Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPS6243497B2 - - Google Patents
[go: Go Back, main page]

JPS6243497B2 - - Google Patents

Info

Publication number
JPS6243497B2
JPS6243497B2 JP55068533A JP6853380A JPS6243497B2 JP S6243497 B2 JPS6243497 B2 JP S6243497B2 JP 55068533 A JP55068533 A JP 55068533A JP 6853380 A JP6853380 A JP 6853380A JP S6243497 B2 JPS6243497 B2 JP S6243497B2
Authority
JP
Japan
Prior art keywords
sample
laser beam
time
ultrasonic
ultrasonic waves
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55068533A
Other languages
Japanese (ja)
Other versions
JPS56164952A (en
Inventor
Tooru Inochi
Katsuhiro Minamida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP6853380A priority Critical patent/JPS56164952A/en
Publication of JPS56164952A publication Critical patent/JPS56164952A/en
Publication of JPS6243497B2 publication Critical patent/JPS6243497B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/341Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics
    • G01N29/343Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics pulse waves, e.g. particular sequence of pulses, bursts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • G01N29/2418Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【発明の詳細な説明】 本発明は、超音波の発信端および受信端をいず
れもレーザー光とした非接触式の超音波受信法に
関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a non-contact ultrasonic reception method using laser beams at both the ultrasonic transmitting end and the ultrasonic receiving end.

水晶等の振動子を鋼材などの試料に接触させ、
そして該振動子に高周波高電圧を印加して該試料
に超音波を励起し、その伝播状況から試料内部の
欠陥等を検出する、いわゆる超音波による非破壊
検査法が従来より各分野で使用されている。しか
し、この方法は、接触式であるため超音波発信端
を試料面に密着させるか、或いは水や他の液体媒
体で隙間を埋めて試料内に超音波を効率よく入射
させることが必要である。このため高温状態にあ
る鋼材等の試料に該振動子を接触させる測定は実
用上不可能に近い。このような理由から接触式超
音波励起法は、使用分野、環境が限定されるの
で、非接触式の超音波励起および受信技術が超音
波非破壊検査法の発展のために望まれている。
かゝる要請に応えて電磁力(ローレンツ力)を利
用して金属内に超音波を発生し、電磁式にこれを
受信する非接触の方法が提案されているが、この
方法は発受信装置をかなり試料面に接近させなけ
ればならず、従つて高温環境での使用が容易でな
いこと、また試料面と該装置との間隔の変動が信
号の強度に強く影響することなどの欠点を有して
おり、その上試料が金属等の導電性のものに限ら
れる難点がある。
A vibrator such as a crystal is brought into contact with a sample such as steel,
A so-called non-destructive inspection method using ultrasonic waves has been used in various fields in which a high frequency and high voltage is applied to the vibrator to excite ultrasonic waves in the sample, and defects etc. inside the sample are detected from the propagation status. ing. However, since this method is a contact method, it is necessary to bring the ultrasonic transmitting end into close contact with the sample surface, or to fill the gap with water or other liquid medium to efficiently inject the ultrasonic waves into the sample. . For this reason, it is practically impossible to perform measurements by bringing the vibrator into contact with a sample such as a steel material that is in a high temperature state. For these reasons, the contact ultrasonic excitation method is limited in its field of use and environment, and therefore, non-contact ultrasonic excitation and reception techniques are desired for the development of ultrasonic non-destructive testing methods.
In response to such demands, a non-contact method has been proposed in which ultrasonic waves are generated in metal using electromagnetic force (Lorentz force) and then received electromagnetically. It has disadvantages such as the fact that it has to be brought very close to the sample surface, making it difficult to use in high-temperature environments, and that fluctuations in the distance between the sample surface and the device strongly affect the signal intensity. Moreover, there is a drawback that the sample is limited to conductive materials such as metals.

ところで強力なパルスレーザー光を試料面に照
射すると、該試料のごとく表面層(数Å程度)の
物質が瞬時に蒸発して飛散しその反力(圧縮応
力)で該試料面に強力なパルス状の弾性波が発生
する。このことは、例えばB.P.Fairand等が1974
年に発表した文献(Quantitative assessment of
laserinduced stress waves generated at
confined surfaces、Applied Physics Letters,
Vol.25,No.8,15October1974、P431〜433)で
明らかにされているが、この方法によれば金属に
限らず任意の試料に遠隔地からパルス状の弾性
波、すなわち超音波(縦波)を励起させることが
できる。
By the way, when a strong pulsed laser beam is irradiated onto a sample surface, the material in the surface layer (about a few angstroms) of the sample instantly evaporates and scatters, and the reaction force (compressive stress) causes a strong pulsed laser beam to be applied to the sample surface. elastic waves are generated. This is true, for example, as BPFairand et al.
Literature published in 2015 (Quantitative assessment of
laser induced stress waves generated at
confined surfaces, Applied Physics Letters,
Vol. 25, No. 8, 15 October 1974, P431-433), according to this method, pulsed elastic waves, that is, ultrasonic waves (longitudinal waves) are applied to any sample, not just metals, from a remote location. ) can be excited.

