JPS6227152B2 - - Google Patents
Info
- Publication number
- JPS6227152B2 JPS6227152B2 JP2758382A JP2758382A JPS6227152B2 JP S6227152 B2 JPS6227152 B2 JP S6227152B2 JP 2758382 A JP2758382 A JP 2758382A JP 2758382 A JP2758382 A JP 2758382A JP S6227152 B2 JPS6227152 B2 JP S6227152B2
- Authority
- JP
- Japan
- Prior art keywords
- plating solution
- silver
- electroless copper
- copper plating
- electroless
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 32
- 229910052802 copper Inorganic materials 0.000 claims description 32
- 239000010949 copper Substances 0.000 claims description 32
- 238000007747 plating Methods 0.000 claims description 32
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 claims description 25
- -1 aliphatic secondary Chemical class 0.000 claims description 15
- 238000005452 bending Methods 0.000 claims description 14
- YNAVUWVOSKDBBP-UHFFFAOYSA-N Morpholine Chemical compound C1COCCN1 YNAVUWVOSKDBBP-UHFFFAOYSA-N 0.000 claims description 12
- GLUUGHFHXGJENI-UHFFFAOYSA-N Piperazine Chemical compound C1CNCCN1 GLUUGHFHXGJENI-UHFFFAOYSA-N 0.000 claims description 12
- 229910052709 silver Inorganic materials 0.000 claims description 9
- 239000004332 silver Substances 0.000 claims description 9
- FOIXSVOLVBLSDH-UHFFFAOYSA-N Silver ion Chemical compound [Ag+] FOIXSVOLVBLSDH-UHFFFAOYSA-N 0.000 claims description 8
- BVKZGUZCCUSVTD-UHFFFAOYSA-N carbonic acid Chemical compound OC(O)=O BVKZGUZCCUSVTD-UHFFFAOYSA-N 0.000 claims description 7
- 150000004985 diamines Chemical class 0.000 claims description 7
- 150000002009 diols Chemical class 0.000 claims description 7
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 7
- 150000003512 tertiary amines Chemical class 0.000 claims description 7
- ASUDFOJKTJLAIK-UHFFFAOYSA-N 2-methoxyethanamine Chemical compound COCCN ASUDFOJKTJLAIK-UHFFFAOYSA-N 0.000 claims description 6
- 150000001983 dialkylethers Chemical class 0.000 claims description 6
- JKFYKCYQEWQPTM-UHFFFAOYSA-N 2-azaniumyl-2-(4-fluorophenyl)acetate Chemical compound OC(=O)C(N)C1=CC=C(F)C=C1 JKFYKCYQEWQPTM-UHFFFAOYSA-N 0.000 claims description 5
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 claims description 5
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 5
- 229910021612 Silver iodide Inorganic materials 0.000 claims description 5
- 150000001346 alkyl aryl ethers Chemical class 0.000 claims description 5
- 150000001991 dicarboxylic acids Chemical class 0.000 claims description 5
- 229940045105 silver iodide Drugs 0.000 claims description 5
- 150000001879 copper Chemical class 0.000 claims description 4
- 238000007772 electroless plating Methods 0.000 claims description 4
- 239000003638 chemical reducing agent Substances 0.000 claims description 3
- 239000008139 complexing agent Substances 0.000 claims description 3
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 claims description 2
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 claims 1
- 239000005977 Ethylene Substances 0.000 claims 1
- 239000000243 solution Substances 0.000 description 19
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 10
- 238000000034 method Methods 0.000 description 5
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 4
- 229910000365 copper sulfate Inorganic materials 0.000 description 4
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 4
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 239000000654 additive Substances 0.000 description 3
- 238000009713 electroplating Methods 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 3
