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JPS6234717B2 - - Google Patents
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JPS6234717B2 - - Google Patents

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Publication number
JPS6234717B2
JPS6234717B2 JP8817480A JP8817480A JPS6234717B2 JP S6234717 B2 JPS6234717 B2 JP S6234717B2 JP 8817480 A JP8817480 A JP 8817480A JP 8817480 A JP8817480 A JP 8817480A JP S6234717 B2 JPS6234717 B2 JP S6234717B2
Authority
JP
Japan
Prior art keywords
heating element
single crystal
crucible
temperature distribution
pulling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8817480A
Other languages
Japanese (ja)
Other versions
JPS5711897A (en
Inventor
Sukehisa Kawasaki
Masao Kishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP8817480A priority Critical patent/JPS5711897A/en
Publication of JPS5711897A publication Critical patent/JPS5711897A/en
Publication of JPS6234717B2 publication Critical patent/JPS6234717B2/ja
Granted legal-status Critical Current

Links

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Resistance Heating (AREA)

Description

【発明の詳細な説明】 本発明は、単結晶引上に用いられる抵抗加熱の
方法及びその装置の改良、特に抵抗加熱体の形状
と配置を改良した方法及びその装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improvements in a resistance heating method and apparatus used for pulling a single crystal, and particularly to a method and apparatus in which the shape and arrangement of a resistance heating element are improved.

単結晶引上において、従来は第1図及び第2図
に示すような抵抗加熱体によつて作られるホツ
ト・ゾーンの中に石英ルツボを置き、この中に単
結晶材料を入れて溶融し、メルトを引上げてい
た。しかし、これら抵抗加熱体を用いた時には、
ゾーンの温度分布が希望どおりにならず、また抵
抗加熱体としてのカーボンの消耗も大きかつた。
Conventionally, in single crystal pulling, a quartz crucible is placed in a hot zone created by a resistance heating element as shown in Figures 1 and 2, and a single crystal material is placed in the hot zone and melted. It was pulling up the melt. However, when using these resistance heating elements,
The temperature distribution in the zone was not as desired, and the carbon used as a resistance heating element was consumed to a large extent.

第1図は従来の抵抗加熱体の一例の断面図を示
す。この場合の抵抗加熱体1は厚さ及び円筒の半
径も一様であるがために、一定の温度分布しか得
られない。
FIG. 1 shows a cross-sectional view of an example of a conventional resistance heating body. Since the resistance heating body 1 in this case has a uniform thickness and a uniform cylindrical radius, only a constant temperature distribution can be obtained.

第2図も従来の抵抗加熱体の一例の断面図であ
り、特許出願公告(昭52−39787)に示されてい
るものである。カーボンの抵抗加熱体20は厚み
に変化があり、しかも円筒が多段状で半径が異な
つている。従つて、第1図の従来の抵抗加熱体と
比較して、多様な温度分布が得られるが、抵抗加
熱体の肉厚の薄い部分のカーボンの消耗が著し
く、使用時間と共に温度分布が変化するという経
時変化があり、これが欠点となる。更に、温度分
布を変える場合、カーボンの厚み、半径、高さを
変え設計製作し、炉内に新しく設置する必要があ
り、カーボンに含有される不純物で係が汚染さ
れ、目的とする高品質の単結晶の成長は望めない
欠点もある。
FIG. 2 is also a cross-sectional view of an example of a conventional resistance heating element, and is shown in a patent application publication (1978-39787). The carbon resistance heating body 20 has a variable thickness, and has a multi-stage cylinder with different radii. Therefore, a variety of temperature distributions can be obtained compared to the conventional resistance heating element shown in Figure 1, but the carbon in the thinner parts of the resistance heating element is significantly consumed, and the temperature distribution changes over time. There is a change over time, which is a drawback. Furthermore, when changing the temperature distribution, it is necessary to design and manufacture the carbon by changing its thickness, radius, and height, and install it in the furnace. This can contaminate the furnace with impurities contained in the carbon, making it difficult to achieve the desired high quality. There is also the drawback that single crystal growth cannot be expected.