この励起された超音波は探傷その他の検査、測
定目的のために当然検出しなければならないが、
その検出方法も勿論非接触でなければ非接触超音
波励起の意味はなくなつてしまう。パルスレーザ
ー光の照射により試料一面において発生した超音
波はその後試料内を伝播して試料他面に到達し、
こゝで反射波等を生じるが、この際試料他面は微
小ながら突出し、次いで凹陥し、つまり機械的変
位を生じる。この機械的変位を何らかの非接触的
な方法で検出すれば超音波の遠隔受信が可能であ
る。微小機械的変位は光による測定が可能であ
る。この際該変位が光の波長以下か、同程度か、
以上かに分けて考える必要があり、以下の場合に
は光干渉方式が有効である。即ちコヒーレントな
計測用レーザー光を試料面に照射し、試料面の機
械的変位による位相差を光ヘテロダインまたは光
ホモダインの手法で検出する。光ホモダイン法で
微小振動変位を測定することは飯島健一、都築泰
雄共著、共立出版刊の「計測論」における「レー
ザ干渉計による微小機械振動の測定」の項などに
示されている。ところが上述の光ヘテロダイン又
はホモダイン検波は、連続的な信号に対しては十
分であるが、瞬間的にしか生じない振動変位に対
しては、機械的振動雑音の分離除去や変位測定に
関与する光量子の不足のためにS/Nが充分でな
いという欠点がある。つまり、レーザー光による
非接触式の超音波発受信法を実現するに当り、単
に送信端をパルスレーザー光とし、且つ受信端を
計測用レーザー光としただけでは良好な測定結果
を期待することはできない。
Of course, this excited ultrasonic wave must be detected for flaw detection and other inspection and measurement purposes.
Of course, the detection method must also be non-contact, otherwise non-contact ultrasonic excitation will have no meaning. The ultrasonic waves generated on one side of the sample by irradiation with pulsed laser light then propagate within the sample and reach the other side of the sample.
This causes reflected waves, etc., but at this time, the other surface of the sample protrudes, albeit slightly, and then becomes depressed, ie, mechanical displacement occurs. If this mechanical displacement is detected by some non-contact method, remote reception of ultrasonic waves is possible. Micromechanical displacements can be measured with light. In this case, whether the displacement is less than or equal to the wavelength of light,
It is necessary to consider the above separately, and the optical interference method is effective in the following cases. That is, a coherent measuring laser beam is irradiated onto the sample surface, and a phase difference due to mechanical displacement of the sample surface is detected using optical heterodyne or optical homodyne techniques. Measuring minute vibration displacements using the optical homodyne method is described in the section ``Measurement of minute mechanical vibrations using a laser interferometer'' in ``Measurement Theory'', co-authored by Kenichi Iijima and Yasuo Tsuzuki, published by Kyoritsu Shuppan. However, the optical heterodyne or homodyne detection described above is sufficient for continuous signals, but for vibrational displacements that occur only instantaneously, it is necessary to separate and remove mechanical vibration noise and to detect optical quanta involved in displacement measurement. There is a drawback that the S/N is not sufficient due to the lack of . In other words, when realizing a non-contact ultrasonic transmission and reception method using laser light, it is not possible to expect good measurement results by simply using pulsed laser light at the transmitting end and measurement laser light at the receiving end. Can not.