- PUPZLCDOIYMWBV-UHFFFAOYSA-N (+/-)-1,3-Butanediol Chemical compound CC(O)CCO PUPZLCDOIYMWBV-UHFFFAOYSA-N 0.000 description 2
- WXUAQHNMJWJLTG-UHFFFAOYSA-N 2-methylbutanedioic acid Chemical compound OC(=O)C(C)CC(O)=O WXUAQHNMJWJLTG-UHFFFAOYSA-N 0.000 description 2
- ALRHLSYJTWAHJZ-UHFFFAOYSA-N 3-hydroxypropionic acid Chemical compound OCCC(O)=O ALRHLSYJTWAHJZ-UHFFFAOYSA-N 0.000 description 2
- XTHFKEDIFFGKHM-UHFFFAOYSA-N Dimethoxyethane Chemical compound COCCOC XTHFKEDIFFGKHM-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- AEMRFAOFKBGASW-UHFFFAOYSA-N Glycolic acid Chemical compound OCC(O)=O AEMRFAOFKBGASW-UHFFFAOYSA-N 0.000 description 2
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- VHRGRCVQAFMJIZ-UHFFFAOYSA-N cadaverine Chemical compound NCCCCCN VHRGRCVQAFMJIZ-UHFFFAOYSA-N 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 239000011889 copper foil Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- YPFDHNVEDLHUCE-UHFFFAOYSA-N propane-1,3-diol Chemical compound OCCCO YPFDHNVEDLHUCE-UHFFFAOYSA-N 0.000 description 2
- KIDHWZJUCRJVML-UHFFFAOYSA-N putrescine Chemical compound NCCCCN KIDHWZJUCRJVML-UHFFFAOYSA-N 0.000 description 2
- 229940100890 silver compound Drugs 0.000 description 2
- 150000003379 silver compounds Chemical class 0.000 description 2
- 229910001961 silver nitrate Inorganic materials 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 2
- XFNJVJPLKCPIBV-UHFFFAOYSA-N trimethylenediamine Chemical compound NCCCN XFNJVJPLKCPIBV-UHFFFAOYSA-N 0.000 description 2
- DNIAPMSPPWPWGF-GSVOUGTGSA-N (R)-(-)-Propylene glycol Chemical compound C[C@@H](O)CO DNIAPMSPPWPWGF-GSVOUGTGSA-N 0.000 description 1
- LZDKZFUFMNSQCJ-UHFFFAOYSA-N 1,2-diethoxyethane Chemical compound CCOCCOCC LZDKZFUFMNSQCJ-UHFFFAOYSA-N 0.000 description 1
- ZXSQEZNORDWBGZ-UHFFFAOYSA-N 1,3-dihydropyrrolo[2,3-b]pyridin-2-one Chemical compound C1=CN=C2NC(=O)CC2=C1 ZXSQEZNORDWBGZ-UHFFFAOYSA-N 0.000 description 1
- RTBFRGCFXZNCOE-UHFFFAOYSA-N 1-methylsulfonylpiperidin-4-one Chemical compound CS(=O)(=O)N1CCC(=O)CC1 RTBFRGCFXZNCOE-UHFFFAOYSA-N 0.000 description 1
- HHAPGMVKBLELOE-UHFFFAOYSA-N 2-(2-methylpropoxy)ethanol Chemical compound CC(C)COCCO HHAPGMVKBLELOE-UHFFFAOYSA-N 0.000 description 1
- MIJDSYMOBYNHOT-UHFFFAOYSA-N 2-(ethylamino)ethanol Chemical compound CCNCCO MIJDSYMOBYNHOT-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- BFSVOASYOCHEOV-UHFFFAOYSA-N 2-diethylaminoethanol Chemical compound CCN(CC)CCO BFSVOASYOCHEOV-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- UPGSWASWQBLSKZ-UHFFFAOYSA-N 2-hexoxyethanol Chemical compound CCCCCCOCCO UPGSWASWQBLSKZ-UHFFFAOYSA-N 0.000 description 1
- QCDWFXQBSFUVSP-UHFFFAOYSA-N 2-phenoxyethanol Chemical compound OCCOC1=CC=CC=C1 QCDWFXQBSFUVSP-UHFFFAOYSA-N 0.000 description 1
- YEYKMVJDLWJFOA-UHFFFAOYSA-N 2-propoxyethanol Chemical compound CCCOCCO YEYKMVJDLWJFOA-UHFFFAOYSA-N 0.000 description 1
- WSGYTJNNHPZFKR-UHFFFAOYSA-N 3-hydroxypropanenitrile Chemical compound OCCC#N WSGYTJNNHPZFKR-UHFFFAOYSA-N 0.000 description 1
- SJZRECIVHVDYJC-UHFFFAOYSA-N 4-hydroxybutyric acid Chemical compound OCCCC(O)=O SJZRECIVHVDYJC-UHFFFAOYSA-N 0.000 description 1
- ZAFNJMIOTHYJRJ-UHFFFAOYSA-N Diisopropyl ether Chemical compound CC(C)OC(C)C ZAFNJMIOTHYJRJ-UHFFFAOYSA-N 0.000 description 1
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- AMQJEAYHLZJPGS-UHFFFAOYSA-N N-Pentanol Chemical compound CCCCCO AMQJEAYHLZJPGS-UHFFFAOYSA-N 0.000 description 1
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 description 1
