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JPS6233571B2 - - Google Patents
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JPS6233571B2 - - Google Patents

Info

Publication number
JPS6233571B2
JPS6233571B2 JP56188499A JP18849981A JPS6233571B2 JP S6233571 B2 JPS6233571 B2 JP S6233571B2 JP 56188499 A JP56188499 A JP 56188499A JP 18849981 A JP18849981 A JP 18849981A JP S6233571 B2 JPS6233571 B2 JP S6233571B2
Authority
JP
Japan
Prior art keywords
optical system
optical
polarizing microscope
additional
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56188499A
Other languages
Japanese (ja)
Other versions
JPS57130010A (en
Inventor
Berugeneru Yoahimu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jenoptik AG
Original Assignee
VEB Carl Zeiss Jena GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VEB Carl Zeiss Jena GmbH filed Critical VEB Carl Zeiss Jena GmbH
Publication of JPS57130010A publication Critical patent/JPS57130010A/en
Publication of JPS6233571B2 publication Critical patent/JPS6233571B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)

Description

【発明の詳細な説明】 本発明は、光路差の迅速な決定のために測定目
盛付補償板が像平面の被測定体の像に重ね合わさ
れ、または公知の測定用補償板を使用する場合、
測定精度を高めるために半影板を使用し、または
二色性ミラーもしくは光束分割偏向プリズムによ
り例えば光学異方性物質の方向依存性透過能を明
らかにする偏光顕微鏡に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention provides a method in which a compensator with a measuring scale is superimposed on the image of the object to be measured in the image plane for rapid determination of the optical path difference, or when using a known measuring compensator.
The present invention relates to a polarizing microscope that uses a penumbra to improve measurement accuracy, or uses a dichroic mirror or a beam splitting deflection prism to reveal the direction-dependent transmittance of optically anisotropic substances, for example.

公知の技術的解決は、観察に必要な偏光光学要
素を、偏光顕微鏡の対物レンズが投影する被測定
体の中間像の平面に配置して、偏光顕微鏡が発生
する像に所望の物理的変化を生起する点が共通し
ている。その場合、この平面の手前で光線の偏向
が行われてはならないことが要求される。なぜな
ら結像する光線の偏光状態は偏向要素で反射した
ときに、一般に無秩序に変化させられるからであ
る。
A known technical solution is to place the polarizing optical elements necessary for observation in the plane of the intermediate image of the object to be measured projected by the objective lens of the polarizing microscope, in order to effect the desired physical changes in the image generated by the polarizing microscope. They have something in common that occurs. In that case, it is required that no deflection of the light beam takes place in front of this plane. This is because the polarization state of the imaged beam is generally changed randomly when reflected by the deflection element.

上記例えば目盛を付けた補償板や半影板、或は
ジクロスコープ板のようなの偏光光学要素はこの
理由から、いわゆるライトの接眼鏡の、機械的に
到達可能な物平面に挿入口から挿入して配置さ
れ、接眼鏡は直線状の鏡筒を介して偏光顕微鏡に
取付けられるから、面倒な姿勢で単眼観察しかで
きない。
For this reason, the polarizing optical elements, such as the graduated compensators, penumbras, or dichroscopic plates mentioned above, are inserted through the insertion opening into the mechanically accessible object plane of the so-called Wright eyepiece. Since the eyepiece is attached to the polarizing microscope through a straight lens barrel, only monocular observation is possible in an awkward position.

