JPS6229396B2 - - Google Patents
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- Publication number
- JPS6229396B2 JPS6229396B2 JP54136771A JP13677179A JPS6229396B2 JP S6229396 B2 JPS6229396 B2 JP S6229396B2 JP 54136771 A JP54136771 A JP 54136771A JP 13677179 A JP13677179 A JP 13677179A JP S6229396 B2 JPS6229396 B2 JP S6229396B2
- Authority
- JP
- Japan
- Prior art keywords
- growth
- growth chamber
- solution
- container
- semiconductor substrates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
本発明は、一度に多数の半導体基板に均一で高
品質なエピタキシヤル成長層を得ることのできる
液相エピタキシヤル成長装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a liquid phase epitaxial growth apparatus that can produce uniform, high-quality epitaxial growth layers on a large number of semiconductor substrates at once.
一般に液相エピタキシヤル成長装置は縦型と横
型があり、縦型は第1図に示すように不純物を含
んだ溶液112に半導体基板109,109…を
保持した基板保持具110を浸漬させるもので、
多数の半導体基板109,109…を同時に処理
するには図の如く半導体基板109,109…を
略水平に支持するのが一般である。一方横型の場
合は、第2図に示すように半導体基板109,1
09…が保持装着された容器101に溶液112
を移すものであるが、この時半導体基板109,
109…をスライド板(図示せず)等に置くと多
数枚を同時に処理できないので、半導体基板10
9,109…は縦に支持するのが一般である。 In general, there are two types of liquid phase epitaxial growth apparatuses: vertical and horizontal types. The vertical type, as shown in FIG. ,
In order to process a large number of semiconductor substrates 109, 109, . . . at the same time, it is common to support the semiconductor substrates 109, 109, . . . substantially horizontally as shown in the figure. On the other hand, in the case of a horizontal type, as shown in FIG.
A solution 112 is placed in a container 101 in which 09... is held and attached.
At this time, the semiconductor substrate 109,
If the semiconductor substrates 109... are placed on a slide plate (not shown), etc., it will not be possible to process a large number of them at the same time.
9, 109... are generally supported vertically.
いずれの場合もこれらの装置を反応管(縦型、
横型の呼称は反応管の設置形式に基づく)の中に
設置し、炉又は高周波加熱器等で溶液112,1
12等を加熱あるいは徐冷して液相エピタキシヤ
ル成長を行なうものである。この時溶液112,
112はいずれも液層が厚いために600度乃至
1300度に加熱すると、1乃至7度の温度勾配と
1.2乃至3.4倍の不純物濃度のばらつきが、いずれ
も深さ方向に生じる。このためエピタキシヤル成
長層の成長厚さやその不純物濃度に差を生じる。
第1図の縦型の装置では、半導体基板の一枚一枚
における成長ムラは少ないが、深層に位置する半
導体基板と、浅層に位置するものでは、極端な相
違が生じ、半導体基板109,109…が発光ダ
イオードの場合、発光効率が±90%程異なる。 In either case, these devices are connected to a reaction tube (vertical type,
The horizontal type name is based on the installation type of the reaction tube), and the solution 112,1 is heated in a furnace or high-frequency heater, etc.
Liquid phase epitaxial growth is performed by heating or slowly cooling a material such as No. 12. At this time, the solution 112,
112 has a thick liquid layer, so the temperature is 600 degrees or more.
When heated to 1300 degrees, there is a temperature gradient of 1 to 7 degrees.
A variation in impurity concentration of 1.2 to 3.4 times occurs in the depth direction in both cases. This causes differences in the growth thickness of the epitaxial growth layer and its impurity concentration.
In the vertical device shown in FIG. 1, there is little unevenness in the growth of each semiconductor substrate, but there is an extreme difference between semiconductor substrates located in deep layers and those located in shallow layers. When 109... is a light emitting diode, the luminous efficiency differs by about ±90%.
第2図の横型の場合は溶液112の上下方向の
対流がわずかながらあるため縦型のものより多少
は良いが、一枚の半導体基板の成長厚さは直径
5.0cmの半導体基板を例にとると、下方で40μm
の成長をしたとき上方は100μmにも達する。 The horizontal type shown in Figure 2 is slightly better than the vertical type because there is a slight convection of the solution 112 in the vertical direction, but the growth thickness of one semiconductor substrate is
Taking a 5.0cm semiconductor substrate as an example, the lower part is 40μm.
