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JPS6237501B2 - - Google Patents
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JPS6237501B2 - - Google Patents

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Publication number
JPS6237501B2
JPS6237501B2 JP53122030A JP12203078A JPS6237501B2 JP S6237501 B2 JPS6237501 B2 JP S6237501B2 JP 53122030 A JP53122030 A JP 53122030A JP 12203078 A JP12203078 A JP 12203078A JP S6237501 B2 JPS6237501 B2 JP S6237501B2
Authority
JP
Japan
Prior art keywords
grid
electron gun
electron
cathode
electron beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53122030A
Other languages
Japanese (ja)
Other versions
JPS5549838A (en
Inventor
Isao Nakatsu
Michio Akyama
Fumio Myanaga
Hidenori Yamazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP12203078A priority Critical patent/JPS5549838A/en
Publication of JPS5549838A publication Critical patent/JPS5549838A/en
Publication of JPS6237501B2 publication Critical patent/JPS6237501B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Description

【発明の詳細な説明】 本発明は陰極線管に内装された電子銃の処理方
法に係り、特に前記電子銃を構成する複数個の電
極のうち第2グリツドの電子ビーム通過孔部及び
その近傍を別途にクリーニングすることにより前
記電子銃の耐電圧を向上すると共にストレーエミ
ツシヨン源を除去する電子銃の処理方法に関する
ものである。 例えば陰極線管の一例としてのカラー受像管は
第1図に示す様に、内面に電子ビームの射突によ
り赤、緑、青に発光する螢光体層からなる螢光面
1が被着形成されたフエースプレート2と、この
螢光面1に対設した色選別電極3と、前記フエー
スプレート2にフアンネル4を介して連接された
ネツク5と、前記ネツク5に内装された電子銃
とからなり、前記電子銃は第2図に示すように
バイポテンシヤル形の場合には図示しないヒータ
を内装する陰極7と、前記陰極7から放出される
電子を電子ビームとし、この電子ビームを制御、
加速、集束させる第1グリツド8、第2グリツド
9、第3グリツド10、第4グリツド11及び絶
縁支持体12などからなり、前記第4グリツド1
1には20KV乃至30KVの高電圧が印加されるた
め、カラー受像管の製造工程中には、前記電子銃
に誘導コイルやテスラ変圧器などを介して実使
用時より数倍高い電圧を印加し、前記電子銃を構
成する各電極表面及び絶縁支持体12の表面に被
着した不所望の物質を除去し、主として第2グリ
ツド9及びまたは第3グリツド10からのストレ
ーエミツシヨンを除去または軽減させる所謂クリ
ーニング工程がある。 この場合、印加電圧や印加時間の設定条件によ
り各電極のみならず絶縁支持体を介して管内グロ
ー放電を起し、このグロー放電による加熱により
絶縁支持体12にクラツクが入つたり、前記各電
極を構成する物質が局部的にガス化したりする危
険性があるため、前記クリーニング工程では前述
したような現象が起らない限度内で印加電圧や印
加時間を設定しているのが現状である。 然るに前述の様な限定された印加電圧や印加時
間によるクリーニング工程を行なつても前記電子
銃構体を構成する電極表面は略クリーニングさ
れるが、この場合電界の反発作用により最もクリ
ーニングを必要とする電子ビーム通過孔部及びそ
の近傍に於てはクリーニング効果が不充分であ
り、特に第2グリツド9の電子ビーム通過孔部内
及びこの電子ビーム通過孔部近傍の第3グリツド
10に対設した部分にエミツシヨンを発生し易い
物質が残存すると、この部分から出た電子は陰極
7から放出された主電子ビームと別の進路を通
り、第1図に示した螢光面1上の主電子ビームの
射突する螢光体層とは別の螢光体層を発光させた
りして画像品位を悪くするストレーエミツシヨン
が発生し易い欠点があつた。 本発明は前記従来の諸欠点に鑑みなされたもの
であり、通常のクリーニング工程の前及びまたは
後に前記ストレーエミツシヨンの最も発生し易い
第2グリツドの電子ビーム通過孔部及びその近傍
をクリーニングする工程を付加することにより、
特性のよい陰極線管を得ることが可能な電子銃の
処理方法を提供することを目的としている。 次に本発明の電子銃の処理方法の一実施例を第
3図によつて説明するが、この場合従来の誘導コ
イルやテスラ変圧器を使用する電子銃の処理方法
は従来と同様なので省略する。 即ち陰極線管に内装された電子銃16は少なく
とも陰極17第1グリツド18、第2グリツド1
9及び第3グリツド20及び絶縁支持体21から
なり、この様な電極構成からなる電子銃16の陰
極17に定常電圧、第1グリツド18及び第3グ
リツド20を略接地電位にし、第2グリツド19
に所定の電圧を印加する時、この第2グリツド1
9に印加する電圧が100V乃至200Vであれば、第
3図に示すように第2グリツド19の電子ビーム
通過孔部の廻りに青白いグロー22,23が発生
する。これは第2グリツド19の電子ビーム通過
孔部を通過した陰極17からの電子ビーム24が
第2グリツド19の電子ビーム通過孔部を通過し
た後、第3グリツド20近傍より折り返して第2
グリツド19の第3グリツド20に対設する面の
電子ビーム通過孔部の近傍に集中し、これらの電
子の衝突により第2グリツド19の電子ビーム通
過孔部及びその近傍に存在していたストレーエミ
ツシヨン源の排出または活性化が行なわれ、スト
レーエミツシヨンが発生し易くなるが、更に第2
グリツド19に印加する電圧を400V乃至500V位
に上昇させると、第2グリツド19が赤熱をはじ
め、これを約2分乃至3分間続けると、前記した
電子の衝突は行なわれるがエミツシヨン源は第2
グリツド19が赤熱されているため破壊され、こ
のグリツド19の電子ビーム通過孔部及びその近
傍は完全にクリーニングされることになる。そし
て第2グリツド19が赤熱される程度の電圧であ
れば絶縁支持体のクラツクや管内グローの発生の
危険はともなわない。 この様に通常行なわれている誘導コイルやテス
ラ変圧器からの高電圧により電子銃を構成する各
電極をクリーニングする工程の前及びまたは後に
前記第2グリツドの所望部を加熱することにより
最も重要な第2グリツドの電子ビーム通過孔部及
びその近傍のストレーエミツシヨン源を除去する
ことにより、画像品位の良い陰極線管を得ること
が出来る。 前記実施例は主としてカラー受像管について説
明したが、これは白黒用受像管観測用陰極線管そ
の他、少くとも陰極、第1グリツド、第2グリツ
ド及び第3グリツドからなる電子銃について総て
適用出来るし、また陰極線管に電子銃を内装した
もの、または電子銃そのものにレーザー光線など
を用いて第2グリツドの電子ビーム通過孔部及び
その近傍のみを赤熱しても効果があるが、この場
合第3グリツド20方向より陰極17方向に向け
てレーザー光線で加熱する場合は陰極17に影響
が出ない様に断熱部材を介入させるか陰極17取
付前に加熱することが望ましい。 前述の様に本発明の電子銃の処理方法によれば
第2グリツドのストレーエミツシヨン源を完全に
除去することが出来るので、その工業的価値は極
