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JPS6220663B2 - - Google Patents
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JPS6220663B2 - - Google Patents

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Publication number
JPS6220663B2
JPS6220663B2 JP50136001A JP13600175A JPS6220663B2 JP S6220663 B2 JPS6220663 B2 JP S6220663B2 JP 50136001 A JP50136001 A JP 50136001A JP 13600175 A JP13600175 A JP 13600175A JP S6220663 B2 JPS6220663 B2 JP S6220663B2
Authority
JP
Japan
Prior art keywords
sample
objective lens
gas
cooling body
magnetic pole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP50136001A
Other languages
Japanese (ja)
Other versions
JPS5260061A (en
Inventor
Toshinori Goto
Yoshasu Harada
Akio Mikajiri
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Denshi KK filed Critical Nihon Denshi KK
Priority to JP50136001A priority Critical patent/JPS5260061A/en
Publication of JPS5260061A publication Critical patent/JPS5260061A/en
Publication of JPS6220663B2 publication Critical patent/JPS6220663B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は試料の近傍に不活性ガスと酸素ガスと
の混合ガスを導入した状態で、グロー放電を発生
させることにより試料近傍におかれた部材に付着
した有機物あるいは有機ガス分子等の汚染物を取
除くように構成した電子顕微鏡及び類似装置に関
するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention is a method of introducing a mixed gas of an inert gas and an oxygen gas into the vicinity of the specimen, and generating a glow discharge in the vicinity of the specimen. The present invention relates to electron microscopes and similar devices configured to remove contaminants such as organic substances or organic gas molecules attached to members.

[従来の技術] 一般に電子顕微鏡等における試料汚染は、試料
近辺の残留ガス中の有機ガス分子が電子ビーム照
射を受け固形化されて試料表面に堆積することに
より生じると考えられている。かかる試料汚染を
防止するために、従来においては試料筒の上下に
冷却体を設置し、試料近辺の有機ガス分子を吸着
する装置が広く使用されている。
[Prior Art] It is generally believed that sample contamination in an electron microscope or the like occurs when organic gas molecules in residual gas near the sample are solidified by electron beam irradiation and deposited on the sample surface. In order to prevent such sample contamination, conventionally, devices have been widely used in which cooling bodies are installed above and below a sample tube to adsorb organic gas molecules near the sample.

しかしながら斯様な装置は、有機ガス分子の発
生源をとめるのではなく、あくまでも冷却体近辺
の有機ガス分子だけを吸着するものであるため、
試料に一番近い対物レンズ上磁極や試料筒の表面
から放出された有機ガス分子が試料に付着し、そ
れによつて試料が汚染されるのを防止することは
できない。
However, such a device does not stop the source of organic gas molecules, but only adsorbs organic gas molecules near the cooling body.
It is impossible to prevent organic gas molecules emitted from the upper magnetic pole of the objective lens closest to the sample or from the surface of the sample tube from adhering to the sample and thereby contaminating the sample.

そこで、これらの不都合を解決するために、対
物レンズの上磁極と下磁極との間に電極を設置す
ると共に、前記各磁極近傍に不活性ガスを導入
し、電極と各磁極間に交流電圧を印加してグロー
放電を発生させることにより対物レンズの上磁極
や試料筒表面等に付着している有機ガス分子等の
汚染物を取除くことが考えられる。
Therefore, in order to solve these problems, an electrode is installed between the upper and lower magnetic poles of the objective lens, an inert gas is introduced near each magnetic pole, and an alternating current voltage is applied between the electrode and each magnetic pole. It is possible to remove contaminants such as organic gas molecules adhering to the upper magnetic pole of the objective lens, the surface of the sample cylinder, etc. by applying this voltage to generate a glow discharge.

[発明が解決しようとする問題点] しかし、対物レンズの上磁極と下磁極との間に
は、上記冷却体や対物レンズの絞り板が設置して
あり、その上に新たにグロー放電用の電極を挿入
することは上磁極と下磁極との間隔を広げること
になり、それによつて分解能の低下を招くことか
らあまり好ましくない。
[Problems to be solved by the invention] However, the cooling body and the aperture plate of the objective lens are installed between the upper magnetic pole and the lower magnetic pole of the objective lens, and a new glow discharge Inserting an electrode is not very preferable because it increases the distance between the upper magnetic pole and the lower magnetic pole, which leads to a decrease in resolution.