When it grows, the upper part reaches 100 μm.
又この時の発光効率は±50%程異なる。さらに
これらの半導体基板はいずれの場合も、エピタキ
シヤル成長のすすんだ所は不純物濃度が高く表面
も荒れており、逆に成長の遅れた所は不純物濃度
は低く表面は鏡面のようになつており、どちらも
結晶品質は低い。 Also, the luminous efficiency at this time differs by about ±50%. Furthermore, in each of these semiconductor substrates, areas where epitaxial growth has progressed have a high impurity concentration and a rough surface, while areas where growth has been delayed have a low impurity concentration and a mirror-like surface. , both have low crystal quality.
本発明はこのような欠点をあらためるためにな
されたもので、一度に多数の半導体基板に、均一
で高品質なエピタキシヤル成長が行なえるもの
で、以下本案を詳細に説明する。 The present invention has been devised to overcome these drawbacks, and enables uniform, high-quality epitaxial growth to be performed on a large number of semiconductor substrates at once.The present invention will be described in detail below.
第3図は本発明一実施例のエピタキシヤル成長
装置の断面図で、反応炉及びその外側に付属する
装置は省略してある。1はカーボン、石英等から
なる回転可能な容器で、反応炉の外から操作でき
る回転軸2を有しており、容器内部は溶液溜3と
成長室4とに区画分離されている。5は摺動可能
なしきり板で、透孔6を有しており、透孔6が溶
液溜3の隔壁7に設けられた注液口8と一致する
よう位置すれば溶液溜3と成長室4とが連通さ
れ、図の如く透孔6と注液口8とが一致しない状
態でしきり板5が挿入されていると溶液溜3も成
長室4も共に密室となる。成長室4には半導体基
板9,9…を多数枚、略垂直に保持する基板保持
具10が設置してある。基板保持具10はカーボ
ン又は石英からなる支持板11,11…を多数連
結したもので、半導体基板9,9…を接着剤又は
それを同等の働きをするもので貼りつけたり、あ
るいは支持板11,11…に爪等を設けて半導体
基板9,9…を係止したりして保持している。 FIG. 3 is a cross-sectional view of an epitaxial growth apparatus according to an embodiment of the present invention, with the reactor and equipment attached outside the reactor being omitted. Reference numeral 1 denotes a rotatable container made of carbon, quartz, etc., which has a rotating shaft 2 that can be operated from outside the reactor, and the inside of the container is divided into a solution reservoir 3 and a growth chamber 4. Reference numeral 5 denotes a slidable partition plate, which has a through hole 6. If the through hole 6 is positioned to match the liquid injection port 8 provided in the partition wall 7 of the solution reservoir 3, the solution reservoir 3 and the growth chamber are connected. 4, and if the partition plate 5 is inserted with the through hole 6 and the liquid injection port 8 not aligned as shown in the figure, both the solution reservoir 3 and the growth chamber 4 become closed chambers. A substrate holder 10 is installed in the growth chamber 4 to hold a large number of semiconductor substrates 9, 9, . . . substantially vertically. The substrate holder 10 is made by connecting a number of support plates 11, 11, etc. made of carbon or quartz, and the semiconductor substrates 9, 9, etc. are pasted with an adhesive or a material that has an equivalent function, or the support plates 11, 11 are provided with claws or the like to lock and hold the semiconductor substrates 9, 9....
半導体基板9,9…としてガリウム燐(GaP)
n型基板とし、p型エピタキシヤル層を成長させ
る場合を例にとつて、本案の装置を用いた工程を
説明する。 Gallium phosphide (GaP) is used as the semiconductor substrate 9, 9...
The process using the apparatus of the present invention will be described by taking as an example the case where an n-type substrate is used and a p-type epitaxial layer is grown.