さらに従来の抵抗加熱体を用いた場合には、
Si、Ge等の引上においても温度分布制御は容易
ではなく、ましてGaP、InP、GaAs等の化合物半
導体の液体カプセル引上法(LEC法)では、P
やAs等の揮発性物質の分解、蒸発を抑制する封
止液としてB2O3を融液上に被せるため、又N2
ス、Arガスの高圧不活性ガス(30〜50atm)の高
温中での対流現象により、一層温度分布は複雑で
制御は困難となる。
Furthermore, when using a conventional resistance heating element,
Temperature distribution control is not easy when pulling Si, Ge, etc., and even more so in the liquid capsule pulling method (LEC method) of compound semiconductors such as GaP, InP, GaAs, etc.
In order to cover the melt with B 2 O 3 as a sealing liquid that suppresses the decomposition and evaporation of volatile substances such as As and As, it is also possible to use high-pressure inert gas (30 to 50 atm) such as N 2 gas or Ar gas at high temperatures. Due to the convection phenomenon, the temperature distribution becomes even more complex and difficult to control.

本発明はこのような従来の抵抗加熱体の欠点を
改善した新たな抵抗加熱体を用いた抵抗加熱方法
を提供するものであり、その単結晶引上げにおけ
る加熱装置を提供するものである。
The present invention provides a resistance heating method using a new resistance heating element that improves the drawbacks of the conventional resistance heating element, and also provides a heating apparatus for pulling a single crystal.

本発明は、内側と外側に抵抗加熱体を配置し、
必要に応じ、外側の抵抗加熱体を内側の抵抗加熱
体上にまで張り出させる構造にして、抵抗加熱体
の高さを調節し、かつ内側の抵抗加熱体と外側の
抵抗加熱体上に必要な電力を供給することによ
り、所定の温度分布を得られるようにするもので
ある。
The present invention arranges resistance heating bodies inside and outside,
If necessary, the height of the resistance heating element can be adjusted by making the outer resistance heating element extend over the inner resistance heating element, and the height of the resistance heating element can be adjusted as needed. By supplying a certain amount of electric power, a predetermined temperature distribution can be obtained.

以下本発明を第3図に基づいて説明する。 The present invention will be explained below based on FIG.

第3図は本発明を実施した単結晶引上装置の一
例の主要部断面図である。第3図において、グラ
フアイト・サセプター34Aに石英ルツボ33が
組み込まれ、この中に単結晶材料の融液(メル
ト)31が入れられ、単結晶32が引上軸37を
回転させながら引上げられる。また、34Aの外
周には抵抗加熱体35A,35B及び35Bの外
周には同軸で円筒状の断熱材36が設置され、更
に石英ルツボ33を回軸させる下軸34B結晶の
引上状態を監視するのぞき窓39が設置されてい
る。30はN2ガスあるいはArガス等の不活性ガ
スであり、チエンバー38内に充填されている。
FIG. 3 is a sectional view of the main parts of an example of a single crystal pulling apparatus embodying the present invention. In FIG. 3, a quartz crucible 33 is installed in a graphite susceptor 34A, a melt 31 of a single crystal material is put therein, and a single crystal 32 is pulled up while rotating a pulling shaft 37. Further, a cylindrical heat insulating material 36 is installed coaxially around the outer periphery of the resistance heating elements 35A, 35B, and 35B, and a lower shaft 34B that rotates the quartz crucible 33 monitors the pulling state of the crystal. A peephole 39 is installed. 30 is an inert gas such as N 2 gas or Ar gas, which is filled in the chamber 38 .

単結晶引上装置により高品質の単結晶を得るに
は、引上炉内温度分布、特に石英ルツボ33近傍
すなわちホツトゾーンの温度分布の制御が重要で
ある。温度分布を決める要因には、抵抗加熱体3
5A及び35B断熱材36グラフアイト・サセプ
ター34等の構造があるが、中でも抵抗加熱体3
5の形状及び位置が最も重要な位置を占める。
In order to obtain a high quality single crystal using a single crystal pulling apparatus, it is important to control the temperature distribution within the pulling furnace, particularly the temperature distribution near the quartz crucible 33, that is, in the hot zone. The factors that determine the temperature distribution include the resistance heating element 3
There are structures such as 5A and 35B insulation material 36 graphite susceptor 34, among others, resistance heating element 3
The shape and position of number 5 occupies the most important position.