そこで、本発明はこのような点に鑑みてなされ
たものであり、対物レンズの上磁極と下磁極間を
広げることなく、前記汚染物を効果的に除くこと
のできる電子顕微鏡及び類似装置を提供すること
を目的とするものである。
The present invention has been made in view of these points, and provides an electron microscope and similar devices that can effectively remove the contaminants without widening the distance between the upper and lower magnetic poles of the objective lens. The purpose is to

[問題点を解決するための手段] 上記目的を達成するために、本発明は対物レン
ズの上下磁極の間に挿入される試料汚染防止用冷
却体を接地電位にある前記上下磁極その他の周囲
部材から電気的に絶縁する手段、前記対物レンズ
上下磁極間へ不活性ガス或は不活性ガスと酸素ガ
スとの混合ガスを導入する手段、前記冷却体と接
地電位間にグロー放電用の電位差を与える電源、
及び前記冷却体を電源に接続するか或は接地する
かを選択するための手段を具備することを特徴と
するものである。
[Means for Solving the Problems] In order to achieve the above object, the present invention provides a sample contamination prevention cooling body inserted between the upper and lower magnetic poles of an objective lens, such that the upper and lower magnetic poles and other surrounding members are at ground potential. means for electrically insulating from the objective lens, means for introducing an inert gas or a mixed gas of an inert gas and oxygen gas between the upper and lower magnetic poles of the objective lens, and providing a potential difference for glow discharge between the cooling body and the ground potential. power supply,
and means for selecting whether the cooling body is connected to a power source or grounded.

以下、本発明の実施例を図面に基づき詳説す
る。
Hereinafter, embodiments of the present invention will be explained in detail based on the drawings.

[実施例] 第1図は本発明の一実施例を示す縦断面図であ
り、図中は対物レンズで、上磁極2と下磁極3
とを非磁性体製スペーサー4により一体化した磁
極片とヨーク5と磁励コイル6とから構成されて
いる。
[Embodiment] FIG. 1 is a longitudinal sectional view showing an embodiment of the present invention, in which numeral 1 is an objective lens, and an upper magnetic pole 2 and a lower magnetic pole 3
It is composed of a magnetic pole piece, a yoke 5, and a magnetic excitation coil 6, which are integrated by a spacer 4 made of a non-magnetic material.

7はこの対物レンズの上方に設けられた試料室
で、内部に試料ステージ8が移動可能におかれて
おり、この試料ステージの光軸部分には試料(図
示せず)を保持した試料筒9が着脱自在に嵌挿さ
れている。
Reference numeral 7 denotes a sample chamber provided above this objective lens, in which a sample stage 8 is movably placed, and a sample cylinder 9 holding a sample (not shown) is located on the optical axis of this sample stage. is removably inserted.

10及び11は試料筒9の上下におかれた試料
汚染防止用冷却体で、光軸部分に電子線通過可能
な穴12a,12bが形成してあり、この両冷却
体は夫々試料室及びヨーク側壁を貫通して冷却槽
13に固定されている。この冷却槽内に例えば液
体窒素の冷媒14を導入し、それによつて冷却体
10,11を冷却することにより試料近傍の有機
ガス分子を吸着する。前記冷却槽13は断熱体
(電気的絶縁を兼ねる)15a,15bを介して
外槽16内に保持されており、この外槽はフラン
ジ17a,17bを介して前記試料室1側壁に固
定されている。これにより前記両冷却体(冷却
槽)は試料室に対して電気的に絶縁される。
Reference numerals 10 and 11 denote cooling bodies for preventing sample contamination placed above and below the sample tube 9. Holes 12a and 12b through which electron beams can pass are formed in the optical axis portion, and these cooling bodies are used for the sample chamber and the yoke, respectively. It penetrates the side wall and is fixed to the cooling tank 13. A refrigerant 14, for example, liquid nitrogen, is introduced into this cooling tank to cool the cooling bodies 10 and 11, thereby adsorbing organic gas molecules near the sample. The cooling tank 13 is held in an outer tank 16 via heat insulators (also serving as electrical insulation) 15a and 15b, and this outer tank is fixed to the side wall of the sample chamber 1 via flanges 17a and 17b. There is. As a result, both the cooling bodies (cooling baths) are electrically insulated from the sample chamber.

18は放電用交流電源(直流電源でもよい)
で、一端はアースされ、他端は切換スイツチSを
介して冷却槽13に接続されている。
18 is an AC power source for discharging (a DC power source may be used)
One end is grounded, and the other end is connected to the cooling tank 13 via a changeover switch S.

