JPS6229014B2 - - Google Patents
Info
- Publication number
- JPS6229014B2 JPS6229014B2 JP10021880A JP10021880A JPS6229014B2 JP S6229014 B2 JPS6229014 B2 JP S6229014B2 JP 10021880 A JP10021880 A JP 10021880A JP 10021880 A JP10021880 A JP 10021880A JP S6229014 B2 JPS6229014 B2 JP S6229014B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- particle
- comparison
- particles
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06M—COUNTING MECHANISMS; COUNTING OF OBJECTS NOT OTHERWISE PROVIDED FOR
- G06M11/00—Counting of objects distributed at random, e.g. on a surface
- G06M11/02—Counting of objects distributed at random, e.g. on a surface using an electron beam scanning a surface line by line, e.g. of blood cells on a substrate
- G06M11/04—Counting of objects distributed at random, e.g. on a surface using an electron beam scanning a surface line by line, e.g. of blood cells on a substrate with provision for distinguishing between different sizes of objects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Measurement Of Current Or Voltage (AREA)
Description
【発明の詳細な説明】
本発明は、液体中に浮懸する血球などの粒子を
電気的または光学的に検出し、その検出パルスの
大きさから粒度を測定する粒子分析装置に関する
もので、低コストでかつ精密な粒度分布測定を行
なうことができる粒子分析装置を提供するもので
ある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a particle analyzer that electrically or optically detects particles such as blood cells suspended in a liquid and measures the particle size from the magnitude of the detection pulse. An object of the present invention is to provide a particle analyzer that can perform accurate particle size distribution measurements at low cost.
従来、液体中に浮懸する血球などの粒子のサイ
ズ分布、すなわち粒度分布を測定するには、まず
粒子を電気的または光学的に検出し、その検出パ
ルスが粒子の大きさに比例することから、粒子信
号の高さを求め、数千〜数万個の粒子についての
高さの分布を求めることによつて行なつている。
その方法としては、
(1) 粒子信号を直接AD変換する方法。 Conventionally, to measure the size distribution, or particle size distribution, of particles such as blood cells suspended in a liquid, the particles are first detected electrically or optically, and the detection pulse is proportional to the particle size. This is done by determining the height of the particle signal and determining the height distribution for thousands to tens of thousands of particles.
The methods are: (1) Direct AD conversion of particle signals.
(2) 50〜100個程度の閾値回路を設け、それぞれ
の閾値回路に計数回路を従属させる方法。(2) A method in which approximately 50 to 100 threshold circuits are provided and a counting circuit is subordinated to each threshold circuit.
(3) 1個の閾値回路の閾値電圧をステツプ状に変
化させ、あたかも閾値回路を50〜100個並べた
かのように動作させる方法。(3) A method in which the threshold voltage of one threshold circuit is changed in steps, so that it operates as if 50 to 100 threshold circuits were lined up.
などがあるが、(1)の方法は、粒子信号は常に一定
の間隔で生ずるとは限らず、一般にポアソン分布
を示し、数マイクロ秒の非常に速いスピードの
AD変換回路が必要であり、さらに変換後のデイ
ジタル値の記憶処理も同じく高速であることが必
要であり、粒子信号の平均パルス間隔が数百マイ
クロ秒のオーダであることを考慮すれば、不経済
である。(2)の方法は、十分に応答できる方法であ
るが、結果として、数百個の粒子計数装置を閾値
電圧を違えて並べたことに相当し、精密な測定法
であるが回路が大規模、複数となり必ずしも低コ
ストではない。(3)の方法は非常に低コストではあ
るが、反面サイズの異なる粒子が液体中に均一に
分散しているとは限らず、沈降などの現象により
測定の前半と後半で条件が異なつていたり、ある
いは検出部につまりが生じたりするなどのトラブ
ルにより、正確な測定が行なえるとは限らない。However, in method (1), particle signals do not always occur at regular intervals, generally exhibit a Poisson distribution, and are extremely fast, lasting several microseconds.