- OPKOKAMJFNKNAS-UHFFFAOYSA-N N-methylethanolamine Chemical compound CNCCO OPKOKAMJFNKNAS-UHFFFAOYSA-N 0.000 description 1
- 229930040373 Paraformaldehyde Natural products 0.000 description 1
- ALQSHHUCVQOPAS-UHFFFAOYSA-N Pentane-1,5-diol Chemical compound OCCCCCO ALQSHHUCVQOPAS-UHFFFAOYSA-N 0.000 description 1
- 229910021607 Silver chloride Inorganic materials 0.000 description 1
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000001361 adipic acid Substances 0.000 description 1
- 235000011037 adipic acid Nutrition 0.000 description 1
- JFCQEDHGNNZCLN-UHFFFAOYSA-N anhydrous glutaric acid Natural products OC(=O)CCCC(O)=O JFCQEDHGNNZCLN-UHFFFAOYSA-N 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- BMRWNKZVCUKKSR-UHFFFAOYSA-N butane-1,2-diol Chemical compound CCC(O)CO BMRWNKZVCUKKSR-UHFFFAOYSA-N 0.000 description 1
- OWBTYPJTUOEWEK-UHFFFAOYSA-N butane-2,3-diol Chemical compound CC(O)C(C)O OWBTYPJTUOEWEK-UHFFFAOYSA-N 0.000 description 1
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- XTVVROIMIGLXTD-UHFFFAOYSA-N copper(II) nitrate Chemical compound [Cu+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O XTVVROIMIGLXTD-UHFFFAOYSA-N 0.000 description 1
- OPQARKPSCNTWTJ-UHFFFAOYSA-L copper(ii) acetate Chemical compound [Cu+2].CC([O-])=O.CC([O-])=O OPQARKPSCNTWTJ-UHFFFAOYSA-L 0.000 description 1
- 125000004093 cyano group Chemical group *C#N 0.000 description 1
- FOTKYAAJKYLFFN-UHFFFAOYSA-N decane-1,10-diol Chemical compound OCCCCCCCCCCO FOTKYAAJKYLFFN-UHFFFAOYSA-N 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- XPPKVPWEQAFLFU-UHFFFAOYSA-J diphosphate(4-) Chemical compound [O-]P([O-])(=O)OP([O-])([O-])=O XPPKVPWEQAFLFU-UHFFFAOYSA-J 0.000 description 1
- 235000011180 diphosphates Nutrition 0.000 description 1
- BXKDSDJJOVIHMX-UHFFFAOYSA-N edrophonium chloride Chemical compound [Cl-].CC[N+](C)(C)C1=CC=CC(O)=C1 BXKDSDJJOVIHMX-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 239000001530 fumaric acid Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- NAQMVNRVTILPCV-UHFFFAOYSA-N hexane-1,6-diamine Chemical compound NCCCCCCN NAQMVNRVTILPCV-UHFFFAOYSA-N 0.000 description 1
- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 1
- OHMBHFSEKCCCBW-UHFFFAOYSA-N hexane-2,5-diol Chemical compound CC(O)CCC(C)O OHMBHFSEKCCCBW-UHFFFAOYSA-N 0.000 description 1
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 1
- 239000011976 maleic acid Substances 0.000 description 1
- DNIAPMSPPWPWGF-UHFFFAOYSA-N monopropylene glycol Natural products CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 1
- 231100000989 no adverse effect Toxicity 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 229920002866 paraformaldehyde Polymers 0.000 description 1
- 229960005323 phenoxyethanol Drugs 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 235000013772 propylene glycol Nutrition 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- CQLFBEKRDQMJLZ-UHFFFAOYSA-M silver acetate Chemical compound [Ag+].CC([O-])=O CQLFBEKRDQMJLZ-UHFFFAOYSA-M 0.000 description 1
- 229940071536 silver acetate Drugs 0.000 description 1
- ADZWSOLPGZMUMY-UHFFFAOYSA-M silver bromide Chemical compound [Ag]Br ADZWSOLPGZMUMY-UHFFFAOYSA-M 0.000 description 1
- 229910001958 silver carbonate Inorganic materials 0.000 description 1
- LKZMBDSASOBTPN-UHFFFAOYSA-L silver carbonate Substances [Ag].[O-]C([O-])=O LKZMBDSASOBTPN-UHFFFAOYSA-L 0.000 description 1
- LFAGQMCIGQNPJG-UHFFFAOYSA-N silver cyanide Chemical compound [Ag+].N#[C-] LFAGQMCIGQNPJG-UHFFFAOYSA-N 0.000 description 1
- 229940098221 silver cyanide Drugs 0.000 description 1
