JPS6239926B2 - - Google Patents
Info
- Publication number
- JPS6239926B2 JPS6239926B2 JP15438881A JP15438881A JPS6239926B2 JP S6239926 B2 JPS6239926 B2 JP S6239926B2 JP 15438881 A JP15438881 A JP 15438881A JP 15438881 A JP15438881 A JP 15438881A JP S6239926 B2 JPS6239926 B2 JP S6239926B2
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- voltage
- circuit
- resistance
- set temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000009529 body temperature measurement Methods 0.000 claims description 19
- 238000001514 detection method Methods 0.000 claims description 14
- 210000003813 thumb Anatomy 0.000 description 11
- 238000010586 diagram Methods 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
- G01K7/25—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
- G01K7/21—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit for modifying the output characteristic, e.g. linearising
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Description
【発明の詳細な説明】
この発明は、例えばサムロータリスイツチ等の
ような多岐切替スイツチを介して設定される設定
温度と、測温抵抗体を介して検出される実際の測
定温度との偏差に対応する電圧を出力する温度差
検出回路に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention is based on the deviation between a set temperature set via a multi-purpose switch such as a thumb rotary switch and an actual measured temperature detected via a resistance temperature detector. The present invention relates to a temperature difference detection circuit that outputs a corresponding voltage.
第１図に、従来の温度差検出回路の一例を示
す。同図において、白金測温体Rtと抵抗Rzとに
より測温回路１が構成されており、この測温回路
１から出力される実際の温度ｔ℃に対応する測温
電圧Ｖ（ｔ）（ａ点基準）は、OPアンプ２の非反
転入力側に供給される。 FIG. 1 shows an example of a conventional temperature difference detection circuit. In the figure, a temperature measurement circuit 1 is configured by a platinum temperature measurement element Rt and a resistor Rz, and a temperature measurement voltage V(t)(a point reference) is supplied to the non-inverting input side of the OP amplifier 2.
他方、OPアンプ２の反転入力側には抵抗Ｒ
１，Ｒ１０，Ｒ１００をそれぞれ介してサムロー
タリスイツチ３，４，５の出力がそれぞれ供給さ
れている。 On the other hand, there is a resistor R on the inverting input side of OP amplifier 2.
The outputs of thumb rotary switches 3, 4, and 5 are supplied through thumb rotary switches 1, R10, and R100, respectively.
サムロータリスイツチ３および４の各切替入力
端子には、ツエナーダイオードDzで設定された
基準電圧を、抵抗RwおよびRyで降圧し、これを
更に抵抗Ra〜Rjからなる抵抗ラダー６により10
分割した各値が供給されており、またサムロータ
リスイツチ５の各切替入力端子には同様にしてツ
エナーダイオードDzで設定された基準電圧を抵
抗Rw，Ryにより降圧し、これを抵抗Rk〜Rmか
らなる抵抗ラダー７につて４分割した各値が供給
されている。 At each switching input terminal of the thumb rotary switches 3 and 4, the reference voltage set by the Zener diode Dz is stepped down by resistors Rw and Ry, and this is further lowered by a resistor ladder 6 consisting of resistors Ra to Rj.
Each divided value is supplied to each switching input terminal of the thumb rotary switch 5. Similarly, the reference voltage set by the Zener diode Dz is stepped down by the resistors Rw and Ry, and this is applied from the resistors Rk to Rm. For the resistance ladder 7, each value divided into four is supplied.
またサムロータリスイツチ３，４および５はそ
れぞれ設定温度を表わす数値の10の０乗、10の１
乗、および10の２乗桁の値にそれぞれ対応してい
る。 Thumb rotary switches 3, 4 and 5 are respectively 10 to the 0th power and 10 to the 1st power of the numerical value representing the set temperature.
and 10 to the power of 10, respectively.
従つて、サムロータリスイツチ３，４および５
を適宜切替設定することによつて、０℃〜399℃
の範囲で任意の温度設定を行なうことができるよ
うになされている。 Therefore, thumb rotary switches 3, 4 and 5
0°C to 399°C by appropriately switching and setting
The temperature can be set arbitrarily within the range of .