An AD conversion circuit is required, and the storage processing of digital values after conversion also needs to be fast. Considering that the average pulse interval of a particle signal is on the order of several hundred microseconds, this is a problem. It's the economy. Method (2) provides a sufficient response, but as a result, it is equivalent to arranging hundreds of particle counters with different threshold voltages, and although it is a precise measurement method, the circuit is large. , and are not necessarily low cost. Method (3) is very low cost, but on the other hand, particles of different sizes are not always uniformly dispersed in the liquid, and the conditions may differ between the first and second half of the measurement due to phenomena such as sedimentation. Accurate measurements may not always be possible due to problems such as blockage or clogging of the detection section.
本発明は上記の諸点に鑑みなされたもので、回
路構成が比較的簡単でありながら、より緻密な測
定結果を得ることができるような粒子分析装置の
提供を目的とするものである。 The present invention has been made in view of the above points, and an object of the present invention is to provide a particle analyzer that can obtain more accurate measurement results while having a relatively simple circuit configuration.
以下、本発明の構成を図面に基づいて説明す
る。第1図は本発明の粒子分析装置の一実施例を
示す系統的説明図である。本発明の粒子分析装置
は、粒子と粒子浮懸液との電気的差異または光学
的差異に基づいて粒子を検出し粒子の大きさに比
例した信号を発生する粒子検出装置1と、この粒
子検出装置1に並列に接続された数個〜数十個の
所定数の比較回路2と、各比較回路2を通過する
粒子信号を計数する計数回路3と、各計数回路3
に接続され1ステツプの計数が終了すると同時に
転送される計数値を次のステツプの測定が終了す
るまで保持する一時記憶回路4と、この一時記憶
回路4に接続され計数回路3の計数値を比較電圧
に対応する所定のメモリに記憶させる演算回路5
と、比較回路2に接続され各比較回路2の比較電
圧を全電圧に均等に分散させステツプを有する階
段状の電圧波形を発生する基準電圧発生回路6
と、この基準電圧発生回路6に接続され各ステツ
プの立上りにおいてタイミング信号を発生するタ
イミング信号発生回路7と、演算回路5に接続さ
れ演算順序などが記憶された読出専用メモリ8、
読出書込メモリ9、入力装置10、メモリの計数
値を前記演算回路5で読み出して表示および/ま
たは記録する出力装置11とからなつている。1
2は表示装置、13は記録装置である。 Hereinafter, the configuration of the present invention will be explained based on the drawings. FIG. 1 is a systematic explanatory diagram showing one embodiment of the particle analyzer of the present invention. The particle analyzer of the present invention includes a particle detection device 1 that detects particles based on electrical or optical differences between the particles and a particle suspension liquid and generates a signal proportional to the size of the particles; A predetermined number of comparison circuits 2 from several to several dozen connected in parallel to the device 1, a counting circuit 3 that counts particle signals passing through each comparison circuit 2, and each counting circuit 3.
A temporary storage circuit 4 is connected to the temporary storage circuit 4, which holds the count value transferred at the same time as the counting of one step is completed until the measurement of the next step is completed, and the count value of the counting circuit 3 connected to this temporary storage circuit 4 is compared. Arithmetic circuit 5 that stores voltage in a predetermined memory corresponding to the voltage.
and a reference voltage generating circuit 6 connected to the comparator circuit 2 and generating a stepped voltage waveform having steps by evenly distributing the comparison voltage of each comparator circuit 2 over the entire voltage.
, a timing signal generation circuit 7 connected to the reference voltage generation circuit 6 and generating a timing signal at the rising edge of each step, a read-only memory 8 connected to the arithmetic circuit 5 and storing the operation order, etc.
It consists of a read/write memory 9, an input device 10, and an output device 11 for reading out the count value of the memory by the arithmetic circuit 5 and displaying and/or recording it. 1
2 is a display device, and 13 is a recording device.