19は不活性ガスと少量の酸素ガスとを混合し
た混合ガス(不活性ガスだけでもよい)を内臓し
たガスボンベで、このガスボンベはヨーク5側壁
を貫通したパイプ20を介して磁極片内に接続さ
れている。前記パイプには混合ガスの流量を調整
するための可変リークバルブ21が設けてある。
Reference numeral 19 denotes a gas cylinder containing a mixed gas of an inert gas and a small amount of oxygen gas (inert gas alone may also be used), and this gas cylinder is connected to the inside of the magnetic pole piece via a pipe 20 penetrating the side wall of the yoke 5. ing. The pipe is provided with a variable leak valve 21 for adjusting the flow rate of the mixed gas.

しかして、今、対物レンズ及び試料室内を排気
した状態において可変リークバルブ21を開放
し、磁極片及び試料室内に混合ガスを導入するこ
とにより試料近傍の圧力を1×10-1〜10-3Torr程
度のガス雰囲気にする。この状態において、スイ
ツチSを点線で示す位置に切換えると、交流電源
18から約1KV程度の交流電圧が冷却槽13を経
て冷却体10,11に印加されるため、これら両
冷却体とアース電位に保たれた上磁極2、下磁極
3、スペーサー4、ヨーク上蓋5a、試料室7、
試料ステージ8及び試料筒9との間で強制的にグ
ロー放電が起こる。この放電により混合ガスは電
離されてイオンとなり、このイオンは前記交流電
源の周期に従つて両冷却体と上磁極、下磁極、ス
ペーサー、ヨーク上蓋、試料室、試料ステージ及
び試料筒との間を交番的に衝撃するため、これら
の部材に付着している有機物や有機ガス分子等の
汚染物をスパツタする。また、前記各部材に付着
している汚染物はイオン衝撃による高温加熱によ
り一部は酸化されてガス化し、スパツタされ易く
なる。かくしてガス化されスパツタされた汚染物
は、排気パイプ(図示せず)を介して排気され
る。しかして斯様な動作を5分間程度行なうこと
により前記各部材に付着された汚染物を完全に取
り除く(クリーニング)ことができる。
Now, with the objective lens and the sample chamber evacuated, the variable leak valve 21 is opened and the mixed gas is introduced into the magnetic pole piece and the sample chamber to reduce the pressure near the sample to 1×10 -1 to 10 -3 Create a gas atmosphere around Torr. In this state, when the switch S is switched to the position shown by the dotted line, an AC voltage of about 1 KV is applied from the AC power supply 18 to the cooling bodies 10 and 11 via the cooling tank 13, so that both of these cooling bodies and the earth potential are applied. The maintained upper magnetic pole 2, lower magnetic pole 3, spacer 4, yoke upper cover 5a, sample chamber 7,
Glow discharge is forcibly generated between the sample stage 8 and the sample cylinder 9. This discharge ionizes the mixed gas into ions, and these ions move between the two cooling bodies, the upper magnetic pole, the lower magnetic pole, the spacer, the yoke upper cover, the sample chamber, the sample stage, and the sample cylinder according to the cycle of the AC power supply. Because of the alternating impact, contaminants such as organic substances and organic gas molecules adhering to these members are spattered. In addition, some of the contaminants adhering to the members are oxidized and gasified by high-temperature heating due to ion bombardment, making them more likely to be spattered. The thus gasified and sputtered contaminants are exhausted via an exhaust pipe (not shown). By performing such an operation for about 5 minutes, the contaminants adhering to each member can be completely removed (cleaned).

尚、この場合、金属等の試料観察のときには試
料筒に予め試料を装着させておけば試料表面もク
リーニングされ、また、生物等の如き放電により
破壊される試料のときには試料筒のみを装着し、
クリーニング終了後に試料を装着させればよい。
また、前記クリーニングの速さは混合ガスの導入
量による試料近傍の圧力、酸素ガスの導入量、交
流電圧及び作動時間によつて任意に制御すること
ができる。
In this case, when observing a sample such as a metal, the surface of the sample can be cleaned by attaching the sample to the sample tube in advance, and when the sample is to be destroyed by electrical discharge, such as a living organism, only the sample tube is attached.
The sample may be attached after cleaning is completed.
Further, the cleaning speed can be arbitrarily controlled by the pressure near the sample depending on the amount of mixed gas introduced, the amount of oxygen gas introduced, the AC voltage, and the operating time.