偏向要素を含む補助光路を介して、最初の偏向
の手前の偏光光学要素が対物レンズによつて作ら
れた物体の中間像と共に、双眼傾斜鏡筒の接眼鏡
物体平面に結像される技術的解決も公知である
(西ドイツ特許公開第2406414号)。双眼鏡筒は別
の、挿入可能な偏向要素を介して常法により顕微
鏡と連結され、快適な観察を保証する。この構成
の欠点は、操作される偏光光学要素と後置の同じ
く操作される測定用検光子が顕微鏡観察者の眼の
高さより上にあること、及びその偏光光学要素に
よつて影響を受けたあとで、その上で偏向させら
れる光束が、近代的な大視野観察技術の場合に
は、直径20ないし25mmとなり、このことが中間結
像系の補正を困難にし、大きさと表面性状に関し
て偏向要素に高い要求を負わせることである。こ
のため顕微鏡付属品として構成された装置がすこ
ぶる嵩張るから、大きな付加重量が顕微鏡台架に
かかる。また、偏光顕微鏡の鏡筒の中に既にある
検光子を利用することができない場合があり、第
2の検光子を補助装置に配設することが必要であ
る。
A technique in which, via an auxiliary optical path containing a deflection element, the polarization optical element before the first deflection is imaged into the eyepiece object plane of the binocular tilting tube together with the intermediate image of the object created by the objective lens. A solution is also known (West German Patent Publication No. 2406414). The binocular tube is connected to the microscope in a customary manner via a separate insertable deflection element to ensure comfortable viewing. The disadvantage of this configuration is that the operated polarizing optical element and the downstream, also operated measuring analyzer are above eye level of the microscope observer, and that the polarizing optical element affected by The beam that is then deflected later has a diameter of 20 to 25 mm in the case of modern large-field observation techniques, which makes the correction of the intermediate imaging system difficult and makes it difficult to correct the deflection elements with respect to size and surface texture. placing high demands on people. This makes the device configured as a microscope accessory quite bulky, and a large additional weight is placed on the microscope stand. Furthermore, it may not be possible to use the analyzer already in the lens barrel of the polarizing microscope, and it is necessary to arrange a second analyzer in the auxiliary device.

本発明の目的は、双眼傾斜鏡筒式偏光顕微鏡に
おいて、筋肉動作の面で好適な姿勢で、物体のオ
ルソスコープまたはコノスコープ観察を保証し、
装置と材料の費用を大幅に引下げ、前述の欠点を
取除くことである。
The purpose of the present invention is to ensure orthoscopic or conoscopic observation of objects in a posture suitable for muscle movement in a binocular tilting tube polarizing microscope;
The aim is to significantly reduce the cost of equipment and materials and eliminate the aforementioned drawbacks.

本発明の根底にあるのは、物体と像平面で物体
に重ね合わされる偏光光学要素の同時観察が可能
であり、物体と偏光光学要素の間で光線の偏向が
行われず、いずれの場合も慣用の鏡筒検光子の使
用が可能であるように、双眼傾斜鏡筒式偏光顕微
鏡を構成する問題である。
The basis of the invention is that simultaneous observation of an object and a polarizing optical element superimposed on the object in the image plane is possible, and that no beam deflection takes place between the object and the polarizing optical element, and in both cases conventional The problem is configuring a binocular tilting barrel polarizing microscope so that it is possible to use a barrel analyzer.

この問題は、双眼傾斜鏡筒と、対物レンズおよ
び検光子の間のテレセントリツク光路と、鏡筒レ
ンズと、テレセントリツク光路の最初の偏向点の
手前にあつて中間像を作り出す、挿入可能な追加
的光学系とを有する偏光顕微鏡によつて解決さ
れ、追加的光学系が共通の焦平面を有する、少く
とも2個の光学部材の無限焦点のユニツトをな
し、偏光に影響を及ぼす光学部材が上記ユニツト
の中にあることを特徴とする。この光学要素が取
外し自在に配設されていれば、好都合である。無
限焦点の系の各光学部材が等しい焦点距離を有す
ることが好ましい。
The problem consists of a telecentric beam path between the binocular tilt tube, the objective lens and the analyzer, and an insertable add-on that creates an intermediate image before the tube lens and the first deflection point of the telecentric beam path. an optical system, the additional optical system forming an afocal unit of at least two optical elements having a common focal plane, the optical elements influencing the polarization being It is characterized by being inside the unit. It is advantageous if this optical element is arranged in a removable manner. Preferably, each optical member of the afocal system has an equal focal length.

また、追加的光学系の前側焦点と対物レンズの
後側焦点面、および追加的光学系の後側焦点と鏡
筒レンズの主平面が一致することが好ましい。
Further, it is preferable that the front focal point of the additional optical system and the rear focal plane of the objective lens, and the rear focal point of the additional optical system and the principal plane of the barrel lens coincide.