なお、可変抵抗器VR１，VR２はそれぞれ、回
路の初期調整用として用いられる。 Note that the variable resistors VR1 and VR2 are each used for initial adjustment of the circuit.
上述の温度差検出回路の出力VOUTは次式で
表わされる。 The output VOUT of the temperature difference detection circuit described above is expressed by the following equation.
Ｖput＝｛Ｖ（ｔ）−Ｖ１（ｔ）／Ｒ１＋Ｖ（ｔ）−Ｖ
１０（ｔ）／Ｒ１０
＋Ｖ（ｔ）−Ｖ１００（ｔ）／Ｒ１００｝×Rf＋Ｖ
（ｔ）…(1)
また上記(1)式において、設定温電圧Vs（ｔ）
は仮想的に次式で表わされる。 Vput ={V(t) -V1 (t)/ R1 +V(t)-V
10 (t)/ R10 +V(t) -V100 (t)/ R100 }×Rf+V
(t)…(1) Also, in the above equation (1), the set temperature voltage Vs(t)
is virtually expressed by the following equation.
Vs（ｔ）＝｛Ｖ（ｔ）−Ｖ１（ｔ）／Ｒ１＋Ｖ（ｔ）−
Ｖ１０（ｔ）／Ｒ１０
＋Ｖ（ｔ）−Ｖ１００（ｔ）／Ｒ１００｝×Rf…(2
)
ところで、この種の温度差検出回路に使用され
る測温抵抗体の抵抗値は、一定の温度範囲におい
ては直線性を保持するが、これを越えた場合、被
直線的に増加または減少することとなる。Vs(t)={V(t) -V1 (t)/ R1 +V(t)-
V 10 (t)/R 10 +V (t) - V 100 (t)/R 100 }×Rf…(2
) By the way, the resistance value of the resistance temperature detector used in this type of temperature difference detection circuit maintains linearity within a certain temperature range, but increases or decreases linearly when this temperature is exceeded. It happens.
このため、抵抗ラダー６および７から得られる
各ステツプ電圧の値を等間隔に設定すると、第３
図に示す如く測定温度が上昇するにつれて、測温
回路１から出力される測温電圧Ｖ（ｔ）と設定温
電圧Vs（ｔ）とは一致しなくなり、非検出体の
温度と設定温度とが一致しているにも拘わらず、
前記Ｖ（ｔ）とVs（ｔ）との偏差Vdefが温度差
出力VOUTとして出力され、これにより温度差
を誤認させることとなる。 Therefore, if the values of each step voltage obtained from the resistance ladders 6 and 7 are set at equal intervals, the third
As shown in the figure, as the measured temperature rises, the temperature measurement voltage V(t) output from the temperature measurement circuit 1 and the set temperature voltage Vs(t) no longer match, and the temperature of the non-sensing object and the set temperature become different. Despite being in agreement,
The deviation Vdef between the V(t) and Vs(t) is output as the temperature difference output VOUT, which causes a misunderstanding of the temperature difference.
そこで、このような問題を解決するために、従
来最上位に相当する10の２乗桁に対応する抵抗ラ
ダー７の各ステツプ電圧の間隔を徐々に小さく設
定することによつて、設定温度電圧Vs（ｔ）の
全体の傾きを第４図に示す如く徐々に小さくする
ようにした試みもなされている。 Therefore, in order to solve this problem, the set temperature voltage Vs can be reduced by gradually setting the interval between the step voltages of the resistor ladder 7 corresponding to the highest squared digit of 10. Attempts have also been made to gradually reduce the overall slope of (t) as shown in FIG.
しかしながら、単に抵抗ラダー７から出力され
る各ステツプ電圧の間隔を徐々に減少さただけで
は、０℃〜99℃、100℃〜199℃、200℃〜299℃、
300℃〜399℃の各範囲内においては、前記曲線
Vs（ｔ）の傾きは変らないため、第４図に示す
如く曲線Vs（ｔ）は鋸歯状を呈することとな
り、100℃、200℃、300℃、400℃の各前後におい
て、設定温電圧Vs（ｔ）の値は大きく変化する
とともに、測温電圧Ｖ（ｔ）と設定温電圧Vs
（ｔ）との偏差Vdefについても十分に補正しきれ
ない等の問題がある。 However, if the interval between each step voltage outputted from the resistance ladder 7 is gradually reduced,
Within each range of 300°C to 399°C, the above curve
Since the slope of Vs(t) does not change, the curve Vs(t) has a sawtooth shape as shown in Figure 4, and the set temperature voltage Vs The value of (t) changes greatly, and the temperature measurement voltage V(t) and set temperature voltage Vs
There is also a problem that the deviation Vdef from (t) cannot be sufficiently corrected.
