JPS6228871B2 - - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ultrasonic flaw detection device that detects defects such as flaws inside an object to be inspected from reflected echoes during ultrasonic flaw detection, and is equipped with a function to self-diagnose abnormalities in circuit functions. The present invention provides an ultrasonic flaw detection device.

Flaw detection using ultrasonic waves is an excellent inspection method that can non-destructively detect internal defects in various products.
Currently, it is widely adopted in various fields and plays an important role in both quality assurance and strength assurance of products. Recently, the development of automatic inspection using the above method has progressed, and ultrasonic flaw detection equipment has been incorporated into the process.
Online ultrasonic flaw detection is also being carried out. However, in general, in ultrasonic flaw detection equipment, if an abnormality occurs in the circuit, it will appear as an abnormality in the flaw detection output, which may cause erroneous judgments.
The reliability of flaw detection is impaired. In particular, in the case of online automatic flaw detection, this has a fatal effect on the inspection results.

The present invention provides an ultrasonic flaw detection device having the configuration described in the claims, so that it can constantly or periodically self-diagnose functional abnormalities in each circuit that makes up the ultrasonic flaw detection device, and when an abnormality occurs, This can be done by outputting an abnormality signal to notify the user, or by automatically stopping the equipment.This is intended to improve reliability and simplify maintenance by preventing erroneous judgments of flaw detection results due to malfunctions. It is ivy.

The invention will be explained below with reference to the drawings.

FIG. 1 shows a block circuit diagram of one embodiment of the ultrasonic flaw detection apparatus according to the present invention, in which 1 is a probe, 2 is a measuring section, and 3 is a cathode ray tube. It constitutes a flaw detection device. The measurement unit 2 includes a pulse voltage generation circuit 4 that applies a transmission voltage to the probe 1, a reception amplification circuit 5 that amplifies reflected echoes from defects F such as scratches on the object W to be inspected to a required level, and A gate generation circuit 6 that temporally discriminates the position of F, a time adjustment circuit 7 that controls the repetition period of the transmission voltage applied to the probe 1, the sweep time of the cathode ray tube 3, etc., and a power supply voltage is supplied to each circuit. It is composed of a voltage generating circuit 8.

The present invention provides check circuits 9 to 1 for checking the respective circuit functions in the probe 1 and each circuit 4 to 8 of the conventionally known ultrasonic flaw detection device described above.
5 is individually provided, and a device that responds to abnormality detection in each of the circuits 9 to 15, for example, in the illustrated embodiment, a comprehensive judgment device that stops the flaw detection device in response to abnormality detection in each of the check circuits 9 to 15. A circuit 16 is added.

As shown in FIG. 2, the pulse check circuit 9 consists of an attenuator 91, a rectifier circuit 92, a comparator 93, and an indicator lamp 94. and comparator 93
By measuring the voltage value at , it is determined whether the pulse voltage generation circuit 4 is functioning normally or not, and when the function is abnormal, a detection signal is output to the comprehensive judgment circuit 16 and at the same time, the indicator lamp 94 is turned on. It is something.

Width check circuit 10, gate check circuit 1
1. Each check circuit of the time check circuit 12 is as follows:
As shown in FIG. 3, a reference voltage generation circuit 101, a comparator 102, and an indicator lamp 103 are provided.
The comparator 102 compares the reference value generated by the reference voltage generation circuit 101 with the test signal output from the reference voltage generation circuit 101 and passed through the respective circuits 5, 6, and 7. It determines whether the function is good or bad, and when the function is abnormal, it outputs a detection signal to the comprehensive judgment circuit 16, and at the same time,
This is to light up the display lamp 103.

As shown in FIG. 4, the power check circuit 13 includes a comparator 131 and indicator lamps 132, 1
33, 134, etc., and determines pass/fail by measuring the output voltage value of the voltage generating circuit 8 with a comparator 131. When a malfunction occurs, a detection signal is output to the comprehensive judgment circuit 16, and at the same time, the corresponding indicator lamps 132 to 134 is turned on.

As shown in FIG. 5, the probe check circuit 14 includes an amplifier 141, a comparator 142, and an indicator lamp 143.
The test piece TP provided with F' is attached and the level of the reflected echo from the artificial defect F' is measured by the comparator 142 to determine the acceptability of the probe 1. In the event of a malfunction, the general judgment circuit At the same time as outputting the detection signal to 16, the display lamp 143 is turned on.