次に略図に基づいて本発明を詳述する。 The invention will now be explained in more detail on the basis of schematic drawings.

対物レンズ1に対して光学軸O1−O1上に補償
板2と、前側要素4、後側要素5、挿入自在な半
影板6から成る追加的光学系3と、検光子7と鏡
筒レンズ8と偏向要素9とが後置されている。偏
向要素には軸O2−O2上で接眼鏡10が続く。軸
O1−O1に垂直に、また軸O2−O2に垂直に、それ
ぞれ中間像平面11および12がある。補償板2
と追加的光学系3の間および検光子7と偏向要素
9の間には、光学軸O1−O1の上に焦点15,1
6がある。
On the optical axis O 1 -O 1 with respect to the objective lens 1, there is provided a compensator 2, an additional optical system 3 consisting of a front element 4, a rear element 5, an insertable penumbra 6, an analyzer 7 and a mirror. A tube lens 8 and a deflection element 9 are placed downstream. The deflection element is followed by an eyepiece 10 on the axis O 2 -O 2 . shaft
Perpendicular to O 1 -O 1 and perpendicular to the axis O 2 -O 2 are intermediate image planes 11 and 12, respectively. Compensation plate 2
and the additional optical system 3 and between the analyzer 7 and the deflection element 9 there is a focal point 15, 1 on the optical axis O 1 −O 1 .
There are 6.

像距離が無限大の対物レンズ1と検光子7の間
で光路O1−O1に挿入しうる追加的光学系3の前
側要素4は、中間像平面11に追加的中間像13
を発生する。この中間像平面11は偏向要素9の
手前にあり、ここに半影板6を挿入することがで
きる。半影板6は補償板2による光路差の正確な
補整を指示し、物体(図示せず)の像に重ね合わ
される。図示されていないもう一つの実施形態に
おいて、補償板を取り去つて半影板を他の、例え
ばジクロスコープや測定目盛を備えた補償板と置
き換えることができる。追加的光学系3の後側要
素5は鏡筒レンズ8と共に追加的補助中間像13
と半影板6と、更にはまた測定目盛の付いた補償
板やジクロスコープとを接眼鏡物平面に結像す
る。
The front element 4 of the additional optical system 3, which can be inserted in the optical path O 1 -O 1 between the objective 1 with infinite image distance and the analyzer 7 , produces an additional intermediate image 13 in the intermediate image plane 11 .
occurs. This intermediate image plane 11 lies in front of the deflection element 9, into which the penumbra 6 can be inserted. The penumbra 6 directs the correct compensation of the optical path difference by the compensator 2 and is superimposed on the image of an object (not shown). In another embodiment, not shown, the compensator can be removed and the penumbra replaced by another compensator, for example a dichroscope or a compensator with a measuring scale. The rear element 5 of the additional optical system 3 together with the tube lens 8 provides an additional auxiliary intermediate image 13
, the penumbra 6 and also a compensator with a measuring scale or a dichroscope are imaged onto the eyepiece object plane.

追加的光学系3は無焦点系として構成され、そ
の前側要素4と後側要素5は等しい焦点距離を有
する。この場合、追加的光学系3を挿入した時、
元の中間像14の位置もその大きさも変化しな
い。
The additional optical system 3 is configured as an afocal system, its front element 4 and rear element 5 having equal focal lengths. In this case, when inserting the additional optical system 3,
Neither the position of the original intermediate image 14 nor its size change.

焦点合わせと結像の尺度はそのままである。焦
点15が前側要素4と対物レンズ1の共通の焦点
であり、焦点16(後側要素の焦点)が鏡筒レン
ズ8の図示しない主平面にあるように、追加的光
学系3を光路O1−O1に挿入しなければならな
い。
Focusing and imaging scale remain the same. The additional optical system 3 is arranged in the optical path O 1 in such a way that the focal point 15 is the common focal point of the front element 4 and the objective 1 and the focal point 16 (focal point of the rear element) is in the main plane (not shown) of the tube lens 8. - Must be inserted in O 1 .

別の実施態様では補償板を取去り、半影板を別
の偏光光学要素、例えば光路差のための測定目盛
付補償板または二色鏡に置き換えることができ
る。
In another embodiment, the compensator can be removed and the penumbra replaced by another polarizing optical element, for example a compensator with a measuring scale for the optical path difference or a dichroic mirror.