溶液溜3にはガリウム(Ga)と燐化ガリウム
(GaP)からなる溶媒に不純物でである亜鉛
(Zn)と酸化ガリウム(Ga2O3)を溶かした溶液1
2を封入してある装置全体を反応炉の中に設置
し、約1050℃に昇温する。しきり板5に係合した
フツク13を操作し、第4図に示す如くしきり板
5の透孔6と注液口8とを一致させるようにしき
り板5を摺動させる。これによつて溶液溜3の溶
液12は成長室4に移動し、溶液は半導体基板
9,9…と接触する。その後フツク13を操作し
てしきり板5をもとのように位置させ、1分間に
3℃の割合で冷却する。冷却中は5分に半回転の
割合で回転軸2を操作した。これにより容器1は
第5図の状態や第6図のように上下逆になつた状
態となり溶液12の温度分布は均一化され、不純
物濃度は一様になる。特に偏析しやすい不純物
は、この例では亜鉛であり、容器12の上方にお
いて析出しやすいが、この回転によつて析出位置
が変化すると同時に温度分布も変化するので、再
び溶液に溶け込むなど高い濃度を維持しながらそ
の分布を一様ならしめる。さらに回転のたびに半
導体基板9,9…と接触している溶液は新規化さ
れる。尚この回転に際して特に第6図の如く上下
逆になつた時でも、成長室4はしきり板5によつ
て密室となつているので溶液12が成長室4から
漏れることはない。これを繰り返して840℃で冷
却を止め、第6図の状態でフツク13を操作して
しきり板5を摺動させ、再び透孔6と注液口8と
を一致させ、溶液12を溶液溜3に移す。 Solution reservoir 3 contains solution 1 in which impurities zinc (Zn) and gallium oxide (Ga 2 O 3 ) are dissolved in a solvent consisting of gallium (Ga) and gallium phosphide (GaP).
The entire device containing 2 is placed in a reactor and heated to approximately 1050°C. The hook 13 engaged with the diaphragm plate 5 is operated to slide the diaphragm plate 5 so that the through hole 6 of the diaphragm plate 5 and the liquid injection port 8 are aligned with each other as shown in FIG. As a result, the solution 12 in the solution reservoir 3 moves to the growth chamber 4 and comes into contact with the semiconductor substrates 9, 9, . . . . Thereafter, the hook 13 is operated to return the partition plate 5 to its original position, and the cooling is performed at a rate of 3° C. per minute. During cooling, the rotating shaft 2 was operated at a rate of half a revolution every 5 minutes. As a result, the container 1 becomes in the state shown in FIG. 5 or upside down as shown in FIG. 6, and the temperature distribution of the solution 12 becomes uniform, and the impurity concentration becomes uniform. The impurity that is particularly prone to segregation is zinc in this example, and it tends to precipitate above the container 12, but as this rotation changes the precipitation position and at the same time changes the temperature distribution, it dissolves into the solution again, causing a high concentration. While maintaining the distribution, the distribution is made uniform. Furthermore, the solution in contact with the semiconductor substrates 9, 9, . . . is renewed each time the rotation is performed. During this rotation, even when the growth chamber 4 is turned upside down as shown in FIG. 6, the solution 12 will not leak from the growth chamber 4 because the growth chamber 4 is closed by the partition plate 5. Repeat this to stop cooling at 840°C, and in the state shown in Figure 6, operate the hook 13 to slide the partition plate 5, align the through hole 6 and the liquid injection port 8 again, and pour the solution 12 into the solution reservoir. Move to 3.
このようにして出来たエピタキシヤル成長層を
測定した所、直径5.0cmの半導体基板9,9…の
全体で、成長層の厚みは薄い所で62μm厚い所で
77μmであり、70μm±5μmのいわゆる平坦部
が約80%を占めた。また結晶性も良く、不純物濃
度のばらつきも少ないので、この半導体基板9,
9…を用いた発光ダイオードは、発光効率が4.1
%と高く、またそのばらつきも±18%以内と小さ
かつた。 When the epitaxial growth layer thus formed was measured, the thickness of the growth layer was 62 μm in the thin part and 62 μm in the thick part on the entire semiconductor substrate 9, 9... with a diameter of 5.0 cm.
77 μm, and the so-called flat portion of 70 μm±5 μm accounted for about 80%. In addition, since the semiconductor substrate 9 has good crystallinity and little variation in impurity concentration,
9. The light emitting diode using... has a luminous efficiency of 4.1
%, and the variation was small, within ±18%.
上述の実施例において、回転軸2の回転は何分
か毎に半回転(但し好ましくは2分〜20分で半回
転)するとか、低速モータ等を用いて常時回転さ
せる等してもよい。又容器1は、図では円柱形を
しているがこれに限られるものではなく、又溶液
溜3は密室とならないで開口部を有し、容器1の
他に排液溜を具備してもよい。 In the above-described embodiment, the rotating shaft 2 may be rotated half a rotation every few minutes (preferably half a rotation every 2 to 20 minutes), or may be rotated constantly using a low-speed motor or the like. Further, although the container 1 has a cylindrical shape in the figure, it is not limited to this, and the solution reservoir 3 may have an opening rather than a closed chamber, and may include a drainage reservoir in addition to the container 1. good.