この発明は上記の問題を解決するためになされ
たもので、その目的とするところは、この種の温
度差検出回路において、全設定温度範囲内におい
て出力誤差を可及的に低減することにある。 This invention was made to solve the above problem, and its purpose is to reduce the output error as much as possible within the entire set temperature range in this type of temperature difference detection circuit. .
この発明は上記の目的を達成するために、前記
最上位桁の多岐切替スイツチ（サムロータリスイ
ツチ）の各切替入力端子とこれに対応する抵抗ラ
ダー回路のタツプとの間に、値の異なる抵抗を介
挿し、前記最上位桁の切替動作に応答して前記
OPアンプの該当する入力抵抗値を変化させ、測
温抵抗体の非直線性に起因する測温電圧と設定温
電圧との偏差を補正するようにしたことを特徴と
するものである。 In order to achieve the above object, the present invention provides resistors of different values between each switching input terminal of the multi-purpose switch (thumb rotary switch) of the most significant digit and the corresponding tap of the resistor ladder circuit. and in response to the switching operation of the most significant digit.
The device is characterized in that the corresponding input resistance value of the OP amplifier is changed to correct the deviation between the temperature measurement voltage and the set temperature voltage caused by the nonlinearity of the resistance temperature sensor.
以下に、この発明の好適な一実施例を添付図面
に従つて詳細に説明する。 Hereinafter, a preferred embodiment of the present invention will be described in detail with reference to the accompanying drawings.
第２図はこの発明に拘わる温度差検出回路の要
部を示す回路図である。同図に示す如く、この発
明に係わる温度差検出回路の特徴は、前記第１図
において仮想線８により囲繞される10の２乗桁の
部分を、第２図に示す如く改良したことにある。
すなわち、10の２乗桁に対応するサムロータリス
イツチ５の各切替入力端子と、抵抗ラダー７を構
成する抵抗Rn〜Rpの各接続点との間には、値の
異なる抵抗ｒ０〜ｒ３００が挿入されているので
ある。 FIG. 2 is a circuit diagram showing the main parts of the temperature difference detection circuit according to the present invention. As shown in the figure, the feature of the temperature difference detection circuit according to the present invention is that the portion of the 10 squared digit surrounded by the imaginary line 8 in FIG. 1 has been improved as shown in FIG. .
That is, resistors r0 to r300 having different values are inserted between each switching input terminal of the thumb rotary switch 5 corresponding to the square digit of 10 and each connection point of the resistors Rn to Rp forming the resistance ladder 7. It is being done.
上述の改良された温度差検出回路においては、
10の２乗桁の値を０、１、２、３のように切替え
ると、その度にOPアンプに対する10の２乗桁の
入力抵抗は適宜に変化することとなる。 In the improved temperature difference detection circuit described above,
When the value of the 10 square digit is changed to 0, 1, 2, or 3, the input resistance of the 10 square digit to the OP amplifier changes appropriately each time.
ここで、０℃〜99℃、100℃〜199℃、200℃〜
299℃、300℃〜399℃の範囲における設定温電圧
Vs（ｔ）の傾きはそれぞれ次のように表わされ
る。 Here, 0℃~99℃, 100℃~199℃, 200℃~
299℃, set temperature voltage in the range of 300℃~399℃
The slope of Vs(t) is expressed as follows.