As shown in FIG. 6, the master check circuit 15 consists of a comparator 151 and an indicator lamp 152, and receives the reflected echo from the artificial defect F' of the test piece TP attached to the probe 1, and determines the level of the reflected echo. Based on the status, it is determined whether each circuit is actually functioning normally in the flaw detector as a whole, and when a malfunction occurs, a detection signal is output to the comprehensive determination circuit 16 and at the same time, an indicator lamp 152 is turned on.

Of course, the indicator lamps of each of the check circuits described above may be omitted, and a lamp for indicating an abnormal location may be attached to the comprehensive judgment circuit 16.

In FIG. 1, a check command circuit 17 is a circuit that controls the operation of each of the check circuits 9-15.

The apparatus of the present invention having the above-mentioned configuration is configured such that each check circuit 9 is sent from the check command circuit 17 before or during the flaw detection work for the defect F of the object W to be inspected.
By sending a check command to ~15,
The quality of the circuit functions of each of the component circuits 4 to 8 of the probe 1 and the measuring section 2 is individually determined. When an abnormality occurs, the comprehensive judgment circuit 16 stops the operation of the device, and at the same time, a check circuit attached to the circuit where the abnormality has occurred lights up a lamp to indicate the abnormality, making it easy to confirm the abnormality. In addition, in the case of the check by the probe check circuit 14 and the master check circuit 15, as shown in FIGS. 5 and 6, a test piece having a predetermined artificial defect F' is
This is done by attaching the TP to the probe 1.

As explained above, according to the present invention, the functionality of each circuit constituting the ultrasonic flaw detection device is individually self-diagnosed, and if an abnormality occurs, an abnormality signal is output to notify the device. By automatically stopping the detection of defects (flaws) in ultrasonic flaw detection, the reliability of ultrasonic flaw detection can be improved. It has the remarkable effect of easy maintenance and management.

Furthermore, according to the present invention, it is possible to detect abnormalities in the functions of each circuit constituting the measuring section using only electrical means, so by appropriately selecting the check timing of each check circuit, Even during the flaw detection operation, it is possible to check for abnormalities in the functions of each component circuit in real time through the gaps, which is very effective in further promoting online use of ultrasonic flaw detection equipment.

[Brief explanation of the drawing]

FIG. 1 is a block circuit diagram showing one embodiment of the ultrasonic flaw detection device according to the present invention, FIG. 2 is a block circuit diagram showing an example of a pulse check circuit 9, and FIG. 3 is a block circuit diagram showing an example of the pulse check circuit 9. Check circuit 1
1. A block circuit diagram showing an example of the time check circuit 12, FIG. 4 a block circuit diagram showing an example of the power supply check circuit 13, and FIG. 5 a block circuit diagram showing an example of the contact check circuit 14. FIG. 6 is a block circuit diagram showing one example of a master check circuit. DESCRIPTION OF SYMBOLS 1...Probe, 2...Measurement part, 3...Cathode ray tube, 4-8...Each circuit which constitutes measurement part 2, 9-
15...Each check circuit, 16...Comprehensive judgment circuit.

Claims (1)

[Claims] 1. A pulse voltage generation circuit that supplies pulse voltage for flaw detection to the probe, a reception amplification circuit that amplifies the reflected echoes received by the probe, and a gate generator that temporally discriminates the defect location from the reflected echoes. a time adjustment circuit that controls the repetition period of the pulse voltage supplied to the probe, the sweep time of the display means, etc.;
In an ultrasonic flaw detection device equipped with a display means such as a cathode ray tube that displays reflected echoes on a time axis, and a voltage generation circuit that supplies power supply voltage to each of the above circuits,
A pulse check circuit detects a malfunction in the circuit from the value of the pulse voltage output by the pulse voltage generation circuit, and a reference voltage signal is input to the reception amplification circuit, and the circuit detects a malfunction in the circuit from the value of the output voltage. a gate check circuit that inputs a reference voltage signal to the gate generation circuit and detects a malfunction of the circuit from the value of the output voltage; and a reference voltage signal that inputs the reference voltage signal to the time adjustment circuit. and a time check circuit for detecting a malfunction in the circuit from the value of the output voltage, and a power supply check circuit for detecting a malfunction in the circuit from the value of the power supply voltage output from the voltage generating circuit. An ultrasonic flaw detection device with a distinctive self-diagnosis function.