しかして、クリーニングが終了した後は切換ス
イツチSを実線で示す位置に切換え、冷却体1
0,11をアース電位に保ち、また、可変リーク
バルブ21を閉じる。しかる後、試料室等内を所
定の真空度に排気し、冷却槽13に冷媒14を導
入して電子銃(図示せず)から電子線を発生する
ことにより顕微鏡像の観察を行なう。
After the cleaning is completed, switch the changeover switch S to the position shown by the solid line, and
0 and 11 are kept at ground potential, and the variable leak valve 21 is closed. Thereafter, the inside of the sample chamber etc. is evacuated to a predetermined degree of vacuum, a coolant 14 is introduced into the cooling tank 13, and an electron beam is generated from an electron gun (not shown) to observe a microscopic image.

尚、前述の説明では本発明を電子顕微鏡に実施
した場合を示したが、走査電子顕微鏡やX線マイ
クロアナライザー等にも同様に実施できることは
言うまでもない。
In the above description, the present invention was applied to an electron microscope, but it goes without saying that it can be similarly applied to a scanning electron microscope, an X-ray microanalyzer, and the like.

[発明の効果] 以上のように本発明においては、試料汚染防止
用冷却体をグロー放電用電極として使用するた
め、対物レンズの上磁極と下磁極間に新たなグロ
ー放電用電極を挿入する必要がなくなる。そのた
め、上磁極と下磁極間の間隔が広がることに基づ
く分解能の低下を招くことなく試料近傍の汚染物
を取り除くことができる。また、グロー放電によ
つて冷却体の表面に付着した有機ガス分子も除去
することができるため、活性化が図られ吸着効率
が高められると同時に、この冷却体を鏡体内の真
空を破壊して外部に取出し冷却体に付着した有機
ガス分子を除去する作業が不要になる等実用性大
なる効果を有する。
[Effects of the Invention] As described above, in the present invention, since the cooling body for preventing sample contamination is used as the glow discharge electrode, it is necessary to insert a new glow discharge electrode between the upper and lower magnetic poles of the objective lens. disappears. Therefore, contaminants near the sample can be removed without deteriorating the resolution due to the widening of the gap between the upper and lower magnetic poles. In addition, organic gas molecules adhering to the surface of the cooling body can be removed by glow discharge, resulting in activation and increasing adsorption efficiency. This has great practical effects, such as eliminating the need to take out the organic gas molecules and remove them from the cooling body.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す縦断面図であ
る。 :対物レンズ、7:試料室、8:試料ステー
ジ、9:試料筒、10,11:冷却体、13:冷
却槽、18:交流電源、19:ガスボンベ。
FIG. 1 is a longitudinal sectional view showing one embodiment of the present invention. 1 : Objective lens, 7: Sample chamber, 8: Sample stage, 9: Sample cylinder, 10, 11: Cooling body, 13: Cooling tank, 18: AC power supply, 19: Gas cylinder.

Claims (1)

【特許請求の範囲】[Claims] 1 対物レンズの上下磁極の間に挿入される試料
汚染防止用冷却体を接地電位にある前記上下磁極
その他の周囲部材から電気的に絶縁する手段、前
記対物レンズ上下磁極間へ不活性ガス或は不活性
ガスと酸素ガスとの混合ガスを導入する手段、前
記冷却体と接地電位間にグロー放電用の電位差を
与える電源、及び前記冷却体を電源に接続するか
或は接地するかを選択するための手段を具備する
ことを特徴とする電子顕微鏡及び類似装置。
1. Means for electrically insulating a sample contamination prevention cooling body inserted between the upper and lower magnetic poles of the objective lens from the upper and lower magnetic poles and other surrounding members that are at ground potential, and an inert gas or Selecting a means for introducing a mixed gas of an inert gas and an oxygen gas, a power source for providing a potential difference for glow discharge between the cooling body and a ground potential, and whether the cooling body is connected to a power source or grounded. Electron microscopes and similar devices characterized in that they are equipped with means for.
JP50136001A 1975-11-12 1975-11-12 Electronic microscope and its similar equipment Granted JPS5260061A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50136001A JPS5260061A (en) 1975-11-12 1975-11-12 Electronic microscope and its similar equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50136001A JPS5260061A (en) 1975-11-12 1975-11-12 Electronic microscope and its similar equipment

Publications (2)

Publication Number Publication Date
JPS5260061A JPS5260061A (en) 1977-05-18
JPS6220663B2 true JPS6220663B2 (en) 1987-05-08

Family

ID=15164859

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50136001A Granted JPS5260061A (en) 1975-11-12 1975-11-12 Electronic microscope and its similar equipment

Country Status (1)

Country Link
JP (1) JPS5260061A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5384786B2 (en) * 2006-11-14 2014-01-08 株式会社日立ハイテクノロジーズ Charged beam device and mirror body thereof

Also Published As

Publication number Publication date
JPS5260061A (en) 1977-05-18

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