本発明は、かゝる諸点を考慮してなされたもの
で、その特徴とする所は試料の一面に大出力のパ
ルスレーザー光を照射して該試料にパルス状の超
音波を発生させ、該超音波が該試料内部を伝播し
て試料他面に到達するとき該試料他面に生ずる機
械的変位を、該試料他面に計測用レーザー光を照
射して検出するようにし、かつ該パルスレーザー
光の照射時刻から該超音波が該試料面に到達する
時刻を予測して該到達予想時刻の前後にわたる限
られた時間内だけ該計測レーザー光を一時的に高
出力とする点にある。このようにすれば、無用な
雑音を拾う恐れが少なく、また微小変位情報を持
つ光量子数を充分大とすることができて、S/N
の良好な非接触式超音波発・受信を達成できる。
以下図示の実施例を参照しながらこれを詳細に説
明する。
The present invention was made in consideration of these points, and its characteristic feature is that one surface of a sample is irradiated with a high-power pulsed laser beam to generate pulsed ultrasonic waves on the sample. Mechanical displacement that occurs on the other surface of the sample when the ultrasonic wave propagates inside the sample and reaches the other surface of the sample is detected by irradiating the other surface of the sample with a measuring laser beam, and the pulsed laser The point is that the time at which the ultrasonic wave will reach the sample surface is predicted from the light irradiation time, and the measurement laser beam is temporarily made high in output only within a limited period of time before and after the expected arrival time. In this way, there is less risk of picking up unnecessary noise, and the number of photons carrying minute displacement information can be made sufficiently large, resulting in S/N
Good non-contact ultrasonic emission and reception can be achieved.
This will be explained in detail below with reference to the illustrated embodiments.

第1図は本発明の一実施例を示す。同図におい
て、1はQスイツチングにより瞬時的に大出力を
発生するパルスレーザーであり、鋼材等の試料2
の一面2aにパルスレーザー光L10を照射する。
Qスイツチングによりパルスレーザーを出力し得
るレーザー光源としてはルビーレーザー、ガラス
レーザーなどがある。これらのレーザー光源が発
生するパルスレーザー(ジアイアントレーザーと
も云う)は例えば100MWの大出力、パルス幅
20nSの短時間のものであり、試料表面(傷を付
けたくない場合は塗料などの保護膜を付ける)層
を瞬時に蒸発、飛散させる。前述のようにこの反
力の作用で試料内に弾性波が発生し、これは厚さ
dの試料内を縦波の伝播速度vで伝播し、レーザ
ー光照射から時間t=d/v経過後に試料他面2
bに到達し微小変位(点線で示す)を惹き起す。
レーザー光L10の一部(微小部分)L11はビームス
プリツタ3によりホトセルまたは光電子増倍管等
の光検出器4に入射し、こゝで検出(光電変換)
される。光検出器4の出力S1はレーザー光L10
試料面2aが照射された時刻情報を与えるが、こ
れをタイマ5で一定時間遅延させる。そして、タ
イマ5の出力S2をトリガ信号として計測用レーザ
ー6を起動し、これを一時的に発振またはQスイ
ツチングさせる。このトリガ信号S2はまたオシロ
スコープ11或いはメモリ12のタイミング用に
も使用される。計測用レーザー6には、ルビー、
YAGレーザーなどQスイツチングの可能なもの
(レーザー源1よりは小出力のものでもよい)を
用いる。レーザー6の出力レーザー光L20はロー
カルオシレーター7で振動数fLで駆動される光
変調器8に入射する。光変調器を出るレーザー光
は0次、±1次、±2次等の回折光となるが、この
うち1次回折光L21は振動数f0+fLとなつてミラ
ー9に到達した後、反射してビームスプリツター
10を通過して光検出器11に入射する。
FIG. 1 shows an embodiment of the invention. In the figure, 1 is a pulse laser that instantaneously generates high output through Q-switching.
A pulsed laser beam L 10 is irradiated onto one surface 2a of the plate.
Laser light sources that can output pulsed lasers by Q-switching include ruby lasers and glass lasers. The pulsed laser (also called di-iron laser) generated by these laser light sources has a high output power of, for example, 100 MW, and a pulse width.
It is a short time of 20nS, and instantly evaporates and scatters the sample surface layer (apply a protective film such as paint if you do not want to damage it). As mentioned above, an elastic wave is generated within the sample due to the action of this reaction force, which propagates at a longitudinal wave propagation speed v within the sample with thickness d, and after a time t = d/v has elapsed from the laser beam irradiation. Sample other side 2
b and causes a minute displacement (indicated by a dotted line).
A part (microscopic part) L 11 of the laser beam L 10 is incident on a photodetector 4 such as a photocell or photomultiplier tube by a beam splitter 3, where it is detected (photoelectric conversion).
be done. The output S 1 of the photodetector 4 gives information on the time when the sample surface 2 a was irradiated with the laser beam L 10 , but this is delayed by a timer 5 for a certain period of time. Then, the measurement laser 6 is activated using the output S2 of the timer 5 as a trigger signal, and is temporarily oscillated or Q-switched. This trigger signal S 2 is also used for timing the oscilloscope 11 or memory 12. The measurement laser 6 includes ruby,
A Q-switchable device such as a YAG laser (a laser source with a lower output than laser source 1 may also be used) is used. The output laser light L 20 of the laser 6 is incident on the optical modulator 8 driven by the local oscillator 7 at a frequency f L . The laser beam exiting the optical modulator becomes 0th-order, ±1st-order, ±2nd-order, etc. diffracted light, and among these, the first-order diffracted light L 21 reaches the mirror 9 with a frequency of f 0 +f L , and then The light is reflected, passes through the beam splitter 10, and enters the photodetector 11.