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 description 1
- YPNVIBVEFVRZPJ-UHFFFAOYSA-L silver sulfate Chemical compound [Ag+].[Ag+].[O-]S([O-])(=O)=O YPNVIBVEFVRZPJ-UHFFFAOYSA-L 0.000 description 1
- 229910000367 silver sulfate Inorganic materials 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/38—Coating with copper
- C23C18/40—Coating with copper using reducing agents
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemically Coating (AREA)
Description
本発明は無電解銅めつき液に関し、詳しくは高
い引張り強度とすぐれた耐折疲労強度とをもつめ
つき銅が得られる無電解銅めつき液に関する。
無電解銅めつきから得られる銅の機械的特性を
向上させるための研究開発は、これまでにも盛ん
に行なわれてきており、又現在でも盛んな理由の
1つは、この無電解銅めつき技術をプリント配線
板の回路形成に応用すると大きな効果が生まれる
可能性があるためである。すなわち、プリント配
線板の回路は年々高密度化しており、違つた面の
回路を導通させるためのスルーホール径は増々小
さくなつてきている。このような状況の中で、電
気めつき方法に較べて平面部分とスルホール内壁
面のめつき厚さに差の生じにくい無電解銅めつき
が期待されているわけである。また、電気めつき
をおこない、回路以外の銅をエツチング除去する
方法(サブトラクト法)においては、エツチング
によりアンダーカツト(銅の厚さ方向において、
表面部分はエツチングレジストの膜で寸法が保持
されるものの、基板近傍ではエツチングがより進
行するために回路断面が逆台形になる。)が生じ
るため細線回路をつくるのは難しい。
これに対して、無電解銅めつき(アデイテイブ
法)では回路部分だけをめつきで付与するのでア
ンダーカツトの問題がなく回路の細線化に有利で
ある。
しかし、これまでの多くの無電解銅めつきは、
一般にプリント配線板の回路形成に用いられてい
るピロリン酸電気めつきから得られる銅(ピロ
銅)の物性、すなわち引張り強さ、および後で述
べる方法で測定した耐折疲労強度に比べて劣つて
いるために、製品の信頼性があまり高くない。す
なわち、プリント配線板に部品搭載後の半田あげ
による加熱などで回路が切断しやすいなどの欠点
がある。ピロ銅の引張り強度は50〜60Kg/mm2、ま
た耐折疲労強度は25μmの厚さで2000〜3000回で
ある。これに対して工業的なレベルで使用されて
いる無電解銅めつきから得られる銅の引張り強度
は、約30Kg/mm2、また耐折疲労強度は800〜1100
回(25μm)である。
配線回路が高密度な配線板では、同時に高い接
続信頼性が要求されるので、無電解銅めつきは前
記した理由で配線の高密度化には有利であつて
も、ほとんど使用されていないのが現状である。
したがつて、無電解銅めつきで得られる銅の物
性が改善され、たとえば、ピロ銅のそれに近づけ
ば新しい道がひらけるのである。
本発明はこのような点に鑑みてなされたもの
で、銅塩、錯化剤、還元剤およびPH調整剤を含む
無電解銅めつき液に、銀イオン供給源と、ジオー
ル、ヒドロキシカルボン酸、ジカルボン酸、ジア
ミン、シアンヒドリン、エチレングリコールのモ
ノあるいはジアルキルエーテル、ヒドロキシ基を
もつ脂肪族第二あるいは第三アミン、O―メチル
―エタノールアミン、P―ジオキサン、モルホリ
ン、ピペラジンの少なくとも1種とを添加したこ
とを特徴とする。
銀イオン供給源としては、金属銀、ヨウ化銀、
臭化銀、塩化銀、硝酸銀、硫酸銀、シアン化銀、
酢酸銀、炭酸銀等の銀化合物の少なくとも一種が
使用される。
銀イオンは得られるめつき銅の機械強度、特に
引張り強度および耐折疲労強度を向上させる。
銀イオン供給源として、金属銀、ヨウ化銀を使
用する場合はその添加量は1mg/もあれば充分
であるが、これより多くてもめつき液が不安定に
なり分解するということはない。これは金属銀、
ヨウ化銀の溶解度が極めて小さいためである。水
に対する溶解度は、金属銀の場合、25℃で2.8×
10-5g/(2.6×10-7モル/)、ヨウ化銀の場
合、20℃で3.4×10-5g/(1.4×10-7モル/
)である。
これに対して、その他の銀の化合物(たとえば
硝酸銀など)の場合には、一般に溶解度が高いの
である一定量以上加えるとめつき液が不安定にな
り分解しやすくなる。これはめつき液中の銀イオ
ン濃度が高くなるためである。この場合、安定剤
を多く添加すればある程度分解を抑えられるがそ
の場合においても限度がある。
溶解度の高い銀イオン供給源を使用する場合、
それらの化合物はめつき液中の銀イオン濃度が得
られためつきの機械強度の向上すなわち、引張り
強度および耐折疲労強度の向上が認められ、かつ
めつき液が不安定になり分解しない濃度となるよ
うな量供給される。
一般にはめつき液中の銀イオンの濃度は10-10
〜10-3モル/が更には10-8〜10-5モル/が好
ましい。
ジオール、ヒドロキシカルボン酸、ジカルボン
酸、ジアミン、シアンヒドリン、エチレングリコ
ールのモノあるいはジアルキルエーテル、ヒドロ
キシ基をもつ脂肪族第二あるいは第三アミン、O
―メチル―エタノールアミン、P―ジオキガン、
モルホリン、ピペラジンは無電解めつき液の安定
性を向上させる。
上記の各々物質の一般式は以下のように表わさ
れる。すなわち、ジオールはHO―R1―OH、ヒ
ドロキシカルボン酸はHO―R2―COOH、ジカル
ボン酸はHOOC―R2―COOH、ジアミンはH2N―
R4―NH2、シアンヒドリンはHO―R5―CN、エチ
レングリコールのモノあるいはジアルキルエーテ
ルはR6―O―CH2CH2―OHあるいはR7―O―
CH2CH2―O―R8、ヒドロキシ基をもつ脂肪族第
二あるいは第三アミンはR10―NH―R9―OHある
いはR13R12N―R11―OH、O―メチル―エタノラ
ミンはH3C―O―CH2CH2―NH2、
P―ジオキサンは
The present invention relates to an electroless copper plating solution, and more particularly to an electroless copper plating solution that provides plating copper with high tensile strength and excellent bending fatigue strength. Research and development to improve the mechanical properties of copper obtained from electroless copper plating has been actively carried out, and one of the reasons why it is still active is that this electroless copper plating This is because the application of the mounting technology to circuit formation on printed wiring boards has the potential to produce great effects. That is, the circuit density of printed wiring boards is becoming higher and higher