粒子検出装置1としては、通常、粒子の浮懸液
を狭あいに形成された通路(微細孔)に通過さ
せ、粒子と液との電気インピーダンスの差異に基
づいて粒子を検出し、粒子の大きさに比例した信
号を発生させる装置が用いられる。この粒子検出
装置1の出力パルスは一例として4〜9個などの
所定の数の比較回路2に同時に送られる。比較回
路2には所定の比較電圧が与えられ、この比較電
圧よりも大きい入力信号(粒子パルス)が入力し
たときオンとなつてパルスを出力する。比較電圧
を発生する基準電圧発生回路6は、50〜100など
の所定の数のステツプを有する階段状の電圧波形
を発生する。この階段状の波形は1ステツプごと
に単調に増加するか、減少するか、または増加減
少を繰り返すかのいずれでも良いが、各比較回路
2が均等にばらまかれた比較電圧を有するように
する。たとえば第2図に示すように(この場合は
99ステツプで終る比較電圧であり9個の比較回路
を並列に並べた例である)、各比較回路2への比
較電圧は10ステツプ分づつはなれた電圧差を有
し、同時にスタートし同時に1ステツプの測定を
終える。したがつて各比較回路2は比較的広い範
囲にわたつて均一に分散されているために、10ス
テツプ間の変動は多少生ずるがほぼ平均化された
スキヤンニングを行なうことができる。3は各比
較回路2に従属接続された計数回路で、1ステツ
プの計数が終了すると同時に次の一時記憶回路4
に計数値が転送され、次のステツプの測定が終了
するまで計数値を保持する。基準電圧発生回路6
からタイミング信号発生回路7を通じ、各ステツ
プの立上りにおいてタイミング信号が発せられ、
計数回路3の計数開始および計数終了、一時記憶
回路4の計数値の入換えが行なわれ、演算回路5
での演算開始が指定される。演算回路5は、読出
専用メモリ8に予め記憶された演算順序に従つて
タイミング信号発生回路7のタイミング信号に応
じ、始めに読出書込メモリ9の0、10、20、30、
……90番地に各一時記憶回路4の計数値を記憶さ
せていく。次のステツプでは1、11、21、31、…
…91番地に計数値が記憶される。以上のようにし
て99番地の次は0番地に戻り、再び上昇してい
く。始めの10ステツプ分の測定で、すべての番地
に計数値が埋まるので、次からは一時記憶回路4
の計数値を読み取り、一方読出書込メモリ9に記
憶されている数値を呼び出し、加算を行ない再び
同番地に数値を記憶させる。 The particle detection device 1 normally detects particles based on the difference in electrical impedance between the particles and the liquid by passing a suspended liquid through narrow passages (micropores), and detects the particles by detecting the size of the particles. A device is used that generates a signal proportional to The output pulses of this particle detection device 1 are simultaneously sent to a predetermined number of comparison circuits 2, such as 4 to 9, for example. A predetermined comparison voltage is applied to the comparison circuit 2, and when an input signal (particle pulse) larger than this comparison voltage is input, the comparison circuit 2 is turned on and outputs a pulse. A reference voltage generation circuit 6 that generates a comparison voltage generates a stepped voltage waveform having a predetermined number of steps, such as 50 to 100. This step-like waveform may monotonically increase, decrease, or repeat increases and decreases for each step, but it is ensured that each comparator circuit 2 has an evenly distributed comparison voltage. For example, as shown in Figure 2 (in this case
The comparison voltage ends in 99 steps (this is an example of 9 comparison circuits arranged in parallel), the comparison voltages to each comparison circuit 2 have a voltage difference separated by 10 steps, and start at the same time and complete 1 step at the same time. Finish the measurement. Therefore, since each comparator circuit 2 is uniformly distributed over a relatively wide range, it is possible to perform scanning that is approximately averaged, although some variation occurs between 10 steps. 3 is a counting circuit connected to each comparator circuit 2, and as soon as one step of counting is completed, the next temporary storage circuit 4 is connected.
The count value is transferred to and held until the next step measurement is completed. Reference voltage generation circuit 6
A timing signal is generated at the rising edge of each step through the timing signal generation circuit 7.
The counting circuit 3 starts and ends counting, the count value of the temporary memory circuit 4 is replaced, and the arithmetic circuit 5
The start of the calculation is specified. The arithmetic circuit 5 first reads 0, 10, 20, 30,
...The count values of each temporary memory circuit 4 are stored at address 90. The next steps are 1, 11, 21, 31,...