一方、0次回折光L22はもとのままの振動数f0
でビームスプリツター10を通過し、試料2の他
面2bで反射し、その反射レーザー光L23はビー
ムスプリツター10に戻り、ここで反射して光検
出器11に入射する。光検出器11はこうして2
入力L21,L23を与えられ、これらを2乗平均検波
して信号S3を出力する。この信号S3は増幅器13
で増幅された後ミクサー14でローカルオシレー
ター7による駆動振動fLと混合され、その出力
はオシロスコープ11で表示され、および又はメ
モリ12に格納される。
On the other hand, the 0th order diffracted light L 22 has the original frequency f 0
The laser beam L 23 passes through the beam splitter 10 and is reflected by the other surface 2b of the sample 2, and the reflected laser beam L23 returns to the beam splitter 10, where it is reflected and enters the photodetector 11. The photodetector 11 is thus
It is given inputs L 21 and L 23 , performs root mean square detection on these, and outputs a signal S 3 . This signal S 3 is transmitted to the amplifier 13
After being amplified by the mixer 14, it is mixed with the drive vibration f L by the local oscillator 7, and its output is displayed on the oscilloscope 11 and/or stored in the memory 12.

ここで、計測用レーザー光L20の振動数をf0
1次回折光L21の振幅をAL0、試料面2bで反射
した信号光L23の振幅をAs、試料面2bの変位を
Zとすると、1次回折光L21はAL0cos{2π(f0
+fL)t}、信号光L23はAscos{2πf0t+4πZ/λ sin2πfst}で表わすことができる。ここでfs
試料2がパルスレーザー1で照射されたときに励
起する超音波の振動数を表わす。またλは振動数
f0の光の波長でλ=c/f0(c:光速)の関係が
ある。したがつて、光検出器11の光電変換出力
S3の強度i(t)は2乗平均検波によつて次式の
ようになる。
Here, the frequency of the measurement laser beam L 20 is f 0 ,
Assuming that the amplitude of the first-order diffracted light L 21 is A L0 , the amplitude of the signal light L 23 reflected on the sample surface 2b is As, and the displacement of the sample surface 2b is Z, the first-order diffracted light L 21 is A L0 cos {2π(f 0
+f L )t}, and the signal light L 23 can be expressed as Ascos {2πf 0 t+4πZ/λ sin2πfst}. Here, f s represents the frequency of the ultrasonic wave excited when the sample 2 is irradiated with the pulsed laser 1. Also, λ is the frequency
There is a relationship of λ=c/f 0 (c: speed of light) at the wavelength of light f 0 . Therefore, the photoelectric conversion output of the photodetector 11
The intensity i(t) of S 3 is determined by the root mean square detection as shown in the following equation.

i(t)=<〔Ascos {2πf0t+4πZ/λsin2πfst} +AL0cos{2π(f0+fL)t}〕> =1/2(As2+1/2AL0 )+AsAL0 〔cos{2πfLt+4πZ/λsin2πfst} …(1) (1)式において、右辺第1項と第2項は直流成分
で、第3項が振動物体の変位Zを含んだ交流成分
である。そこで、第3項をiac(t)とおく。
4πZ/λ<1のとき、iac(t)は近似的に次式で表 わすことができる。
i(t)=<[Ascos {2πf 0 t+4πZ/λsin2πfst} +A L0 cos{2π(f 0 +f L )t}] 2 > =1/2(As 2 +1/2A L0 2 )+AsA L0 [cos{2πf Lt +4πZ/λsin2πf s t} (1) In equation (1), the first and second terms on the right side are DC components, and the third term is an AC component including the displacement Z of the vibrating object. Therefore, the third term is set as iac(t).
When 4πZ/λ<1, iac(t) can be approximately expressed by the following equation.