year by year, and the diameter of through holes for conducting circuits on different surfaces is becoming smaller and smaller. Under these circumstances, electroless copper plating is expected to produce less difference in the plating thickness between the flat surface and the inner wall surface of the through-hole compared to electroplating methods. In addition, in the method of electroplating and etching away copper other than the circuit (subtract method), etching creates an undercut (in the thickness direction of the copper).
Although the dimensions of the surface portion are maintained by the etching resist film, etching progresses further near the substrate, resulting in an inverted trapezoidal cross section of the circuit. ), making it difficult to create thin wire circuits. On the other hand, in electroless copper plating (additive method), only the circuit portion is plated, so there is no undercut problem and it is advantageous for thinning the circuit. However, most electroless copper plating to date has been
The physical properties of copper (pyrocopper) obtained from pyrophosphate electroplating, which is generally used to form circuits on printed wiring boards, are inferior to the tensile strength and bending fatigue strength measured by the method described later. Because of this, the reliability of the product is not very high. That is, there is a drawback that circuits are easily broken due to heating caused by soldering after components are mounted on a printed wiring board. The tensile strength of pyro-copper is 50 to 60 Kg/mm 2 , and the bending fatigue strength is 2000 to 3000 times at a thickness of 25 μm. In contrast, the tensile strength of copper obtained from electroless copper plating, which is used on an industrial level, is approximately 30 kg/mm 2 , and the bending fatigue strength is 800 to 1100.
times (25 μm). Wiring boards with high-density wiring circuits also require high connection reliability, so electroless copper plating is rarely used, even though it is advantageous for increasing wiring density for the reasons mentioned above. is the current situation. Therefore, if the physical properties of copper obtained by electroless copper plating are improved and brought closer to those of pyrocopper, for example, a new path will open up. The present invention has been made in view of these points, and includes a silver ion supply source, diol, hydroxycarboxylic acid, Added at least one of dicarboxylic acid, diamine, cyanohydrin, mono- or dialkyl ether of ethylene glycol, aliphatic secondary or tertiary amine having a hydroxy group, O-methyl-ethanolamine, P-dioxane, morpholine, and piperazine. It is characterized by Silver ion sources include metallic silver, silver iodide,
Silver bromide, silver chloride, silver nitrate, silver sulfate, silver cyanide,
At least one type of silver compound such as silver acetate or silver carbonate is used. Silver ions improve the mechanical strength of the plated copper obtained, especially the tensile strength and bending fatigue strength. When metallic silver or silver iodide is used as a silver ion source, an addition amount of 1 mg/m is sufficient, but even if the amount is more than this, the plating solution will not become unstable and decompose. This is metallic silver,
This is because the solubility of silver iodide is extremely low. The solubility in water is 2.8× at 25℃ for metallic silver.
10 -5 g/(2.6 x 10 -7 mol/), in the case of silver iodide, 3.4 x 10 -5 g/(1.4 x 10 -7 mol/) at 20°C.