【図面の簡単な説明】[Brief explanation of the drawing]

図は本発明による偏光顕微鏡の略図を示す。 1……対物レンズ、3……追加的光学系、7…
…検光子、8……鏡筒レンズ。
The figure shows a schematic diagram of a polarizing microscope according to the invention. 1...Objective lens, 3...Additional optical system, 7...
...Analyzer, 8...Target lens.

Claims (1)

【特許請求の範囲】 1 双眼傾斜鏡胴と、対物レンズおよび検光子の
間のテレセトリツク光路と、鏡胴レンズと、テレ
セントリツク光路の最初の偏向点の手前にあつて
中間像を作り出す、挿入可能な追加的光学系とを
有する偏光顕微鏡において、上記追加的光学系が
共通の焦平面を有する少なくとも2個の光学部材
の無限焦点のユニツトであつてこのユニツトの中
に偏光に影響を及ぼす光学的要素が存在すること
を特徴とする、上記偏光顕微鏡。 2 偏光に影響を及ぼす光学的要素が取り除き可
能に配設されている、特許請求の範囲第1項に記
載の偏光顕微鏡。 3 無限焦点のユニツトの各光学部材が等しい焦
点距離を有する、特許請求の範囲第2項に記載の
偏光顕微鏡。 4 追加的光学系の前側焦点と対物レンズの後側
焦平面、また追加的光学系の後側焦点と鏡胴レン
ズの主平面が一致する、特許請求の範囲第3項に
記載の偏光顕微鏡。
[Scope of Claims] 1. A telecentric optical path between the binocular tilting barrel, the objective lens and the analyzer, and an insertable lens which is located before the first deflection point of the telecentric optical path and creates an intermediate image. a polarizing microscope having an additional optical system, said additional optical system being an afocal unit of at least two optical members having a common focal plane, in which said optical system has an optical polarization-influencing optical system; The polarizing microscope described above, characterized in that an element is present. 2. The polarizing microscope according to claim 1, wherein the optical element that affects polarization is removably disposed. 3. A polarizing microscope according to claim 2, wherein each optical member of the afocal unit has an equal focal length. 4. The polarizing microscope according to claim 3, wherein the front focal point of the additional optical system and the rear focal plane of the objective lens, and the rear focal point of the additional optical system and the principal plane of the barrel lens coincide.
JP18849981A 1981-02-02 1981-11-26 Polaroid microscope Granted JPS57130010A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD22736581A DD156298A1 (en) 1981-02-02 1981-02-02 POLARIZATION MICROSCOPE

Publications (2)

Publication Number Publication Date
JPS57130010A JPS57130010A (en) 1982-08-12
JPS6233571B2 true JPS6233571B2 (en) 1987-07-21

Family

ID=5528907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18849981A Granted JPS57130010A (en) 1981-02-02 1981-11-26 Polaroid microscope

Country Status (3)

Country Link
JP (1) JPS57130010A (en)
DD (1) DD156298A1 (en)
DE (1) DE3142912A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2181498C1 (en) * 2001-01-15 2002-04-20 Общество с ограниченной ответственностью "Лаборатория АМФОРА" Method for determination of object microrelief and optical properties of presurface layer, modulation interference microscope for realization of the method

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE371201C (en) * 1920-12-02 1923-03-12 Wilhelm Spaeth Dr Process for the production of colored light for the presentation of moving pictures with natural colors
DE1293472C2 (en) * 1967-06-21 1974-04-18 Leitz Ernst Gmbh Tube lens system with compensators for polarizing microscopes
AT333052B (en) * 1973-04-04 1976-11-10 Reichert Optische Werke Ag OPTICAL ARRANGEMENT FOR MICROSCOPES
US4282485A (en) * 1978-05-22 1981-08-04 Pneumo Corporation Linear variable phase transformer with constant magnitude output

Also Published As

Publication number Publication date
DE3142912A1 (en) 1982-09-09
JPS57130010A (en) 1982-08-12
DD156298A1 (en) 1982-08-11

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