iac(t)=AsAL0〔cos2πfLt+2πZ/λ {cos2π(fL+fs)t−cos2π (fL−fs)t}〕 …(2) 検出信号iac(t)に駆動振動数fLを混合する
(ヘテロダイン)ことによつて、振動変位Zに比
例した振動成分 iac(t)=AsAL02πZ/λcos2πfst…(3) を取り出すことができる。ミクサーの出力をS4
する。(3)式において、fsはパルスレーザー光L10
の半値幅をτsとしたときの実効的な振動数で、
sとτsの間には次式の関係がある。
iac(t)=AsA L0 [cos2πf Lt +2πZ/λ {cos2π(f L +f s )t−cos2π (f L −f s )t}] …(2) The drive frequency f L is added to the detection signal iac(t) By mixing (heterodyne), it is possible to extract the vibration component iac(t)=AsA L0 2πZ/λcos2πf s t (3) which is proportional to the vibration displacement Z. Let the output of the mixer be S 4 . In equation (3), f s is the pulsed laser beam L 10
The effective frequency when the half-width of is τ s ,
There is a relationship between f s and τ s as shown in the following equation.

s1/τ …(4) ただし、cos2πfstは0t〓2τsの間で成
り立ち、t>2τsでは0である。
f s 1/τ s (4) However, cos2πf s t holds true between 0t≓2τ s , and is 0 when t>2τ s .

この2乗平均検波は、光ヘテロダイン法に準拠
したものであるが、従来と異なる点は、振動変位
による信号AsL02πZ/λcos2πfstがパルスレー ザー光L10のパルス幅に相当する時間しか存しな
いことである。
This root-mean-square detection is based on the optical heterodyne method, but the difference from the conventional method is that the signal A s A L0 2πZ/λcos2πf s t due to vibration displacement is generated over a period of time corresponding to the pulse width of the pulsed laser beam L 10 This is the only thing that exists.

こうして光ヘテロダイン法により変位Zの検
出、従つて超音波の非接触受信が可能になるが、
こゝで問題なのは信号光L21,L23の強度および継
続時間である。前述のようにパルスレーザー光
L10の持続時間は極めて短く、従つて変位Zの生
起時間およびその測定可能時間も極めて短かい。
かゝる短時間に充分な信号つまり光量子を光検出
器11に与えて確実な検出を行なわせる必要があ
る。また検出する変位Zは極めて微小であり、ま
た高温環境では測定光のゆらぎによつても擬似信
号が生じるから、かゝるものを検出してしまわな
いように何らかのフイルタ機能を持たせることが
重要である。そこで本発明ではパルスレーザー光
L10によつて試料2内に発生したパルス状の超音
波が試料面2bに到達して該面に機械的変位を生
じさせる時刻を中心にした微小時間だけ計測を行
なうようにする。タイマ5はかゝる目的で設けら
れたものでその遅延時間は試料2の厚みdおよび
超音波伝播速度に応じて設定する。即ち、前述の
ようにレーザー光L10を時刻t=0で試料面2a
に照射すると該面に発生した超音波パルス(弾性
波)は試料内を速度vで伝播して時刻t=tに試
料面2bに到達し、該面に微小変化を生じさせる
からタイマ5の遅延時間はd/vを中心にした微
小幅に設定する。具体例を挙げるとパルスレーザ
ー1がパルス幅20n sec、出力100MWのパルスレ
ーザー光L10を時刻t=0で試料面2aに照射し
たとすると、光検出器4の出力にはほとんど同時
に(遅れても0.1n sec程度)信号S1が現われる。
こゝで試料2の厚みdを30mmと仮定すれば超音波
(縦波)の伝播速度は6mm/1μsec程度であるか
ら、約5μsec後に試料面2bに機械的変位が発
生する。計測用レーザー光L20はこの変位を捉え
る訳であるが、これにはタイマ5の遅延時間を4
μSとし、計測用レーザー6の持続時間を2μS
とするのがよい。なおレーザー6をQスイツチン
グしてパルスレーザーを生じさせるのに要する時
間は数10nS程度であり、これも無視してよい。
In this way, the optical heterodyne method makes it possible to detect the displacement Z and, therefore, to receive ultrasonic waves in a non-contact manner.
The problem here is the intensity and duration of the signal lights L 21 and L 23 . Pulsed laser light as mentioned above
The duration of L 10 is extremely short, and therefore the time during which the displacement Z occurs and the time during which it can be measured are also extremely short.
It is necessary to provide sufficient signals, ie, photons, to the photodetector 11 in such a short period of time to ensure reliable detection. In addition, the displacement Z to be detected is extremely small, and in high-temperature environments, fluctuations in the measurement light can also cause false signals, so it is important to provide some kind of filter function to prevent such things from being detected. It is. Therefore, in the present invention, pulsed laser light
Measurement is performed only for a short period of time centered on the time when the pulsed ultrasonic waves generated in the sample 2 by L10 reach the sample surface 2b and cause mechanical displacement on the surface. The timer 5 is provided for this purpose, and its delay time is set depending on the thickness d of the sample 2 and the ultrasonic propagation speed. That is, as mentioned above, the laser beam L 10 is applied to the sample surface 2a at time t=0.
The ultrasonic pulse (elastic wave) generated on the surface propagates within the sample at a speed v and reaches the sample surface 2b at time t=t, causing a minute change in the surface, so the timer 5 is delayed. The time is set to a minute width centered on d/v. To give a specific example, if the pulsed laser 1 irradiates the sample surface 2a with a pulsed laser beam L 10 with a pulse width of 20 n sec and an output of 100 MW at time t=0, the output of the photodetector 4 will be applied almost simultaneously (with a delay). (about 0.1n sec) signal S 1 appears.
Here, assuming that the thickness d of the sample 2 is 30 mm, the propagation velocity of the ultrasonic wave (longitudinal wave) is about 6 mm/1 μsec, so mechanical displacement occurs on the sample surface 2b after about 5 μsec. The measurement laser beam L 20 captures this displacement, but the delay time of timer 5 is 4.
μS, and the duration of the measurement laser 6 is 2 μS.
It is better to Note that the time required to Q-switch the laser 6 to generate a pulsed laser is approximately several tens of nanoseconds, and this time can also be ignored.