第4図には、本発明装置の加熱体及びその周辺
装置の正面図を示す。引上炉の一般構造と同様に
ルツボ43がサセプター44Aに設置され、下軸
44Bに連結されている。その外側に加熱体が設
置され、下部加熱体45Bと上部加熱体45Aの
上下2段及び2重の円筒加熱体という2段2重構
造となつている。各々の加熱体の底部に電極板が
取り付けられ、これら電極板を調整することによ
り、下部加熱体45Bと上部加熱体45A共に上
下方向の移動が容易である。ルツボと下部加熱体
45B及び上部加熱体45Aの配置関係をいろい
ろと変化させ、又下部加熱体45Bと上部加熱体
45Aへの入力を独立に制御することによつて、
最適温度分布が実現される。
FIG. 4 shows a front view of the heating element and its peripheral equipment of the apparatus of the present invention. Similar to the general structure of a pulling furnace, a crucible 43 is installed in a susceptor 44A and connected to a lower shaft 44B. A heating body is installed on the outside thereof, and has a two-stage, double-layered structure consisting of a lower heating element 45B and an upper heating element 45A in upper and lower stages and a double cylindrical heating element. Electrode plates are attached to the bottom of each heating element, and by adjusting these electrode plates, both the lower heating element 45B and the upper heating element 45A can be easily moved in the vertical direction. By variously changing the arrangement relationship between the crucible, the lower heating element 45B, and the upper heating element 45A, and by independently controlling the input to the lower heating element 45B and the upper heating element 45A,
An optimal temperature distribution is achieved.

例えば、第5図のように上部加熱体55Aの厚
みを変化させると、簡単に温度分布が変えられ
る。第6図に下部加熱体45Bの斜視図を、第7
図に上部加熱体45Aの斜視図を示す。これらは
等間隔のスリツト66,76をもつ、発熱導線条
65,75を形成している。
For example, by changing the thickness of the upper heating body 55A as shown in FIG. 5, the temperature distribution can be easily changed. A perspective view of the lower heating body 45B is shown in FIG.
The figure shows a perspective view of the upper heating body 45A. These form heating conductor strips 65, 75 having equally spaced slits 66, 76.

本発明によれば、以上説明したように本発明装
置はルツボと同心軸上外部に上下変動が簡単な2
段2重構造の加熱体から構成され、これらとルツ
ボとの配置関係及び電気的入力を独立にコントロ
ールすることにより、Si、Ge等の単結晶引上の
みならず、GaP、InP、GaAs等の複雑な温度分布
を示す単結晶引上においても所望の温度分布が比
較的容易に構成され、高品質の単結晶が得られ
る。
According to the present invention, as explained above, the present invention device has two parts that can be easily moved up and down on the outside on the concentric axis with the crucible.
Consisting of a heating element with a double layered structure, by independently controlling the arrangement relationship between these and the crucible and electrical input, it is possible to pull not only single crystals such as Si and Ge, but also GaP, InP, GaAs, etc. Even when pulling a single crystal showing a complicated temperature distribution, a desired temperature distribution can be constructed relatively easily, and a high quality single crystal can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は従来の抵抗加熱体の一例の断
面図である。第3図は、本発明を実施した単結晶
引上装置の一例の主要断面図である。第4図、第
5図は本発明に使用する抵抗加熱体の断面図であ
り、第6図、第7図は各々本発明に使用する下部
加熱体と上部加熱体の一例の斜視図である。 図中で10,20は抵抗加熱体であり、35
A,45A,55A,75は上部加熱体であり、
35B,45B,55B,65は下部加熱体であ
る。43,53はるつぼであり、44A,54A
はサセプターである。
FIGS. 1 and 2 are cross-sectional views of an example of a conventional resistance heating body. FIG. 3 is a main sectional view of an example of a single crystal pulling apparatus embodying the present invention. 4 and 5 are cross-sectional views of a resistance heating body used in the present invention, and FIGS. 6 and 7 are perspective views of an example of a lower heating element and an upper heating element, respectively, used in the present invention. . In the figure, 10 and 20 are resistance heating elements, and 35
A, 45A, 55A, 75 are upper heating bodies;
35B, 45B, 55B, and 65 are lower heating bodies. 43, 53 are crucibles, 44A, 54A
is a susceptor.