...The count value is stored at address 91. As described above, after address 99, the number returns to address 0 and rises again. By measuring the first 10 steps, all addresses are filled with count values, so from now on, temporary memory circuit 4 is used.
The counted value is read, and on the other hand, the numerical value stored in the read/write memory 9 is called, addition is performed, and the numerical value is stored again at the same address.
以上のように、各比較回路2の列だけに注目す
ると、0〜99ステツプについて各ステツプでの計
数値を見ているだけであるが、実際には9個の比
較回路2で平均して計数値を見るために、平均化
された緻密なデータが得られる。したがつて試料
の不均一な分散や、あるいは粒子の沈降などの現
象やつまりなどが生じても、各比較回路に同時に
生ずるために、1個の比較回路でスキヤンした場
合と比較して格段の信頼性が生ずる。また各ステ
ツプにおける測定値も1個でスキヤンした場合と
比較し、比較回路の従属列の列の数だけ時間を延
長して測定したことになり、各ステツプにおける
粒子数がその分だけ増加し、多くの粒子について
の平均のデータを見ることができる。ステツプの
数、測定時間、比較回路の列の最適条件の選定と
して、演算回路などを構成する近年多様化したマ
イクロコンピユータ技術を考慮する必要がある。
通常の素子では、前記演算の所要時間は数十〜数
百マイクロ秒のオーダであり、高速になれば非常
なコストアツプとなる。数十マイクロ秒は、粒子
の検出パルス列が数マイクロ〜数百マイクロ秒の
オーダであることからして直接のパルスの分析を
するには適していない。しかし本発明のように、
定められた時間間隔で演算を行なう方法には適し
ている。しかも各タイミングパルスで読出書込を
した後に、他の演算、たとえば表示装置に除々に
増加する各番地の粒子数の表示を行なわせてモニ
タすることなどができる。本実施例においては、
測定時間を5秒とした場合100ステツプで9列で
あるから、1ステツプの所要時間は50ミリ秒であ
り、1列当り5.6ミリ秒の時間があり、マイクロ
コンピユータなどにより演算処理を行なつたとし
ても十分の余裕がある。出力をグラフ化して表示
および/または記録する場合に、見易さあるいは
微妙な曲線の変化あるいは変曲点などを明確に表
示および/または記録する必要があり、この意味
から通常、ステツプ数は少なくとも50あるいは
100程度は必要である。ステツプ数を10程度に少
なくし過ぎると、グラフの傾向はつかめても変曲
点などは隠れてしまい望ましくない。一方、比較
回路から一時記憶回路までの列の数を何列にする
かは問題であり、あまり大きくするとステツプ化
させスキヤンニングする意味がなくなる。せいぜ
い2、3〜10の範囲であると考えられる。比較電
圧のスキヤンニング方式の本実施例以外の方法と
して、各比較回路に分割したステツプの各部を受
け持たせ、第1の比較回路は0〜9、第2の比較
回路は10〜19、……第9の比較回路は90〜99と
し、各々が所定の回数だけ繰り返す方法があり、
前述の回路構成よりはより簡単になる。ただし列
の数が3とか7とかの場合には、端数が生ずるた
め均等にカバーできる数としなければならない。
この場合、精度は繰返しの回数によつて定まる。 As mentioned above, if we focus only on the column of each comparison circuit 2, we are only looking at the count value at each step for steps 0 to 99, but in reality, we are looking at the average count value of 9 comparison circuits 2. In order to see the numbers, you can get detailed, averaged data. Therefore, even if phenomena such as non-uniform dispersion of the sample or sedimentation of particles or clogging occur, they will occur in each comparison circuit at the same time, making it much easier to scan than in the case of scanning with a single comparison circuit. Credibility arises. In addition, the measured value at each step is compared to the case where one particle is scanned, and the measurement time is extended by the number of dependent columns of the comparator circuit, and the number of particles at each step increases by that amount. You can see average data for many particles. When selecting the optimal conditions for the number of steps, measurement time, and array of comparison circuits, it is necessary to consider the recently diversified microcomputer technology that configures arithmetic circuits and the like.