「０℃〜99℃」
（１／Ｒ１＋１／Ｒ１０＋１／ｒ０）×Rf
「100℃〜199℃」
（１／Ｒ１＋１／Ｒ１０＋１／ｒ１００）×Rf
「200℃〜299℃」
（１／Ｒ１＋１／Ｒ１０＋１／ｒ２００）×Rf
「300℃〜399℃」
（１／Ｒ１＋１／Ｒ１０＋１／ｒ３００）×Rf
上述の各式から明らかなように、設定温度電圧
曲線Vs（ｔ）の傾きは、各温度範囲において異
なることとなり、従つて抵抗r0〜ｒ３００の値を
適宜に設定することによつて、第５図に示す如く
各温度範囲内における曲線Vs（ｔ）の傾きθ
０，θ１００，θ２００，θ３００の値を測温電
圧Ｖ（ｔ）曲線に沿うように設定すれば、全温度
設定範囲内において測温電圧Ｖ（ｔ）と設定温電
圧Vs（ｔ）との偏差を可及的に低減させ、これ
により温度差出力VOUTの誤差を著しく減少さ
せることが可能となる。"0℃~99℃" (1/ R1 +1/ R10 +1/r0) x Rf "100℃~199℃" (1/ R1 +1/ R10 +1/r100) x Rf "200℃~299℃ ” (1/R 1 + 1/R 10 + 1/r200) x Rf “300℃~399℃” (1/R 1 + 1/R 10 + 1/r300) x Rf As is clear from the above formulas, the set temperature The slope of the voltage curve Vs(t) differs in each temperature range. Therefore, by appropriately setting the values of the resistors r0 to r300, the slope of the voltage curve Vs(t) within each temperature range can be changed as shown in FIG. t) slope θ
If the values of 0, θ100, θ200, and θ300 are set along the temperature measurement voltage V(t) curve, the deviation between the temperature measurement voltage V(t) and the set temperature voltage Vs(t) within the entire temperature setting range This makes it possible to significantly reduce the error in the temperature difference output VOUT.
実際に、本出願人が行なつた実験の結果では、
次のような良好な結果が得られた。 In fact, according to the results of experiments conducted by the applicant,
The following good results were obtained.
『従来例』Ｒ１＝100KΩ、Ｒ１０＝10KΩ、Ｒ１
００＝3KΩ
設定誤差；全温度囲を100％として、大きい箇所
において約２％
『本発明』ｒ０＝3.32KΩ、ｒ１００＝3.09KΩ、
ｒ２００＝2.87KΩ、ｒ３００＝
2.61KΩ
設定誤差；全温度範囲を100％として大きい箇所
で0.5％以内
以上の実施例の説明でも明らかように、この発
明に係わる温度差検出回路は前記最上位桁の多岐
切換スイツチ（サムロータリスイツチ）の各切替
入力端子とこれに対応する抵抗ラダー回路のタツ
プとの間に、値の異なる抵抗を介挿し、前記最上
位桁の切替動作に応答して前記OPアンプの該当
する入力抵抗値を変化させ、測温抵抗体の非直線
性に起因する測温電圧と設定温電圧との偏差を補
正するようにしたことを特徴とするものであるか
ら、この種温度差検出回路における誤差を可及的
に低減させることが可能となり、その検出精度を
著しく向上させることができる。"Conventional example" R1 = 100KΩ, R10 = 10KΩ, R1
00 = 3KΩ Setting error: Approximately 2% at large points when the entire temperature range is 100% ``Invention'' r0 = 3.32KΩ, r100 = 3.09KΩ,
r200=2.87KΩ, r300=
2.61KΩ Setting error: Within 0.5% at large points assuming the entire temperature range is 100% As is clear from the explanation of the embodiments above, the temperature difference detection circuit according to the present invention is based on the multi-variable changeover switch (thumb rotary switch) of the most significant digit. ) A resistor with a different value is inserted between each switching input terminal of the OP amplifier and the corresponding tap of the resistor ladder circuit, and the corresponding input resistance value of the OP amplifier is changed in response to the switching operation of the most significant digit. It is characterized by correcting the deviation between the temperature measurement voltage and the set temperature voltage due to the non-linearity of the resistance temperature detector, so it is possible to eliminate errors in this type of temperature difference detection circuit. This makes it possible to significantly reduce the amount of noise and improve the detection accuracy significantly.