). On the other hand, other silver compounds (such as silver nitrate) generally have high solubility, so if more than a certain amount is added, the plating solution becomes unstable and easily decomposes. This is because the concentration of silver ions in the plating solution increases. In this case, decomposition can be suppressed to some extent by adding a large amount of stabilizer, but even in that case there is a limit. When using a highly soluble silver ion source,
These compounds have been shown to increase the silver ion concentration in the plating solution, improve the mechanical strength of the plating, that is, improve the tensile strength and bending fatigue strength, and raise the concentration so that the plating solution does not become unstable and decompose. will be supplied in sufficient quantity. Generally, the concentration of silver ions in the plating solution is 10 -10
-10 -3 mol/more preferably 10 -8 -10 -5 mol/. Diols, hydroxycarboxylic acids, dicarboxylic acids, diamines, cyanohydrins, mono- or dialkyl ethers of ethylene glycol, aliphatic secondary or tertiary amines with hydroxy groups, O
-Methyl-ethanolamine, P-diokigane,
Morpholine and piperazine improve the stability of electroless plating solutions. The general formula of each of the above substances is expressed as follows. That is, diols are HO—R 1 —OH, hydroxycarboxylic acids are HO—R 2 —COOH, dicarboxylic acids are HOOC—R 2 —COOH, and diamines are H 2 N—
R 4 -NH 2 , cyanohydrin is HO-R 5 -CN, mono- or dialkyl ether of ethylene glycol is R 6 -O-CH 2 CH 2 -OH or R 7 -O-
CH 2 CH 2 -O-R 8 , an aliphatic secondary or tertiary amine with a hydroxy group is R 10 -NH-R 9 -OH or R 13 R 12 N-R 11 -OH, O-methyl-ethanolamine is H 3 C―O―CH 2 CH 2 ―NH 2 , P-dioxane is
【式】モルホリンは[Formula] Morpholine is
【式】ピペラジンは、[Formula] Piperazine is
【式】である。
ジオールとしては、例えばエチレングリコー
ル、トリメチレングリコール、テトラメチレング
リコール、ペンタメチレングリコール、ヘキサメ
チレングリコール、1,10―デカンジオール、
1,2―プロパンジオール、1,2―ブタンジオ
ール、1,3―ブタンジオール、2,3―ブタン
ジオール、2,5―ヘキサンジオール等が使用さ
れる。ヒドロキシカルボン酸としては、例えばグ
リコール酸、β―ヒドロキシプロピオン酸、3―
ヒドロキシ酪酸等が使用される。ジカルボン酸と
しては、例えば、しゆう酸、マロン酸、こはく
酸、グルタル酸、アジピン酸、メチルこはく酸、
マレイン酸、フマル酸等が使用される。ジアミン
としては例えばエチレンジアミン、1,3―プロ
パンジアミン、1,4―ブタンジアミン、1,5
―ペンタンジアミン、1,6―ヘキサンジアミン
等が使用される。シアンヒドリンとしては、例え
ばエチレンシアンヒドリンがある。エチレングリ
コールのモノあるいはジアルオルエーテルとして
は、例えばエチレングリコールモノメチルエーテ
ル、エチレングリコールモノエチルエーテル、エ
チレングリコールモノ―n―プロピルエーテル、
コチレングリコールモノ―イソプロピルエーテ
ル、エチレングリコールモノ―n―ブチルエーテ
ル、エチレングリコールモノ―イソ―ブチルエー
テル、エチレングリコールモノ―n―ヘキシルエ
ーテル、エチレングリコールモノフエニルエーテ
ルあるいはエチレングリコールジメチルエーテ
ル、エチレングリコールジエチルエーテルが使用
される。ヒドロキシ基をもつ脂肪族第二あるいは
第三アミンとしては、例えばN―メチルエタノー
ルアミン、N―エチルエタノールアミンあるいは
N,N―ジメチルエタノールアミン、N,N―ジ
エチルエタノールアミンが使用される。
ジオール、ヒドロキシカルボン酸、ジカルボン
酸、ジアミン、ジアンヒドリン、エチレングリコ
ールのモノあるいはジアルキルエーテル、ヒドロ
キシ基をもつ脂肪族第二あるいは第三アミン、O
―メチル―エタノールアミン、P―ジオキサン、
モルホリン、ピペラジンの添加量は0.001g/
以上、好ましくは0.01〜10g/、最も好ましく
は0.5〜5g/である。
添加量が0.001g/未満の場合はめつき液の
安定性が低下し、めつき銅の物性、すなわち引張
り強度および耐折疲労強度が低下する。添加量が
多くても悪影響は与えないが、一般に10g/を
超える添加は不必要である。
アミルアルコールを0.001g/、好ましくは
0.01〜10g/最も好ましくは0.5〜5g/更
に添加することも出来る。
本発明においてベースとなる無電解銅めつき液
はとくに特殊な配合のものではない。銅塩、錯化
剤、還元剤およびPH調整剤とからなる一般の無電
解銅めつき液が用いられる。銅塩としては、硫酸
銅、ハロゲン化銅、硝酸銅、酢酸銅等が、錯化剤
としては、エチレンジアミン四酢酸、ロツシエル
塩等が還元剤としてはホルマリン、バラホルムア
ルデヒド等が、PH調整剤としては水酸化ナトリウ
ム等が使用される。代表的な無電解めつき液とし
ては、硫酸銅3〜20g/、エチレンジアミン四
酢酸、銅塩濃度の1.2〜3倍モル濃度量、37%の
ホルマリン水溶液2〜25ml/、PH11.5〜13.0の
ものが好ましい。温度は90℃以下で行うのが良
い。
以上説明したように本発明の無電解銅めつき液
により引張り強度、耐折疲労強度に優れためつき
銅が得られた。
実施例 1〜9
硫酸銅0.04モル/、エチレンジアミン四酢酸
0.05モル/、ホルムアルデヒド0.03モル/、
PH11.8の溶液に次表の添加物を添加して無電解銅
めつき液を作成した。
これらのめつき液に活性化処理したステンレス
板を浸漬して70℃で無電解めつきをおこない、め
つき膜厚25〜35μmの銅箔を得た。めつきの析出
速度、得られた銅箔の引張り強度耐折疲労強度は
次表のとうりである。
尚、引張り強度は10mm×70mmの試験片を用い東
洋測器製のテンシロン形万能試験機を用い、つか
み間隔15mm引張り速度1mm/分で測定した。
又、耐折疲労強度の測定はJIS P8115に準じた
耐折疲労試験器でおこなつた。折り曲げ点の曲率
は半径2mmのものを使用した。この試験器によれ
ば耐折疲労強度が試料破断までの折り曲げ回数で
示される。[Formula]. Examples of diols include ethylene glycol, trimethylene glycol, tetramethylene glycol, pentamethylene glycol, hexamethylene glycol, 1,10-decanediol,
1,2-propanediol, 1,2-butanediol, 1,3-butanediol, 2,3-butanediol, 2,5-hexanediol, etc. are used. Examples of hydroxycarboxylic acids include glycolic acid, β-hydroxypropionic acid, and 3-hydroxycarboxylic acid.