In a normal device, the time required for the above calculation is on the order of tens to hundreds of microseconds, and if the speed is increased, the cost will increase significantly. Several tens of microseconds is not suitable for direct pulse analysis because particle detection pulse trains are on the order of several to hundreds of microseconds. However, like the present invention,
This is suitable for methods that perform calculations at fixed time intervals. Furthermore, after reading and writing with each timing pulse, other calculations can be performed, for example, the number of particles at each address that gradually increases can be displayed on a display device for monitoring. In this example,
If the measurement time is 5 seconds, there are 100 steps and 9 columns, so the time required for one step is 50 milliseconds, and there is a time of 5.6 milliseconds per column. However, there is plenty of room. When displaying and/or recording output graphically, it is necessary to clearly display and/or record subtle curve changes or inflection points, and for this reason the number of steps is usually at least 50 or
About 100 is necessary. If the number of steps is too small, to about 10, the trend in the graph may be grasped, but inflection points will be hidden, which is not desirable. On the other hand, the number of columns from the comparator circuit to the temporary storage circuit is a problem; if the number is too large, there will be no point in scanning in steps. It is thought to be in the range of 2-3 to 10 at most. As a comparison voltage scanning method other than this embodiment, each comparison circuit is in charge of each part of the divided steps, and the first comparison circuit is in charge of 0 to 9, the second comparison circuit is in charge of 10 to 19, and so on. ...There is a method in which the ninth comparison circuit is set to 90 to 99 and each repeats a predetermined number of times,
This is simpler than the circuit configuration described above. However, if the number of columns is 3 or 7, fractions will occur, so the number must be chosen so that they can be evenly covered.
In this case, accuracy is determined by the number of repetitions.
以上のようにして、読出書込メモリ9の各番地
に各ステツプの計数値が記憶され、出力装置11
の表示装置12および/または記録装置13で表
示および/または記録される。第3図は読出書込
メモリ9に記憶された計数値を直接表示した例で
あり、第4図は隣り合つた番地の計数値の差をパ
ーセント表示した例であり、前者は一般に累積粒
度分布曲線として知られており、後者は通常の粒
度分布曲線として知られている。なお入力装置1
0には、測定のための諸条件が入力され、たとえ
ば測定の所要時間の変更、出力時に同時に検体番
号を表示させるとかの指令、または累積粒度分布
曲線の形で出力させるかもしくは通常の粒度分布
曲線の形で出力させるかの指令などを入力させ
る。 As described above, the count value of each step is stored in each address of the read/write memory 9, and the output device 11
is displayed and/or recorded on the display device 12 and/or recording device 13. Fig. 3 is an example in which the count values stored in the read/write memory 9 are directly displayed, and Fig. 4 is an example in which the difference between the count values at adjacent addresses is displayed as a percentage. The latter is known as the normal particle size distribution curve. Note that input device 1
In 0, various conditions for measurement are input, such as changing the time required for measurement, displaying the sample number at the same time as output, or outputting in the form of a cumulative particle size distribution curve or a normal particle size distribution. Input commands such as whether to output in the form of a curve.
以上説明したように、本発明の粒子分析装置
は、数個から数十個までの所定の個数の比較回路
の比較電圧を全測定範囲のレベル電圧に均等に分
散させ、ステツプ状にスキヤンすることにより、
低コストでかつ構成が簡単でしかも精度の高い粒
度分布測定を行なうことができるという効果を有
している。 As explained above, the particle analyzer of the present invention is capable of uniformly distributing the comparison voltages of a predetermined number of comparison circuits, from several to several dozen, to level voltages over the entire measurement range, and scanning in steps. According to
It has the advantage that it is low cost, has a simple configuration, and can perform highly accurate particle size distribution measurements.