以上の如く本発明は、不純物を混入した溶液を
少なくとも1時的に(即ちエピタキシヤル成長中
は)溜める事が出来、溶液を溜めたままで回転可
能な成長室と、この成長室に隣接した溶液溜と、
エピタキシヤル成長中、成長室を密室ならしめる
しきり板と、成長室の中にあつて複数の半導体基
板を略垂直に保持してなる基板保持具とを具備す
るものであるから、一度に、多数の半導体基板
に、均一で高品質なエピタキシヤル成長が行なえ
る。 As described above, the present invention provides a growth chamber in which a solution containing impurities can be stored at least temporarily (that is, during epitaxial growth) and can be rotated while the solution is stored; Tame and
During epitaxial growth, it is equipped with a partition plate that makes the growth chamber a closed room, and a substrate holder that holds a plurality of semiconductor substrates approximately vertically in the growth chamber, so that a large number of semiconductor substrates can be grown at once. Uniform, high-quality epitaxial growth can be performed on semiconductor substrates.
第1図と第2図は液相エピタキシヤル成長装置
の説明図、第3図は本発明実施例の断面図、第4
図、第5図、第6図は本発明の装置を用いたエピ
タキシヤル工程の説明図である。
1…容器、2…回転軸、3…溶液溜、4…成長
室、5…しきり板、6…透孔、9,9…半導体基
板、10…基板保持具。
1 and 2 are explanatory diagrams of a liquid phase epitaxial growth apparatus, FIG. 3 is a sectional view of an embodiment of the present invention, and FIG.
5 and 6 are explanatory diagrams of an epitaxial process using the apparatus of the present invention. DESCRIPTION OF SYMBOLS 1... Container, 2... Rotating shaft, 3... Solution reservoir, 4... Growth chamber, 5... Separation plate, 6... Through hole, 9, 9... Semiconductor substrate, 10... Substrate holder.
Claims (1)
けられ不純物を混入した溶液を少なくともエピタ
キシヤル成長中溜めることができる成長室と、こ
の成長室に隣接して容器の中に設けられた溶液溜
と、成長室と溶液溜とをしきりエピタキシヤル成
長中成長室を密室ならしめるしきり板と、成長室
に収納され複数の半導体基板を略垂直に保持して
なる基板保持具とを具備した事を特徴とする液相
エピタキシヤル成長装置。1. A rotatably supported container, a growth chamber provided in the container and capable of storing a solution containing impurities during at least epitaxial growth, and a growth chamber provided in the container adjacent to the growth chamber. It is equipped with a solution reservoir, a partition plate that separates the growth chamber from the solution reservoir and makes the growth chamber a closed room during epitaxial growth, and a substrate holder that is housed in the growth chamber and holds a plurality of semiconductor substrates substantially vertically. A liquid phase epitaxial growth apparatus characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13677179A JPS5659696A (en) | 1979-10-23 | 1979-10-23 | Liquid phase epitaxial growing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13677179A JPS5659696A (en) | 1979-10-23 | 1979-10-23 | Liquid phase epitaxial growing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5659696A JPS5659696A (en) | 1981-05-23 |
| JPS6229396B2 true JPS6229396B2 (en) | 1987-06-25 |
Family
ID=15183122
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13677179A Granted JPS5659696A (en) | 1979-10-23 | 1979-10-23 | Liquid phase epitaxial growing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5659696A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04367587A (en) * | 1991-06-14 | 1992-12-18 | Shin Etsu Handotai Co Ltd | Liquid phase growth and apparatus therefor |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS49123500A (en) * | 1973-04-02 | 1974-11-26 | ||
| JPS5344311A (en) * | 1973-07-05 | 1978-04-21 | Masahiro Hiyamuta | Stripper for reaper |
| JPS5147153A (en) * | 1974-02-01 | 1976-04-22 | Joruju Ruboshii Konsutorukuchu | MARUAMIKI |
| JPS531036A (en) * | 1976-06-25 | 1978-01-07 | Toray Industries | Light polarizer |
-
1979
- 1979-10-23 JP JP13677179A patent/JPS5659696A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5659696A (en) | 1981-05-23 |
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