光検出器11に充分な光量子を与えるには計測
用レーザー光源6の出力(連続出力)を大にして
もよいが、該光源6をQスイツチングしてパルス
レーザーを出力させるのが有効であり、そしてこ
のQスイツチングを前記タイミングで行なえば無
用な雑音を拾わない利点も得られる。こうして本
発明によれば検出感度を充分なレベルにあげるこ
とができると共に、測定試料に生ずる機械的振動
による雑音や、とくに熱間、すなわち高温環境で
測定するときに生ずる光のゆらぎによる雑音等を
効果的に除くことができる。
In order to provide sufficient photons to the photodetector 11, the output (continuous output) of the measurement laser light source 6 may be increased, but it is effective to Q-switch the light source 6 to output a pulsed laser. If this Q switching is performed at the above-mentioned timing, there is an advantage that unnecessary noise is not picked up. In this way, according to the present invention, detection sensitivity can be raised to a sufficient level, and noise caused by mechanical vibrations occurring in the measurement sample and noise caused by light fluctuations that occur especially when measuring in a hot, high-temperature environment, etc. can be suppressed. can be effectively removed.

第2図はミクサー14の出力を種々に利用する
信号処理回路であり、ピークホールド回路21の
出力Bが信号S4のピーク(変位)を示すアナログ
値である。信号S4は積分器22、シユミツト回路
23へも分岐され、シユミツト回路23の出力で
パルス発生器24を起動し、ゲートコントローラ
25からスタートパルスPSTRおよびストツプパ
ルスPSTPを発生させる。PSTRおよびPSTPはノ
アゲート27を介して積分器22に加わり、その
動作時間を規定する。従つて信号S3は例えばある
レベル以上の部分が積分され、その面積情報Aが
積分器22から出力される。演算器26は面積情
報Aとピーク値Bとを用いて信号S3の半値幅など
を演算する。サンプルホールド回路27は、遅延
回路28でパルスPSTPを所定時間遅延したタイ
ミングで、演算器26の出力をサンプリングして
これをホールドする。従つてホールド回路27の
出力Cは信号S4のパルス幅情報となる。
FIG. 2 shows a signal processing circuit that uses the output of the mixer 14 in various ways, and the output B of the peak hold circuit 21 is an analog value indicating the peak (displacement) of the signal S4 . The signal S4 is also branched to an integrator 22 and a Schmitt circuit 23, and the output of the Schmitt circuit 23 activates a pulse generator 24, causing a gate controller 25 to generate a start pulse P STR and a stop pulse P STP . P STR and P STP enter integrator 22 via NOR gate 27 and define its operating time. Therefore, for example, a portion of the signal S3 above a certain level is integrated, and the area information A thereof is output from the integrator 22. The calculator 26 uses the area information A and the peak value B to calculate the half width of the signal S3 . The sample and hold circuit 27 samples and holds the output of the arithmetic unit 26 at a timing when the pulse P STP is delayed by a predetermined time in the delay circuit 28 . Therefore, the output C of the hold circuit 27 becomes pulse width information of the signal S4 .