Claims (1)

【特許請求の範囲】 1 ルツボの外周に同心的に2重円筒構造の加熱
体を設置し、内側の加熱体は中間の高さにし、外
側の加熱体は上部を逆U字状に形成し、該内側加
熱体上にまで張り出すようにし、予め炉の上下方
向の所定位置に設定し、然る後各加熱体に所定の
電力を入力することにより、ルツボ近傍の温度を
所定の分布にして引上を行うことを特徴とする単
結晶の引上方法。 2 ルツボの外周に同心的に2重円筒構造の加熱
体を配置し、内側の加熱体は中間の高さにし、外
側の加熱体は上部を逆U字状に形成し該内側加熱
体上にまで張り出すようにし、しかも各々の加熱
体は加熱体取付位置を調整することにより炉の上
下方向に自由に設定可能である構造とし、2つの
加熱体の配置関係及び各々の加熱体の発熱量を独
立に制御することを可能とし、ルツボ近傍の温度
分布を自由に制御できるようにしたことを特徴と
する単結晶引上装置。 3 特許請求の範囲第2項の装置において、加熱
体部の全体の厚さを変化させること、または厚さ
に分布を与えることにより、所定の温度分布が得
られるようにしたことを特徴とする特許請求の範
囲第2項に記載の単結晶引上装置。
[Claims] 1. A heating element having a double cylindrical structure is installed concentrically around the outer periphery of the crucible, the inner heating element is set at an intermediate height, and the upper part of the outer heating element is formed into an inverted U shape. , so that it extends above the inner heating element, and is set in advance at a predetermined position in the vertical direction of the furnace, and then by inputting a predetermined electric power to each heating element, the temperature near the crucible is made to have a predetermined distribution. 1. A method for pulling a single crystal, characterized in that pulling is carried out using a single crystal. 2 A heating element with a double cylindrical structure is arranged concentrically around the outer periphery of the crucible, the inner heating element is at an intermediate height, and the outer heating element has an upper part formed in an inverted U shape and placed on the inner heating element. Furthermore, each heating element can be freely set in the vertical direction of the furnace by adjusting the mounting position of the heating element, and the arrangement of the two heating elements and the calorific value of each heating element are 1. A single crystal pulling device characterized by being able to independently control the temperature distribution in the vicinity of the crucible and freely controlling the temperature distribution in the vicinity of the crucible. 3. The device according to claim 2, characterized in that a predetermined temperature distribution can be obtained by changing the entire thickness of the heating body part or by giving a distribution to the thickness. A single crystal pulling device according to claim 2.
JP8817480A 1980-06-27 1980-06-27 Method of pulling up single crystal and device therefor Granted JPS5711897A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8817480A JPS5711897A (en) 1980-06-27 1980-06-27 Method of pulling up single crystal and device therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8817480A JPS5711897A (en) 1980-06-27 1980-06-27 Method of pulling up single crystal and device therefor

Publications (2)

Publication Number Publication Date
JPS5711897A JPS5711897A (en) 1982-01-21
JPS6234717B2 true JPS6234717B2 (en) 1987-07-28

Family

ID=13935539

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8817480A Granted JPS5711897A (en) 1980-06-27 1980-06-27 Method of pulling up single crystal and device therefor

Country Status (1)

Country Link
JP (1) JPS5711897A (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59137399A (en) * 1983-01-28 1984-08-07 Nippon Telegr & Teleph Corp <Ntt> Method and apparatus of growing low-dislocation density single crystal
JPS6046993A (en) * 1983-08-23 1985-03-14 Sumitomo Electric Ind Ltd Device for pulling up single crystal
JPS6046998A (en) * 1983-08-26 1985-03-14 Sumitomo Electric Ind Ltd Pulling up of single crystal and its device
JPS60221391A (en) * 1984-04-18 1985-11-06 Toshiba Corp Device for growing compound semiconductor single crystal
JPS6144794A (en) * 1984-08-08 1986-03-04 Hitachi Ltd Heating element
JPS6153187A (en) * 1984-08-24 1986-03-17 Sony Corp Device for growing single crystal

Also Published As

Publication number Publication date
JPS5711897A (en) 1982-01-21

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