めて大である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for processing an electron gun built into a cathode ray tube, and particularly relates to a method for processing an electron beam passage hole of a second grid and its vicinity among a plurality of electrodes constituting the electron gun. The present invention relates to an electron gun processing method that improves the withstand voltage of the electron gun and removes stray emission sources by separately cleaning the electron gun. For example, a color picture tube, which is an example of a cathode ray tube, has a phosphor layer 1 formed on its inner surface that emits red, green, and blue light upon impact with an electron beam, as shown in FIG. a face plate 2, a color selection electrode 3 disposed opposite to the fluorescent surface 1, a neck 5 connected to the face plate 2 via a funnel 4, and an electron gun 6 housed in the neck 5.
As shown in FIG. 2, when the electron gun 6 is of a bipotential type, the electron gun 6 is composed of a cathode 7 which is equipped with a heater (not shown), and an electron beam emitted from the cathode 7. control,
It consists of a first grid 8, a second grid 9, a third grid 10, a fourth grid 11, an insulating support 12, etc. for acceleration and focusing, and the fourth grid 1
Since a high voltage of 20KV to 30KV is applied to the electron gun 1, during the manufacturing process of the color picture tube, the electron gun
A voltage several times higher than that in actual use is applied to 6 via an induction coil or Tesla transformer to remove undesired substances adhering to the surface of each electrode and the surface of the insulating support 12 constituting the electron gun. However, there is a so-called cleaning step which primarily removes or reduces stray emissions from the second grid 9 and/or the third grid 10. In this case, depending on the setting conditions of the applied voltage and application time, glow discharge occurs in the tube not only through each electrode but also through the insulating support, and heating caused by this glow discharge may cause cracks in the insulating support 12 or Since there is a risk that the substances constituting the material may locally gasify, the current situation is that in the cleaning process, the applied voltage and application time are set within limits that do not cause the above-mentioned phenomenon. However, even if the cleaning process is performed using a limited applied voltage and applied time as described above, the surface of the electrode constituting the electron gun assembly 6 is almost cleaned, but in this case, the surface that requires the most cleaning due to the repulsion of the electric field The cleaning effect is insufficient in the electron beam passing hole portion of the second grid 9 and in the vicinity thereof, and especially in the portion of the second grid 9 in the electron beam passing hole portion and in the vicinity of the electron beam passing hole portion opposite to the third grid 10. If a substance that is likely to generate emission remains in the area, the electrons emitted from this area will take a different path from the main electron beam emitted from the cathode 7, and the main electron beam on the fluorescent surface 1 shown in FIG. There is a drawback that stray emission tends to occur, which causes a phosphor layer other than the phosphor layer to emit light and deteriorates image quality. The present invention has been made in view of the various drawbacks of the prior art, and includes cleaning the electron beam passage hole of the second grid where stray emission is most likely to occur and its vicinity before and/or after the normal cleaning process. By adding a process,
