使用し、ま
たレーザービームの入射角は透明板14の屈折率
を1.52として49度前後に設定するのが最も効果的
である。
Regarding interference fringes, the spatial density D of interference fringes (number per unit angle of beam divergence angle) is approximately as follows: D=tsin2θ/λo√ 22 〓 t: Thickness of transparent plate 14 θ: Laser beam Incident angle λo: Laser beam wavelength n: Refractive index of the transparent plate 14. Therefore, in order to obtain interference fringes as closely spaced as possible, a thick transparent plate 14 is used. Furthermore, it is most effective to set the incident angle of the laser beam to around 49 degrees, assuming that the refractive index of the transparent plate 14 is 1.52.

本発明者らの実験によれば、高度の平行平面を
有する透明板14として市販の厚み19.0mmのフロ
ートガラス板を使用した場合、回転鏡反射面4A
の回転角1度内に含まれる干渉縞数は、レーザー
ビーム入射角θが34度で172本、同39度で185本、
同49度で197本、同59度で184本、同64度で169本
であることが確認された。一方現在のところ入手
できる最も精密なロータリーエンコーダ板でも回
転角1度当りスリツト本数が30本以下であるから
本発明方法によれば光走査における検査体の区画
割りを従来に比し飛躍的に高密度細分化できる。
また本発明方法によれば回転鏡の回転角度変化に
同期して検査位置番地がカウントされるので回転
鏡に回転速度ムラがあつてもこれに影響を受ける
ことなく正確に検査位置検出を行なうことができ
る。
According to experiments by the present inventors, when a commercially available float glass plate with a thickness of 19.0 mm is used as the transparent plate 14 having a highly parallel plane, the rotating mirror reflecting surface 4A
The number of interference fringes included within 1 degree of rotation angle is 172 when the laser beam incident angle θ is 34 degrees, 185 when the laser beam incident angle is 39 degrees,
It was confirmed that there were 197 lines at 49 degrees, 184 lines at 59 degrees, and 169 lines at 64 degrees. On the other hand, even with the most precise rotary encoder plate available at present, the number of slits per degree of rotation angle is less than 30, so the method of the present invention dramatically increases the division of the inspection object during optical scanning compared to the conventional method. Density subdivision is possible.
Furthermore, according to the method of the present invention, the inspection position address is counted in synchronization with changes in the rotation angle of the rotating mirror, so even if there is uneven rotation speed of the rotating mirror, the inspection position can be accurately detected without being affected by this. I can do it.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明方法の一実施例を示す斜視図、
第2図は第1図の要部を拡大して示す平面図、第
3図は同実施例における信号処理方法を模式的に
示すブロツク図である。 1……検査体、4……回転鏡、4A……反射
面、8……走査線、12……レーザー光源、14
……干渉縞発生装置、15……干渉縞受光器、2
4……干渉縞、26……計数器。
FIG. 1 is a perspective view showing an embodiment of the method of the present invention;
FIG. 2 is an enlarged plan view of the main part of FIG. 1, and FIG. 3 is a block diagram schematically showing the signal processing method in the same embodiment. 1... Test object, 4... Rotating mirror, 4A... Reflective surface, 8... Scanning line, 12... Laser light source, 14
...Interference fringe generator, 15...Interference fringe receiver, 2
4...Interference fringes, 26...Counter.

Claims (1)

【特許請求の範囲】 1 検査体への投射光又は検査体からの反射光を
回転鏡で移動させつつ検査体を小部分毎に順次検
査する光走査方法において、前記回転鏡にレーザ
ー干渉縞を投射し、回転鏡で反射した干渉縞を受
光器に受光させ、前記回転鏡の回転に伴なつて前
記受光器を通過する干渉縞数を計数し、該計数値
に基づいて前記検査位置を決定することを特徴と
する光走査における位置検出方法。 2 レーザー干渉縞は、収束させたレーザービー
ムを高度の平行平面をもつ透明板に斜め方向から
当てて該透明板を透過又は表面で反射する主ビー
ムと該透明板内部で反射した後前記主ビーム方向
に出射する副ビームとの相互干渉により生成させ
ることを特徴とする特許請求の範囲第1項記載の
方法。
[Scope of Claims] 1. In an optical scanning method in which the object to be inspected is sequentially inspected small parts while moving the light projected onto the object to be inspected or the light reflected from the object to be inspected using a rotating mirror, laser interference fringes are formed on the rotating mirror. The interference fringes projected and reflected by a rotating mirror are received by a light receiver, the number of interference fringes passing through the light receiver as the rotating mirror rotates is counted, and the inspection position is determined based on the counted value. A position detection method in optical scanning characterized by: 2 Laser interference fringes are created by focusing a converged laser beam obliquely on a transparent plate with highly parallel planes, and dividing the main beam through the transparent plate or reflecting it on the surface, and the main beam after being reflected inside the transparent plate. 2. The method according to claim 1, wherein the method is generated by mutual interference with a sub-beam emitted in a direction.
JP11493579A 1979-09-07 1979-09-07 Position detecting method in optical scanning Granted JPS5639517A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11493579A JPS5639517A (en) 1979-09-07 1979-09-07 Position detecting method in optical scanning

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11493579A JPS5639517A (en) 1979-09-07 1979-09-07 Position detecting method in optical scanning

Publications (2)

Publication Number Publication Date
JPS5639517A JPS5639517A (en) 1981-04-15
JPS6217725B2 true JPS6217725B2 (en) 1987-04-20

Family

ID=14650295

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11493579A Granted JPS5639517A (en) 1979-09-07 1979-09-07 Position detecting method in optical scanning

Country Status (1)

Country Link
JP (1) JPS5639517A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3590327T1 (en) * 1984-07-05 1986-06-26 Ricoh Co., Ltd., Tokio/Tokyo Method for regulating the temperature of a semiconductor laser in an optical scanning device
JPS6333834A (en) * 1986-07-28 1988-02-13 Canon Inc Surface condition inspection device
JPS63124941A (en) * 1986-11-14 1988-05-28 Hitachi Electronics Eng Co Ltd Detection system for scanning position

Also Published As

Publication number Publication date
JPS5639517A (en) 1981-04-15

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