第1図は本発明の粒子分析装置の一実施例を示
す系統的説明図、第2図は基準電圧発生回路が発
生する電圧波形図、第3図は本発明の粒子分析装
置により得た累積粒度分布の一例を示す曲線図、
第4図は粒度分布の一例を示す曲線図である。
1……粒子検出装置、2……比較回路、3……
計数回路、4……一時記憶回路、5……演算回
路、6……基準電圧発生回路、7……タイミング
信号発生回路、8……読出専用メモリ、9……読
出書込メモリ、10……入力装置、11……出力
装置、12……表示装置、13……記録装置。
Fig. 1 is a systematic explanatory diagram showing one embodiment of the particle analyzer of the present invention, Fig. 2 is a voltage waveform diagram generated by the reference voltage generation circuit, and Fig. 3 is the cumulative amount obtained by the particle analyzer of the present invention. A curve diagram showing an example of particle size distribution,
FIG. 4 is a curve diagram showing an example of particle size distribution. 1... Particle detection device, 2... Comparison circuit, 3...
Counting circuit, 4...Temporary storage circuit, 5...Arithmetic circuit, 6...Reference voltage generation circuit, 7...Timing signal generation circuit, 8...Read-only memory, 9...Read/write memory, 10... Input device, 11... Output device, 12... Display device, 13... Recording device.
Claims (1)
的差異に基づいて粒子を検出し粒子の大きさに比
例した信号を発生する粒子検出装置と、この粒子
検出装置に並列に接続された数個〜数十個の所定
数の比較回路と、各比較回路を通過する粒子信号
を計数する計数回路と、各計数回路に接続され1
ステツプの計数が終了すると同時に転送される計
数値を次のステツプの測定が終了するまで保持す
る一時記憶回路と、この一時記憶回路に接続され
計数回路の計数値を比較電圧に対応する所定のメ
モリに記憶させる演算回路と、比較回路に接続さ
れ各比較回路の比較電圧を全電圧に均等に分散さ
せステツプを有する階段状の電圧波形を発生する
基準電圧発生回路と、この基準電圧発生回路に接
続され各ステツプの立上りにおいてタイミング信
号を発生するタイミング信号発生回路と、演算回
路に接続され演算順序などが記憶された読出専用
メモリ、読出書込メモリ、入力装置、メモリの計
数値を前記演算回路で読み出して表示および/ま
たは記録する出力装置とからなることを特徴とす
る粒子分析装置。1. A particle detection device that detects particles based on the electrical or optical difference between the particles and the particle suspension liquid and generates a signal proportional to the size of the particles, and the number of particles connected in parallel to this particle detection device. A predetermined number of comparison circuits ranging from 1 to several dozen, a counting circuit that counts particle signals passing through each comparison circuit, and 1 particle connected to each counting circuit.
A temporary memory circuit that holds the counted value transferred at the same time as the counting of a step is completed until the measurement of the next step is completed, and a predetermined memory connected to this temporary memory circuit that compares the counted value of the counting circuit and corresponds to the voltage. an arithmetic circuit that is stored in the comparator circuit, a reference voltage generation circuit that is connected to the comparison circuit and generates a stepped voltage waveform having steps by evenly distributing the comparison voltage of each comparison circuit over the total voltage, and a reference voltage generation circuit that is connected to the reference voltage generation circuit. A timing signal generation circuit that generates a timing signal at the rising edge of each step, a read-only memory connected to the arithmetic circuit and storing the order of operations, a read/write memory, an input device, and the count values of the memory are processed by the arithmetic circuit. 1. A particle analysis device comprising: an output device for reading, displaying and/or recording.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10021880A JPS5724842A (en) | 1980-07-22 | 1980-07-22 | Particle analyzing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10021880A JPS5724842A (en) | 1980-07-22 | 1980-07-22 | Particle analyzing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5724842A JPS5724842A (en) | 1982-02-09 |
| JPS6229014B2 true JPS6229014B2 (en) | 1987-06-24 |
Family
ID=14268154
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10021880A Granted JPS5724842A (en) | 1980-07-22 | 1980-07-22 | Particle analyzing device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5724842A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS604805A (en) * | 1983-06-23 | 1985-01-11 | Sunstar Giken Kk | Thickness measuring device |
| JP5693973B2 (en) * | 2008-03-03 | 2015-04-01 | コーニンクレッカ フィリップス エヌ ヴェ | High resolution classification |
-
1980
- 1980-07-22 JP JP10021880A patent/JPS5724842A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5724842A (en) | 1982-02-09 |
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