It is an object of the present invention to provide a method for processing an electron gun, which makes it possible to obtain a cathode ray tube with good characteristics. Next, an embodiment of the electron gun processing method of the present invention will be explained with reference to FIG. 3, but in this case, the processing method for an electron gun using a conventional induction coil or Tesla transformer is the same as the conventional method, so the explanation will be omitted. . That is, the electron gun 16 built into the cathode ray tube has at least a cathode 17, a first grid 18, and a second grid 1.
9, a third grid 20, and an insulating support 21, the cathode 17 of the electron gun 16 having such an electrode configuration is set to a steady voltage, the first grid 18 and the third grid 20 are set to approximately ground potential, and the second grid 19 is set to approximately ground potential.
When a predetermined voltage is applied to this second grid 1
If the voltage applied to the grid 9 is 100V to 200V, a bluish-white glow 22, 23 is generated around the electron beam passage hole of the second grid 19, as shown in FIG. This is because the electron beam 24 from the cathode 17 that has passed through the electron beam passage hole of the second grid 19 is turned back from near the third grid 20 and then passed through the second grid 19.
The electron beams are concentrated near the electron beam passage holes on the surface of the grid 19 facing the third grid 20, and the stray electrons that were present in the electron beam passage holes of the second grid 19 and in its vicinity are destroyed by collision of these electrons. The emission source is discharged or activated, and stray emission is more likely to occur, but the second
When the voltage applied to the grid 19 is increased to about 400V to 500V, the second grid 19 starts to become red hot, and if this continues for about 2 to 3 minutes, the electron collision described above takes place, but the emission source becomes red.
Since the grid 19 is red-hot, it is destroyed, and the electron beam passage hole of the grid 19 and its vicinity are completely cleaned. If the voltage is high enough to make the second grid 19 red-hot, there is no danger of cracking the insulating support or causing glow inside the tube. By heating the desired part of the second grid before and/or after the process of cleaning each electrode constituting the electron gun using the high voltage from the induction coil or Tesla transformer, which is normally carried out, the most important part can be heated. By removing the electron beam passage hole of the second grid and the stray emission source in its vicinity, a cathode ray tube with good image quality can be obtained. Although the above embodiment has mainly been explained with respect to a color picture tube, this can be applied to all types of cathode ray tubes for monochrome picture tube observation, as well as electron guns consisting of at least a cathode, a first grid, a second grid, and a third grid. It is also effective to heat only the electron beam passage hole of the second grid and its vicinity by using a cathode ray tube with an internal electron gun or a laser beam in the electron gun itself, but in this case, the third grid When heating the cathode 17 with a laser beam from the direction 20, it is desirable to intervene with a heat insulating member or heat the cathode 17 before attaching it so that the cathode 17 is not affected. As mentioned above, according to the electron gun processing method of the present invention, the stray emission source of the second grid can be completely removed, and therefore its industrial value is extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はカラー受像管の簡略断面図、第2図は
電子銃の要部立面図、第3図は本発明の電子銃の
処理方法の一工程の説明図である。 16……電子銃、22,23……グロー。
FIG. 1 is a simplified sectional view of a color picture tube, FIG. 2 is an elevational view of a main part of an electron gun, and FIG. 3 is an explanatory diagram of one step of the electron gun processing method of the present invention. 6 , 16 ... Electron gun, 22, 23... Glow.