第１図は従来回路の回路図、第２図は本発明回
路の要部を示す回路図、第３図は設定温電圧と測
温電圧との関係を示す従来例のグラフ、第４図は
設定温電圧と測温電圧との関係を示す従来の改良
型のグラフ、第５図は本発明回路における設定温
電圧と測温電圧との関係を示すグラフである。
１……測温回路、２……OPアンプ、３，４お
よび５……サムロータリスイツチ、６，７……抵
抗ラダー回路、ｒ０，ｒ１００，ｒ２００，ｒ３
００……値の異なる抵抗。
Fig. 1 is a circuit diagram of a conventional circuit, Fig. 2 is a circuit diagram showing main parts of the circuit of the present invention, Fig. 3 is a graph of a conventional example showing the relationship between set temperature voltage and temperature measurement voltage, and Fig. 4 is a circuit diagram of a conventional circuit. FIG. 5 is a conventional improved graph showing the relationship between the set temperature voltage and the temperature measurement voltage. FIG. 5 is a graph showing the relationship between the set temperature voltage and the temperature measurement voltage in the circuit of the present invention. 1... Temperature measurement circuit, 2... OP amplifier, 3, 4 and 5... Thumb rotary switch, 6, 7... Resistance ladder circuit, r0, r100, r200, r3
00...Resistance with different values.
Claims (1)
する測温回路と、設定温度を表わす数値の各桁の
値に相当するステツプ電圧を発生する抵抗ラダー
回路と、前記抵抗ラダー回路の各ステツプ出力を
択一的に取出すための多岐切替スイツチと、前記
多数切替スイツチを介して取出される各桁値を表
わすステツプ電圧を加算して、設定温度に対応す
る設定温電圧を求めるとともに、この設定温電圧
と前記測温回路から出力される測温電圧との偏差
を求める演算増幅器による温度差演算手段とを具
備する温度差検出回路において； 前記最上位桁の多岐切替スイツチの各切替端子
とこれに対応する抵抗ラダー回路の各タツプとの
間に、値の異なる抵抗を介挿し、前記最上位桁の
切替に応答して前記演算増幅器の該当する入力抵
抗値を変化させ、測温抵抗体の非直線性に起因す
る測温電圧と設定温電圧との偏差を補正するよう
に構成したことを特徴とする温度差検出回路。[Scope of Claims] 1. A temperature measurement circuit that outputs a temperature measurement voltage corresponding to the output of a resistance temperature sensor, a resistance ladder circuit that generates step voltages corresponding to the values of each digit of a numerical value representing a set temperature, The set temperature corresponding to the set temperature is determined by adding the step voltage representing each digit value taken out via the multi-variable selector switch for selectively taking out each step output of the resistance ladder circuit and the multiple selector switch. In a temperature difference detection circuit comprising a temperature difference calculation means using an operational amplifier to obtain a voltage and to obtain a deviation between the set temperature voltage and the temperature measurement voltage output from the temperature measurement circuit; A resistor with a different value is inserted between each switching terminal of the switch and each corresponding tap of the resistor ladder circuit, and the corresponding input resistance value of the operational amplifier is changed in response to the switching of the most significant digit. A temperature difference detection circuit characterized in that the temperature difference detection circuit is configured to correct a deviation between a temperature measurement voltage and a set temperature voltage due to nonlinearity of a resistance temperature sensor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15438881A JPS5855728A (en) | 1981-09-29 | 1981-09-29 | Detecting circuit for temperature difference |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15438881A JPS5855728A (en) | 1981-09-29 | 1981-09-29 | Detecting circuit for temperature difference |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5855728A JPS5855728A (en) | 1983-04-02 |
| JPS6239926B2 true JPS6239926B2 (en) | 1987-08-26 |
Family
ID=15583039
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15438881A Granted JPS5855728A (en) | 1981-09-29 | 1981-09-29 | Detecting circuit for temperature difference |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5855728A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3126476B2 (en) * | 1991-04-23 | 2001-01-22 | 株式会社東芝 | Cryogenic temperature measurement device |
| DE69232673T2 (en) * | 1991-04-23 | 2003-03-13 | Kabushiki Kaisha Toshiba, Kawasaki | Tiefsttemperaturmessausrüstung |
-
1981
- 1981-09-29 JP JP15438881A patent/JPS5855728A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5855728A (en) | 1983-04-02 |
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