尚、実施例では試料2の一面2aに励起された
超音波が最初に他面2bに到達して該面に生じさ
せる機械的変化だけを測定する場合につき説明し
たが、例えばオシロスコープ11で信号S4とS1
同時に表示すれば両者の時間間隔から超音波の正
確な伝播速度を測定することができる。この超音
波の正確な伝播速度情報は試料の性状等に関する
各種の情報を提供するものである。また試料他面
2bに達した超音波はそこで反射し、照射面2a
に戻つてそこで再び反射し、といつた多重反射を
行ない、試料他面2bにはこれらの反射波(エコ
ー)が到来する度に変位するが、これらの変位を
すべて検出すれば、その減衰定数から試料内部の
結晶粒径等を求めることができる。この場合タイ
マ5はt=t、3t,5t,……の近傍のタイミング
で信号S2を繰り返し発生するように構成する。
In the embodiment, a case has been described in which the ultrasonic waves excited on one surface 2a of the sample 2 first reach the other surface 2b and only the mechanical change caused on that surface is measured. If 4 and S 1 are displayed simultaneously, the accurate propagation velocity of the ultrasonic wave can be measured from the time interval between the two. Accurate propagation velocity information of this ultrasonic wave provides various information regarding the properties of the sample and the like. In addition, the ultrasonic waves that have reached the other surface 2b of the sample are reflected there, and the irradiated surface 2a
The other surface of the sample 2b is displaced each time these reflected waves (echoes) arrive, but if all of these displacements are detected, the attenuation constant can be calculated by From this, the crystal grain size inside the sample can be determined. In this case, the timer 5 is configured to repeatedly generate the signal S2 at timings near t=t, 3t, 5t, .

以上述べたように本発明によれば、超音波の送
信端および受信端をそれぞれレーザー光とするの
で超音波の非接触発受信が可能になり、そして受
信端のレーザー光をパルス化して高出力とすると
共に時間制限するのでS/Nを向上させることが
でき(3桁以上改善されることが期待される)超
音波による被検体の探傷、検査、測定等の実用性
を一層高めることができる。このレーザー光によ
る非接触式の超音波発受信法は、電磁力を利用す
る非接触方法に比べて発、受信器を試料から充分
離隔設置することが可能であるため、高温状態の
試料に対しても問題なく適用でき、またその試料
が非金属であつても構わない利点を有する。
As described above, according to the present invention, the ultrasonic transmitting end and the receiving end are each made of laser light, which enables non-contact transmission and reception of ultrasonic waves, and the laser light at the receiving end is pulsed to provide high output power. In addition, since the time is limited, the S/N ratio can be improved (expected to be improved by more than 3 orders of magnitude), and the practicality of ultrasonic flaw detection, inspection, measurement, etc. of specimens can be further increased. . Compared to non-contact methods that use electromagnetic force, this non-contact method of transmitting and receiving ultrasonic waves using laser light allows the transmitter and receiver to be installed far enough away from the sample, making it suitable for high-temperature samples. It has the advantage that it can be applied without any problem even if the sample is a non-metal.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示すブロツク図、
第2図は受信端で得られた信号の処理回路例を示
すブロツク図である。 図中、1はパルスレーザー、2は試料、3およ
び10はビームスプリツタ、4および11は光検
出器、5はタイマ、6は計測用レーザー、9はミ
ラー、11はオシロスコープである。
FIG. 1 is a block diagram showing one embodiment of the present invention;
FIG. 2 is a block diagram showing an example of a processing circuit for signals obtained at the receiving end. In the figure, 1 is a pulse laser, 2 is a sample, 3 and 10 are beam splitters, 4 and 11 are photodetectors, 5 is a timer, 6 is a measurement laser, 9 is a mirror, and 11 is an oscilloscope.