Claims (1)

【特許請求の範囲】 1 陰極線管に内装された少なくとも陰極、第1
グリツド、第2グリツド及び第3グリツドからな
る電子銃に誘導コイルやテスラ変圧器からの高電
圧を印加し前記第1グリツド、第2グリツド及び
第3グリツドの所望表面をクリーニングする工程
の前及びまたは後に前記第2グリツドの所望部を
加熱し、前記所望部のストレーエミツシヨン源を
除去する手段を付加したことを特徴とする電子銃
の処理方法。 2 第2グリツドの所望部のストレーエミツシヨ
ン源を除去する手段が前記第2グリツドに電圧を
印加し過電流を流すことを特徴とする特許請求の
範囲第1項記載の電子銃の処理方法。 3 第2グリツドの所望部が前記第2グリツドの
電子ビーム通過孔部及びその近傍であることを特
徴とする特許請求の範囲第1項または第2項に記
載の電子銃の処理方法。
[Scope of Claims] 1. At least a cathode installed in a cathode ray tube, a first
Before the step of applying high voltage from an induction coil or a Tesla transformer to an electron gun consisting of a grid, a second grid and a third grid to clean desired surfaces of the first grid, second grid and third grid, and/or A method for processing an electron gun, further comprising means for subsequently heating a desired portion of the second grid to remove a stray emission source in the desired portion. 2. The electron gun processing method according to claim 1, wherein the means for removing the stray emission source in a desired portion of the second grid applies a voltage to the second grid to cause an overcurrent to flow therethrough. . 3. The electron gun processing method according to claim 1 or 2, wherein the desired portion of the second grid is an electron beam passage hole of the second grid and its vicinity.
JP12203078A 1978-10-05 1978-10-05 Treating method for electron gun Granted JPS5549838A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12203078A JPS5549838A (en) 1978-10-05 1978-10-05 Treating method for electron gun

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12203078A JPS5549838A (en) 1978-10-05 1978-10-05 Treating method for electron gun

Publications (2)

Publication Number Publication Date
JPS5549838A JPS5549838A (en) 1980-04-10
JPS6237501B2 true JPS6237501B2 (en) 1987-08-12

Family

ID=14825847

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12203078A Granted JPS5549838A (en) 1978-10-05 1978-10-05 Treating method for electron gun

Country Status (1)

Country Link
JP (1) JPS5549838A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5732553A (en) * 1980-08-04 1982-02-22 Mitsubishi Electric Corp Manufacture of cathode ray tube
US4832646A (en) * 1986-06-19 1989-05-23 North American Philips Consumer Electronics Corp. Aging process for cathode ray tubes
JPH0744001B2 (en) * 1986-10-28 1995-05-15 ソニー株式会社 Electron gun processing

Also Published As

Publication number Publication date
JPS5549838A (en) 1980-04-10

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