Hydroxybutyric acid and the like are used. Examples of dicarboxylic acids include oxalic acid, malonic acid, succinic acid, glutaric acid, adipic acid, methylsuccinic acid,
Maleic acid, fumaric acid, etc. are used. Examples of the diamine include ethylenediamine, 1,3-propanediamine, 1,4-butanediamine, 1,5
-Pentanediamine, 1,6-hexanediamine, etc. are used. Examples of cyanohydrin include ethylene cyanohydrin. Examples of ethylene glycol mono- or dialol ethers include ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol mono-n-propyl ether,
Cotylene glycol mono-isopropyl ether, ethylene glycol mono-n-butyl ether, ethylene glycol mono-iso-butyl ether, ethylene glycol mono-n-hexyl ether, ethylene glycol monophenyl ether or ethylene glycol dimethyl ether, ethylene glycol diethyl ether are used. Ru. As the aliphatic secondary or tertiary amine having a hydroxy group, for example, N-methylethanolamine, N-ethylethanolamine, N,N-dimethylethanolamine or N,N-diethylethanolamine is used. Diols, hydroxycarboxylic acids, dicarboxylic acids, diamines, dianhydrins, mono- or dialkyl ethers of ethylene glycol, aliphatic secondary or tertiary amines with hydroxy groups, O
-Methyl-ethanolamine, P-dioxane,
The amount of morpholine and piperazine added is 0.001g/
Above, preferably 0.01 to 10 g/, most preferably 0.5 to 5 g/. If the amount added is less than 0.001 g/l, the stability of the plating solution decreases, and the physical properties of the plated copper, ie, tensile strength and bending fatigue strength, decrease. Even if the amount added is large, there will be no adverse effect, but addition of more than 10 g/l is generally unnecessary. 0.001g/amyl alcohol, preferably
It is also possible to further add 0.01-10g/most preferably 0.5-5g/. The electroless copper plating solution that is the base of the present invention is not particularly formulated. A general electroless copper plating solution consisting of a copper salt, a complexing agent, a reducing agent and a PH adjuster is used. Copper salts include copper sulfate, copper halides, copper nitrate, copper acetate, etc. Complexing agents include ethylenediaminetetraacetic acid, Rothsiel's salt, etc. Reducing agents include formalin, paraformaldehyde, etc., and pH adjusters include Sodium hydroxide etc. are used. Typical electroless plating solutions include 3 to 20 g of copper sulfate, ethylenediaminetetraacetic acid, 1.2 to 3 times the molar concentration of the copper salt, 2 to 25 ml of a 37% formalin aqueous solution, and a pH of 11.5 to 13.0. Preferably. It is best to keep the temperature below 90℃. As explained above, by using the electroless copper plating solution of the present invention, a matted copper having excellent tensile strength and bending fatigue strength was obtained. Examples 1 to 9 Copper sulfate 0.04 mol/ethylenediaminetetraacetic acid
0.05 mol/, formaldehyde 0.03 mol/,
An electroless copper plating solution was prepared by adding the additives listed in the table below to a solution with a pH of 11.8. An activated stainless steel plate was immersed in these plating solutions and subjected to electroless plating at 70°C to obtain a copper foil having a plated film thickness of 25 to 35 μm. The plating precipitation rate, tensile strength and bending fatigue strength of the resulting copper foil are as shown in the following table. The tensile strength was measured using a 10 mm x 70 mm test piece using a Tensilon type universal testing machine manufactured by Toyo Sokki at a gripping interval of 15 mm and a tensile speed of 1 mm/min. In addition, the bending fatigue strength was measured using a bending fatigue tester conforming to JIS P8115. The radius of curvature of the bending point was 2 mm. According to this tester, the bending fatigue strength is indicated by the number of times the sample is bent until it breaks.