Claims (1)

【特許請求の範囲】[Claims] 1 試料の一面に大出力のパルスレーザー光を照
射して該試料にパルス状の超音波を発生させ、該
超音波が該試料内部を伝播して試料他面に到達す
るとき該試料他面に生ずる機械的変位を、該試料
他面に計測用レーザー光を照射して検出するよう
にし、かつ該パルスレーザー光の照射時刻から該
超音波が該試料面に到達する時刻を予測して該到
達予想時刻の前後にわたる限られた時間内だけ該
計測レーザー光を一時的に高出力とすると共に、
前記超音波による試料他面の機械的変位は、該試
料他面に照射した計測用レーザー光の反射光と該
計測用レーザー光の参照信号用ミラーからの反射
光とをヘテロダイン検波して検出することを特徴
とする、レーザー光による超音波の発受信法。
1. Irradiate one side of the sample with a high-power pulsed laser beam to generate pulsed ultrasonic waves in the sample, and when the ultrasonic waves propagate inside the sample and reach the other side of the sample, The resulting mechanical displacement is detected by irradiating the other surface of the sample with a measuring laser beam, and the time at which the ultrasonic wave will reach the sample surface is predicted from the irradiation time of the pulsed laser beam, and the time at which the ultrasonic wave reaches the sample surface is predicted. While temporarily increasing the power of the measurement laser beam for a limited period of time before and after the predicted time,
The mechanical displacement of the other surface of the sample due to the ultrasonic waves is detected by heterodyne detection of the reflected light of the measurement laser beam irradiated onto the other surface of the sample and the reflected light of the measurement laser beam from the reference signal mirror. A method of transmitting and receiving ultrasonic waves using laser light, which is characterized by the following.
JP6853380A 1980-05-23 1980-05-23 Transmitting and receiving method for ultrasonic wave by laser beam Granted JPS56164952A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6853380A JPS56164952A (en) 1980-05-23 1980-05-23 Transmitting and receiving method for ultrasonic wave by laser beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6853380A JPS56164952A (en) 1980-05-23 1980-05-23 Transmitting and receiving method for ultrasonic wave by laser beam

Publications (2)

Publication Number Publication Date
JPS56164952A JPS56164952A (en) 1981-12-18
JPS6243497B2 true JPS6243497B2 (en) 1987-09-14

Family

ID=13376460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6853380A Granted JPS56164952A (en) 1980-05-23 1980-05-23 Transmitting and receiving method for ultrasonic wave by laser beam

Country Status (1)

Country Link
JP (1) JPS56164952A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58171662A (en) * 1982-04-02 1983-10-08 Hitachi Ltd Non-contact ultrasonic transmitter/receiver
JP2717600B2 (en) * 1990-11-27 1998-02-18 新日本製鐵株式会社 Thin film evaluation equipment

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS541069A (en) * 1977-06-03 1979-01-06 Omron Tateisi Electronics Co Automatic judgement apparatus of frequencies

Also Published As

Publication number Publication date
JPS56164952A (en) 1981-12-18

Similar Documents

Publication Publication Date Title
US5608166A (en) Generation and detection of ultrasound with long pulse lasers
Hutchins et al. A laser study of transient Lamb waves in thin materials
US5926273A (en) Method of measuring the absorption spectra of solutions by laser induced photothermal displacement spectroscopy
US5048969A (en) Piezoelectric measurement of laser power
JPH08285823A (en) Ultrasonic inspection equipment
JPS6243497B2 (en)
JPS6014298B2 (en) Ultrasonic transmission and reception method using laser light
Pierce et al. Laser generation of ultrasonic Lamb waves using low power optical sources
JPS5831872B2 (en) Non-contact ultrasonic flaw detection method
Mitra et al. An optical fibre interferometer for remote detection of laser generated ultrasonics
US5042302A (en) Phase-accurate imaging and measuring of elastic wave fields with a laser probe
Dewhurst Optical sensing of ultrasound
JP2717600B2 (en) Thin film evaluation equipment
RU2337353C1 (en) Method for contact-free ultrasonic diagnostics of welded junctions
Bourkoff et al. Low‐energy optical generation and detection of acoustic pulses in metals and nonmetals
JPH09257755A (en) Laser ultrasonic inspection apparatus and laser ultrasonic inspection method
JPH04178538A (en) Method and apparatus for generating and detecting ultrasonic waves in sample
Thomsen et al. Ultrasonic experiments with picosecond time resolution
JP7743176B2 (en) Non-contact vibration measuring device and non-contact vibration measuring method
Hen et al. Surface-acoustic-wave characterization of thin layer deposition on a standard silicon-photonic circuit
Ho et al. Direct and indirect dual-probe interferometers for accurate surface wave measurements
JP2789968B2 (en) Measurement method and apparatus by optical TDR
JPS6154179B2 (en)
JPH1183812A (en) Ultrasonic detection method and device using laser light
Tanaka et al. Nondestructive detection of small defects by laser ultrasonics