【表】
比較例 1〜3
硫酸銅0.04モル/、エチレンジアミン四酢酸
0.05モル/、ホルムアルデヒド0.03モル/、
PH11.8の溶液に次表の添加物を添加して無電解銅
めつき液を作成し、実施例同様に特性の測定を行
なつた。[Table] Comparative Examples 1 to 3 Copper sulfate 0.04 mol/, ethylenediaminetetraacetic acid
0.05 mol/, formaldehyde 0.03 mol/,
An electroless copper plating solution was prepared by adding the additives listed in the following table to a solution with a pH of 11.8, and its properties were measured in the same manner as in the examples.
Claims (1)
無電解銅めつき液に、銀イオン供給源と、ジオー
ル、ヒドロキシカルボン酸、ジカルボン酸、ジア
ミン、シアンヒドリン、エチレングリコールのモ
ノあるいはジアルキルエーテル、ヒドロキシ基を
もつ脂肪族第二あるいは第三アミン、O―メチル
―エタノールアミン、P―ジオキサン、モルホリ
ン、ピペラジンの少なくとも1種とを添加した無
電解銅めつき液。 2 銀イオン供給源を無電解めつき液中の銀イオ
ンの濃度が、得られためつき銅の引張り強度およ
び耐折疲労強度の向上が認められかつめつき液が
分解しない濃度となるように添加するとともに、
ジオール、ヒドロキシカルボン酸、ジカルボン
酸、ジアミン、シアンヒドリン、エチレングリコ
ールのモノあるいはジアルキルエーテル、ヒドロ
キシ基をもつ脂肪族第二あるいは第三アミン、O
―メチル―エタノールアミン、P―ジオキサン、
モルホリン、ピペラジンの少なくとも1種を
0.001g/以上添加する特許請求の範囲第1項
記載の無電解銅めつき液。 3 銀イオン供給源が金属銀、ヨウ化銀である特
許請求の範囲第1項又は第2項記載の無電解銅め
つき液。[Scope of Claims] 1. An electroless copper plating solution containing a copper salt, a complexing agent, a reducing agent, and a PH adjuster, a silver ion source, and a diol, hydroxycarboxylic acid, dicarboxylic acid, diamine, cyanohydrin, and ethylene. An electroless copper plating solution containing at least one of glycol mono- or dialkyl ether, aliphatic secondary or tertiary amine having a hydroxyl group, O-methyl-ethanolamine, P-dioxane, morpholine, and piperazine. 2 Add the silver ion source to the electroless plating solution so that the concentration of silver ions is such that the tensile strength and bending fatigue strength of the resulting matted copper are improved and the plating solution does not decompose. At the same time,
Diols, hydroxycarboxylic acids, dicarboxylic acids, diamines, cyanohydrins, mono- or dialkyl ethers of ethylene glycol, aliphatic secondary or tertiary amines with hydroxy groups, O
-Methyl-ethanolamine, P-dioxane,
At least one of morpholine and piperazine
The electroless copper plating solution according to claim 1, in which 0.001 g/or more is added. 3. The electroless copper plating solution according to claim 1 or 2, wherein the silver ion source is metallic silver or silver iodide.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2758382A JPS58144464A (en) | 1982-02-22 | 1982-02-22 | Electroless copper plating liquid |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2758382A JPS58144464A (en) | 1982-02-22 | 1982-02-22 | Electroless copper plating liquid |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58144464A JPS58144464A (en) | 1983-08-27 |
| JPS6227152B2 true JPS6227152B2 (en) | 1987-06-12 |
Family
ID=12224977
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2758382A Granted JPS58144464A (en) | 1982-02-22 | 1982-02-22 | Electroless copper plating liquid |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58144464A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2615682B2 (en) * | 1986-11-14 | 1997-06-04 | 株式会社デンソー | Chemical copper plating solution |
-
1982
- 1982-02-22 JP JP2758382A patent/JPS58144464A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58144464A (en) | 1983-08-27 |
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